MILLIMETER THICK MAGNETIC PCB WITH HIGH RELATIVE PERMEABILITY AND DEVICES THEREOF
20220165466 · 2022-05-26
Assignee
Inventors
Cpc classification
H05K3/4644
ELECTRICITY
H05K3/462
ELECTRICITY
H05K2201/086
ELECTRICITY
H05K2201/10098
ELECTRICITY
B32B5/263
PERFORMING OPERATIONS; TRANSPORTING
H05K1/09
ELECTRICITY
International classification
B32B5/02
PERFORMING OPERATIONS; TRANSPORTING
B32B5/26
PERFORMING OPERATIONS; TRANSPORTING
Abstract
A magnetic PCB generated by simultaneously spin-spraying a ferrite ion solution and an oxidant solution on a substrate plate while the substrate plate is rotated at a speed 40 rpm to about 300 rpm and heated at 40° C. to 300° C.
Claims
1. A spin-spray deposited M(x)Zn(1-x)-ferrite magnetic PCB, comprising a film of ferrite deposition having a formula M(x)Zn(1-x)-ferrite wherein M represents a metal ion selected from Zn, Co, Mn, Cu, Ni and a mixture thereof, and x represents a ratio between M and Zn, ranging 0 to 1; and a layer of a substrate, wherein the film of ferrite deposition uniformly formed on the layer of the substrate.
2. The ferrite magnetic PCB of claim 1, wherein the ferrite magnetic PCB has a magnetic relative permeability greater than 500 and a high saturation magnetization greater than 0.4 T.
3. The ferrite magnetic PCB of claim 1, wherein the film of ferrite deposition is deposited through a spin-spray mechanism by spraying on the layer of the substrate a spin spray reaction solution comprising FeCl.sub.2 and MCl.sub.2 where M represents a metal ion selected from Zn, Co, Mn, Cu, Ni and a mixture thereof, and simultaneously spraying on the layer of the substrate an oxidizing buffer solution, while the substrate simultaneously is heated to a temperature between 20-100° C. and rotated at a speed between 5-1000 rpm.
4. The ferrite magnetic PCB of claim 3, wherein the oxidizing buffer solution is a NaNO.sub.2 acetate buffer.
5. The ferrite magnetic PCB of claim 1, wherein the layer of the substrate has a panel dimension between 1 inch to 48 inches; and the film of ferrite deposition has a thickness in a range between 50 nm and 20 μm.
6. The ferrite magnetic PCB of claim 1, wherein the substrate is a FR4, TMM10i, Si, glass, printed circuit board, or a transparency.
7. A multiple layered ferrite magnetic PCB assembly, comprising a plurality layers of ferrite coated PCB substrates, each layer substrate being coated at least one ferrite thin film, said plurality layers of ferrite coated PCB substrates being laminated together with a layer of polymer by heating the layered assembly to form the ferrite film PCB laminate.
8. The multiple layered ferrite magnetic PCB assembly of claim 7 is a panel of size less than 48″×48″, having a thickness of 0.05˜5 mm and an average magnetic relative permeability greater than 1˜200, and the polymer is thermoset resin.
9. The multiple layered ferrite magnetic PCB assembly of claim 7, wherein one or more ferrite coated PCB substrates are generated by simultaneously spraying of a ferrite ion solution and an oxidant buffer solution on a heated and spinning substrate.
10. A method for generating a magnetic PCB, comprising the steps of: providing a spin-spray machinery having a first spray nozzle, a second spray nozzle, a spindle platform for spinning and heating a substrate plate; spraying the substrate plate with a ferrite ion reaction solution from the first spray nozzle at a first spraying speed; simultaneously spraying the substrate plate with an oxidant buffer solution from the second spray nozzle at a second spraying speed; simultaneously spinning said substrate plate at a rotation speed while simultaneously heating said substrate plate to a temperature between 20° C. to 400° C.; and collecting a ferrite coated substrate plate.
11. The method of claim 10, wherein the rotation speed is between 5 rpm to about 1000 rpm.
12. The method of claim 10, wherein the first and the second spraying speed is between 1 mL/min to 1000 mL/min.
13. The method of claim 10, wherein said first and second nozzles are placed directly over the substrate plate with a distance between the nozzles and the substrate's surface in an range of about 1 inch to about 50 inches.
14. The method of claim 10, wherein the step of spraying lasts for a period between 1 minute to 1000 minutes.
15. The method of claim 10, wherein the ferrite ion reaction solution comprises FeCl.sub.2 and MCl.sub.2 where M represents a metal ion selected from Zn, Co, Mn, Cu, Ni and a mixture thereof, and the oxidizing solution is a NaNO.sub.2 oxidant acetate buffer.
16. The method of claim 10, further comprising the steps of: generating a first ferrite coated substrate using said steps of claim 10; generating a second ferrite coated substrate using said steps of claim 10; hot-pressuring said first ferrite coated substrate stacked with said second ferrite coated substrate with a pressure between 0.01 psi to 100 psi at a temperature between 50° C.˜400° C. for 1 min˜24 hrs.
17. The method of claim 16, wherein the first ferrite coated substrate has a different ferrite composition from the ferrite composition of the second ferrite coated substrate.
18. The method of claim 16, wherein the first ferrite coated substrate has a ferrite layer with a thickness in between 0.01 μm and 20 μm.
19. A compact inductor comprising a magnetic PCB generated by method of claim 10.
20. A transformer comprising a magnetic PCB generated by method of claim 10.
21. An antenna comprising a magnetic PCB generated by method of claim 10.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0052] Reference will now be made in detail to embodiments of the invention. Wherever possible, same or similar reference numerals are used in the drawings and the description to refer to the same or like parts or steps. The drawings are in simplified form and are not to precise scale. The word ‘couple’ and similar terms do not necessarily denote direct and immediate connections, but also include connections through intermediate elements or devices. For purposes of convenience and clarity only, directional (up/down, etc.) terms may be used with respect to the drawings. These and similar directional terms should not be construed to limit the scope in any manner. It will also be understood that other embodiments may be utilized without departing from the scope of the present invention, and that the detailed description is not to be taken in a limiting sense, and that elements may be differently positioned, or otherwise noted as in the appended claims without requirements of the written description being required thereto.
[0053] The terms “first,” “second,” “third,” “fourth,” and the like in the description and the claims, if any, may be used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable. Furthermore, the terms “comprise,” “include,” “have,” and any variations thereof, are intended to cover non-exclusive inclusions, such that a process, method, article, apparatus, or composition that comprises a list of elements is not necessarily limited to those elements, but may include other elements not expressly listed or inherent to such process, method, article, apparatus, or composition.
[0054] The present invention may be described herein in terms of functional block components and various processing steps. It should be appreciated that such functional blocks may be realized by any number of hardware and/or software components configured to perform the specified functions. For example, the present invention may employ various integrated circuit components, e.g., memory elements, processing elements, logic elements, look-up tables, and the like, which may carry out a variety of functions under the control of one or more microprocessors or other control devices.
[0055] It should be appreciated that the particular implementations shown and described herein are illustrative of the invention and its best mode and are not intended to otherwise limit the scope of the present invention in any way. Furthermore, the connecting lines shown in the various figures contained herein are intended to represent exemplary functional relationships and/or physical couplings between the various elements. It should be noted that many alternative or additional functional relationships or physical connections may be present in a practical incentive system implemented in accordance with the invention.
[0056] The term “substrate” refers to the “substrate” term in electronic engineering field, a wafer is a common example; in general substrate refers to a solid (usually planar) substance onto which a layer of another substance is applied, and to which that second substance adheres, this substance serves as the foundation upon which electronic devices such as transistors, diodes, and especially integrated circuits (ICs) are deposited.
[0057] The term “FR-4 (or FR4)” is a NEMA grade designation for glass-reinforced epoxy laminate material. FR-4 is a composite material composed of woven fiberglass cloth with an epoxy resin binder that is flame resistant.
[0058] The term permeability in this application refers to magnetic permeability. Magnetic permeability is generally measured by FMR.
[0059] The term PCB or “printed circuit board” refers to a flat sheet of insulating substrate material and a layer of copper foil, laminated to the substrate; chemical etching divides the copper layer into separate conducting lines into tracks or circuit traces, pads for connections, vias to pass connections between layers of copper. In multi-layer boards, the layers of material are laminated together in an alternating sandwich: copper, substrate, copper, substrate, copper, etc, each plane of copper is etched, and any internal vias are plated-through, before the layers are laminated together. FR-4 glass epoxy is the most common insulating substrate. Another substrate material is cotton paper impregnated with phenolic resin, often tan or brown. Laminates are manufactured by curing under pressure and temperature layers of cloth or paper with thermoset resin to form an integral final piece of uniform thickness. The size can be up to 4 by 8 feet (1.2 by 2.4 m) in width and length. Different dielectrics are used as substrate, include polytetrafluoroethylene (Teflon), FR-4, FR-1, CEM-1 or CEM-3. Well known pre-preg materials used in the PCB industry are FR-2 (phenolic cotton paper), FR-3 (cotton paper and epoxy), FR-4 (woven glass and epoxy), FR-5 (woven glass and epoxy), FR-6 (matte glass and polyester), G-10 (woven glass and epoxy), CEM-1 (cotton paper and epoxy), CEM-2 (cotton paper and epoxy), CEM-3 (non-woven glass and epoxy), CEM-4 (woven glass and epoxy), CEM-5 (woven glass and polyester).
[0060] Commercially available PCBs are mostly not magnetic, but only dielectric with a dielectric constant in the range of 2˜13. Because ferrite deposition requires greater than 700° C. processing temperature to in order to form high crystalline quality ferrite, it has been almost impossible for electronic engineers to manufacture magnetic PCBs with traditional methods. Since magnetic PCBs can lead to more compact and more power efficient antennas, inductors, and transformers, etc. and which will in turn allow for the manufacturing of electronics with much smaller sizes, less weight, and less power consumption, many efforts have been made in finding a way to deposit ferrite material on PCBs, including the recent report by Rogers Corporation who generated a type of magnetic PCBs by packing magnetic powders into polymers. However, this type of magnetic PCBs only demonstrated a magnetic relative permeability of 5, also with large loss tangents at 400˜500 MHz. In addition, Rogers Corporation's method works with limited PCB sizes, but is heavy and hard to machine.
[0061] This application discloses a new way of manufacturing magnetic PCBs by spin spray deposition of high-quality low-cost thick ferrite films onto thin PCBs, such as FR4, and using prepreg or epoxy and hot-pressing for forming thick PCBs. A ferrite film is formed on a substrate during aqueous ferrite solution deposition. Substrate spinning will improve thickness uniformity of the ferrite layer formed on substrate and rinse excess oxide particles away from the substrate surface. The formation process is performed at temperatures less than about 100° C., which is particularly advantageous given the temperature sensibility of PCBs.
[0062] Embodiments of the invention may be used to deposit ferrite films on various substrate materials. Preferably deposition is at low temperatures such as about 100° C. or less. The process depends on the controlled atomization of an aqueous oxidizing solution and an aqueous chloride solution of metal cations sprayed sequentially on the surface of a rotating, heated substrate.
[0063] In reference to
[0064] An example spinning table machine system 150 is shown in
Example 1: Use of the Spin-Spray Ferrite Deposition System
[0065] A six-liter oxidizing solution containing 0.84 g NaNO.sub.2 and 69 g CH.sub.3COONa is prepared and held in a container. Similar, a six-liter cation ferrite solution containing FeCl.sub.2 (9.21 g), ZnCl.sub.2.6H.sub.2O (0.246 g) and MnCl.sub.2.6H.sub.2O (0.867 g) is also prepared and held in a container. Bubbled nitrogen may be used in both containers to prevent premature oxidation of the cations and NaNO.sub.2. These solutions were respectively flew through a 0.125″ diameter polypropylene tube to the spray nozzles 101 and 105.
[0066] To begin a deposition run, FR4 substrates were placed on a plate onto the spin table with a spindle with a carbon tape. After the rpm of spindle were set, and the rotation was initiated. Preferably the rotational speeds were operated in the range of about 40 rpm to about 300 rpm. The substrate surface is then heated to a specified temperature, and it rotates on the spindle, and it is exposed to alternating sprays of oxidizer and cation solutions. Spacing between nozzles and distance between the bottom of the nozzle and the substrate surface are part of the testing parameters. Preferably, the nozzles are placed directly over substrates, and the distance between nozzles and the surface of substrates is preferably in the range of about 1 inch to about 5 inches. Typically, the deposition time for an approximately 3 μm thick ferrite film at 90 rpm rotation speed is about 180 minutes.
[0067] Typically, a higher rpm yields better quality films, for instance it may increase the smoothness of the formed ferrite film. After metal-ferrite film formation, the substrate panel is covered with a blackish-gray layer of ferrite material.
[0068] This spin spray methods are capable of depositing MnxZn(1-x)-ferrite, where x is the ratio between Mn and Zn, films with an ultra-high relative permeability if different amount of MnCl.sub.2 and ZnCl.sub.2 are used in the cation ferrite solution. For example, a relative permeability of greater than 2000 and high saturation magnetic flux density Bs=0.85 Tesla may be obtained at 50/50 ratio of Mn0.5Zn0.5-ferrite composition. The spin spray reaction solutions may be composed of a chemical formula of FeCl.sub.2 and MCl.sub.2, where M is a metal ion like Zn, Co, Mn, Ni, or other metal ions, or the mixture of them, while the oxidizing solution is a mixture of a oxidant buffer, such as an acetate, CH.sub.3COONa, CH.sub.3COOK, CH.sub.3COONH.sub.4 and an oxidant, such as NaNO.sub.2. The deposition reaction temperature preferably ranges between 70-120° C., and the speed of rotation of the supporting table at between 120-200 rpm for high quality films. The heating temperature, speed and rotation may be adjusted for optimum reaction and deposition results.
[0069] In reference to
[0070] Alternatively coated substrates may be first formed by depositing ferrite on a larger substrate and cutting the larger coated substrate into several smaller ferrite coated pieces and to stack the smaller pieces together. A large substrate may be, for example 12 inch by 12 inch as shown in
[0071] In some cases, the ferrite layer of a coated substrate may be first cleaned before they are used to form an assembly. The number of coated layers can very, for example, at least 2 and less than 100, and there are stacked tightly together to form a layered assembly in a manner such that the ferrite layer of one coated substrate is in directly pre-preged with the uncoated substrate surface of another coated substrate.
[0072] Compressing the layered assembly may include positioning the layered assembly in a press and applying pressure to the layered assembly, forcing the coated substrates together. The pressure applied on the surface of the substrate may vary between 0.65 psi to 3.5 psi.
[0073] After a layer assembly is assembled in a press, the press is then heated to a temperature less than the transition temperature of one or more of the substrates in the layered assembly. The layered assembly may be heated at a ramp rate between 2° C./min and 30° C./min. In one example, a layered assembly is heated to a temperature between 120° C. to 250° C. After achieving the desired temperature, the layered assembly may continue to be heated for at least 30 mins or at least 1 hour. In some cases, the layered assembly is heated up to 3 hours or more. In certain cases, the layered assembly is heated for a specified desired time, the annealed layered assembly is left to cool down without disturbance.
[0074] Advantages of spin-spray ferrite deposition and the magnetic PCBs assembly methods described herein include providing high permeability thick PCBs (0.5˜2 mm thick PCBs) with multilayered ferrite films, generating thick high permeability PCBs with a relative permeability μr>100 at >300 MHz.
Example 2: Ferromagnetic Resonance (FMR) Spectroscopy Measurement
[0075] FMR is coupling between an electromagnetic wave and the magnetization of a medium through which the electromagnetic wave passes. This coupling induces a significant loss of power of the wave. The power is absorbed by the precessing magnetization of the material and lost as heat. For this coupling to occur, the frequency of the incident wave must be equal to the precession frequency of the magnetization (Larmor frequency) and the polarization of the wave must match the orientation of the magnetization.
[0076] The Ferromagnetic Resonance (FMR) Spectroscopy is a key technique used to measure the ferromagnetic resonance (FMR) line width for metallic magnetic thin film samples. The typical working frequency of FMR system is 1 GHz to 10 GHz or higher.
[0077] FMR arises from the precessional motion of the (usually quite large) magnetization M of a ferromagnetic material in an external magnetic field H. The magnetic field exerts a torque on the sample magnetization which causes the magnetic moments in the sample to precess. Ferromagnetic resonance (FMR) is a useful technique in the measurement of magnetic properties of variety of magnetic media from bulk ferromagnetic materials to nano-scale magnetic thin films. The precessional motion of a magnetization of a ferromagnetic material in relation to the applied external magnetic field is known as the FMR. In the actual process of resonance from macroscopic point of view, the energy is absorbed from rf transverse magnetic field hrf, which occurred when frequency matched with precessional frequency. Microscopically, the applied field forges a Zeeman splitting in the energy levels, and the microwave excites magnetic dipole transitions between these split levels. The precession frequency depends on the orientation of the material and the magnitude of the applied magnetic field. It has the capability to measure all the most important parameters of the magnetic material i.e., static properties: curie temperature, total magnetic moment, relaxation mechanism, elementary excitations; and the dynamic properties. The dynamic properties of magnetic materials can be feasibly perplexed by FMR, by excitation of standing spin waves due to magnetic pinning.
[0078] FMR is usually measured at microwave frequencies (from a few GHz up to about 100 GHz) and the applied magnetic fields range from 0 up to a few T. Testing samples are placed in FMR spectrometer. The microwave power is supplied by klystron or other microwave generator. The power reflected from the device under test (DUT) containing the sample is measured by microwave detector. DUT can be microwave cavity, short-ended waveguide or other microwave device.
[0079] In-plane FMR measurements were performed in a JEOL, JES-FA 300 (X-band at ω=8.969 GHz with the power 1 mW) spectrometer at room temperature. As shown in
[0080] FMR spectrum under a series of magnetic fields are then converted into magnetic permeability μ (Greek mu) that is thus defined as μ=B/H. Magnetic flux density B is a measure of the actual magnetic field within a material considered as a concentration of magnetic field lines, or flux, per unit cross-sectional area, in an external magnetic field H.
Example 3: Four and Eight Layered Ferrite Filmed PCB Assemblies
[0081] 3 μm MnZn Ferrite thin film was deposited on a 100 μm thick FR4 substrate at 90° C.-120° C. by inventor's home-made 24 inch-diameter spin spray system as shown in FIG. 1B. After deposition, the ferrite was washed thoroughly with deionized water. The layered substrate was cut into 2″×2″ squares, and 4 of the 2″×2″ squares were stacked with 50 μm prepreg and formed four layered assembly. The layered assembly was placed in a pressure of 0.65 psi, and at the same time the layer assembly was heated at 120° C. for 30 mins. After heating, the laminate was cooled down under pressure of 0.65 psi. In
[0082] Two four-layered ferrite filmed PCB assemblies were stacked 50 μm prepreg together and formed 8 layered ferrite filmed PCB assembly. In
Example 4: NiZn Ferrite Thin Filmed TMM10i PCB
[0083] Using FeCl.sub.2 (9.21 g), ZnCl.sub.2.6H.sub.2O (0.246 g) and NiCl.sub.2.6H.sub.2O (1.638 g) as ferrite solution and the process described in Example 1, 10 μm NiZn ferrite thin film was deposited on a TMM10i substrate at 90° C. by spin spray as described in Example 1. After deposition, the ferrite was washed thoroughly with deionized water.
Example 5: Multi-Layered MnZn and NiZn Ferrite Filmed PCB Assemblies
[0084] The experiments in Examples 3 and 4 were repeated by busing Ni—Zn ferrite and Mn—Zn Ferrite. Briefly varying number of layers of Ni—Zn ferrite filmed PCBs or Mn—Zn ferrite filmed PCBs were hot-pressured together with 50 μm pre-preg resulting with laminates thickness ranging from about 100 μm to about 10 mm. The laminated Ferrite Filmed PCB Assemblies were further measured for the real permeability.
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[0091] The above measured data indicate that magnetic PCBs are functionally superior and stable in frequencies 10-800 MHz.
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Example 6: Antennas Using Ferrite Filmed PCB Assemblies
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Example 7: Inductors Using Ferrite Filmed PCB Assemblies
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[0097] Having described at least one of the preferred embodiments of the present invention with reference to the accompanying drawings, it will be apparent to those skills that the invention is not limited to those precise embodiments, and that various modifications and variations can be made in the presently disclosed system without departing from the scope or spirit of the invention. Thus, it is intended that the present disclosure cover modifications and variations of this disclosure provided they come within the scope of the appended claims and their equivalents.
[0098] Additional general background, which helps to show variations and implementations, may be found in the following publications, all of which are hereby incorporated by reference herein for all purposes: [0099] 1. “Antennas”, Kraus, J. D. 2nd Ed, MacGraw Hill, 1988; [0100] 2. “Broadband Ferrite Loaded Loop Antenna”, Meloling John Harold, Dawson David Carlos, Hansen Peder Meyer, U.S. Pat. No. 7,737,905, 2010; [0101] 3. “Ferrite Antenna”, Huf Huelsbeck, Fuerst G, and Neosid Pemetzrieder, U.S. Pat. No. 6,919,856, 2005; [0102] 4. “Twin coil antenna”, Christopher M. Justice, U.S. Pat. No. 6,529,169, 2003; [0103] 5. “Millimeter thick magnetic print circuit boards (PCBs) with a high relative permeability of 50˜150 and related devices and systems” Xiaoling Shi, Hui Lu, Nian Sun, Winchester Technologies, LLC, Burlington, Mass. 01803. US Patent application.
[0104] None of the description in the present application should be read as implying that any particular element, step, or function is an essential element which must be included in the claim scope: THE SCOPE OF PATENTED SUBJECT MATTER IS DEFINED ONLY BY THE ALLOWED CLAIMS. Moreover, none of these claims are intended to invoke paragraph six of 35 USC section 112 unless the exact words “means for” are followed by a participle. The claims as filed are intended to be as comprehensive as possible, and NO subject matter is intentionally relinquished, dedicated, or abandoned.