VISIBLE LIGHT DETECTOR WITH HIGH-PHOTORESPONSE BASED ON TiO2/MoS2 HETEROJUNCTION AND PREPARATION THEREOF

Abstract

In the field of photoelectric devices, a visible light detector is provided with high-photoresponse based on a TiO.sub.2/MoS.sub.2 heterojunction and a preparation method thereof. The detector, based on a back-gated field-effect transistor based on MoS.sub.2, includes a MoS.sub.2 channel, a TiO.sub.2 modification layer, a SiO.sub.2 dielectric layer, Au source/drain electrodes and a Si gate electrode, The TiO.sub.2 modification layer is modified on the surface of the MoS.sub.2 channel. By employing micromechanical exfoliation and site-specific transfer of electrodes, the method is intended to prepare a detector by constructing a back-gated few-layer field-effect transistor based on MoS.sub.2, depositing Ti on the channel surface, and natural oxidation.

Claims

1. A visible light detector with high-photoresponse based on a TiO.sub.2/MoS.sub.2 heterojunction, wherein the detector is based on a back-gated field-effect transistor based on MoS.sub.2, the detector comprising a MoS.sub.2 channel, a TiO.sub.2 modification layer, a SiO.sub.2 dielectric layer, Au source/drain electrodes and a Si gate electrode, the TiO.sub.2 modification layer being modified on the surface of the MoS.sub.2 channel, the TiO.sub.2 modification layer being obtained from e-beam evaporation of a certain thickness of metallic Ti film on the surface of the MoS.sub.2 channel and natural oxidation of the metallic Ti film, the MoS.sub.2 including a few layers of MoS.sub.2 flakes with a high crystallinity.

2. The visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction according to claim 1, wherein the MoS.sub.2 flakes are in a hexagonal phase with a single-crystal structure, the few layers numbering 3-5 layers, and the overall thickness is 2-2.5 nm.

3. The visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction according to claim 1, wherein the TiO.sub.2 modification layer is a naturally oxidized TiO.sub.2 layer having a thickness of 1-2 nm.

4. The visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction according to claim 3, wherein the TiO.sub.2 layer is in a crystalline state or an amorphous state, and when the TiO.sub.2 layer is in the crystalline state, it has single-crystal sheets.

5. The visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction according to claim 1, wherein at a zero-gate voltage and under illumination of a white-light LED, the detector can reach a high photoresponsivity of 1099 A/W and a high specific detectivity of 1.67×10.sup.13 Jones.

6. A method of preparing the visible light detector with high-photoresponse based on a TiO.sub.2/MoS.sub.2 heterojunction, wherein the method comprises the following steps: S1. preparing MoS.sub.2 flakes, and transferring the MoS.sub.2 flakes onto a SiO.sub.2/Si wafer; S2. constructing a transistor based on MoS.sub.2, site-specific transferring gold electrodes onto the MoS.sub.2 flakes obtained in step S1, getting source/drain electrodes of the detector, a highly-doped Si substrate being a gate electrode; S3. e-beam evaporation of Ti, depositing a certain thickness of metallic Ti film on a channel surface of the transistor based on MoS.sub.2 constructed in step S2, getting a device based on the Ti/MoS.sub.2 heterojunction; and S4. natural oxidation, exposing the device based on the Ti/MoS.sub.2 heterojunction prepared in step S3 in air for oxidation, obtaining the TiO.sub.2/MoS.sub.2 heterojunction for a visible-light detector.

7. The method of preparing the visible light detector with high-photoresponse based on the TiO.sub.2/MoS.sub.2 heterojunction according to claim 6, wherein, in step S1, the MoS.sub.2 flakes are prepared by micromechanical exfoliation, and the MoS.sub.2 flakes are heated after being transferred onto the SiO.sub.2/Si wafer.

8. The method of preparing the visible light detector with high-photoresponse based on the TiO.sub.2/MoS.sub.2 heterojunction according to claim 6, wherein, in step S2, the electrode thickness of the transistor based on MoS.sub.2 is 50 nm, and after the transistor based on MoS.sub.2 is constructed, it is annealed at 200° C. in an atmosphere of Ar/H.sub.2 at 10 Pa for 1 hr.

9. The method of preparing the visible light detector with high-photoresponse based on the TiO.sub.2/MoS.sub.2 heterojunction according to claim 6, wherein in step S3, the thickness of the e-beam-evaporated Ti film is 2 nm, and the deposition rate is 0.2 Å/s.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0034] FIG. 1 is a schematic diagram showing the preparation process of a visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction according to one example of the present disclosure. Where: (a) shows the few-layer MoS.sub.2 flake prepared by micromechanical exfoliation; (b) shows the back-gated field-effect transistor based on MoS.sub.2 constructed by transferring the electrodes; (c) shows the transistor based on Ti/MoS.sub.2 generated by e-beam evaporation of Ti; (d) shows the photodetector based on TiO.sub.2/MoS.sub.2 heterojunction after oxidation.

[0035] FIG. 2A shows an optical image of the few-layer MoS.sub.2 flakes.

[0036] FIG. 2B shows an atomic force microscope image of the MoS.sub.2 heterostructure modified with TiO.sub.2.

[0037] FIG. 3A shows a high-resolution transmission electron microscope image of the TiO.sub.2/MoS.sub.2 heterojunction.

[0038] FIG. 3B shows a fast Fourier transform pattern of the high-resolution transmission electron microscope image containing the region as shown in FIG. 3a.

[0039] FIG. 3C shows an inverse fast Fourier transform pattern of the diffraction ring from TiO.sub.2 in FIG. 3b.

[0040] FIG. 3D shows an electron energy loss spectroscopy of the TiO.sub.2/MoS.sub.2 heterojunction, showing the signal from Ti.

[0041] FIG. 4 shows an X-ray photoelectron spectroscopy of the TiO.sub.2/MoS.sub.2 heterojunction, where a-d show core-level high resolution XPS spectra of Mo 3d, S 2p, Ti 2p and O1s in TiO.sub.2/MoS.sub.2, respectively.

[0042] FIG. 5A shows an optical image of the field-effect transistor based on MoS.sub.2.

[0043] FIG. 5B shows a Raman spectrum of the MoS.sub.2 flake.

[0044] FIG. 5C shows a 3D-model diagram of the photodetector based on MoS.sub.2 modified with TiO2 nanosheets.

[0045] FIG. 5D shows a 3D-model and cross-section diagram of the photodetector based on MoS.sub.2 modified with TiO.sub.2 nanosheets.

[0046] FIG. 6A shows transfer curves of photodetectors based on MoS.sub.2 and TiO.sub.2/MoS.sub.2 respectively in dark and under different illumination power densities at a source/drain bias of 1 V, with the inset showing the dependence of threshold voltage variations on the power density.

[0047] FIG. 6B shows the photocurrents as a function of the gate voltages under different power densities.

[0048] FIG. 6C shows the dependence of the photocurrents on the power density at different gate voltages.

[0049] FIG. 7A shows the dependence of the responsivities of photodetectors based on MoS.sub.2 and TiO.sub.2/MoS.sub.2 respectively on the power density at different gate voltages.

[0050] FIG. 7B shows the dependence of the specific detectivities of photodetectors based on MoS.sub.2 and TiO.sub.2/MoS.sub.2 respectively on the power density at different gate voltages.

[0051] FIG. 7C shows the responsivity comparison of the two photodetectors based on MoS.sub.2 and TiO.sub.2/MoS.sub.2 respectively at different gate voltages.

[0052] FIG. 7D shows the specific detectivity comparison of the two photodetectors based on MoS.sub.2 and TiO.sub.2/MoS.sub.2 respectively at different gate voltages.

[0053] FIG. 8A shows an energy band diagram of a triple-layer MoS.sub.2 under visible light illumination.

[0054] FIG. 8B shows an energy band diagram of the TiO.sub.2/MoS.sub.2 heterojunction under visible light illumination.

DETAILED DESCRIPTION

[0055] Specific examples of the present disclosure will be described in detail in combination with the attaching drawings below. It should be noted that the technical features or the combination thereof described in the following examples should not be considered to be isolated, which can be combined to achieve better technical effects.

Example 1

[0056] This example provides a visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction, the detector is based on a back-gated field-effect transistor based on MoS.sub.2, and the detector includes a MoS.sub.2 channel, a TiO.sub.2 modification layer, a SiO.sub.2 dielectric layer, Au source/drain electrodes and a Si gate electrode, the TiO.sub.2 modification layer is modified on the surface of the MoS.sub.2 channel. At a zero-gate voltage and under the illumination of a white-light LED, the detector can reach a high photoresponsivity of 1099 A/W and a high specific detectivity of 1.67×10.sup.13 Jones.

[0057] Preferably, the MoS.sub.2 channel is few-layer MoS.sub.2 flakes with a high crystallinity, the MoS.sub.2 flakes are in a hexagonal phase with a single-crystal structure; the few-layer means 3 layers, and the overall thickness is 2-2.5 nm.

[0058] Preferably, the TiO.sub.2 modification layer is a naturally oxidized TiO.sub.2 layer, and the thickness of the TiO.sub.2 layer is 1-2 nm.

[0059] Preferably, the TiO.sub.2 layer is in a crystalline state or an amorphous state, and when the TiO.sub.2 layer is in the crystalline state, it has single-crystal sheets.

Example 2

[0060] This example provides a method of preparing the visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction.

[0061] S1. Preparation of few-layer MoS.sub.2 flakes with nanometer thickness and high crystallinity;

[0062] S1.1 Taking an appropriate amount of bulk MoS.sub.2 crystals and placing them on one adhesive side of Scotch tapes;

[0063] S1.2 Folding both ends of the adhesive tapes in half along the middle, contacting the other adhesive side of the adhesive tapes with the upper surface of MoS.sub.2 bulks, compacting the part of adhesive tapes attached with MoS.sub.2 gently, tearing slowly so that the MoS.sub.2 bulks can be divided into two parts, repeating multiple times of sticking and tearing, until small pieces of MoS.sub.2 were distributed on both sides of the adhesive tapes discretely;

[0064] S1.3 Cutting the adhesive tapes in the middle, attaching the side attached with MoS.sub.2 slowly onto SiO.sub.2/Si substrates that have been washed with piranha solution, flattening and squeezing the adhesive tapes, heating the SiO.sub.2/Si wafer attached with MoS.sub.2 on adhesive tapes on a heating plate at 100° C. for 2 min to enhance the adhesion between MoS.sub.2 and the substrates;

[0065] S1.4 Tearing the adhesive tapes slowly from the silicon wafer, resulting in that the MoS.sub.2 flakes being transferred onto the substrates (FIG. 1(a)).

[0066] S2. Preparation of field-effect transistor based on MoS.sub.2

[0067] S2.1 Cutting silicon wafers plated with an array of gold electrodes at a thickness of 50 nm into rectangular chips of 0.5 cm×1 cm by using a silicon knife;

[0068] S2.2 Dropwise adding an appropriate amount of PMMA solution onto the surface of chips with electrodes, spin-coating at a low rate of 1000 r/min for 10 s firstly, then spin-coating at a high rate of 4000 r/min for 50 s; placing the chips with electrodes spin-coated with PMMA on a heating plate and heating at 120° C. for 3 min for solidification, scraping PMMA off the edge of silicon wafers with a knife in case of blocking the etching of the oxidation layer;

[0069] S2.3 Immersing the electrode chips with solidified PMMA right side up in a HF solution (the volume ratio of HF to H.sub.2O is 1:3), etching at room temperature for 2 h, taking them out with acid and alkali resistant tweezers and rinsing with deionized water for many times; covering a piece of PDMS over the electrodes, and exfoliating the electrodes off the silicon wafers slowly;

[0070] S2.4 With the use of a probe station, placing MoS.sub.2 flakes in the spot region of the microscope on a translation stage, adjusting the optical microscope while adjusting the X-Y-Z translation stage to stack the electrodes on MoS.sub.2 flakes accurately, heating at 140° C. for 3 min to make PDMS to be softened and lose viscosity, exfoliating PDMS off so that the PMMA films attached with electrodes can be transferred onto the MoS.sub.2 flakes; then heating the device at 180° C. for 3 min to enhance the adhesion between the electrodes and MoS.sub.2;

[0071] S2.5 Immersing the device attached with PMMA films in an acetone solution for 2 h to dissolve PMMA, and washing the device with isopropanol and deionized water successively;

[0072] S2.6 Placing the device in a tubular furnace, introducing a mixed atmosphere of Ar/H.sub.2 at 40 sccm, maintaining the pressure within the furnace at 10 Pa, annealing at 200° C. for 1 h so as to further remove PMMA and enhance the contact between the gold electrodes and MoS.sub.2, thus obtaining the field-effect transistor based on MoS.sub.2 (FIG. 1(B)).

[0073] S3. Deposition of metal Ti

[0074] S3.1 Taking an appropriate amount of Ti target material particles into a crucible, and sticking the wafers with MoS.sub.2 samples onto a substrate with high-temperature adhesive tapes.

[0075] S3.2 Setting the thickness of the deposited Ti film to be 2 nm and the depositing rate to be 0.2 Å/s.

[0076] S3.3 When the base pressure reached 1×10.sup.−4 Pa, heating the target materials with e-beam; when the depositing rate on the film thickness gauge was steady, opening the middle baffle, so that Ti can be deposited on the surface of the device channel at room temperature (FIG. 1(c)).

[0077] S4. Natural oxidation of Ti

[0078] A Ti/MoS.sub.2 heterojunction device will be oxidized to a TiO.sub.2/MoS.sub.2 heterojunction device quickly when exposed in air (FIG. 1(D)), which was then stored in a vacuum vessel at 2000 Pa.

Example 3

[0079] 1. Characterization of the Visible Light Detector with High-Photoresponse Based on TiO.sub.2/MoS.sub.2 Heterojunction

[0080] The surface morphology of the samples was characterized by using a Bruker Multimode 8 atomic force microscope (AFM). The microstructure of the samples was characterized by using a JEOL 2200FS transmission electron microscope (TEM) equipped with electron energy loss spectroscopy (EELS). X-ray photoelectron spectroscopy (XPS) was harvested by using a PHI 5000 VersaProbe III X-ray photoelectron spectrometer. Raman spectrum (Raman) was harvested by using a Horiba Jobin Yvon HR-800 micro-Raman system excited with 532 nm laser.

[0081] 2. Photoresponse Test

[0082] The photoresponse of the photodetector based on TiO.sub.2/MoS.sub.2 heterojunction was tested in air by using a B1500A semiconductor parameter analyzer (Agilent). LED visible lights for test mainly include visible lights at three wavelengths of 450 nm, 541 nm and 715 nm. The spot diameter was 3 mm, far greater than the length and width of the channel of the device.

[0083] 3. Results and Discussion

[0084] Firstly, few-layer MoS2 flakes were obtained by exfoliation (FIG. 2a), and upon the completion of TiO.sub.2 modification, the surface morphology of TiO.sub.2/MoS.sub.2 heterojunction was characterized by AFM. As shown in FIG. 2B, the surface of MoS.sub.2 modified with TiO.sub.2 was smooth and clean, the root-mean-square roughness was about 0.3 nm, and there were no significant island particles, indicating the layered growth of Ti on MoS.sub.2.

[0085] The high resolution transmission electron microscope (HRTEM) image shows the microstructure of TiO.sub.2/MoS.sub.2 heterojunction (FIG. 3A), indicating that MoS.sub.2 has a good crystallinity. The FFT image containing the region as shown in FIG. 3A is shown in FIG. 3B, showing the hexagonal symmetric diffraction spots of MoS.sub.2. In addition, a weak diffraction ring corresponding to a plane with a lattice spacing of 0.218 nm can be observed. FIG. 3C shows an IFFT image of the polycrystalline ring, from which we can observe the two nanosheets (NSs) in the region as shown in FIG. 3A. The sheet on the upper left is roughly a square 2-3 nm on a side, and the spacing of crystal faces in two orthogonal directions is 0.219 nm (OA) and 0.213 nm (OB) respectively. The amorphous layer between the nanosheets may be amorphous TiO.sub.2. To further determine the components of the nanosheets, an EELS analysis was conducted. As shown in FIG. 3D, significant Ti-L.sub.3, Ti-L.sub.2 and O-K peaks can be observed, which are located at 458.8 eV, 463.6 eV and 532.4 eV respectively, demonstrating the formation of TiO.sub.2 on the surface of MoS.sub.2.

[0086] The electronic state and interfacial interaction of TiO.sub.2/MoS.sub.2 were characterized by using XPS. In FIG. 4, (A) and (B) showed Mo 3d.sub.5/2, Mo 3d.sub.3/2, S 2p.sub.3/2, and S 2p.sub.1/2 doublet peaks, in which the peak positions were consistent with those in XPS spectrum of pristine MoS.sub.2. The spectrum of Ti 2p core level was shown in FIG. 4(C), the doublet peaks of Ti 2p.sub.3/2 and Ti 2p.sub.1/2 were detected at 458.78 eV and 464.50 eV, which corresponds to the binding energies of Ti.sup.4+ in TiO.sub.2. The two satellite peaks at 457.20 eV and 463.40 eV may arise from Ti.sup.3+ caused by the oxygen vacancies in TiO.sub.2. This result further confirmed that Ti on MoS.sub.2 was oxidized to TiO.sub.2, and there was no interfacial reaction between Ti and MoS.sub.2. In the spectrum of 0 is core level as shown in FIG. 4(D), the peak at 531.50 eV derives from the oxygen vacancies in TiO.sub.2.

[0087] The optical image of the field-effect transistor based on MoS.sub.2 is as shown in FIG. 5A, in which the length and width of the channel are 7 μm and 17 μm respectively, and the area of the device is about 119 μm.sup.2. The frequency difference between the two Raman characteristic peaks E.sub.2g.sup.1 and A.sub.1g is 23.3 cm.sup.−1 (FIG. 5B), indicating that the MoS.sub.2 flake has triple layers. After conducting a photoresponse test on the photodetector based on MoS.sub.2, Ti with a thickness of 2 nm was deposited on the channel, which is oxidized naturally to get the photodetector based on TiO.sub.2/MoS.sub.2 heterojunction, its 3D-model and cross-section diagram were shown in FIG. 5C and FIG. 5D.

[0088] FIG. 6A shows transfer curves of two photodetectors in dark and under different illumination power densities. With the increase of the power density of white-light, the transfer curve of the photodetector based on MoS.sub.2 moves towards the negative direction gradually, and the threshold voltage changes, indicating that the photogating effect dominates the photoresponse. Compared with the pure MoS.sub.2 device, the threshold voltage variation of the detector based on TiO.sub.2/MoS.sub.2 is more significant, as shown in the inset of FIG. 6A. It indicates that TiO.sub.2 enhances the photogating effect of MoS.sub.2, of which the enhancement mechanism will be discussed later. FIG. 6B shows the photocurrents as a function of the gate voltages for the two photodetectors. At the same power density, the photocurrent of the detector based on TiO.sub.2/MoS.sub.2 is significantly greater than that of the device based on MoS.sub.2. Compared with the photodetector based on pure MoS.sub.2, the photocurrent of the device based on TiO.sub.2/MoS.sub.2 increases continually with the increase of the gate voltage, this is due to that under light illumination, electrons in TiO.sub.2 are injected into MoS.sub.2, increasing the electron concentration in MoS.sub.2, thereby increasing the channel current. The interface charge transfer behavior will be discussed in the photoresponse mechanism later.

[0089] FIG. 6C describes the dependence of the photocurrents on the power density at different gate voltages, in which the dependence of the photocurrents on the power density is fitted by using an index-law equation. For the photodetector based on pure MoS.sub.2, under a reverse bias of −40 V, the photocurrent increases almost linearly with the increase of the power density (a≈1.03), indicating that the photo-generated carriers are mainly determined by the flux of incident photon, and the photoconductive effect plays a key role in the generation of photocurrent. However, under a forward bias of 60 V, it is observed that there is a strong sublinear relationship between the photocurrent and the power density (α=0.35), indicating that the photogating effect dominates the generation of photocurrent. Under light illumination, photo-generated holes were then captured by traps and generate a local electric field, thereby causing the transfer curve to shift towards the negative direction. A similar dependence of the photocurrent on the power density was also found in the photodetector based on TiO.sub.2/MoS.sub.2.

[0090] FIG. 7A describes the dependence of the responsivities of photodetectors based on MoS.sub.2 and TiO.sub.2/MoS.sub.2 respectively on the power density at different gate voltages. The responsivity of the photodetector based on TiO.sub.2/MoS.sub.2 is significantly higher than that of the device based on MoS.sub.2. The responsivity decreases almost monotonically with the increase of the power density, this is because the trapped charges in MoS.sub.2 have become saturated, thus confirming the dominant mechanism of photogating effects. FIG. 7C compares the responsivities of the two photodetectors at different gate voltages. At zero bias voltage, at a power density of 23.2 μW/mm.sup.2, the responsivity of the photodetector based on TiO.sub.2/MoS.sub.2 reaches up to 1099 A/W, which is about 1.7 times that of a detector based on pure MoS.sub.2 (406 A/W). The responsivity can be further enhanced by applying a higher bias voltage.

[0091] FIG. 7B describes the dependence of the specific detectivities of the two detectors on the power density at different gate voltages. At gate voltages from 0 V to 60 V, the specific detectivities of the photodetector based on TiO.sub.2/MoS.sub.2 are all significantly higher than those of the device based on MoS.sub.2. At zero-gate voltage, the maximum detectivity of the photodetector based on TiO.sub.2/MoS.sub.2 is 1.7×10.sup.13 Jones, which is about 3.2 times that of the device based on MoS.sub.2 (4.0×10.sup.12 Jones), as shown in FIG. 7D. In addition, as the gate voltage increasing from 0 V to 60 V, the detectivities of the two photodetectors are all reduced significantly, this is because that at greater gate voltages, the dark current is higher, thus reducing the specific detectivity.

[0092] As shown in FIG. 8A-FIG. 8B, an energy band alignment model of triple-layer MoS.sub.2 and TiO.sub.2 is employed to illustrate the mechanism of photoresponse. There are hole-traps at the edge of MoS.sub.2 valence bands, which may be charge traps introduced by structural defects of MoS.sub.2 such as vacancies or dislocations as well as MoS.sub.2/SiO.sub.2 interfaces. As shown in FIG. 8A, for the photodetector based on MoS.sub.2, under visible light illumination, MoS.sub.2 absorbs photon energy and excites electron-hole pairs. The photo-generated holes are then captured by traps, which prolong the life of photo-generated electrons in the conduction band, generate a local gate voltage of a certain magnitude (corresponding to the negative shift of the threshold voltage), and induce more electrons in the channel, thereby enhancing the photoresponse. The defect levels caused by the oxygen vacancies in TiO.sub.2 are located at 1.2 eV below the bottom of the conduction band, which can act as electron traps. As shown in FIG. 8B, TiO.sub.2 and MoS.sub.2 form type I energy band alignment, which helps the transport of electrons from TiO.sub.2 to MoS.sub.2. The high photoresponse of the photodetector based on TiO.sub.2/MoS.sub.2 can be explained in two ways. On the one hand, visible light can excite electrons captured in trap states of TiO.sub.2 to make them transit to the conduction band, and then transfer into the MoS.sub.2 conduction band, so that the Fermi level of MoS.sub.2 can increase slightly, thereby increasing the electron concentration in the MoS.sub.2, further increasing the current in the channel, and improving the modulation of the gate voltage on the photocurrent. On the other hand, TiO.sub.2/MoS.sub.2 interfaces will introduce a great amount of hole traps into MoS.sub.2, thus increasing the density of trap states, which may generate a higher local gate voltage under light illumination, thereby attracting more electrons into the conduction band and improving the optical gain.

[0093] In conclusion, the present disclosure employs a micromechanical exfoliation method of tearing and sticking with adhesive tapes (but not limited to this method) and a van der Waals integration method by site-specific transferring of electrodes to construct a back-gated field-effect transistor based on MoS.sub.2, then an e-beam evaporation technology is used to deposit the metal Ti at a thickness of 2 nm on the surface of the MoS.sub.2 channel, and then a photodetector based on TiO.sub.2/MoS.sub.2 heterojunction can be obtained after natural oxidation. Through the method of the present disclosure, a relatively perfect Au/MoS.sub.2 interface can be obtained, and this method can avoid the damage to the MoS.sub.2 lattice or the introduction of chemical impurities; at the same time, the strong wettability of Ti increases the contact area between TiO.sub.2 and MoS.sub.2, and the oxygen vacancies generated from the incomplete oxidation of Ti improve the responses of TiO.sub.2 to the visible light. Under visible light illumination, the photodetector based on TiO.sub.2/MoS.sub.2 exhibits a high photoresponsivity of 1099 A/W and a high specific detectivity of 1.67×10.sup.13 Jones, which are increased by 1.7 times and 3.2 times respectively compared to those of the device based on MoS.sub.2.

[0094] The present disclosure proposes a simple method for preparing the visible light detector with high-photoresponse based on TiO.sub.2/MoS.sub.2 heterojunction, which can be extended in commercial applications at a low cost and in a high efficiency. However, it should be noted that, the production rate of MoS.sub.2 in the micromechanical exfoliation process is too low, so it is difficult to prepare in large scale. Therefore, in industrial applications, chemical vapor deposition or physical vapor deposition can be used to prepare MoS.sub.2 thin films with large area. This study not only provides a good foundation for the application of transition metal dichalcogenides in photoelectric detection, but also provides a new idea for the development of novel high performance photodetectors.

[0095] Although several examples of the present disclosure have been given herein, it should be understood by the technical persons in the art that variations can be made to the examples herein without deviating from the spirit of the present disclosure. The above examples are only exemplary, rather than being considered as the limitation on the protection scope of the present disclosure.