METHOD AND APPARATUS FOR MEASURING TOPOLOGICAL CHARGE OF PARTIALLY COHERENT FRACTIONAL VORTEX BEAM

Abstract

A to-be-measured partially coherent fractional vortex beam passes through a scattering object, an error between measurable information and to-be-measured information is minimized by using an optimization algorithm, and a main electric field mode and a weight of a to-be-measured fractional vortex beam are reconstructed by using a multimode stacked diffraction algorithm. A cross-spectral density function of the partially coherent fractional vortex beam is calculated, a cross-spectral density of a partially coherent fractional vortex optical field is reconstructed, and complete information including light intensity, a light intensity association, an electric field association, a phase, and the like of the partially coherent fractional vortex optical field is obtained. After the complete information of the partially coherent fractional vortex optical field is obtained, reverse transmission calculation is performed to obtain a source field vortex phase distribution, thereby implementing accurate topological charge measurement of the fractional vortex beam under low coherence conditions.

Claims

1. A method for measuring a topological charge of a partially coherent fractional vortex beam, comprising: irradiating a to-be-measured fractional vortex beam to a scattering sample, performing a horizontal and vertical movement overlap scan, and acquiring diffraction light intensity by using a detector placed in a diffraction area; calculating a to-be-measured electric field and performing iterative update by using a multimode stacked diffraction algorithm to minimize an error between the diffraction light intensity acquired by the detector and diffraction light intensity calculated according to the to-be-measured electric field, to obtain a target to-be-measured electric field of the to-be-measured fractional vortex beam; reconstructing a cross-spectral density function of the to-be-measured fractional vortex beam according to the target to-be-measured electric field, and obtaining optical field information of the to-be-measured fractional vortex beam; and performing reverse transmission calculation according to the cross-spectral density function and the optical field information of the to-be-measured fractional vortex beam to obtain a source field vortex phase distribution diagram, and observing a magnitude and a sign of a topological charge of the to-be-measured fractional vortex beam according to the source field vortex phase distribution diagram.

2. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 1, wherein the diffraction area is a Fresnel diffraction area or a Fraunhofer diffraction area.

3. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 1, wherein an overlap rate of the overlap scan ranges from 60% to 70%.

4. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 1, wherein before the calculating a to-be-measured electric field and performing iterative update by using a multimode stacked diffraction algorithm to minimize an error between the diffraction light intensity acquired by the detector and diffraction light intensity calculated according to the to-be-measured electric field, to obtain a target to-be-measured electric field of the to-be-measured fractional vortex beam, the method comprises: decomposing a cross-spectral density W (r.sub.1, r.sub.2) of the to-be-measured fractional vortex beam into a plurality of electric fields ${\displaystyle {.Math.}_i^{N_R}{O}_{\left(r1\right)}^{\ast i}{O}_{\left(r2\right)}^i}$ (i = 1, 2, 3, ..., and n) by using a random modulus decomposition method, wherein ${\text{O}}_{\left(r1\right)}^{\text{i}}\text{and}{O}_{\left(r2\right)}^i$ are i .sup.th electric fields after the to-be-measured fractional vortex beam is decomposed, N.sub.R is a positive integer selected according to a different degree of coherence, and r1 and r2 are spatial coordinates.

5. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 4, wherein the calculating a to-be-measured electric field and performing iterative update by using a multimode stacked diffraction algorithm to minimize an error between the diffraction light intensity acquired by the detector and diffraction light intensity currently calculated according to the to-be-measured electric field, to obtain a target to-be-measured electric field of the to-be-measured fractional vortex beam comprises: step 1: assuming that the cross-spectral density of the to-be-measured fractional vortex beam irradiated to the scattering sample is $W\left(r_1,r_2\right)={\displaystyle {.Math.}_i^{N_R}{O}_{\left(r1\right)}^{\ast i}{O}_{\left(r2\right)}^i},$ and assuming that a transmittance function of a j .sup.th time of irradiation to the scattering sample is P(r - R.sub.j), wherein r represents a coordinate, R.sub.j represents a relative displacement between the to-be-measured fractional vortex beam and the scattering sample, and j represents the j.sup.th time of irradiation to a sample area; step 2: calculating that each outgoing field after the to-be-measured fractional vortex beam passes through the scattering sample is ${\phi }_j^i\left(r\right)=O_{\left(r\right)}^i\ast \text{P}\left(r-R_j\right);$ step 3: updating a diffraction field by using the diffraction light intensity acquired by the detector, and updating the outgoing field to ${{\phi }^{\prime }}_j^i\left(r\right)$ according to the diffraction field; step 4: updating each to-be-measured electric field $O_{\left(r\right)}^i:$ ${O^{\prime }}_j^i\left(r\right)=O_j^i\left(r\right)+\alpha \frac{P_j^{\ast }\left(r-{\text{R}}_{\text{j}}\right)}{{\left|P_j^{*}\left(r-{\text{R}}_{\text{j}}\right)\right|}_{max}^2}\left({{\phi }^{\prime }}_j^i\left(r\right)-{\phi }_j^i\left(r\right)\right),\text{and}$ ${P^{\prime }}_j\left(r-{\text{R}}_{\text{j}}\right)=P_j\left(r-{\text{R}}_{\text{j}}\right)+\beta \frac{O_j^{\ast i}\left(r\right)}{{\left|O_j^{*i}\left(r\right)\right|}_{max}^2}\left({{\phi }^{\prime }}_j^i\left(r\right)-{\phi }_j^i\left(r\right)\right),$ wherein α and β are constants, ${{\phi }^{\prime }}_j^i\left(r\right)$ represents an updated i .sup.th outgoing light electric field corresponding to a j.sup.th scan position, ${\phi }_j^i\left(r\right)$ is an i .sup.th outgoing optical field corresponding to the j.sup.th scan position, ${O^{\prime }}_j^i\left(r\right)$ is an updated i .sup.th incident light electric field irradiated to the scattering sample corresponding to the j.sup.th scan position, $O_j^i\left(r\right)$ is an i .sup.th incident light electric field irradiated to the scattering sample corresponding to the j.sup.th scan position, P′.sub.j(r - R.sub.j) is an updated transmittance function of the j.sup.th time of irradiation to the scattering sample, and * represents taking conjugate; and step 5: determining, by using a gradient descent algorithm, whether the error between the diffraction light intensity acquired by the detector and the currently calculated diffraction light intensity reaches a preset minimization threshold, and if the error reaches the minimization threshold, obtaining the target to-be-measured electric field, or otherwise repeating steps 2 to 5 until the error reaches the minimization threshold.

6. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 5, wherein the reconstructing a cross-spectral density function of the to-be-measured fractional vortex beam according to the target to-be-measured electric field comprises: making the cross-spectral density function $W\left({\text{r}}_1,{\text{r}}_2\right)={\displaystyle {.Math.}_i^{N_R}{\alpha }_i{O}_{\left(r1\right)}^{\ast i}{O}_{\left(r2\right)}^i},$ wherein α .sub.i = ⅟N.sub.R is a spectral weight; and for a partially coherent beam, introducing a vortex phase, wherein the cross-spectral density may be represented as W.sub.0(r.sub.1, r.sub.2) = W(r.sub.1, r.sub.2)exp(-ilθ.sub.1)exp(ilθ.sub.2), wherein θ is an angular coordinate, l is the topological charge, when l is an integer, the cross-spectral density is represented as a partially coherent integer vortex beam, and when l is a fraction, the cross-spectral density is represented as a partially coherent fractional vortex beam.

7. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 6, wherein the obtaining optical field information of the to-be-measured fractional vortex beam comprises: letting r1 = r2, and calculating light intensity I; and letting r2 = 0, and calculating a degree of coherence .Math..

8. The method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 1, wherein the performing reverse transmission calculation according to the optical field information of the to-be-measured fractional vortex beam to obtain a source field vortex phase distribution diagram, and observing a magnitude and a sign of a topological charge of the to-be-measured fractional vortex beam according to the source field vortex phase distribution diagram comprises: performing W/|W| on the cross-spectral density function W to calculate a cross-spectral density phase distribution function: obtaining the source field vortex phase distribution diagram according to the cross-spectral density phase distribution function; and observing a phase jump of a source plane or performing loop integration on a phase according to the source field vortex phase distribution diagram to obtain the topological charge of the fractional vortex beam.

9. An apparatus for measuring a topological charge of a partially coherent fractional vortex beam, comprising: a light source, configured to emit a partially coherent beam; a spatial light modulator, configured to generate a partially coherent fractional vortex beam, that is, a to-be-measured fractional vortex beam; a displacement platform, configured to: move a scattering sample, and perform a horizontal and vertical movement overlap scan; a detector, placed in diffraction area, and configured to acquire diffraction light intensity; and a computer, configured to: calculate a to-be-measured electric field and perform iterative update by using a multimode stacked diffraction algorithm to minimize an error between the diffraction light intensity acquired by the detector and diffraction light intensity calculated according to the to-be-measured electric field, to obtain a target to-be-measured electric field of the to-be-measured fractional vortex beam; reconstruct a cross-spectral density function of the to-be-measured fractional vortex beam according to the target to-be-measured electric field, and obtain optical field information of the to-be-measured fractional vortex beam; and perform reverse transmission calculation according to the cross-spectral density function and the optical field information of the to-be-measured fractional vortex beam to obtain a source field vortex phase distribution diagram, and observe a magnitude and a sign of a topological charge of the to-be-measured fractional vortex beam according to the source field vortex phase distribution diagram.

10. A computer-readable storage medium, the computer-readable storage medium storing a computer program, the computer program being executed by a processor to implement the steps of the method for measuring a topological charge of a partially coherent fractional vortex beam according to claim 4.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0049] To make the content of the present invention clearer and more comprehensible, the present invention is further described in detail below according to specific embodiments of the present invention and the accompanying draws. Where:

[0050] FIG. 1 is a flowchart of implementing measurement of a topological charge of a partially coherent fractional vortex beam according to the present invention;

[0051] FIG. 2 is a schematic diagram of acquiring diffraction light intensity;

[0052] FIG. 3 is a schematic diagram of an overlap scan;

[0053] FIG. 4 is an experimental light path diagram of generate and measuring a partially coherent fractional vortex beam; and

[0054] FIG. 5 is a schematic diagram of experimental results of a cross-spectral density distribution of an (a-b) focal field of a partially coherent fractional vortex beam when TC = 2.5 and a cross-spectral density distribution of a source field obtained through (c-d) retransmission.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0055] The core of the present invention is to provide to a method and an apparatus for measuring a topological charge of a partially coherent fractional vortex beam and a computer storage medium, so that precision is high, and a fractional topological charge of a partially coherent fractional vortex beam is quantitatively solved and characterized.

[0056] To enable a person skilled in the art to better understand the solutions of the present invention, the present invention is further described below in detail with reference to the accompanying drawings and specific implementations. Apparently, the described embodiments are merely some rather than all of the embodiments of the present invention. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present invention without creative efforts fall within the protection scope of the present invention.

[0057] Refer to FIG. 1. FIG. 1 is a flowchart of implementing measurement of a topological charge of a partially coherent fractional vortex beam according to the present invention. Specific operation steps are as follows:

[0058] S101: Irradiate a to-be-measured fractional vortex beam to a scattering sample, perform a horizontal and vertical movement overlap scan, and acquire diffraction light intensity by using a detector placed in a diffraction area.

[0059] As shown in FIG. 2, in an optical imaging method based on a coherent diffraction imaging concept, a to-be-measured fractional vortex beam is irradiated to a strong scattering sample. The to-be-measured fractional vortex beam and the sample move along x and y to perform an overlap scan (as shown in FIG. 3). An overlap rate of the overlap scan ranges from 60% to 70%. A CCD is placed at a Fourier plane or a far field of the sample to acquire diffraction light intensity (the diffraction area is a Fresnel diffraction area or a Fraunhofer diffraction area), to acquire a series of light intensity. Through a Fourier transform constraint of temporal space and spectrum space, relative phases between adjacent areas may be calculated from information redundancy generated from overlapping of the adjacent areas, to reconstruct an image, thereby implementing high-resolution imaging of a to-be-tested light source and a to-be-measured object. Because no lens is used, the theoretical resolution of the method may be higher than that of a conventional optical system. This solution solves a convergence problem in a reconstruction algorithm and implements both a large field of view and high resolution.

[0060] S102: Calculate a to-be-measured electric field and perform iterative update by using a multimode stacked diffraction algorithm to minimize an error between the diffraction light intensity acquired by the detector and diffraction light intensity calculated according to the to-be-measured electric field, to obtain a target to-be-measured electric field of the to-be-measured fractional vortex beam.

[0061] S103: Reconstruct a cross-spectral density function of the to-be-measured fractional vortex beam according to the target to-be-measured electric field, and obtain optical field information of the to-be-measured fractional vortex beam.

[0062] S104: Perform reverse transmission calculation according to the cross-spectral density function and the optical field information of the to-be-measured fractional vortex beam to obtain a source field vortex phase distribution diagram, and observe a magnitude and a sign of a topological charge of the to-be-measured fractional vortex beam according to the source field vortex phase distribution diagram.

[0063] In a case that an electric field is reconstructed, reverse transmission calculation and reverse focusing calculation may be calculated to restore a vortex phase at a source plane, thereby implementing calculation of a topological charge. The calculation of a topological charge may be given based on a multiple relationship between a phase jump and 2π. This relationship satisfies the original definition of a fractional vortex beam. Based on the high resolution characteristic of the stacked coherent diffraction imaging algorithm, high-resolution and high-precision measurement of a fractional topological charge in a case of a weak light source signal and a turbulence in a transmission medium can be implemented.

[0064] Based on the foregoing embodiments, step S102 is further described in detail. Details are as follows:

[0065] A partially coherent optical field is an electric field with random fluctuations, which may be understood as a statistical average .Math.E*(r.sub.1)E(r.sub.2).Math. of an instantaneous electric field, is extended by using intrinsic modes ϕ.sub.mn that are orthogonal to each other, and may be represented as:

[00012]${\displaystyle {.Math.}_{m=0}^{N_C}{\displaystyle {.Math.}_{n=0}^{N_C}{\lambda }_{mn}{\varphi }_{mn}^{\ast }}}\left({\text{r}}_1\right){\varphi }_{mn}\left({\text{r}}_2\right),$

where λ.sub.mn represents a weight of a mode. For classic Gaussian Schell model (GSM) partially coherent light, a cross-spectral density function may be decomposed into non-coherence superposition of a Hermitian-Gaussian (HG) mode, that is:

[00013]$\begin{array}{l}{\varphi }_{mn}\left(\text{r}\right)={\left(\frac{2c}{\pi }\right)}^{1/2}\frac{1}{\sqrt{2^{m+n}m!n!}}{H}_m\left(x\sqrt{2c}\right)H_n\left(y\sqrt{2c}\right)\cdot \\ \exp \left[-c\left(x^2+y^2\right)\right],\end{array}$

where H.sub.m and H.sub.n respectively represent an m.sup.th-order Hermitian polynomial and an n.sup.th-order Hermitian polynomial, and N.sub.c represents a quantity of modes. This mode decomposition and representation method is called coherent mode decomposition. Another decomposition manner is a random mode decomposition method. In this method, a partially coherent beam is represented by a non-coherence superposition of spatially random complex fields:

[00014]${\displaystyle {.Math.}_{n=1}^{N_R}{\alpha }_n{E}_n^{\ast }\left({\text{r}}_1\right)E_n\left({\text{r}}_2\right)},$

where α.sub.n = 1/N.sub.R represents a mode weight, and E.sub.n(r) represents one of the random models.

[0066] The foregoing coherent mode decomposition and random mode decomposition principles have been widely applied to experimental generation of partially coherent light, and similarly may be applied to measurement of a partially coherent optical field.

[0067] A cross-spectral density W(r.sub.1,r.sub.2) of the to-be-measured beam is decomposed into a plurality of electric fields

[00015]${\displaystyle {.Math.}_i^{N_R}{O}_{\left(r1\right)}^{\ast i}{O}_{\left(r2\right)}^i}$

(i = 1, 2, 3, ..., and n) by using a decomposition method, where

[00016]${\text{O}}_{\left(r1\right)}^{\text{i}}\text{and}{O}_{\left(r2\right)}^i$

are i.sup.th electric fields after the to-be-measured beam is decomposed, N.sub.R is a positive integer selected according to a different degree of coherence (N.sub.R is theoretically infinitely great, and takes a finite value in an actual process. N.sub.R is greater than 2000 when coherence is low, and an error can be neglected. When a degree of coherence/beam waist width ratio is between 1 and 0.1, high accuracy can be ensured by making NR between 4×4 and 10×10), and r1 and r2 are spatial coordinates.

[0068] Step a: Assume that the cross-spectral density of the to-be-measured beam irradiated to the scattering sample is

[00017]$W\left(r_1,r_2\right)={\displaystyle {.Math.}_i^{N_R}{O}_{\left(r1\right)}^{\ast i}{O}_{\left(r2\right)}^i},$

and assume that a transmittance function of a j.sup.th time of irradiation to the scattering sample is P(r - R.sub.j), where r represents a coordinate, R.sub.j represents a relative displacement between the to-be-measured beam and the scattering sample, and j represents the j.sup.th time of irradiation to a sample area.

[0069] Step b: Calculate that each outgoing field after the to-be-measured beam passes through the scattering sample is

[00018]${\phi }_j^i\left(r\right)=O_{\left(r\right)}^i\ast \text{P}\left(r-R_j\right).$

[0070] Step c: Update a diffraction field and an outgoing field by using measured light intensity. The diffraction field is updated to

[00019]${{\text{Ψ}}^{\prime }}_j^i\left(k\right)=\frac{{\text{I}}_j\left(k\right)}{\sqrt{{\displaystyle {.Math.}_{m=1}^M\left({\left|{\text{Ψ}}_j\left(k\right)\right|}^2\right)}}}{\text{Ψ}}_j^i\left(k\right),$

where

[00020]${\text{Ψ}}_j^i\left(k\right)=FFT\left\{{\phi }_{\left(r\right)}^i\right\},$

corresponding to a diffraction field of an i.sup.th mode, I.sub.j(k) is diffraction light intensity of the j.sup.th time of irradiation acquired by the detector, and is light intensity contributed by all electric field modes,

[00021]$\sqrt{{\displaystyle {.Math.}_{m=1}^M\left({\left|{\text{Ψ}}_j\left(k\right)\right|}^2\right)}}$

is an amplitude of the outgoing field obtained through iterative calculation, and M is a total quantity of modes. An outgoing wave

[00022]${{\phi }^{\prime }}_j^i\left(r\right)=\text{I}FFT\left({{\text{Ψ}}^{\prime }}_j^i\left(k\right)\right)$

of the i.sup.th mode is updated by using inverse Fourier transform. FFT represents Fourier transform, and IFFT represents inverse Fourier transform. Step d: Update each to-be-measured electric field

[00023]$O_{\left(r\right)}^i:$

[00024]${O^{\prime }}^i{}_j\left(r\right)=O_j^i\left(r\right)+\alpha \frac{P_j^{\ast }\left(r-{\text{R}}_{\text{j}}\right)}{{\left|P_j^{\ast }\left(r-{\text{R}}_{\text{j}}\right)\right|}_{max}^2}\left({{\phi }^{\prime }}_j^i\left(r\right)-{\phi }_j^i\left(r\right)\right),\text{and}$

[00025]${P^{\prime }}_j\left(r-{\text{R}}_{\text{j}}\right)=P_j\left(r-{\text{R}}_{\text{j}}\right)+\beta \frac{o_j^{\ast i}\left(r\right)}{{\left|o_j^{\ast i}\left(r\right)\right|}_{max}^2}\left({{\phi }^{\prime }}_j^i\left(r\right)-{\phi }_j^i\left(r\right)\right),$

where α and β are constants,

[00026]${{\phi }^{\prime }}_j^i\left(r\right)$

represents an updated i.sup.th outgoing light electric field corresponding to a j.sup.th scan position,

[00027]${\phi }_j^i\left(r\right)$

is an i.sup.th outgoing optical field corresponding to the j.sup.th scan position, O′.sup.ij(r) is an updated i.sup.th incident light electric field irradiated to the scattering sample corresponding to the j.sup.th scan position, O.sup.ij(r) is an i.sup.th incident light electric field irradiated to the scattering sample corresponding to the j.sup.th scan position, P′.sub.j(r - R.sub.j) is an updated transmittance function of the j.sup.th time of irradiation to the scattering sample, and * represents taking conjugate.

[0071] Step e: Determine, by using a gradient descent algorithm, whether the error between the diffraction light intensity acquired by the detector and the currently calculated diffraction light intensity reaches a preset minimization threshold, and if the error reaches the minimization threshold, obtain the target to-be-measured electric field, or otherwise repeat steps b to e until the error reaches the minimization threshold. If the beam is fully coherent light, a difference from partially coherent light only lies in that a plurality of electric fields need to be measured for partially coherent light. Therefore, in the present invention, a fully coherent fractional vortex beam can also be measured.

[0072] In the present invention, an iterative algorithm in mixed mode stacked coherent diffraction imaging is used to implement the reconstruction of an electric field mode: A light source irradiates a sample, a diffraction pattern in a Fresnel diffraction area is recorded, and the diffraction pattern and an object plane satisfy a Fourier transform relationship. A camera in a diffraction plane can only record an amplitude of an optical field, and phase information is missing. To solve a phase, information of a to-be-measured plane is reconstructed. In the iterative algorithm of coherent diffraction imaging, an algorithm such as a gradient descent is used minimize an error between photographing light intensity and calculated light intensity. To resolve iterative convergence and unique solution problems, redundant overlap scans are used in stacked coherent diffraction imaging technologies, and diffraction information constraining each other greatly improves the convergence speed and accuracy of iteration. Mixed mode synchronous iteration is used in a stacked coherent diffraction imaging iteration algorithm. The “mixed mode” refers to an electric field mode of partially coherent light. The present invention mainly studies reconstruction results of a light source, and extracts information carried in the light source.

[0073] Based on the foregoing embodiments, steps S103 and S104 are further described in detail in this embodiment. Details are as follows: [0074] making cross-spectral density function W(r.sub.1, r.sub.2) = .Math.E*(r.sub.1)E(r.sub.2).Math. = where α.sub.i = 1/N.sub.R is a spectral weight; and [0075] for a partially coherent beam, introducing a vortex phase, where the cross-spectral density may be represented as W.sub.0(r.sub.1, r.sub.2) = W(r.sub.1, r.sub.2)exp(-ilθ.sub.1)exp(ilθ.sub.2), where θ is an angular coordinate, l is the topological charge, when l is an integer, the cross-spectral density is represented as a partially coherent integer-order vortex phase, and when l is a fraction, the cross-spectral density is represented as a partially coherent fractional vortex phase; [0076] letting r1 = r2, and calculating light intensity I; and [0077] letting r2 = 0, and calculating a degree of coherence .Math. ; [0078] performing W/ |W| on the cross-spectral density function W to calculate a cross-spectral density phase distribution function: [0079] obtaining the source field vortex phase distribution diagram according to the cross-spectral density phase distribution function; and [0080] observing a phase jump of a source plane or performing loop integration on a phase through reverse transmission or reverse focusing of an optical field to a source plane to obtain the topological charge of the fractional vortex beam.

[0081] If a partially coherent vortex beam is focused, according to the principle of Fourier transform, a relationship between a cross-spectral density W.sub.0(r.sub.1,r.sub.2) of a source field and a cross-spectral density W.sub.f(ρ.sub.1, ρ.sub.0) of a focal field may be derived, and may be briefly described as:

[00029]$F^{-1}\left\{W_f\left({\rho }_1,{\rho }_0\right)\right\}\propto W_0\left(r_1,r_2\right).$

[0082] Similarly, a cross-spectral density quantitative association between an acceptance plane at a random transmission distance and the source plane may also be derived.

[0083] The partially coherent beam may be considered as non-coherence superposition of a fully coherent beam. A to-be-measured partially coherent beam passes through a scattering object. An error between measurable information and to-be-measured information is minimized by using a gradient descent algorithm. A main electric field mode and a weight of a to-be-measured fractional vortex beam are reconstructed. Based on a mathematical relationship between an electric field mode and a cross-spectral density, a cross-spectral density function of the partially coherent beam is calculated, a cross-spectral density of partially coherent optical field is reconstructed, and complete information including light intensity, a light intensity association, an electric field association, a phase, and the like of the partially coherent optical field is obtained. After the complete information of the partially coherent optical field is obtained, reverse transmission calculation is performed to obtain a source field vortex phase distribution, thereby implementing accurate topological charge measurement of the fractional vortex beam under low coherence conditions. Therefore, the present invention may be used for the measurement of a low coherent fractional vortex optical field. Accurate measurement and reverse transmission calculation in a partially coherent light electric field mode are implemented by using the solution of reconstructing source field information with a diffraction pattern and in combination with the iterative algorithm in mixed mode stacked coherent diffraction imaging. This technique also solves the key scientific problem that it is difficult to separate electric field modes in space, and partially coherent optical mode multiplexing becomes as a new usable dimension of space division multiplexing, which greatly increases the capacity of optical communication and has important applications in optical communication, optical encryption and decryption, and the like.

[0084] A specific embodiment of the present invention further provides a computer-readable storage medium, the computer-readable storage medium storing a computer program, the computer program being executed by a processor to implement the foregoing steps S102 to S104.

[0085] Embodiments of the present invention further provide an apparatus for measuring a topological charge of a partially coherent fractional vortex beam, including: [0086] a light source, configured to emit a partially coherent beam; [0087] a spatial light modulator, configured to generate a partially coherent fractional vortex beam, that is, a to-be-measured fractional vortex beam; [0088] a displacement platform, configured to: move a scattering sample, and perform a horizontal and vertical movement overlap scan; [0089] a detector, placed in diffraction area, and configured to acquire diffraction light intensity; and [0090] a computer, configured to: calculate a to-be-measured electric field and perform iterative update by using a multimode stacked diffraction algorithm to minimize an error between the diffraction light intensity acquired by the detector and diffraction light intensity calculated according to the to-be-measured electric field, to obtain a target to-be-measured electric field of the to-be-measured fractional vortex beam; [0091] reconstruct a cross-spectral density function of the to-be-measured fractional vortex beam according to the target to-be-measured electric field, and obtain optical field information of the to-be-measured fractional vortex beam; and perform reverse transmission calculation according to the cross-spectral density function and the optical field information of the to-be-measured fractional vortex beam to obtain a source field vortex phase distribution diagram, and observe a magnitude and a sign of a topological charge of the to-be-measured fractional vortex beam according to the source field vortex phase distribution diagram.

[0092] As shown in FIG. 4, specific experimental steps of generating and measuring a partially coherent fractional vortex beam in this embodiment are as follows:

[0093] A semiconductor solid-state laser (with a wavelength of 532.8 nm) emits laser light to enter a rotating frosted glass sheet. A beam is collimated by a lens after diffusion by the rotating frosted glass sheet (with a rotation frequency of 20 HZ). The degree of coherence of partially coherent light can be changed by changing the size of a spot irradiated on frosted glass. After the partially coherent beam passes through a spatial light modulator, a partially coherent fractional vortex beam is generated. The degree of coherence of the generated partially coherent light field is large when the spot irradiated on the frosted glass is very small. In an embodiment, a beam on a rear surface of the spatial light modulator (with a degree of coherence of 1 mm and a beam waist of 1 mm) is a measurement object.

[0094] After being transmitted by a distance, a to-be-measured fractional vortex beam is focused and irradiated on a resolution board. The resolution board is placed on a displacement platform, and a displacement distance may be controlled by using MATLAB software. In this example, the displacement platform is displaced by 10 steps in both an x direction and a y direction, with a step size of 20 um. The size of a spot on the resolution board is approximately 150 um. A camera acquires diffraction light intensity at 13 cm away from the resolution board. After the acquired diffraction light intensity is introduced into multi-mode stacked diffraction imaging, the main modes of the partially coherent fractional vortex beam may be obtained. The beam is retransmitted to a plane of the spatial light modulator in these modes. A topological charge may be obtained by examining phase discontinuity at this time.

[0095] Experimental results are shown in FIG. 5. After one circle, a total number of phase discontinuity is φ = 5.005π to calculate TC = φ/2 = 2.5025, and the accuracy is 99.9%.

[0096] Instruments in this embodiment are specifically:

[0097] A pure phase spatial light modulator is a reflective pure phase spatial light modulator: HOLOEYE GAEA, which has a size of 3840*2160 pixels and a pixel size of 3.74 .Math.m. The pure phase spatial light modulator is configured to set a measurement range. That is, a vortex phase is loaded on the spatial light modulator, so that a partially coherent beam can be converted into a fractional partially coherent beam.

[0098] The displacement platform used in the present invention is a Newport Gothic Bearing XYZ translation table (with a step size less than 30 nm), and displacement precision is within 100 nm.

[0099] A sample used in the present invention is a resolution board (USAF), produced by the American Thorlabs Company.

[0100] In the present invention, the light detector is a CCD or a CMOS. In this embodiment, the used CCD is an EMCCD (electron-multiplying camera) professional camera. Specific parameters include a size of is 1024*1024 pixels and a pixel size of 13 .Math.m. The CCD is driven by the MATLAB software. The foregoing software is used to observe and store image information received by the CCD. After the CCD is connected to a computer, the MATLAB software is used to record and store the image information received by the CCD.

[0101] A person skilled in the art should understand that embodiments of this application may be provided as a method, a system, or a computer program product. Therefore, this application may use a form of hardware only embodiments, software only embodiments, or embodiments with a combination of software and hardware. In addition, this application may use a form of a computer program product that is implemented on one or more computer-usable storage media (including but not limited to a disk memory, a CD-ROM, an optical memory, and the like) that include computer-usable program code.

[0102] The present application is described with reference to the flowcharts and/or block diagrams of the method, the device (system), and the computer program product according to the embodiments of the present application. It should be understood that computer program instructions may be used to implement each process and/or each block in the flowcharts and/or the block diagrams and a combination of a process and/or a block in the flowcharts and/or the block diagrams. The computer program instructions may be provided for a general-purpose computer, a dedicated computer, an embedded processor, or a processor of another programmable data processing device to generate a machine, so that the instructions executed by the computer or the processor of the another programmable data processing device generate an apparatus for implementing a specific function in one or more procedures in the flowcharts and/or in one or more blocks in the block diagrams.

[0103] These computer program instructions may be stored in a computer readable memory that can instruct the computer or any other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory generate an artifact that includes an instruction apparatus. The instruction apparatus implements a specific function in one or more processes in the flowcharts and/or in one or more blocks in the block diagrams.

[0104] These computer program instructions may be loaded onto a computer or another programmable data processing device, so that a series of operations and steps are performed on the computer or the another programmable device, thereby generating computer-implemented processing. Therefore, the instructions executed on the computer or the another programmable device provide steps for implementing a specific function in one or more processes in the flowcharts and/or in one or more blocks in the block diagrams.

[0105] Obviously, the foregoing embodiments are merely examples for clear description, rather than a limitation to implementations. For a person of ordinary skill in the art, other changes or variations in different forms may also be made based on the foregoing description. All implementations cannot and do not need to be exhaustively listed herein. Obvious changes or variations that are derived there from still fall within the protection scope of the invention of the present invention.