ELECTRICAL OPERATING DEVICE AND METHOD FOR RECOGNIZING MALFUNCTIONS
20220244310 · 2022-08-04
Inventors
Cpc classification
H02H1/0092
ELECTRICITY
G01R31/31816
PHYSICS
H02H3/05
ELECTRICITY
H02H3/28
ELECTRICITY
G06F11/0736
PHYSICS
G06F11/0796
PHYSICS
H02H1/04
ELECTRICITY
International classification
Abstract
An electrical operating device includes measuring equipment for an electrical measured variable, and preprocessing equipment for digital measured values. The preprocessing equipment has an integrated circuit and an electronic memory component for configuring a logic circuit. A processor evaluates preprocessed measurement data and, on the basis of the evaluation, transmits data telegrams to other electrical operating devices. The preprocessing equipment calculates a respective checksum for a digital measured value, and the processor recognizes a malfunction from the measured value and the checksum of the measured value, and suppresses the evaluation and/or the transmission of the data telegrams in the event of a malfunction. There is also described a method for recognizing malfunctions.
Claims
1. An electrical operating device, comprising: measuring equipment for measuring an electrical measured variable; and preprocessing equipment having an integrated circuit and an electronic memory component for a configuration of a logic circuit; said preprocessing equipment being configured for processing digital measured values and for calculating respective checksums for the digital measured values; and a processor configured to evaluate preprocessed measurement data received from said preprocessing equipment and, based on the evaluation, to transmit data telegrams to other electrical operating devices; said processor being configured to recognize a malfunction based on a measured value and a respective checksum of the measured value, and to suppress an evaluation and/or a transmission of a data telegram if a malfunction is recognized.
2. The electrical operating device according to claim 1, wherein a checksum of bits of a digital measured value is formed for the checksum.
3. The electrical operating device according to claim 2, wherein the bits of the digital measured value is also weighted and/or channel information is taken into consideration for the checksum.
4. The electrical operating device according to claim 1, wherein said processor is configured to prevent an evaluation and/or transmission of data telegrams if a malfunction is recognized, at least until a malfunction is no longer recognized on a basis of a further measured value and of a respective checksum of the further measured value.
5. The electrical operating device according to claim 1, wherein said processor is configured to enable an evaluation and/or a transmission of data telegrams if no malfunction is recognized.
6. The electrical operating device according to claim 1, wherein said integrated circuit comprises a field programmable gate array and said electronic memory component comprises a static random access memory.
7. The electrical operating device according to claim 1, which comprises an analog/digital converter configured to convert the electrical measured variable, being an analog electrical measured variable, into a digital measured value at a predefined sampling rate.
8. The electrical operating device according to claim 1, further comprising a protection device, and wherein the data telegrams comprise protection commands and the protection device comprises data communication equipment for transmitting the data telegrams to switches being the other operating devices in an energy grid.
9. A method for recognizing malfunctions in an electrical operating device, the method comprising: measuring an electrical measured variable by measuring equipment; and preprocessing digital measured values by preprocessing equipment having an integrated circuit and an electronic memory component for a configuration of a logic circuit, to generate preprocessed measurement data; calculating respective checksums for the digital measured values by the preprocessing equipment, and receiving and evaluating the preprocessed measurement data by a processor, and recognizing a malfunction on a basis of a measured value and a respective checksum of the measured value by the processor; transmitting data telegrams based on the evaluating step to another electrical operating device, but suppressing an evaluation and/or a transmission of the data telegrams in the event of a malfunction.
10. The method according to claim 9, which comprises forming the checksum from bits of the digital measured value.
11. The method according to claim 10, which further comprises weighting the bits of the digital measured value and/or taking channel information into consideration for the checksum.
12. The method according to claim 9, which comprises, on recognizing a malfunction, preventing the evaluation and/or the transmission of data telegrams
Description
BRIEF DESCRIPTION OF THE FIGURE
[0042] The sole FIGURE of the drawing is a schematic illustration of an exemplary embodiment of an electrical operating device according to the invention.
DETAILED DESCRIPTION OF THE INVENTION
[0043] An electrical line 2 of an energy transmission grid of the high-voltage level is connected (possibly via a non-illustrated measuring transducer) by means of the line 3 to an electrical operating means 1 that is designed as a protection device. A measured value processing chain is illustrated in the protection device 1.
[0044] Measuring equipment 8 for an electrical measured variable is designed to determine the time profile of a voltage U. Analog measured values are output via an analog connection 9, which in this case is an instantaneous voltage value. The instantaneous voltage value is converted in an analog/digital converter 10 at a predefined sampling rate of, for example, 8 kHz into a bit sequence (e.g. “1010”), which indicates a digital measured value 12.
[0045] This digital measured value 12 is, for example, retrieved by preprocessing equipment 13 for digital measured values 12. The preprocessing equipment here comprises an integrated circuit 14 and an electronic memory component 15 for the configuration of a logic circuit, wherein the integrated circuit comprises a field programmable gate array (FPGA) and the electronic memory component comprises a static random access memory (SRAM).
[0046] As soon as it arrives, the FPGA adds a checksum 24, for example a checksum of the bits of the digital measured value 12, to each digital measured value 12. Channel information 19 can furthermore also be taken into consideration for the checksum 24. A timestamp 18 can also be taken into consideration. A bit sequence 17 thus results, for which the checksum 24 is calculated, potentially also with a weighting of the bits of the digital measured value. If high-energy radiation, for example ionizing radiation such as gamma radiation 16, now acts on the electronic memory component 15, what is known as an SEU can occur. This can lead to a bit-flip within the bit sequence 17, which would consequently lead to a changed checksum 24. This means that the result of an SEU is that the checksum 24 in the bit sequence 24 no longer matches the now changed bit sequence 17 with the digital measured value.
[0047] The checksum 24 is now carried as the bit sequence 23, together with the bit sequence 17 that contains at least the digital measured value 12, through the further measured value chain.
[0048] The bit sequence 23 is made available via the data line 25 to a processor installation or processor 22. The processor 22 has a central processing unit (CPU) 26 and a data memory 27.
[0049] The processor 22 is configured to evaluate the preprocessed measurement data, i.e., the bit sequence 17 from the bit sequence 23. From the measured value 12 and the further information 18, 19 in the bit sequence 17, as well as the respective checksum 24, it can recognize a malfunction and, in the event of a malfunction, suppress the evaluation and/or the transmission of data telegrams to other electrical operating means 4. This recognizing of a malfunction takes place in that a second checksum 28 is calculated from the bit sequence 17, and compared with the checksum 24. If the two checksums match, the bit sequence 17 is present in unchanged form—no SEU has occurred. If the two checksums do not match, an error such as a bit-flip of one or a number of bits must be suspected.
[0050] If no malfunction is present, the processor 22 can evaluate the digital measured value 12 etc., and, if predefined limit values are violated, can for example execute a protection function for the electrical energy grid. In this case, the processor 22 sends a protection command 21 to data communication equipment 20 that is designed to transmit the protection command 21 as a data telegram 29 over a data communication connection 5 to a switch 4.
[0051] When, for example, the data telegram 29 is received in a controller for the switch 4, the switch 4 is triggered. In that case, the switch 4 changes from a closed state 6 into an open state 7.