METHOD AND DEVICE FOR THE EXPOSURE OF A PHOTOSENSITIVE COATING
20230251580 · 2023-08-10
Assignee
Inventors
- Bernhard Thallner (St. Florian am Inn, AT)
- Boris Povazay (St. Florian am Inn, AT)
- Tobias Zenger (St. Florian am Inn, AT)
- Thomas Uhrmann (St. Florian am Inn, DE)
Cpc classification
G03F7/70466
PHYSICS
International classification
Abstract
The invention relates to a method and a device for the exposure of a photosensitive coating.
Claims
1. A method for exposure of a photosensitive coating, the photosensitive coating including at least a first photosensitive area and a second photosensitive area, comprising: reacting the first area to photons of a first wavelength; and the second area reacts to photons of a second wavelength, wherein the first wavelength is different from the second wavelength, wherein the method comprises the following steps, in particular in the following sequence: exposing the coating to photons of a first wavelength during which the first photosensitive area of the coating reacts to the photons of the first wavelength, and exposing the coating to photons of a second wavelength during which the second photosensitive area of the coating reacts to the photons of the second wavelength. wherein the first wavelength is different from the second wavelength.
2. The method according to claim 1, wherein the coating is exposed by means of a dynamically controllable unit.
3. The method according to claim 1, wherein the coating is exposed by means of at least one mask.
4. The method according to claim 1, wherein the exposing of the coating to the photons of the first wavelength produces a photochemical reaction only in the first area and the exposure of the coating to the photons of the second wavelength produces a photochemical reaction only in the second area.
5. The method according to claim 1, wherein the coating is exposed in a spatially resolved and/or punctual manner.
6. The method according to claim 1, wherein the exposing of the coating to the photons of the first wavelength and the exposing of the coating to the photons of the second wavelength, is by an individually controllable photon source such that a wavelength and/or a dose of the photons is/are adjusted.
7. The method according to claim 1, wherein the exposing of the coating to the photons of the first wavelength and the exposing of the coating to the photons of the second wavelength is by positioning a filter in front of a broad-band photon source such that a wavelength and/or a dose of the phontons is/are adjusted.
8. The method according to claim 1, wherein different depth regions of the coating react after one another.
9. The method according to claim 1, wherein the coating has sensitivities for photons of the same wavelength which vary over a thickness of the coating.
10. The method according to claim 1, wherein the first photosensitive area is a first layer, and wherein the second photosensitive area is a second layer on the first layer.
11. A device for the exposure of a photosensitive coating, the photosensitive coating including at least a first photosensitive area and a second photosensitive area, the device comprising: a radiation device configured to: expose the coating to photons of a first wavelength during which the first photosensitive area of the coating reacts to the photons of the first wavelength; and expose the coating to photons of a second wavelength during which the second photosensitive area of the coating reacts to the photons of the second wavelength, wherein the first wavelength is different from the second wavelength.
12. The device according to claim 11, comprising a dynamically controllable unit configured to expose the coating to the photons of the first and second wavelengths.
13. The device according to claim 11, comprising at least one mask configured to expose the coating to the photons of the first and second wavelengths.
14. The device according to claim 11, comprising a mobile support configured to move the coating with respect to the radiation device.
15. An article produced with the method of claim 1.
16. The method according to claim 2, wherein the dynamically controllable unit is a digital micromirror unit.
17. The method according to claim 5, wherein the coating is exposed by means of beam bundles.
18. The device according to claim 12, wherein the dynamically controllable unit is a digital micromirror unit.
19. An article produced with the device of claim 11.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0128] Further advantages, features and details of the invention emerge from the following description of preferred examples of embodiment and with the aid of the drawings. In the figures:
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DETAILED DESCRIPTION OF THE INVENTION
[0138] Identical components and components having the same function are denoted with the same reference numbers in the figures.
[0139] The figures are not true to scale. In particular, photosensitive layers 3a, 3b and optical system 4 with all its elements are not represented true to scale compared to substrate 1.
[0140] The inventive principle is illustrated by way of example in the simplest and most efficient way, in that each area is represented as a single, deposited layer. In the following
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[0143] Since photosensitive layers 3a, 3b have other physical and/or chemical properties, in particular with regard to their sensitivity to the wavelength of incident photons, it is particularly advantageous for the materials, from which photosensitive layers 3a, 3b are made, to be deposited by two single coating elements 2a, 2b separated from one another. It is also conceivable that coating system 2 comprises only a single coating element.
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[0145] In the next two figures, the principal of the exposure is described in a more illustrative manner with the aid of layouts 10a, 10b. Either positive and/or negative lacquer can be used for individual photosensitive layers 5a, 5b. The examples are described on the basis of negative lacquers, i.e. the materials of photosensitive layers 3a, 3b, which are hit by photons, crosslink at these points and remain in place after corresponding baking-out and/or development steps. These points are represented as black areas.
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[0147] The enlarged representation shows a layout section 10a projected by DMD 7 into photosensitive layer 3a. The individual mirrors of DMD 7 have been switched in such a way that only the peripheral, i.e. the lateral mirrors of the DMD, have exposed the photons into photosensitive layer 3a. An edge-shaped area, which is later to form the walls of a cavity 11, has thus been exposed.
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[0149] In contrast with the prior art, no focusing of the photon flow onto second depth region 9b of second photosensitive layer 3b has to be carried out with the method according to the invention. The photons of the second wavelength generally also reach first photosensitive 3a, without producing a chemical and/or physical reaction there, which leads to an exposure of second depth region 9a.
[0150] The enlarged representation shows a layout section 10b projected by DMD 7 into photosensitive layer 3b. The individual mirrors of DMD 7 have been switched in such a way that almost all the mirrors have projected the photons with a second wavelength into photosensitive layer 3b. Only some mirrors, with which the exposure can be carried out in the upper left-hand and lower right-hand area, have been switched in such a way that the photons have not been projected into photosensitive layer 3b. Areas according to the invention were thus able to be created, which after the subsequent baking-out and/or development steps will form entrances in a cover 12 in order to connect the outside world with cavity 11 (see previous figure).
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[0152] After these process steps, further process steps take place, in particular the development of coating system 3. Advantageously, only a single development step is required.
[0153] The impression could arise from the figures that the method according to the invention is a step-and-repeat process, with the aid of which at least one three-dimensional structure, including cavity 11, a cover 13 and entrances 12, is to be produced at one or more points in layer system 3 on substrate 1. Although the method according to the invention would very probably be suitable for positioning optical system 4 relative to substrate 1 at a first position to produce one such three-dimensional structure there, in order thereafter to carry out a plurality of further relative movements to a plurality of further positions to produce further three-dimensional structures, much more can be brought about with it.
[0154] Especially when the three-dimensional structures to be produced are larger than the exposure grid of DMD 7 itself, the three-dimensional structures have to be exposed during the relative movement between optical system 4 and substrate 1 by continuous programming of the mirrors of the DMD during the relative movement. The use of a photon source 5 and layer system 3 should be considered especially from the standpoint of such a continuous relative movement and a continuous switching process of the mirrors of DMD 7.
[0155] An alternative method according to the invention, which is based on a mask technology, is described in the following.
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[0160] According to the invention, filter 6b (not shown) is kept opened or removed or else second filter 6a is kept closed. Photons with a second wavelength thus exit from second single photon source 5b and are projected through apertures 16b of second mask 15b onto coating 3. Since only second photosensitive layer 3b of layer system 3 is sensitive for the photons of the second wavelength of second single photon source 5b, the chemical and/or physical reactions also take place only in second exposed depth regions 9b, although the photons also reach first photosensitive layer 3a.
[0161] Following these process steps, further process steps, in particular the development of coating system 3, take place. Advantageously, only a single development step is required.
TABLE-US-00001 List of reference numbers 1 Substrate 2 Coating system 2a, 2b Single coating element 3 Coating 3a, 3b Areas/photosensitive layers 4, 4′ Optical system 5 Radiation device, photon source 5a, 5b Single photon sources 6a, 6b Filters 7 Digital micromirror unit, digital micromirror device (DMD) 8a, 8b Secondary beams 9a, 9b Exposed depth region 10a, 10b Layout section 11 Cavity 12 Cover 13 Entrances 14 Mirror 15a, 15b Masks 16a, 16b Apertures