Method for Producing Tungsten Hexafluoride

Abstract

A production method of tungsten hexafluoride according to one embodiment of the present invention includes: a first step of bringing tungsten having an oxide film into contact with a fluorine gas or inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride in a reactor, thereby removing the oxide film from the tungsten; and a second step of bringing the tungsten from which the oxide film has been removed by the first step into contact with a fluorine-containing gas to form tungsten hexafluoride.

Claims

1.-6. (canceled)

7. A production method of tungsten hexafluoride, comprising: a first step of bringing tungsten having an oxide film into contact with a hydrogen fluoride-containing gasin a reactor, thereby removing the oxide film from the tungsten, wherein the hydrogen fluoride-containing gas is either a fluorine gas containing 50 vol ppm to 50 vol % of hydrogen fluoride or an inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride; and a second step of bringing the tungsten from which the oxide film has been removed by the first step into contact with a fluorine-containing gas to form tungsten hexafluoride.

8. The production method of tungsten hexafluoride according to claim 7, wherein, in the first step, the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 25° C. to 200° C.

9. The production method of tungsten hexafluoride according to claim 7, wherein the fluorine-containing gas used in the second step is a fluorine gas, a nitrogen trifluoride gas or a mixed gas thereof.

10. The production method of tungsten hexafluoride according to claim 7, wherein, in the second step, the tungsten from which the oxide film has been removed is brought into contact with the fluorine-containing gas at a temperature ranging from 25° C. to 200° C.

11. An oxide film removing method for tungsten, comprising bringing tungsten having an oxide film into contact with a hydrogen fluoride-containing gas, wherein the hydrogen fluoride-containing gas is either a fluorine gas containing 50 vol ppm to 50 vol % of hydrogen fluoride or an inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride.

12. The oxide film removing method for tungsten according to claim 11, wherein the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 25° C. to 200° C.

13. The production method of tungsten hexafluoride according to claim 8, wherein, in the first step, the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 40° C. to 150° C.

14. The production method of tungsten hexafluoride according to claim 7, wherein the concentration of the hydrogen fluoride in the hydrogen fluoride-containing gas is 100 vol ppm to 1 vol %.

15. The production method of tungsten hexafluoride according to claim 10, wherein, in the second step, the tungsten from which the oxide film has been removed is brought into contact with the fluorine-containing gas at a temperature ranging from 40° C. to 150° C.

16. The oxide film removing method for tungsten according to claim 12, wherein the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 40° C. to 150° C.

17. The oxide film removing method for tungsten according to claim 11, wherein the concentration of the hydrogen fluoride in the hydrogen fluoride-containing gas is 100 vol ppm to 1 vol %.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0029] FIG. 1 is a schematic view of a WF.sub.6 synthesis apparatus.

[0030] FIG. 2 is a graph showing X-ray photoelectron spectra of raw material tungsten and tungsten material after a first step (pretreatment step).

DETAILED DESCRIPTION OF THE EMBODIMENTS

[0031] Embodiments of the present invention will be described in detail below. It should however be noted that the present invention is not limited to the following embodiments.

[0032] A WF.sub.6 production method according to the first embodiment of the present invention includes: a first step (hereinafter also referred to as pretreatment step) of bringing tungsten having an oxide film into contact with a F.sub.2 gas or inert gas containing 50 vol ppm to 50 vol % of HF in a reactor, thereby removing the oxide film from the tungsten; and a second step of forming WF.sub.6 by bringing the tungsten from which the oxide film has been removed by the first step into contact with a fluorine-containing gas.

[0033] Herein, the first step corresponds to an oxide film removing method for tungsten according to the second embodiment of the present invention as will be mentioned later.

1. Raw Material Tungsten

[0034] Metal tungsten as a raw material for production of tungsten hexafluoride (hereinafter also referred to as raw material tungsten) is commercially available in the form of an ingot or in the form of being processed into a powder. Since the outermost surface of a tungsten powder is thinly oxidized in the air, a commercially available tungsten powder loses its luster and turns brown due to the formation of a natural oxide film. In the tungsten hexafluoride production method, the raw material tungsten can be also called “tungsten having an oxide film”.

[0035] In the tungsten hexafluoride production method, the raw material tungsten can be used in various forms such as a powder, a bulk, an ingot etc. Although the raw material tungsten used in the tungsten hexafluoride production method can be selected from various forms such as a powder with a particle size of 100 nm or smaller, an ingot with a size of 10 cm or larger etc., it is preferable to use the raw material tungsten in the form of a powder with a particle size of 1 μm to 10 cm or a bulk for ease of charging the raw material tungsten into the reactor and for ease of flowing the F.sub.2 gas or inert gas through the tungsten powder or bulk. Tungsten powders with various particle sizes ranging from 0.5 μm to 1500 μm are commercially available. It is also preferable to arbitrarily select the raw material tungsten from these commercially available powders. In the present invention, the particle size of the tungsten powder refers to an average particle diameter measured according to the Fisher Sub-sieve Sizer method.

[0036] Even in the oxide film removing method for tungsten, the above-mentioned raw material tungsten can be arbitrarily selected and used.

2. First Step (Pretreatment Step)

[0037] In the first step of the WF.sub.6 production method, the tungsten having the oxide film (i.e. raw material tungsten) is brought into contact with the F.sub.2 gas or inert gas containing 50 vol ppm to 50 vol % of HF (hereinafter also referred to as “HF-containing gas”) in the reactor whereby there is obtained the tungsten from which the oxide film has been removed. Examples of the inert gas are nitrogen (N.sub.2), helium (He) and argon (Ar). In terms of easy availability and cost, N.sub.2 is preferred as the inert gas.

[0038] As mentioned above, it is known that an oxide film is formed a surface of tungsten is corroded in the air even under normal temperature and normal humidity conditions so that an oxide film is formed to cover the outermost surface of the tungsten. The tungsten whose outermost surface is covered with the oxide film is poor in reactivity with F.sub.2. For production of WF.sub.6, such tungsten has to be reacted with a F.sub.2 gas under high-temperature conditions exceeding 200° C. as disclosed in Patent Documents 1 to 4.

[0039] As a result of intensive studies made by the present inventors, however, it has surprisingly been found that: when the pretreatment step (first step) is performed by bringing a F.sub.2 gas or inert gas containing HF at a concentration of 50 vol ppm (parts per million by volume) to 50 vol % into contact with raw material tungsten, the surface of the raw material tungsten is activated by removal of an oxide film without the need to separately perform alkaline treatment as disclosed in Patent Document 5; and the resulting tungsten immediately reacts with a F.sub.2 gas even at a low temperature of 150° C. or lower to immediately form WF.sub.6 (see Examples 1 to 5 of TABLE 1). As will be discussed later, raw material tungsten was not subjected to any alkaline treatment for removal of an oxide film in each of the after-mentioned Examples. It is assumed that: by the pretreatment before the formation of WF.sub.6 being performed with the F.sub.2 gas or inert gas containing a low concentration of HF, it is possible to remove the oxide film on the outermost surface of the tungsten without causing corrosion of the reactor wall by HF; and, by removal of the oxide film from the surface of the tungsten, the surface of the tungsten is activated to immediately react with F.sub.2 so that WF.sub.6 can be immediately formed at a lower temperature.

[0040] In the tungsten hexafluoride production method according to the present embodiment, WOF.sub.4 or WF.sub.6 is detected in the reaction system after the first step in which the raw material tungsten and the HF-containing gas are brought into contact with each other. Hence, the following reactions are assumed as the mechanism of removing the oxide film from the raw material tungsten upon contact of the raw material tungsten with the HF-containing gas.

[0041] For example, tungsten trifluoride (WO.sub.3) reacts with HF whereby WOF.sub.4 is formed from WO.sub.3 through the following reactions (3) to (6).

HF+WO.sub.3.fwdarw.WO.sub.2F(OH)  Reaction (3)

HF+WO.sub.2F(OH).fwdarw.WOF.sub.2(OH).sub.2  Reaction (4)

HF+WOF.sub.2(OH).sub.2.fwdarw.WF.sub.3(OH).sub.3  Reaction (5)

HF+WF.sub.3(OH).sub.3.fwdarw.WOF.sub.4+2H.sub.2O  Reaction (6)

[0042] In the presence of a F.sub.2 gas, WF.sub.3(OH).sub.3 formed in the reaction (5) reacts with the F.sub.2 gas whereby WF.sub.6 is formed from WO.sub.3 through the following reaction (7).

WF.sub.3(OH).sub.3+F.sub.2.fwdarw.WF.sub.6+3HF+3/2O.sub.2  Reaction (7)

[0043] WOF.sub.4 formed in the reaction (6) and WF.sub.6 formed in the reaction (7) are vaporized and remain in the reaction system. In this way, the oxide film on the tungsten surface is converted to a gas (WOF.sub.4 or WF.sub.6) and removed.

[0044] In the WF.sub.6 production method according to the present embodiment, the concentration of HF in the F.sub.2 gas or inert gas during the first step is 50 vol ppm to 50 vol % as expressed in parts per million by volume or percentage by volume based on the total volume of the F.sub.2 gas and HF or the total volume of the inert gas and HF. When the concentration of HF in the gas is lower than 50 vol ppm, the effect of removing the oxide film from the surface of the raw material tungsten is small. When the concentration of HF in the gas is higher than 50 vol %, there is a risk of corrosion of the reactor wall by HF. The concentration of HF in the gas is preferably 100 vol ppm to 1 vol % (10000 vol ppm).

[0045] [Contact Temperature]

[0046] In the WF.sub.6 production method according to the present embodiment, the contact temperature between the raw material tungsten and the HF-containing gas during the first step is preferably 25° C. to 200° C. Even when the contact temperature is room temperature (25° C.), the surface of the raw material tungsten is sufficiently activated by removal of the oxide film. The contact temperature is more preferably higher than or equal to 40° C. Since one object of the WF.sub.6 production method according to the present invention is to produce WF.sub.6 without using a reaction temperature exceeding 200° C. so as not to cause a damage to the reactor, more specifically the reactor wall, the contact temperature between the tungsten and the HF-containing gas does not need to be higher than 200° C. The contact temperature is more preferably lower than or equal to 150° C., still more preferably lower than or equal to 70° C.

[0047] [Contact Time]

[0048] In the WF.sub.6 production method according to the present embodiment, the contact time between the raw material tungsten and the HF-containing gas during the first step can be arbitrarily set depending on, for example, the degree of progress of oxidation of the raw material tungsten, the yield of WF.sub.6 after the second step, and the like.

[0049] [Contact Pressure]

[0050] In the WF.sub.6 production method according to the present embodiment, the pressure inside the reactor during the first step is preferably 0.01 kPa to 300 kPa, more preferably 0.01 kPa to 100 kPa, in terms of absolute pressure. It is unfavorable that the pressure inside the reactor is lower than 0.01 kPa in terms of absolute pressure because, in such a low pressure range, the load of pressure retaining equipment becomes large. It is also unfavorable that the pressure inside the reactor is higher than 300 kPa in terms of absolute pressure because, in such a high pressure range, there arise a possibility of liquefaction of WF.sub.6 and a possibility of leakage of WF.sub.6 from the reactor.

3. Second Step (Reaction Step)

[0051] In the second step, the tungsten from which the oxide film has been removed by the first step is brought into contact with the fluorine-containing gas such as F.sub.2 gas to form WF.sub.6.

[0052] [Fluorine-containing Gas]

[0053] Examples of the fluorine-containing gas used in the second step are a F.sub.2 gas, a NF.sub.3 gas and a mixed gas thereof. The fluorine-containing gas may be diluted with an inert gas. In this case, the inert gas is selected from the group consisting of N.sub.2, He and Ar. As the fluorine-containing gas, a F.sub.2 gas is preferred.

[0054] [Reaction]

[0055] In the case of using a F.sub.2 gas as the fluorine-containing gas, the tungsten after the first step (i.e. the tungsten from which the oxide film has been removed) reacts with the F.sub.2 gas to form WF.sub.6 as in the above reaction (1). In the case of using a NF.sub.3 gas as the fluorine-containing gas, the tungsten after the first step (i.e. the tungsten from which the oxide film has been removed) reacts with the NF.sub.3 gas to form WF.sub.6 as in the above reaction (2).

[0056] [Contact Temperature]

[0057] The contact temperature between the tungsten from which the oxide film has been removed and the fluorine-containing gas during the second step is preferably 25° C. to 200° C. Even when the contact temperature is room temperature (25° C.), the tungsten from which the oxide film has been removed reacts with the fluorine-containing gas. The contact pressure is more preferably higher than or equal to 40° C. Since one object of the WF.sub.6 production method according to the present invention is to produce WF.sub.6 at a low temperature of 200° C. or lower, the contact temperature between the tungsten from which the oxide film has been removed and the fluorine-containing gas does not need to be higher than 200° C. The contact temperature is more preferably lower than or equal to 150° C., still more preferably lower than or equal to 70° C.

[0058] [Contact Time]

[0059] The contact time between the tungsten from which the oxide film has been removed and the fluorine-containing gas during the second step can be arbitrarily set depending on, for example, the yield of WF.sub.6 and the like.

[0060] [Contact Pressure]

[0061] In the WF.sub.6 production method according to the present embodiment, the pressure inside the reactor during the second step is in the same range as the pressure inside the reactor during the first step.

4. Production of WF.SUB.6

[0062] [Reactor]

[0063] The reactor used in the WF.sub.6 production method according to the present embodiment can be of batch type or continuous type as long as the reactor is capable of being charged with the tungsten. The material of the reactor is selected from those resistant to F.sub.2, WF.sub.6 and HF. For instance, nickel, nickel alloy and stainless steel are usable as the reactor material. Specific examples of the nickel alloy are Monel (trademark) predominantly containing nickel and copper with small amounts of iron, manganese, sulfur etc. Specific examples of the stainless steel are austenite stainless steels such as SUS304, SUS316 etc.

[0064] In the WF.sub.6 production method, it is preferable to utilize a circulation system for flowing the gas through the tungsten in order to improve the contact efficiency between the HF-containing gas and the raw material tungsten during the first step and the contact efficiency between the tungsten and the fluorine-containing gas such as F.sub.2 gas during the second step. In the first step, however, the oxide film can be removed from the tungsten even without the use of the circulation system.

[0065] [Shift from First Step to Second Step]

[0066] Herein, an explanation will be given of the shift from the “first step (pretreatment step)” to the “second step (reaction step)” in the WF.sub.6 production method according to the present embodiment.

[0067] It is convenient and economical to perform the first step and the second step continuously in the same reactor although the first step and the second step can be performed in different reactors. At the time of shifting from the first step to the second step, it is preferable to remove the gas after the first step from the reactor in the case where the concentration of HF in the gas after the first step is high. In the case where the concentration of HF in the gas after the first step is low or in the case where HF has been completely consumed by the first step and thus does not remain in the system, the second step can be initiated by feeding the fluorine-containing gas such as F.sub.2 gas into the reactor without removing the gas after the first step.

[0068] It is preferable and convenient to perform the first step in a state that the reactor is closed after being charged with the raw material tungsten and the HF-containing gas. In order to activate the surface of the raw material tungsten by removal of the oxide film, it is preferable to circulate and flow the gas in the reactor.

[0069] Further, it is convenient to perform the second step by feeding the fluorine-containing gas such as F.sub.2 gas to allow the fed gas to flow through the tungsten charged in the reactor and come into contact the tungsten, and then, collecting the gas after the contact.

[0070] The concentration of WF.sub.6 product in the gas after the contact can be measured by analyzing the collected gas with a Fourier transform infrared spectrophotometer.

[0071] [WF.sub.6 Synthesis Apparatus]

[0072] One example of WF.sub.6 synthesis apparatus usable in the WF.sub.6 production method according to the present embodiment is shown in FIG. 1. It is noted that the WF.sub.6 synthesis apparatus used in the WF.sub.6 production method according to the present embodiment is not limited to that of FIG. 1.

[0073] As shown in FIG. 1, the WF.sub.6 synthesis apparatus 100 includes: a reaction container (as a reactor) 16 charged with raw material tungsten 18; a hydrogen fluoride gas (HF) feeding unit 13; a fluorine-containing gas feeding unit 14; and an inert gas (e.g. N.sub.2) feeding unit (not shown).

[0074] The reaction container 16 is equipped with a jacket or electric heater (not shown) so as to adjust the temperature inside the reaction container 16 by the flow of temperature-controlled water through the jacket or to heat the inside of the reaction container 16 by the heater.

[0075] Each of the HF gas feeding unit 13 and the fluorine-containing gas feeding unit 14 is equipped with a mass flow controller (not shown) and is configured to feed the gas into the reaction container 16 while controlling the flow rate of the gas by the mass flow controller. A product outlet 17 is disposed on a downstream side of the reaction container 16 so that the gas after the reaction is taken out from the product outlet.

[0076] The reaction container 16 may be provided with a circulation system so as to circulate the F.sub.2 gas or inert gas containing HF, or the fluorine-containing gas such as F.sub.2 gas, and allow the gas to flow through the tungsten.

5. Oxide Film Removal Method for Tungsten

[0077] The oxide film removal method for tungsten according to the second embodiment of the present invention includes bringing tungsten having an oxide film into contact with a F.sub.2 gas or inert gas containing 50 vol ppm to 50 vol % of HF.

[0078] As mentioned above, it is known that a surface of tungsten is oxidized (corroded) in the air even under normal temperature and normal humidity conditions so that an oxide film is formed to cover the outermost surface of the tungsten. The present inventors have found as a result of intensive studies that, when the pretreatment step (first step) is performed by bringing the F.sub.2 gas or inert gas containing 100 vol ppm to 1 vol % of HF into contact with the tungsten having the oxide film, the oxide film is removed from the surface of tungsten; and the thus-treated tungsten surface becomes reactive to F.sub.2 so that the tungsten immediately reacts with a F.sub.2 gas even at a low temperature of 150° C. or lower to immediately form WF.sub.6 (see Examples 1 to 4 of TABLE 1). In other words, it is possible to remove the oxide film on the outermost surface of the tungsten under a mild condition that the contact temperature is 150° C. or lower.

[0079] In the oxide film removal method for tungsten according to the present embodiment, the concentration of HF in the F.sub.2 gas or inert gas is 50 vol ppm to 50 vol % as expressed in parts per million by volume or percentage by volume based on the total volume of the F.sub.2 gas or inert gas and HF. When the concentration of HF is lower than 50 vol ppm, the effect of removing the oxide film from the surface of tungsten is small. When the concentration of HF is higher than 50 vol %, there is a risk of corrosion of the reactor under the strong oxidation power of HF. The concentration of HF is preferably 100 vol ppm to 1 vol %.

[Contact Temperature]

[0080] In the oxide film removal method for tungsten according to the present embodiment, the contact temperature between the tungsten and the HF-containing gas is preferably 25° C. to 200° C. Even when the contact temperature is room temperature (25° C.), the surface of the tungsten is sufficiently activated by removal of the oxide film from the tungsten surface. The contact temperature is more preferably higher than or equal to 40° C. When the contact temperature is higher than 200° C., there arises a possibility of a damage caused to the reactor. The contact temperature is more preferably lower than or equal to 150° C.

[0081] [Reactor]

[0082] The reactor can be of batch type or continuous type as long as the reactor is capable of being charged with the tungsten. The material of the reactor is selected from those resistant to F.sub.2, WF.sub.6 and HF. For instance, nickel, nickel alloy and stainless steel are usable as the reactor material. Specific examples of the nickel alloy are Monel (trademark) predominantly containing nickel and copper with small amounts of iron, manganese, sulfur etc. Specific examples of the stainless steel are austenite stainless steels such as SUS304, SUS316 etc.

EXAMPLES

[0083] The production method of tungsten hexafluoride according to the present invention will be described in more detail below by way of the following specific examples. It should however be understood that the production method of tungsten hexafluoride according to the present invention is not limited to the following specific examples.

[0084] [WF.sub.6 Synthesis Apparatus]

[0085] In the following examples, the production of WF.sub.6 was carried out using the WF.sub.6 synthesis apparatus of FIG. 1. The reaction container 16 used was a batch-type reaction container made of Ni with an inner diameter of 55 mm, an outer diameter of 60 mm and a length of 300 mm. The temperature inside the reaction container 16 was adjusted by flowing temperature-controlled water at a flow rate of 0.5 L/min through the jacket of the reaction container 16.

[0086] [WF.sub.6 Concentration Measurement]

[0087] The concentration of WF.sub.6 in the gas taken out from the product outlet 17 was measured with a Fourier transform infrared spectrophotometer (type IRPrestage21 manufactured by Shimadzu Corporation).

Example 1

[0088] [First Step (Pretreatment Step)]Into the reaction container 16, commercially available raw material tungsten 18 (605.5 g, particle size: 1 μm) was charged. The inside of the reaction container 16 was degassed, and then, heated to 70° C. by flowing hot water through the jacket (not shown). In a state that the inside of the reaction container 16 was maintained at 70° C., a HF gas and a F.sub.2 gas were respectively fed from the HF gas feeding unit 13 and the fluorine-containing gas feeding unit 14 into the reaction container such that the concentration of HF relative to the F.sub.2 gas was controlled to 100 vol ppm (0.01 vol %) and such that the pressure inside the reaction container 16 was controlled to 80 kPa. After the gas feeding, the gas inside the reaction container 16 was kept circulated by the circulation system for 24 hours so as to flow through the raw material tungsten 18 in a state that the inside of the reaction container 16 was maintained at 70° C. After the gas inside the reaction container 16 was discharged and replaced with an inert gas (N.sub.2), a part of the tungsten inside the reaction container 16 was taken out and analyzed by XPS (X-ray Photoelectron Spectroscopy). The XPS analysis result is shown in FIG. 2. In the spectrum of the raw material tungsten, there were peaks A and B corresponding to W—O bond. On the other hand, the peaks A and B corresponding to W—O bond disappeared in the spectrum of the tungsten after the first step. It is confirmed from this result that the oxide film was removed from the tungsten.

[Second Step (Reaction Step)]

[0089] In a state that the inside of the reaction container 16 was maintained at 70° C., a F.sub.2 gas was fed from the fluorine-containing gas feeding unit 14 into the reaction container 16 at a flow rate of 0.5 slm (liter per minute at 0° C. and 1 atm) by the mass flow controller (not shown) such that only the F.sub.2 gas flowed through the tungsten 18 from which the oxide film had been removed in the reaction container 16 under a condition that the pressure inside the reaction container was 80 kPa. After a lapse of 20 minutes from the initiation of the gas flow, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 99% or more in the product gas.

Example 2

[0090] The first step and the second step were performed by the same procedures under the same conditions using the same raw material tungsten 18 as in Example 1, except that the concentration of HF in the F.sub.2 gas charged into the reaction container 16 was controlled to 1000 vol ppm (0.1 vol %). After a lapse of 20 minutes from the initiation of the gas flow in the second step, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 99% or more in the product gas.

Example 3

[0091] The first step and the second step were performed by the same procedures under the same conditions using the same raw material tungsten 18 as in Example 1, except that the concentration of HF in the F.sub.2 gas charged into the reaction container 16 was controlled to 10000 vol ppm (1 vol %). After a lapse of 20 minutes from the initiation of the gas flow in the second step, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 99% or more in the product gas.

Example 4

[First Step (Pretreatment Step)]

[0092] Into the reaction container 16, the same raw material tungsten 18 as used in Example 1 was charged. The inside of the reaction container 16 was degassed, and then, heated to 40° C. by flowing hot water through the jacket (not shown). In a state that the inside of the reaction container 16 was maintained at 40° C., a HF gas and a F.sub.2 gas were respectively fed from the HF gas feeding unit 13 and the fluorine-containing gas feeding unit 14 into the reaction container such that the concentration of HF relative to the F.sub.2 gas was controlled to 100 vol ppm (0.01 vol %) and such that the pressure inside the reaction container 16 was controlled to 80 kPa. After the gas feeding, the gas inside the reaction container 16 was kept circulated for 24 hours so as to flow through the raw material tungsten 18 in a state that the inside of the reaction container 16 was maintained at 40° C.

[Second Step (Reaction Step)]

[0093] In a state that the inside of the reaction container 16 was maintained at 40° C., a F.sub.2 gas was fed from the fluorine-containing gas feeding unit 14 into the reaction container 16 at a flow rate of 0.5 slm by the mass flow controller (not shown) such that only the F.sub.2 gas flowed through the tungsten 18 from which the oxide film had been removed in the reaction container 16 under a condition that the pressure inside the reaction container was 80 kPa. After a lapse of 20 minutes from the initiation of the gas flow, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 99% or more in the product gas.

Example 5

[First Step (Pretreatment Step)]

[0094] Into the reaction container 16, the same raw material tungsten as used in Example 1 was charged. The inside of the reaction container 16 was degassed, and then, heated to 40° C. by flowing hot water through the jacket (not shown). In a state that the inside of the reaction container 16 was maintained at 40° C., a HF gas and a N.sub.2 gas were respectively fed from the HF gas feeding unit 13 and the N.sub.2 gas feeding unit (not shown) into the reaction container such that the concentration of HF relative to the N.sub.2 gas was controlled to 100 vol ppm (0.01 vol %) and such that the pressure inside the reaction container 16 was controlled to 80 kPa. After the gas feeding, the gas inside the reaction container 16 was kept circulated for 24 hours so as to flow through the raw material tungsten 18 in a state that the inside of the reaction container 16 was maintained at 40° C.

[Second Step (Reaction Step)]

[0095] In a state that the inside of the reaction container 16 was maintained at 40° C., a F.sub.2 gas was fed from the fluorine-containing gas feeding unit 14 into the reaction container 16 at a flow rate of 0.5 slm by the mass flow controller (not shown) such that only the F.sub.2 gas flowed through the tungsten 18 from which the oxide film had been removed in the reaction container 16 under a condition that the pressure inside the reaction container was 80 kPa. After a lapse of 20 minutes from the initiation of the gas flow, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 99% or more in the product gas.

Comparative Example 1

[0096] The first step and the second step were performed by the same procedures under the same conditions using the same raw material tungsten 18 as in Example 1, except that the concentration of HF in the F.sub.2 gas charged into the reaction container 16 was controlled to 10 vol ppm (0.001 vol %). A part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 5% in the product gas.

Comparative Example 2

[0097] Without performing the first step, the second step was performed by the same procedure under the same conditions using the same raw material tungsten 18 as in Example 1.

[0098] More specifically, 605.5 g of the raw material tungsten 18 was charged into the reaction container 16. Then, the inside of the reaction container 16 was degassed. In a state that the inside of the reaction container 16 was maintained at 70° C. by flowing water of 70° C. through the jacket, a F.sub.2 gas was fed from the fluorine-containing gas feeding unit 14 into the reaction container 16 at a flow rate of 0.5 slm by the mass flow controller (not shown) such that only the F.sub.2 gas flowed through the raw material tungsten 18 in the reaction container 16 under a condition that the pressure inside the reaction container was 80 kPa. After a lapse of 20 minutes from the initiation of the gas flow, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 3% in the product gas.

Reference Example 1

[0099] Using the same raw material tungsten as in Example 1, WF.sub.6 was produced without performing the first step.

[0100] More specifically, a F.sub.2 gas was fed from the fluorine-containing gas feeding unit 14 into the reaction container 16 at a flow rate of 0.5 slm (liter per minute at 0° C. and 1 atm) by the mass flow controller (not shown) in a state that the inside of the reaction container 16 was heated to 250° C. by the electric heater. By this gas feeding, only the F.sub.2 gas flowed through the reaction container 16 under a condition that the pressure inside the reaction container 16 was 80 kPa. After a lapse of 20 minutes from the initiation of the gas flow, a part of the reaction product gas was taken out and sampled from the product outlet 17. When the sampled product gas was analyzed with the Fourier transform infrared spectrophotometer, it was confirmed that WF.sub.6 was contained at a concentration of 99% or more in the product gas.

[0101] In TABLE 1, Examples 1 to 4 and Comparative Examples 1 to 2 are summarized by showing are the contact temperature between the raw material tungsten 18 and the HF-containing F.sub.2 gas and the concentration of HF in the F.sub.2 gas during the first step, the contact temperature between the tungsten from which the oxide film was removed and the F.sub.2 gas during the second step and the concentration of WF.sub.6 in the product gas at the product outlet 17.

TABLE-US-00001 TABLE 1 First Step Second Step (Pretreatment Step) (Reaction Step) Contact HF HF Contact WF.sub.6 Temp. Conc. Diluting Temp. Conc. ° C. vol ppm Gas ° C. % Example 1 70 100 F.sub.2 70 >99 Example 2 70 1000 70 >99 Example 3 70 10000 70 >99 Example 4 40 500 40 >99 Example 5 40 500 N.sub.2 40 >99 Comparative 70 10 F.sub.2 70 5 Example 1 Comparative No Treatment 70 3 Example 2 Reference 250 >99 Example 1

[0102] In each of Examples 1 to 4 embodying the WF.sub.6 production method according to the present invention, WF.sub.6 was finally obtained at a high concentration of 99% or more even though the contact temperature during the second step was 40° C. or 70° C. which was lower than those in the conventional methods.

[0103] In Comparative Example 1 in which the concentration of HF in the F.sub.2 gas was low and was out of the scope of the WF.sub.6 production method according to the present invention, the concentration of WF.sub.6 was at a low level of 5%. In Comparative Example 2 in which the first step of the WF.sub.6 production method according to the present invention was not performed, the concentration of WF.sub.6 was at a low level of 3%.

[0104] In Reference Example 1 corresponding to one conventional method, WF.sub.6 was finally obtained at a high concentration of 99% or higher. However, the contact temperature between the tungsten and the F.sub.2 gas was 250° C. in Reference Example 1.

[0105] As described above, the production method of WF.sub.6 according to the embodiment of the present invention enables production of WF.sub.6 by contact of the tungsten and the fluorine-containing gas at a lower temperature than the conventional methods. Further, the production method of WF.sub.6 and the oxide film removing method for tungsten both according to the embodiments of the present invention enable activation of the tungsten by removal of the oxide film from the surface of the tungsten so as to allow immediate reaction of the tungsten with F.sub.2 such that WF.sub.6 can be obtained, without causing a damage to the reactor, by contact of the tungsten and the fluorine-containing gas at a lower temperature than the conventional methods of production of WF.sub.6.

DESCRIPTION OF REFERENCE NUMERALS

[0106] 100: WF.sub.6 synthesis apparatus [0107] 13: Hydrogen fluoride gas feeding unit (HF gas feeding unit) [0108] 14: Fluorine-containing gas feeding unit [0109] 16: Reaction vessel (Reactor) [0110] 17: Product outlet [0111] 18: Raw material tungsten