VACUUM INTERRUPTER ASSEMBLY, SWITCHGEAR INCLUDING VACUUM INTERRUPTER ASSEMBLY, AND METHOD OF CONFIGURING VACUUM INTERRUPTER ASSEMBLY
20230290592 · 2023-09-14
Inventors
Cpc classification
H01H2033/66269
ELECTRICITY
International classification
Abstract
Described herein is a VI assembly that includes a VI having a stationary contact on a stationary contact potential, a moveable contact on a moveable contact potential, and a vapor shield. The stationary and moveable contacts define a contacting area. The moveable contact is moveable relative to the stationary contact along an axis of the VI. The VI assembly further includes at least one field coupler. The stationary contact and the vapor shield have a predetermined stationary contact-vapor shield capacitance with respect to each other. The moveable contact and the vapor shield have a predetermined moveable contact-vapor shield capacitance with respect to each other. The field coupler is configured such that it adds a field coupler capacitance to at least one of the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance to make the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance substantially equal.
Claims
1. A vacuum interrupter assembly (VI assembly), comprising: a vacuum interrupter (VI), having a stationary contact on a stationary contact potential, a moveable contact on a movable contact potential, the stationary contact and the moveable contact defining a contacting area, and having a vapor shield disposed around the contacting area, wherein the moveable contact is moveable relative to the stationary contactalong an axisof the VI; and at least one field coupler comprising an electrically conductive material, wherein the stationary contactand the vapor shieldhave a predetermined stationary contact-vapor shield capacitance with respect to each other, wherein the moveable contactand the vapor shield have a predetermined moveable contact-vapor shield capacitance with respect to each other, and wherein the field coupler is arranged and configured such that it adds a field coupler capacitance to at least one of the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance to make the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance substantially equal.
2. The VI assembly of claim 1, wherein; the field coupler is galvanically connected to the moveable contact potential, and the field coupler capacitance is configured such that it is substantially a the difference between the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance.
3. The VI assembly of claim 1, wherein; the field coupler is galvanically connected to the moveable contact potential, and the field coupler capacitance is configured such that a vapor shield-ground capacitance is less than a sum of the moveable contact-vapor shield capacitance and the field coupler capacitance.
4. The VI assembly of claim 1, wherein; the field coupler is galvanically connected to the stationary contact potential, and the field coupler capacitance is configured such that it is substantially a the difference between the moveable contact-vapor shield capacitance and the stationary contact-vapor shield capacitance.
5. The VI assembly of claim 1 comprising two field couplers, wherein: a first field coupler of the two field couplers is galvanically connected to the moveable contact potential, a second field coupler of the two field couplers is galvanically connected to the stationary contact potential, and a field coupler capacitance of the first field coupler and a field coupler capacitance of the second field coupler are configured such that a the sum of the moveable contact-vapor shield capacitance and the field coupler capacitance of the first field coupler is substantially a the sum of the stationary contact-vapor shield capacitance and the field coupler capacitance of the second field coupler.
6. The VI assembly of claim 1, comprising n field couplers galvanically connected to the moveable contact potential each contributing to and summing up to a moveable-contact field coupler capacitance where n is an integer greater than 1, and wherein the moveable-contact field coupler capacitance is configured such that it is substantially a difference between the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance.
7. The VI assembly of claim 1, comprising n field couplers galvanically connected to the stationary contact potential each contributing to and summing up to a stationary-contact field coupler capacitance where n is an integer greater than 1, and wherein the stationary-contact field coupler capacitance is configured such that it is substantially a the difference between the moveable contact-vapor shield capacitance and the stationary contact-vapor shield capacitance.
8. The VI assembly of claim 1, the VI assembly comprising n field couplers galvanically connected to the moveable contact potential each contributing to and summing up to a moveable-contact field coupler capacitance, where n is an integer greater than 1, wherein the moveable-contact field coupler capacitance is configured such that it is substantially a difference between the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance, and the VI assembly comprises m field couplers galvanically connected to the stationary contact potential each contributing to and summing up to a stationary-contact field coupler capacitance, where m is an integer greater than 1, wherein the stationary-contact field coupler capacitance is configured such that it is substantially a difference between the moveable contact-vapor shield capacitance and the stationary contact-vapor shield capacitance, and wherein the stationary-contact field coupler capacitance and the moveable-contact field coupler capacitance are configured such that the sum of the moveable-contact field coupler capacitance and the moveable contact-vapor shield capacitance is substantially the sum of the stationary-contact field coupler capacitance and the stationary contact-vapor shield capacitance.
9. The VI assembly of claim 1, comprising a floating field coupler on a floating potential, wherein the floating potential exists on a connection point of a series connection of two partial capacitances from the floating field coupler to one of the contacts, and wherein the two partial capacitances are configured such that a sum of the stationary contact-vapor shield capacitance and a term in which a the product of a first partial capacitance and an additional coupling capacitance that is present between the floating potential and a ground potential is divided by a the sum of the first partial capacitance and a second partial capacitance and the additional coupling capacitance is substantially equal a sum of the moving contact-vapor shield capacitance and a term in which a the product of the first partial capacitance and the second partial capacitance is divided by a the sum of the first partial capacitance and the second partial capacitance and the additional coupling capacitance.
10. The VI assembly of claim 1, wherein the field coupler capacitance is configured by approximation via a concentric cylinder formula of a capacitance as in the following equation
11. The VI assembly of claim 1 wherein each field coupler is galvanically connected to at most one of the stationary contact potential or the moveable contact potential.
12. The VI assembly of claim 8, wherein each field coupler is galvanically connected to at most one of the stationary contact potential or the moveable contact potential.
13. The VI assembly of claim 1, wherein each of the vapor shield, the stationary contact and the moveable contact have metal surfaces exposed towards the contacting area.
14. The VI assembly of claim 1, wherein the field coupler is substantially entirely made of the electrically conductive material.
15. The VI assembly of claim 1, wherein the field coupler comprises an elongated part extending substantially in an axial direction, and a plate-like part in a vicinity of the contacting area, and wherein, in a projection onto a plane orthogonal to a radial direction, the plate-like part has a substantially round shape.
16. The VI assembly of claim 3, wherein the field coupler comprises an elongated part extending substantially in an axial direction, and a plate-like part in a vicinity of the contacting area, and wherein, in a projection onto a plane orthogonal to a radial direction, the plate-like part has a substantially round shape.
17. The VI assembly of claim 1, wherein, when the VI has a VI length along a symmetry axis of the VI, the field coupler has a length in an axial direction that is greater than about 0.2 times the VI length and smaller than about 0.8 times the VI length, and a surface of the field coupler extends about an extension angle between 10 degrees and 180 degrees in a circumferential direction of the VI.
18. The VI assembly of claim 3, wherein, when the VI has a VI length along a symmetry axis of the VI, the field coupler has a length in an axial direction that is greater than about 0.2 times the VI length and smaller than about 0.8 times the VI length, and a surface of the field coupler extends about an extension angle between 10 degrees and 180 degrees in a circumferential direction of the VI.
19. A switchgear, comprising at least one switchgear element and comprising the vacuum interrupter assembly according to claim 1, wherein at least one switchgear element contributes to at least one of the predetermined stationary contact-vapor shield capacitance and the predetermined moveable contact-vapor shield capacitance.
20. A method of configuring a vacuum interrupter assembly, the vacuum interrupter assembly comprising a vacuum interrupter (VI), having a stationary contact on a stationary contact potential, a moveable contact on a moveable contact potential, the stationary contact and the moveable contact defining a contacting area, and the VI comprising a vapor shield disposed around the contacting area, wherein the moveable contact is moveable relative to the stationary contact along an axis of the VI, wherein the stationary contact and the vapor shield have a predetermined stationary contact-vapor shield capacitance with respect to each other, wherein the moveable contact and the vapor shield have a predetermined moveable contact-vapor shield capacitance with respect to each other, and wherein the method comprises: determining, by simulation, a configuration and arrangement of a field coupler comprising an electrically conductive material such that the field coupler adds a field coupler capacitance to at least one of the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance to make the stationary contact-vapor shield capacitance and the moveable contact-vapor shield capacitance substantially equal.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0026] The techniques disclosed herein will be even more apparent in the following description of embodiments by referring to the accompanying drawings.
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DETAILED DESCRIPTION
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[0045] In the state shown in
[0046] The vapor shield 250 is on a floating electrical potential. In particular, in the type of VI 200 described herein, the vapor shield 250 is not galvanically connected with any one of the stationary or moveable contacts 210, 220, or ground.
[0047] Typically, the VI 200 is installed in a compact medium or high voltage switchgear. Medium or high voltage, as used herein, typically includes a rating in a range of about 10 kV to about 200 kV. In a conventional setting, the configuration and arrangement of elements of the switchgear, such as a busbar, neighboring VIs for other phases etc., and/or the configuration and arrangement of elements of the VI 200 itself, such as the enclosure 260 and an internally asymmetric configuration of the VI 200 etc., may lead to a distortion of an electric field that is present in and around the contacting area 230 both during a period when the VI 200 is conducting (i.e., closed) and when the VI 200 is opened. Such one or more elements of the switchgear (i.e., a switchgear element or multiple switchgear elements), thus have an influence on the various capacitances of the VI 200, including the capacitances of the contacts 210, 220 with respect to the vapor shield 250, as discussed further below. In other words: The one or more switchgear elements contribute to the respective capacitances of the VI 200. The one or more switchgear elements having such an influence include e.g., a constituent element, a constituent component, a component part, a section, etc., of the switchgear, excluding the VI 200 itself or parts of the VI 200 itself. Such a distortion of the electric field might compromise the dielectric performance of the VI 200. As mentioned above, the dielectric performance of the VI 200 may depend on the actual switchgear that the VI 200 is installed in. For example, the VI 200 is put into close proximity to other live parts of the switchgear, and grounded components such as a grounded tank. As a result, the electric field at the VI 200 contacts 210, 220 is enhanced, and thus, the VI dielectric performance is degraded.
[0048] The dielectric performance of the VI 200 depends to a great extent on the capacitances of the VI 200, probably influenced by the element(s) of the switchgear. It was found that among the capacitances, there are two capacitances that are favorably made substantially equal, namely a capacitance C.sub.F-S between the stationary contact (210) and the vapor shield (250), and a capacitance C.sub.M-S between the moveable contact (220) and the vapor shield. The capacitance C.sub.F-S is herein also referred to as the stationary contact-vapor shield capacitance. The capacitance C.sub.M-S is herein also referred to as the moveable contact-vapor shield capacitance. Note that the capacitances C.sub.F-S, C.sub.M-S are parasitic capacitances that influence, e.g., distort, the electric field in the contacting area 230, and that the capacitances C.sub.F-.sub.S, C.sub.M-S are predetermined for a given electrical environment of the VI 200, e.g., in a given switchgear environment. The capacitances C.sub.F-S, C.sub.M-S may be obtained for the given electrical environment of the VI 200, for example, by known methods, among others by known methods of calculation, measuring, simulation, or any combination thereof.
[0049] The VI assemblies 100 according to embodiments as described herein contribute to alleviating the distortion of the electric field, thus helping to achieve a favorable dielectric performance or behavior of the VI 200 in the actual switchgear that it is installed in. To that end, one or more field couplers 10 are installed. The field coupler(s) 10 is/are arranged such that at least a part thereof is at an outer circumferential surface of the housing 260 in a field coupling region F such that it capacitively couples with the vapor shield 250. The field coupler 10 adds a field coupler capacitance C.sub.coupler to at least one of the stationary contact-vapor shield capacitance C.sub.F-S and the moveable contact-vapor shield capacitance C.sub.M-S. The field coupler 10 is configured and arranged such that it makes the stationary contact-vapor shield capacitance C.sub.F-S and the moveable contact-vapor shield capacitance C.sub.M-S substantially equal. For example, a deviation of at most 10% or at most 5% between the stationary contact-vapor shield capacitance C.sub.F-S and the moveable contact-vapor shield capacitance C.sub.M-S is achieved by adding the field coupler capacitance C.sub.coupler via the field coupler 10.
[0050] The field coupler capacitance C.sub.coupler may be obtained by a known method, such as methods of calculation, measuring, simulation, or any combination thereof. For example, when the field coupler capacitance C.sub.coupler is obtained, a shape, a material, a mounting position, a mounting orientation, or a combination thereof may be established by multiple iterations of electrical field simulation. Conditions for any such simulation may include to optimize the field coupler capacitance C.sub.coupler that the shape provides, minimize the breakdown probability between neighboring field couplers 10, or a combination thereof.
[0051] For example, the field coupler capacitance C.sub.coupler is obtained for a state in which the contacts 210, 220 of the VI 200 are in an open position. However, the field coupler capacitance C.sub.coupler may also be obtained for a state in which the contacts 210, 220 of the VI 200 are in an intermediate position.
[0052] The field coupler 10 thus interacts capacitively, through the housing 260, with the vapor shield 250. The field coupler 10 may help to correct a field asymmetry resulting from e.g., an internal VI 200 geometry and/or imposed by other switchgear elements, as discussed above. The field coupler 10 may further help to reduce the capacitive coupling between the VI 200 and switchgear elements, particularly a switchgear tank. Provision of the field coupler 10 may also have the effect to reduce the capacitive coupling of the VI 200 components to the ground potential.
[0053] In the following, specific embodiments depicted in
[0054] In the embodiment shown in
[0055] In the embodiment shown in
[0056] In the embodiment shown in
[0057] In the embodiments shown in
[0058] The equivalent circuit shown in
[0059] In the embodiment shown in
[0060] In the embodiment shown in
[0061] In the equivalent circuit shown in
[0062] In the embodiments discussed, a vapor shield-ground capacitance C.sub.S-G, i.e., the capacitance that is established between the vapor shield 250 and a ground potential, is neglected. However, in the embodiments, consideration may be made as to the vapor shield-ground capacitance C.sub.S-G. For example, when the field coupler is galvanically connected to the moveable contact potential, the field coupler capacitance C.sub.coupler may be configured such that the vapor shield-ground capacitance C.sub.S-G is less than a sum of the moveable contact-vapor shield capacitance C.sub.M-S and the field coupler capacitance C.sub.coupler.
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Here, R.sub.1 is the radial distance from the axis to an outer circumferential surface of the vapor shield, R.sub.2 is the radial distance from the axis to a surface of the field coupler opposing the outer circumferential surface of the vapor shield, α is the angle — in radian — of extension of the surface of the field coupler in a circumferential direction, l is the length of the field coupler in the axial direction, and ε is the permittivity in the space between the field coupler and the vapor shield. Thereby, an approximation of the capacitance C.sub.coupler imposed by a field coupler 10 may be determined by way of calculation.
[0064] A dielectric simulation was performed for an exemplary standalone VI 200 and the same type of VI 200 installed in a switchgear. While in the standalone VI 200 the maximum stress on the contacts was still on a permissible level for the application of a certain electrical field strength E.sub.1, with a vapor shield potential having a certain value Vsi in a range between 50 kV and 100 kV, upon installation of the VI 200 in the switchgear, the vapor shield potential shifted to approximately 0.94 times Vsi due to internal field distortion and capacitive coupling to a tank of the switchgear. Thereby, the stress acting on the contacts increased to approximately 1.03 times E.sub.1, which was outside the permissible range. Upon installation of a field coupler 10 as described herein, the vapor shield potential was brought back to approximately Vsi, and the stress on the contacts was lowered to approximately 0.99 times E.sub.1. Thereby, the risk of a dielectric breakdown can be significantly lowered.