Holding apparatus for sample carriers, and method for introducing and withdrawing a sample carrier

Abstract

The invention relates to a holding apparatus (100) for sample carriers (200) for use in cryomicroscopy, encompassing: a body having at least one sample carrier receptacle that comprises at least one sample carrier support surface against which at least one sample carrier (200) is abuttable; at least one first sample carrier holding means (121); and at least one second sample carrier holding means (131) that is configured to impinge upon the sample carrier (200) with force against the first sample carrier holding means (121); and to an arrangement having a manipulation container and such a holding apparatus (100), and to methods for introducing and withdrawing a sample carrier (200).

Claims

1. A holding apparatus for sample carriers for use in cryomicroscopy, the holding apparatus comprising: a body having a sample carrier receptacle comprising a sample carrier support surface against which a sample carrier is abuttable; a first sample carrier holding means; and a second sample carrier holding means configured to impinge upon a sample carrier (200) which is abutting against the sample carrier support surface; wherein the second sample carrier holding means impinges upon the abutting sample carrier with force urging the abutting sample carrier against the first sample carrier holding means; wherein the first sample carrier holding means is defined by at least part of an inner wall of the sample carrier receptacle; wherein the first sample carrier holding means includes at least one first recess into which the abutting sample carrier is partly introducible; wherein the at least one first recess is in the form of an undercut; wherein the at least one first recess remains at least partly exposed when the sample carrier is abutting, and an abutment surface of the at least one first recess for contacting the abutting sample carrier faces in a direction intersecting the sample carrier support surface at an acute angle and is connected to the sample carrier support surface by a curved surface; wherein the first sample carrier holding means includes at least one projection whose inner surface serves at least in part as the sample carrier abutment surface; and wherein the sample carrier is held by the first sample carrier holding means such that a force component acts on the sample carrier in a direction parallel to the sample carrier support surface and another force component acts on the sample carrier in a direction perpendicular to the sample carrier support surface.

2. The holding apparatus according to claim 1, wherein the second sample carrier holding means comprises a spring.

3. The holding apparatus according to claim 2, wherein the spring is a leaf spring.

4. The holding apparatus according to claim 1, wherein the body includes a second recess arranged such that the abutting sample carrier is graspable by means of a grasping tool.

5. The holding apparatus according to claim 4, wherein the first sample carrier holding means comprises at least two portions arranged alongside the second recess in the body.

6. The holding apparatus according claim 1, wherein a height of the body extending perpendicular to the sample carrier support surface is no greater than a thickness of the abutting sample carrier.

7. The holding apparatus according to claim 1, wherein the sample carrier receptacle is configured such that the abutting sample carrier abuts with at least 10% of a surface facing toward the sample carrier support surface.

8. The holding apparatus according to claim 1, wherein the sample carrier receptacle is configured such that a mount of the abutting sample carrier abuts against the sample carrier support surface, wherein said mount abuts with at least 20% of a surface facing toward the sample carrier support surface.

9. The holding apparatus according to claim 1, wherein the second sample carrier holding means is configured to be pressed away from the first sample carrier holding means upon positioning of a sample carrier in the sample carrier receptacle.

10. The holding apparatus according to claim 1, wherein the sample carrier receptacle is configured to receive annular sample carriers.

11. The holding apparatus according to claim 1, wherein the body has at least two sample carrier receptacles.

12. The holding apparatus according to claim 1, wherein a largest dimension of the holding apparatus is less than 50 mm.

13. The holding apparatus according to claim 1, wherein the body includes a manipulator receptacle for receiving a manipulator for moving the holding apparatus.

14. An apparatus comprising: a holding apparatus for sample carriers for use in cryomicroscopy, the holding apparatus including (i) a body having a sample carrier receptacle that comprises a sample carrier support surface against which a sample carrier is abuttable, (ii) a first sample carrier holding means, and (iii) a second sample carrier holding means configured to impinge upon a sample carrier which is abutting against the sample carrier support surface with force urging the abutting sample carrier against the first sample carrier holding means, wherein the body further has a manipulator receptacle, wherein the first sample carrier holding means is defined by at least part of an inner wall of the sample carrier receptacle, wherein the first sample carrier holding means includes at least one first recess into which the abutting sample carrier is partly introducible, wherein the at least one first recess is in the form of an undercut, and wherein the at least one first recess remains at least partly exposed when the sample carrier is abutting, and an abutment surface of the at least one first recess for contacting the abutting sample carrier faces in a direction intersecting the sample carrier support surface at an acute angle and is connected to the sample carrier support surface by a curved surface; wherein the first sample carrier holding means includes at least one projection whose inner surface serves at least in part as the sample carrier abutment surface; and wherein the sample carrier is held by the first sample carrier holding means such that a force component acts on the sample carrier in a direction parallel to the sample carrier support surface and another force component acts on the sample carrier in a direction perpendicular to the sample carrier support surface; a manipulation container in which the holding apparatus can be immobilized; and a manipulator receivable by the manipulator receptacle to mount the holding apparatus on the manipulator, wherein the manipulator is operable to move the holding apparatus.

15. A method for introducing a sample carrier into a holding apparatus, the holding apparatus comprising (i) a body having a sample carrier receptacle that comprises a sample carrier support surface against which a sample carrier is abuttable, (ii) a first sample carrier holding means, and (iii) a second sample carrier holding means configured to impinge upon a sample carrier which is abutting against the sample carrier support surface with force urging the abutting sample carrier against the first sample carrier holding means, the method comprising the steps of: grasping the sample carrier by means of a grasping tool; pressing the sample carrier against the second sample carrier holding means such that the second sample carrier holding means is pressed away from the first sample carrier holding means; abutting the sample carrier against the sample carrier support surface; and moving the sample carrier onto the first sample carrier holding means until the sample carrier comes to a stop against the first sample carrier holding means; wherein the first sample carrier holding means is defined by at least part of an inner wall of the sample carrier receptacle, wherein the first sample carrier holding means includes at least one first recess into which the abutting sample carrier is partly introducible, wherein the at least one first recess is in the form of an undercut, and wherein the at least one first recess remains at least partly exposed when the sample carrier is abutting, and an abutment surface of the at least one first recess for contacting the abutting sample carrier faces in a direction intersecting the sample carrier support surface at an acute angle and is connected to the sample carrier support surface by a curved surface and wherein the first sample carrier holding means includes at least one projection whose inner surface serves at least in part as the sample carrier abutment surface; and wherein the sample carrier is held by the first sample carrier holding means such that a force component acts on the sample carrier in a direction parallel to the sample carrier support surface and another force component acts on the sample carrier in a direction perpendicular to the sample carrier support surface.

Description

BRIEF DESCRIPTION OF THE DRAWING VIEWS

(1) FIG. 1 is an exploded view schematically showing a holding apparatus according to the present invention in a preferred embodiment.

(2) FIG. 2 shows the holding apparatus of FIG. 1 in assembled form, with a sample carrier inserted.

(3) FIG. 3 is an enlarged detail of FIG. 2.

(4) FIG. 4 is a plan view of the holding apparatus of FIG. 1.

(5) FIG. 5 is an enlarged section view of part of the holding apparatus of FIG. 4.

(6) FIG. 6 shows part of the portion shown in FIG. 5.

(7) FIG. 7 is an enlarged section view of a further part of the holding apparatus of FIG. 4.

(8) FIG. 8 shows an arrangement according to the present invention having a manipulation container and holding apparatus, in a preferred embodiment.

(9) FIGS. 9A-9D show execution of a method according to the present invention, in a preferred embodiment.

DETAILED DESCRIPTION OF THE INVENTION

(10) FIGS. 1 to 7 schematically depict a holding apparatus according to the present invention for sample carriers, in a preferred embodiment. This holding apparatus 100 will be described in further detail below, with reference to all of FIGS. 1 to 7.

(11) Holding apparatus 100 has a body 110 that here, aside from various recesses and the like, has a substantially cuboidal external shape. In the interior, holding apparatus 100 can also be hollow or can exhibit recesses. Holding apparatus 100 is provided, by way of example, for the reception of two sample carriers 200, one of which is visible in each of FIGS. 2 to 5, and therefore comprises two sample carrier receptacles 155.

(12) Holding apparatus 100 furthermore comprises two first sample carrier holding means 121 that are constituted here by part of an inner wall 122 of sample carrier receptacle 155 and furthermore are embodied, in particular, integrally with body 110. In particular, first sample carrier holding means 121 are embodied with first recesses 125 in the form of undercuts. This is apparent especially clearly from the section views in FIGS. 5 and 6, where FIG. 6 shows the left part of FIG. 5 but without abutting sample carriers.

(13) In particular, first sample carrier holding means 121 comprises here a projection 123 whose outer edge, here labeled P, is located above sample carrier support surface 150. The result is to constitute here a recess 125 that remains at least partly exposed even when a sample carrier is abutting. Sample carrier 200 therefore abuts only with a sample carrier abutment surface 122a that here is part of inner wall 122, and in the region of projection 123. What can also be achieved in this fashion is that sample carrier 200 is held by first sample carrier holding means 121 in such a way that a force or force component acts on sample carrier 200 not only parallel to sample carrier support surface 150 but also perpendicularly thereto. Sample carrier 200 is thus also pressed onto, or compressed against, sample carrier support surface 150 by first sample carrier holding means 121, and thus also prevented from falling out if the holding apparatus is, for example, rotated.

(14) In addition, it is also apparent here that holding apparatus 100 does not project beyond sample carrier 200 in terms of height, i.e. that the extent of holding apparatus 100 perpendicularly to sample carrier support surface 150 is no greater than the thickness d of sample carrier 200, as shown in FIG. 5.

(15) First sample carrier holding means 121 are furthermore adapted to the round shape of sample carrier 200. In particular, first sample carrier holding means 121 here each comprise two portions 121a and 121b that are arranged alongside a second recess 141. A grasping tool can fit in second recess 141 upon introduction or withdrawal of sample carriers, as will be explained in further detail later.

(16) Holding apparatus 100 furthermore comprises two second sample carrier holding means 131 that here each comprise a spring, in particular a leaf spring. In the instance shown, the two leaf springs 131 are embodied as part of a plate 130. A plate 130 of this kind, which is made of a suitable, i.e. resilient, material, can be embodied correspondingly for this purpose.

(17) A hole is provided in plate 130 so that plate 130, and thus the two leaf springs 131, can be fastened onto body 110 by means of a screw 135. It is understood that other fastening means can also be used, or that the leaf springs can also be fastened individually.

(18) It is also clearly evident from what is shown in FIG. 1, and in particular also in FIG. 7, that leaf springs 131 are deflected toward second holding means 121, for example between approximately 5° and 7°, with respect to the remainder of plate 130. This is shown in FIG. 7 by way of the angle ϕ. Corresponding recesses 132 are also provided for this purpose in body 110. As a result, leaf springs 131 can each exert a force on a sample carrier 200 abutted against sample carrier support surface 150 with a force component not only toward first sample carrier holding means 121 but also toward sample carrier support surface 150, and can thereby securely retain the respective sample carriers, as is evident from FIGS. 2 and 3.

(19) The angle included between leaf springs 131 and the remainder of plate 130 when a sample carrier is introduced can, in particular, be smaller than with no sample carrier introduced, so as to ensure exertion of a force when a sample carrier is introduced. The sample carrier can thereby be pressed against sample carrier support surface 150 not only by means of first sample carrier holding means 121 but also by means of second sample carrier holding means 131.

(20) At the same time, however, the respective leaf spring 131 can also be pressed in a direction away from the corresponding first holding means 121 when a corresponding force is exerted (externally) on the respective leaf spring 131. This can be advantageous in particular upon positioning or introduction of a sample carrier, but also upon withdrawal.

(21) FIG. 8 schematically depicts an arrangement having a manipulation container 400 and a holding apparatus 100, in a preferred embodiment. Manipulation container 400 comprises a partition 410 and can be held and moved, for example, by means of a handle 420.

(22) Provided in manipulation container 400 is a manipulation holder 445 that comprises a guide 445 into which holding apparatus 100 can be introduced and immobilized. When the holding apparatus is immobilized, a sample carrier can be introduced into holding apparatus 100 or withdrawn from holding apparatus 100, for example, by means of a grasping tool 300, here in the form of a forceps.

(23) Also provided is a manipulator 430 that can be moved, for example, along an axis in which, by way of example, handle 420 is also located. Manipulator 430 can be part of manipulation apparatus 400. Manipulator 430 can furthermore, for example, be mounted onto holding apparatus 100 so that holding apparatus 100 can be mounted onto manipulator 430 by means of receptacle 160, as is apparent e.g. from FIGS. 1 and 2. Holding apparatus 100 can then be moved therewith. It is also conceivable for holding apparatus 100 to be withdrawn from manipulation container 400, or introduced into it, through a suitable opening.

(24) Be it noted that the manipulation apparatus—both in isolation and when located in the manipulation container, depending on the situation—can be moved back and forth between various devices in order to carry out various processes using various devices.

(25) FIGS. 9A-9D depict execution of a preferred embodiment of a method according to the present invention, schematically and from top to bottom, with reference to four illustrations. Firstly, a sample carrier 200 can be grasped with a forceps 300.

(26) It is also apparent from the first illustration (FIG. 9A) that sample carrier 200 can comprise a mount 210 that is embodied here in particular annularly, and a grid 220; a sample can be placed onto the latter.

(27) As is evident from the second illustration (FIG. 9B), sample carrier 200 can then be pressed by means of the forceps in direction R1 against the corresponding leaf spring 131. The sample carrier should be held obliquely, for example at an angle of approximately 5°, as is also indicated by the oblique arrow associated with R1. Leaf spring 131 becomes slightly pressed aside by the first holding means in this process.

(28) Sample carrier 200 can then be lowered in direction R2 as shown in the third illustration (FIG. 9C), i.e. the sample carrier can then be placed on the sample carrier support surface. In that context, the forceps fits into second recess 141 shown, for example, in FIG. 1. Sample carrier 200 can then be pulled against the first sample carrier holding means, here in direction R3, as is evident from the fourth illustration (FIG. 9D). Leaf spring 131 relaxes slightly, and the sample carrier is pressed into or against the first sample carrier holding means. As a result of the particular configuration, already described, of the first and second sample carrier holding means, the sample carrier can also, in particular, be pressed onto the sample carrier support surface.

(29) The sample carrier is thereby held securely in the holding apparatus. The aforementioned steps can be carried out in reverse order for removal of sample carrier 200 from the holding apparatus.

(30) As is evident from the Figures, the sample carrier, at least in the form shown here, can be placed into the holding apparatus on both sides. Care should nevertheless be taken that that side of the sample carrier on which the grid is mounted faces upward, i.e. away from the sample carrier support surface. Better observation by means of a microscope is thereby possible.