RADIATION-EMITTING SEMICONDUCTOR CHIP, AND METHOD FOR PRODUCING SAME

Abstract

The invention relates to a radiation-emitting semiconductor chip having the following features:—a semiconductor body including an active region which, during operation, generates electromagnetic radiation and is arranged in a resonator, —at least one recess in the semiconductor body, which recess completely penetrates the active region, wherein—the recess has a first lateral face and a second lateral face opposite the first lateral face, and—the first lateral face has a first coating which specifies a reflectivity for the electromagnetic radiation of the active region, and/or—the second lateral face has a second coating which specifies a reflectivity for the electromagnetic radiation of the active region. The invention further relates to a method for producing such a semiconductor chip.

Claims

1. A radiation-emitting semiconductor chip comprising: a semiconductor body comprising an active region which, during operation, generates electromagnetic radiation and is arranged in a resonator, at least one cutout in the semiconductor body which completely penetrates through the active region, wherein the cutout has a first side surface and a second side surface opposite the first side surface, and the first side surface has a first coating, which predefines a reflectivity for the electromagnetic radiation of the active region, and/or the second side surface has a second coating, which predefines a reflectivity for the electromagnetic radiation of the active region.

2. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the first coating is embodied as a first layer sequence having a multiplicity of individual layers, and/or the second coating is embodied as a second layer sequence having a multiplicity of individual layers.

3. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the first coating and the second coating are embodied differently from one another.

4. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the first layer sequence and the second layer sequence are formed from individual layers of identical materials and with an identical succession, and a thickness of the first layer sequence in the region of the first side surface and a thickness of the second layer sequence in the region of the second side surface are different from one another.

5. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the thickness of the first layer sequence in the region of the first side surface and the thickness of the second layer sequence in the region of the second side surface are in a ratio of greater than 1:1 and less than or equal to 1:20.

6. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the second layer sequence is embodied in identical fashion to the first layer sequence apart from an additional symmetry breaking layer, or the first layer sequence is embodied in identical fashion to the second layer sequence apart from an additional symmetry breaking layer.

7. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the semiconductor body comprises a first segment and a second segment, the first segment being electrically and/or optically isolated from the second segment by the cutout.

8. The radiation-emitting semiconductor chip as claimed in claim 1, wherein the first segment comprises the resonator and the second segment comprises a modulation element configured to modulate an intensity of the electromagnetic radiation of the active region.

9. The radiation-emitting semiconductor chip as claimed in claim 7, wherein the first segment and the second segment are electrically isolated from one another, and the second segment comprises an electrical switching element configured to switch on and switch off the radiation-emitting semiconductor chip.

10. The radiation-emitting semiconductor chip as claimed in claim 7, wherein the semiconductor body has a segment comprising one or more of the following elements: photodiode, passive waveguide, active waveguide, beam splitter, beam combiner, lens, wavelength-selective element, phase shifting elements, frequency doubler, taper, amplifier, converter, transistor.

11. The radiation-emitting semiconductor chip as claimed in claim 1, wherein a refractive index progression along the main extension direction of the semiconductor chip proceeding from the first side surface of the cutout as far as the second side surface of the cutout is embodied in nonperiodic fashion.

12. An array comprising at least two radiation-emitting semiconductor chips as claimed in claim 1.

13. A method for producing a radiation-emitting semiconductor chip comprising: providing a semiconductor body comprising an active region which, during operation, generates electromagnetic radiation, and is arranged in a resonator, producing at least one cutout in the semiconductor body which completely penetrates through the active region, the cutout having a first side surface and a second side surface, the first side surface being arranged opposite the second side surface, and applying a first coating, which predefines a reflectivity for the electromagnetic radiation of the active region, to the first side surface, and/or applying a second coating, which predefines a reflectivity for the electromagnetic radiation of the active region, to the second side surface.

14. The method as claimed in claim 13, wherein the second side surface of the cutout is provided with a protective layer, the first side surface of the cutout is provided with the first coating, and the protective layer is removed again, such that the semiconductor body is freely accessible in the region of the second side surface.

15. The method as claimed in claim 14, wherein the first coating is provided with a further protective layer at least in the region of the first side surface, and the second side surface of the cutout is provided with the second coating, and the further protective layer is removed again, such that the first coating is freely accessible in the region of the first side surface.

16. The method as claimed in claim 13, wherein the first coating and the second coating are simultaneously applied to the first side surface and the second side surface, wherein the first coating is embodied as a first layer sequence of a multiplicity of individual layers, and the second coating is embodied as a second layer sequence of a multiplicity of individual layers, the first layer sequence and the second layer sequence are formed from individual layers of identical materials and with an identical succession, and a thickness of the first layer sequence in the region of the first side surface and a thickness of the second layer sequence in the region of the second side surface are in a ratio of between not less than 1:1 and not more than 1:20.

17. The method as claimed in claim 16, wherein a preferred direction of a method for applying the first coating and the second coating forms a predefined angle with a main extension plane of the semiconductor body, such that the thickness of the first coating in the region of the first side surface is different from the thickness of the second coating in the region of the second side surface.

18. The method as claimed in claim 16, wherein before the first coating and the second coating are applied, a shading element is applied to a region of a main surface of the semiconductor body which directly adjoins the first side surface of the cutout, such that the thickness of the first coating in the region of the first side surface is different from the thickness of the second coating in the region of the second side surface.

19. The method as claimed in claim 13, wherein a multiplicity of semiconductor bodies are provided in a wafer assemblage, separating trenches are arranged between the semiconductor bodies, a layer sequence comprising a first layer and a second layer is deposited in the separating trenches, the semiconductor bodies are singulated along the separating trenches in such a way that the first layer is arranged on a side surface of a semiconductor body and the second layer is arranged on a side surface of a directly adjacent semiconductor body.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0062] FIGS. 1 to 4 show schematic sectional illustrations of different stages of a method in accordance with one exemplary embodiment.

[0063] FIG. 5 shows a schematic sectional illustration of a radiation-emitting semiconductor chip in accordance with one exemplary embodiment.

[0064] FIGS. 6 and 7 each show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a coating in accordance with one exemplary embodiment.

[0065] FIG. 8 shows a schematic sectional illustration of one stage of a method in accordance with one exemplary embodiment.

[0066] FIGS. 9 and 10 each show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a coating in accordance with one exemplary embodiment.

[0067] FIG. 11 shows a schematic sectional illustration of one stage of a method in accordance with a further exemplary embodiment.

[0068] FIG. 12 shows a schematic sectional illustration of a radiation-emitting semiconductor chip in accordance with one exemplary embodiment.

[0069] FIGS. 13 to 16 each show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a coating in accordance with one exemplary embodiment.

[0070] FIGS. 17 to 19 show schematic illustrations of a radiation-emitting semiconductor chip in accordance with one exemplary embodiment.

[0071] FIGS. 20 to 25 each show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation on an uncoated side surface of a cutout.

[0072] FIGS. 26 to 30 show schematic plan views of a radiation-emitting semiconductor chip in accordance with various exemplary embodiments.

[0073] FIGS. 31 to 34 show schematic plan views of an array in accordance with various exemplary embodiments.

[0074] FIGS. 35 to 37 show schematic illustrations of different stages of a method in accordance with one exemplary embodiment.

[0075] FIGS. 38 and 39 show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a coating in accordance with one exemplary embodiment.

[0076] FIGS. 40 and 41 show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a coating in accordance with one exemplary embodiment.

[0077] FIGS. 42 and 43 show schematic sectional illustrations of a radiation-emitting semiconductor chip in accordance with a further exemplary embodiment.

DETAILED DESCRIPTION

[0078] Elements that are identical, of identical type or act identically are provided with the same reference signs in the figures. The figures and the size relationships of the elements illustrated in the figures among one another should not be regarded as to scale. Rather, individual elements, in particular layer thicknesses, may be illustrated with exaggerated sizes in order to enable better illustration and/or in order to afford a better understanding.

[0079] In the method in accordance with the exemplary embodiment in FIGS. 1 to 4, a first step involves providing a semiconductor body 1 (not illustrated). The semiconductor body 1 has an active region 2 which, during operation, generates electromagnetic radiation. The semiconductor body 1 is arranged on a substrate 3.

[0080] A cutout 4 which completely penetrates through the active region 2 is produced in the semiconductor body 1 (FIG. 1). The cutout 4 is produced by etching, for example. Furthermore, etch stop layers 5 can be arranged in the semiconductor body 1, said layers stopping an etching process of the cutout 4. In this regard, a depth of the cutout 4 can be defined.

[0081] The cutout 4 has a first side surface 6 and a second side surface 7 opposite the first side surface 6. A protective layer 8 is applied at least to the second side surface 7. In the present case, the protective layer 8 also extends over that region of a main surface 9 of the semiconductor body 1 which directly adjoins the second side surface 7. The protective layer 8 is a photoresist layer, for example.

[0082] After the protective layer 8 has been applied, a first coating 10 is deposited (FIG. 2) and the protective layer 8 is removed again, such that the first coating 10 is applied only on the first side surface 6 of the cutout 4, parts of a bottom surface 11 of the cutout 4 and on a region of the main surface 9 of the semiconductor body 1 which directly adjoins the cutout 4 (FIG. 3). In the present case, the first coating 6 is formed from a multiplicity of individual layers 12 which comprise two different materials and are arranged alternately. It is also possible to use more than two different materials for the individual layers. By way of example, the first coating 10 is embodied as antireflective for the electromagnetic radiation generated in the active region 2.

[0083] In a next step, a further protective layer 8 is applied (not illustrated) to the first coating 6 and a second coating 13 is deposited. The second protective layer 8 is then removed again, such that the second coating 13 is applied only on the second side surface 7 of the cutout 4, parts of the bottom surface 11 of the cutout 4 and in that region of the main surface 9 of the semiconductor body 1 which directly adjoins the second side surface 7 (FIG. 4). In the present case, the second coating 13 is embodied as highly reflective for the electromagnetic radiation generated in the active region 2.

[0084] The radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 5 has a semiconductor body 1 arranged on a substrate 3. A cutout 4 having a first side surface 6 and a second side surface 7 opposite the first side surface 6 is arranged in the semiconductor body 1. A first coating 10 is applied to the first side surface 6, which first coating in the present case likewise partly extends over a bottom surface 11 of the cutout 4 and also over a main surface 9 adjoining the first side surface 6. A second coating 13 is arranged on a second side surface 7 of the cutout 4, which second coating likewise extends over parts of the bottom surface 11 of the cutout 4 and also the main surface 9 of the semiconductor body 1 adjoining the second side surface 7. In the present case, the region 14 of the cutout 4 which remains free of the first coating 6 and the second coating 7 is completely filled with a dielectric 15.

[0085] FIG. 6 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating 10 and a second coating 13 each having a multiplicity of individual layers 12, the material, thickness, refractive index and order of which are indicated in table 1.

TABLE-US-00001 TABLE 1 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 88 1.5 coating First TiO.sub.2 128 2.2 coating First SiO.sub.2 102 1.5 coating First TiO.sub.2 56 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 11 2.2 coating Second SiO.sub.2 38 1.5 coating Second TiO.sub.2 147 2.2 coating Second SiO.sub.2 7 1.5 coating Laser 2.5

[0086] In the exemplary embodiment in FIG. 6, the first coating 10 and the second coating 13 are applied independently of one another, as has already been described with reference to FIGS. 1 to 4, for example. The region of the cutout between the two coatings is filled with a 1000 nanometer thick SiO.sub.2 layer.

[0087] Here and in the following figures, the curve C0 shows the reflectivity of the coatings 6, 7, while the curve C1 shows the reflectivity upon variation of the thickness of the coatings 6, 7 by 2% (at least 2 nanometers) and upon variation of the thickness of the central SiO.sub.2 layer or of the central TiO.sub.2 layer by +/−500 nanometers.

[0088] FIG. 7 shows simulated values of the reflectivity R as a function of the wavelength λ of incident electromagnetic radiation for a first coating and a second coating each having a multiplicity of individual layers, the material, thickness, refractive index and order of which are indicated in table 2.

TABLE-US-00002 TABLE 2 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 78 1.5 coating First TiO.sub.2 51 2.2 coating First SiO.sub.2 102 1.5 coating First TiO.sub.2 126 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 11 2.2 coating Second SiO.sub.2 34 1.5 coating Second TiO.sub.2 58 2.2 coating Laser 2.5

[0089] In the exemplary embodiment in FIG. 7, too, the first coating and the second coating 13 are applied independently of one another, as has already been described with reference to FIGS. 1 to 4, for example.

[0090] In contrast to the method in accordance with the exemplary embodiment in FIGS. 1 to 4, in which the first coating 10 and the second coating 13 are deposited successively, the first coating 10 and the second coating 13 are deposited simultaneously on the semiconductor body 1 in the method in accordance with the exemplary embodiment in FIG. 8. A deposition method having a preferred direction 16 having an angle α with a main extension plane 17 of the semiconductor body 1 is used for this purpose.

[0091] In this regard, the first coating 10 and the second coating 13 are deposited simultaneously, the second coating 13 at least on the second side surface 7 having a different thickness than the first coating 10 on the first side surface 6. This is attained by means of self-shading of the cutout 4 during deposition on account of the preferred direction 16. Examples of suitable directional deposition methods are sputtering or vapor deposition.

[0092] The first coating 10 and the second coating 13 attained by the method in accordance with the exemplary embodiment in FIG. 8 have layer sequences of individual layers 12 of identical material and with an identical succession. The first coating 10 and the second coating 13 differ only in their thickness on the first side surface 6 and the second side surface 7 of the cutout 4.

[0093] FIG. 9 shows simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a first coating and a second coating each having a multiplicity of individual layers, the material, thickness, refractive index and order of which are indicated in table 3.

TABLE-US-00003 TABLE 3 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 150 1.5 coating First TiO.sub.2 145 2.2 coating First SiO.sub.2 117 1.5 coating First TiO.sub.2 89 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 44.5 2.2 coating Second SiO.sub.2 58.5 1.5 coating Second TiO.sub.2 72.5 2.2 coating Second SiO.sub.2 75 1.5 coating Laser 2.5

[0094] In the exemplary embodiment in FIG. 9, the first coating 10 and the second coating 13 are applied simultaneously, as already described with reference to FIG. 8. The first coating 10 and the second coating 13 have individual layers 12 of identical material and with an identical succession. However, the first coating 10 and the second coating 13 differ with regard to their thicknesses. A ratio of the thickness of the first coating 10 to the thickness of the second coating 13 is approximately 2:1.

[0095] FIG. 10 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating 10 and a second coating 13 each having a multiplicity of individual layers 12, the material, thickness, refractive index and order of which are indicated in table 4.

TABLE-US-00004 TABLE 4 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 68 1.5 coating First TiO.sub.2 173 2.2 coating First SiO.sub.2 185 1.5 coating First TiO.sub.2 65 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 16.2 2.2 coating Second SiO.sub.2 46.2 1.5 coating Second TiO.sub.2 43.2 2.2 coating Second SiO.sub.2 17 1.5 coating Laser 2.5

[0096] In the exemplary embodiment in FIG. 10, the first coating 10 and the second coating 13 are applied simultaneously, as already described with reference to FIG. 8. The first coating 10 and the second coating 13 have individual layers 12 of identical material and with an identical succession. However, the first coating 10 and the second coating 13 differ with regard to their thicknesses. A ratio of the thickness of the first coating 10 to the thickness of the second coating 13 is approximately 4:1.

[0097] A first coating 10 and a second coating 13 such as are attained by the method in accordance with the exemplary embodiment in FIG. 8 can also be attained by the method in accordance with the exemplary embodiment in FIG. 11.

[0098] In the method in accordance with the exemplary embodiment in FIG. 11, a shading element 18 is applied to a region of a main surface 9 of the semiconductor body 1 which directly adjoins a first side surface 6 of a cutout 4 in the semiconductor body 1. A first coating 10 and a second coating 13 are then deposited simultaneously, such that a thickness of the first coating 10 on the first side surface 6 is different from the thickness of the second coating 13 on the second side surface 7 on account of the shading element 18.

[0099] The radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 12 has a first coating 10 and a second coating 13, which coatings are embodied in identical fashion apart from a symmetry breaking layer 19 within the second coating 13. The symmetry breaking layer 19 can be produced with the aid of a photoresist layer and a lift-off method.

[0100] FIG. 13 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating 10 and a second coating 13 each having a multiplicity of individual layers 12, the material, thickness, refractive index and order of which are indicated in table 5.

TABLE-US-00005 TABLE 5 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 70 1.5 coating First TiO.sub.2 55 2.2 coating First SiO.sub.2 81 1.5 coating First TiO.sub.2 62 2.2 coating First SiO.sub.2 7 1.5 coating Cutout TiO.sub.2 1000 2.2 Second SiO.sub.2 7 1.5 coating Second TiO.sub.2 62 2.2 coating Second SiO.sub.2 81 1.5 coating Second SiO.sub.2 70 1.5 coating Laser 2.5

[0101] In this case, the first coating 10 has a symmetry breaking layer 19 composed of TiO.sub.2 having a thickness of approximately 55 nanometers.

[0102] FIG. 14 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating 10 and a second coating 13 each having a multiplicity of individual layers 12, the material, thickness, refractive index and order of which are indicated in table 6.

TABLE-US-00006 TABLE 6 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 45 1.5 coating First TiO.sub.2 89 2.2 coating First SiO.sub.2 57 1.5 coating First TiO.sub.2 49 2.2 coating First SiO.sub.2 45 1.5 coating Cutout TiO.sub.2 1000 2.2 Second SiO.sub.2 22.5 1.5 coating Second TiO.sub.2 24.5 2.2 coating Second SiO.sub.2 14.2 1.5 coating Second TiO.sub.2 22.2 2.2 coating Second SiO.sub.2 11.2 1.5 coating Laser 2.5

[0103] In this case, the individual layers 12 of the first coating 10 and of the second coating 13 were applied successively in two different steps, wherein the two individual layers 12 of the first coating 10 and of the second coating 13 which directly adjoin the cutout 4 filled with TiO.sub.2 and having a thickness of 1000 micrometers each have thicknesses which are in a ratio of 2:1 with respect to one another. The further individual layers 12 of the first coating 10 and the further individual layers 12 of the second coating 13 have thicknesses with a ratio of 4:1 with respect to one another. In this regard, a first coating 10 and a second coating 13 can be produced which have different optical properties but very similar thicknesses. This increases the stability of the coatings 10, 13.

[0104] FIG. 15 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating 10 and a second coating 13 each having a multiplicity of individual layers 12, the material, thickness, refractive index and order of which are indicated in table 7.

TABLE-US-00007 TABLE 7 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 32 1.5 coating First TiO.sub.2 160 2.2 coating First SiO.sub.2 69 1.5 coating First TiO.sub.2 27.5 2.2 coating First SiO.sub.2 7.2 1.5 coating First TiO.sub.2 27.5 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 110 2.2 coating Second SiO.sub.2 29 1.5 coating Second TiO.sub.2 110 2.2 coating Second SiO.sub.2 17.2 1.5 coating Second TiO.sub.2 40 2.2 coating Second SiO.sub.2 8 1.5 coating Laser 2.5

[0105] In this case, the individual layers 12 of the first coating 10 and of the second coating 13 were applied successively in two different steps, wherein the two individual layers 12 of the first coating 10 and of the second coating 13 which directly adjoin the cutout 4 filled with SiO.sub.2 and having a thickness of 1000 micrometers each have thicknesses which are in a ratio of 1:4 with respect to one another. The further individual layers 12 of the first coating 10 and the further individual layers 12 of the second coating 13 have thicknesses with a ratio of 4:1 with respect to one another. In this regard, a first coating 10 and a second coating 13 can be produced which have different optical properties but very similar thicknesses. This increases the stability of the coatings 10, 13.

[0106] FIG. 16 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating 10 and a second coating 13 each having a multiplicity of individual layers 12, the material, thickness, refractive index and order of which are indicated in table 8.

TABLE-US-00008 TABLE 8 Thickness Material (nanometers) Refractive index n Laser 2.5 First TiO.sub.2 72 2.2 coating First SiO.sub.2 8 1.5 coating Cutout TiO.sub.2 1000 2.2 Second SiO.sub.2 8 1.5 coating Second TiO.sub.2 72 2.2 coating Second SiO.sub.2 84 1.5 coating Second TiO.sub.2 40 2.2 coating Second SiO.sub.2 89 1.5 coating Laser 2.5

[0107] In this exemplary embodiment, the first coating 10 and the second coating 13 differ significantly from one another with regard to the number of individual layers 12, thickness and material of the individual layers 12. The first coating can be applied jointly with the last two individual layers of the second coating.

[0108] The radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIGS. 17 to 19 has an active region 2 in which, during operation, electromagnetic radiation is generated. A first layer 21 is applied on a side surface 20 of the semiconductor body 1, said first layer being embodied as highly reflective for electromagnetic radiation of the active region 2. A second layer 23 is applied on a side surface 22 of the semiconductor body 1 that is opposite said side surface 21, said second layer being embodied as antireflective for the electromagnetic radiation of the active region 2 (FIGS. 17 and 18). Furthermore, the semiconductor body 1 comprises a ridge waveguide 24 extending from one side surface 20 of the semiconductor body 1 to the opposite side surface 22 of the semiconductor body 1.

[0109] Furthermore, the semiconductor body 1 has a first segment 25 and a second segment 26, which are separated from one another by a cutout 4. The cutout 4 is illustrated in detail in FIG. 19. In the present case, the cutout 4 completely perforates the ridge waveguide 24. One of the side surfaces 6, 7 of the cutout 4 is provided with a first coating 10 embodied as antireflective or highly reflective for the electromagnetic radiation of the active region 2. By way of example, the first coating 10 on a first side surface 6 of the cutout 4 is embodied as antireflective. In this case, the second coating 13 on the second side surface 7 opposite the first side surface 6 is embodied as highly reflective for the electromagnetic radiation of the active region 2.

[0110] A first electrical contact location 27 is arranged in the region of the first segment 25 and is suitable for electrically contacting the first segment 25 and driving it separately from the second segment 26. A second contact location 28 is arranged on the second segment 26 and is suitable for electrically driving the second segment 26. The first electrical contact location 27 and the second electrical contact location 28 each cover the ridge waveguide 24.

[0111] In the present case, the first segment 25 and the second segment 26 have different functionalities. The first segment 25 is configured to generate electromagnetic laser radiation, while the second segment 26 is a modulation element 29 for the electromagnetic laser radiation.

[0112] The highly reflective second coating 13, together with the highly reflective first layer 21 on the side surface 20 of the semiconductor body 1, forms a resonator 30 in which the active region 2 is arranged within the first segment 25. The resonator is designed to generate a population inversion within the active region 2, such that electromagnetic laser radiation is attained within the first segment 25 of the semiconductor body 1.

[0113] In the present case, the second segment 26 comprises the modulation element 29. The modulation element 29 can be embodied as partly or wholly absorbent for the electromagnetic laser radiation generated in the first segment 25 during operation by means of corresponding energization via the second electrical contact location 28.

[0114] The electromagnetic laser radiation generated in the first segment 25 enters the modulation element 29 partly through the highly reflective first coating 10, in which modulation element an intensity of the laser radiation can be modulated. The modulated electromagnetic laser radiation then exits the radiation-emitting semiconductor chip 31 from the side surface 22 of the semiconductor body 1 having the antireflective second layer 23 (FIG. 18).

[0115] FIGS. 20 to 25 show simulated values of reflectivities R as a function of the wavelength 2 for various cutouts 4 that are not provided with a coating 10, 13 but rather are only filled with air.

[0116] FIG. 20 shows reflectivities R as a function of the wavelength λ for an air-filled cutout 4 having a width of approximately 1462.5 nanometers. In this case, a maximum of the reflectivity R having a value of approximately 52% is at approximately 450 nanometers (curve C2).

[0117] By contrast, FIG. 21 shows the reflectivity R for an only insignificantly wider air-filled cutout 4 having a width of 1575 nanometers. A minimum for the reflectivity R is now present at a wavelength λ of approximately 450 nanometers (curve C3).

[0118] FIG. 22 shows the reflectivity R as a function of the wavelength 2 in the case of a variation of 1% of a width of an air-filled cutout 4 proceeding from a value of the width of approximately 1462.5 nanometers (curves C4). Furthermore, the reflectivity C2 from FIG. 20 is plotted as reference.

[0119] FIG. 23 shows the reflectivity R as a function of the wavelength λ in the case of a variation of 2.5% of a width of an air-filled cutout proceeding from a value of the width of approximately 1462.5 nanometers (curve C4). Furthermore, the reflectivity C2 from FIG. 20 is plotted as reference.

[0120] FIG. 24 shows the reflectivity R as a function of the wavelength λ in the case of a variation of 5% of a width of an air-filled cutout proceeding from a value of the width of approximately 1462.5 nanometers (curve C4). Furthermore, the reflectivity C2 from FIG. 20 is plotted as reference.

[0121] FIG. 25 shows the reflectivity R as a function of the wavelength λ in the case of a variation of 10% of a width of an air-filled cutout proceeding from a value of the width of approximately 1462.5 nanometers (curve C4). Furthermore, the reflectivity C2 from FIG. 20 is plotted as reference.

[0122] As shown by FIGS. 20 to 25, the reflectivity of uncoated side surfaces of a cutout varies greatly with the dimensions of the cutout such as may arise as a result of manufacturing tolerances, for example. A comparison with FIGS. 6, 7, 9, 10, 13, 14, 15, 16, 38, 39 shows that this problem can be at least significantly reduced with the first coating and/or the second coating.

[0123] In contrast to the radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIGS. 17 to 19, the radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 26 has a switching element 32 instead of a modulation element 29 within the second segment 26. The switching element 32 is suitable for switching the radiation-emitting semiconductor chip 31 on and off. Furthermore, a first side surface 6 of the cutout 4 is provided with a first coating and a second side surface 7 of the cutout 4 is provided with a second coating 13, the first coating 10 and the second coating 13 reflecting as little as possible of the electromagnetic laser radiation generated in the first segment 25. In the present exemplary embodiment, the cutout 4 isolates the first segment 25 from the second segment 26 only electrically and not optically.

[0124] Furthermore, in the case of the present radiation-emitting semiconductor chip 31, a second layer 23 on a second side surface 22 of the semiconductor body 1 is embodied as reflective for the electromagnetic laser radiation in order, together with a first highly reflective layer 21 on the opposite side surface 20 of the semiconductor body 1, to form a resonator 30 for electromagnetic laser radiation of an active region 2 of the semiconductor body 1.

[0125] In contrast to the radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIGS. 17 to 19, the semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 27 comprises a third segment 33 having a photodiode 34. In this case, a further cutout 4 is arranged between the third segment 33 having the photodiode 34 and the first segment 25, in which electromagnetic laser radiation is generated during operation.

[0126] The radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 28 has a semiconductor body 1 having a total of six segments 25, 26, 33, three of which in each case are embodied as already described with reference to FIG. 27. Furthermore, the semiconductor body 1 has two ridge waveguides 24, each of which passes through three segments 25, 26, 33. The two ridge waveguides 24 merge into one common ridge waveguide 24 downstream of both modulation elements 29.

[0127] The radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 29 has a first segment 25, in which electromagnetic laser radiation is generated. A cutout 4 is arranged laterally with respect to the first segment 25, in the case of which cutout two opposite side surfaces 6, 7 are provided with a first coating 10 and a second coating 13, as already described here. Furthermore, the radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 29 comprises a ridge waveguide 24, which passes completely through the first segment 25 and splits into two branches 24′, 24″ downstream of the cutout 4.

[0128] Furthermore, the radiation-emitting semiconductor chip 31 comprises two further segments 26, 33, each embodied as a modulation element 29. In the present case, the modulation elements 29 are a Mach-Zehnder interferometer having an adjustable phase shift. One of the branches 24′, 24″ of the ridge waveguide 24 passes through each modulation element 29. The two branches 24′, 24″ of the ridge waveguide 24 merge again downstream of the two segments 26, 33 comprising the modulation elements 29. The ridge waveguide 24 guides the electromagnetic laser radiation generated in the first segment 25 during operation through the two modulation elements 29 and then to a side surface 22 of the semiconductor body 1, from which the laser radiation is emitted.

[0129] The radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 30 has a first segment 25 and a second segment 26. The first segment 25 and the second segment 26 are provided for generating electromagnetic laser radiation. A cutout 4 having a first side surface 6 and a second side surface 7 opposite the first side surface 6 is arranged between the first segment 25 and the second segment 26.

[0130] The first side surface 6 of the cutout 4 is provided with a first coating 10 and the second side surface 7 is provided with a second coating 13. The first coating 10, together with a first layer 21 on a side surface 20 of the semiconductor body 1, forms a first resonator 30′ for the electromagnetic radiation generated in an active region 2 within the first segment 25. The second coating 10, together with a second layer 23 on a further side surface 22 of the semiconductor body 1, forms a second resonator 30″ for the electromagnetic radiation generated in the active region 2 within the second segment 26. Consequently, electromagnetic laser radiation is generated in both segments 25, 26.

[0131] The semiconductor body 1 furthermore comprises a ridge waveguide 24 passing through the semiconductor body 1 from one side surface to the opposite side surface 22. In particular, the ridge waveguide 24 passes through the first segment 25 and the second segment 26 and guides electromagnetic laser radiation between the two side surfaces 20, 22 of the semiconductor body 1. The first resonator 30′ and the second resonator 30″ have different lengths, such that electromagnetic laser radiation of different modes arises in the two resonators 30′, 30″. The first resonator 30′ and the second resonator 30″ are optically coupled to one another. As a result, modes of electromagnetic laser radiation which exist for both resonators 30′, 30″ form in the entire ridge waveguide 24. In this regard, it is possible to generate electromagnetic laser radiation having only few modes, ideally only one mode, with a very small line width and little temperature dependence.

[0132] The array in accordance with the exemplary embodiment in FIG. 31 comprises four radiation-emitting semiconductor chips 31, which are embodied integrally with one another, that is to say are fabricated jointly from one wafer. Each semiconductor chip 31 of the array in accordance with the exemplary embodiment in FIG. 31 has a semiconductor body 1 comprising two segments 25, 26 having different functions, between which a respective cutout 4 is arranged.

[0133] Each semiconductor body 1 has a first segment 25, in which laser radiation is generated, and a second segment 26 embodied as a switching element 32. Opposite side surfaces 6, 7 of each cutout 4 are provided with coatings 10, 13, as already described. In particular, the coatings 10, 13 of the cutouts 4 of the different semiconductor bodies 1 are different. In this regard, the laser radiation emitted by the array can be adjusted in a desired manner.

[0134] In contrast to the array in accordance with the exemplary embodiment in FIG. 31, the array in accordance with the exemplary embodiment in FIG. 32 has radiation-emitting semiconductor chips 31 having semiconductor bodies 1 comprising only a single segment 25. In the present case, the different segments 25 of the various semiconductor bodies 1 are provided for generating electromagnetic laser radiation of different wavelengths. One of the coatings 10, 13 of the side surfaces 6, 7 of the cutouts 4 in each case forms a resonator 30 having a first layer 21 on a side surface 20 of the semiconductor body 1, such that the semiconductor chips 31 emit different laser radiation in a targeted manner. The use of a plurality of radiation-emitting semiconductor chips 31 in an array thus makes it possible to set different laser properties in a targeted manner. Additionally or alternatively, it is also possible to compensate for differences in the laser radiation of the semiconductor chips 31 which arise for example as a result of different thermal coupling during the mounting of an array.

[0135] The arrays in accordance with the exemplary embodiments in FIGS. 33 and 34 likewise have radiation-emitting semiconductor chips 31 comprising only a single segment 25. In this case, the resonators 30 of the individual radiation-emitting semiconductor chips 31 differ in their lengths.

[0136] In the methods in accordance with the exemplary embodiment in FIGS. 35 to 37, firstly a multiplicity of semiconductor bodies 1 are provided in a wafer assemblage. Separating trenches 35 are then arranged between the semiconductor bodies 1 (FIG. 35). By way of example, the separating trenches 35 can be produced by etching. A layer sequence comprising a first layer 21 and a second layer 23 is then deposited in the separating trenches 35. In this case, the first layer 21 is embodied as highly reflective for laser radiation generated in an active region 2 of the semiconductor body 1, while the second layer 32 is embodied as antireflective for the laser radiation.

[0137] Finally, the semiconductor bodies 1 are singulated along the separating trenches 35 in such a way that the first layer 21 is arranged on a side surface 20 of one semiconductor body and the second layer 23 is arranged on a side surface 22 of a directly adjacent semiconductor body 1. In this case, the separating trenches 35 are arranged in such a way that a plurality of semiconductor chips 31 comprising a semiconductor body 1 having a first layer 21 and/or second layer 23 are combined to form an array (FIGS. 36 and 37). These arrays can also furthermore be singulated to form individual semiconductor chips.

[0138] FIGS. 38 and 39 show simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a first layer 21 and a second layer 23 each having a multiplicity of individual layers 21, the material, thickness, refractive index and order of which are indicated in table 9. The curve C5 in FIG. 38 here shows the reflectivity of the first layer 21, while the curve C6 represents the reflectivity in the case of variation of the thickness of the layer 21 by 2% (at least 2 nanometers). The curve C5 in FIG. 39 here shows the reflectivity of the second layer 23, while the curve C6 represents the reflectivity in the case of variation of the thickness of the layer 23 by 2% (at least 2 nanometers).

TABLE-US-00009 TABLE 9 Thickness Material (nanometers) Refractive index n Laser 2.5 First layer SiO.sub.2 80 1.5 First layer TiO.sub.2 46 2.2 First layer SiO.sub.2 231 1.5 First layer TiO.sub.2 51 2.2 First layer SiO.sub.2 76 1.5 First layer TiO.sub.2 154 2.2 First layer SiO.sub.2 77 1.5 First layer TiO.sub.2 51 2.2 Separating Air 1000 1 trench Second TiO.sub.2 18.9 2.2 layer Second SiO.sub.2 28.5 1.5 layer Second TiO.sub.2 57 2.2 layer Second SiO.sub.2 28.1 1.5 layer Second TiO.sub.2 18.9 2.2 layer Second SiO.sub.2 85.5 1.5 layer Second TiO.sub.2 17 2.2 layer Second SiO.sub.2 29.6 1.5 layer Laser 2.5

[0139] In this exemplary embodiment, in a first step, the individual layers 21 of the first layer 21 and of the second layer 23 are deposited on separating trenches 35 between semiconductor bodies 1 which are embodied in continuous fashion in a wafer assemblage. The wafer assemblage is then singulated along the separating trenches 35, such that the first layer 21 is arranged on a side surface 20 of one semiconductor body and the second layer 23 is arranged on the side surface 22 of a directly adjacent semiconductor body 1. In this case, the first layer 21 is embodied as antireflective for the electromagnetic radiation generated in an active region 2 of the semiconductor body 1, while the second layer 23 is embodied as highly reflective for the electromagnetic radiation generated in the active region 2 of the semiconductor body 1 or has a defined reflectivity for the electromagnetic radiation generated in the active region 2 of the semiconductor body 1. In this case, a ratio of a thickness of the first layer 21 to a thickness of the second layer 23 is approximately 2.7:1.

[0140] FIG. 40 shows simulated values of the reflectivity R as a function of the wavelength 2, of incident electromagnetic radiation for a first coating and a second coating each having a multiplicity of individual layers, the material, thickness, refractive index and order of which are indicated in table 10.

TABLE-US-00010 TABLE 10 Thickness Material (nanometers) Refractive index n Laser 2.5 First SiO.sub.2 69 1.5 coating First TiO.sub.2 64 2.2 coating First SiO.sub.2 248 1.5 coating First TiO.sub.2 40 2.2 coating First SiO.sub.2 167 1.5 coating First TiO.sub.2 32 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 12.5 2.2 coating Second SiO.sub.2 65.1 1.5 coating Second TiO.sub.2 15.6 2.2 coating Second SiO.sub.2 96.7 1.5 coating Second TiO.sub.2 25 2.2 coating Second SiO.sub.2 26.9 1.5 coating Laser 2.5

[0141] The thickness of the first coating and the thickness of the second coating are in a ratio of 2.56:1. In particular, the reflectivity of the two coatings is set in such a way that said coatings have different reflectivities for different wavelength ranges. In the present case, the reflectivity amounts to approximately 30% in the blue spectral range and approximately 60% in the green spectral range.

[0142] FIG. 41 shows simulated values of the reflectivity R as a function of the wavelength 2 of incident electromagnetic radiation for a first coating and a second coating each having a multiplicity of individual layers, the material, thickness, refractive index and order of which are indicated in table 11.

TABLE-US-00011 TABLE 11 Thickness Material (nanometers) Refractive index n Laser 2.5 First TiO.sub.2 271 2.2 coating First SiO.sub.2 90 1.5 coating First TiO.sub.2 46 2.2 coating First SiO.sub.2 102 1.5 coating First TiO.sub.2 38 2.2 coating Cutout SiO.sub.2 1000 1.5 Second TiO.sub.2 7.6 2.2 coating Second SiO.sub.2 20.4 1.5 coating Second TiO.sub.2 9.2 2.2 coating Second SiO.sub.2 18 1.5 coating Second TiO.sub.2 54.2 2.2 coating Laser 2.5

[0143] The thickness of the first coating and the thickness of the second coating are in a ratio of 5:1. In particular, the reflectivity of the two coatings is set in such a way as to be approximately identical in the blue spectral range and in the green spectral range.

[0144] The radiation-emitting semiconductor chips 31 in accordance with the exemplary embodiments in FIGS. 42 and 43 have two segments 25, 26, of which the first segment 25 generates electromagnetic laser radiation during operation, while the second segment 26 is a switching segment 32 provided and configured for switching the radiation-emitting semiconductor chip 31 on and off. The two segments 25, 26 are separated from one another by a cutout 4.

[0145] In the case of the radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 42, the region 14 of the cutout 4 is not completely filled with a first coating 10 and a second coating 13 on opposite side surfaces 6, 7. Rather, a region 14 between the two coatings 6, 7 in the cutout 4 is filled with air. As illustrated schematically by the two arrows, it is desirable for a width of the cutout not to be made too large, in order that as much electromagnetic laser radiation as possible from the first segment 25 can enter the second segment 26. Preferably, a width of the cutout is at most 800 nanometers, at most 15 micrometers, at most 5 micrometers and particularly preferably at most 2 micrometers wide.

[0146] In the case of the radiation-emitting semiconductor chip 31 in accordance with the exemplary embodiment in FIG. 42, the region 14 of the cutout 4 between the first coating 10 and the second coating 13 is filled by a material 15 having a refractive index of greater than 1. As illustrated by the arrows in FIG. 43, a filling of the cutout 4 with such a material also increases the electromagnetic laser radiation that enters the second segment 26.

[0147] The invention is not restricted to the exemplary embodiments by the description on the basis of said exemplary embodiments. Rather, the invention encompasses any novel feature and also any combination of features, which in particular includes any combination of features in the patent claims, even if this feature or this combination itself is not explicitly specified in the patent claims or exemplary embodiments.