CONNECTION SYSTEM AND METHOD FOR AN OPTIMIZED JOINING PROCESS OF BUSBARS
20220165656 · 2022-05-26
Assignee
Inventors
Cpc classification
B23K20/002
PERFORMING OPERATIONS; TRANSPORTING
B23K2101/36
PERFORMING OPERATIONS; TRANSPORTING
H01L23/50
ELECTRICITY
B23K20/02
PERFORMING OPERATIONS; TRANSPORTING
H01L21/603
ELECTRICITY
H01L21/4842
ELECTRICITY
International classification
H01L23/50
ELECTRICITY
H01L21/48
ELECTRICITY
Abstract
A connection system for an optimized joining process of busbars, including at least one busbar of a first electronic circuit and at least one busbar of a second electronic circuit. The at least two electronic circuits represent individual components, and the individual components are connectable to one another via the at least one busbar. The at least one of the at least one busbar of the first electronic circuit is mechanically processed.
Claims
1. A connection system for an optimized joining process of busbars, comprising: at least one busbar of a first electronic circuit and at least one busbar of a second electronic circuit, wherein the at least two electronic circuits represent individual components, wherein the individual components are connectable to one another via the at least one busbar, wherein at least one of the at least one busbar of the first electronic circuit is mechanically processed.
2. The connection system as claimed in claim 1, wherein the at least one of the at least one busbar of the first electronic circuit is mechanically processed in such a way that it forms a predefined intended bending point.
3. The connection system as claimed in claim 1, wherein at least a first of the at least two circuits is a semiconductor power module and a second of the at least two circuits is a capacitor, in particular an intermediate circuit capacitor.
4. The connection system as claimed in claim 2, wherein the intended bending point is formed as a minimization of a material thickness of the busbar or as an at least partially applied passage.
5. The connection system as claimed in claim 2, wherein the intended bending point is formed from a combination of a minimization of a material thickness of the busbar and a passage.
6. The connection system as claimed in claim 4, wherein the minimization or the passage is formed as an incision, hole, notch, recess, or material removal.
7. The connection system as claimed in claim 1, wherein the intended bending point is formed from a combination of transverse and longitudinal material removal.
8. The connection system as claimed in claim 1, wherein the intended bending point is configured to provide a homogeneous stress of a molding compound of the first circuit and/or a potting compound of the second circuit.
9. A method for joining two electronic circuits with the aid of an above-described connection system, comprising the following steps a) mechanically processing at least one busbar of a first electronic circuit and thus producing an intended bending point in the at least one busbar of the first electronic circuit, b) arranging the at least one mechanically processed busbar of the first electronic circuit to be overlapping with at least one busbar of a second electronic circuit, c) applying a uniformly distributed joining force to the busbars arranged to be overlapping one another, both in the region of the first electronic circuit and in the region of the second electronic circuit, d) pressing down with a joining force on the busbars in the region of the produced intended bending point, e) deforming at least the at least one busbar of the first electronic circuit, but in particular the busbars arranged to be overlapping one another, in the region of the intended bending point, f) producing a firm connection between the busbars of the at least two circuits.
10. The method as claimed in claim 9, wherein the connection between the busbars is welded.
11. The connection system as claimed in claim 4, wherein the minimization or the passage is formed as an incision, hole, notch, recess, or material removal.
12. The connection system as claimed in claim 2, wherein the intended bending point is formed from a combination of transverse and longitudinal material removal.
13. The connection system as claimed in claim 3, wherein the intended bending point is formed from a combination of transverse and longitudinal material removal.
14. The connection system as claimed in claim 4, wherein the intended bending point is formed from a combination of transverse and longitudinal material removal.
15. The connection system as claimed in claim 5, wherein the intended bending point is formed from a combination of transverse and longitudinal material removal.
16. The connection system as claimed in claim 6, wherein the intended bending point is formed from a combination of transverse and longitudinal material removal.
17. The connection system as claimed in claim 2, wherein the intended bending point is configured to provide a homogeneous stress of a molding compound of the first circuit and/or a potting compound of the second circuit.
18. The connection system as claimed in claim 3, wherein the intended bending point is configured to provide a homogeneous stress of a molding compound of the first circuit and/or a potting compound of the second circuit.
19. The connection system as claimed in claim 4, wherein the intended bending point is configured to provide a homogeneous stress of a molding compound of the first circuit and/or a potting compound of the second circuit.
20. The connection system as claimed in claim 5, wherein the intended bending point is configured to provide a homogeneous stress of a molding compound of the first circuit and/or a potting compound of the second circuit.
Description
BRIEF DESCRIPTION OF THE FIGURES
[0026] The invention is schematically illustrated in the drawings with the aid of embodiments and is described in more detail below with reference to the drawings, wherein the same components are identified by the same reference signs. In the figures:
[0027]
[0028]
[0029]
[0030]
[0031]
[0032]
[0033]
[0034]
[0035]
DETAILED DESCRIPTION
[0036]
[0037] The busbar 13 has an intended bending point 15 which was formed by the introduction of mechanical processing onto the busbar 13. At least a minimization of a material thickness of the busbar 13 or a passage in the material of the busbar 13 is achieved by the mechanical processing and the intended bending point 15 is thus defined.
[0038] In addition,
[0039]
[0040]
[0041] In the process, the busbars 13, 14 are deformed in the region of the first of the two circuits 11. Both the first busbar 13 and the second busbar 14 are deformed here. The first busbar 13 is deformed in particular along the intended bending point 15. The first busbar 13 buckles along the intended bending point 15 due to the mechanical processing at the points predetermined by the mechanical processing.
[0042] A firm connection is established between the busbars 13, 14 of the two circuits 11, 12 and thus a firm connection is established between the power module and the intermediate circuit capacitor.
[0043]
[0044] In this case, voltages occur in a molding compound of the first circuit 11, in the present case the capacitor. This tension in the material can result in the formation of cracks, which can result in the material flaking off and thus a direct selection of the power module. It is also possible for moisture to penetrate due to the formation of cracks over the entire service life, which can also result in damage and failure.
[0045]
[0046] In this case, tensions occur in a potting compound of the second circuit 12, the power module.
[0047]
[0048]
[0049]
[0050]
[0051]
LIST OF REFERENCE SIGNS
[0052] 10 connection system [0053] 11 first electronic circuit [0054] 12 second electronic circuit [0055] 13 at least one busbar of the first electronic circuit [0056] 14 at least one busbar of the second electronic circuit [0057] 15 intended bending point