ADVANCED HIGHSPEED SYSTEM TO IDENTIFY AND CLASSIFY AREAS OF RAIL ANOMALIES
20220099630 ยท 2022-03-31
Inventors
Cpc classification
B61K9/08
PERFORMING OPERATIONS; TRANSPORTING
G01N2291/044
PHYSICS
G01N29/2418
PHYSICS
G01N29/07
PHYSICS
International classification
G01N29/07
PHYSICS
B61K9/08
PERFORMING OPERATIONS; TRANSPORTING
G01N29/22
PHYSICS
Abstract
The present invention provides a highspeed advanced system to identify and classify the area of anomalies in a railroad rail. This is achieved by using a novel linear array solution that employs parallel transmission of an ultrasonic beam and the use of a virtual synthetic aperture to receive reflected echoes. This integrated system has the capability to locate and classify near surface horizontal defects at speeds more than 40 km/h and at the same time maintaining a constant pulse density of at least 4 mm or less per incremental longitudinal movement.
Claims
1. A system for performing an ultrasonic inspection of railroad rails in order to detect horizontal near surface fractures in a head area of a rail being inspected, which horizontal near surface fractures propagate in a horizontal and longitudinal plane of said rail, said inspection being performed as said inspection system moves along the railroad rails, the system comprising: a sensing wheel arranged to roll along the top of the railroad rails being inspected, a linear array generating one or more excitation pulses for one or more separate groups of transducer elements within said linear array, and one or more groups of virtual synthetic apertures to collect received echo data from said separate groups of transducer elements.
2. A system in accordance with claim 1 wherein said virtual synthetic apertures are synthesized into smaller groupings of one or more transducer elements scanning across said head area of said rail.
3. A system in accordance with claim 2 wherein said virtual synthetic apertures are synthesized into small groupings of one or more transducer elements scanning across said head area of said rail and grouping said echo data result to obtain a full scan across said linear array.
4. A system in accordance with claim 1 wherein said system is comprised of a sliding transducer array.
5. A system in accordance with claim 1 which combines echo data results of one or more groupings of said virtual synthetic apertures to generate a TOF Cscan presentation.
6. A system in accordance claim 1 which combines echo data results of one or more groupings of said virtual synthetic apertures to generate an Amplitude Cscan presentation.
7. A system in accordance with claim 1 which combines echo data results of one or more groupings of said virtual synthetic apertures to generate a Ascan presentation.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0014] The patent or application file contains at least one drawing executed in color. Copies of this patent or patent application publication with color drawing(s) will be provided by the Office upon request and payment of the necessary fee.
[0015] Further objects, features and advantages of the invention will become apparent from the following detailed description taken in conjunction with the accompanying figures showing illustrative embodiments of the invention, in which:
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DETAILED DESCRIPTION OF THE INVENTION
[0023]
[0024] While the present invention embodies similar apparatus for performing inspection of a length of test material, such as a railroad rail, the novelty of the invention is the unique application of electronics and data acquisition techniques. By combining parallel pulse transmission (described below) and sequential virtual apertures (described below) for receiving data it provides a high-speed capability that was not possible with current technology.
[0025] More specifically, for each high-speed scan, and for each echo, the data processing unit has the capability to generate the Time of Flight (TOF), Amplitude and an RF A Scan. The TOF is used to generate a C Scan presentation of a horizontal defect displaying depth and length along the longitudinal position as shown in
[0026] In accordance with the invention described herein,
[0027] The table in
[0028] To further clarify, using current conventional linear array technology each incremental pulse of the 24 needed requires approximately 120 microseconds of transmit/receive time or 2,880 microseconds to scan across the entire array. This limits the testing speed to 1.5-2 km/h. Using the new described methodology of using a three-pulse sequence the transmit/receive time will be 120 microseconds multiplied by 3 or approximately a cycle of 360 microseconds for one complete scan across the entire array. The new method described herein significantly increases the testing speed to more than 40 km/h which greatly reduces the testing costs.
[0029]
[0030] Although a specific embodiment of the invention has been disclosed herein it is to be understood that various modifications can be made to the described embodiment without departing from the scope of the claimed invention, which modification, would be apparent to one skilled in this art area.