OPTICAL PULSE TESTING DEVICE AND OPTICAL PULSE TESTING METHOD
20220120635 · 2022-04-21
Assignee
Inventors
- Atsushi NAKAMURA (Musashino-shi, Tokyo, JP)
- Nazuki HONDA (Musashino-shi, Tokyo, JP)
- Daisuke IIDA (Musashino-shi, Tokyo, JP)
- Hiroyuki OSHIDA (Musashino-shi, Tokyo, JP)
- Keiji OKAMOTO (Musashino-shi, Tokyo, JP)
Cpc classification
G01M11/3154
PHYSICS
International classification
Abstract
An object of the present invention is to provide an optical pulse test apparatus and an optical pulse test method that are capable of determining a change in state of an optical fiber connection portion without the need for reference and without being affected by changes in gap interval before and after the change in state. The optical pulse test apparatus according to the present invention is configured to perform an OTDR measurement by using test optical pulses having spectral widths of from several nm to several hundred nm arranged at intervals of several ten nm to several hundred nm, calculate a reflection peak value caused by the Fresnel reflection at the connection portion from the obtained OTDR waveform, and determine a state such as water immersion of the optical fiber connection portion based on the value.
Claims
1. An optical pulse test apparatus comprising: a light incident unit configured to input test optical pulses having predetermined spectral widths on one end of an optical fiber under test, the optical fiber under test including a connection portion at which optical fibers are connected to each other; a light receiving unit configured to receive backscattered light by the test optical pulses from one end of the optical fiber under test and obtain a light intensity distribution with respect to a longitudinal direction of the optical fiber under test; and a computation unit configured to calculate a reflection peak value caused by Fresnel reflection generated at the connection portion of the optical fiber under test from the light intensity distribution, and determine a type of medium at the connection portion of the optical fiber under test, based on the reflection peak value.
2. The optical pulse test apparatus according to claim 1, wherein the predetermined spectral widths are from several nm to several hundred nm.
3. The optical pulse test apparatus according to claim 1, wherein the light incident unit sequentially inputs the test optical pulses having different center wavelengths on one end of the optical fiber under test, and the computation unit determines a type of medium at the connection portion of the optical fiber under test, based on an average value obtained by averaging the reflection peak values determined for each of the test optical pulses having different center wavelengths.
4. The optical pulse test apparatus according to claim 1, wherein the light incident unit sequentially inputs the test optical pulses having different center wavelengths on one end of the optical fiber under test, and the computation unit obtains reflectance data from the reflection peak values determined for each of the test optical pulses having different center wavelengths, and determines a type of medium at the connection portion of the optical fiber under test, based on a value obtained by logarithmically expressing a reciprocal of an average value obtained by averaging the reflectance data.
5. The optical pulse test apparatus according to claim 1, wherein the light incident unit sequentially inputs the test optical pulses having different center wavelengths on one end of the optical fiber under test, and the computation unit obtains reflectance data of the reflection peak values determined for each of the test optical pulses having different center wavelengths, and determines a type of medium at the connection portion of the optical fiber under test, based on a value obtained by logarithmically expressing a minimum value of the reflectance data.
6. An optical pulse test method comprising: inputting test optical pulses having predetermined spectral widths on one end of an optical fiber under test, the optical fiber including a connection portion at which optical fibers are connected to each other; receiving backscattered light by the test optical pulses from one end of the optical fiber under test and obtaining a light intensity distribution with respect to a longitudinal direction of the optical fiber under test; and calculating a reflection peak value caused by Fresnel reflection generated at the connection portion of the optical fiber under test from the light intensity distribution to determine a type of medium at the connection portion of the optical fiber under test, based on the reflection peak value.
7. The optical pulse test method according to claim 6, wherein the predetermined spectral widths are from several nm to several hundred nm.
8. The optical pulse test method according to claim 6, wherein the test optical pulses having different center wavelengths are, in the inputting, sequentially input on one end of the optical fiber under test, and a type of medium at the connection portion of the optical fiber under test is determined, in the calculating, based on an average value obtained by averaging the reflection peak values determined for each of the test optical pulses having different center wavelengths.
9. The optical pulse test method according to claim 6, wherein the test optical pulses having different center wavelengths are, in the inputting, sequentially input on one end of the optical fiber under test, and reflectance data is obtained, in the calculating, from the reflection peak values determined for each of the test optical pulses having different center wavelengths, and a type of medium at the connection portion of the optical fiber under test is determined, in the calculating, based on a value obtained by logarithmically expressing a reciprocal of an average value obtained by averaging the reflectance data.
10. The optical pulse test method according to claim 6, wherein the test optical pulses having different center wavelengths are, in the inputting, sequentially input on one end of the optical fiber under test, and reflectance data of the reflection peak values determined for each of the test optical pulses having different center wavelengths is obtained in the calculating, and determines, in the calculating, a type of medium at the connection portion of the optical fiber under test, based on a value obtained by logarithmically expressing a minimum value of the reflectance data.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0021]
[0022]
[0023]
[0024]
[0025]
[0026]
[0027]
[0028]
[0029]
[0030]
[0031]
DESCRIPTION OF EMBODIMENTS
[0032] Embodiments of the present invention will be described with reference to the accompanying drawings. The embodiments described below are examples of the present invention and the present invention is not limited to the embodiments described below. In the present specification and the drawings, components with the same reference signs indicate the same components.
[0033]
[0034] The computation unit C calculates a reflection peak value caused by the Fresnel reflection generated at the connection portion X of the optical fiber under test FUT from the light intensity distribution, and determines the type of medium in the connection portion X of the optical fiber under test FUT, based on the reflection peak value.
[0035] In the following description, the test wavelength has three wavelengths, but is not limited to three wavelengths.
[0036] 1-1 represents a first light source having a wavelength λ1. 1-2 represents an optical bandpass filter that cuts out light from light emitted from the first light source at a desired spectral width.
1-3 represents a first light pulsing unit for pulsing the light cut out with the bandpass filter to produce a first test optical pulse. 1-4 represents a second light source having a wavelength λ2. 1-5 represents an optical bandpass filter that cuts out light from light emitted from the second light source at a desired spectral width. 1-6 represents a second light pulsing unit for pulsing the light cut out with the bandpass filter to produce a second test optical pulse. 1-7 represents a third light source having a wavelength λ3. 1-8 represents an optical bandpass filter that cuts out light from light emitted from the third light source at a desired spectral width. 1-9 represents a third light pulsing unit for pulsing the light cut out with the bandpass filter to produce a third test optical pulse. 1-10 represents an electrical pulse generation unit that outputs an electrical pulse for driving the first to third light pulsing units and a trigger signal for an A/D converter. 1-11 to 1-13 represent optical circulators each of which separates backscattered light from an optical fiber under test. 1-14 represents a light switching unit that sequentially inputs the first to third test optical pulses to the FUT. 1-15 represents a light switching unit that receives backscattered light generated by the test optical pulse. 1-16 represents a light detector. 1-17 represents an A/D converter, and 1-18 represents a computation processor.
[0037] The light incident unit A includes light sources (1-1, 1-4, 1-7), optical bandpass filters (1-2, 1-5, 1-8), light pulsing units (1-3, 1-6, 1-9), optical circulators (1-11, 1-12, 1-13), a light switching unit 1-14, and an electrical pulse generation unit 1-10. The light receiving unit B includes a light switching unit 1-15 and a light detector 1-16. The computation unit C includes an A/D converter 1-17 and a computation processor 1-18.
[0038] The acquisition of an OTDR waveform for detecting the state of the optical fiber connection portion using the present apparatus will be described.
[0039] The light having a center wavelength λ1 emitted from the first light source 1-1 is trimmed to a spectral width Δλ1 by the optical bandpass filter 1-2, and then pulsed by the light pulsing unit 1-3 based on the electrical signal generated by the electrical pulse generation unit 1-10, and thus a first test optical pulse having a center wavelength λ1 and a spectral width Δλ1 is generated.
[0040] The light having a center wavelength λ2 emitted from the second light source 1-4 is trimmed to a spectral width Δλ2 by the optical bandpass filter 1-5, and then pulsed by the light pulsing unit 1-6 based on the electrical signal generated by the electrical pulse generation unit 1-10, and thus a second test optical pulse having a center wavelength λ2 and a spectral width Δλ2 is generated.
[0041] The light having a center wavelength λ3 emitted from the third light source 1-7 is trimmed to a spectral width Δλ3 by the optical bandpass filter 1-8, and then pulsed by the light pulsing unit 1-9 based on the electrical signal generated by the electrical pulse generation unit 1-10, and a third test optical pulse having a center wavelength λ3 and a spectral width Δλ3 is generated.
[0042] As illustrated in
[0043] The first, second, and third test optical pulses can also be generated by trimming a wide band light having a spectral width of several hundred nm, such as super continuum light emitted from a single light source, by an optical bandpass filter to have a desired center wavelength and spectral width.
[0044] The light incident unit A sequentially inputs the test optical pulses having different center wavelengths on one end of the optical fiber under test FUT, and the computation unit C determines the type of medium at the connection portion of the optical fiber under test based on an average value obtained by averaging the reflection peak values determined for each of the test optical pulses having different center wavelengths.
[0045] When the first test optical pulse is incident on the optical fiber under test (FUT), Rayleigh scattering occurs in the FUT and Fresnel reflection occurs at the optical fiber connection portion, and part of them returns to the incident end as backscattered light. Backscattered light returned to the incident end of the FUT is extracted via the circulator 1-11, converted into an electrical signal by the light detector 1-16, quantified by the A/D converter 1-17, and analyzed by the computation processor 1-18.
[0046] By repeatedly measuring and averaging the backscattered light power obtained as a function of time, i.e., a distance from the incident end of the FUT, together with a trigger signal output from the electrical pulse generation unit 1-10, an OTDR waveform by the first test optical pulse is obtained.
[0047] Subsequently, the light switching units 1-14 and 1-15 are switched and the second test optical pulse is incident on the FUT to obtain the OTDR waveform data by the second test optical pulse. The same operation is repeated for the third test optical pulse to obtain the OTDR waveform data.
[0048] In the optical fiber connection portion X of a connector connection or the like, a reflection peak by Fresnel reflection is observed in the OTDR waveform, as illustrated in
[0049] A method of determining the state of the optical fiber connection portion X from the OTDR waveform data obtained by using the optical pulse test apparatus 301 will be theoretically described.
[0050] In the optical fiber connection portion X, in a case where the end face of the optical fiber is a right angle, the Fresnel reflectance R generated at the gap sandwiched between the two optical fibers is represented as follows.
[0051] R0 is defined by Equation (2).
Here, n.sub.1 represents the refractive index of the optical fiber, n is the refractive index of the medium filled in the gap between the two optical fibers of the connection portion X, d is the interval of the gap (gap interval), and λ is the wavelength (referred to as test wavelength) of the test optical pulse of the OTDR in a vacuum.
Computation Example 1
[0052] In the present embodiment, an example is described in which the light incident unit A sequentially inputs test optical pulses having different center wavelengths on one end of the optical fiber under test FUT, and the computation unit C determines the type of medium in the connection portion X of the optical fiber under test FUT based on an average value obtained by averaging the reflection peak values determined for each of the test optical pulses having different center wavelengths.
[0053]
[0054] The wavelength characteristic of the reflection attenuation amount RL differs depending on the refractive index difference of the medium filled in the gap of the connection portion X. That is, overall, the reflection attenuation amount RL of the filled medium decreases in order of the refractive index matching agent, water, and air. However, because each wavelength characteristic appears periodically with a very large peak dependent on wavelength k, gap interval d, and refractive index n, it is not possible to identify a filled material even when comparing the values of the reflection attenuation amount RL at any wavelength.
[0055] Thus, in the optical pulse test method of the present embodiment, in order to reduce such effects of the wavelength, the gap interval, and the like (peaks appearing in wavelength characteristics of the reflection attenuation amount), the spectrum width of the test optical pulse is widened to several nm to several hundred nm to obtain a wavelength average of a reflection attenuation amount for each test optical pulse.
[0056]
[0057] Furthermore, by extracting the reflection peak values using test optical pulses with a wavelength of a wavelength interval of several ten nm to several hundred nm, for example, wavelengths of 1310 nm, 1490 nm, and 1650 nm, that is, by measuring the OTDR at the test wavelength 1310 nm, 1490 nm, and 1650 nm, and then averaging the reflection peak values, the reflection peak value can be leveled. The optical pulse test method of the present embodiment is a determination value for identifying a connected state of the optical fiber connection portion X of this average value that is leveled.
[0058] The simulation results for the determination values when the gap interval changes under the above conditions (where the test wavelength is set to 1310 nm, 1490 nm, and 1650 nm, and the spectral width of each test light is 10 nm) is illustrated in
[0059] The range of changes in the determination value of each filling medium with respect to the changes in the gap interval does not overlap, and even in a case where the gap interval changes, a material filled in the gap of the connection portion X of the optical fiber can be easily identified.
[0060] Note that the reflection peak value H observed in the OTDR waveform is a value dependent on the pulse width W [s] of the test optical pulse, and thus, it is desirable to generalize the reflection peak value H as the reflection attenuation amount RL.sup.(i) [dB], for example, by using the following equation described in NPL 2 (p. 3).
Here, H.sup.(i) [dB] is the reflection peak value calculated from the OTDR waveform measured at the i-th test wavelength and λ.sub.i, [dB] is the Rayleigh backscattering ratio of the optical fiber under test.
[0061] The average value RL.sub.ave [dB] of reflection attenuation amount RL.sup.(i) [dB] of N measured test wavelengths is as follows.
By using the RL.sub.ave as a determination value, the water immersion state of the optical fiber connection portion X can be recognized without requiring the reference information measured before water immersion of the optical fiber connection portion X, and without being affected by the change in the gap interval.
[0062] In the embodiments of
[0063] In this design, when the spectral width of the test optical pulse can be set wide (for example, 300 nm), the wavelength interval of the test optical pulse can be widened and the number of wavelengths can be reduced. Thus, when the spectral width of the test optical pulse is required to be set narrow (for example, 2 nm), it is only required that the wavelength interval of the test optical pulse is narrowed and the number of wavelengths is increased.
Computation Example 2
[0064] In the present embodiment, an example is described in which the light incident unit A sequentially inputs test optical pulses having different center wavelengths on one end of the optical fiber under test FUT, and the computation unit C obtains an effective reflection attenuation amount from the reflection peak values determined for each of the test optical pulses having different center wavelengths, and determines the type of medium in the connection portion X of the optical fiber under test FUT based on the effective reflection attenuation amount.
[0065]
[0066] These results show that the reflection attenuation amount RL depends on the test wavelength λ, the gap interval d, and the refractive index n. Parameters other than the test wavelength, that is, the refractive index and gap interval of a medium filled in the gap in the optical connector under test are generally unknown, and thus it is not possible to identify the filled material from the value of the reflection attenuation amount RL measured at a specific wavelength.
[0067] Thus, the inventors arrived at the following points. As shown in
[0068]
[0069] The optical pulse test method performs a light incident procedure, a light receiving procedure, and a computation procedure.
[0070] The light incident procedure inputs a test optical pulse having a predetermined spectral width to one end of the optical fiber under test FUT including a connection portion X at which optical fibers are connected to each other.
[0071] The light receiving procedure receives a backscattered light by the test optical pulse from one end of the optical fiber under test FUT, and obtains a light intensity distribution (OTDR waveform) of the optical fiber under test FUT in the longitudinal direction.
[0072] The computation procedure calculates a reflection peak value caused by the Fresnel reflection generated at the connection portion X of the optical fiber under test FUT from the light intensity distribution, and determines the type of medium in the connection portion X of the optical fiber under test FUT, based on the reflection peak value.
[0073] Note that in the light incident procedure, the test optical pulses having different center wavelengths are sequentially incident on one end of the optical fiber under test.
[0074] In other words, from steps S01 to S03 correspond to the light incident procedure performed by the light incident unit A and the light receiving procedure performed by the light receiving unit B, and from steps S04 to S05 correspond to a computation procedure performed by the computation unit C.
[0075] Here, two examples of effective reflection attenuation amount as defined by the computation unit C will be described.
First Definition
[0076] The first definition defines the effective reflection attenuation amount as the reflection attenuation amount corresponding to an average value of the reflectance at a plurality of wavelengths. The effective reflection attenuation amount according to the first definition is a value obtained by obtaining a reflectance from the reflection peak value determined for each of the test optical pulses having different center wavelengths, and logarithmically expressing the reciprocal of the average value obtained by averaging the reflectance data. Specifically, the value is as follows.
The average value R.sub.eff of the reflectance data obtained at a plurality of wavelengths is defined as follows.
However, N represents the number of wavelengths used for the test, and R.sub.i (λ.sub.i) represents the reflectance at the wavelength λ.sub.i.
The value of the reciprocal of Equation (3) logarithmically expressed is defined as the effective reflection attenuation amount RL.sub.eff.
[Math. 6]
RL.sub.eff=−10 log.sub.10(R.sub.eff) (6)
[0077] Note that in the present definition, an arithmetic average of the reflectance R.sub.i (λ.sub.i) needs to be performed in the linear scale. Typically, the OTDR needs to convert the value obtained in the OTDR to the reflectance in the linear scale in order to express a logarithmic reflection attenuation amount, followed by an arithmetic average of Equation (5).
[0078] The order (number of digits) of the average value of the reflectance in the linear scale is greatly dependent on the largest value in the reflectance data to be averaged, and is an equivalent number of digits to that value. However, the number of digits may be the same as the largest value, or may be lower due to taking an average. Obtaining a value of the number of digits equivalent to the largest value corresponds to obtaining the lowest reflection attenuation amount data in the measured reflection attenuation amount data when the value is logarithmically transformed and expressed as the reflection attenuation amount.
Second Definition
[0079] The second definition defines the minimum value of the reflection attenuation amount data at a plurality of wavelengths as the effective reflection attenuation amount. The effective reflection attenuation amount according to the second definition is a value obtained by obtaining the reflectance of the reflection peak value determined for each of the test optical pulses having different center wavelengths, and logarithmically expressing the minimum value of the reflectance data. Specifically, the value is as follows.
[Math. 7]
RL.sub.eff=−10 log.sub.10{min[R.sub.i(λ.sub.i)]} (7)
[0080]
[0081] It can be seen from the results of
Other Embodiments
[0082] Note that the present invention is not limited to the above-described embodiments, and can be variously modified and implemented within the scope not departing from the gist of the present invention. In short, the present invention is not limited to the above-described embodiment as it is, and can be embodied with the components modified within the scope not departing from the gist thereof when implemented. Various inventions can be formed by appropriate combinations of a plurality of components disclosed in the above-described embodiment. For example, several components may be deleted from all of the components illustrated in the embodiment. Furthermore, components of different embodiments may be appropriately combined with each other.
REFERENCE SIGNS LIST
[0083] 1-1 First light source [0084] 1-2 First optical bandpass filter [0085] 1-3 First light pulsing unit [0086] 1-4 Second light source [0087] 1-5 Second optical bandpass filter [0088] 1-6 Second light pulsing unit [0089] 1-7 Third light source [0090] 1-8 Third optical bandpass filter [0091] 1-9 Third light pulsing unit [0092] 1-10 Electrical pulse generation unit [0093] 1-11 to 1-13 Optical circulator [0094] 1-14, 1-15 Light switching unit [0095] 1-16 Light detector [0096] 1-17 A/D converter [0097] 1-18 Computation processor [0098] 301 Optical pulse test apparatus