CRYSTAL FORM OF DAPRODUSTAT, PREPARATION METHOD THEREFOR AND USE THEREOF

Abstract

Disclosed is crystal form M of the proline hydroxylase inhibitor daprodustat, wherein the X-ray powder diffraction thereof, expressed in 2θ angles and using Cu-Ka radiation, has characteristic peaks at 4.7±0.2°, 6.5±0.2°, and 6.8±0.2°. Disclosed are the preparation method for and the use of crystal form M. The crystal form M has good light stability, high temperature stability and high humidity stability, good solubility, and high purity.

Claims

1. A crystal form M of a proline hydroxylase inhibitor, wherein an X-ray powder diffraction of the crystal form M using Cu-Kα radiation has characteristic peaks at 2θ angles of 4.7±0.2°, 6.5±0.2° and 6.8±0.2°.

2. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the X-ray powder diffraction of the crystal form M using Cu-Kα radiation further has a characteristic peak at 2θ angle of 20.7±0.2°.

3. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the X-ray powder diffraction of the crystal form M using Cu-Kα radiation further has characteristic peaks at 2θ angles of 7.5±0.2° and 7.9±0.2°.

4. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has the following X-ray powder diffraction pattern data: TABLE-US-00015 2θ (±0.2°) d (Å) I % 4.7 18.9 27.7 6.5 13.7 15.7 6.8 13.0 100

5. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has the following X-ray powder diffraction pattern data: TABLE-US-00016 2θ (±0.2°) d (°A) I % 4.7 18.9 27.7 6.5 13.7 15.7 6.8 13.0 100 7.5 11.7 4.8 7.9 11.1 3.4

6. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has the following X-ray powder diffraction pattern data: TABLE-US-00017 2θ (±0.2°) d (Å) I % 4.68 18.88 27.7 6.45 13.69 15.7 6.81 12.97 100 7.55 11.70 4.8 7.95 11.11 3.4 10.77 8.21 1.6 15.27 5.80 3.5 16.63 5.33 1.6 17.49 5.07 1.5 20.67 4.30 9 21.67 4.09 2.2

7. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has an X-ray powder diffraction pattern substantially as shown in FIG. 1.

8. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein a differential scanning calorimetry curve of the crystal form M has an absorption peak at 122.8±2° C.

9. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has a differential scanning calorimetry curve substantially as shown in FIG. 2.

10. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has a thermal weight loss of less than 3.2% before 100° C. in a thermo gravimetric analysis curve.

11. The crystal form M of the proline hydroxylase inhibitor according to claim 1, wherein the crystal form M has a thermo gravimetric analysis curve substantially as shown in FIG. 3.

12. A method for preparing the crystal form M of the proline hydroxylase inhibitor according to claim 1, comprising the following steps of: dissolving a crystal form CS1 of the proline hydroxylase inhibitor in n-butanol or isobutanol, adding an aqueous solution of sodium dodecyl benzenesulfonate and concentrating to obtain a solid, adding the solid into water for slurrying, filtering and drying to obtain the crystal form M.

13. A pharmaceutical composition, comprising the crystal form M according to claim 1 and a pharmaceutically acceptable excipient.

14. A method for preventing or treating anemia, ischemia or myocardial infarction, comprising a step of administering a pharmaceutically effective dose of the crystal form M according to claim 1 or a pharmaceutical composition comprising the same to a patient.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the specific embodiments of the present disclosure or the prior art, the following is a brief description of accompanying drawings to be used in the specific embodiments or the prior art. It will be apparent that the accompanying drawings in the following description are some embodiments of the present disclosure and that other drawings may be obtained without creative effort by those of ordinary skill in the art based on these drawings.

[0026] FIG. 1 is an X-ray diffraction pattern of a crystal form M in Example 1 according to the present disclosure.

[0027] FIG. 2 is a differential scanning calorimetry curve of the crystal form M in Example 1 according to the present disclosure.

[0028] FIG. 3 is a thermo gravimetric analysis curve of the crystal form M in Example 1 according to the present disclosure; and

[0029] FIG. 4 is an X-ray diffraction pattern of a crystal form CS1 in Comparative Example 1 according to the present disclosure.

[0030] FIG. 5 is a differential scanning calorimetry curve of the crystal form CS1 in Comparative Example 1 according to the present disclosure.

[0031] FIG. 6 is a thermo gravimetric analysis curve of the crystal form CS1 in Comparative Example 1 according to the present disclosure.

[0032] FIG. 7 is an X-ray diffraction pattern of a crystal form CS9 in Comparative Example 2 according to the present disclosure.

[0033] FIG. 8 is a differential scanning calorimetry curve of the crystal form CS9 in Comparative Example 2 according to the present disclosure.

[0034] FIG. 9 is a thermo gravimetric analysis curve of the crystal form CS9 in

[0035] Comparative Example 2 according to the present disclosure.

[0036] FIG. 10 is an X-ray diffraction pattern of a crystal form K in Comparative Example 3 according to the present disclosure.

[0037] FIG. 11 is a differential scanning calorimetry curve of the crystal form K in Comparative Example 3 according to the present disclosure.

[0038] FIG. 12 is a thermo gravimetric analysis curve of the crystal form K in Comparative Example 3 according to the present disclosure.

[0039] FIG. 13 is a comparative X-ray powder diffraction pattern showing the light stability of a crystal form M and the crystal form K in Experimental Example 3 according to the present disclosure; wherein, A is a comparative X-ray powder diffraction pattern showing the light stability of the crystal form M, and B is a comparative X-ray powder diffraction pattern showing the light stability of the crystal form K.

[0040] FIG. 14 is a comparative X-ray powder diffraction pattern showing the high temperature stability of the crystal form M and the crystal form K in Experimental Example 3 according to the present disclosure; wherein, A is a comparative X-ray powder diffraction pattern showing the high temperature stability of the crystal form M, and B is a comparative X-ray powder diffraction pattern showing the high temperature stability of the crystal form K.

[0041] FIG. 15 is a comparative X-ray powder diffraction pattern showing the high humidity stability of the crystal form M and the crystal form K in Experimental Example 3 according to the present disclosure; wherein, A is a comparative X-ray powder diffraction pattern showing the high humidity stability of the crystal form M and B is a comparative X-ray powder diffraction pattern showing the high humidity stability of the crystal form K.

DETAILED DESCRIPTION

[0042] In both the description and the claims of the present disclosure, compounds are named based on chemical structural formulae, and if a name of a compound is inconsistent with a chemical structural formula when a same compound is represented, the compound is named based on the chemical structural formula or a chemical reaction formula.

[0043] In the present application, scientific and technical terms used herein have the meanings commonly understood by those skilled in the art, unless otherwise stated. However, for a better understanding of the disclosure, definitions and explanations of some of relevant terms are provided below. In addition, where the definitions and explanations of the terms provided in this application are inconsistent with the meanings commonly understood by those skilled in the art, the meanings of the terms are based on the definitions and explanations of the terms provided in this application.

[0044] X-ray powder diffraction (XRPD) refers to that when an X-ray beam illuminates onto an object, the X-ray beam is scattered by atoms in the object, and each atom produces scattered waves that interfere with each other, resulting in diffraction. The result of the superposition of diffraction waves is that the intensity of the rays intensifies in some directions and decreases in other directions. A crystal structure can be obtained by analyzing the diffraction results. An X-ray diffractometer uses a diffraction principle to accurately determine the crystal structure, texture and stress of a substance, and to perform precise phase, qualitative and quantitative analyses. For crystalline materials, when the crystals to be measured are at different angles to an incident beam, those crystal planes that satisfy Bragg diffraction are detected, which are reflected in the XRPD pattern as diffraction peaks with different diffraction intensities. For amorphous materials, the XRPD patterns thereof are some diffuse scattering broad peaks because the structure does not have a long-range order of atomic arrangements in the crystal structure, but only a short-range order in the range of a few atoms.

[0045] The “2θ angle” mentioned in the present disclosure means that the X-ray diffraction analysis is based on a Bragg formula (the Bragg formula is 2dsinθ=nk), where “θ” refers to a glancing angle or Bragg angle, which is a complement angle of an angle of incidence. “2θ” refers to a diffraction angle; “d” refers to an interplanar distance between two adjacent crystal faces in a crystal lattice, with Å as a unit; “λ” refers to a wavelength of X-rays; “n” is any positive integer, and the X-ray diffraction is referred to as n-order diffraction accordingly. The horizontal coordinate corresponding to the powder diffraction peak in an XRPD pattern is the 2θ angle, and the error range of the 2θ angle at the peak position is ±0.3°, optionally ±0.2°. When the crystal form of the disclosure is determined by X diffraction, there is sometimes a slight error in the determination of peaks due to the instrument or conditions for measurement, so this error should be considered when determining the crystalline structure. Therefore, the applicant has considered the error range (±0.2) when determining the 2θ angle. “Substantially as shown in figure” means that at least 50%, or at least 60%, or at least 70%, or at least 80%, or at least 90%, or at least 99% of peaks are shown in the figure.

[0046] Differential scanning calorimetry (DSC) is a thermal analysis method. The power difference (e.g. in the form of heat) input to a sample and a reference as a function of temperature is measured at a program-controlled temperature. A curve recorded by a differential scanning calorimeter is called a DSC curve, which uses a rate of heat absorption or release of a sample, that is, a heat flow rate dH/dt (unit: mJ/sec) or heat flow (unit: W/g) as a vertical coordinate, and the temperature T or time t as a horizontal coordinate. The DSC curve can be used to determine a variety of thermodynamic and kinetic parameters, such as specific heat capacity, heat of reaction, heat of transformation, phase diagram, reaction rate, crystallization rate, polymer crystallinity and sample purity.

[0047] Thermogravimetric analysis (TGA) is a thermal analysis technique that measures the mass of a sample to be measured as a function of temperature at a program-controlled temperature to study the thermal stability and composition of a substance. A thermogravimetric method is to measure the mass of a substance as a function of temperature (or time) under a program-controlled temperature. The mass of the measured substance changes when the measured substance is subjected to sublimation, vaporization, decomposition into gases or loss of crystallization water during the heating process. At this time, the thermogravimetric curve is not straight but decreases somewhat. By analyzing the thermogravimetric curve, it is possible to know at what temperature the measured substance changes and to calculate how much material, such as crystallization water, is lost based on the weight loss. TGA experiments are useful for studying changes in the properties of crystals, for example, the physical phenomena of substances such as melting, evaporation, sublimation and adsorption, as well as the chemical phenomena of substances such as dissociation, oxidation, reduction, thermal stability, decomposition processes, quantitative analysis of ingredients, effects of additives and fillers, moisture and volatiles, and reaction kinetics. Thermogravimetric analysis is usually divided into two categories: dynamic (temperature rise) and static (constant temperature). The curve obtained by the thermogravimetric test is called a thermogravimetric curve (a TG curve). The TG curve is expressed in terms of mass as a vertical coordinate, and can also be expressed in other forms such as percent weight loss; temperature (or time) as a horizontal coordinate, with increase in temperature (or time) from left to right.

[0048] Experimental Solution

[0049] The following examples are provided for a better understanding of the present disclosure, are not limited to the preferred embodiments and does not constitute a limitation on the content and protection scope of the disclosure. Any product identical or similar to the present disclosure, derived by anyone under the inspiration of the present disclosure or by combining the features in the present disclosure with that in the prior art, falls within the protection scope of the present disclosure.

EXAMPLE 1

Preparation of a Crystal Form M

[0050] 50 mg of a crystal form CS1 of a compound of a formula (I) was weighed in a sample vial, 10 ml of n-propanol was added, and the mixture was heated to 40° C. to completely dissolve the compound, then 100 μl of a 0.1 mol/L aqueous sodium dodecyl benzenesulfonate solution was added, and the mixture was stirred at 35° C. for 24 h, concentrated, and filtered to obtain a white solid precipitate. 5 ml of water was added to the white solid precipitate for slurrying, then another 5 ml of water was added, and the obtained solution was stirred for 2 h, filtered, and dried to obtain an off-white solid. XRPD test was performed on the off-white solid, showing a crystalline structure, named as a crystal form M. The structure of the crystal form M was characterized by differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), respectively.

[0051] (1) X-Ray Powder Diffraction (XRPD)

[0052] X-ray powder diffraction was performed by using the crystal form M, with the following measurement conditions: [0053] determination was performed by using Cu-Kα under a voltage of 40 KV, and a current of 40 mA at a test angle of 3-45°, a step length of 0.02°, an exposure time of 0.2S, and a light tube slit width of 1mm by using a Dtex detector with a slit width of 2.7 mm and a Germany BRUKER D8 DISCOVER type X-ray powder diffractometer.

[0054] An XRPD pattern of the above described crystal form M is shown in FIG. 1. An X-ray powder diffraction of the crystal form M has characteristic peaks at 2θ angles of 4.7±0.2°, 6.5±0.2° and 6.8±0.2°, also has a characteristic peak at 2θ angle of 20.7±0.2°, as well as also has characteristic peaks at 2θ angles of 7.5±0.2° and 7.9±0.2°. The specific peak positions of X-ray diffraction of the crystal form M are shown in Table 1.

TABLE-US-00004 TABLE 1 X-ray diffraction results of the crystal form M 2θ (±0.2°) d (Å) I % 4.677 18.8789 27.7 6.451 13.6901 15.7 6.811 12.9667 100 7.549 11.7005 4.8 7.949 11.1126 3.4 10.768 8.2093 1.6 15.267 5.7986 3.5 16.625 5.3281 1.6 17.487 5.0674 1.5 20.661 4.2954 9 21.696 4.0928 2.2

[0055] (2) DSC Determination

[0056] DSC determination was performed by using the crystal form M under the following conditions: [0057] determination was performed by a TA250 differential scanning calorimeter from TA Instrument Company, USA, with nitrogen protection and a heating rate of 10° C./min.

[0058] The DSC pattern of the crystal form M is shown in FIG. 2, and the crystal form M has an endothermic peak at 122.76° C.

[0059] (3) TGA Detection

[0060] TGA determination was performed by using the crystal form M under the following conditions: [0061] determination was preformed by TA550 from TA Instrument Company, USA, with a heating rate of 10° C./min.

[0062] The TGA curve of the crystal form M is shown in FIG. 3, illustrating that the crystal form M was desolvated by 3.2% before 100° C.

Comparative Example 1

Preparation of a Crystal Form CS1

[0063] A raw drug of N-[(1,3-dicyclohexylhexahydro-2,4,6-trioxo-5- pyrimidinyl)carbonyl] glycine (i.e., a raw drug of a compound of a formula (I)) was prepared according to the prior art, e.g., according to the method disclosed in CN101505752B. The raw drug of N-[(1,3-dicyclohexylhexahydro-2,4,6-trioxo-5- pyrimidinyl)carbonyl]glycine in this comparative example was prepared by Shanghai Haoyuan Biopharmaceutical Technology Co., Ltd. by repeating the method disclosed in the prior art CN101505752B. The raw drug of the compound of the formula (I) was subjected to X-ray powder diffraction with the following measurement conditions:

determination was performed by using Cu-Kα under a voltage of 40 KV, and a current of 40 mA at a test angle of 3-45°, a step length of 0.02°, an exposure time of 0.2 S, and a light tube slit width of 1 mm by using a Dtex detector with a slit width of 2.7 mm and a Germany BRUKER D8 DISCOVER type X-ray powder diffractometer.

[0064] An XRPD pattern of the raw drug of the compound of the formula (I) as described above is shown in FIG. 4, and the specific X-ray diffraction positions and intensities are shown in Table 2. From FIG. 4 and Table 2, it can be seen that the raw drug of the compound of the formula (I) is substantially consistent with the crystal form CS1 in the patent literature (WO2019052133), and the raw drug of the compound was named as the crystal form CS1.

TABLE-US-00005 TABLE 2 X-ray diffraction results of the crystal form CS1 2θ (±0.2°) d I % 3.959 22.3005 8.1 6.388 13.8252 51.9 7.586 11.6447 100 7.967 11.0882 28.6 12.833 6.8927 2 13.495 6.5557 2.6 15.233 5.8116 7.1 15.849 5.587 1.5 17.167 5.1609 6 19.304 4.5941 15.5 19.783 4.4841 6.9 20.058 4.4232 3.1 20.42 4.3456 3.5 20.725 4.2824 6 21.039 4.219 32.1 24.056 3.6964 8 26.093 3.4122 2.1

[0065] (2) DSC Determination

[0066] DSC determination was performed by using the crystal form CS1 under the following conditions: [0067] determination was performed by a TA250 differential scanning calorimeter from TA Instrument Company, USA, with nitrogen protection and a heating rate of 10° C./min.

[0068] The DSC pattern of the crystal form CS1 is shown in FIG. 5, and the crystal form CS1 has an absorption peak at 244.50° C.

[0069] (3) TGA Detection

[0070] TGA determination was performed by using the crystal form CS1 under the following conditions: [0071] determination was performed by TA550 from TA Instrument Company, USA, with a heating rate of 10° C./min.

[0072] The TGA curve of the crystal form CS1 is shown in FIG. 6, illustrating that the crystal form CS1 was desolvated by 0.3% before 100° C.

Comparative Example 2

Preparation of a Crystal Form CS9

[0073] 60 mg of a crystal form CS1 was weighed in a sample vial, 15 ml of 4-methyl-2-pentanone was added and the mixture was heated to 40° C. to dissolve the crystal form CS1 completely. 20 MHz of 85% rated power was used to sonicate for 10 min, then 200 μl of a 0.1 mol/L aqueous sodium dodecyl benzenesulfonate solution was added, and the mixture was heated to 50° C., stirred for 48 h, concentrated, and filtered to obatin a solid. 10 ml of water was added into the solid, and the mixture was continued to be stirred at 50° C. for 30 min and filtered to obtain an off-white solid. XRPD test was performed on the off-white solid, showing a crystalline structure, which was substantially consistent with the crystal form CS9 in the literature (WO2019052133), and the off-white solid was named as the crystal form CS9 below. The crystal form CS9 was characterized by differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), respectively.

[0074] (1) X-Ray Powder Diffraction (XRPD)

[0075] X-ray powder diffraction was performed by using the crystal form CS9 with the following measurement conditions: [0076] determination was performed by using Cu-Kα under a voltage of 40 KV, and a current of 40 mA at a test angle of 3-45°, a step length of 0.02°, an exposure time of 0.2 S, and a light tube slit width of 1 mm by using a Dtex detector with a slit width of 2.7 mm and a Germany BRUKER D8 DISCOVER type X-ray powder diffractometer.

[0077] The XRPD pattern of the above crystal form CS9 is shown in FIG. 7. The specific X-ray diffraction positions of the crystal form CS9 are shown in Table 3.

TABLE-US-00006 TABLE 3 X-ray diffraction results of the crystal form CS9 2θ (±0.2°) d (Å) I % 4.695 18.8041 33.8 6.616 13.3499 100 9.389 9.4121 8.1 10.583 8.352 2.8 13.383 6.6104 1.3 13.816 6.4042 1.1 15.316 5.7804 3.6 17.13 5.1722 5.2 17.625 5.028 0.8 18.528 4.7848 2.6 19.509 4.5465 2.2 20.202 4.3919 10.2 21.044 4.2182 6.2 23.211 3.829 1.6 24.235 3.6694 5.5

[0078] (2) DSC Determination

[0079] DSC determination was performed by using the crystal form CS9 under the following conditions: [0080] determination was performed by a TA250 differential scanning calorimeter from TA Instrument Company, USA, with nitrogen protection and a heating rate of 10° C./min.

[0081] The DSC pattern of the crystal form CS9 is shown in FIG. 8, and the crystal form CS9 has an absorption peak at 244.3° C.

[0082] (3) TGA Detection

[0083] TGA determination were performed by using the crystal form CS9 under the following conditions: [0084] determination was preformed by TA550 from TA Instrument Company, USA, with a heating rate of 10° C./min.

[0085] The TGA curve of the crystal form CS9 is shown in FIG. 9, and shows that the crystal form CS9 was desolvated by 0.08% before 100° C.

Comparative Example 3

Preparation of a Crystal Form K

[0086] 70 mg of a crystal form CS1 was weighed in a sample vial, 0.5 ml of N,N-dimethylformamide was added and the mixture was heated to 40° C. to dissolve the crystal form CS1 completely. 20 ml of acetonitrile was added, and the mixture was cooled to −15° C. and stirred for 12 h to obtain a white solid precipitate, and filtering and drying were performed to obtain an off-white solid. XRPD test was performed on the off-white solid, showing a crystalline structure, named as a crystal form K. The structure of the prepared crystal form K was then characterized by differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), respectively.

[0087] (1) X-Ray Powder Diffraction (XRPD)

[0088] X-ray powder diffraction was performed by using the crystal form K under the following measurement conditions: [0089] determination was performed by using Cu-Kα under a voltage of 40 KV, and a current of 40 mA at a test angle of 3-45°, a step length of 0.02°, an exposure time of 0.2 S, and a light tube slit width of 1 mm by using a Dtex detector with a slit width of 2.7 mm and a Germany BRUKER D8 DISCOVER type X-ray powder diffractometer.

[0090] An XRPD pattern of the above crystal form K is shown in FIG. 10. The specific X-ray diffraction positions of the crystal form K are shown in Table 4.

TABLE-US-00007 TABLE 4 X-ray diffraction results of the crystal form K 2θ (±0.2°) d (Å) I % 6.37 13.8642 100 7.146 12.3598 62.7 7.505 11.7696 72.5 10.806 8.1802 0.6 12.254 7.217 2.1 13.075 6.7653 1.7 13.495 6.5559 0.2 15.469 5.7233 5.3 16.291 5.4365 3.5 16.549 5.3523 1.5 17.267 5.1314 1.4 18.086 4.9006 1.5 18.781 4.7209 2.4 19.225 4.613 52 19.887 4.4609 2.5 20.958 4.2352 35.6 21.56 4.1183 4.5 22.819 3.8938 2 25.732 3.4592 2.2 26.348 3.3797 7

[0091] (2) DSC Determination

[0092] DSC determination was performed by using the crystal form K under the following conditions:

[0093] determination was measured by a TA250 differential scanning calorimeter from TA Instrument Company, USA, with nitrogen protection and a heating rate of 10° C./min.

[0094] The DSC pattern of the crystal form K is shown in FIG. 11, which shows that the crystal form K has absorption peaks at 165° C. and 243° C.

[0095] (3) TGA Detection

[0096] TGA determination was performed by using the crystal form K under the following conditions: [0097] determination was performed by TA550 from TA Instrument Company, USA, with a heating rate of 10° C./min.

[0098] The TGA pattern of the crystal form K is shown in FIG. 12, and shows that the crystal form K was desolvated by 1.08% before 100° C.

Experimental Example 1

Study on the Solubility of the Crystal Form M

[0099] Test product: the crystal form M, crystal form CS1, crystal form CS9 and crystal form K of the compound of the formula (I), preparation methods thereof being respectively shown in Example 1, Comparative example 1, Comparative example 2 and Comparative example 3.

[0100] Test method: the saturation solubilities in water of the crystal form M, crystal form CS1, crystal form CS9 and crystal form K of the compound of the formula (I) were determined by respectively taking excess test products, placing the test products in 10 mg sample vials, adding 3 ml of aqueous solution, stirring at room temperature for 12 h, and testing the solubility in water by an HPLC method. The operating conditions of HPLC were as follows:

[0101] Instrument: high performance liquid chromatograph (model: Thermo U3000)

[0102] Chromatographic column: Agilent C18 column (5 μm, 150 mm×4.6 mm)

[0103] Mobile phase composition and gradient elution procedure:

TABLE-US-00008 TABLE 5 Gradient elution procedure Time 0.5% aqueous phosphoric Acetonitrile (min) acid solution (%) (%) 0 95 5 3 95 5 8 5 95 15 5 95

[0104] Detection wavelength: 260.4 nm

[0105] Flow rate: 1 mL/min

[0106] Injection volume: 15 μL

[0107] Column temperature: 30° C.

[0108] The results are shown in Table 6.

TABLE-US-00009 TABLE 6 Saturation solubility results Item Saturation solubility Crystal form M 42.47 μg/ml Crystal form K 23.36 μg/ml Crystal form CS1 24.48 μg/ml Crystal form CS9  19.4 μg/ml

[0109] From the above table, it can be seen that the saturation solubility of the crystal form M is significantly higher compared with those of the crystal form K, the crystal form CS1 and the crystal form CS9.

Experimental Example 2

Study on the Purity of the Crystal Form M

[0110] Test product: the crystal form M, crystal form CS1, crystal form CS9 and crystal form K of the compound of the formula (I), preparation methods thereof being respectively shown in Example 1, Comparative example 1, Comparative example 2 and Comparative example 3.

[0111] Test method: an HPLC method was adopted, and determination was performed by an external standard method with reference to the method in Appendix VD of the Chinese Pharmacopoeia (2015 edition) by using samples on day 0 as a control.

[0112] Operating conditions of HPLC

[0113] Instrument: high performance liquid chromatograph (model: Thermo U3000)

[0114] Chromatographic column: Agilent C18 column (5 μm, 150 mm×4.6 mm)

[0115] Mobile phase composition and gradient elution procedure:

TABLE-US-00010 TABLE 7 Gradient elution procedure Time 0.5% aqueous phosphoric Acetonitrile (min) acid solution (%) (%) 0 95 5 3 95 5 8 5 95 15 5 95

[0116] Detection wavelength: 260.4 nm

[0117] Flow rate: 1 mL/min

[0118] Injection volume: 15 μL

[0119] Column temperature: 30° C.

[0120] The results are shown in Table 8.

TABLE-US-00011 TABLE 8 Purity results Crystal Crystal Crystal Crystal form M form K form CS1 form CS9 Purity 99.96% 99.91% 99.83% 99.81% Impurity content  0.04%  0.09%  0.17%  0.19%

[0121] Compared with that of the crystal form CS1 and the crystal form CS9, the purity of the crystal form M was improved by 0.13% and 0.15%, respectively. The crystal form M of the present disclosure has higher purity and lower impurity content, which can not only improve the safety of a drug for use, but also solve the problem of low activity due to low content.

Experimental Example 3

Study on the Stability of the Crystal Form M

[0122] 1. Experimental Method

[0123] Light stability: samples of the crystal form M, crystal form CS1, crystal form CS9 and crystal form K (prepared in Example 1, Comparative example 1, Comparative example 2 and Comparative example 3, respectively) of the compound of the formula (I) were placed under illumination conditions of 4500 Lux at 25° C. for 10 days, respectively. Samples were taken on Day 5 and Day 10 at fixed time points, respectively, to determine the XRPD patterns of the crystal form M and the crystal form K and the content of N-[(1,3-dicyclohexylhexahydro-2,4,6-trioxo-5-pyrimidinyl)carbonyl]glycine in the crystal form M, the crystal form K, the crystal form CS1 and a crystal form CS9, which were compared with those of samples on day 0.

[0124] High temperature stability: samples of the crystal form M, crystal form CS1, crystal form CS9 and crystal form K (prepared in Example 1, Comparative example 1, Comparative example 2 and Comparative example 3, respectively) of the compound of the formula (I) were placed at 60° C. for 10 days, respectively. Samples were taken on Day 5 and Day 10 at fixed time points, respectively, to determine the XRPD patterns of the crystal form M and the crystal form K and the content of N-[(1,3-dicyclohexylhexahydro-2,4,6-trioxo-5-pyrimidinyl)carbonyl] glycine in the crystal form M, the crystal form K, the crystal form CS1 and the crystal form CS9, which were compared with those of samples on day 0.

[0125] High humidity stability: samples of the crystal form M, crystal form CS1, crystal form CS9 and crystal form K (prepared in Example 1, Comparative example 1, Comparative example 2 and Comparative example 3, respectively) of the compound of the formula (I) were placed at 40° C. at 75% RH for 10 days, respectively. Samples were taken on Day 5 and Day 10 at fixed time points, respectively, to determine the XRPD patterns of the crystal form M and the crystal form K and the content of N-[(1,3-dicyclohexylhexahydro-2,4,6-trioxo-5-pyrimidinyl)carbonyl] glycine in the crystal form M, the crystal form K, the crystal form CS1 and the crystal form CS9, which were compared with those of samples on day 0.

[0126] The specific stability study method can refer to the method in Appendix XI C of Part II of Chinese Pharmacopoeia (2015 edition); the purity was detected by HPLC, and can be determined by an external standard method with reference to the method in Appendix VD of the Chinese Pharmacopoeia (2015 edition) by using samples on day 0 as a control.

[0127] Operating conditions of HPLC

[0128] Instrument: high performance liquid chromatograph (model: Thermo U3000)

[0129] Chromatographic column: Agilent C18 column (5 μm, 150 mm×4.6 mm)

[0130] Mobile phase composition and gradient elution procedure.

TABLE-US-00012 TABLE 9 Gradient elution procedure Time 0.5% aqueous phosphoric Acetonitrile (min) acid solution (%) (%) 0 95 5 3 95 5 8 5 95 15 5 95

[0131] Detection wavelength: 260.4 nm

[0132] Flow rate: 1 mL/min

[0133] Injection volume: 15 μL

[0134] Column temperature: 30° C.

[0135] 2. Experimental Results

[0136] From FIGS. 13-15, it can be seen that the crystal form M and the crystal form K have good stability under strong light (25° C., 4500 Lux), high temperature (60° C.) and high humidity (25° C., 92.5% RH), and no crystalline transformation occurred. The crystal forms M and K provided in the present application have good light stability, high temperature stability, and high humidity stability, and the purity was substantially unchanged during 10 days of placement, indicating that the crystal form M has good stability and is not easily degraded, which can guarantee the preparation of stable formulations.

TABLE-US-00013 TABLE 10 Stability study results of the crystal form M Starting purity Purity on Purity change Conditions (day 0) day 10 on day 10 25° C., 4500 Lux 99.96% 99.91% 0.05% 60° C. 99.84% 0.12% 40° C., 75% RH 99.82% 0.14%

TABLE-US-00014 TABLE 11 Stability study results of the crystal form K Starting purity Purity on Purity change Conditions (day 0) day 10 on day 10 25° C., 4500 Lux 99.91% 99.86% 0.50% 60° C. 99.64% 0.27% 40° C., 75% RH 99.57% 0.34%

[0137] It is apparent that the foregoing examples are only examples for clear explanation and are not intended to limit the implementations. Other variations or changes may be made in different forms based on the above description for those of ordinary skill in the art. It is not necessary, nor is it possible, to give an exhaustive list of embodiments. The obvious variations or changes derived therefrom are still within the protection scope of the disclosure.