Laser bar device having multiple emitters
11742634 · 2023-08-29
Assignee
Inventors
Cpc classification
H01S5/34333
ELECTRICITY
B82Y20/00
PERFORMING OPERATIONS; TRANSPORTING
H01S5/4012
ELECTRICITY
H01S5/0087
ELECTRICITY
International classification
H01S5/40
ELECTRICITY
B82Y20/00
PERFORMING OPERATIONS; TRANSPORTING
Abstract
Method and devices for emitting electromagnetic radiation at high power using nonpolar or semipolar gallium containing substrates such as GaN, AlN, InN, InGaN, AlGaN, and AlInGaN, are provided. The laser devices include multiple laser emitters integrated onto a substrate (in a module), which emit green or blue laser radiation.
Claims
1. A device comprising: a laser bar device comprising: a common base member having a region containing gallium and nitrogen material; a plurality of laser devices arranged in parallel alignment and disposed on a surface of the common base member, each of the laser devices of the plurality of laser devices being a ridge laser device having an active region; a plurality of emitters, one emitter of the plurality of emitters provided for each of the laser devices, the plurality of emitters being characterized by an average operating power, each of the plurality of emitters being characterized by an emission of electromagnetic radiation within a wavelength range of between 395 nm and 480 nm, and each of the laser devices being characterized by a length and a width; at least one collimating optic coupled to the plurality of emitters; and an electrode electrically coupled to the laser devices, wherein total output power of the laser bar device is greater than 5 W.
2. The device of claim 1 wherein the active region of each of the plurality of laser devices is substantially the same as the active region of others of the plurality of laser devices.
3. The device of claim 1 wherein the plurality of emitters are characterized by an average operating power of at least 100 mWatts per emitter, and/or the total output power of the laser bar device is greater than 10 W.
4. The device of claim 1 wherein the electrode is a common electrode electrically coupled to each of the laser devices.
5. The device of claim 1 wherein the electrode includes a plurality of electrodes, and each of the plurality of electrodes are separately coupled to at least one of the plurality of emitters.
6. A lighting system comprising the device of claim 1.
7. A display system comprising the device of claim 1.
8. A package selected from a hermetically sealed package, an environmentally sealed package, or an open package, the package comprising the device of claim 1.
9. A system comprising the device of claim 1, the system further comprising: a package configured to enclose the laser bar device; a cooler configured to remove thermal energy from the laser bar device; a power source electrically coupled to the laser bar device; and an application configured with the device, wherein the application is selected from a general lighting application, a laser application, a projection application, or a display application.
10. The device of claim 1 wherein a lateral spacing between adjacent ones of the plurality of emitters is in a range of 2 μm to 200 μm.
11. The device of claim 1 wherein a length of each of the plurality of emitters is in a range of between 300 μm to 3000 μm, and/or a width of each of the plurality of emitters is in a range of between 1 μm to 20 μm.
12. The device of claim 1 further comprising a phosphor material operably coupled to the at least one collimating optic and configured to interact with the electromagnetic radiation from the plurality of emitters to cause a shift in wavelength of the electromagnetic radiation from a first wavelength range to a second wavelength range.
13. The device of claim 1 further comprising a micro-channel cooler thermally coupled to the laser bar device.
14. A device comprising: a common base member having a region containing gallium and nitrogen material; at least three laser devices arranged in parallel alignment and overlying a surface of the common base member, each of the laser devices of the at least three laser devices being a ridge laser device having an active region; a plurality of emitters, one emitter of the plurality of emitters provided for each of the laser devices, the plurality of emitters being characterized by an average operating power, each of the plurality of emitters being characterized by an emission of electromagnetic radiation at a wavelength that is substantially the same as the wavelength of others of the plurality of emitters; at least one collimating optic coupled to the plurality of emitters; an electrode electrically coupled to the plurality of emitters; and a member operably coupled to the substrate and configured for cooling purposes; wherein total output power of the laser devices is greater than 5 W.
15. The device of claim 14 further comprising a phosphor material operably coupled to the collimating optic and configured to interact with the electromagnetic radiation from the plurality of emitters to output substantially white light.
16. The device of claim 14 wherein the plurality of emitters are characterized by an average operating power of at least 100 mWatts per emitter, and/or the total output power of the laser devices is greater than 10 W.
17. The device of claim 14 wherein the electrode includes a plurality of electrodes, and each of the plurality of electrodes are separately coupled to at least one of the plurality of emitters.
18. The device of claim 14 wherein the plurality of emitters are characterized by an emission of electromagnetic radiation within a wavelength range of between 395 nm and 480 nm.
19. The device of claim 14 wherein the member includes a micro-channel cooler thermally coupled to the common base member.
20. A system comprising: a laser bar, the laser bar comprising: a common base member having a region containing gallium and nitrogen material; a plurality of laser devices arranged in parallel alignment and disposed on a surface of the common base member, each of the laser devices of the plurality of laser devices being a ridge laser device; a plurality of emitters, one emitter of the plurality of emitters provided for each of the laser devices, the plurality of emitters being characterized by an average operating power, each of the plurality of emitters being characterized by an emission of electromagnetic radiation within a wavelength range of between 395 nm and 480 nm, and each of the laser devices being characterized by a length and a width; at least one collimating optic coupled to the plurality of emitters; and an electrode electrically coupled to the laser bar, wherein total output power of the laser bar is greater than 5 W; a package configured to enclose the laser bar; a cooler configured to remove thermal energy from the laser bar; a power source electrically coupled to the laser bar; and an application configured with the laser bar, wherein the application is selected from a general lighting application, a laser application, a projection application, or a display application.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
(12)
(13)
(14)
(15)
(16)
(17)
(18)
(19)
(20)
DETAILED DESCRIPTION
(21) Certain embodiments provided by the present disclosure high power GaN-based laser devices and the methods for making and using these laser devices. Specifically, laser devices are configured to operate with 0.5 to 5 W or 5 to 20 W or higher output power in the blue or green wavelength regimes. In certain embodiments, laser devices are manufactured from bulk nonpolar or semipolar gallium and nitrogen containing substrates. As mentioned above, the output wavelength of the laser devices can be in the blue wavelength region of 430-480 nm and in the green wavelength region 500-545 nm. It is to be appreciated that laser devices according to embodiments of the present disclosure can also operate in wavelengths such as violet (395 to 425 nm) and blue-green (475-505 nm). The laser devices can be used in various applications, such as in projection systems where high power laser are used to illuminate images and videos.
(22) Certain projectors using a laser pumped phosphor design were first commercialized in 2010 by Casio in the 1000-3000 lumen regime for education, board rooms, entertainment, and other applications. The laser-phosphor design approach has the advantage of long reliability (>10k hour lifetime) due to the use of reliable laser diode technology, and therefore favorably compares to prior designs, which utilized bulky, inefficient, and unreliable lamps (<2000 hour lifetime). Moreover, the laser phosphor approach is superior to other potential designs such as LEDs because the laser-phosphor approach directs high power laser light (20 watts to 40 watts of optical) onto a small spot on a phosphor (1 mm to 2 mm diameter), that results in visible light generation that has high spatial brightness and that can then be collimated efficiently to illuminate a display generating chip (DLP and LCOS panels) to produce images. Because LEDs are more extended sources with roughly 1-2 watts per mm.sup.2 output, it is not possible to focus 20-40 watts of LED optical emission onto a small 1 mm spot and then collimate the light efficiently to illuminate a display generating chip (i.e., DLP and LCOS panels) to produce images.
(23) Limitations exist with conventional laser-phosphor designs. That is, the laser-phosphor designs utilize a large number of individually packaged laser diode devices (20-30 devices) and external lenses and mirrors to steer and focus the 20-30 beams onto a spot on the phosphor. This approach is practical because it utilizes the individually mounted laser diodes, which are available in packages (“TO-can packages” such as TO-56 and TO-9) that have been utilized in the optical storage and telecommunications markets and other specialty laser markets. The approach of using individually packaged devices has substantial challenges, which we have discovered:
(24) The cost is high for this approach since each of the 20-30 laser emitters has its own hermetically sealed package, and an individual lens is actively aligned and affixed to each laser package, and then steered with additional mirrors and optics onto the phosphor.
(25) High cost is also required in the assembly process because, great care, substantial alignment time, and high precision tooling must be utilized so that each beam is collimated and steered onto the phosphor, and that each beam is positioned relative to all of the other beams in order to deliver the desired spot onto the phosphor with the desired pattern and uniformity.
(26) High cost is required since the individually packaged laser cans are designed so that the collimating optics can only be positioned far from the chip at the outside of the window of the can, and because the mechanical tolerances of each package are too high to allow for a monolithic lens or alignment approach of multiple optics to multiple lasers at one time.
(27) The projector form factor is large because the laser diodes are mounted independently on TO-can packages, and the packages are then mounted in a larger assembly in which the fins are cooled with fans. This can drive the height of the projector to be larger than otherwise necessary (i.e., 2″ or more), reducing the slim profile and functionality, which is desired by consumers who desire portability.
(28) Projector efficiency and reliability are a challenge since typically, the beam spot on the phosphor is not uniform and has hot spots with high intensity, and the phosphor can overheat locally causing substantial reduction in emission and lifetime. In extreme cases, the phosphor can be burned causing catastrophic damage to the projector.
(29) Projector efficiency and cost are also a challenge since the pattern of the laser spot is not matched to the geometry of the display generating chip, then beam from the phosphor needs to be expanded to overfill the display generating chip resulting in substantial light loss (as much as 50% loss).
(30) Projector reliability is challenging due to the thermal aspects of this design approach since the lasers are mounted independently on TO-can packages, and the thermal path has substantial resistance between the active region of the laser diode chip and the case of the packaged device (10-20° C. per Watt). The packages are then mounted in a larger assembly whose fins are cooled with fans. This design causes the laser active area to operate at high temperatures, which decreases their efficiency and results in more heat generation and higher costs and reduced reliability. Operating temperatures for the laser case is limited to 50° C., which makes it difficult for the projectors to operate in hot environments such as emerging countries schools where air conditioning is not available. These and other limitations may be overcome by the present system and apparatus, which will be further described below.
(31)
(32) In certain embodiments, the GaN surface orientation is substantially in the {20-21} orientation, and the device has a laser stripe region 101 formed overlying a portion of the off-cut crystalline orientation surface region. Laser stripe region 101 has a width 103 and a length 102. For example, the laser stripe region is characterized by a cavity orientation substantially in a projection of a c-direction, which is substantially normal to an a-direction. In certain embodiments, the laser stripe region has a first end 104 and a second end 105. In certain embodiments, the device is formed on a projection of a c-direction on a {20-21} or an offcut of a {20-21} gallium and nitrogen containing substrate having a pair of cleaved mirror structures, which face each other.
(33) In certain embodiments, a device has a first cleaved facet provided on the first end 104 of the laser stripe region and a second cleaved facet provided on the second end 105 of the laser stripe region 101. The first cleaved facet is substantially parallel with the second cleaved facet. Mirror surfaces are formed on each of the cleaved facets. The first cleaved facet provides a first mirror surface by a top-side skip-scribe scribing and breaking process. The scribing process can use any suitable technique, such as a diamond scribe or laser scribe. In certain embodiments, the first mirror surface has a reflective coating selected from silicon dioxide, hafnia, and titania, tantalum pentoxide, zirconia, or combinations of any of the foregoing. Depending upon the embodiment, the first mirror surface can also have an anti-reflective coating.
(34) Also, in certain embodiments, the second cleaved facet provides a second mirror surface by a top side skip-scribe scribing and breaking process. In certain embodiments, the scribing is diamond scribed or laser scribed. In certain embodiments, the second mirror surface comprises a reflective coating as described for the first surface.
(35) In certain embodiments where the device is formed on a nonpolar Ga-containing substrate, the device is characterized by spontaneously emitted light polarized substantially perpendicular to the c-direction. The light has a polarization ratio of greater than about 0.1 to about 1 perpendicular to the c-direction, and a wavelength ranging from about 430 nanometers to about 480 nanometers (blue), and in certain embodiments, from about 500 nanometers to about 540 nanometers (green). The spontaneously emitted light is highly polarized and has a polarization ratio of greater than 0.4. In certain embodiments where the device is formed on a semipolar {20-21} Ga-containing substrate, the device is characterized by spontaneously emitted light polarized substantially parallel to the a-direction, and in certain embodiments, perpendicular to the cavity direction, which is oriented in the projection of the c-direction.
(36) In certain embodiments, the present disclosure provides an alternative device structure capable of emitting light having a wavelength of 501 nm and greater in a ridge laser embodiment. In certain embodiments, a device is provided with one or more of the following epitaxially grown elements:
(37) an n-GaN cladding layer with a thickness from 100 nm to 3000 nm with Si doping level of 5E17 cm.sup.−3 to 3E18 cm.sup.−3;
(38) an n-side SCH layer comprised of InGaN with a molar fraction of indium between 2% and 10% and a thickness from 20 to 200 nm;
(39) multiple quantum well active region layers comprising at least two 2.0 nm to 8.5 nm thick InGaN quantum wells separated by GaN or InGaN barrier layers having a thickness of 1.5 nm and greater, and in certain embodiments, up to about 12 nm thick;
(40) optionally, a p-side SCH layer comprising InGaN with a molar fraction of indium of between 1% and 10% and a thickness from 15 nm to 100 nm, or an upper GaN-guide layer;
(41) an electron blocking layer comprising AlGaN with a molar fraction of aluminum between 6% and 22% and a thickness from 5 nm to 20 nm, and doped with Mg.
(42) a p-GaN cladding layer with a thickness from 400 nm to 1000 nm with a Mg doping level of 2E17 cm.sup.−3 to 2E19 cm.sup.−3; and
(43) a p++-GaN contact layer with a thickness from 20 nm to 40 nm with a Mg doping level of 1E19 cm.sup.−3 to 1E21 cm.sup.−3.
(44) In certain embodiments, the laser devices are free from aluminum bearing cladding layers and/or free from aluminum bearing cladding positioned in the vicinity of the light emitting quantum well layers. In certain embodiments, a device will not contain aluminum bearing cladding layers within 500 nm to 150 nm of the quantum well layers where the optical field intensity in the laser mode is very high. In certain embodiments, devices provided by the present disclosure are believed to prevent detrimental characteristics of high temperature operation of the laser device.
(45)
(46) In certain embodiments, an n-type Al.sub.uIn.sub.vGa.sub.1-u-vN layer, where 0≤u, v, u+v≤1, is deposited on the substrate. The carrier concentration may be from about 10.sup.16 cm.sup.−3 and 10.sup.20 cm.sup.−3. The deposition may be performed using metalorganic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE).
(47) To fabricate a device, a bulk GaN substrate can be placed on a susceptor in an MOCVD reactor. After closing, evacuating, and back-filling the reactor (or using a load lock configuration) to atmospheric pressure, the susceptor can be heated to a temperature between about 900° C. to about 1200° C. in the presence of a nitrogen-containing gas. In certain embodiments, the susceptor is heated to approximately 900° C. to 1200° C. under flowing ammonia. A flow of a gallium-containing metalorganic precursor, such as trimethylgallium (TMG) or triethylgallium (TEG) is initiated, in a carrier gas, at a total rate between approximately 1 and 50 standard cubic centimeters per minute (sccm). The carrier gas may comprise hydrogen, helium, nitrogen, or argon. The ratio of the flow rate of the Group V precursor (ammonia) to that of the Group III precursor (trimethylgallium, triethylgallium, trimethylindium, trimethylaluminum) during growth is between about 2000 and about 12000 sccm. A flow of disilane in a carrier gas, with a total flow rate of between about 0.1 and 10 sccm, is initiated.
(48) In certain embodiments, the laser stripe region comprising a p-type gallium nitride layer 211 is made with an etching process, such as dry etching, or wet etching. The dry etching process is an inductively coupled process using chlorine bearing species or a reactive ion etching process using similar chemistries. The device also has an overlying dielectric region 208, which is etched to expose contact region 213. In certain embodiments, the dielectric region 208 is an oxide such as silicon dioxide or silicon nitride. The contact region 213 is coupled to an overlying metal layer 215. The overlying metal layer can be a multilayered structure containing gold and platinum (Pt/Au), nickel gold (Ni/Au).
(49) The laser device has active region 207, which can include one to ten quantum well regions or a double heterostructure region for light emission. As an example, following deposition of the n-type Al.sub.uIn.sub.vGa.sub.1-u-vN layer for a predetermined period of time, so as to achieve a predetermined thickness, an active layer is deposited with 2-10 quantum wells. The quantum wells comprise InGaN with GaN, AlGaN, InAlGaN, or InGaN barrier layers separating the quantum wells. In certain embodiments, the quantum well layers and barrier layers comprise Al.sub.wIn.sub.xGa.sub.1-w-xN and Al.sub.yIn.sub.zGa.sub.1-y-zN, respectively, where 0≤w, x, y, z, w+x, y+z≤1, where w<u, y and/or x>v, z so that the bandgap of the quantum well layer(s) is less than that of the barrier layer(s) and the n-type layer. In certain embodiments, the quantum well layers and barrier layers each have a thickness between about 1 nm and about 20 nm. The composition and structure of the active layer are chosen to provide light emission at a preselected wavelength. The active layer may be left undoped (or unintentionally doped) or may be n-type doped or p-type doped.
(50) In certain embodiments, the active region can also include an electron blocking region and/or a separate confinement heterostructure. The electron-blocking layer may comprise Al.sub.sIn.sub.tGa.sub.1-s-tN, where 0≤s, t, s+t≤1, with a higher bandgap than the active layer, and may be doped p-type. In certain embodiments, the electron blocking layer comprises AlGaN. In certain embodiments, the electron blocking layer comprises an AlGaN/GaN super-lattice structure with alternating layers of AlGaN and GaN, each layer having a thickness between about 0.2 nm and about 5 nm.
(51) As noted, the p-type gallium nitride structure is deposited above the electron blocking layer and active layer(s). The p-type layer is doped with Mg, to a level between about 10.sup.16 cm.sup.−3 and 10.sup.22 cm.sup.−3, and has a thickness between about 5 nm and about 1000 nm. The outermost 1 nm to 50 nm of the p-type layer is doped more heavily than the rest of the layer, so as to enable an improved electrical contact. The laser stripe is obtained by an etching process, such as dry etching. In certain embodiments, the device also has an overlying dielectric region, e.g,. silicon dioxide, which exposes contact region 213.
(52) In certain embodiments, electrical contact region 213 can be a reflective electrical contact. In certain embodiments, a reflective electrical contact comprises silver, gold, aluminum, nickel, platinum, rhodium, palladium, chromium, or the like. is the reflective electrical contact can be deposited by thermal evaporation, electron beam evaporation, electroplating, sputtering, or another suitable technique. In certain embodiments, the electrical contact serves as a p-type electrode for the optical device. In certain embodiments, the electrical contact serves as an n-type electrode for the optical device.
(53) The laser devices illustrated in
(54) In certain embodiments, the laser stripe length, or cavity length ranges from 300 μm to 3000 μm and is fabricated using growth and fabrication techniques described in U.S. Publication No. 2010/0316075, which is incorporated by reference herein for all purposes. As an example, laser diodes are fabricated on nonpolar or semipolar gallium containing substrates, where the internal electric fields are substantially eliminated or mitigated relative to polar c-plane oriented devices. It is to be appreciated that reduction in internal fields often enables more efficient radiative recombination. Further, the heavy hole mass is lighter on nonpolar and semipolar substrates, such that better gain properties from the lasers can be achieved.
(55) One difficulty with fabricating high-power GaN-based lasers with wide cavity designs is a phenomenon in which the optical field profile in the lateral direction of the cavity becomes asymmetric such that there are local bright regions and local dim regions. Such behavior is often referred to as filamenting and can be induced by lateral variations in the index of refraction or thermal profile which alters the mode guiding characteristics. Such behavior can also be a result of non-uniformities in the local gain/loss caused by non-uniform injection of carriers into the active region or current crowding where current is preferentially conducted through the outer regions of the laser cavity. That is, the current injected through the p-side electrode tends toward the edge of the etched p-cladding ridge/stripe required for lateral waveguiding, and is then conducted downward where the holes recombine with electrons primarily near the side of the stripe. Regardless of the cause, such filamenting or non-symmetric optical field profiles can lead to degraded laser performance as the stripe width is increased.
(56)
(57) The substrate shown in
(58) Depending on the application, a high power laser device can have a number of cavity members, n, which can range from 2 to 5, 10, or even 20. The lateral spacing, or the distance separating one cavity member from another, can range from 2 μm to 25 μm or larger, depending upon the requirements of the laser diode. In various embodiments, the length of the cavity members can range from 300 μm to 2000 μm, and in some cases as much as 3000 μm.
(59) In certain embodiments, laser emitters (e.g., cavity members) are arranged as a linear array on a single chip. The laser emitters are configured to emit blue or green laser radiation. As shown, emitters are substantially parallel to one another, and they can be separated by 3 μm to 15 μm, by 15 μm to 7 μm, by 75 μm to 150 μm, by 150 μm to 300 μm, by 300 μm to 500 μm, or by 500 μm to 1000 μm. The number of emitters in the array can vary from 3 to 15, from 15 to 30, from 30 to 50, from 50 to 100, or more than 100. Each emitter may produce an average output power of 25 mW to 50 mW, 50 mW to 100 mW, 100 mW to 250 mW, 250 mW to 500 mW, 500 mW to 1000 mW, or greater than 1 W. Thus the total output power of the laser device having multiple emitters can range from 200 mW to 500 mW, from 500 mW to 1000 mW, from 1 W to 2 W, from 2 W to 5 W, from 5 W to 10 W, from 10 W to −20 W, and greater than 20 W. The widths of the individual emitters can be from 1.0 μm to 3.0 μm, from 3.0 μm to 6.0 μm, from 6.0 to 10.0 μm, from 10 μm to 20.0 μm, and in certain embodiments, greater than 20 μm. The lengths of the emitters can range from 400 μm to 800 μm, from 800 μm to 1200 μm, from 1200 μm to 1600 μm, or in certain embodiments, greater than 1600 μm.
(60) The cavity member has a front end and a back end. The laser device is configured to emit laser radiation through the front mirror at the front end. The front end can have an anti-reflective coating or no coating 1, thereby allowing radiation to pass through the mirror without excessive reflectivity. Since substantially no laser radiation is to be emitted from the back end of the cavity member, the back mirror is configured to reflect the radiation back into the cavity. The back mirror has a highly reflective coating with a reflectivity greater than 85%.
(61)
(62) The cavity members are electrically coupled to each other by the electrode 404. The laser diodes, each having an electrical contact through its cavity member, share a common n-side electrode. Depending on the application, the n-side electrode can be electrically coupled to the cavity members in different configurations. In certain embodiments, the common n-side electrode is electrically coupled to the bottom side of the substrate. In another embodiment, the n-contact is on the top of the substrate, and the connection is formed by etching deep down into the substrate from the top and then depositing metal contacts. If the laser diodes are electrically coupled to one another in a parallel configuration when current is applied to the electrodes, all laser cavities can be pumped relatively equally. Since the ridge widths will be relatively narrow such as, for example, from 1.0 μm to 5.0 μm, the center of a cavity member will be in close vicinity to the edges of the ridge (e.g., the via) such that current crowding or non-uniform injection will be mitigated. Most importantly, filamenting can be prevented and the lateral optical field profile can be symmetric in such narrow cavities.
(63) It is to be appreciated that the laser device with multiple cavity members has an effective ridge width ofn×w, which could easily approach the width of conventional high power lasers having a width in the 10 μm to 50 μm range. Typical lengths of laser bar devices provided by the present disclosure can range from 400 μm to 2000 μm, and can be as much as 3000 μm. A schematic illustration of a conventional single stripe narrow ridge emitter intended for lower power applications of 5 mW to 500 mW is shown in
(64) The laser devices illustrated in
(65) As shown in
(66) In
(67) In certain embodiments, the array of emitters can be manufactured from a gallium nitride substrate. The substrate has a surface characterized by a semi-polar or non-polar orientation. The gallium nitride material allows the laser device to be packaged without hermetic sealing. More specifically, by using the gallium nitride material, the laser bar is substantially free from AlGaN and/or high Ga-content InAlGaN cladding layers, substantially free from p-type AlGaN and/or high Ga-content InAlGaN cladding layers, or substantially free from aluminum bearing layers within the cladding in the vicinity of the quantum well light emitting layers. Typically, AlGaN and/or InAlGaN cladding layers are unstable when operating in normal atmosphere, as they interact with oxygen. To address this problem, conventional laser devices with AlGaN and/or InAlGaN material are hermetically sealed to prevent interaction between the AlGaN and/or InAlGaN and air. In contrast, because AlGaN and/or InAlGaN claddings are not present in laser devices according to certain embodiments provided by the present disclosure, the laser devices do not need to be hermetically packaged. This reduces the cost of manufacturing,
(68)
(69)
(70)
(71)
(72) Laser bars integrating multiple laser emitters provide numerous performance advantages. In certain embodiments, single-mode emitters are integrated in a single laser bar. The emitters are manufactured from a single substrate. The emitters are arranged in parallel as shown in
(73)
(74)
(75)
(76) Depending on the packaging methods, reliability and performance of the laser will vary.
(77)
(78)
(79)
(80)
(81)
(82)
(83) As disclosed herein, laser bars packaged with color conversion material (e.g., phosphors) can have a wide range of applications, which include both lighting and projection uses. Laser bars being used for projection purposes are described in U.S. Publication No. 2010/0302464, which is incorporated by reference hereby for all purposes. For display applications, a laser bar with multiple emitters integrated into a single package helps reduce both cost and size of projectors. In pico-projectors where 24 W of laser emission is needed, using laser bars operating at relatively high voltage (e.g. 6 W per laser bar) is more convenient than using 24 laser diodes that operate at 1 W each.
(84)
(85)
(86) Depending on the application, various types of phosphor materials may be used for color conversion. The phosphor materials disclosed herein are wavelength conversion materials, which can be ceramic or semiconductor particle phosphors, ceramic or semiconductor plate phosphors, organic or inorganic downconverters, upconverters (anti-stokes), nanoparticles, and other materials which provide wavelength conversion. Some examples are listed below:
(87) (Sr,Ca).sub.10(PO.sub.4).sub.6*B.sub.2O.sub.3:Eu.sup.2+(wherein 0<n{circumflex over ( )}1)
(88) (Ba,Sr,Ca).sub.5(PO.sub.4).sub.3(Cl,F,Br,OH):Eu.sup.2+,Mn.sup.2+
(89) (Ba, Sr,Ca)BPO.sub.5:Eu.sup.2+,Mn.sup.2+
(90) Sr.sub.2Si.sub.3O.sub.8*.sub.2SrC.sub.12:Eu.sup.2+
(91) (Ca,Sr,Ba).sub.3MgSi.sub.2O.sub.8:Eu.sup.2+, Mn.sup.2+
(92) BaAl.sub.8O.sub.13:Eu.sup.2+
(93) 2SrO*.sub.0.84P2O.sub.5*0..sub.16B.sub.2O.sub.3:Eu.sup.2+
(94) (Ba,Sr,Ca)MgA.sub.110O.sub.17:Eu.sup.2+,Mn.sup.2+
(95) K.sub.2SiF.sub.6:Mn.sup.4+
(96) (Ba,Sr,Ca)Al.sub.2O.sub.4:Eu.sup.2+
(97) (Y,Gd,Lu,Sc,La)BO.sub.3:Ce.sup.3+.Tb.sup.3+
(98) (Ba,Sr,Ca).sub.2(Mg,Zn)Si.sub.2O.sub.7:Eu.sup.2+
(99) (Mg,Ca,Sr, Ba,Zn).sub.2Si1_xO.sub.4_2x:Eu.sup.2+(wherein 0<x=0.2)
(100) (Sr,Ca,Ba)(Al,Ga,m).sub.2S.sub.4:Eu.sup.2+
(101) (Lu,Sc,Y,Tb)2_u_vCevCa1+uLiwMg.sub.2_wPw(Si,Ge).sub.3_w012_u/2 where —O.SSu{circumflex over ( )}1; 0<v£Q.1; and
(102) OSw{circumflex over ( )}O..sub.2
(103) (Ca,Sr).sub.8(Mg,Zn)(SiO.sub.4).sub.4Cl.sub.2:Eu.sup.2+,Mn.sup.2+
(104) Na.sub.2Gd.sub.2B.sub.2O.sub.7:Ce.sup.3+,Tb.sup.3+
(105) (Sr,Ca,Ba,Mg,Zn).sub.2P.sub.2O.sub.7:Eu.sup.2+Mn.sup.2+
(106) (Gd,Y,Lu,La).sub.2O.sub.3:Eu.sup.3+,Bi.sup.3+
(107) (Gd,Y,Lu,La).sub.2O2S:Eu.sup.3+,Bi.sup.3+
(108) (Gd,Y,Lu,La)VO.sub.4:Eu.sup.3+,Bi.sup.3+
(109) (Ca,Sr)S:Eu.sup.2+,Ce.sup.3+
(110) (Y,Gd,Tb,La,Sm,Pr,Lu).sub.3(Sc,Al,Ga).sub.5_nO.sub.12_3/2n:Ce.sup.3+(wherein 0{circumflex over ( )}0{circumflex over ( )}0.5)
(111) ZnS:Cu+,Cl˜
(112) ZnS:Cu+,Al.sup.3+
(113) ZnS:Ag+,Al.sup.3+
(114) SrY.sub.2S.sub.4:Eu.sup.2+
(115) CaLa.sub.2S.sub.4:Ce.sup.3+
(116) (Ba,Sr,Ca)MgP.sub.2O.sub.7:Eu.sup.2+, Mn.sup.2+
(117) (Y,Lu).sub.2WO.sub.6:Eu.sup.3+,Mo.sup.6+
(118) CaWO.sub.4
(119) (Y,Gd,La).sub.2O.sub.2S:Eu.sup.3+
(120) (Y,Gd,La).sub.2O.sub.3:Eu.sup.3+
(121) (Ca,Mg)xSyO:Ce
(122) (Ba,Sr,Ca)nSinNn:Eu.sup.2+(wherein 2n+4=3n)
(123) Ca.sub.3(SiO.sub.4)Cl.sub.2:Eu.sup.2+
(124) ZnS:Ag.sup.+,Cl˜
(125) (Y,Lu,Gd).sub.2_nCanSi.sub.4N.sup.6+nC1_n:Ce.sup.3+, (wherein OSn{circumflex over ( )}O.5)
(126) (Lu,Ca,Li,Mg,Y)α-SiAlON doped with Eu.sup.2+ and/or Ce.sup.3+
(127) (Ca,Sr,Ba)SiO.sub.2N.sub.2:Eu.sup.2+,Ce.sup.3+
(128) (Sr,Ca)AlSiN.sub.3:Eu.sup.2+
(129) CaAlSi(ON).sub.3:uEu.sup.2+
(130) Sr.sub.10(PO.sub.4).sup.6C.sub.12:Eu.sup.2+
(131) (BaSi)O12N2:Eu.sup.2+
(132) SrSi.sub.2(O,Cl).sub.2N.sub.2:Eu.sup.2+
(133) (Ba,Sr)Si.sub.2(O,Cl)2N2:Eu.sup.2+
(134) LiM.sub.2O.sub.8:Eu.sup.3+ where M=(W or Mo)
(135) In other examples, one or more phosphors can be as follows:
(136) (Y,Gd,Tb,La,Sm,Pr,Lu).sub.3(Sc,Al,Ga).sub.5-nO.sub.12-3/2n:Ce.sup.3+ (wherein 0≤n≤0.5)
(137) ZnS:Cu+,Cl−
(138) (Y,Lu,Th)3Al.sub.5O.sub.12:Ce.sup.3+
(139) ZnS:Cu+,Al3+
(140) ZnS:Ag+,Al3+
(141) ZnS:Ag+,Cl−
(142) (Ca, Sr) Ga.sub.2S.sub.4:Eu.sup.2+
(143) SrY.sub.2S.sub.4:Eu.sup.2+
(144) CaLa.sub.2S.sub.4:Ce.sup.3+
(145) (Ba,Sr,Ca)MgP.sub.2O.sub.7:Eu.sup.2+,Mn.sup.2+
(146) (Y,Lu).sub.2WO.sub.6:Eu.sup.3+,Mo.sup.6+
(147) CaWO.sub.4
(148) (Y,Gd,La).sub.2O.sub.2S:Eu.sup.3+
(149) (Y,Gd,La).sub.2O.sub.3:Eu.sup.3+
(150) (Ba,Sr,Ca).sub.nSi.sub.nN.sub.n:Eu.sup.2+ (where 2n+4=3n)
(151) Ca.sub.3(SiO.sub.4)Cl.sub.2:Eu.sup.2+
(152) (Y,Lu,Gd).sub.2-nCa.sub.nSi.sub.4N.sub.6+nC.sub.1−n:Ce.sup.3+, (wherein 0≤n≤0.5)
(153) (Lu,Ca,Li,Mg,Y) alpha-SiAlON doped with Eu.sup.2+ and/or Ce.sup.3+
(154) (Ca,Sr,Ba)SiO.sub.2N.sub.2:Eu.sup.2+,Ce.sup.3+
(155) (Sr,Ca)AlSiN.sub.3:Eu.sup.2+
(156) CaAlSi(ON).sub.3:Eu.sup.2+
(157) Sr.sub.10(PO.sub.4).sub.6Cl.sub.2:Eu.sup.2+
(158) (BaSi)O.sub.12N.sub.2:Eu.sup.2+
(159) M(II).sub.aSi.sub.bO.sub.cN.sub.dCe:A wherein (6<a<8, 8<b<14,13<c<17,5<d<9,0<e<2) and M(II) is a divalent cation of (Be,Mg,Ca,Sr,Ba,Cu,Co,Ni,Pd,Tm,Cd) and A of (Ce,Pr,Nd,Sm,Eu,Gd,Tb,Dy,Ho,Er,Tm,Yb,Lu,Mn,Bi,Sb)
(160) SrSi.sub.2(O,Cl).sub.2N.sub.2:Eu.sup.2+
(161) (Ba,Sr)Si.sub.2(O,Cl).sub.2N.sub.2:Eu.sup.2+
(162) LiM.sub.2O.sub.8:Eu.sup.3+ where M=(W or Mo)
(163) For purposes of the present disclosure, it is understood that when a phosphor has two or more dopant ions (i.e. those ions following the colon in the above phosphors), this is to mean that the phosphor has at least one (but not necessarily all) of those dopant ions within the material. That is, as understood by those skilled in the art, this type of notation means that the phosphor can include any or all of those specified ions as dopants in the formulation.
(164)
(165) In certain embodiments, methods and apparatus include a packaged device or enclosure for multiple emitters. Each of the devices can be configured on a single ceramic or multiple chips on a ceramic, which are disposed on a common heat sink. As shown, the package includes all free optics coupling, collimators, mirrors, spatially or polarization multiplexed for free space output or refocused in a fiber or other waveguide medium. As an example, the package has a low profile and may include a flat pack ceramic multilayer or a single layer. The layer may include a copper base, a copper tungsten base such as a butterfly package or me be a covered CT mount, Q-mount, or others. In certain embodiments, the laser devices are soldered on CTE matched material with low thermal resistance (e.g., AlN, diamond, diamond compound) and form a sub-assembled chip on ceramics. The sub-assembled chip is then assembled together on a second material with low thermal resistance such as copper including, for example, active cooling (i.e., simple water channels or micro channels). In certain embodiments, a sub-assembled chip can be formed directly on the base of a package equipped with all connections such as pins. The flatpack can be equipped with an optical interface such as a window, free space optics, a connector or a fiber to guide the light generated and an environmentally protective cover.
(166) In certain embodiments, the package can be used in a variety of applications. The applications include power scaling (modular possibility) and spectral broadening (select lasers with slight wavelength shift for broader spectral characteristics). The application can also include multicolor monolithic integration such as blue-blue, blue-green, RGB (red-blue-green), and others.
(167) In certain embodiments, the laser devices can be configured on a variety of packages. As an example, the packages include TO9 can, TO56 can, flat package(s), CS-Mount, G-Mount, C-Mount, micro-channel cooled package(s), and others. In other examples, the multiple laser configuration can have a combined operating power of 1.5 Watts, 3, Watts, 6 Watts, 10 Watts, and greater. In certain embodiments, an optical device including multiple emitters, is free from any optical combiners, which can lead to inefficiencies. In other examples, optical combiners may be included and configured with the multiple emitter devices. Additionally, the plurality of laser devices (i.e., emitters) may comprise an array of laser devices configured on a non-polar oriented GaN or a semi-polar oriented GaN or a combination thereof, among others.
(168) As used herein, the term GaN substrate is associated with Group III-nitride based materials including GaN, InGaN, AlGaN, or other Group III containing alloys or compositions that are used as starting materials. Such starting materials include polar GaN substrates (i.e., substrate where the largest area surface is nominally an (h k 1) plane wherein h=k=0, and 1 is non-zero), non-polar GaN substrates (i.e., substrate material where the largest area surface is oriented at an angle ranging from about 80-100 degrees from the polar orientation described above towards an (h k 1) plane wherein 1=0, and at least one of h and k is non-zero) or semi-polar GaN substrates (i.e., substrate material where the largest area surface is oriented at an angle ranging from about +0.1 degrees to 80 degrees or 110 degrees to 179.9 degrees from the polar orientation described above towards an (h k 1) plane wherein 1=0, and at least one of h and k is non-zero). Of course, there can be other variations, modifications, and alternatives.
(169) In other examples, laser devices provided by the present disclosure are operable in an environment comprising at least 150,000 ppm oxygen gas. In certain embodiments, a laser device is substantially free from AlGaN and/or InAlGaN cladding layers. The laser device is substantially free from p-type AlGaN and/or p-type InAlGaN cladding layers. In certain embodiments, each of the emitters comprises a front facet and a rear facet, the front facet being substantially free from coatings. In certain embodiments, each of the emitters comprises a front facet and a rear facet, the rear facet comprising a reflective coating. In other examples, a laser device includes a micro-channel cooler thermally coupled to the substrate. In certain embodiments, a device also has a submount characterized by a coefficient of thermal expansion (CTE) associated with the substrate and a heat sink. In certain embodiments, a submount is coupled to the substrate, and in certain embodiments, a submount is selected from aluminum nitride material, BeO, diamond, composite diamond, and combinations of any of the foregoing. In certain embodiments, the substrate is glued onto a submount, the submount being characterized by a heat conductivity of at least 200 W/(mk). In certain embodiments, the substrate comprises one or more cladding regions. In certain embodiments, the one or more optical members comprise a fast-axis collimation lens. In certain embodiments, the laser device is characterized by a spectral width of at least 4 nm. In certain embodiments, the number N of emitters can range between 3 and 15, 15 and 30, 30 and 50, and in certain embodiments, can be greater than 50. In other examples, each of the N emitters produces an average output power of 25 mW to 50 mW, produces an average output power of 50 to 100 mW, produces an average output power of 100 to 250 mW, produces an average output power of 250 to 500 mW, or produces an average output power of 500 mW to 1000 mW. In a specific example, each of the N emitters produces an average output power greater than 1 W. In an example, each of the N emitters is separated by 3 μm to 15 μm from one another or separated by 15 μm to 75 μm from one another or separated by 75 μm to 150 μm from one another or separated by 150 μm to 300 μm from one another.
(170) In certain embodiments, optical devices such as lasers are disclosed. An optical device includes a gallium and nitrogen containing material having a surface region, which is characterized by a semipolar surface orientation within ±5 degrees of one of the following (10-11), (10-1-1), (20-21), (20-2-1), (30-31), (30-3-1), (40-41), or (40-4-1) or {30-32}, {20-21},{30-3-1}, or the {30-3-2}. For example, in certain embodiments, the surface region is characterized by a crystallographic orientation selected from a {11-22} plane, a {20-21} plane, a {30-31} plane, a {30-32} plane, a {20-21} plane, a {30-3-1} plane, a {30-3-2} plane, within +/−5 degrees in an a-direction from the a {11-22} plane, within +/−5 degrees in the a-direction from the {20-21} plane, within +/−5 degrees in the a-direction from the {30-31} plane, within +/−5 degrees in the a-direction from the {30-32} plane, within +/−5 degrees in the a-direction from the {20-21} plane, within +/−5 degrees in the a-direction from the {30-3-1} plane, within +/−5 degrees in the a-direction from the {30-3-2} plane, within +/−5 degrees in a c-direction from the {11-22} plane, within +/−5 degrees in the c-direction from the {20-21} plane, within +/−5 degrees in the c-direction from the {30-31} plane, within +/−5 degrees in the c-direction from the {30-32} plane, within +/−5 degrees in the c-direction from the {20-21} plane, within +/−5 degrees in the c-direction from the {30-3-1} plane, and within +/−5 degrees in the c-direction from the {30-3-2} plane. In certain embodiments, a device also has a first waveguide region configured in a first direction, which is a projection of a c-direction overlying the surface region of the gallium and nitrogen containing material. In certain embodiments, a device also has a second waveguide region coupled to the first waveguide region and is configured in a second direction overlying the surface region of the gallium and nitrogen containing material. In certain embodiments, the second direction is different from the first direction and substantially parallel to the a-direction. In certain embodiments, the first and second waveguide regions are continuous, are formed as a single continuous waveguide structure, and are formed together during manufacture of the waveguides. Of course, there can be other variations, modifications, and alternatives.
(171) In certain embodiments, methods and systems disclosed herein have certain benefits and/or advantages. That is, the present laser module-phosphor design approach utilizes a single common package to house a number of laser diode devices (1-30 devices), lenses, and mirrors within a package to produce a single beam of radiation, which is then delivered onto a spot on a phosphor. This approach has several advantages over the individually packaged design approach including reduced cost, improved optical throughput and efficiency, reduced form factor, and increased reliability.
(172) The cost is reduced using this approach because the 1-30 lasers emitters are packaged inside a single package (hermetically sealed or perhaps not), e.g., module. In this example, a package member comprises the plurality of devices coupled to the package member with an aluminum nitride submount, a diamond submount, or a beryllium oxide submount, among others.
(173) Cost is also reduced because the individual lenses can be brought in close proximity to the laser chip enabling the use of small low cost optics throughout the module, and thereby reduce or eliminate the need for active alignment and high precision tooling.
(174) Moreover, the approach uniquely enables lower cost by allowing the use of passively aligned waveguides and/or optical fiber (instead of lenses), which can be brought up in close proximity to the laser chip emitting facet to capture the light from each chip. Because the waveguide and/or optical fiber can be much larger (e.g., 100 μm to 500 μm) than the laser emitter (2 μm to 50 μm) the light from each emitter can be collected without high precision active alignment. Also, because of the excellent mechanical tolerances associated with the positioning of each chip inside the package, monolithic lens, fiber, or waveguide alignment is possible.
(175) Cost is also saved in the assembly process because the beams inside the module can be integrated into a single waveguide or fiber to simplify and reduce the cost of the optical delivery to the phosphor beam. This approach has the benefit of generating a uniform beam at the output side of the module, which maximizes the phosphor pumping process and thereby minimizes or eliminates hot spots and reliability issues. This allows projector manufacturing to more consistent and the performance specifications of a product can be met with greater predictability.
(176) By utilizing a carefully designed fiber or waveguide to aggregate or combine the beams from each emitter, the laser spot coming from the module can be shaped into a variety of spatial patterns such as rectangular patterns, which can match the typical geometry of display generating chips (such as 4:3 and 16:9, among others). This will improve or maximize the optical throughput and efficiency of the projector.
(177) The projector form factor can be reduced because the laser diodes are mounted inside a single flat package, and the package can be mounted directly onto a surface, which can be cooled with fans or other advanced thermal dissipation devices. This can minimize the height of the projector and thereby facilitate achieving a slim profile and compact functionality, which is desired by consumers who value portability.
(178) Also, projector reliability is extended in this design because the edge emitting lasers are mounted directly onto a flat package, the thermal resistance between the active region of the laser diode chip and the case of the module is minimized (1-5° C. per Watt). This design causes the laser active area to operate at low temperatures (10° C. to 30° C. lower), which increases laser efficiency and results in lower costs and increased reliability. In certain embodiments, operating temperatures for the laser module may increase to 70° C., which allows the projectors to operate in hot environments. Depending upon the embodiment, one or more of these benefits may be achieved.
(179) While the above is a full description of the specific embodiments, various modifications, alternative constructions and equivalents may be used. Therefore, the above description and illustrations should not be taken as limiting the scope of the present invention which is defined by the appended claims.