SYSTEM AND METHOD OF MEASURING GRAIN ORIENTATIONS

Abstract

A system and a method of measuring grain orientations of a metal component. The method includes defining a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations. The method further includes defining a nominal grain orientation at each measurement location. The method further includes loading the measurement locations into a computer-controllable fixture suitable for positioning the metal component. The method further includes locating the metal component in the computer-controllable fixture. The method further includes taking the series of measurements at the series of measurement locations. The method further includes analysing the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.

Claims

1. A method of measuring grain orientations of a metal component, the method comprising: defining a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations; defining a nominal grain orientation at each measurement location; loading the measurement locations into a computer-controllable fixture suitable for positioning the metal component; locating the metal component in the computer-controllable fixture; taking the series of measurements at the series of measurement locations; and analysing the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.

2. The method of claim 1, wherein the nominal grain orientation is defined based on a viewing attitude at each measurement location.

3. The method of claim 1, wherein taking the series of measurements further comprises recording the series of measurements.

4. The method of claim 1, wherein analysing the measurement at each measurement location further comprises: determining a difference between the measurement at each measurement location and the nominal grain orientation at the corresponding measurement location; and comparing the difference with a threshold difference.

5. The method of claim 4, wherein the threshold difference is an angle of 10 degrees.

6. The method of claim 1, further comprising irradiating the metal component with an X-ray beam using an X-ray source at each measurement location.

7. The method of claim 6, further comprising detecting diffracted X-rays from each measurement location on the metal component using an X-ray detector.

8. The method of claim 7, further comprising moving the metal component via the computer-controllable fixture to each measurement location.

9. The method of claim 8, wherein moving the metal component further comprises translating the metal component along one or more axes such that a distance between the X-ray source, each measurement location on the metal component and the X-ray detector is substantially constant.

10. The method of claim 9, wherein moving the metal component further comprises rotating the metal component about one or more planes such that a normal to a surface of the metal component at each measurement location subtends a substantially constant angle Ai at the X-ray source.

11. The method of claim 1, wherein analysing the measurement at each measurement location further includes fitting a Laue pattern mask to the measurement.

12. The method of claim 1, wherein the computer-controllable fixture is a six-axis computer-controllable fixture.

13. A system for measuring grain orientations of a metal component, the system comprising: a computer-controllable fixture for positioning the metal component; and a controller configured to: receive a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations; define a nominal grain orientation at each measurement location; load the measurement locations into a computer-controllable fixture suitable for positioning the metal component; locate the metal component (in the computer-controllable fixture; take a series of measurements at the series of measurement locations; and analyse the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.

14. The system of claim 13, further comprising: an X-ray source for irradiating the metal component with an X-ray beam at each measurement location; and an X-ray detector for detecting diffracted X-rays from each measurement location on the metal component.

15. The system of claim 13, wherein the computer-controllable fixture is a six-axis computer-controllable fixture.

16. The system of claim 14, wherein the computer-controllable fixture is a six-axis computer-controllable fixture.

Description

DESCRIPTION OF THE DRAWINGS

[0058] Embodiments will now be described by way of example only, with reference to the Figures, in which:

[0059] FIG. 1 is a sectional side view of a gas turbine engine;

[0060] FIG. 2 is a close-up sectional side view of an upstream portion of a gas turbine engine;

[0061] FIG. 3 is a partially cut-away view of a gearbox for a gas turbine engine;

[0062] FIG. 4 is a block diagram of a system for measuring grain orientations of a metal component;

[0063] FIG. 5 is a schematic perspective view of an exemplary system for measuring grain orientations;

[0064] FIG. 6 is a schematic perspective view of the system shown in FIG. 5 showing a metal component positioned for measurement;

[0065] FIG. 7A is a schematic perspective view showing measurement at a first measurement location of the metal component;

[0066] FIG. 7B is a schematic perspective view showing measurement at a second measurement location of the metal component; and

[0067] FIG. 8 is a flowchart of a method of measuring grain orientations of a metal component.

[0068] Aspects and embodiments of the present disclosure will now be discussed with reference to the accompanying Figures. Further aspects and embodiments will be apparent to those skilled in the art.

DETAILED DESCRIPTION

[0069] FIG. 1 illustrates a gas turbine engine 10 having a principal rotational axis 9. The engine 10 comprises an air intake 12 and a propulsive fan 23 that generates two airflows: a core airflow A and a bypass airflow B. The gas turbine engine 10 comprises a core 11 that receives the core airflow A. The engine core 11 comprises, in axial flow series, a low pressure compressor 14, a high-pressure compressor 15, combustion equipment 16, a high-pressure turbine 17, a low pressure turbine 19 and a core exhaust nozzle 20. A nacelle 21 surrounds the gas turbine engine 10 and defines a bypass duct 22 and a bypass exhaust nozzle 18. The bypass airflow B flows through the bypass duct 22. The fan 23 is attached to and driven by the low pressure turbine 19 via a shaft 26 and an epicyclic gearbox 30.

[0070] In use, the core airflow A is accelerated and compressed by the low pressure compressor 14 and directed into the high pressure compressor 15 where further compression takes place. The compressed air exhausted from the high pressure compressor 15 is directed into the combustion equipment 16 where it is mixed with fuel and the mixture is combusted. The resultant hot combustion products then expand through, and thereby drive, the high pressure and low pressure turbines 17, 19 before being exhausted through the core exhaust nozzle to provide some propulsive thrust. The high pressure turbine 17 drives the high pressure compressor 15 by a suitable interconnecting shaft 27. The fan 23 generally provides the majority of the propulsive thrust. The epicyclic gearbox 30 is a reduction gearbox.

[0071] An exemplary arrangement for a geared fan gas turbine engine 10 is shown in FIG. 2. The low pressure turbine 19 (see FIG. 1) drives the shaft 26, which is coupled to a sun wheel, or sun gear, 28 of the epicyclic gear arrangement 30. Radially outwardly of the sun gear 28 and intermeshing therewith is a plurality of planet gears 32 that are coupled together by a planet carrier 34. The planet carrier 34 constrains the planet gears 32 to process around the sun gear 28 in synchronicity whilst enabling each planet gear 32 to rotate about its own axis. The planet carrier 34 is coupled via linkages 36 to the fan 23 in order to drive its rotation about the engine axis 9. Radially outwardly of the planet gears 32 and intermeshing therewith is an annulus or ring gear 38 that is coupled, via linkages 40, to a stationary supporting structure 24.

[0072] Note that the terms “low pressure turbine” and “low pressure compressor” as used herein may be taken to mean the lowest pressure turbine stages and lowest pressure compressor stages (i.e. not including the fan 23) respectively and/or the turbine and compressor stages that are connected together by the interconnecting shaft 26 with the lowest rotational speed in the engine (i.e. not including the gearbox output shaft that drives the fan 23). In some literature, the “low pressure turbine” and “low pressure compressor” referred to herein may alternatively be known as the “intermediate pressure turbine” and “intermediate pressure compressor”. Where such alternative nomenclature is used, the fan 23 may be referred to as a first, or lowest pressure, compression stage.

[0073] The epicyclic gearbox 30 is shown by way of example in greater detail in FIG. 3. Each of the sun gear 28, planet gears 32 and ring gear 38 comprise teeth about their periphery to intermesh with the other gears. However, for clarity only exemplary portions of the teeth are illustrated in FIG. 3. There are four planet gears 32 illustrated, although it will be apparent to the skilled reader that more or fewer planet gears 32 may be provided within the scope of the claimed disclosure. Practical applications of a planetary epicyclic gearbox 30 generally comprise at least three planet gears 32.

[0074] The epicyclic gearbox 30 illustrated by way of example in FIGS. 2 and 3 is of the planetary type, in that the planet carrier 34 is coupled to an output shaft via linkages 36, with the ring gear 38 fixed. However, any other suitable type of epicyclic gearbox 30 may be used. By way of further example, the epicyclic gearbox 30 may be a star arrangement, in which the planet carrier 34 is held fixed, with the ring (or annulus) gear 38 allowed to rotate. In such an arrangement the fan 23 is driven by the ring gear 38. By way of further alternative example, the gearbox 30 may be a differential gearbox in which the ring gear 38 and the planet carrier 34 are both allowed to rotate.

[0075] It will be appreciated that the arrangement shown in FIGS. 2 and 3 is by way of example only, and various alternatives are within the scope of the present disclosure. Purely by way of example, any suitable arrangement may be used for locating the gearbox 30 in the engine 10 and/or for connecting the gearbox 30 to the engine 10. By way of further example, the connections (such as the linkages 36, 40 in the FIG. 2 example) between the gearbox 30 and other parts of the engine 10 (such as the input shaft 26, the output shaft and the fixed structure 24) may have any desired degree of stiffness or flexibility. By way of further example, any suitable arrangement of the bearings between rotating and stationary parts of the engine (for example between the input and output shafts from the gearbox and the fixed structures, such as the gearbox casing) may be used, and the disclosure is not limited to the exemplary arrangement of FIG. 2. For example, where the gearbox 30 has a star arrangement (described above), the skilled person would readily understand that the arrangement of output and support linkages and bearing locations would typically be different to that shown by way of example in FIG. 2.

[0076] Accordingly, the present disclosure extends to a gas turbine engine having any arrangement of gearbox styles (for example star or planetary), support structures, input and output shaft arrangement, and bearing locations.

[0077] Optionally, the gearbox may drive additional and/or alternative components (e.g. the intermediate pressure compressor and/or a booster compressor).

[0078] Other gas turbine engines to which the present disclosure may be applied may have alternative configurations. For example, such engines may have an alternative number of compressors and/or turbines and/or an alternative number of interconnecting shafts. By way of further example, the gas turbine engine shown in FIG. 1 has a split flow nozzle 18, 20 meaning that the flow through the bypass duct 22 has its own nozzle 18 that is separate to and radially outside the core exhaust nozzle 20. However, this is not limiting, and any aspect of the present disclosure may also apply to engines in which the flow through the bypass duct 22 and the flow through the core 11 are mixed, or combined, before (or upstream of) a single nozzle, which may be referred to as a mixed flow nozzle. One or both nozzles (whether mixed or split flow) may have a fixed or variable area. Whilst the described example relates to a turbofan engine, the disclosure may apply, for example, to any type of gas turbine engine, such as an open rotor (in which the fan stage is not surrounded by a nacelle) or turboprop engine, for example. In some arrangements, the gas turbine engine 10 may not comprise a gearbox 30.

[0079] The geometry of the gas turbine engine 10, and components thereof, is defined by a conventional axis system, comprising an axial direction (which is aligned with the rotational axis 9), a radial direction (in the bottom-to-top direction in FIG. 1), and a circumferential direction (perpendicular to the page in the FIG. 1 view). The axial, radial and circumferential directions are mutually perpendicular.

[0080] Due to the high temperatures and the high mechanical loads to which turbine blades are subjected, single crystal casting with tight orientation control may be used to produce turbine blades. It should be noted that single crystal casting with tight orientation control can also be used to produce other components that are subjected to high temperatures and high mechanical loads.

[0081] In single crystal casting, the crystal orientation of the resulting component is controlled by a metal seed, which has a crystal orientation close to a nominal orientation.

[0082] FIG. 4 illustrates a block diagram of a system 100 for measuring grain orientations of a metal component 102 (shown in FIG. 6). In some embodiments, the metal component 102 may be an aerofoil. The system 100 includes a computer-controllable fixture 104 for positioning the metal component 102. The computer-controllable fixture 104 may be configured to automatically locate, position, move and fix the metal component 102 associated with the computer-controllable fixture 104. Further, the computer-controllable fixture 104 may be configured to calculate three-dimensional (3-D) coordinates of the metal component 102 at all possible locations at which the metal component 102 may be positioned. In some embodiments, the computer-controllable fixture 104 is a six-axis computer-controllable fixture. The metal component 102 may be suitably positioned on the computer-controllable fixture 104 as per application requirements.

[0083] The system includes an X-ray source 108 for irradiating the metal component 102 and an X-ray detector 110 for detecting diffracted X-rays. The X-ray source 108 and the X-ray detector 110 may be of any suitable type which may be compatible with application requirements pertaining to the present disclosure. The present idea is not limited by type of the X-ray source 108 and the X-ray detector 110 in any manner.

[0084] The system 100 further includes a controller 112. The controller 112 may be communicably coupled with the computer-controllable fixture 104, the X-ray source 108 and the X-ray detector 110. The controller 112 may control various functional aspects of the computer-controllable fixture 104, the X-ray source 108 and the X-ray detector 110.

[0085] The controller 112 of the system 100 may include a processor (not shown) and a memory (not shown). The memory may include computer executable instructions that are executable by the processor to perform a logic associated with the controller 112. In an example, the controller 112 may include analog-to-digital converters to process the signals from the various components of the system 100.

[0086] The processor and the memory may be in communication with each other. The processor may be in communication with additional components. The processor may be in communication with a user interface (not shown) that may indicate to an operator grain orientation measurements and related analysis. In some embodiments, the processor may also receive inputs from the operator via the user interface. The controller 112 may control various parameters of the system 100 based on the inputs received from the operator.

[0087] The processor may be any device that performs logic operations. The processor may include a general processor, a central processing unit, an application specific integrated circuit (ASIC), a digital signal processor, a field programmable gate array (FPGA), a digital circuit, an analog circuit, a controller, a microcontroller, any other type of processor, or any combinations thereof. The processor may include one or more components operable to execute computer executable instructions or computer code embodied in the memory.

[0088] Some of the features of the controller 112 may be stored in a computer readable storage medium (for example, as logic implemented as computer executable instructions or as data structures in memory). All or part of the controller 112 and its logic and data structures may be stored on, distributed across, or read from one or more types of computer readable storage media. Examples of the computer readable storage medium may include a hard disk, a floppy disk, a CD-ROM, a flash drive, a cache, volatile memory, non-volatile memory, RAM, flash memory, or any other type of computer readable storage medium or storage media. The computer readable storage medium may include any type of non-transitory computer readable medium, such as a CD-ROM, a volatile memory, a non-volatile memory, ROM, RAM, or any other suitable storage device.

[0089] A network interface (not shown) may facilitate communication of the controller 112 with a packet-based network, such as a local area network. Additionally, peripheral interfaces (not shown) may be provided. For example, the peripheral interfaces may include RS232 serial interfaces to connect the controller 112 to the other parts of the system 100 to allow control thereof. The peripheral interfaces may further include Universal Serial Bus (USB) interfaces to facilitate connection of human interface devices to the controller 112, along with a Video Graphics Array (VGA) interface to allow connection of a display (e.g., the user interface) to the controller 112.

[0090] FIG. 5 shows various components of the system 100. The X-ray source 108, the X-ray detector 110 and the controller 112 are appropriately placed to make sure measurements are effectively recorded. The system 100 further includes the computer controllable fixture 104. The computer controllable fixture 104 includes a first platform 118, a second platform 120 and a third platform 122. The first platform 118 is adapted to translate along X-axis. The second platform 120 is adapted to translate along Y-axis. Similarly, the third platform 122 is adapted to translate along Z-axis. The third platform 122 further includes a datum location and clamping arrangement 124 to hold the metal component 102. The clamping arrangement 124 may also be adapted to rotate the metal component 102 about X-axis, and Y-axis. Further, the third platform 122 may be adapted to rotate about Z-axis. Thus, the metal component 102 may be placed in any orientation and position in 3-D spatial plane.

[0091] FIG. 6 shows the metal component 102 on the computer-controllable fixture 104. The controller 112 may move the metal component 102 via the computer-controllable fixture 104 to various measurement locations. Moving the metal component 102 includes translating the metal component 102 along one or more axes such that a distance between the X-ray source 108, each measurement location on the metal component 102 and the X-ray detector 110 is substantially constant. As shown in FIG. 7A, a first measurement location P1 and a second measurement location P2 are defined at the metal component 102. The controller 112 may move the metal component 102 in any suitable manner. The metal component 102 may be placed such that the first measurement location P1 on the metal component 102 is located at a certain spatial location before translational movement. The controller 112 may move the metal component 102 such that the second measurement location P2 on the metal component 102 comes to coordinates of the spatial location of the first measurement location P1 after the translational movement. As illustrated, a distance D1 between the X-ray source 108 and the first measurement location P1 before translational movement remains same as the distance D1 between the X-ray source 108 and the second measurement location P2 after translational movement. Similarly, a distance D2 between the X-ray detector 110 and first measurement location P1 before translational movement remains same as the distance D2 between the X-ray detector 110 and the second measurement location P2 after translational movement.

[0092] Further, moving the metal component 102 may also include rotating the metal component 102 about one or more planes such that a normal to a surface of the metal component 102 at each measurement location subtends a substantially constant angle at the X-ray source 108. As shown in FIG. 7B, the first measurement location P1 and the second measurement location P2 is defined at the metal component 102. The controller 112 may move the metal component 102 such that the second measurement location P2 on the metal component 102 spatially comes to coordinates of the first measurement location P1 before rotational movement of the metal component 102. Further as illustrated, the normal to the surface of the metal component 102 at the first measurement location P1 before rotational movement and at the second measurement location P2 after rotational movement subtend equal angles A1 at the X-ray source 108.

[0093] Further, it should be contemplated that if the measurement position on the metal component 102 is changed through, for example, translation along X and Z axis only, then there is no change observed in resulting observations. However, if the metal component 102 part is moved along the Y axis (i.e., forward and backwards) then the diffracted X-rays will be out of line with the X-ray detector 110. Thus, this distance may have to remain fixed.

[0094] Furthermore, if the measurement position is changed to a curved face instead of a flat surface, then the metal component 102 may need to be rotated about appropriate axes so that the new measurement local area is still perpendicular, and adjust the position of the metal component 102 along Y-axis such that the X-ray detector 110 may detect the diffracted X-rays 116. Now, the reading obtained would be in a different viewing axis and may also require automatic selection of a different Laue mask along corresponding viewing axis accordingly. This information may be compared with historical data as well. However, a mathematical transformation is preferably applied to convert the measurement back into a reference system which used initially during part development and design process. It should be noted that this is a crystallographic transformation and not just a geometric transformation. This step may also be carried out through pre-determined lookup tables, graphs etc.

[0095] With combined reference to FIGS. 4-6, the controller 112 is configured to receive a series of measurement locations on the metal component 102. The series of measurement locations are defined as locations at which a series of measurements are taken. The series of measurements are indicative of grain orientations at corresponding measurement locations. In some embodiments, the measurement locations may be provided by an engineer or any other personnel involved with the grain orientation measurement process. Measurement locations may be defined as coordinates with respect to reference axes.

[0096] When the controller 112 moves the metal component 102 from a first measurement location to a second measurement location, the controller 112 may also define the nominal grain orientation of the metal component 102 at the second measurement location. The controller 112 may already have nominal grain orientation of the metal component 102 at the first measurement location. Knowing the coordinates of the second measurement location, the controller 112 may apply appropriate spatial transformations to the nominal grain orientation at the first measurement location to derive the nominal grain orientation at the second measurement location. For example, comparison between coordinates of the first and second measurement location may provide angular movements. The angular movements may then be split into angular movements along reference axes, which may further be used to derive nominal grain orientation at the second location. Predetermined reference transformation matrices may be provided with the controller 112 which may calculate the value of nominal grain orientation at each measurement location.

[0097] It should be contemplated that the above explanation is merely exemplary and various other such transformation methods may be used to determine nominal grain orientation of the metal component 102 at each measurement location.

[0098] The controller 112 defines a nominal grain orientation at each measurement location. The nominal grain orientation is defined based on a viewing attitude at each measurement location. The nominal grain orientation at a first measurement location may be defined as a vector N1 provided below.

N1=a1i+a2j+a3k

[0099] To derive a nominal grain orientation at another measurement location, the controller 112 may calculate a displacement vector through the following exemplary method:

[0100] First measurement location: P1=x1i+y1j+z1k

[0101] Second measurement location: P2=x2i+y2j+z2k

[0102] Displacement vector. D=(x2−x1)i+(y2−y1)j+(z2−z1)k

[0103] To calculate a nominal grain orientation N2 at the second measurement location P2, the nominal grain orientation N1 at the first location P1 may be clubbed with the displacement vector D:

N2=N1[D]

N2=(a1i+a2j+a3k)[(x2−x1)i+(y2−y1)j+(z2−z1)k]

[0104] The above calculations are provided as an exemplary reference, and any suitable mathematical strategy may be utilized to define the various parameters.

[0105] The controller 112 loads the measurement locations into the computer-controllable fixture 104 suitable for positioning the metal component 102. The controller 112 locates the metal component 102 in the computer-controllable fixture 104. The term ‘locate’, as used herein, refers to positioning the metal component 102 on the computer-controllable fixture 104 such that the controller 112 has exact location coordinates of the metal component 102 along with orientation with respect to the reference axes.

[0106] The controller 112 then takes a series of measurements at the series of measurement locations. In some embodiments, taking the series of measurements further comprises recording the series of measurements. The series of measurements are taken with help of the X-ray source 108 and the X-ray detector 110. The controller 112 irradiates the metal component 102 with an X-ray beam 114 using the X-ray source 108 at each measurement location and detects diffracted X-rays 116 from each measurement location on the metal component 102 using the X-ray detector 110. Record of the measurements may be maintained in any suitable format which may be reusable for future references and further calculations and analysis.

[0107] After recording the diffracted X-rays by the X-ray detector 110, the controller 112 may select an appropriate Laue pattern mask to fit the recorded diffraction pattern. The Laue pattern mask may be a pre-determined diffraction pattern which may exhibit similar patterns as to recorded diffraction pattern. After matching with a known Laue pattern, appropriate angular transformations may be applied for calculating orientation.

[0108] Fitting a known characteristic Laue pattern to the recorded diffraction pattern may include selecting closest Laue pattern from a pre-defined library of Laue patterns corresponding to various crystallographic orientations, and using the known information about the crystallographic orientation to define the crystallographic orientation of the metal component 102 accordingly. This step may provide ease of further calculations and data processing. The controller 112 may have a pre-stored library of various Laue patterns from which the controller 112 may select the one which may be closest to the recorded pattern.

[0109] Afterwards, the controller 112 analyses the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location. Analysing the measurement at each measurement location further comprises determining a difference between the measurement at each measurement location and the nominal grain orientation at the corresponding measurement location. Further, the difference is compared with a threshold difference. The threshold difference may be defined as a value of difference between the measurement and the nominal grain orientation at a measurement location which will not provide an appropriate strength to the join of the metal component 102 with another metal component (not shown) at a measurement location. The threshold difference will vary depending on the materials involved, but commonly any difference beyond 10 degrees makes for an unacceptably weak bond.

[0110] The controller 112 may determine an alternative location of joining the metal component 102 to another metal component (not shown) based on the comparison between the measurement and the nominal grain orientation. For example, if the difference exceeds the threshold difference, then the controller 112 may proceed to determine the alternative location. Alternatively, if the difference does not exceed the threshold difference, the controller 112 may provide a confirmation of proceeding with further steps of the manufacturing process.

[0111] FIG. 8 shows a flow chart depicting a method 200 of measuring grain orientations of the metal component 102.

[0112] At step 202, a series of measurement locations are defined on the metal component 102 at which to take a series of measurements indicative of grain orientations at corresponding measurement locations.

[0113] At step 204, a nominal grain orientation is defined at each measurement location. In some embodiments, the nominal grain orientation is defined based on a viewing attitude at each measurement location.

[0114] At step 206, the measurement locations are loaded into the computer-controllable fixture 104 suitable for positioning the metal component 102. The computer-controllable fixture 104 may be a six-axis computer-controllable fixture.

[0115] At step 208, the metal component 102 is located in the computer-controllable fixture 104.

[0116] At step 210, the series of measurements are taken at the series of measurement locations. In some embodiments, taking the series of measurements further comprises recording the series of measurements.

[0117] At step 212, the measurement is analysed at each measurement location relative to the nominal grain orientation at the corresponding measurement location. In some embodiments, analysing the measurement at each measurement location further includes determining a difference between the measurement at each measurement location and the nominal grain orientation at the corresponding measurement location. The method 200 further includes comparing the difference with a threshold difference. In an embodiment, analysing the measurement at each measurement location further includes fitting a Laue pattern mask to the measurement.

[0118] In further steps, an alternative location of joining the metal component 102 to another metal component may be determined based on the comparison between the measurement and the nominal grain orientation.

[0119] In some embodiments, the method 200 may include irradiating the metal component 102 with an X-ray beam using the X-ray source 108 at each measurement location. The method 200 may further include detecting diffracted X-rays from each measurement location on the metal component 102 using the X-ray detector 110.

[0120] In some embodiments, the method 200 may include moving the metal component 102 via the computer-controllable fixture 104 to each measurement location. Moving the metal component 102 may include translating the metal component 102 along one or more axes such that a distance between the X-ray source 108, each measurement location on the metal component 102 and the X-ray detector 110 is substantially constant. Moving the metal component 102 may also include rotating the metal component 102 about one or more planes such that a normal to a surface of the metal component 102 at each measurement location subtends a substantially constant angle at the X-ray source 108.

[0121] It should be noted that the present disclosure focuses on a combination of a system 100 including the computer controllable fixture 104, compensation to re-position the metal component 102 to get a reading, automatic selection of a correct Laue pattern mask, and transformation of said reading back to a nominal (based on the exact compensations applied by the movable fixture 104). The present disclosure may eliminate any manual calculation steps. This may allow the present disclosure to be applied in volume production of the metal component 102, which cannot be envisioned through conventional methods.

[0122] The present disclosure may be applied to various applications. In one embodiment, the movable fixture 104 may be used for measuring multiple points on the same flat surface, in a single coordinate reference system, e.g., test bar or blade root to tip.

[0123] In another embodiment, the present disclosure may be used for measuring multiple points on the metal component 102, where the distance between X-ray source 108 and the metal component 102 changes across the surface and needs to be compensated to get a reading, but the coordinate system does not change.

[0124] In another embodiment, the present disclosure may be used for measuring multiple points on a curved surface of the metal component 102, adjusting component rotation to get a reading (for example as shown in FIG. 7), selecting the correct Laue pattern mask, and transforming the results back to the nominal reference system.

[0125] The present disclosure may also be used for defining suitable joint areas, for spot or area joining process. Further, the functionality of the present disclosure may be extended to measure multiple pieces in multiple locations, store the data, and match the multiple pieces based on their overall level of grain mismatch, even if they are not measured in exactly the same place. This can be done by the mathematical transformations of either of the halves of the joints.

[0126] It will be understood that the disclosure is not limited to the embodiments above-described and various modifications and improvements can be made without departing from the concepts described herein. For example, instead of lost-wax casting, die casting or sand casting may be used with the present disclosure. Except where mutually exclusive, any of the features may be employed separately or in combination with any other features and the disclosure extends to and includes all combinations and sub-combinations of one or more features described herein.