SYSTEM AND A METHOD FOR EXTRACTING LOW-LEVEL SIGNALS FROM HI-LEVEL NOISY SIGNALS
20220029716 · 2022-01-27
Inventors
Cpc classification
H04B1/10
ELECTRICITY
H04B17/336
ELECTRICITY
International classification
Abstract
A method for extracting a sought signal from a noisy signal. The method includes sampling a plurality of samples in a series of cycles of the noisy signal wherein each sample having an n-bit sampled value (n≥1), giving rise to a plurality of samples each associated with a respective cycle of the series, wherein each sample is sampled at time T relative to the origin of the respective cycle. The method further includes associating data indicative of the plurality of n-bit samples to N bins according to the corresponding sampled values, wherein N is a function of n, and calculating data indicative of a number of samples for each bin, giving rise to data indicative N-bins histogram or normalized N-bins histogram. The method further includes determining the signal value based on the data indicative of the N-bins histogram or normalized N-bins histogram.
Claims
1) A method for extracting a sought signal from a noisy signal, the method comprising, by a circuitry: a) sampling a plurality of samples in a series of cycles of the noisy signal wherein each sample having an n-bit sampled value (n≥1), giving rise to a plurality of samples each associated with a respective cycle of said series: and wherein each sample is sampled at time T relative to the origin of the respective cycle; b) associating data indicative of the plurality of n-bit samples to N bins according to the corresponding sampled values, wherein N is a function of n, and c) calculating data indicative of a number of samples for each bin, giving rise to data indicative N-bins histogram or normalized N-bins histogram; d) determining the signal value based on the data indicative of the N-bins histogram or normalized N-bins histogram.
2) The method according to claim 1 wherein said step (a) further includes: i) sampling in each cycle a batch of samples that includes a succession of at least two samples and performing said steps a-c with respect to each sample in the batch, giving rise to a determined series of signal values, constituting said sought signal.
3) The method according to claim 1, wherein the SNR of said noisy signal is low.
4) The method according to claim 3, wherein said low SNR complies with the following equation:
Min{P.sub.1,P.sub.2, . . . P.sub.N}.Math.Num>1, wherein P.sub.1, P.sub.2, . . . P.sub.N are the normalized N-bins Histogram probabilities, and Num stands for the number of said plurality of samples, and N stands for the N.sup.th bin of N number of bins.
5) The method according to claim 1, wherein said N being a function of n equals to 2.sup.n.
6) The method according to claim 1, wherein said steps a-c are performed while said sought signal is retained substantially invariable.
7) The method according to claim 1, wherein said cycle time duration depends on a signal repletion frequency.
8) The method according to claim 1, wherein said plurality of samples are sampled at a frequency that complies with the Nyquist sampling theorem.
9) The method according to claim 1, wherein the noisy signal is a Gaussian characterized by distribution.
10) The method according to claim 1, wherein said n=1.
11) The method according to claim 10, wherein the data indicative of the samples being “1” or “0” according to the sign of the sample and wherein number of bins N=2.
12) The method according to claim 11, wherein the data indicative of normalized N bins histogram complies with the equation:
Num.sup.(+)/(Num.sup.(+)+Num.sup.(−)), or Num.sup.(−)/(Num.sup.(+)+Num.sup.(−)), where Num.sup.(+) equals the number of positive signs and Num.sup.(−) equals the number of negative signs and Num.sup.(+)+Num.sup.(−) equals the number of said plurality of samples.
13) The method according to claim 12, wherein said determined signal value complies with the equation:
v.sub.0=−√{square root over (2)}σ.Math.erfc.sup.−1(2.Math.Num.sup.(+)/Num))
14) The method according to claim 1, for use in a through-wall image acquisition device having antenna elements for transmitting and receiving signals adapted to pass through at least one obstacle for imaging objects.
15) A system for extracting a sought signal from a noisy signal, the system comprising a circuitry that includes: a sampler for sampling a plurality of samples in a series of cycles of the noisy signal wherein each sample has an n-bit sampled value (n≥1), giving rise to a plurality of samples each associated with a respective cycle of said series: and wherein each sample is sampled at time T relative to the origin of the respective cycle; a processing circuitry operatively coupled to said sampler, for associating data indicative of the plurality of n-bit samples to N bins according to the corresponding sampled values, wherein N is a function of n, and the processing circuitry is further adapted to calculate data indicative of a number of samples for each bin, giving rise to a data indicative N-bins histogram or a normalized N-bins histogram; the processing circuitry is further adapted to determine the signal value based on the data indicative of the N-bins histogram or normalized N-bins histogram.
16) The system according to claim 15, further comprising a Deserializer module operatively coupled to said sampler for reducing the bit-rate of the sampler to correspond to an operable processing rate of the processing circuitry.
17) The system according to claim 15, wherein said sampler is adapted to sample, in each cycle, a batch of samples that includes a succession of at least two samples, and wherein said processing circuitry is adapted to performing said associating, calculating and determining with respect to each sample in the batch, giving rise to a determined series of signal values, constituting said sought signal.
18) The system according to claim 15, wherein the SNR of said noisy signal is low.
19) The system according to claim 18, wherein said low SNR complies with the following equation:
Min{P.sub.1,P.sub.2, . . . P.sub.N}.Math.Num>1, wherein P.sub.1, P.sub.2, . . . P.sub.N are the normalized N-bins Histogram probabilities, and Num stands for the number of said plurality of samples, and N stands for the N.sup.th bin of N number of bins.
20) The system according to claim 15, wherein said N being a function of n equals to 2.sup.n.
21) The system according to claim 15, wherein said steps a-c are performed while said sought signal is retained substantially invariable.
22) The system according to claim 15, wherein said cycle time duration depends on a signal repletion frequency.
23) The system according to claim 15, wherein said plurality of samples are sampled at a frequency that complies with the Nyquist sampling theorem.
24) The system according to claim 15, wherein the noisy signal is characterized by a Gaussian distribution.
25) The system according to claim 15, wherein said n=1 and said sampler being a comparator.
26) The system according to claim 25, wherein the data indicative of the samples being “1” or “0” according to the sign of the sample and wherein number of bins N=2.
27) The system according to claim 26, wherein the data indicative of normalized N bins histogram complies with the equation:
Num.sup.(+)/(Num.sup.(+)+Num.sup.(−)), or Num.sup.(−)/(Num.sup.(+)+Num.sup.(−)), where Num.sup.(+) equals the number of positive signs and Num.sup.(−) equals the number of negative signs and Num.sup.(+)+Num.sup.(−) equals the number of said plurality of samples.
28) The system according to claim 27, wherein said determined signal value complies with the equation:
v.sub.0=−√{square root over (2)}σ.Math.erfc.sup.−1(2.Math.Num.sup.(+)/Num))
29) The system according claim 15, for use in a through-wall image acquisition device having antenna elements for transmitting and receiving signals adapted to pass through at least one obstacle for imaging objects.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0065] In order to better understand the subject matter that is disclosed herein and to exemplify how it may be carried out in practice, embodiments will now be described, by way of non-limiting example only, with reference to the accompanying drawings, in which:
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DETAILED DESCRIPTION OF EMBODIMENTS
[0076] In the detailed description, numerous specific details are set forth in order to provide a thorough understanding of the invention. However, it will be understood by those skilled in the art that the presently disclosed subject matter may be practiced without these specific details. In other instances, well-known methods, procedures, components and circuits have not been described in detail so as not to obscure the presently disclosed subject matter.
[0077] As used herein, the phrase “for example”, “such as”, “for instance”, “e.g.”, and variants thereof describe non-limiting embodiments of the presently disclosed subject matter. Reference in the specification to “(a) certain embodiment(s)”, “one embodiment” or variants thereof means that a particular feature, structure or characteristic described in connection with the embodiment(s) is included in at least one embodiment of the presently disclosed subject matter.
[0078] Bearing this in mind, attention is drawn to
[0079] Note that for convenience of explanation only, the description below focuses on radar as an example of a signal acquisition device. The invention is not bound by any specific radar, for instance radar with an antenna array configured to transmit and receive signals. Note also that the system for extracting signals in accordance with certain embodiments of the invention is exemplified with reference to objects that are located behind a non-transparent obstacle (say an opaque wall, such as of a wall of a building), normally when the operator cannot view the object (say people) therebehind. Thus, by way of non-limiting example, the system and method in accordance with various embodiments of the inventions may be used for various other applications that do not necessarily involve through the wall imaging, such as perimeter radar, ground penetrating radar, medical imaging and/or others, where the sought signal has a very low SNR
[0080] Reverting to
[0081] Note that the through-the-wall image acquisition device shown in
[0082] Attention is now drawn to
where c is the speed of light at vacuum and PRF is the transmitted signal repetition rate. Due to the (lossy) obstacle (a wall being an example), and the sensing range, the received signal's intensity drastically attenuates and its intensity becomes much smaller than the noise intensity, giving rise to a noisy signal that is received by the antenna, where, put intuitively, the sought signal component (i.e. the signal that originates from the object of interest) is “buried” in the noise component of the noisy signal. The invention is of course not bound by the specified PRF of 1 MHz. Specifically, under certain operational conditions, such as for the example of PRF equals 1 MHz, the EndRange is limited to about 150 meters. This is of course only an example. Thus, for example, for short range radars (say, of the order of tens of meters), the PRF is of the order of MHz(s), whereas for long range radars (say, of the order of hundreds of KMs), the PRF is of the order of KHz(s) or less. The latter are of course only non-limiting examples.
[0083] Reverting now to the circuitry 200 in
[0084] The so amplified noisy signal 203 is fed to a sampler 204, e.g. a 1-bit comparator 204 (or in case of n>1 bits, these are sampled using a different known per se sampler, such as ADC). The sampler 204 is triggered by a clock 205 at a frequency (herein the sampling rate) that is typically considerably higher than that of the PRF of the radar, say 12.8 GHz, complying with the Nyquist sampling criterion, which requires that the sampling rate must be at least twice the highest frequency component of the sampled signal. In a typical, yet not exclusive, ultra-wide-band radar used for through wall sensing, the highest frequency component is about 5 GHz, thus the sampling rate should be greater than 10 GHz. Note that, as clearly shown in
[0085] Before moving on, attention is drawn to
[0086] Reverting to
[0087] In accordance with certain embodiments, the samples of interest are sampled periodically, namely sampled at the elapse of time T 303 (relative to the origin of the cycle 304 see
[0088] Reverting to the 1 bit sample example, the sampler yields “1” or “0” depending on the sign of the signal (buried in noise) at the sampling instant. Assuming that the sought signal is positive—as depicted by way of example in
[0089] Reverting now to the time duration T (see e.g.
[0090] Note that in accordance with certain embodiments, the noisy signals that are received during the time duration 7 although not reflected from an object and therefore apparently may be composed of noise only, may nevertheless be sampled and processed, all depending upon the particular application.
[0091] In accordance with other embodiments, the signals that are received during the specified time duration T are discarded (and other sections of the received signal are sampled. This may be implemented, for instance, by sampling the signals, but not processing them (as will be discussed in greater detail with reference to
[0092] Note also that in accordance with certain embodiments, the StartRange may indicate a distance that extends from the transmitting antenna elements to the nearest face of the obstacle. This is however not limiting. Thus, for example, in accordance with various other embodiments, the StartRange is a user selectable parameter, for example the user can decide to “look” 10 meters behind the wall. By another non-limiting example, the StartRange may be selected such that it includes one or more obstacles (e.g. a few walls, one behind the other), all depending upon the particular application.
[0093] Note also that in accordance with certain embodiments, instead of one sample per cycle, a batch of x samples (x>1) per cycle may be sampled and processed e.g. starting from T and extending for additional Δt (or its equivalent in number of samples). For example, in
[0094] The additional Δt duration is needed in order to cover the ΔL distance behind the obstacle. In accordance to previous definitions,
A more detailed discussion that pertains to a batch of x samples per cycle (where x>1) is given below.
[0095] Attention is now reverted to the simplified example of Num cycles, and only one sample per cycle (i.e. a batch of size x=1) each sampled at duration T relative to the origin of its corresponding cycle (e.g. with reference to
[0096] Reverting now to
[0097] Moving now to the FPGA module 208, attention is also drawn to
[0098] Note that the invention is not bound by the specified FPGA component (being an example of processing circuitry), nor by the specific block diagram depicted in
[0099] Note also the invention is not bound by the specified circuitry of
[0100] Thus, in accordance with certain embodiments, the processing circuitry 400 is configured to store data indicative of the plurality of n-bit samples to N bins according to the corresponding sampled values, wherein N is a function of n (number of bits in each sample). In accordance with the certain embodiment of 1-bit sampling, the specified function is 2.sup.n. Thus, in the specific case of 1-bit long sample, the number of bins N is 2. Then, the specified circuitry is configured to calculate data indicative of the number of samples per each bin (for example, by counting the number of samples per bin e.g. summing the sampled values for each bin), giving rise to N-bins histogram data). Note that for the case of 1-bit long samples, while 2 bins are used, calculating the number of the samples by summing the samples may apply to only one bin (say Num.sup.(+) obtained by summing the samples in the “1”-s bin). The other's bin count of number of the samples (by this example Num.sup.(−) of the “0”-s bin) may be calculated by deducing from the total number of samples (Num) the sum of the other bin, or in other words, by this example Num.sup.(−)=Num−Num.sup.(+).
[0101] Based on the so determined data indicative of N bins histogram, the sought signal value may be calculated.
[0102] For a better understanding of the foregoing, consider a non-limiting implementation of circuitry 400. It includes input 401 for receiving serially the bulk of sampled values (by this example a series of “1” and “0” outputted from comparator 204). It further includes an adder 402 coupled to input 401 and operatively coupled to memory read unit 403 and memory write unit 404. By way of non-limiting example, the write unit and the read unit may be implemented with a dedicated logic adapted to access the memory, including reading the sum value of the current sample, adding this sum to the current sample, and then completing the cycle by writing the new sum to the same memory address.
[0103] Also shown in
[0104] In operation, and at the onset, sample 408 sum content is reset (sum=0). Thus, data indicative each sampled value is fed through input 401 to adder 402. The adder is also fed (through the reader 403) with the sample (single bin) sum (initially sum=0) which is added to the input value fed through input 401. The summed value is then written back (through write element 404) to the (single) bin accumulator 408. For example, in case the fed data is “1” (e.g., being indicative of the Siu sampled value of C.sub.1), the sum total 1=1+0 is written back to bin 408. Next, data indicative of the next sampled value input (e.g. S.sub.2,1 of C.sub.2), say “0” is then summed to the so read previous sum (1), giving rise to sum total 1 which is written back to the bin 408. Next, the input data (say 1) indicative of the next sampled value (e.g. S.sub.3,1 of C.sub.3) is summed to the previous read sum (1), giving rise to a sum value 2 (namely 1+1=2) that is written back to bin 408. This procedure is repeated until all the plurality of sampled values are processed in the manner specified.
[0105] By this example, the data indicative of the N bin histogram represents the total number of samples associated with each one of the N bins. Thus, for a 2 bins example, the first bin holds the number of samples having the “1” value (say Num.sup.(+)). As described above, the other “bin” sum may be easily derived, i.e. Num.sup.−)=Num−Num.sup.(+). Note that the pertinent additional logic is not shown in
[0106] By another non-limiting example, if the corresponding summed values are divided by the total number of samples Num (see e.g. 440 in
[0107] Note that calculating data indicative of the number of samples may be implemented by counting the number of samples per bin, or in accordance with other embodiments summing the number of samples or e.g. sample values, or, by another example, deducting the number of samples from a given initial value, and so forth.
[0108] Having obtained the data indicative of the N bins histogram or normalized N bins histogram, there follows the computation stage of calculating sought signal value 450 based on the so determined N bins histogram. Thus, by one specific example, by assuming Gaussian distributed additive noise of standard deviation σ, the sought signal v.sub.0 may be calculated in accordance with the following equation.
v.sub.0=−√{square root over (2)}σ.Math.erfc.sup.−1(2.Math.Num.sup.(+)/Num))
where erfc.sup.−1(⋅) is the inverse error function.
[0109] As may be recalled, the signals that are processed by the FPGA 400, are typically those that are of interest, namely those that are sampled after the elapse of time duration T. In cases where the signals that fall in the time duration T are also sampled and fed to the FPGA 400, an appropriate logic (not shown) may be embedded in the FPGA 400 for discarding them. Note that in certain other embodiments, the signals that fall in the specified time duration Tare also of interest (although, apparently, they may represent noise only), and therefore are sampled and processed in the manner specified. In accordance with certain other embodiments, any subset of samples (from the set of 12800 samples—spanning the entire cycle) may be selected, all depending upon the particular application.
[0110] Attention is now reverted to
[0111] Note that in accordance with certain embodiments, it would be advantageous to commence and complete the whole processing described above while the sought signal is retained invariable. It is, thus, appreciated that the proposed solution exemplified above, with reference to
[0112] The specified advantages apply also to the various other embodiments discussed below, including batch of x samples (x>1) and multi-bit (n-bit where n>1) sampling.
[0113] The specified description with reference to
[0114] Similarly, the same procedure applies to the second sample in each batch (e.g. S.sub.1,2, S.sub.2,2 . . . S.sub.NUM,2 in respective cycles C.sub.1, C.sub.2, . . . C.sub.NUM) that are fed through, say input 401.sub.(2) in
[0115] Turning now to
[0116] Attention is now drawn to
[0117] The better granularity of the sampled values will facilitate extraction of a more accurate sought signal (as described in the context of
[0118] The FPGA of
[0119] Having obtained the N-bins histogram (per sample) or normalized N-bins histogram, the sought sample value may be extracted, using known-in-the art-techniques, in estimation theory, to estimate the signal value given its estimated probability distribution (the normalized N-bins histogram) and the prior knowledge about the additive noise distribution (e.g. Gaussian distribution with zero mean and known standard deviation).
[0120] Note that the more accurate result may involve a more complex circuitry, e.g. an ADC instead of a comparator, and more demanding circuitry and bit-rates, e.g. in terms of power consumption, thus reducing battery life span, for implementing the FPGA that “supports” a larger numbers of bits.
[0121] Note that in accordance with certain other embodiments, n bit samples (n>2) may be used, mutatis mutandis.
[0122] Note that n-bit sampling (n>1) may apply to a single sample per cycle, or a batch of samples per cycle, all as described in detail above, mutatis mutandis.
[0123] As explained with reference to various embodiments of the invention, the noisy signal may have a low SNR, or may be referred to intuitively also as the signal buried in the noise. In accordance with various embodiments, this may require that the noisy signal may not saturate the sampler (comparator or ADC). Thus, with reference to
[0124] By another embodiment where n bit (n>1) samples are utilized, this intuitive requirement of sufficient samples in each bin may be required, for instance in accordance with the following equation.
[0125] In accordance with certain embodiments, where N bins are utilized, the requirement for sufficient samples complies with and said low SNR complies with the following equation:
Min{P.sub.1,P.sub.2, . . . P.sub.N}.Math.Num>1, [0126] wherein P.sub.1, P.sub.2, . . . P.sub.N are the normalized N-bins Histogram probabilities, and Num stands for the number of said plurality of samples, and N stands for the N.sup.th bin of N number of bins.
[0127] Note that whereas the explanation above referred to Gaussian distribution, the invention is by no means bound by the specified Gaussian distribution, and other statistical distributions of noise are applicable mutatis mutandis.
[0128] It is appreciated that, unless specifically stated otherwise, certain features of the presently disclosed subject matter which are described in the context of separate embodiments, can also be provided in combination in a single embodiment. Conversely, various features of the presently disclosed subject matter, which are described in the context of a single embodiment, can also be provided separately or in any suitable sub-combination. Those versed in the art will readily appreciate that the teachings of the presently disclosed subject matter are not bound by the systems illustrated in
[0129] It should be noted that whenever a term is used in the description (such as N-bins histogram, Normalized N-bins histogram, number of samples per bin, etc.) it also encompasses data indicative of the respective term.
[0130] It is to be understood that the invention is not limited in its application to the details set forth in the description contained herein or illustrated in the drawings. The invention is capable of other embodiments and of being practiced and carried out in various ways. Hence, it is to be understood that the phraseology and terminology employed herein are for the purpose of description and should not be regarded as limiting. As such, those skilled in the art will appreciate that the conception upon which this disclosure is based may readily be utilized as a basis for designing other structures, methods, and systems for carrying out the several purposes of the presently disclosed subject matter.
[0131] Those skilled in the art will readily appreciate that various modifications and changes can be applied to the embodiments of the invention as hereinbefore described without departing from its scope, defined in and by the appended claims.