Patterning of Organic Light Emitting Diode Device and the OLED Displays Manufactured Therefrom
20220020830 · 2022-01-20
Inventors
Cpc classification
H10K71/00
ELECTRICITY
H10K59/38
ELECTRICITY
H10K59/00
ELECTRICITY
G03F7/0007
PHYSICS
Y02E10/549
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
International classification
Abstract
A method for producing ultrahigh resolution (for example, 800˜4000 Pixel Per Inch, PPI) Organic Light Emitting Diode (OLED) displays, with the following characteristics: S1, on top of the driving backplane, deposit the first electrode with designed spacing between one another. After that the Pixel Defining Layer (PDL) is deposited and patterned based on the designs of subpixels of the display; S2, on top of the defined subpixel regions from S1, deposit OLED devices, then fabricate the second electrode with the protection layer; S3, on top of the described second electrode with protection layer, deposit the third electrode. The present invention discloses the patterning method to produce OLED devices without using the conventional Metal Masks. Instead, an ultra-thin organic mask is fabricated using the special photolithographic process, and the OLED device structure that include the protection layer to prevent damages to the OLED device from the chemicals used during the processes.
Claims
1. A production method for Organic Light Emitting Diode (OLED) display, with the following characteristics: S1, on top of the driving backplane, deposit the first electrode with designed spacing between one another, based on the requirement of the display. After that the Pixel Defining Layer (PDL) is deposited and patterned according to the spacing between different subpixels; S2, on top of the defined subpixel regions from S1, deposit OLED devices, then fabricate the protective second electrode; and S3, on top of the described protective second electrode, deposit the third electrode.
2-3. (canceled)
4. The OLED device and display produced with claim 1, wherein the process of S2 includes the following steps: S201, Apply the first photoresist and the second photoresist layers to form a bi-layer structure on the described first electrode and the Pixel Define layer (PDL) on the driving backplane; S202, Expose the top photoresist on all of the subpixel regions for the OLED devices with a photolithography system; S204, Develop the exposed top photoresist to remove the photoresist at the exposed regions, followed by dissolving the underneath photoresist polymer layer with the selected solvent; S205, Deposit the layers of the whole White OLED device at all of the subpixel areas that photoresists are removed to form the complete White OLED device at those subpixel regions. The described White OLED device may possess a Tandem structure, consisting of Red, Green and Blue subunits staking vertically, or other subunit combinations such as Yellow and Blue subunits stacking vertically. Afterwards, the second electrode with protection layer is deposited on the white OLED device; and S206, Strip off the first and the second photoresist layers and the undesired layers of the White OLED device on top of them, at the non-subpixel regions.
5. The OLED device and display produced with claim 1, wherein after the process of S3 of preparation of the third electrode includes the following steps: S4, Fabricate the first barrier layer on the third electrode; S5, On the first barrier layer, fabricate the Color Filter (CF) layers corresponding to the selected subpixel regions for the desired color based on the requirement of the OLED display; and S6, Fabricate the second barrier layer on the Color Filter (CF) layers.
6. The OLED device and display produced with claim 4, wherein the described Color Filter (CF) layer includes Red CF, Green CF, Blue CF and Transparent CF layer.
7. The OLED device and display produced with claim 5, wherein the white OLED device contain at least one organic light emitting subunit stacking vertically to form a tandem structure; each light emitting subunit contains at least one organic semiconductor layer, such as the Hole Injection Layer (HIL), Hole Transport Layer (HTL), Emitting Layer (EML), Electron Transport Layer (ETL), or Electron Injection Layer (EIL), wherein the protective second electrode is deposited on the Electron Injection layer (EIL) of the uppermost subunit.
8. The OLED device and display produced with claim 5, wherein the white OLED device contains the Hole Injection Layer (HIL), Hole Transport Layer (HTL), the first Emitting Layer (EML1), Electron Transport Layer (ETL), Carrier Generating Layer (CGL), Hole Transport Layer (HTL), the second Emitting Layer (EML2), Electron transport layer (ETL), Electron Injection Layer (EIL) and the protective second electrode.
9. (canceled)
10. A method for making subpixel device for an Organic Light Emitting Diode (OLED) display on a driving backplane comprising the steps of: depositing a plurality of first electrodes on top of the driving plane, the plurality of first electrodes being spaced apart; depositing a pixel defining layer on top of the driving backplane with the plurality of first electrodes, the pixel defining layer defining a plurality of subpixel regions; depositing a photo resist layer on the driving backplane; exposing the photoresist layers with a photo mask to transfer pattern from photomask to the photo resist layer covering the driving backplane;; developing the exposed photo resist layer with selected chemical to form bilayer organic mask structures; depositing thin layers for the selected color of light emitting device on top of the subpixel regions forming the subpixel device and on top of photo resist layer previously not removed; depositing a plurality of second electrodes on top of the light emitting layer, the plurality of second electrodes being covered by a protection layer; and removing the light emitting layers and the second electrodes deposited on top of the photo resist layer previously not removed by dissolving the photo resist layer previously not removed.
11. The method of claim 10 further comprising the step of depositing a common layer on top of the pixel defining layer.
12. The method of claim 11, wherein the step of depositing a photo resist layer on the driving backplane further comprise depositing the photo resist layer on top of the common layer.
13. The method of claim 11, wherein the step of depositing the common layer further comprises depositing a hole injection layer and a hole transport layer.
14. The method of claim 10, wherein the step of depositing the photo resist layer further comprises depositing a first photo resist layer and depositing a second photo resist layer.
15. The method of claim 10 further comprising the step of forming the driving backplane on a flexible substrate.
16. The method of claim 10, wherein dissolving the photo resist layer not previously removed further comprises a solvent entering contact with the photo resist layer through a through gap formed on the light emitting layer and the protective second electrodes.
17. The method of claim 10 further comprising the step of depositing a plurality of third electrodes on top of the second electrodes with the protective layer.
18. An Organic Light Emitting Diode (OLED) display with a plurality of pixels, each pixel comprising: a driving backplane; a first electrode deposited on top of the driving backplane; a plurality of pixel defining layer deposited on top of the driving backplane and adjacent to the first electrode to define subpixel regions; a common layer deposited on top of the plurality of pixel defining layer and on top of the first electrode; an OLED device deposited on top of the common layer and above the electrode; and a second electrode deposited on top of the OLED device, the second electrode having a protective layer.
19. The OLED display of claim 18, wherein the common layer further comprises a Hole Injection Layer (HIL).
20. The OLED display of claim 18, wherein the common layer further comprises a Hole Transport Layer (HTL).
21. A method for making a subpixel display for an Organic Light Emitting Diode (OLED) display on a driving backplane comprising the steps of: depositing a plurality of first electrodes on top of the driving plane, the plurality of first electrodes being spaced apart; depositing a light emitting layer of selected colors on top of the plurality of first electrodes and over an entire area of the driving backplane; depositing a plurality of second electrodes on top of the light emitting layer, the plurality of second electrodes being covered by a protection layer; and removing the light emitting layer and the second electrodes not deposited on top of the plurality of first electrodes, at the non-subpixel regions.
22. The method of claim 21, wherein the step of depositing the plurality of second electrodes forms a plurality of gaps exposing photo resist layers .
23. The method of claim 22, wherein the step of removing the light emitting layer and the second electrodes not deposited on top of the plurality of first electrodes at non-subpixel regions further comprises dissolving exposed materials of the photo resist layer with the selected chemicals.
Description
DESCRIPTION OF THE DRAWINGS
[0045] The advantages of this invention are become obvious from the description below, or can be understood through the practices of this invention with the following illustrative examples.
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DESCRIPTION OF SYMBOLS
[0079] 100, driving backplane; [0080] 110, the first electrode; [0081] 120, Pixel Defining Layer (PDL); [0082] 130, Hole Injection Layer (HIL) and Hole Transport Layer (HTL); [0083] 140, the first photoresist; [0084] 150, the second photoresist; [0085] 160b, the protective second electrode; [0086] 160R, the Red subpixel OLED device described in Example 1; [0087] 160G the Green subpixel OLED device described in Example 1; [0088] 160B, the Blue subpixel OLED device described in Example 1; [0089] 170, the third electrode; [0090] 190R, the Red subpixel OLED device described in Example 2; [0091] 190G, the Green subpixel OLED device described in Example 2; [0092] 190B, the Blue subpixel OLED device described in Example 2; [0093] 160W, the White OLED device described in Example 3; [0094] 180, the first barrier layer; [0095] 210R, the red Color Filter described in Example 3; [0096] 210G, the green Color Filter described in Example 3; [0097] 210B, the blue Color Filter described in Example 3; [0098] 210W, the transparent Color Filter described in Example 3; [0099] 200, the second barrier layer; [0100] a indicates the process step to coat the first photoresist and the second photoresist; [0101] b indicates the exposure step by using a photolithography tool; [0102] c indicates the development and the dissolution steps of the exposed photoresists; [0103] d indicates the processes of depositing the OLED device layers and the second electrode with protection layer; [0104] e indicates the processes to strip off the first and the second photoresists; [0105] f indicates the process to deposit the third electrode; [0106] g indicates the deposition of the first barrier layer; [0107] h represents the fabrication process of the color filters; [0108] i represents the deposition process of the second barrier layer.
BEST MODE
[0109] Hereinafter embodiments of the present invention are described with detailed examples. These embodiments are exemplary; the present invention in not limited thereto, and the present invention is defined by the scope of claims.
[0110] Hereinafter the embodiments of the present invention are described with illustrative figures to describe in details the fabrication method of Organic Light Emitting Diode (OLED) devices and the OLED display produced thereof.
[0111] The present invention discloses the production method of Organic Light Emitting Diode (OLED) devices, including:
[0112] S1, Deposit the first electrode with designed spacing between one another, based on the requirement of the display. After that the Pixel Defining Layer (PDL) is deposited and patterned according to the spacing between different subpixels. The active matrix driving backplane may be produced on glass, flexible substrates or silicon wafer, with Low Temperature Poly-silicon Thin Film Transistors (LTPS TFT), or Oxide Semiconductor Thin Film Transistors (Oxide TFT), or Complimentary Metal-Oxide-Semiconductor (Si-based CMOS) field-effect transistors fabricated directly on silicon wafer. The first electrode may be transparent conductor layer, such as conductive transparent metal oxides, for example, Indium-Tin-Oxide (InSn.sub.xO.sub.y), Indium-Zinc Oxide (InZn.sub.xO.sub.y), Aluminum-Tin-Oxide (AlSn.sub.xO.sub.y), Indium-Germanium Oxide (IGO) etc.;
[0113] S2, on top of the subpixel regions deposit OLED devices, then fabricate the second electrode with the protection layer; The second electrode with protection layer maybe formed by the stacking structure of thin transparent organic, inorganic conductive or dielectric layers; For example,
PEDOT:PSS (Poly3,4-ethylenedioxythiophene-poly(styrene-sulfonate), PETE (polyethyleneimine-ethoxylated), BCP(bathocuproine), graphene, Carbon nanotube(CNTs), Silver (Ag) nanowires, Magnesium (Mg), gold (Au), Silver(Ag), Barium(Ba), Calcium(Ca), Erbium(Er), Ytterbium (Yb), Magnesium alloy (MgAg, Mgln), Aluminum Alloy (AlLi, AlMg, AlCa), Indium-Tin-Oxide (ITO/InSn.sub.xO.sub.y), Indium-Zinc Oxide (IZO/InZn.sub.xO.sub.y), Aluminum-Tin-Oxide (ATO/AlSn.sub.xO.sub.y), Indium-Germanium Oxide (IGO), Aluminum-doped SiO (Al—SiO), Lithium Fluoride (LiF), Lithia (Li.sub.2O), Molybdenum oxide (MoO.sub.3), Vanadium pentoxide(V.sub.2O.sub.5), oxide/metal/oxide (OMO, such as ITO/Ag/ITO) stacking structure etc.
[0114] S3, on top of the described second electrode with protection layer, deposit the third electrode. The third electrode may be transparent conductor layer, such as conductive transparent metal oxides, for example, Indium-Tin-Oxide (InSn.sub.xO.sub.y), Indium-Zinc Oxide (InZn.sub.xO.sub.y), Aluminum-Tin-Oxide (AlSn.sub.xO.sub.y), Indium-Germanium Oxide (IGO) etc.
[0115] The present invention discloses the patterning method to produce ultra-high resolution Organic Light Emitting Diode (OLED) display without using the high precision Fine Metal Mask (FMM), instead the OLED devices are patterned by using a special photolithography process together with the required device structures. The OLED display produced by this process possesses superior display performance and reliability properties.
[0116] Depending on the difference of the production processes described in S2 for OLED device fabrication, three types (but not limited to) of AMOLED displays can be produced, including:
1. High resolution Red-Green-Blue Side-By-Side (RGB SBS) AMOLED display;
2. Another high-resolution Red-Green-Blue Side-By-Side (RGB SBS) AMOLED display;
3. High resolution White OLED plus Color Filters (WOLED+CF) AMOLED display.
The production process for these three types of AMOLED display is described below.
[0117] Moreover, although the examples described herein are production of the Active-Matrix organic Light Emitting Diode (AMOLED) displays, the process disclosed in present invention is applicable to produce Passive Matrix Organic Light Emitting Diode (PMOLED) displays by replacing the active matrix driving backplane with the passive matrix driving backplanes.
EXAMPLE 1
[0118] As shown in
[0119] S1001, Deposit the first electrode with designed spacing between one another, based on the requirement of the display. After that the Pixel Defining Layer (PDL) is deposited and patterned according to the spacing between different subpixels, to define subpixel regions for OLED device fabrication;
[0120] S1002, on top of the first electrode and PDL deposit the common layers, including Hole Injection Layer (HIL) and Hole Transport Layer (HTL), on all of the subpixel areas;
[0121] S1003, Apply the first photoresist layer and the second photoresist layer. The photoresist materials may be ordinary photoresist resins, which are photosensitive polymer materials. They can be the negative type photoresist which will polymerized (by photo-polymerization or photo cross-linking reactions) when exposed to the required wavelengths of light. For example (but not limited to), methyl methacrylate series, or fluoroalkyl series of photosensitive polymer materials, crosslink reactions occur when exposed to the required light; the photoresist may also be the positive type that photo-decomposition reactions take place when irradiate with the required light, for example, diazo naphthoquinone, DNQ series materials etc. The photoresist materials are not limited to the examples provided. As the major selection criteria, the solvent used to dissolve the photoresist materials is selected not to damage the film materials used in the OLED device.
[0122] S1004, Photo expose the upper photoresist at the desired subpixel regions, to pattern for the deposition of the first color OLED devices, using the photo mask and the photolithography system.
[0123] S1005, Develop the exposed photoresist, followed by patterning the photoresist polymer layer underneath by dissolving it with the selected solvent
[0124] S1006, Deposit the remaining material for the layers of the OLED device of the first color sequentially at the areas that photoresists are removed to form the complete OLED device at those subpixel regions. The described OLED may be one of the Red subpixel OLED devices, Green subpixel OLED device, or Blue subpixel OLED device. The described remaining layers of the OLED device includes red light emitting layer or green light emitting layer, or blue light emitting layer, Electron Transport Layer (ETL), Electron Injection Layer (EIL);
[0125] S1007, On the Electron Injection Layer (EIL) of completed OLED device, deposit the material for the protective second electrode; when depositing the material for the OLED device and the material for the protective second electrode on top of the photoresist layer, a plurality of discontinuous gaps are formed and the gap exposes the photoresist layer. These discontinuous gaps are formed around the bilayer photoresist structures resulting from the discontinuous coverage of the deposited films on top of these structures due to their overhang structure and height, compared to that of the thickness of the materials deposited.
[0126] S1008, Strip off the first and the second photoresist layers and the undesired remaining layers of the first color OLED on top of them, at the non-subpixel regions by exposing unprotected photoresist layers through the previously formed gaps. The selection criteria for the solvent used to dissolve the photoresists is that the solvent will not cause chemical reaction and damage the OLED devices deposited during this stripping process.
[0127] Repeat the steps S1003˜S1008, to complete the production of the Red subpixel OLED devices, Green subpixel OLED devices, and Blue subpixel OLED devices that are required of the OLED display.
[0128] S1009, Fabricate the third electrode on the second electrode and protection layer previously deposited;
[0129] More detailed description of the production processes is provided below, based on the processing steps illustrated from
[0130] As shown in
[0131] As shown in
[0132] As shown in
[0133] As shown in
[0134] As shown in
[0135] As shown in
[0136] As shown in
[0137] As shown in
[0138] As shown in
EXAMPLE 2
[0139] As shown in
[0140] S2001, Deposit the first electrode with designed spacing between one another, based on the requirement of the display. After that the Pixel Defining Layer (PDL) is deposited and patterned according to the spacing between different subpixels, to define subpixel regions for OLED device fabrication;
[0141] S2002, Apply the first photoresist layer and the second photoresist layer on the patterned PDL and the first electrode;
[0142] S2003, Photo expose the photoresists at the desired subpixel regions, to pattern for the deposition of the first color OLED devices, using the photo mask and the photolithography system.
[0143] S2004, Develop the exposed photoresist, followed by patterning the photoresist polymer layer underneath by dissolving it with the selected solvent;
[0144] S2005, Deposit the complete layers of the OLED device of the first color sequentially at the areas that photoresists are removed to form the complete OLED device at those subpixel regions. The described OLED may be one of the Red or Green or Blue subpixel OLED devices. The described complete layers of the OLED device may include Hole Injection Layer (HIL), Hole Transport Layer (HTL), red light emitting layer or green light emitting layer, or blue light emitting layer, Electron Transport Layer (ETL), Electron Injection Layer (EIL);
[0145] S2006, On the Electron Injection Layer (EIL) of completed OLED device, deposit the protective second electrode;
[0146] S2007, Strip off the first and the second photoresist layers and the undesired remaining layers of the first color OLED on top of them, at the non-subpixel regions. The selection criteria for the solvent used to dissolve the photoresists is that the solvent may dissolve the photoresist effectively, but will not cause chemical reaction and damage the OLED devices deposited during this stripping process.
[0147] Repeat the steps S2002˜S2007, to complete the production of the Red subpixel OLED devices, Green subpixel OLED devices, and Blue subpixel OLED devices that are required of the OLED display.
[0148] S2008, Fabricate the third electrode on the second electrode and protection layer previously deposited;
[0149] More detailed description of the production processes is provided below, based on the processing steps illustrated from
[0150] As shown in
[0151] As shown in
[0152] As shown in
[0153] As shown in
[0154] As shown in
[0155] As shown in
[0156] As shown in
[0157] As shown in
[0158] As shown in
[0159] With the processing steps described above, based on the illustrations of
[0160] Example 1 and Example 2 illustrate the production method by using the combination of the device fabrication procedures and the design of OLED device structure to protect the deposited OLED devices, to reduce the possible damages resulting from the contact between processing chemicals to the OLED devices during production of the OLED display. Using the normal photoresist and the benign photoresist polymer combination to form the organic masking structure to pattern the OLED device in the thermal evaporation process, as replacement to the traditional high precision Fine Metal Mask (FMM). Due to the use of the thin organic masking structure, the common issues associated to the use of FMM, such as contact contamination or damages to the substrate, shadow effect and the variations and distortions of FMM may be eliminated. Therefore, OLED display with subpixels of larger aperture ratio, dramatic improvement of display and power performance and reliability maybe produced. Moreover, current invention enables the production of ultra-high resolution (for example, 800˜4000 ppi) of AMOLED with RGB Side-by-Side architecture that is unachievable with FMM process. This opens up the new possibilities to produce the ultra-high resolution direct emitting, full color AMOLED displays, including glass-based, flexible substrate-based or Si-based AMOLED displays.
EXAMPLE 3
[0161] As shown by
[0162] S3001, Deposit the first electrode with designed spacing between one another, based on the requirement of the display. After that the Pixel Defining Layer (PDL) is deposited and patterned according to the spacing between different subpixels, to define subpixel regions for OLED device fabrication;
[0163] S3002, Apply the first photoresist layer and the second photoresist layer on the patterned PDL and the first electrode;
[0164] S3003, Photo expose the photoresists at all of the subpixel regions, to pattern for the deposition of the white color OLED devices, using the photo mask and the photolithography system.
[0165] S3004, Develop the exposed photoresist, followed by patterning the photoresist polymer layer underneath by dissolving it with the selected solvent; to open up the subpixel regions to complete the patterning for deposition of white OLED device;
[0166] S3005, Deposit the white OLED device on all of the patterned subpixel regions;
[0167] S3006, deposit the second electrode with protection layer on the deposited white OLED device;
[0168] S3007, Strip off the first and the second photoresist layers and the undesired white OLED deposition on top of them, at the non-subpixel regions. The selection criteria for the solvent used to dissolve the photoresists is that the solvent may dissolve the photoresist effectively, but will not cause chemical reaction and damage the OLED devices deposited during the stripping process.
[0169] Fabricate the third electrode on the second electrode and protection layer previously deposited;
[0170] More detailed description of the production processes is provided below, based on the processing steps illustrated from
[0171] As shown by
[0172] As shown by
[0173] As shown by
[0174] As shown by
[0175] As shown by
[0176] The white OLED device shown in
1 depositing the first electrode followed by Pixel Defining Layer (PDL),
2 then deposit Hole Injection Layer (HIL),
3 Hole Transport Layer (HTL),
[0177] 4 the first Light Emitting Layer,
5 Electron Transport Layer (ETL),
6 Carrier Generation Layer (CGL),
7 Hole Transport Layer (HTL),
[0178] 8 the second Light Emitting Layer,
9 Electron Transport Layer (ETL),
10 Electron Injection Layer (EIL),
[0179] 11 the second electrode with protection layer; The second electrode with protection layer 160b is fabricated on the white OLED device 160W, based on the process step S3006.
[0180] The white OLED device in
1 the first electrode and the PDL on the driving backplane,
2 then Hole Injection Layer (HIL),
3 Hole Transport Layer (HTL),
4 Light Emitting Layer (EML),
5 Electron Transport Layer (ETL),
6 Electron Injection Layer (EIL),
[0181] 7 the second electrode with protection layer; following process step S3006, the second electrode with protection layer 160b is fabricated on the White OLED 160W;
[0182] As shown by
[0183] As shown by
[0184] Furthermore, after the OLED device is completed, on top of that the process step g is taken to fabricate the first barrier layer 180 on top of the third electrode 170;
[0185] As shown by
[0186] As shown by
[0187] With the processing steps illustrated above, an ultrahigh resolution full color AMOLED display panel with white OLED plus color filters architecture maybe achieved. The Example 3 illustrates the production method by using combination of the device fabrication procedures and the design of OLED device structure to protect the deposited OLED devices, to reduce the possible damages resulting from the contact between processing chemicals to the OLED devices during production of the OLED display. The AMOLED display produced possesses high performance in display quality, lifetime and reliability. Another important feature of the AMOLED display produced with the disclosed photolithographic patterning processes, using the combination of bilayer photoresist polymers, including conventional photoresist and the special benign optical polymer, lift-off to strip off the undesired photoresists at the non-subpixel regions, with selected solvent after depositing OLED device, resulting in separation between subpixels in the AMOLED display. This physical separation between subpixels prevents the issues of crosstalk due to leakage current caused by the adjacent subpixels that often occur in the high resolution conventional white OLED plus color filter AMOLED display produced by the Clean Metal Mask (CMM) patterning process, in which the blanket white OLED layers are coated in the vacuum deposition system, using the CMM as shadow mask. Therefore, the organic semiconductor layers in the white OLED device are connected between the resulted subpixels of the AMOLED produced.
[0188] Using the organic thin mask produced by special bilayer photoresists and photolithographic processes to pattern the subpixel of the AMOLED display of white OLED plus color filter architecture, in replacement of conventional white OLED plus color filter AMOLED produced by CMM patterning process, the separation between subpixels is achieved, which prevent the undesirable current leakage from the adjacent subpixels, and thus effectively reduce the color mixing crosstalk issue and allow the production of high quality, long lifetime, ultrahigh resolution AMOLED display with the white OLED plus color filter architecture.
[0189] The patterning process and the OLED device structure disclosed in present invention may be used for production of PMOLED and AMOLED displays for the wearable application, such as ultrahigh resolution microOLED displays used in smart glasses for Virtual Reality (VR), Mixing Reality (MR) and Augmented Reality (AR); electronic skin and displays in automobiles, eBook and ePaper; AMOLED displays used in high end mobile phones, smart phones, notebook computers televisions, and foldable and rollable OLED display products.
[0190] In the description in present invention, the terms for describing the relative direction or location, such as “center”, “vertical”, “horizontal”, “upper”, “lower”, “front”, “back”, “left”, “right”, “in”, “out” are used to concisely illustrate the relation of relative location shown in the Figures attached, instead of indicating or implying that the device or setup must possess the specific orientation or directional structure; thus, cannot be viewed as limitation of present invention.
[0191] In the description of present invention, “the feature”, “for example” may include one or multiple features or examples, without being listed exhaustively.
[0192] In the description of present invention, the terms used “one example”, “some example”, “illustrative example”, “illustration”, “implementation example” or “some illustrations” imply that the characteristics, structure or feature described are included in at least one of the Examples or illustrations. These terms do not necessary indicate the same example or illustration.
[0193] Although present invention is illustrated with some Examples, so it is understandable to the normal technical people in the field, there are possible variations, modifications, replacement, and change could be made based on the principles and methods disclosed within. The scope of present invention is defined by the claims and their equivalents.