HIGH-SPEED AND LOW-VOLTAGE ELECTRO-OPTICAL MODULATOR BASED ON LITHIUM NIOBATE-SILICON WAFER
20220100048 · 2022-03-31
Inventors
Cpc classification
International classification
Abstract
A high-speed and low-voltage electro-optical modulator based on a lithium niobate-silicon wafer. A silicon wafer is located above a lithium niobate wafer; a lithium niobate-silicon hybrid waveguide is formed by etching a silicon waveguide; and the power of light waves is differently distributed in the lithium niobate-silicon hybrid waveguide by changing the structure of the silicon waveguide. When higher power is distributed in the silicon waveguide, the high-speed and low-voltage electro-optical modulator is suitable for realizing a compact wave splitting function, a wave combining function and a thermo-optical modulation function; and when higher power is distributed in the lithium niobate waveguide, the high-speed and low-voltage electro-optical modulator is suitable for realizing a high-speed and low-voltage electro-optical modulation function. The present invention takes advantage of the lithium niobate and silicon material platforms respectively, and is suitable for high-speed and low-voltage electro-optical modulation.
Claims
1. A high-speed and low-voltage electro-optical modulator with a Mach-Zehnder interference structure based on a lithium niobate-silicon wafer, comprising, as arranged from bottom to top, a silicon substrate layer, a silicon dioxide isolation layer, a lithium niobate wafer layer, and a silicon waveguide layer, wherein the silicon waveguide layer is etched to form multimode interferometers, a phase shifting arm, spot-size converters, DC bias electrodes, and traveling-wave electrodes; a high refractive index region, a spot-size conversion region, an electro-optical modulation region, a spot-size conversion region, and a high refractive index region are sequentially formed from an input end to an output end; the phase shifting arm comprises thermal modulation phase shifters and electrical modulation phase shifters; the multimode interferometers and the thermal modulation phase shifters are located in the high refractive index regions; the spot-size converters are located in the spot-size conversion region, and the electrical modulation phase shifters are located in the electro-optical modulation region; the multimode interferometers, the phase shifting arm, and the spot-size converters constitute a waveguide structure component; the DC bias electrodes are formed near the thermal modulation phase shifters; and the traveling-wave electrodes are formed near electrical modulation phase shifters.
2. The high-speed and low-voltage electro-optical modulator with the Mach-Zehnder interference structure based on the lithium niobate-silicon wafer according to claim 1, wherein the waveguide structure component comprises the two multimode interferometers, the four spot-size converters, the two thermal modulation phase shifters, the two electrical modulation phase shifters, the DC bias electrodes and the traveling-wave electrodes, wherein the two multimode interferometers respectively serve as a multiplexer and a demultiplexer; two output ports of the multiplexer are respectively connected to ends of the two thermal modulation phase shifters, and the other ends of the two thermal modulation phase shifters are respectively connected to ends of the two spot-size converters, the other ends of the two spot-size converters are respectively connected to ends of the two electrical modulation phase shifters, the other ends of the two electrical modulation phase shifters are respectively connected to ends of the other two spot-size converters, and the other ends of the two spot-size converters are connected to the multiplexer.
3. The high-speed and low-voltage electro-optical modulator with the Mach-Zehnder interference structure based on the lithium niobate-silicon wafer according to claim 1, wherein the spot-size converters are realized through single-layer tapered couplers or double-layer tapered couplers.
4. The high-speed and low-voltage electro-optical modulator with the Mach-Zehnder interference structure based on the lithium niobate-silicon wafer according to claim 1, wherein the waveguide structure component comprises, sequentially, the first multimode interferometer, the thermal modulation phase shifters, the spot-size converters, the electrical modulation phase shifters, and the second multimode interferometer.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION OF THE INVENTION
[0023] The present invention is described in detail below with reference to the drawings and embodiments, and detailed implementation and structure are given, but the protection scope of the present invention is not limited to the following embodiments.
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[0028] In the first embodiment, the basic structure of the present invention is a Mach-Zehnder modulator. The Mach-Zehnder modulator comprises two the multimode interferometers 1, the two spot-size converters 3, the two thermal modulation phase shifters 21, the two electrical modulation phase shifters 22, and the DC bias electrodes 4 and the traveling-wave electrodes 5. The multimode interferometer is a 1×2 multi-mode interferometer, and the two multimode interferometers 1 respectively serve as a multiplexer and a demultiplexer. Two output ports of the multiplexer are respectively connected to the two thermal modulation phase shifters 21, and the two thermal modulation phase shifters 21 are respectively connected to ends of the two spot-size converters 3, the other ends of the two spot-size converters 3 are respectively connected to the two electrical modulation phase shifters 22, the two electrical modulation phase shifters 22 are respectively connected to the two spot-size converters, and the two spot-size converters 3 are finally connected to the multiplexer. The DC bias electrodes 4 are formed near the thermal modulation phase shifters 21, and the traveling-wave electrodes 5 are formed near the electrical modulation phase shifters 22. The high-speed and low-voltage electro-optical modulator with the Mach-Zehnder interference structure based on the lithium niobate-silicon wafer has the greatest characteristic that there is a silicon wafer on the lithium niobate wafer, and the silicon wafer is etched through a mature complementary metal oxide integration process to form a lithium niobate-silicon hybrid waveguide. By controlling the etching width and the etching depth of the silicon waveguide, the light waves can be transmitted in the silicon waveguide and the lithium niobate waveguide.
[0029] In the second embodiment of the present invention, regarding the bias point control method of the high-speed and low-voltage modulator, in the embodiment of the present invention, the thermal modulation phase shifters 21 are located in the high refractive index regions, and are used for the bias point control of the high-speed and low-voltage modulator. Therefore, from one port of the modulator to the other port of the modulator, a waveguide structure component comprises the multimode interferometer 1, the thermal modulation phase shifters 21, the spot-size converters 3, the electrical modulation phase shifters 22, and the multimode interferometer 1.
[0030] In the third embodiment of the present invention, the thermal modulation phase shifters 21 are located in the low refractive index region, and are used for the bias point control of the high-speed and low-voltage modulator. Therefore, from one port of the modulator to the other port of the modulator, the waveguide structure component respectively comprises the multimode interferometer 1, the spot-size converters 3, the thermal modulation phase shifters 21, the electrical modulation phase shifters 22, and the multimode interferometer 1.
[0031] In the fourth embodiment of the present invention, the electrical modulation phase shifters are used for the bias point control of the high-speed and low-voltage modulator. Therefore, from one port of the modulator to the other port of the modulator, the waveguide structure component comprises the multimode interferometer 1, the spot-size converters 3, the electrical modulation phase shifters 22, and the multimode interferometer 1.
[0032] Regarding the spot-size conversion method, in this embodiment of the present invention, as the silicon waveguide has different etching widths and heights in the high refractive index regions and the electro-optical modulation region, the two-layered tapered couplers are used as the spot-size converters 3 for the transfer and transmission of light waves. In other embodiments of the present invention, the silicon waveguides in the high refractive index regions and the electro-optical modulation region have the same etching width, so that the single-layer tapered couplers can be used as the spot-size converters 3 for the transfer and transmission of the light waves.