MEASURING SYSTEM AND METHOD FOR MEASURING LIGHT SOURCES

Abstract

The present disclosure relates to a measuring system for measuring a light source in a polarization-independent manner, having a camera comprising a plurality of image sensors arranged in the form of a matrix, and a microscope optics, and to a method for measuring the light sources in a polarization-independent manner. The aim is to make it possible to measure the light output of the light source in an improved, simple and largely polarization-independent manner while maintaining the spatial resolution in the microscopic range. To that end, the present disclosure proposes that a linear polarizer is associated with each of the image sensors, wherein the linear polarizers are arranged in the form of a matrix in front of the image sensors and two or more, preferably four, polarizers form a matrix block, wherein the transmission directions of adjacent linear polarizers within a matrix block are rotated relative to one another, preferably by 45° or by 90°. In the method according to the present disclosure, the measurement signals of the image sensors that are associated with the polarizers of the same matrix block are converted into light output measured values in order to obtain the desired polarization independence.

Claims

1. A measuring system for measuring a light source in a polarization-independent manner, having a camera comprising a plurality of image sensors arranged in the form of a matrix, and a microscope optics, wherein a linear polarizer is associated with each of the image sensors, wherein the linear polarizers are arranged in the form of a matrix in front of the image sensors and two or more polarizers form a matrix block, wherein the transmission directions of adjacent linear polarizers within a matrix block are rotated relative to one another, preferably by 45° or by 90°.

2. The measuring system as claimed in claim 1, wherein micro lenses are arranged in the form of a matrix in front of the polarizers and one micro lens is associated with each polarizer.

3. The measuring system as claimed in claim 1, wherein the image sensors are in the form of CMOS sensors.

4. The measuring system as claimed in claim 1, wherein a beam splitter is provided, wherein the light of the light source can be fed by means of the beam splitter to the camera and at the same time to a spectral measuring device.

5. The measuring system as claimed in claim 4, wherein the spectral measuring device is a spectroradiometer.

6. The measuring system as claimed in claim 1, wherein an optical edge filter is provided which can be pivoted or moved into the beam path between the light source and the camera.

7. The measuring system as claimed in claim 1, wherein the microscope optics comprises at least one optical filter.

8. The measuring system as claimed in claim 1, wherein the microscope optics comprises a tube lens.

9. The measuring system as claimed in claim 1, wherein the magnification and the numerical aperture of the microscope optics are so chosen that the optical resolution is lower than the geometric resolution of the arrangement of the matrix blocks.

10. A method for measuring a light source in a polarization-independent manner using a measuring system as claimed in claim 1, in which the light source emits light which is focused on the image sensors of the camera by the microscope optics, the light passes through the polarizers associated with each of the image sensors, and the light is captured by the image sensors, wherein each image sensor converts the light that is incident on the image sensor into a measurement signal, wherein the measurement signals of the image sensors that are associated with the polarizers of the same matrix block are then converted into light output measured values in which polarization-dependent deviations are compensated for, and an image of the distribution of the light output of the light source is produced from the light output measured values of all the matrix blocks.

11. The method as claimed in claim 10, wherein the measured light source is an arrangement of VCSEL elements in the form of a matrix.

12. The method as claimed in claim 10, wherein the measurement is performed with a spatial resolution of less than 1 μm.

13. The method as claimed in claim 10, wherein the light source emits light with a wavelength greater than 800 nm.

14. The method as claimed in claim 10, wherein the conversion of the measurement signals of the image sensors that are associated with the polarizers of the same matrix block into absolute light output measured values is carried out on the basis of a calibration performed beforehand.

Description

[0023] The invention will be explained in greater detail hereinbelow with reference to the drawings, in which:

[0024] FIGS. 1a and 1b: show, schematically, a 3D view of a measuring system according to the invention with a housing (a) and without a housing (b);

[0025] FIG. 2: shows, schematically, detail region A from FIG. 1b;

[0026] FIGS. 3a and 3b: show, schematically, the construction of the polarizers for use in a measuring system according to the invention;

[0027] FIGS. 4a and 4b: show the total output measurement with different polarizers without polarization correction (4a) and with polarization correction (4b);

[0028] FIG. 5: shows the total output measurement with a conventional camera and according to the invention with a camera having polarizers including polarization correction.

[0029] In the figures, the housing of the measuring system according to the invention is designated with reference sign 1. A microscope objective 2 is arranged on the front side. FIG. 1b shows the interior of the measuring system with the housing 1 removed. Behind the microscope objective 2, further elements of a microscope optics M are arranged, the individual components of which will be discussed in detail hereinbelow (see FIG. 2). A beam splitter 3 is further provided, which guides part of the light by way of a coupling optics 4 into a light-transmitting fiber F, of which only a short piece is shown. The fiber guides the light to a spectroradiometer (not shown), in order to perform a spectral measurement. A camera 5 is further provided, which captures the other part of the light for the spatially resolved measurement of the light output.

[0030] FIG. 2 shows the microscope optics M from FIG. 1b in detail. Optical filters 6 and a tube lens 7 are arranged behind the microscope objective 2.

[0031] In FIG. 3a, three matrix arrangements (8, 9, 10) are shown, which are components of the camera 5. The matrix arrangement 8 at the front is composed of micro lenses 11. The rear matrix arrangement 10 is formed of individual image sensors 12. The image sensors 12 are in the form of, for example, CMOS sensors or CCD sensors. Between these two matrix arrangements 8, 10 there is a further matrix arrangement 9. The matrix arrangement 8 is composed of polarizers 13. The transmission angles of adjacent polarizers 13 are different. An image sensor 12 and a micro lens 11 are associated with each polarizer 13.

[0032] The polarizers 13 are additionally divided into 2×2 matrix blocks 13a. Such a matrix block 13a is shown schematically in FIG. 3b. The transmission directions of the individual polarizers 13 of a matrix block 13a are here each rotated by 45° relative to the adjacent polarizers 13 and in this exemplary embodiment lie at 0°, 45°, 90° and 135°.

[0033] In the measurement of a light source using the measuring system according to the invention, light is emitted by the light source. The light is introduced into the measuring system by way of the microscope objective 2 and guided through the optical filters 6 and the tube lens 7 to the beam splitter 3. By way of the beam splitter 3, the light is guided to the camera 5 and in parallel to the spectroradiometer. In the camera, the light strikes the image sensors 12 by way of the micro lenses 11 and through the polarizers 13. The light is captured by means of the image sensors 12 and converted into electrical measurement signals. The measurement signals of the image sensors 12 that are associated with a 2×2 matrix block 13a are then each converted into an output measured value which is free of polarization effects. The influence of the polarization of the light emitted by the light source is thereby minimized and the measurement result is virtually polarization-independent. The polarization sensitivity of the image sensors 13 is compensated for by the conversion, and the error budget caused by the polarization is minimized. Thus, the light output can be determined precisely and in a spatially-resolved manner. For determining the absolute output or a radiometric quantity linked with the absolute output, such as in particular the radiation density, calibration, for example by measuring a reference light source beforehand, is necessary. The opening angle of the light emission can be determined by varying the distance between the light source and the measuring system and observing the change in the image scale on the sensor array 10. This is of interest in particular when measuring VCSEL arrays. At the same time, the measuring system makes it possible to measure the absolute output of individual emitters of a VCSEL array quickly, easily and precisely.

[0034] It is conceivable in other embodiments according to the invention to divide the polarizers 12 into 2×1 matrix blocks, for example, and to shift the transmission directions of the polarizers 13 of a matrix block by 90°. Further variants are possible.

[0035] For converting the measurement signals into output measured values, a polarization-dependent correction factor can be used according to the invention. The 2D information of the polarization contained in each matrix block is used to find the correct correction factor for each pixel.

[0036] A typical calibration for a camera consists of a bad-pixel correction, a dark-current correction (“img_dark(x,y)”), a flat-field calibration (“img_ffc(x,y)”) and a sensitivity correction (“sensitivity(lambda)”):

img_cal(x,y)=(img_raw(x,y)−img_dark(x,y))*img_ffc(x,y)*sensitivity(lambda) [0037] “img_raw” is the image as seen by the camera, with the raw camera pixels. [0038] “img_dark” is the dark noise of the camera, typically measured with the camera in dark surroundings without light. [0039] “img_ffc” is a position-dependent correction factor due to imperfections of the optics and the sensitivity changes of the camera. [0040] “sensitivity(lambda)” is a wavelength-dependent correction factor due to the camera technology, the quantum efficiency of which is dependent on the wavelength of the incident light.

[0041] According to the invention, this conventional correction is extended by a correction factor for the polarization:

img_cal(x,y)=(img_raw(x,y)−img_dark(x,y))*img_ffc(x,y)*sensitivity(lambda)*polcorrection(x,y)

[0042] The polarization correction (“polcorrection(x,y)”) is dependent on the polarization angle at a position (x,y) and the degree thereof at that position (x,y):

polcorrection(x,y)=A0(x,y)*cos(2*alpha(x,y)−alpha0(x,y))+Aoff(x,y)*DoP(x,y) [0043] “alpha(x,y)” describes the polarization angle at position (x,y), measured by the camera and its polarization-sensitive pixels (matrix blocks), [0044] “DoP(x,y)” describes the degree of polarization at position (x,y), measured by the camera and its polarization-sensitive pixels, [0045] “A0(x,y)” describes a position-sensitive matrix of the zero-phase polarization, [0046] “alpha0(x,y)” describes the zero-phase polarization (dependent on the polarization filters of the respective matrix block at position x,y of the sensor matrix), [0047] “AOff(x,y)” describes a position-dependent offset of the amplitude.

[0048] Calibration for a camera with four different polarization orientations is carried out in a further development of the method according to the invention in the following steps:

[0049] 1. Bad-pixel correction: So-called cold and hot pixels in the camera are determined in the same manner as in conventional methods. At least two images are recorded in dark mode and in the light state and the individual pixel deviations are determined.

[0050] 2. Dark-current correction: An image is recorded in dark surroundings (as in conventional methods). This gives the value for the dark-current correction “img_dark(x,y)”.

[0051] 3. Flat-field calibration: Different flat-field calibration images are recorded with polarized light with at least four different polarizations (e.g. 0°, 45°, 90°, 135°). For each polarization, the flat-field calibration is carried out in the same manner as in conventional methods. The four flat-field calibration images are used to correct each polarization filter of the camera. A complete image is calculated therefrom. This gives the value for the flat-field calibration “img_ffc(x,y)”, independent of the polarization.

[0052] 4. Any offset owing to non-ideal polarizers (manufacturing inaccuracies, etc.) can be calculated from the four different polarization images. This gives an offset for each polarization calculation (alpha0(x,y)) and an amplitude variation, dependent on the position on the camera (A0(x,y)) and possibly dependent on the polarization of the light (Aoff(x,y)), which is also dependent on the degree of polarization.

[0053] 5. Monochromatic light is used to measure the sensitivity of the camera. This must be carried out over the entire wavelength calibration range and gives a scalar factor for each wavelength. This is required for the absolute calibration of the camera. This gives the value for the sensitivity correction “sensitivity(lambda)”.

[0054] In FIGS. 4a and 4b, total output measurements without and with polarization correction are compared with one another. The measurement was carried out with rotation of the light source in 45° steps. The measurement was performed using a polarized light source and a typical CMOS camera with a microscope optics. In FIG. 4a, a difference in the pixel sum of more than 10% is apparent only as a result of rotation of the polarization of the light source by 90°. This clearly shows that the polarization of the light source cannot be disregarded when the absolute output is to be measured using a camera. The polarization dependence cannot be disregarded in the case of relative measurements of individual emitters of a VCSEL array either, because there is the possibility of the polarization change for each emitter individually.

[0055] FIG. 4b shows the result of measuring the same light source using a camera with polarization filters and carrying out a polarization correction as described above. Virtually no polarization dependence can be seen.

[0056] FIG. 5 shows a measurement of a polarized light source. The total power measured with a standard CMOS camera (solid line) and measured with the camera with polarizers (broken line) and correction according to the invention is shown.

[0057] The polarizers were rotated with a lambda/2 plate. The measurement error due to polarization is greatly reduced.

LIST OF REFERENCE SIGNS

[0058] 1 housing

[0059] 2 microscope objective

[0060] 3 beam splitter

[0061] 4 coupling optics

[0062] 5 camera

[0063] 6 optical filters

[0064] 7 tube lens

[0065] 8-10 matrix arrangements

[0066] 11 micro lens

[0067] 12 image sensor

[0068] 13 polarizer

[0069] 13a matrix block of polarizers 13

[0070] M microscope optics

[0071] F fiber