3D DIFFRACTION TOMOGRAPHY MICROSCOPY IMAGING METHOD BASED ON LED ARRAY CODED ILLUMINATION
20210372916 · 2021-12-02
Assignee
Inventors
- Chao Zuo (Nanjing, CN)
- Qian Chen (Nanjing, CN)
- Jiaji LI (Nanjing, CN)
- Jiasong Sun (Nanjing, CN)
- Yao FAN (Nanjing, CN)
- Shijie Feng (Nanjing, CN)
- Yuzhen Zhang (Nanjing, CN)
Cpc classification
G01N15/1468
PHYSICS
G01N2015/1445
PHYSICS
G01N15/1425
PHYSICS
International classification
Abstract
The present invention discloses a three-dimensional diffraction tomography microscopy imaging method based on LED array coded illumination. Firstly, acquiring the raw intensity images, three sets of intensity image stacks are acquired at different out-of-focus positions by moving the stage or using electrically tunable lens. And then, after acquiring the intensity image stacks of the object to be measured at different out-of-focus positions, the three-dimensional phase transfer function of the microscopy imaging system with arbitrary shape illumination is derived. Further, the three-dimensional phase transfer function of the microscopic system under circular and annular illumination with different coherence coefficients is obtained as well, and the three-dimensional quantitative refractive index is reconstructed by inverse Fourier transform of the three-dimensional scattering potential function. The scattering potential function is converted into the refractive index distribution. Thus, the quantitative three-dimensional refractive index distribution of the test object is obtained. The invention realizes high-resolution and high signal-to-noise ratio 3D diffraction tomography microscopic imaging of cells, tiny biological tissues and other samples.
Claims
1. A method of three-dimensional diffraction tomography microscopy imaging based on LED array coded illumination, characterized by the steps of: step 1: acquisition of the original intensity image, in the case of the measured thick object is in focus, and by changing the LED array code so that the shape of the illumination source is a circle with coherence coefficient S1, S2 and S3, by moving the carrier table or using the electrically tunable lens to acquire three sets of intensity image stacks at different out-of-focus positions I.sub.s1.sup.1, I.sub.s1.sup.2, . . . I.sub.s1.sup.i, . . . I.sub.s1.sup.N, I.sub.s2.sup.1, I.sub.s2.sup.2, . . . I.sub.s2.sup.i, . . . I.sub.s2.sup.N and I.sub.s3.sup.1, I.sub.s3.sup.2, . . . I.sub.s3.sup.i, . . . I.sub.s3.sup.N; step 2: by changing the LED array coding so that the illumination pattern is in the shape of a circle with a coherence factor S4, and then by moving the carrier or using an electrically tunable lens to capture the intensity image stack of the object to be measured at different out-of-focus positions I.sub.s4.sup.1, I.sub.s4.sup.2, . . . I.sub.s4.sup.i, . . . I.sub.s4.sup.N; step 3: deriving the three-dimensional phase transfer function of the microscopic imaging system with arbitrary shape illumination, extending the three-dimensional transfer function model of tilted coherent point light source to the three-dimensional transfer function model of partially coherent illumination and annular illumination, and obtaining the three-dimensional phase transfer function of the microscopic system under circular and annular illumination with different coherence parameters; step 4: 3D diffraction tomography quantitative refractive index deconvolution reconstruction, 3D Fourier transform of the acquired four groups of intensity image stacks to obtain the 3D spectrum of the four illumination cases, the four groups of 3D spectra will be summed, then divided in the frequency domain by the sum of the absolute values of the four 3D phase transfer functions to obtain the 3D scattering potential function; step 5: the quantitative three-dimensional refractive index distribution of the measured object, the inverse Fourier transform of the three-dimensional scattering potential function, and the conversion of the scattering potential function into the refractive index distribution, can be obtained from the quantitative three-dimensional refractive index distribution of the measured object.
2. The method according to claim 1, characterized in step 2: the circular illumination scheme is introduced into a conventional circular brightfield microscope by LED array encoded illumination, and a series of light intensity image stacks along the axial direction under the circular shape illumination pattern are taken I.sub.s4.sup.1, I.sub.s4.sup.2, . . . I.sub.s4.sup.i, . . . I.sub.s4.sup.N.
3. The method according to claim 2, characterized by changing the LED array coding so that the circular illumination pattern from small to large, the fourth group will change the illumination pattern to circular illumination pattern, and then in each lighting conditions, through the electrically tunable lens to collect the intensity of the object to be measured in different out-of-focus position image stack; the first row is the LED array coded illumination pattern, the second row is the image intensity map acquired under the axial Z1 position, the second row is the image stack map acquired under the axial Z2 position, and so on, the intensity image stack of the object to be measured under different out-of-focus positions in the axial direction is acquired by changing the electrically tunable lens.
4. The method according to claim 1, characterized in that step 3 is realized in the following way: the absorbance n.sub.a(r) and refractive index n.sub.P(r) of the three-dimensional object correspond to the imaginary and real parts of the complex refractive index, respectively, the relationship between n(r) the complex refractive index of the object n.sub.0(r) and the refractive index of the enclosing medium is expressed as a three-dimensional scattering potential V(r)=k.sub.0.sup.2[n.sup.2(r)−n.sub.m.sup.2]; where r is the three-dimensional spatial variable, k.sub.0 is the wave number corresponding to the wavelength in the vacuum, n.sub.n, is the refractive index of the medium in which the object is located, and in conventional transmission bright-field microscopy systems, the intensity image measured for a three-dimensional object I(r) can be expressed as
I(r)=B+P(r).Math.H.sub.P(r)+A(r).Math.H.sub.A(r) Where B is the captured transmitted light component, A(r) and P(r) are the imaginary and real parts of the three-dimensional scattering potential of the object, respectively, H.sub.A(r) and H.sub.P(r) are the point spread functions of the imaging system for the absorbed and phase parts of the object, respectively; a three-dimensional Fourier transform of the above equation is used to obtain the three-dimensional Fourier spectrum of the captured intensity map;
Ĩ(ρ)=Bδ(ρ)+{tilde over (P)}(ρ)T.sub.P(ρ)+Ã(ρ)T.sub.A(ρ) where Bδ(ρ) is the zero frequency component of the corresponding intensity image, {tilde over (P)}(ρ) and T.sub.P(ρ) are the 3D transfer functions of the spectrum and phase of the phase component of the scattering potential, respectively, while Ã(ρ) and T.sub.A(ρ) are the 3D transfer functions of the frequency component and absorption of the absorption component of the scattering potential, respectively, and the 3D transfer function corresponding to the phase component is
5. The method according to claim 1, characterized in step 4: the intensity stacks I.sub.s1(r), I.sub.s2(r), and I.sub.s3(r) under the circular light source of the coherence coefficient S1, S2 and S3 Fourier transform to obtain their corresponding intensity map Fourier spectrum Ĩ.sub.s1(ζ), Ĩ.sub.s2(ζ), Ĩ.sub.s3(ζ), and then transform the intensity stacks taken under the circular light source I.sub.s4(r) to their Fourier spectra to obtain Ĩ.sub.s4(ζ), the four intensity stacks obtained the sum of the Fourier spectra of the four intensity stacks is divided by the sum of the T.sub.P4 absolute values of the corresponding four three-dimensional phase transfer functions T.sub.P1, T.sub.P2, and T.sub.P3; the sum of the Fourier spectra of the four intensity stacks is
Ĩ(ζ)=Ĩ.sub.s1(ζ)+Ĩ.sub.s2(ζ)+Ĩ.sub.s3(ζ)+Ĩ.sub.s4(ζ) where Ĩ.sub.s1(ζ), Ĩ.sub.s2(ζ), Ĩ.sub.s3(ζ) and Ĩ.sub.s4(ζ) are the Fourier spectra of intensity maps obtained by Fourier transforming the intensity stacks captured under different illuminated light sources with coherence parameters of S1, S2, S3, and S4 respectively; the sum of the absolute values of the four three-dimensional transfer functions is
T.sub.P(ζ)=|T.sub.P1(ζ)|+|T.sub.P2(ζ)|+|T.sub.P3(ζ)|+|T.sub.P4(ζ)| the T.sub.P1(ζ) Fourier spectrum of the three-dimensional scattering potential function is obtained by dividing the sum of the four intensity stack Fourier spectra by the sum of the T.sub.P4 absolute values of the four corresponding three-dimensional phase transfer functions T.sub.P1, T.sub.P2, T.sub.P3 and T.sub.P2(ζ), T.sub.P3(ζ) T.sub.P4(ζ) respectively.
6. The method according to claim 1, characterized in that step five is achieved by performing a three-dimensional inverse Fourier transform of the three-dimensional scattering potential function by;
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0014]
[0015]
[0016]
[0017]
[0018]
DESCRIPTION OF THE PREFERRED EMBODIMENT
[0019] The present invention is based on a three-dimensional diffraction tomography microscopy imaging method with LED array encoded illumination in the following process.
[0020] Step 1, build a three-dimensional diffraction tomography microscopy imaging system: combined with
[0021] Step 2, acquisition of the original intensity image: in the case of the thick object sample to be measured as the focus state, by changing the LED array coding so that the illumination source shape for the coherence parameter S1, S2 and S3 the circular shape, by moving the carrier table or using the electrically tunable lens to acquire three sets of intensity image stacks at different out-of-focus positions I.sub.s1.sup.1, I.sub.s2.sup.2, . . . , I.sub.s1.sup.i, . . . I.sub.s1.sup.N, I.sub.s2.sup.1, I.sub.s2.sup.2, . . . , I.sub.s2.sup.i, . . . I.sub.s2.sup.N and I.sub.s3.sup.1, I.sub.s2.sup.2, . . . , I.sub.s3.sup.i, . . . I.sub.s3.sup.N. The intensity image stacks of the object to be measured at different out-of-focus positions are acquired by moving the carrier or using the electrically tunable lens I.sub.s4.sup.1, I.sub.s2.sup.2, . . . , I.sub.s4.sup.i, . . . I.sub.s4.sup.N S4 four different image stacks based on the LED array coding illumination can be obtained by the CMOS camera, i.e., the circular illumination scheme is introduced into the conventional circular shape by LED array coding illumination. The bright-field microscope was used to capture a series of light intensity image stacks along the axial direction under the circular shape illumination pattern I.sub.s4.sup.1, I.sub.s2.sup.2, . . . , I.sub.s4.sup.i, . . . I.sub.s4.sup.N.
[0022]
[0023] In step 3, the three-dimensional phase transfer function of the microscopic imaging system with arbitrarily shaped pupil illumination is derived: from the three-dimensional transfer function model of tilted coherent point light source to the three-dimensional transfer function model of partially coherent illumination and annular illumination, the three-dimensional phase transfer function of the microscopic system under circular and annular illumination with different coherence parameters is obtained. The absorbance n.sub.a(r) and refractive index n.sub.P(r) of the three-dimensional object correspond to the imaginary and real parts of the complex refractive index n(r), respectively, and the relationship between the n(r) complex refractive index of the object n.sub.0(r) and the refractive index of the enclosing medium can be expressed as the three-dimensional scattering potential
where r is the three-dimensional spatial variable, k.sub.0 is the number of waves in the vacuum corresponding to the wavelength, and n.sub.m is the refractive index of the medium in which the object is located.
[0024] In a conventional transmission bright-field microscopy system, the intensity image measured for a three-dimensional object I(r) can be expressed as
I(r)=B+P(r).Math.H.sub.P(r)+A(r).Math.H.sub.A(r)
where B is the captured transmitted light component, A(r) and P(r) are the imaginary and real parts of the object's 3D scattering potential, respectively. H.sub.A(r) and H.sub.P(r) are the point spread functions of the imaging system for the absorbed and phase parts of the object, respectively.
[0025] A three-dimensional Fourier transform of the above equation yields the three-dimensional Fourier spectrum of the captured intensity map;
Ĩ(ρ)=Bδ(ρ)+{tilde over (P)}(ρ)T.sub.P(ρ)+Ã(ρ)T.sub.A(ρ)
where Bδ(ρ) is the zero frequency component of the corresponding intensity image. {tilde over (P)}(ρ) and T.sub.P(ρ) are the three-dimensional transfer functions of the spectrum and phase of the phase component of the scattering potential, respectively, while Ã(ρ) and T.sub.A(ρ) are the three-dimensional transfer functions of the frequency component and absorption of the absorption component of the scattering potential, respectively. the three-dimensional transfer function corresponding to the phase component is
where ρ=(u,v,w), λ is the corresponding illumination source wavelength, {tilde over (S)}(u,v) is the light source distribution function, {tilde over (P)}(u,v) and {tilde over (P)}*(u,v) is a pair of conjugate light pupil function defined by the microscope objective, whose absolute value can be expressed as
where ρ.sub.P is the normalized cutoff frequency of the pupil of the microscope objective.
[0026] For a coherent point source at any point on the source plane, that is {tilde over (S)}(u,v)=δ(u−ρ.sub.s,v). Substituting this light source function into the above equation, the corresponding three-dimensional phase transfer function for this light source is obtained as
The above three-dimensional transfer function of can be divided into
and
that is, the two spherical shells moved by the illuminated light source in three-dimensional space
and
that is, the definition function of the Ewald spherical shell.
[0027] When the light source is a traditional circular pattern i.e.
S(u) Substituting the expression for the light source into the three-dimensional phase transfer function, the corresponding three-dimensional phase transfer function for a partially coherent illuminated circular light source with different coherence factors ρ.sub.S can be obtained.
[0028] When the light source is an annular light source can be defined as
The form of the transfer function under annular illumination is obtained by substituting the three-dimensional phase transfer function. By extending the 3D transfer function model from the tilted coherent point source to the circular partially coherent illumination and annular illumination models, the 3D phase transfer function of the microscope system under circular and annular illumination with different coherence parameters is obtained.
[0029] Combined with
[0030] Step 4, three-dimensional diffraction laminar quantitative refractive index deconvolution reconstruction: the acquired four groups of intensity image stacks are subjected to three-dimensional Fourier transform to obtain the three-dimensional spectra under four illumination cases. The obtained four sets of 3D spectra are summed and then divided by the sum of the absolute values of the four 3D phase transfer functions in the frequency domain to obtain the 3D scattering potential function.
[0031] The Fourier transform is performed I.sub.s1(r) on the intensity stacks of the circular light source with coherence parameters of S1. I.sub.s1(r), I.sub.s2(r), I.sub.s3(r) and I.sub.s4(r), and the Fourier spectra of the intensity maps are obtained as Ĩ.sub.s1(ζ), Ĩ.sub.s2(ζ), Ĩ.sub.s3(ζ) and Ĩ.sub.s4(ζ). Then the intensity stacks of the circular light source with coherence parameters of S1, S2, S3 and S4 are transformed I.sub.s4(r) to their Fourier domain. The sum of the Fourier spectra of the four intensity stacks obtained is divided by the sum of the T.sub.P4 absolute values of the four 3D phase transfer functions T.sub.P1, T.sub.P2, T.sub.P3 and T.sub.P4. The sum of the four intensity stack Fourier spectra is
Ĩ(ζ)=Ĩ.sub.s1(ζ)+Ĩ.sub.s2(ζ)+Ĩ.sub.s3(ζ)+Ĩ.sub.s4(ζ)
where Ĩ.sub.s1(ζ), Ĩ.sub.s2(ζ), Ĩ.sub.s3(ζ) and Ĩ.sub.s4(ζ) are the Fourier spectra of intensity maps obtained by Fourier transforming the intensity stacks captured under different illuminated light sources with coherence parameters of S1, S2, S3, and S4 respectively.
[0032] The sum of the absolute values of the four three-dimensional transfer functions is
T.sub.P(ζ)=|T.sub.P1(ζ)|+|T.sub.P2(ζ)|+|T.sub.P3(ζ)|+|T.sub.P4(ζ)|
where T.sub.P1(ζ), T.sub.P2(ζ), T.sub.P3(ζ) and T.sub.P4(ζ) correspond to four different illumination coherence parameters under the three-dimensional phase transfer function. The sum of the four intensity Fourier spectra is divided by the sum of the corresponding four three-dimensional phase transfer functions to obtain the Fourier spectrum of the three-dimensional scattering potential function of the measured object.
[0033] Step 5: Quantitative three-dimensional refractive index distribution of the measured object. The inverse Fourier transform is performed on the three-dimensional scattering potential function of the object under test, and the scattering potential function is converted into the refractive index distribution to obtain the quantitative three-dimensional refractive index distribution of the object under test.
By P (r) using the scattering potential formula, the quantitative three-dimensional refractive index distribution of the object under test is obtained.
[0034] Combined with
[0035]