Coil electronic component
11769624 · 2023-09-26
Assignee
Inventors
- Young Il Lee (Suwon-si, KR)
- Jeong Gu Yeo (Suwon-si, KR)
- Ji Hoon Hwang (Suwon-si, KR)
- Myoung Ki Shin (Suwon-si, KR)
- Byeong Cheol Moon (Suwon-si, KR)
Cpc classification
H01F2003/106
ELECTRICITY
H01F2017/048
ELECTRICITY
International classification
H01F27/29
ELECTRICITY
Abstract
A coil electronic component includes a body including a coil portion disposed therein, and including a plurality of magnetic particles, and external electrodes connected to the coil portion. The body includes an internal region and a protective layer disposed on a surface of the internal region. A first particle of the plurality of magnetic particles included in the protective layer includes an oxide film disposed on a surface of the first particle, and a second particle, having a size greater than a size of the first particle, of the plurality of magnetic particles includes a coating layer disposed on a surface of the second particle and having a composition different from a composition of the oxide film.
Claims
1. A coil electronic component, comprising: a body including a coil portion disposed therein, and including a plurality of magnetic particles; and external electrodes connected to the coil portion, wherein the body includes an internal region and a protective layer disposed on a surface of the internal region, and wherein a first particle of the plurality of magnetic particles included in the protective layer includes an oxide film disposed on a surface of the first particle, and a second particle, having a size greater than a size of the first particle, of the plurality of magnetic particles includes a coating layer disposed on a surface of the second particle, the coating layer having a composition different from a composition of the oxide film, the oxide film is in contact with the first particle and the coating layer is in contact with the second particle, the coating layer disposed on the surface of the second particle includes a phosphorus element, and the oxide film of the first particle does not include a phosphorus element.
2. The coil electronic component of claim 1, wherein the coating layer includes glass.
3. The coil electronic component of claim 1, wherein a thickness of the coating layer is 10 to 60 nm.
4. The coil electronic component of claim 1, wherein the first particle includes pure iron.
5. The coil electronic component of claim 1, wherein the first particle has a diameter of 5 μm or less.
6. The coil electronic component of claim 1, wherein the second particle includes an Fe-based alloy.
7. The coil electronic component of claim 1, wherein the second particle has a diameter of 10 to 25 μm.
8. The coil electronic component of claim 1, wherein a thickness of the protective layer is 4 to 40 μm.
9. The coil electronic component of claim 1, wherein the oxide film includes an oxide including a metal component included in the first particle.
10. The coil electronic component of claim 1, wherein a thickness of the oxide film is 200 nm or less.
11. The coil electronic component of claim 1, wherein a partial particle of the plurality of magnetic particles included in the internal region includes an oxide film disposed on a surface of the partial particle.
12. The coil electronic component of claim 11, wherein the oxide film in the internal region has a thickness less than a thickness of the oxide film of the protective layer.
13. The coil electronic component of claim 11, wherein an amount of oxides of the oxide film included in a unit volume of the protective layer is greater than an amount of oxides of the oxide film included in a unit volume of the internal region.
14. The coil electronic component of claim 1, wherein a thickness of the oxide film of the protective layer decreases in a direction from the protective layer to the internal region.
15. The coil electronic component of claim 1, wherein, when the protective layer includes two regions having a same thickness as each other, a thickness of the oxide film in a region adjacent to a surface of the body is greater than a thickness of the oxide film in a region adjacent to the internal region.
16. The coil electronic component of claim 1, wherein the coating layer disposed on the surface of the second particle has a multilayer structure including a P-based inorganic coating layer and an atomic layer deposition layer.
17. A coil electronic component, comprising: a body including a coil portion disposed therein, and including a plurality of magnetic particles; and external electrodes connected to the coil portion, wherein the plurality of magnetic particles comprises first partial particles disposed adjacent to a surface of the body and including oxide films directly disposed on respective surfaces of the first partial particles, and second partial particles disposed adjacent to an internal region of the body and including oxide films directly disposed on respective surfaces of the second partial particles, and an average thickness of the oxide films of the first partial particles adjacent to the surface of the body is greater than an average thickness of the oxide films of the second partial particles adjacent to the internal region of the body, wherein each of the oxide films of the first partial particles adjacent to the surface of the body and the oxide films of the second partial particles adjacent to the internal region of the body is an only oxide film disposed on a corresponding particle.
18. The coil electronic component of claim 17, wherein at least one of the first partial particles or at least one of the second partial particles has a diameter of 5 μm or less.
19. The coil electronic component of claim 17, wherein a thickness of the oxide film disposed on at least one of the first partial particles or at least one of the second partial particles is 200 nm or less.
Description
BRIEF DESCRIPTION OF DRAWINGS
(1) The above and other aspects, features, and advantages of the present disclosure will be more clearly understood from the following detailed description, taken in conjunction with the accompanying drawings, in which:
(2)
(3)
(4)
(5)
DETAILED DESCRIPTION
(6) Hereinafter, exemplary embodiments of the present disclosure will be described as follows with reference to the attached drawings.
(7) The present disclosure may, however, be exemplified in many different forms and should not be construed as being limited to the specific exemplary embodiments set forth herein. Rather, these exemplary embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. Accordingly, shapes and sizes of the elements in the drawings can be exaggerated for clear description. Also, elements having the same function within the scope of the same concept represented in the drawing of each exemplary embodiment will be described using the same reference numeral.
(8)
(9) Referring to the diagrams, a coil electronic component 100 in an exemplary embodiment of the present disclosure may include a body 101 may include a body 101, a support substrate 102, a coil portion 103, and external electrodes 105 and 106, and the body 101 may include a plurality of magnetic particles 112 and 212. The body 101 may include an internal region 120 and a protective layer 111 disposed on a surface of the internal region 120. A partial particle 112 (hereinafter, a first particle) may include an oxide film 113 disposed on a surface of the first particle. A partial particle 212 (hereinafter, a second particle) having a size greater than a size of the first particle 112 may include a coating layer 213 having a composition different from a composition of the oxide film 113 and disposed on a surface of the second particle 212. According to an exemplary embodiment of the present disclosure, the second particle 212 may be included as an essential element, but in other exemplary embodiments, the second particle 212 may not be provided.
(10) The body 101 may seal at least portions of the support substrate 102 and the coil portion 103, and may form an exterior of the coil electronic component 100. The body 101 may be configured to externally expose a partial region of a lead-out pattern L. As illustrated in
(11) According to an exemplary embodiment of the present disclosure, the body 101 may include the magnetic particles 112 and 212 having different sizes, thereby increasing the amount of the magnetic particles 112 and 212 included in the body 101. As for the first particle 112 having a relatively small size, the first particle 112 may fill a space between the second particles 212. The first particle 112 may include pure iron, and may have a form of carbonyl iron powder (CIP), for example. A diameter d1 of the first particle 112 may be 5 μm or less.
(12) The oxide film 113 may be disposed on a surface of the first particle 112. For example, as illustrated in
(13) The oxide film 113 on a surface of the first particle 112 may be an oxide of a metal component included in the first particle 112. For example, when the first particle 112 includes pure iron, the oxide film 113 may be an oxide iron (Fe.sub.2O.sub.3). Thicknesses t1 and t3 of the oxide film 113 may be 200 nm or less. According to an exemplary embodiment of the present disclosure, the oxide film 113 may be effectively disposed on the first particle 112 of a protective layer 110 forming an external layer of the body 101 by adjusting process conditions for forming the oxide film 113. Accordingly, insulating properties of the protective layer 110 may improve. When insulating properties of the protective layer 110 improve, inductance properties and breakdown voltage (BDV) properties of the coil electronic component 100 may also improve.
(14) Referring to
(15) A size of the protective layer 110 may be adjusted by changing a heat treatment temperature for forming the oxide film 113 or an ozone concentration. According to the study performed by the inventors, when a thickness T of the protective layer 110 was 4 to 40 μm, improved inductance properties and breakdown voltage properties were secured. When a heat treatment temperature was excessively increased, or a heat treatment time was excessively lengthened, a thickness of the oxide film 113 was increase. Accordingly, although insulating properties improved, inductance property degraded. In this case, as described above, the thicknesses t1 and t3 of the oxide films 113 disposed in the protective layer 110 and the internal region 120 may be 200 nm or less.
(16) As for the protective layer 110 obtained by the above-described method, a size of the oxide film 113 on a surface of the first particle 112 may be varied in different regions. For example, a thickness of the oxide film 113 may decrease from a surface of the protective layer 110 to the internal region 120. Also, when the protective layer 110 is divided into two regions having the same thickness, a thickness of the oxide film 113 in a region disposed on a surface may be greater than a thickness of the oxide film 113 in a region disposed adjacent to the internal region 120. That is because, as described above, the oxide film 113 may have a greater thickness on a surface of the body 101.
(17) The second particle 212 having a relatively great size may include an Fe-based alloy, or the like. For example, the second particle 212 may include a nanocrystalline particle boundary alloy having a composition of Fe—Si—B—Cr, an Fe—Ni based alloy, and the like. A diameter d2 of the second particle 212 may be 10 to 25 μm. When a portion of the magnetic particle includes an Fe-based alloy as described above, magnetic properties such as permeability may improve, but the magnetic particle may be vulnerable to electrostatic discharge (ESD). Accordingly, a coating layer 213 may be disposed on a surface of the second particle 212. The coating layer 213 may have a composition different from a composition of the oxide film 113 of the first particle 112.
(18) According to the study conducted by the inventors, the oxide film 113 was selectively formed only on a surface of the first particle 112 during a process of oxidizing the body 101, and the oxide film was not disposed on the second particle 212, or a small amount of oxide film was formed. When a small amount of oxide film is disposed on the second particle 212, a thickness of the second particle 212 may be less than a thickness of the oxide film 113 of the first particle 112. The oxide film of the second particle 212 may refer to an oxide film disposed on a surface of the second particle 212 or a surface of the coating layer 213. When the body 101 is oxidized by a heat treatment process, the oxide film 113 started being disposed on the first particle 112 having a relatively small size within a temperature range of 100 to 200° C., a relatively low temperature, whereas the second particle 212 started being oxidized at 500° C. or higher, a temperature significantly higher than the above-mentioned temperature. In the temperature in which the second particle 212 is oxidized, damage may be applied to the insulating material 110, and others. Accordingly, the body 101 may be oxidized in a temperature lower than the above-mentioned temperature, thereby selectively oxidizing the first particle 112.
(19) The coating layer 213 on a surface of the second particle 212 may be configured as an inorganic coating layer including a P component. For example, the coating layer 213 may include P-based glass. The P-based inorganic coating layer may include elements such as P, Zn, Si, and the like, and may include oxides of the elements. When the coating layer 213 is configured as a P-based inorganic coating layer, a thickness t2 of the coating layer 213 may be 10 to 60 nm.
(20) The coating layer 213 on a surface of the second particle 212 may also be configured as an atomic layer deposition (ALD) layer. The atomic layer deposition may be a process of uniformly coating a surface of an object in atomic layer level by surficial chemical reaction during a process of periodically supplying and discharging a reacting material. The coating layer 213 obtained by the above-described process may have a reduced and uniform thickness and improved insulating properties. Accordingly, even when the body 101 is filled with a large amount of the second particle 212, insulating properties of the body 101 may be effectively secured. When the coating layer 213 is configured as an atomic layer deposition layer, a thickness of the coating layer 213 may be reduced such that a size of the body 101 may be reduced, and a thickness of the coating layer 213 may be 10 to 15 nm. Also, when the coating layer 213 is configured as an atomic layer deposition layer, the coating layer 213 may include alumina (Al.sub.2O.sub.3), silica (SiO.sub.2), and the like. The coating layer 213 may also include various materials formed by an atomic layer deposition other than the above-mentioned materials. For example, the coating layer 213 may include materials such as TiO.sub.2, ZnO.sub.2, HfO.sub.2, Ta.sub.2O.sub.5, Nb.sub.2O.sub.5, Sc.sub.2O.sub.3, Y.sub.2O.sub.3, MgO, B.sub.2O.sub.3, GeO.sub.2, and the like. According to exemplary embodiments of the present disclosure, as illustrated in
(21) As an example of a method of manufacturing the body 101, the body 101 may be formed by a layering process. For example, the coil portion 103 may be disposed on the support substrate 102 using a plating process, and the like, a plurality of unit laminates for manufacturing the body 101 may be prepared, and the unit laminates may be stacked. The unit laminates may be manufactured by making a slurry using a mixture of the magnetic particles 112 and 212 including a metal and organic materials such as a thermosetting resin, a binder, a solvent, and the like, coating a carrier film with the slurry in thickness of several tens of μm using a doctor blade method, drying the slurry, and manufacturing the unit laminates in sheet form. Accordingly, the manufactured unit laminate may include magnetic particles distributed in a thermosetting resin such as an epoxy resin, a polyimide, or the like. A plurality of the unit laminates may be formed, and the unit laminates may be stacked in an upper portion and a lower portion of the coil portion 103 and may be pressured, thereby implementing the body 101. The oxide film 113 may be disposed on the magnetic particle 112 present in the body 101 through an oxidization process as described above, and in this case, a relatively thinner oxide film 113 may be disposed on the magnetic particle 112 of the internal region 120, or the oxide film 113 may not be disposed on the magnetic particle 112 of the internal region 120.
(22) The other elements will be described with reference to
(23) The coil portion 103 may be disposed in the body 101, and may perform various functions in an electronic device through properties implemented by coils of the coil electronic component 100. For example, the coil electronic component 100 may be implemented as a power inductor, and in this case, the coil portion 103 may stabilize power by storing electricity in a form of a magnetic field and maintaining an output voltage. Coil patterns included in the coil portion 103 may be layered on both surfaces of the support substrate 102, and may be electrically connected through a conductive via V penetrating the support substrate 102. The coil portion 103 may be formed in spiral form, and a lead-out portion T may be included in an outermost region of the spiral form for electrical connection with the external electrodes 105 and 106.
(24) The coil portion 103 may be disposed on at least one of a first surface (an upper surface in
(25) The external electrodes 105 and 106 may be disposed externally on the body 101 and may be connected to the lead-out pattern L. The external electrodes 105 and 106 may be formed using a paste including a metal having high electrical conductivity, and the paste may be a conductive paste including one of nickel (Ni), copper (Cu), tin (Sn) or silver (Ag), or alloys thereof, for example. Each of the external electrodes 105 and 106 may further include a plating layer (not illustrated) disposed thereon. In this case, the plating layer may include one or more elements selected from a group consisting of nickel (Ni), copper (Cu), and tin (Sn). For example, a nickel (Ni) plating layer and a tin (Sn) plating layer may be formed in order.
(26) According to the aforementioned exemplary embodiments, in the coil electronic component, breakdown voltage properties may improve as insulating properties of the body improves.
(27) While the exemplary embodiments have been shown and described above, it will be apparent to those skilled in the art that modifications and variations could be made without departing from the scope of the present disclosure as defined by the appended claims.