Reflectometry system for detecting faults on a hardened multipoint connector of an electrical network

Abstract

The invention relates to a reflectometry system for detecting faults on a hardened multipoint connector of an electrical network, of the type that comprises a measuring probe, characterized in that it comprises an interfacing and impedance matching part that is electrically suitable for mounting on the connector to be tested and comprises a body provided with at least one element in the form of a collector ring for the contact masses of the connector and a measuring opening for the probe of the reflectometry system.

Claims

1. A reflectometry system for detecting faults on a hardened multipoint connector of an electrical network, comprising: (i) a measuring probe, and (ii) an interfacing and impedance matching part that is electrically compatible with and configured for mounting on a connector to be tested comprising a plurality of contacts, and comprises a body provided with at least one element in the form of a collector ring adapted to connect the contacts of the connector to a same mass except a contact of the connector to be tested, and a measuring opening for the measuring probe.

2. The reflectometry system according to claim 1, wherein the at least one element in the form of a collector ring is associated with a probe receptacle for receiving and positioning the measuring probe across from the contact of the connector to be tested.

3. The reflectometry system according to claim 1, wherein the at least one element in the form of a collector ring is associated with electrical spring contacts of the connector to be tested to preserve a functional endurance of the connector.

4. The reflectometry system according to claim 1, wherein the at least one element in the form of a collector ring is removably associated with the body of the interfacing and impedance matching part, so as to be able to be replaced by another element in the form of an interchangeable collector ring having an opening for measuring access to a contact different from the connector in order to test the different contact.

5. The reflectometry system according to claim 1, wherein the at least one element in the form of a collector ring is separately associated with the body of the interfacing and impedance matching part, so as to be able to be moved and reassembled thereupon, so that the measuring opening provides access to different contacts of the connector in order to test the different contacts.

6. The reflectometry system according to claim 1, wherein the measuring probe is connected to an oscilloscope.

Description

(1) The invention will be better understood upon reading the following description, provided solely as an example, and done in reference to the appended drawings, in which:

(2) FIG. 1 shows a schematic sectional view of a reflectometry system of the state of the art;

(3) FIG. 2 shows a schematic sectional view of a reflectometry system according to the invention;

(4) FIG. 3 shows an end view of an interfacing and impedance matching part included in the composition of a system according to the invention; and

(5) FIG. 4 illustrates an electrical spring contact used in a system according to the invention.

(6) These figures, and in particular FIG. 1, show a reflectometry system of the state of the art.

(7) This system is used to detect faults on a hardened multipoint connector of an electrical network.

(8) This connector is designated by general reference 1 in this FIG. 1, and it includes several electrical contacts, such as the contact designated by general reference 2 according to this same figure.

(9) The reflectometry system also includes a measuring probe, designated by general reference 3, associated with an oscilloscope, designated by general reference 4.

(10) This probe is suitable for being placed in contact with each electrical contact of the connector, in order to test the latter and potentially detect a fault of the corresponding network.

(11) As previously indicated, this structure has a certain number of drawbacks, in particular in terms of the difficulty of positioning the probe correctly, and therefore in terms of the quality and reproducibility of the corresponding measurement.

(12) To resolve these problems, in a reflectometry system according to the invention, an interfacing and impedance matching part is used including a collector ring for the masses and a measuring opening for the probe.

(13) FIGS. 2 and 3 show an exemplary embodiment of such a system.

(14) In these figures, the hardened multipoint connector of the electrical network is designated by general reference 10, and it still includes contacts, such as the contact designated by general reference 11.

(15) The system according to the invention includes an interfacing and impedance matching part designed to be mounted on the connector to be tested, this interfacing and impedance matching part being designated by general reference 12.

(16) This interfacing and impedance matching part is suitable for being mounted on the connector to be tested 10.

(17) This part includes a body designated by general reference 13 in these figures, this body being provided with at least one element in the form of a collector ring for the contact masses of the connector, this ring being designated by general reference 14.

(18) The body and the ring also include a measuring opening to allow the insertion of the probe of the reflectometry system, this opening for example being designated by general reference 15 in FIG. 3.

(19) Indeed, and as illustrated in FIG. 2, the element in the form of a collector ring for the masses is also associated with means for receiving and positioning the measuring probe across from a contact of the connector to be tested.

(20) In FIG. 2, these means for receiving and positioning the probe are designated by general reference 16 (e.g., a probe receptacle) and the probe is designated by general reference 17.

(21) Conventionally, the latter is still connected to an oscilloscope, designated by general reference 18.

(22) As is also illustrated in these figures and in particular in FIG. 2, the element 14 in the form of a collector ring for the contact masses is removably associated with the body 13 of the interfacing part.

(23) This then for example makes it possible to replace this element with another interchangeable element in the form of a collector ring for the masses, having a measuring opening for access to a different contact of the connector in order to test it.

(24) Of course, other embodiments can be considered, and for example, the element in the form of a collector ring for the contact masses can also be separately associated with the body of the interfacing part, so as to be able to be moved and reassembled thereupon, so that its measuring opening provides access to different contacts of the connector in order to test them.

(25) Lastly, and as illustrated in FIG. 4, it should be noted that the element in the form of a collector ring for the masses can be associated with electrical spring contacts, like that designated by general reference 19 in this FIG. 4, in order to preserve the functional endurance of the connector.

(26) One can then see that such a structure has a certain number of advantages relative to the systems of the state of the art.

(27) Indeed, the use of the interfacing part, as previously described, makes it possible to improve the quality of the contact and therefore the quality of the measurement and the reproducibility thereof, while being easier to implement.

(28) Of course, still other embodiments may be considered.