Optical imaging apparatus using metamaterial and optical imaging method using metamaterial
11175186 · 2021-11-16
Assignee
- Korea Institute Of Science And Technology (Seoul, KR)
- CENTER FOR ADVANCED META-MATERIALS (Daejeon, KR)
Inventors
- Minah Seo (Seoul, KR)
- Sang-Hun Lee (Seoul, KR)
- Chulki KIM (Seoul, KR)
- Jae Hun KIM (Seoul, KR)
- Taikjin Lee (Seoul, KR)
- Deok Ha Woo (Seoul, KR)
Cpc classification
G01J5/0803
PHYSICS
G01J3/42
PHYSICS
G02B1/002
PHYSICS
International classification
G02B1/00
PHYSICS
Abstract
One embodiment of the present invention provides an optical imaging apparatus using a metamaterial including a metamaterial array sensor which includes a plurality of unit cells made of a metamaterial and is positioned adjacent to an observation object, an imaging beam providing unit which provides an imaging beam toward the metamaterial array sensor, a control beam providing unit which controls a control beam provided to the unit cell to block the imaging beam incident on the unit cell, and an imaging beam measuring unit which measures a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor when the imaging beam passes through the unit cell and an imaging beam transmission amount of the metamaterial array sensor when the control beam is focused on the unit cell to block the imaging beam incident on the unit cell.
Claims
1. An optical imaging apparatus using a metamaterial, comprising: a metamaterial array sensor which includes a plurality of unit cells made of a metamaterial and is positioned adjacent to an observation object; an imaging beam providing unit which provides an imaging beam toward the metamaterial array sensor; a control beam providing unit which controls a control beam provided to a unit cell to block an imaging beam incident on the unit cell; an imaging beam measuring unit which measures a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor when the imaging beam passes through the unit cell and an imaging beam transmission amount of the metamaterial array sensor when the control beam is focused on the unit cell to block the imaging beam incident on the unit cell; and an image acquiring unit which acquires an optical analysis image of the observation object, which has a spatial resolution corresponding to a size of the metamaterial constituting the unit cell, by using the unit cell imaging beam transmission amount, which is measured by the imaging beam measuring unit, with respect to each of the plurality of unit cells.
2. The optical imaging apparatus of claim 1, wherein a size of the metamaterial constituting the unit cell is smaller than a diffraction limit of the imaging beam.
3. The optical imaging apparatus of claim 1, wherein the control beam has a spot size that is preset to correspond to a size of the metamaterial constituting the unit cell.
4. The optical imaging apparatus of claim 1, wherein the imaging beam is in a form of a terahertz wave, and the control beam has a wavelength in a visible light wavelength range.
5. An optical imaging method using a metamaterial, comprising: a) providing an imaging beam toward a metamaterial array sensor which includes a plurality of unit cells made of a metamaterial and is positioned adjacent to an observation object; b) controlling a control beam provided to the unit cell to block an imaging beam incident on a unit cell; c) measuring a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor when the imaging beam passes through the unit cell and an imaging beam transmission amount of the metamaterial array sensor when the control beam is focused on the unit cell to block the imaging beam incident on the unit cell; and d) acquiring an optical analysis image of the observation object, which has a spatial resolution corresponding to a size of the metamaterial constituting the unit cell, by using the unit cell imaging beam transmission amount with respect to each of the plurality of unit cells, which is measured according to operation c).
6. The optical imaging method of claim 5, wherein a size of the metamaterial constituting the unit cell is smaller than a diffraction limit of the imaging beam.
7. The optical imaging method of claim 5, wherein the control beam has a spot size that is preset to correspond to a size of the metamaterial constituting the unit cell.
8. The optical imaging method of claim 5, wherein the imaging beam is in a form of a terahertz wave, and the control beam has a wavelength in a visible light wavelength range.
9. The optical imaging apparatus of claim 1, wherein a difference between transmission amounts of switch-on and switch-off corresponds to transmission in the unit cell.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS
(9) Hereinafter, the present invention will be described in detail with reference to the accompanying drawings. However, the present invention may be implemented in several different forms and thus is not limited to the embodiments described herein. In addition, the accompanying drawings are used to easily understand the embodiments presented herein, and the technical spirit presented herein is not limited by the accompanying drawings. As such, it should be understood that the present invention should be construed to extend to any alterations, equivalents and substitutes that are included within the spirit and scope of the present invention. Parts which are not associated with the description are not illustrated in the drawings in order to clearly describe the present invention, the size, form, and shape of each component shown in the drawings may be variously modified, and like reference numerals refer to like elements throughout the specification.
(10) In addition, suffixes “module” and “unit” used for components disclosed in the following description are merely given or interchangeably used to facilitate a description of the specification, and the suffix itself does not give any special meaning or function. Also, in describing the embodiments presented herein, the detailed description will be omitted when a specific description for publicly known technologies to which the present invention pertains is judged to obscure the gist of the embodiments presented herein.
(11) Throughout the specification, in a case in which one component is described as being “connected (joined, in contact with, or coupled)” to another component, such a description includes both a case in which one component is “connected (joined, in contact with, or coupled)” directly to another component and a case in which one component is “connected (joined, in contact with, or coupled)” indirectly to another component with still another component disposed between one component and another component. In addition, unless explicitly described to the contrary, the term “comprise (include or have)” will be understood to imply the inclusion of stated components but not the exclusion of any other components.
(12) Terms used herein are used for describing a specific embodiment and do not limit the present invention. A singular form includes a plurality of forms unless it is clearly represented otherwise, and components that are distributed and implemented may be implemented in a combined form unless a particular limitation. In this specification, a term “comprise” or “have” indicates presence of a characteristic, numeral, step, operation, element, component, or combination thereof described in the specification and does not exclude presence or addition of at least one characteristic, numeral, step, operation, element, component, or combination thereof.
(13) It will be understood that, although terms “first and second” used herein may be used to describe various components, the components should not be limited by these terms. The terms are only used to distinguish one element from another component. For example, a first component could be termed a second component, and, similarly, a second component could be termed a first component, without departing from the scope of the present invention.
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(15) Prior to the detailed description being set forth, the concept of the present invention will be briefly described. In optical imaging, when a diffraction limit spot size of an imaging beam is greater than a size of an observation object, a detailed spatial shape of the observation object is not imaged. According to the present invention, a resolution of an image is increased by reducing an actual spot size to a level of a unit metamaterial using a metamaterial array sensor and a control beam. Here, the control beam serves to change optical properties of the unit metamaterial to transmit or block an imaging beam incident on the unit metamaterial. In addition, the unit metamaterial (unit cell) is made to be smaller than a diffraction limit of the imaging beam, and the control beam has a spot size small enough to be separately incident on each unit metamaterial. In this case, a difference between transmission amounts of an imaging beam generated by turning a control beam on and off corresponds to a transmission amount of the imaging beam passing through the unit metamaterial. When a difference between transmission amounts according to the presence and absence of a control beam is measured in all unit metamaterials of an array, an image, of which an actual resolution corresponds to a level of a unit metamaterial, may be acquired.
(16) Referring to
(17) The metamaterial array sensor 110 includes a plurality of unit cells 111 made of a metamaterial and is positioned adjacent to an observation object. Referring to
(18) In addition, referring to
(19) The imaging beam providing unit 120 provides an imaging beam to the metamaterial array sensor 110. Here, the imaging beam may have the same form as the imaging beam 202 shown in
(20) The control beam providing unit 130 controls a control beam provided to the unit cell 111 to block the imaging beam incident on the unit cell 111. That is, the control beam providing unit 130 controls turn-on or off of the control beam. In this case, the control beam may have the same form as a control beam 203 shown in
(21) The above-described imaging beam may be in a form of a terahertz wave, and the above-described control beam may have a wavelength in a visible light wavelength range, but the present invention is not limited thereto.
(22) The imaging beam measuring unit 140 measures a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor 110 when the imaging beam passes through the unit cell 111 and an imaging beam transmission amount of the metamaterial array sensor 110 when the control beam is focused on the unit cell 111 to block the imaging beam incident on the unit cell 111.
(23) Referring to
(24) The image acquiring unit 150 acquires an optical analysis image of the observation object, which has a spatial resolution corresponding to a size of a metamaterial constituting the unit cell 111, by using a unit cell imaging beam transmission amount with respect to each of the plurality of unit cells 111, which is measured by the imaging beam measuring unit 140.
(25) Referring to
(26) Meanwhile, a size of the metamaterial constituting the unit cell 111 may be smaller than a diffraction limit of the imaging beam. In addition, the control beam may have a spot size that is preset to correspond to the size of the metamaterial constituting the unit cell 111. Referring to
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(28) According to one embodiment of the invention, a unit metamaterial may be designed to optically switch transmittance of a cut-off frequency band. As a transmittance switching mechanism, there are various methods including refractive index tuning by a thermal effect and impact ionization by forming a conductive channel through photoexcitation of electric charges. As shown in
(29) Specifically, the slot antenna array 601 made of a metal and manufactured on the semiconductor substrate 602 transmits the terahertz wave 603 at a resonant frequency. As in the case of control beam-off as shown in
(30) As shown in
(31) As described above, the present invention may be suitable for imaging using a long wavelength greater than or equal to that of a terahertz wave. When a control beam in a visible light region and a nano metamaterial are used, it is possible to obtain a resolution that is at least hundreds of times smaller than a wavelength. In addition, the present invention may be easily combined with terahertz time domain spectroscopy and used. When a biomaterial is imaged using a long wavelength greater than or equal to that of a terahertz wave, a low spatial resolution, which makes it difficult to distinguish a biological structure, has been a limitation. Thus, the present invention may be utilized in fields such as medicine and pharmaceuticals by facilitating imaging of a biomaterial in a long wavelength.
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(33) The optical imaging method using a metamaterial according to the present embodiment provides an optical imaging method using a metamaterial, which includes a) providing an imaging beam to a metamaterial array sensor which includes a plurality of unit cells made of a metamaterial and is positioned adjacent to an observation object (S110), b) controlling a control beam provided to the unit cell to block the imaging beam incident on the unit cell (S120), and c) measuring a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor when the imaging beam passes through the unit cell and an imaging beam transmission amount of the metamaterial array sensor when the control beam is focused on the unit cell to block the imaging beam incident on the unit cell (s130).
(34) In the present embodiment, the optical imaging method may further include d) acquiring an optical analysis image of the observation object, which has a spatial resolution corresponding to a size of the metamaterial constituting the unit cell, by using the unit cell imaging beam transmission amount with respect to each of the plurality of unit cells, which is measured according to operation c) (S140).
(35) In the present embodiment, the size of the metamaterial constituting the unit cell may be smaller than a diffraction limit of the imaging beam.
(36) In the present embodiment, the control beam may have a preset spot size that is preset to correspond to the size of the metamaterial constituting the unit cell.
(37) In the present embodiment, the imaging beam is in a form of a terahertz wave, and the control beam may have a wavelength in a visible light wavelength range.
(38) As described above, the present invention relates to a method of achieving ultra high resolution imaging using a metamaterial array sensor. In the present invention, by bringing a metamaterial array sensor and an observation object into contact with each other and using an imaging optical beam for measuring transmittance thereof together with a control optical beam for individually switching transmittance of the imaging beam in a unit metamaterial, an image is acquired by two-dimensionally scanning a difference between transmission amounts of an imaging beam generated when the unit metamaterial is switched. Since the acquired image has a spatial resolution by as much as a size of the unit metamaterial irrespective of a diffraction limit of an imaging beam, ultra high resolution imaging may be achieved by using a metamaterial array in which a size of a unit metamaterial is smaller than a diffraction limit.
(39) According to embodiments of the present invention, a control beam capable of switching transmittance of an imaging beam is focused on one unit metamaterial. A difference between intensities of a transmitted imaging beam generated by turning a control beam on and off corresponds to intensity of an imaging beam passing through a corresponding unit metamaterial. When the same measurement is performed on all unit metamaterials in a metamaterial array, an image having a spatial resolution as large as a size of the unit metamaterial is acquired irrespective of a diffraction limit of an imaging beam in an array area.
(40) According to the present invention, in optical imaging, it is possible to obtain a transmission amount and transmittance of an imaging beam with respect to an individual unit metamaterial and to acquire an optical analysis image in which a spatial resolution of imaging is increased to a level of a size of a unit metamaterial irrespective of a diffraction limit.
(41) In addition, according to the present invention, in imaging using a long wavelength greater than or equal to that of a terahertz wave, when a control beam in a visible light region and a nano metamaterial are used, it is possible to obtain a resolution that is at least hundreds of times smaller than a wavelength. Furthermore, the present invention may be easily combined with terahertz time domain spectroscopy and used. When a biomaterial is imaged using a long wavelength greater than or equal to that of a terahertz wave, it is possible to solve a problem in occurrence of a low spatial resolution which makes it difficult to distinguish a biological structure. Thus, the present invention may be utilized in fields such as medicine and pharmaceuticals by facilitating imaging of a biomaterial in a long wavelength.
(42) It should be understood that the effects of the present invention are not particularly limited to those described above, and the present invention includes all effects that can be deduced from the detailed description of the present invention or the configurations of the invention described in the claims.
(43) The description of the present invention is intended for illustration, and those skilled in the art will appreciate that the present invention can be easily modified in other detailed forms without changing the technical spirit or essential features of the present invention. Therefore, the above-described embodiments should be understood as being exemplary rather than restrictive. The scope of the present invention should be defined by the accompanying claims rather than by the detailed description, and all changes or modifications derived from the meanings and scopes of the claims and equivalents thereof should be construed as being included in the scope of the present invention.