LEVEL SENSOR OR POINT LEVEL SENSOR WITH TEMPERATURE COMPENSATION

Abstract

A sensor is provided for generating an output signal for detecting a limit level of a medium, a filling level of the medium, and/or for differentiating between different media, the sensor including: a processor to process a measurement signal generated using the sensor; and a reference unit to generate a reference signal, the processor is further configured to perform temperature compensation using the reference signal, the processor and the reference unit each having a signal conversion unit to provide temperature-dependent signal conversion, the signal conversion units being thermally coupled to one another, and the temperature compensation includes compensating for temperature dependency of the signal conversion unit of the processor using a thermal coupling.

Claims

1.-21. (canceled)

22. A sensor for generating an output signal for detecting a limit level of a medium, a filling level of the medium, and/or for differentiating between different media, the sensor comprising: a processor configured to process a measurement signal generated using the sensor; and a reference unit configured to generate a reference signal, wherein the processor is further configured to perform temperature compensation using the reference signal, wherein the processor and the reference unit each have a signal conversion unit configured to provide temperature-dependent signal conversion, wherein the signal conversion units are thermally coupled to one another, and wherein the temperature compensation comprises compensating for temperature dependency of the signal conversion unit of the processor using a thermal coupling.

23. The sensor according to claim 22, wherein the signal conversion unit of the reference unit is part of a demodulator of the processor.

24. The sensor according to claim 22, wherein each of the signal conversion units has a diode or consists of a diode.

25. The sensor according to claim 22, wherein the sensor is configured to form a probe impedance using the medium, and wherein the measurement signal is dependent on the probe impedance.

26. The sensor according to claim 25, wherein the sensor is further configured to apply a signal to the probe impedance, the signal being an AC voltage signal or containing an AC voltage component.

27. The sensor according to claim 22, wherein the processor is further configured to generate an amplified or unamplified signal difference based on the reference signal.

28. The sensor according to claim 22, wherein the reference unit is further configured to generate the reference signal based on an essentially temperature-independent DC voltage signal.

29. The sensor according to claim 22, wherein the reference signal is a DC voltage signal.

30. The sensor according to claim 29, wherein the reference unit is further configured to receive an input signal, which is a DC voltage signal, and wherein the reference unit is further configured to generate the reference signal based on the input signal.

31. The sensor according to claim 22, wherein the measurement signal has an AC voltage component and a DC voltage component, and/or wherein a DC voltage component is added to the measurement signal using a circuit of the sensor.

32. The sensor according to claim 31, wherein the signal conversion unit of the processor has a diode, which functions as a rectifier.

33. The sensor according to claim 32, wherein the diode is part of a demodulator of the processor.

34. The sensor according to claim 33, wherein the demodulator is an amplitude demodulator.

35. The sensor according to claim 31, wherein the reference signal is a DC voltage signal.

36. The sensor according to claim 35, wherein the reference unit is further configured to receive an input signal, which is a DC voltage signal, and wherein the reference unit is further configured to generate the reference signal based on the input signal.

37. The sensor according to claim 35, wherein the sensor includes a temperature sensor configured to detect a temperature value.

38. The sensor according to claim 37, wherein the sensor is arranged and configured to detect a temperature value of the signal conversion units.

39. The sensor according to claim 37, wherein the sensor is configured to adjust a level of the reference signal and/or a level of the DC voltage component based on the detected temperature value.

40. The sensor according to claim 22, wherein the measurement signal has an AC voltage component and a DC voltage component, wherein the DC voltage component is generated using a DC voltage, which is received by a probe impedance, and wherein the probe impedance is formed by the sensor using the medium.

41. The sensor according to claim 22, wherein: (a) the signal conversion units are arranged in a common housing, wherein the thermal coupling is effected using the common housing, and/or (b) the signal conversion units are each part of a common semiconductor module.

Description

[0036] The above-mentioned and further advantageous features of the present disclosure will become even more apparent from the following detailed description of the exemplary embodiments with reference to the accompanying drawings. It must be noted that not all possible embodiments of the present disclosure necessarily achieve all or some of the advantages set forth herein.

[0037] FIG. 1 shows a schematic view of a structure of a sensor according to an embodiment;

[0038] FIG. 2 shows a schematic view of the monitoring of a limit level using the evaluation unit of the sensor shown in FIG. 1 according to the embodiment;

[0039] FIG. 3 shows a schematic block diagram of the sensor shown in FIG. 1 according to the embodiment;

[0040] FIG. 4 shows a schematic view of the signals generated by the sensor, in comparison with a comparative example, in which a high-frequency amplifier is used and which is not part of the claimed subject matter; and

[0041] FIG. 5 shows a circuit diagram for the source unit, the processing unit and the reference unit of the sensor shown in FIG. 1 according to the embodiment.

[0042] FIG. 1 shows a schematic view of a sensor 100 according to one embodiment, which is configured as a point level sensor. The sensor 100 is configured particularly as an impedance point level sensor, in which measurements of impedance values of a probe impedance are used to monitor the limit level of a medium. The medium may be, for example, a filling medium within a container.

[0043] In the embodiment shown, the probe impedance has a capacitance, the electrical fields of which extend at least partially through the medium. However, alternatively or additionally, it is also conceivable that electrical and/or magnetic fields of an ohmic resistance and/or an impedance extend through the medium.

[0044] However, the present invention is not limited to such a sensor for limit level monitoring. It is conceivable that one or more aspects of the present invention are used to form sensors which detect the filling level of a medium and/or which differentiate between different media.

[0045] As shall be described in more detail below, the sensor 100 is configured as a resonance sensor. The sensor 100 applies a signal, which has an AC voltage component or which is an AC voltage signal, to the probe impedance. The signal to be applied to the probe impedance is an essentially periodic signal of a time-varying frequency. The sensor 100 is also configured to detect one or more parameters of a resonance behaviour of the probe impedance. As shall be described in more detail below, the sensor 100 determines a signal amplitude at a resonance frequency and the frequency value of the resonance frequency, which each depend on the probe impedance. Alternatively or additionally, it is also conceivable that the point level sensor detects other parameters, such as the sharpness of resonance (also referred to as resonance quality or Q factor), a change in the frequency value of the resonance frequency, and/or a change in the signal amplitude at the resonance frequency.

[0046] As shown in FIG. 1, the sensor 100 has a measuring probe 102, which has a measuring electrode 106, an insulation 107, and a reference electrode 108. The measuring electrode 106 and the reference electrode 108 form a corresponding pair of electrodes, between which the measuring capacitance 110 is formed, which is part of the probe impedance. The measuring electrode 106 and the reference electrode 108 are configured such that field lines of the measuring capacitance 110 extend through a spatial area, in which the medium is located in the filled state. The measuring electrode 106 and the reference electrode 108 are therefore configured for capacitive measurement on the medium. It is conceivable that the sensor 100 is configured such that the reference electrode 108 is at least partially provided by the wall of the container that contains the medium.

[0047] The electrodes 106 and 108 are made of metal. The insulation, for example, may be made of plastic, particularly PEEK (polyether ether ketone). The reference electrode 108 is configured to be tubular, wherein the measuring electrode 106 is arranged at a distal end of the reference electrode 108. The insulation 107 forms a sealing closure at a distal end of the reference electrode 108, wherein the measuring electrode 106 is arranged in a, thus formed, interior space of the measuring probe 102. In the filled state, a distal end section of the measuring probe 102 is surrounded by the medium such that an end section of the reference electrode 108 is in contact with the medium. However, it is also conceivable that the sensor 100 is configured such that a filled state is detected when the medium is at a distance from the distal end section of the measuring probe 102, said distance being less than a predefined distance.

[0048] The probe 102 also has an inductance 109, which is connected in series to the measuring electrode 106 and thus with the measuring capacitance 110. In the embodiment shown, the inductance 109 is configured to be discrete. This means particularly that the inductance is configured as a separate component from the other components. For example, the inductance 109 may be configured as an air-core coil. The inductance value of the inductance 109 is selected such that the resonance frequency, which depends on the inductance 109 and the measuring capacitance 110, is between 100 MHz and 200 MHz for different media to be measured and/or filling states (full, empty with deposits of filling material, or empty without deposits of filling material). An inductance value of the inductance 109 may be, for example, in a range between 0.5 nanohenry and 1000 nanohenry, particularly in a range between 0.5 nanohenry and 700 nanohenry, or in a range between 0.5 nanohenry and 200 nanohenry.

[0049] The sensor 100 furthermore has a control and evaluation unit 101 which has a signal generation unit 103, a processing unit 104, and a control unit 105. The signal generation unit 103 is configured to apply a probe signal to the probe impedance which consists of the inductance 109 and the measuring capacitance 110. The processing unit 104 is configured to process a measurement signal which is generated using the probe impedance, to which the probe signal is applied. The control unit 105 is configured to determine the frequency value of the resonance frequency and an amplitude value at the resonance frequency, which depends on an absolute value of the probe impedance at the resonance frequency. On the basis of the determined values, the control unit 105 generates an output signal of the sensor 100, for example, in the form of one or more switching commands.

[0050] FIG. 2 is a schematic view of the monitoring of the limit level by the sensor 100 on the basis of the determined frequency value of the resonance frequency and on the basis of the determined signal amplitude at the resonance frequency. The curve 200 shows the frequency-dependent course of the signal amplitude A when the measuring probe is clean (i.e., without deposits of the medium on the point level sensor) when the filling level of the medium is lower than the predefined limit level. The curve 201 shows the frequency-dependent course of the signal amplitude A when the filling level is lower than the predefined limit level, but with deposits of the medium (such as deposits of ketchup) on the sensor. The curve 202 shows the frequency-dependent course of the signal amplitude A when the filling level is greater than or equal to the predefined limit level, i.e., when the distal end section of the measuring probe 102 (shown in FIG. 1) is covered by the medium.

[0051] As shall be described below, the switching commands “empty” and “full” are generated by the control unit 105 on the basis of the frequency value f of the resonance frequency and on the basis of the amplitude value A of the measurement signal at the resonance frequency. The amplitude value A depends on the absolute value of the probe impedance. If the minimum is in range I, i.e., if the frequency value of the resonance frequency is greater than a frequency value f.sub.0 or if the amplitude at the resonance frequency is greater than an amplitude value A.sub.0, the control unit 150 outputs the switching command “empty.” However, if the minimum is in range II, i.e., if the resonance frequency is at a frequency value which is lower than the frequency value f.sub.0 and the amplitude value is less than the amplitude value z.sub.0, the switching command “full” is output.

[0052] The two switching ranges I and II, defined by the frequency value f.sub.0 and the amplitude value A.sub.0, may be invariably fixed, for example, during the production of the sensor. Alternatively, it is conceivable that the sensor is configured such that switching ranges I and II are configurable by a user. For example, it is conceivable that the frequency value f.sub.0 and/or the amplitude value A.sub.0 is adjustable using a user interface of the sensor. However, it has been shown that, for many applications, the frequency value f.sub.0 and the amplitude value A.sub.0 may be selected such that invariably fixed values are sufficient to ensure a reliable limit level monitoring. As a result, an adjustment by the customer, which may be time-consuming, may be omitted.

[0053] FIG. 3 shows a schematic block diagram of the signal generation unit 103, the processing unit 104, the probe impedance 303, and a reference unit 402 of the sensor, which shall be described in more detail below. FIG. 4 shows a schematic view of the signals generated by the signal generation unit 103 and by the processing unit 104 using the probe impedance 303.

[0054] The signal generation unit 103 has a supply unit 307, a D/A converter 301, and a voltage-controlled oscillator 302 (VCO). The oscillator 302 is connected to the supply unit 307 and is controlled using the D/A converter with a voltage ramp at the input. As a result, a source signal is generated at an output of the oscillator 302, said source signal being an AC voltage signal of constant amplitude and having a frequency ramp over a predefined or a user-configurable frequency sweep range. However, it is also conceivable that the amplitude maxima of the source signal change periodically or non-periodically. Additionally or alternatively, it is conceivable that the source signal does not have a continuous frequency ramp, but that the frequency changes step-wise in temporally successive steps. The source signal may, for example, sweep through a frequency range between 100 MHz and 200 MHz continuously and/or step-wise.

[0055] The source signal is used to apply a voltage to the probe impedance 303, which is formed from the inductance 109 (shown in FIG. 1) and the measuring capacitance 110, said voltage being an AC voltage signal or having an AC voltage component, wherein the frequency is changed continuously and/or step-wise. The resulting resonance behaviour is processed using the processing unit 104. As shown in FIG. 3, the processing unit 104 has an amplitude demodulator 304 (envelope demodulator) and an amplification unit 305, which is connected downstream of the amplitude demodulator 304. The amplified signal, which represents the resonance curve, is digitised using an A/D converter 306 of the processing unit 104. The resonance curve is analysed by the control unit 105 (shown in FIG. 2) using the digitised signal, and the output signal of the sensor is generated.

[0056] The signal 501 of FIG. 4 shows the AC voltage component of the measurement signal, which is obtained using the probe impedance, to which the source signal is applied. The signal 501 has frequency components of the frequency ramp of the source signal, which form the carrier signal, wherein the carrier signal is amplitude-modulated due to the resonance behaviour of the probe impedance. The signal amplitude is reduced at the resonance frequency because the absolute value of the impedance of the probe impedance exhibits a minimum at the resonance frequency.

[0057] As shown by the signal 504, the measurement signal contains, in addition to the AC voltage component, a DC voltage component in order to provide a signal 504 with higher signal values. As a result, the signal values of the input signal of the amplitude demodulator (shown in FIG. 3) are increased such that the positive amplitude maxima of the DC voltage component exceed the threshold voltage of a diode of the amplitude demodulator 304, which is used for rectification. However, additionally or alternatively, it is also conceivable that the signal 501 is generated as the measurement signal and a DC voltage component is added using a separate, downstream circuit, which is arranged, for example, in the processing unit 104, in order to obtain the signal 504.

[0058] As shown in FIG. 3 (and as shall be described in more detail below with reference to FIG. 5), the DC voltage component is generated by receiving, from the supply unit, a DC voltage by the probe impedance 303. The DC voltage may be temperature-independent or substantially temperature-independent.

[0059] FIG. 4 also shows the demodulated signal 505 which is output by the amplitude demodulator on the basis of the signal 504 and which essentially represents the resonance behaviour of the probe impedance. In the depicted embodiment, the demodulated signal 505 has, due to the temperature dependency of the characteristic curve of the rectifier diode of the amplitude demodulator, a temperature dependency which essentially corresponds to an offset, as is shown schematically in FIG. 4 by the dashed line 508 below the demodulated signal 505. The dashed line 508 shows the output signal of the amplitude demodulator at a lower temperature. It is advantageous to amplify the output signal 505 of the amplitude demodulator in order to obtain sufficiently high reliability in the monitoring of the limit level. As a result, a resolution of the signal may be improved, in particular by several bits. This allows, for example, for a better utilisation of a input range of the A/D converter 306 (shown in FIG. 3). However, as shall be described below, this produces a comparatively large error if the temperature dependency is not compensated for.

[0060] Specifically, as is shown by the signal 506, it is necessary for purposes of amplification to first subtract a DC voltage from the output signal 505 and to amplify the difference, so that the amplified signal 507 is obtained.

[0061] As can be seen from the dashed signals 509 and 510, which correspond to the output signal 508 of the amplitude demodulator at a lower temperature, the subtraction and amplification also increase the temperature dependency, which may impair a reliable monitoring of the limit level.

[0062] However, it has been shown that it is possible to efficiently compensate for this temperature dependency. This allows providing a sensor that may be specified for a wide range of process temperatures. For example, the sensor according to the embodiment may be used for a comparatively wide range of process temperatures, from −40° C. to +115° C., due to the compensation for the temperature dependency.

[0063] For correcting the demodulated signal 505, the sensor according to the embodiment has a reference unit 402 (shown in FIG. 3), which is in signal connection with the supply unit 307 in order to receive a temperature-independent or substantially temperature-independent DC voltage signal from the supply unit 307. The reference unit 402 has a diode which is thermally coupled to the rectifier diode of the amplitude demodulator 304. For example, both diodes may be arranged in a common housing of a semiconductor module in order to provide a sufficient heat-conducting connection, as shall be explained below with reference to FIG. 5. However, other configurations for thermal coupling between the diode of the reference unit 402 and the diode of the amplitude demodulator 304 are also conceivable. The diodes may have a substantially identical characteristic curve and/or a substantially identical temperature dependency of the characteristic curve. In particular, the diodes may be structurally identical.

[0064] The output signal of the reference unit 402 is a DC voltage signal. This DC voltage signal and the demodulated output signal of the amplitude demodulator are fed as input signals to the amplification unit 305 of the evaluation unit 104, which has a differential amplifier. The temperature dependence of the demodulated signal is compensated for by the difference between the two signals. The input voltage for the reference unit 402 is selected such that the output signal of the differential amplifier does not exhibit a zero crossing and thus has a sufficiently large distance from the zero point. As a result, the determination of the resonance frequency and the amplitude at the resonance frequency allows limit level monitoring at a sufficiently high accuracy.

[0065] As is also shown in FIG. 3, the sensor may have a temperature sensor 403. The temperature sensor 403 may be configured to detect a temperature of the rectifier diode of the amplitude demodulator 304 and the diode of the reference unit 402, which are thermally coupled to one another. The supply unit 307 may be configured to adjust the DC voltage signal, which the reference unit 402 receives from the supply unit 307, based on the detected temperature. Additionally or alternatively, the supply unit 307 may be configured to adjust the DC voltage component of the measurement signal and/or a DC voltage component, which is added to the measurement signal using a circuit of the processing unit 104, based on the detected temperature value.

[0066] As a result, it can be ensured for each temperature that the output signal of the differential amplifier does not exhibit a zero crossing at the respective temperature and/or that the difference between the demodulated output signal of the amplitude demodulator and the output signal of the reference unit does not reach the limit range of the amplification unit 305. In other words, it is thus possible to optimise the measurement signal and/or the signal processing of the measurement signal on the basis of the detected temperature.

[0067] The sensor may be configured such that the adjustment of the DC voltage signal, which the reference unit 402 receives from the supply unit 307, the adjustment of the DC voltage component of the measurement signal and/or the adjustment of the DC voltage component which is added to the measurement signal by a circuit, is performed based on a lookup table. The lookup table may be stored, for example, in a data storage device of the supply unit 307.

[0068] In FIG. 4, signals 502 and 503 of a comparative example, which is not covered by the claimed subject matter, are also shown by way of example. The signal 502 is obtained from a measurement signal 501, which is an AC voltage signal, using a high-frequency amplifier. The subsequent amplitude demodulation then results in signal 503. The demodulated signal 503 reflects the resonance behaviour. Also here, an error is generated by the amplitude demodulation (depicted schematically by the signal 511 shown as a dashed line). However, this error is comparatively small because the demodulation is performed after the amplification. However, the use of a high-frequency amplifier entails high costs and reduces the robustness of the sensor. Furthermore, such a high-voltage amplifier has a comparatively high power consumption.

[0069] FIG. 5 shows a circuit diagram of the oscillator 302, the probe impedance 303, which consists of the inductance 109 and the measuring capacitance 110, the reference unit 402, the amplitude demodulator 304 (shown in FIG. 3), and the amplification unit 305. The amplitude demodulator 304 (shown in FIG. 3) comprises the signal conversion unit 601 (shown in FIG. 5) as a rectifier diode, as well as the smoothing capacitor 603. The reference unit 402 is supplied by the supply unit with a temperature-independent or substantially temperature-independent DC voltage signal U.sub.Ref and has the signal conversion unit 602 as a diode. The signal conversion units 601 and 602 are arranged in a common semiconductor module 600, which may be provided, for example, by the BAT 17-07 semiconductor module manufactured by Infineon, which has two parallel Schottky diodes which are arranged in a common SMD housing.

[0070] A positive voltage U.sub.DC of 3V at the contact 606, which is connected to the inductance 109 via a resistor 607, increases the measurement signal at node 608, so that the amplitude maxima of the measurement signal exceed the threshold voltage of the rectifier diode 601 of the amplitude demodulator 304 (shown in FIG. 3), as has been described with reference to the signal 504 shown in FIG. 4. The voltage U.sub.DC may be temperature-independent or substantially temperature-independent and may be provided by the supply unit 307.

[0071] FIG. 5 also shows that the amplification unit has a differential amplifier which amplifies the input signals E.sub.1 and E.sub.2 to form an amplified output signal A=V.Math.(E.sub.1−E.sub.2), wherein V is an amplification factor of the differential amplifier. As a result, the amplified resonance curve is output at an output 605 of the amplification unit 305, as is shown as signal 507 in FIG. 4.

[0072] The supply unit 307 (shown in FIG. 3) may be configured to adjust the DC voltage signal U.sub.Ref and the voltage U.sub.DC based on temperatures of a temperature sensor 403, which detects the temperature of the signal conversion units 601 and 602. The temperature sensor may be thermally coupled to the signal conversion units 601 and 602.

[0073] Given the depicted embodiment, it was therefore possible to show that it is possible to provide a simply constructed and robust point level sensor which allows for reliable limit level monitoring.