CONTINUOUS INFRARED SPECTROSCOPY SYSTEM AND METHOD

Abstract

A sample support apparatus (150) for use in a spectrometer (285), comprises an elongate support (110) comprising a plurality of receiving portions (112) each configured to receive a respective internal reflection element (IRE) or IRE slide (135), the elongate support having a sample side and a beam side opposite the sample side; and a plurality of IREs or IRE slides (135), each IRE or IRE slide provided at a respective receiving portion (112) of the elongate support (110), wherein each IRE or IRE slide (135) has at least one sample-receiving portion provided on a sample side thereof, and at least one beam-receiving portion provided on a beam side thereof. The sample support apparatus (150) has a stowed configuration, and a deployed configuration configured to allow application of a sample (276) on one or more of the plurality of IREs or IRE slides (135).

Claims

1. A sample support apparatus for use in a spectrometer, wherein the sample support apparatus comprises: an elongate support comprising a plurality of receiving portions each configured to receive a respective internal reflection element (IRE) or IRE slide, the elongate support having a sample side and a beam side opposite the sample side; and a plurality of IREs or IRE slides, each IRE or IRE slide provided at a respective receiving portion of the elongate support, wherein each IRE or IRE slide has at least one sample-receiving portion provided on a sample side thereof, and at least one beam-receiving portion provided on a beam side thereof, wherein the sample support apparatus has a stowed configuration, and a deployed configuration configured to allow application of a sample on one or more of the plurality of IREs or IRE slides.

2. A sample support apparatus according to claim 1, wherein the elongate support of the sample support apparatus is flexible.

3. A sample support apparatus according to claim 1, wherein the sample support apparatus is capable of being wound or spooled on or around a storing device.

4. A sample support apparatus according to claim 1, wherein the elongate support comprises or is provided in the form of a ribbon or tape.

5. A sample support apparatus according to claim 1, wherein the plurality of receiving portions are aligned longitudinally along the elongate support.

6. A sample support apparatus according to claim 1, wherein the plurality of receiving portions are spaced apart at regular intervals on the elongate support.

7. A sample support apparatus according to claim 1, wherein each receiving portion is configured to receive a respective internal reflection element (IRE), and wherein each IRE has one sample-receiving portion provided on a sample side of the slide, and one beam-receiving portion provided on a beam side of the slide.

8. A sample support apparatus according to claim 1, wherein the receiving portions each comprises one or more openings on a beam side of the elongate support, wherein each opening has a size less than the size of a respective IRE.

9. (canceled)

10. A sample support apparatus according to claim 1, wherein each receiving portion comprises a recess on a sample side of the elongate support, each receiving portion being configured to receive a respective IRE.

11. A sample support apparatus according to claim 1, wherein the elongate support comprises approximately between 10 and 5000 receiving portions and/or wherein the sample support apparatus comprises approximately between 10 and 5000 IREs.

12. A sample support apparatus according to claim 1, wherein the sample support apparatus further comprises at least one holding element provided on a sample side of the elongate support, the at least one holding element being configured to cover at least a portion of at least one IRE, wherein the/each holding element comprises at least one aperture configured to expose a portion of the sample side of a respective IRE and wherein the at least one aperture has a size equal to or less than the size of a sample-receiving portion of a respective IRE.

13. (canceled)

14. (canceled)

15. A sample support apparatus according to any claim 11, wherein the at least one holding element is provided in the form of a film or a tape.

16. A kit of parts for providing a sample support apparatus, the kit of parts comprising: an elongate support comprising a plurality of receiving portions each configured to receive a respective internal reflection element (IRE) or IRE slide, the elongate support having a sample side and a beam side opposite the sample side, wherein the elongate support has a stowed configuration, and a deployed configuration configured to allow application of one or more IREs or IRE slides thereon; and a plurality of IREs or IRE slides, each IRE or IRE slide configured to be provided at a respective receiving portion of the elongate support, wherein each IRE or IRE slide has at least one sample-receiving portion provided on a sample side thereof, and at least one beam-receiving portion provided on a beam side thereof.

17. A kit of parts according to claim 16, further comprising a holding element arranged to be provided on a sample side of the elongate support and configured to cover at least a portion of at least one IRE.

18. A method of making a sample support apparatus, the method comprising: providing an elongate support comprising a plurality of receiving portions each configured to receive a respective IRE or IRE slide, the elongate support having a sample side and a beam side opposite the sample side, wherein the sample support apparatus has a stowed configuration, and a deployed configuration configured to allow application of a sample on one or more of the plurality of IREs or IRE slides; and disposing at least one IRE or IRE slide in a respective receiving portion of the elongate support, wherein the at least one IRE or IRE slide has at least one sample-receiving portion provided on a sample side thereof, and at least one beam-receiving portion provided on a beam side thereof.

19. A method according to claim 18, comprising disposing a plurality of IREs or IRE slides on the elongate support, each IRE or IRE slide being provided in a respective receiving portion of the elongate support.

20. A method according to claim 18, comprising moving the elongate support in a linear direction.

21. (canceled)

22. A method according to claim 18, further comprising applying a holding element on a sample side of the elongate support so as to cover at least a portion of at least one IRE.

23. A method according to claim 18, comprising stowing the sample support apparatus.

24. A system for measuring a sample, the system comprising: a dispenser configured to supply a sample support apparatus according to claim 1; a sample dispenser configured to apply a sample on a sample-receiving portion of the sample support apparatus; and a spectrometer.

25. A method for measuring a sample, the method comprising: supplying a sample support apparatus according to claim 1; applying a sample on a sample-receiving portion of the sample support apparatus; and moving the sample support apparatus to a spectrometer so as to measure the sample.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0167] Various aspects of the invention will now be described by way of example only, and with reference to the accompanying drawings, in which:

[0168] FIG. 1 is a schematic representation of the principles of ATR-IR spectroscopy;

[0169] FIG. 2 is a schematic representation of a conventional set-up showing a single IRE for performing ATR-IR spectroscopy analysis;

[0170] FIG. 3 is a schematic view of a system for making a sample support apparatus according to an embodiment;

[0171] FIG. 4 is a schematic view of a sample support apparatus according to an embodiment;

[0172] FIG. 5 is a view of an alternative embodiment of a sample support apparatus;

[0173] FIGS. 6, 7 and 8 show a bottom view and cross-sectional views of an embodiment of an IRE slide for use in the sample support apparatus of FIG. 4 or FIG. 5;

[0174] FIG. 9 is a schematic view of a system for measuring a sample according to an embodiment.

DETAILED DESCRIPTION

[0175] Referring to FIG. 1 there is shown a schematic representation of the principles of ATR-IR spectroscopy. In FIG. 2, these principles are illustrated in the context of the conventional set-up showing a single IRE for performing ATR-IR spectroscopy analysis.

[0176] As shown in FIGS. 1 and 2, “Attenuated Total Reflection” (ATR) employs an internal reflective element (IRE) 10 through which an IR beam 20 is passed. The sample is deposited directly onto the IRE 10. The specific refractive properties of the IRE depends on the material from which the IRE is made, which can be for example diamond, germanium, zinc selenide or silicon. As shown in FIG. 1, when the IR light beam 20 is passed through the IRE 10 at an angle 81 above the critical angle, the beam 20 is internally reflected through this medium on its upper surface 12 in contact with the sample 30. When the beam 20 meets the IRE and sample interface 12, this results in the production of an evanescent wave 14 which penetrates into the sample 30. The depth of this penetration is dependent upon the refractive indices of the IRE 10 and the sample 30, and is generally in the range of 0.5-2 μm. The beam 20, which then contains information about the sample 30, is then reflected by the IRE 10 towards a detector.

[0177] FIG. 3 shows a schematic view of a system 100 and associated method for making a sample support apparatus 150, according to an embodiment. The sample support apparatus 150 is shown in more detail in FIGS. 4 and 5.

[0178] An elongate flexible support 110 is provided on a first reel 120. The elongate flexible support 110 has a plurality of receiving portions 112 each configured to receive a respective internal reflection element (IRE) 135. The receiving portions 112 are provided on a sample side (which in use corresponds to an upper side) of the elongate flexible support 110. The elongate flexible support 110 has a beam side (which in use corresponds to a lower side) opposite the sample side.

[0179] In this embodiment, the elongate flexible support 110 has a width of about 12-16 mm. However, in other embodiments, the elongate flexible support 110 may have a width corresponding to the standard width of a microscope slide, in this embodiment about 25 mm. This may help allow the apparatus to be used with a conventional FTIR spectrometer.

[0180] Advantageously, the elongate flexible support 110 also has a height or depth corresponding to the standard height or depth of a microscope slide, in this embodiment about 1 mm.

[0181] As shown in FIG. 3, the elongate flexible support 110 is unwound from first reel 120 and held taut as it is fed through slide dispenser 130. Thus, as shown by section “A” of elongate flexible support 110 in FIG. 3, upstream of the slide dispenser 130, the elongate flexible support 110 is devoid of any IRE slides thereon.

[0182] In this embodiment, slide dispenser 130 includes an automated robotic arm 138 configured to place an IRE 135 in a respective receiving portion 112 of the elongate flexible support 110.

[0183] The IREs 135 are provided on a slide tray 131 which has a number of IREs thereon. In use, the tray 132 is located near the slide dispenser 130 to allow the arm 138 to automatically pick an IRE 135 from the tray 132 and apply it in a respective receiving portion 112 of the support 110. When all IREs on a tray have been used, such tray (shown as 133), is displaced and replaced by another tray 131 to continue application of IREs 135 on support 110.

[0184] The IREs 135 are placed such that a sample-receiving portion thereof faces upwards (i.e. away from recess 112 of support 110), and a beam-receiving portion thereof faces downwards (i.e. towards recess 112 of support 110).

[0185] Downstream from slide dispenser 130 is a cover dispenser 140 configured to apply a holding element 145 on an upper (sample) side of the support 110.

[0186] As shown by section “B” of elongate flexible support 110 in FIG. 3, the section B of support 110 downstream of slide dispenser 130 and upstream of cover dispenser 140 has an IRE 135 in each of the support recesses 112.

[0187] In this embodiment, the holding elements 145 consist of adhesive labels provided on a tape 141. As the support 110 is fed through cover dispenser 140, tape 141 is also fed through the cover dispenser 140 from tape reel 142, and a robot 143 automatically applies a label 145 onto a portion of a respective IRE 135.

[0188] As best shown in FIG. 4, in this embodiment, each label 145 partially covers a peripheral portion of a respective IRE 135. Each label 145 also covers a portion of a sample side of the flexible support 110 directly adjacent and around the IREs 135. Thus, at least a portion of the IREs 135 on a sample side thereof is sandwiched between the flexible support 110 and its respective label 145.

[0189] In this embodiment, each label 145 is configured to secure and/or hold a respective IRE 135 in place, e.g. within its respective recess 112 of the support 110.

[0190] As best shown in FIG. 4, each label 145 has an aperture 146 near a central region thereof which is configured to expose a portion of the sample side of a respective IRE 135.

[0191] However, it will be appreciated that, in other embodiments, each label 145 may be sized so as to cover a portion of more than one IRE slide, and that in such instance each label may have more than one aperture 146 so as to expose a portion of the sample side of all the IREs covered by the label.

[0192] The size of aperture 146 of labels 145 is slightly less than the size of the sample-receiving portion of the IREs 135. By such provision, a sample may be applied to the sample side of each IRE 135, whilst providing a further physical barrier between adjacent sample-receiving portions, thus further reducing the risk of cross-contamination between adjacent sample-receiving portions or IREs 135.

[0193] In this embodiment, the IREs 135 are approximately 6 mm×6 mm in size with a grooved area on their beam-receiving portions of about 5 mm×5 mm, and the apertures 146 have a size of approximately 3-4 mm×3-4 mm.

[0194] The assembled sample support apparatus 150 in represented by section “C” in FIG. 3, downstream of cover dispenser 140.

[0195] The sample support apparatus 150 is then wound on a second reel 122. By such provision, a continuous sample support apparatus 150 having multiple IREs thereon can be prepared effectively and stored conveniently.

[0196] The sample support apparatus 150 has holes 116 along the edges of the flexible support 110 to aid unwinding of the flexible support 110 (e.g. from first reel 120), winding of sample support apparatus 150 (e.g. on second reel 122), and/or handling of the sample support apparatus 150 and/or flexible support 110 during the process and/or subsequent use.

[0197] Referring to FIG. 4, the flexible support 110 is shown on its left hand side with two recesses 112a,112b each having an opening 113a,113b on a beam side of the support 110, corresponding to section “A” on the support 110 in FIG. 3. Each opening 113a,113b is configured to allow irradiation of a beam side of an associated IRE, but to prevent the IRE from falling through the openings 113a,113b. In this embodiment, the openings are circular and have a diameter of approximately 2 mm. However, it will be appreciated that in other embodiments the openings may be square, rectangular, elliptical, and any other suitable shape, and may have a dimension, e.g. diameter or width, or about 2-5 mm.

[0198] Referring to FIG. 4, the central section of flexible support 110 corresponds to section “B” in FIG. 3, and shows IREs 135c,135d placed within respective recesses 112c,112d.

[0199] Finally, the section of the sample support apparatus 150 on the right hand side of FIG. 4 corresponds to section “C” in FIG. 3, and shows a labels 145e,145f,145g applied on an outer portion of respective IREs 135e,135f,135g, and with their respective apertures 146e,146f,146g over a central portion of IREs 135e,135f,135g.

[0200] FIGS. 6, 7 and 8 show an embodiment of an IRE 135 used in the apparatus 150 of FIGS. 3-5. FIG. 6 is a view of the beam side of the IRE 135, whilst FIGS. 7 and 8 show cross-sectional views of the IRE 135.

[0201] In this embodiment, beam-receiving portion of IRE 135 is configured to permit a radiation beam to penetrate a surface of the IRE 135 on the beam side of the IRE 135.

[0202] Each beam-receiving portion defines a plurality of elongate grooves 161 and prisms 162. Conveniently, each beam-receiving portion defines has a plurality of aligned, parallel and adjacent grooves 161 and prisms 162.

[0203] In this embodiment, the prisms 162 are recessed relative to a lower surface 163 of the IRE 135 on the beam side thereof. The IRE 135 has a peripheral region defined by the lower surface 163, which assists in locating and supporting the IRE 135 when placed in its respective recess 112 of the elongate flexible support 110.

[0204] However, in another embodiment, the prisms 162 may protrude outwardly relative to the lower surface 163 of the IRE 135 on the beam side thereof. Other alternative embodiments may be envisaged in which an outer portion of the prisms 162 may protrude outwardly relative to the lower surface 163, and an inner portion of the prisms 162 may be recessed relative to the lower surface 163.

[0205] In this embodiment, the silicon IREs 135 had a thickness of 380 μm, and grooves 161 had a width of 250 μm, a depth of 176.8 μm, and a spacing of 25 μm.

[0206] FIG. 9 is a schematic view of a system, generally designated 200, for measuring a sample, according to an embodiment.

[0207] The system 200 has a reel 222 with a sample support apparatus 250 wound thereon. The sample support apparatus 250 is similar to the sample support apparatus 150 of FIGS. 3-5, like parts denoted by like numerals, incremented by ‘100’.

[0208] The system 200 is configured to permit in-line or continuous measurement of samples 276 by FTIR spectroscopy.

[0209] The system 200 includes a sample dispenser 270 located downstream from reel 222 and configured to apply a sample 276 on the sample-receiving portion of an IRE 235 of the sample support apparatus 250.

[0210] In use, the system 200 permits supply of sample support apparatus 250 by unwinding it from reel 222 in a linear direction.

[0211] As each IRE 235 passes through or near sample dispenser 270, the robotic arm 275 thereof dispenses a predetermined amount of sample 276 on a sample-receiving portion of the IRE 235. Typically, the sample support apparatus 250 is kept stationary whilst sample 276 is applied on respective IRE 235.

[0212] The samples 276 are provided on a sample tray 271 which has a number of samples 276 thereon. In use, tray 272 is located near the sample dispenser 270 to allow the arm 275 to automatically obtain a predetermined amount of sample 276 from the tray 272 and apply it to a respective IRE 235 of the sample support apparatus 250. When all samples 276 on a tray have been used, such tray (shown as 273), is displaced and replaced by another tray 271 to continue dispensing of sample 275 on IREs 235 of apparatus 250.

[0213] The system 200 further comprises a dryer 280 configured to dry wet samples 276 provided on the sample support apparatus 250. In this embodiment, the dryer 280 is an oven including an air flow supply. It will be appreciated that, in the event that dry samples are applied on the sample support apparatus 250, a dryer may not be required.

[0214] The system includes one or more spectrometers 285, which is provided downstream of the sample dispenser 270 and of the dryer 280. In this embodiment the spectrometer is an ATR-FTIR spectrometer.

[0215] In this embodiment, there is provided a single spectrometer 285 for ease of representation. However, it will be appreciated that multiple spectrometers may be coupled to the system in order to further increase the capacity of the system and increase throughput. For example, if there are four spectrometers, the first spectrometer may be configured to measure a sample at position n, the second spectrometer may be configured to measure a sample at position n+1, the third spectrometer may be configured to measure a sample at position n+2, and the fourth spectrometer may be configured to measure a sample at position n+3. After each multiple measurement, the sample support apparatus 250 would then be moved such that the sample at position n+4 would be measured by the first spectrometer, etc. By such provision, the time required to perform measurement or analysis of the samples on the sample support apparatus 250 may be reduced.

[0216] The system 200 is automated in order to maximise reliability, repeatability and throughput capacity.

[0217] The system 200 is associated with a controller 290 configured to control movement, e.g. translation, of the sample support apparatus 250.

[0218] The controller may control movement, e.g. translation and/or unwinding of the sample support apparatus 250, by a predetermined distance.

[0219] Typically, the controller 290 maintains the sample support apparatus stationary whist a sample 276 is applied on the sample support apparatus 250. This may help the accuracy of the sample application. Typically also, the controller 290 maintains the sample support apparatus 250 stationary whist one or more samples 276 is/are being measured by the spectrometer(s) 285.

[0220] The provision of a sample support apparatus 250 having numerous successive IREs 235 allows for automated in-line, continuous measurements of numerous samples 276 without having to remove and replace a sample slide between successive measurements as per current approaches. This may avoid the need to remove, clean and dry an IRE between successive measurements as is current practice, thus permitting high throughput ATR-FTIR analysis.

[0221] It will be appreciated that the described embodiments are not meant to limit the scope of the present invention, and the present invention may be implemented using variations of the described examples.