SYSTEM AND METHOD FOR HOLOGRAPHIC IMAGING OF A SINGLE PLANE OF AN OBJECT
20210271204 · 2021-09-02
Inventors
Cpc classification
G02B27/58
PHYSICS
G03H2210/33
PHYSICS
G03H2001/005
PHYSICS
G03H1/0486
PHYSICS
G03H1/0443
PHYSICS
G03H1/041
PHYSICS
G03H2001/0458
PHYSICS
G03H1/0493
PHYSICS
G02B21/367
PHYSICS
G02B21/361
PHYSICS
International classification
G03H1/00
PHYSICS
G02B21/36
PHYSICS
G02B27/58
PHYSICS
Abstract
A system and method to produce a hologram of a single plane of a three dimensional object includes an electromagnetic radiation assembly to elicit electromagnetic radiation from a single plane of said object, and an assembly to direct the elicited electromagnetic radiation toward a hologram-forming assembly. The hologram-forming assembly creates a hologram that is recorded by an image capture assembly and then further processed to create maximum resolution images free of an inherent holographic artifact.
Claims
1. A holographic method for detecting interference of electromagnetic waves emitted exclusively from a single plane of a three dimensional object, the method comprising: receiving, at an optical arrangement, electromagnetic waves from the three dimensional object; for each point of a plurality of points in the single plane of the three dimensional object: forming, in the optical arrangement, a first beam of electromagnetic waves and a second beam of electromagnetic waves from electromagnetic waves emitted exclusively from said each point; and detecting exclusively a pattern of interference between the first beam and the second beam; reconstructing a hologram using the detected patterns corresponding to the plurality of points in the single plane.
2. The method of claim 1 in which the electromagnetic waves are light.
3. The method of claim 2 in which the electromagnetic waves are fluorescent light, luminescent light, or reflected light.
4. (canceled)
5. (canceled)
6. (canceled)
7. The method of claim 2 in which the electromagnetic waves are incoherent light.
8. The method of claim 1, wherein the electromagnetic waves emitted from the single plane are used to create an image.
9. The method of claim 8, wherein the resolution of the image exceeds the Rayleigh or Abbe limit.
10. The method of claim 1, wherein the receiving includes initially collecting the electromagnetic waves from the object with a microscope objective in the optical arrangement.
11. The methods of claim 8, further comprising combining a series of single plane images to create a three dimensional image.
12. A holographic system for detecting interference of electromagnetic waves emitted exclusively from a single plane of a three dimensional object, the system comprising: an optical arrangement configured to: receive electromagnetic waves from the three dimensional object; for each point of a plurality of points in the single plane of the three dimensional object, form a respective first beam of electromagnetic waves and a respective second beam of electromagnetic waves from electromagnetic waves emitted exclusively from said each point; and a detector configured to: for each point of a plurality of points in the single plane of the three dimensional object, detect exclusively a pattern of interference between the respective first beam and the respective second beam; and reconstruct a hologram using the detected patterns corresponding to the plurality of points in the single plane.
13. The system of claim 12 in which the electromagnetic waves are light.
14. The system of claim 13 in which the electromagnetic waves are fluorescent light, luminescent light and reflected light.
15. (canceled)
16. (canceled)
17. (canceled)
18. The system of claim 13, wherein the electromagnetic waves are incoherent light.
19. The system of claim 12, wherein the electromagnetic waves emitted from the single plane are used to create an image.
20. The system of claim 19, wherein the resolution of the image exceeds the Rayleigh or Abbe limit.
21. The system of claim 12, wherein the electromagnetic waves are initially collected with a microscope objective of the optical arrangement.
22. The systems of claim 19, wherein a series of single plane images is combined to create a three dimensional image.
23. A super-resolution optical microscope system, said system comprising: an optical system containing one or more conjugate image planes and a detection plane, with a spatial filter placed at a conjugate image plane; a microscope objective configured to receive light from an object and direct said light to the optical system, wherein the optical system is configured to receive the light from the microscope objective, spatially filter the received light at a conjugate image plane, and produce a hologram at the detection plane; and an image recording device configured to record the hologram at the detection plane.
24. (canceled)
25. The holographic system of claim 13, wherein a confocal technique is used to isolate, for each said point in the single plane of the three dimensional object, the electromagnetic waves emitted exclusively from said each point.
26. The holographic system of claim 25, further comprising a confocal pinhole at a conjugate plane between the object and the detection plane in the optical arrangement, wherein the confocal technique includes operating the confocal pinhole to isolate electromagnetic waves emitted exclusively from said each point, and wherein the conjugate plane containing the confocal pinhole is common to the image planes of both the first and second beams formed from the electromagnetic waves emitted from each said point.
27. The holographic system of claim 25, further comprising a spinning disk at a conjugate plane between the object and the detection plane in the optical arrangement, wherein the confocal technique includes operating the spinning disk to isolate electromagnetic waves emitted exclusively from said each point, and wherein the conjugate plane containing the spinning disk is common to the image planes of both the first and second beams formed from the electromagnetic waves emitted from each said point.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION OF THE DRAWINGS
[0014] With reference to the detailed discussion of the drawings, it is emphasized that the drawings and descriptions are meant to present the composition and operating principles to a sufficient degree to enable a fundamental understanding of the method and system of the invention. Thus certain details such as polarization sensitive optics and compound lens assemblies are represented in the most simplified form to present a clear and readily understood schematic, appropriate to enable one skilled in the art to appreciate the system and method.
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REFERENCES CITED
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TABLE-US-00001 U.S. PATENT DOCUMENTS 8,009,340 B2 August 2011 Rosen 8,179,578 B2 May 2012 Rosen et al. 8,542,421 B2 September 2013 Rosen et al. 8,405,890 B2 March 2013 Rosen 6,147,798 B2 November 2000 Brooker et al. OTHER PUBLICATIONS Siegel et al., in Optics Express, Vol. 20, p. 19822 (2012). Jost, et al., in Annu. Rev. Mater. Res. Vol/43, pp 261-282 (2013).