Ultrasonic Transducer and Method of Fabricating an Ultrasonic Transducer
20220013103 · 2022-01-13
Inventors
Cpc classification
H10N30/03
ELECTRICITY
H10N30/06
ELECTRICITY
G10K11/02
PHYSICS
International classification
G10K11/02
PHYSICS
Abstract
An ultrasonic transducer that includes a delay line, an active piezoelectric element, and interposing metal conductive layer between the delay line and active piezoelectric element. The delay line and active piezoelectric element are joined so that ultrasonic waves may be coupled from the active piezoelectric element into the delay line or from the delay line into the active piezoelectric element. A via is formed, using a milling operation, in the active piezoelectric element to expose the edge of the interposing metal conductive layer between the delay line and active piezoelectric element. A conductive layer makes electrical contact between the interposing metal conductive layer and the surface of the active piezoelectric element to allow an electrical connection to be made from the surface of the active piezoelectric element to the interposing metal conductive layer.
Claims
1-7. (canceled)
8. A method of producing an ultrasonic transducer, the method comprising the steps of: providing a delay line substrate; providing a piezoelectric substrate as an active transducer element; depositing a first metal layer on the delay line substrate; depositing a second metal layer and the piezoelectric substrate; bonding the delay line substrate to the piezoelectric substrate to form a stack and to facilitate coupling ultrasonic waves from the piezoelectric element into the delay line or from the delay line into the piezoelectric element; milling the piezoelectric substrate to expose a portion of at least one of the first metal layer and the second metal layer to allow electrical contact; depositing a first patterned electrode on the exposed portion to allow external electrical connection to the at least one of the first metal layer and the second metal layer; and depositing a second patterned electrode on the piezoelectric element, the second patterned electrode defining an active area of the ultrasonic transducer and configured to electrically connect externally.
9. The method of claim 8, further comprising: milling the piezoelectric substrate at a plurality of locations; and partitioning the stack through at least one of the plurality of locations to create individual ultrasonic transducers.
10. The method of claim 9, wherein the partitioning includes core drilling through the delay line substrate of the at least one of the plurality of locations.
11. A method of producing an ultrasonic transducer, the method comprising the steps of: providing a delay line substrate; providing a piezoelectric substrate as an active transducer element; depositing a metal layer on either the delay line substrate or the piezoelectric substrate; bonding the delay line substrate to the piezoelectric substrate such that the deposited metal layer is between the delay line substrate and the piezoelectric substrate to form a stack and to facilitate coupling ultrasonic waves from the piezoelectric element into the delay line or from the delay line into the piezoelectric element; milling the piezoelectric substrate to expose a portion of at least one of the first metal layer and the second metal layer to allow electrical contact; depositing a first patterned electrode on the exposed portion to allow external electrical connection to the at least one of the first metal layer and the second metal layer; and depositing a second patterned electrode on the piezoelectric element, the second patterned electrode defining an active area of the ultrasonic transducer and configured to electrically connect externally.
12. The method of claim 11, wherein milling the piezoelectric substrate occurs at a plurality of locations and the method of claim 9 further comprises partitioning the stack through at least one of the plurality of locations to create individual ultrasonic transducers.
13. The method of claim 12, wherein the partitioning includes core drilling through the delay line substrate of the at least one of the plurality of locations.
14. The method of claim 11, wherein milling the piezoelectric substrate forms a via tapering to a depth.
15. The method of claim 11, wherein milling the piezoelectric substrate forms an annular via including two side walls extending a full depth of the via, and depositing the first patterned electrode deposits the first patterned electrode on a radially inward one of the two side walls.
16. The method of claim 11, wherein milling the piezoelectric substrate forms an annular via including two side walls extending a full depth of the via, and depositing the first patterned electrode deposits the first patterned electrode on both of the two side walls.
17. The method of claim 16, wherein depositing the first patterned electrode deposits the first patterned electrode discontinuously between the two side walls.
Description
BRIEF DESCRIPTION OF THE DRAWING
[0016] FIG.1 shows a schematic cross sectional view of an ultrasonic transducer with a delay line,. according to the prior art.
[0017]
[0018]
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[0020]
[0021]
[0022]
[0023]
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[0027]
DETAILED DESCRIPTION OF THE INVENTION
[0028] In order to overcome the common issues with current methods of producing a via in piezoelectric materials used in ultrasonic transducers and to provide reproducible performance at a low manufacturing cost across a wide variety of piezoelectric materials, a novel fabrication method is employed.
[0029]
[0030]
[0031] The important aspect of the cutting tool 70 is that the cutting surfaces 71 are angled (shown as the angle θ in
[0032] Also shown in
[0033]
[0034] Once edges of the bonded metal layers 64 are exposed, a first conductive layer 80, shown in
[0035] Alternatively, as shown in
[0036] In another alternative, as shown in
[0037]
[0038] The individual device 90 may be mounted in an appropriate case and external connection of the first conductive layer 80 and the second conductive layer 82 can be made with any number of conventional means. A proper stimulus voltage, typically in the form of a pulse, may be applied to the two electrodes producing an ultrasonic wave which will propagate from the piezoelectric material into the delay line and may be used to interrogate a given test material that is coupled to the delay line. After the appropriate delay time, a reflected wave from the interrogated test material will propagate back to the piezoelectric material and can be measured with appropriate receiver electronics.
[0039] As a demonstration of the feasibility of the current invention, an ultrasonic transducer was fabricated according to the steps outlined in this disclosure.
[0040] A custom milling tool with cutting edges angled at 45 degrees and an annular cross section with a 5 mm diameter and 2 mm sidewall thickness was used to form an annular via. The first conductive layer 80 is divided into two halves. In this way, the only path of conduction from one half of the first conductive layer 80 to the second half of the first conductive layer 80 is through the contact made by the via through the bottom bonded metal layer 64. A low resistance measurement would confirm the successful contact made through the via providing proof of the concept. A two point resistance measurement was made contacting the upper and lower halves of the first conductive layer 80 on a number of devices. In each case, the resistance was less than 2 ohms, indicating an excellent contact made through the via.
[0041] Accordingly, it is to be understood that the embodiments of the invention herein described are merely illustrative of the application of the principles of the invention. Reference herein to details of the illustrated embodiments is not intended to limit the scope of the claims, which themselves recite those features regarded as essential to the invention.
LIST OF REFERENCE NUMBERS
[0042] 60 piezoelectric substrate
62 delay line substrate
64 interposing metal layers
70 cutting tool
71 cutting surfaces
72 annular via
80 first conductive layer
81 alternative first conductive layer
82 second conductive layer
83 second alternative first conductive layer
90 individual device