Microscope and method for viewing a specimen using a microscope
11226478 · 2022-01-18
Assignee
Inventors
- Alexander Gaiduk (Jena, DE)
- Dominik STEHR (Jena, DE)
- Johannes Winterot (Jena, DE)
- Volker Pusch (Hüttlingen, DE)
Cpc classification
G02B21/365
PHYSICS
G02B21/367
PHYSICS
G02B21/361
PHYSICS
G02B21/008
PHYSICS
International classification
Abstract
The present invention relates to a method for viewing a specimen using a microscope which comprises an objective lens and an image sensor for converting an image formed on the image sensor by the objective lens. A field of view of the microscope can be varied by selecting a section of the image sensor. In one step of the method, an initial image of at least a partial section of the specimen is captured with the microscope, for which a first field of view is selected on the microscope. The initial image is analyzed to determine at least two differing fields of view forming a partial area image, wherein a partial area of the initial image is formed by each of the fields of view forming a partial area image. Images of the partial areas of the specimen are captured for each of the determined fields of view forming a partial area image. The invention further relates to a microscope for viewing a specimen using a microscope.
Claims
1. A method for examining a sample by microscopy using a microscope comprising an objective and an image sensor, wherein an image-sensor-side field of view of the microscope is modifiable by selecting a section of the image sensor; wherein the method comprises the following steps: recording an initial image of at least a portion of the sample with the microscope, for the purposes of which a first field of view is selected on the microscope, the initial image being recorded as a two-dimensional image with a maximum two-dimensional resolution or as a three dimensional image; ascertaining at least two differing portion-imaging fields of view by analyzing the initial image, wherein a portion of the initial image is imaged by each of the portion-imaging fields of view, and wherein by analyzing the initial image, a contrast for recording the microscopic images, parameters for controlling aberrations and/or parameters for setting an actuator of an optical element are ascertained and/or an option for recording an extended depth of field or an option for recording a depth information item is selected; and recording two-dimensional and/or three-dimensional images of the portions of the sample for each of the ascertained portion-imaging fields of view.
2. Method according to claim 1, wherein by analysing the initial image, a resolution of the microscopic images to be recorded and/or a viewing frustum for recording the microscopic images are ascertained.
3. The method according to claim 1, wherein the first field of view is larger than the at least one portion-imaging field of view, wherein the microscopic images of the portions are recorded with a finer resolution than the initial image.
4. The method according to claim 3, wherein the initial image is recorded as an overview image of the sample.
5. The method according to claim 3, wherein the individual portions that are imaged in the initial image are analysed when analyzing the initial image in order to determine a resolution that is required in each case for examining the respective portion by microscopy; and in that the individual portion-imaging fields of view are selected in accordance with the respective required resolution determined previously.
6. The method according to claim 3, wherein it comprises the following further steps: analysing at least one of the microscopic images of the portions in order to determine at least one sub-portion-imaging field of view for recording microscopic images of at least a plurality of sub-portions of the sample, wherein the at least one sub-portion-imaging field of view is smaller than the portion-imaging field of view; and recording microscopic images of the plurality of sub-portions of the sample for the respectively previously determined sub-portion-imaging field of view, wherein the microscopic images of the sub-portions are recorded with a finer resolution than the respective portion.
7. The method according to claim 1, wherein the initial image is recorded as a microscopic image of a first portion of the sample, for the purposes of which the first field of view is selected as the portion-imaging field of view.
8. The method according to claim 7, wherein the portion-imaging fields of view for recording the microscopic images of the further portions of the sample following the first portion are selected proceeding from the analysis of the image of the first portion of the sample, wherein the individual microscopic images of the further portions are respectively analysed in order to select the individual portion-imaging fields of view for recording the microscopic images of the further portions of the sample respectively following thereon.
9. The method according to claim 1, wherein the initial image and/or at least a plurality of the microscopic images are recorded with an extended depth of field.
10. The method according to claim 9, wherein a plurality of individual images with different z-positions are respectively recorded for the purposes of recording the initial image and/or the microscopic images with the extended depth of field.
11. The method according to claim 1, wherein use is made of an optical actuator for fast recording of a focus stack, said optical actuator being embodied as a microsystem with mechanically movable micromirrors.
12. The method according to claim 1, wherein the initial image and/or at least a plurality of the microscopic images are additionally recorded with a depth information item.
13. The method according to claim 1, wherein the actuator is configured to deform or displace the active optical element.
14. The method according to claim 1, wherein the actuator is formed by a microsystem for mechanically moving micromirrors and/or micro-lenses.
15. The method according to claim 1, wherein the actuator is a focus actuator and/or an aberration actuator.
16. A microscope for examining a sample by microscopy; comprising: an objective for magnified optical imaging of the sample; an image sensor for converting the imaged image into an electrical signal, wherein an image-sensor-side field of view of the microscope is variable by selecting a section of the image sensor; and an electronic control unit for controlling the image sensor, wherein the control unit is configured to carry out a method according to claim 1.
17. The microscope according to claim 16, characterized in that the objective has a maximum magnification factor of at most 40.
18. The microscope according to claim 17, wherein it comprises an optical actuator which is embodied as a microsystem with mechanically movable micromirrors for recording an extended depth of field.
19. The microscope according to claim 16, wherein it comprises an optical actuator which is embodied as a microsystem with mechanically movable micromirrors for recording an extended depth of field.
Description
DESCRIPTION OF THE DRAWINGS
(1) Further details and developments of the invention will become apparent from the following description of preferred embodiments of the invention, with reference being made to the drawing. In the drawing:
(2)
(3)
(4)
(5)
(6)
DETAILED DESCRIPTION OF THE INVENTION
(7)
(8) The overview image 01 has a low resolution of 250 line pairs/mm and was recorded with a large field of view which, in relation to the sample 02, equals 3.6 mm 0.3.6 mm. The resolution in the z-direction is 100 μm. Since the overview image 01 images the entire sample 02 (shown in
(9) A first microscopic image 04 of the plurality of microscopic images 03 images a large portion of the sample 02 (shown in
(10) A second microscopic image 06 of the plurality of microscopic images 03 images a small portion of the sample 02 (shown in
(11) A third microscopic image 07 of the plurality of microscopic images 03 images a small portion of the sample 02 (shown in
(12) A fourth microscopic image 08 of the plurality of microscopic images 03 images two small portions of the sample (shown in
(13) A fifth microscopic image 09 of the plurality of microscopic images 03 images a mid-sized portion of the sample (shown in
(14) The various characteristics of the recordings of the overview image 01, of the first microscopic image 04, of the second microscopic image 06, of the third microscopic image 07, of the fourth microscopic image 08 and of the fifth microscopic image 09 are presented in a comparative manner in Table 1.
(15) TABLE-US-00001 TABLE 1 Resolution Magnification Image 2D/3D Description Resolution Speed Field of view in z in z Overview 2D Single, 250 10 3.6 .Math. 100 — image 01 large region lp/mm images/s 3.6 mm.sup.2 μm First microscopic 2D Single 1000 10 2.4 .Math. 4.5 — image 04 lp/mm images/s 2.4 mm.sup.2 μm Second microscopic 2D Single 1000 30 0.6 .Math. 4.5 — image 06 lp/mm images/s 0.6 mm.sup.2 μm Third microscopic 3D Single 1000 >1 0.6 .Math. 0.6 .Math. 4.5 No image 07 lp/mm volume/s 0.45 mm.sup.3 μm Fourth microscopic 3D Composed 1000 <1 0.6 .Math. 0.6 .Math. 4.5 No image 08 mosaic lp/mm volume/s 0.45 mm.sup.3 μm 1000 <1 0.6 .Math. 0.6 .Math. 4.5 Yes lp/mm volume/s 0.6 mm.sup.3 μm Fifth microscopic 3D Single 500 >1 1.2 .Math. 1.2 .Math. 45 Yes image 09 lp/mm volume/s 1 mm.sup.3 μm
(16) For the purposes of recording the overview image 01 and the microscopic images 03 there is, according to the invention, a suitable selection of a small maximum magnification factor of at most 40, a large maximum field of view, a quick mechanical focusing, an image conversion with a small pixel spacing and a large number of pixels, a fast transfer of the data obtained by the image conversion and the portions to be examined by microscopy for the purposes of increasing the speed of the image conversion.
(17) In accordance with a first example according to the invention, a small maximum magnification factor of at most 40 and a large numerical aperture are selected in order to obtain a large maximum field of view and a fine optical resolution so as, in particular, to record two-dimensional microscopic images 03.
(18) In accordance with a second example according to the invention, a small maximum magnification factor of at most 40 and a large numerical aperture are selected in order to obtain a large maximum field of view and in order to minimize the necessary changes in the magnification as a consequence of the large and fast variation in the focusing if three-dimensional microscopic images 03 are to be recorded.
(19) In accordance with a third example according to the invention, a small pixel spacing is selected for the image conversion, said pixel spacing being small enough to ensure that there is no undersampling at the selected numerical aperture and the selected magnification. A large number of pixels is used for the image conversion, and so the field of view is large. The fast image conversion that is obtainable according to the invention is synchronized with varying focusing. It is possible to obtain two-dimensional microscopic images 03 by an image conversion with 42 million pixels and 1080 lines with a frame rate of more than 60 Hz. It is possible to obtain three-dimensional microscopic images 03 by way of a focus variation of >10 kHz at a speed of 1 volume/s of a spatial portion with a size of 10 mm 0.10 mm 0.10 mm, with the spatial resolution in the x-direction, y-direction and z-direction being 5 μm, 5 μm and 170 μm, respectively. For a spatial portion with a size of 6 mm 0.5 mm 0.7 mm, the spatial resolution in the x-direction, y-direction and z-direction is 0.8 μm, 0.9 μm and 170 μm, respectively. For a spatial portion with a size of 180 μm 0.130 μm 0.36 μm, the spatial resolution in the x-direction, y-direction and z-direction is 0.1 μm, 0.1 μm and 0.9 μm, respectively.
(20)
(21) The three options 11, 12, 13 differ, in particular, in the realization of the measurement of a depth information item of the sample 02.
(22) In the first option 11, a microsystem 22 with movable micromirrors serves to measure a depth information item of the sample 02, with the microsystem 22 with the movable micromirrors being arranged in a back-reflecting manner by way of a beam splitter 23. Moreover, the microsystem 22 serves for fast fine focusing, including a correction of the aberration. In the second option 12, the microsystem 22 with the movable micromirrors is arranged in a reflecting manner at an angle of 45°. Here too, the microsystem 22 serves in addition for fast fine focusing, including a correction of the aberration. In the third option 13, an active optical element 24, such as e.g. a lens that is controllable by mechanical vibrations, a liquid lens or a diffractive lens, serves to measure a depth information item of the sample 02. Moreover, the active optical element 24 serves for fast fine focusing, including a correction of the aberration. Optionally, a lens 26 is arranged in front of the image sensor 21 in each case. Each of the three options 11, 12, 13 facilitates a three-dimensional and a two-dimensional microscopic recording of the sample 02. By way of the method according to the invention, described above, it is possible to increase the speed of the measurement by a factor of between 2 and 100.
(23)
(24) The options 31, 32, 33 may comprise further optical elements (not shown here), such as e.g. a lens that is controllable by mechanical vibrations, a liquid lens or a diffractive lens, as a result of which e.g. an intensity, a phase and/or a polarization of the light to be produced are controllable.
(25) The three options 31, 32, 33 for the coaxial illumination 17 of the sample 02 may alternatively also be embodied for the sub-stage illumination or for the ring illumination.
(26)
(27) In the third embodiment, which is illustrated on the left-hand side, a microsystem 42 with movable micromirrors is arranged in a back-reflecting manner by way of a beam splitter 43 in order to act as an actuator for adjusting the focusing. In the fourth embodiment, which is illustrated on the right-hand side, a focus actuator 44 serves to adjust the focusing. A further optional lens 46 may be arranged in front of the image sensor 21.
(28)
(29) As an alternative to the presented embodiment, the initial image may also be a two-dimensional image with a low resolution and a large field of view, a three-dimensional image with a low resolution in three dimensions and a large viewing frustum.