Measuring device and method for horizontal dynamic impedance of specified foundation depth based on differential response analysis of pulse excitation

Abstract

A measuring device and method for horizontal dynamic impedance of specified foundation depth based on differential response analysis of pulse excitation. The measuring method is realized based on the measuring device. Two rigid piles with different lengths are embedded into different foundation depths. Motion characteristics of the two rigid piles in the process of collision impact with the outside are different under the same pulse excitation. Dynamic impedance of specified foundation depth is deduced from the formula according to the differential response. Single-degree-of-freedom oscillators are arranged on the pile heads of the two piles, and strain gauges are arranged on the bottoms of the single-degree-of-freedom oscillators to obtain stress states of the single-degree-of-freedom oscillators, thereby calculating the relative displacements of the single-degree-of-freedom oscillators. This is simple in structure, reliable in measurement and convenient in data collection and processing.

Claims

1. A measuring device for horizontal dynamic impedance of specified foundation depth based on differential response analysis of pulse excitation, the measuring device comprising a bracket (1), a bidirectional electromagnetic exciter (2), single-degree-of-freedom oscillators (3), strain gauges (4), a raft (5), two rigid piles (6), a photosensitive band (7), laser sources (8) and an information collector (9), wherein the two rigid piles (6) with different lengths are embedded into different foundation depths; the single-degree-of-freedom oscillators (3) with different frequencies are arranged on pile heads of the two rigid piles (6) according to the frequency of an actual structure, and the natural vibration frequencies of the single-degree-of-freedom oscillators (3) are regulated by regulating the heights and the mass of the single-degree-of-freedom oscillators (3); the strain gauges (4) are vertically arranged on the bottoms of the single-degree-of-freedom oscillators (3) and used for measuring bottom strain of the single-degree-of-freedom oscillators (3); laser source (8) is arranged respectively on each of the single-degree-of-freedom oscillators; absolute displacements of the single-degree-of-freedom oscillators (3) at each moment are measured through the photosensitive band (7) arranged at one side parallel to the axes of the two rigid piles (6) and the information collector (9) connected with the photosensitive band (7); the raft (5) is arranged on the junction of the rigid piles (6) and a foundation surface and is used for ensuring that the junction of the rigid piles and the foundation surface is static; the bidirectional electromagnetic exciter (2) is installed on the raft (5) through the bracket (1) and is positioned between the two rigid piles (6) to ensure that impact loads on the two rigid piles (6) are the same; the bidirectional electromagnetic exciter (2) can instantly eject an oscillator to impact a pile head through electromagnetic change.

2. A measuring method for horizontal dynamic impedance of specified foundation depth based on differential response analysis of pulse excitation, wherein the measuring method is realized based on the measuring device, and a pile head reserved on the foundation has a length of h.sub.0; the instantaneous acting force F=m′ü′ of the bidirectional electromagnetic exciter (2) on the pile head is obtained according to the acceleration ü′ exerted to an excitation block by the bidirectional electromagnetic exciter (2) and the mass m′ of the excitation block; the following physical quantities are obtained through measurement: the instantaneous acting force F of the exciter on the pile head, the mass M of a short pile, the mass M′ of a long pile, a distance h.sub.n from the bottom of a soil layer to the ground surface and the mass m of the single-degree-of-freedom oscillator; the method specifically comprises the following steps: 1) the bidirectional electromagnetic exciter (2) ejects the oscillator, and the oscillator comes into full contact with the pile head of the rigid pile (6) and rebounds to obtain the instantaneous acting force F; 2) the vertical strain ε on the bottom of a cantilever bar of the single-degree-of-freedom oscillator (3) is measured through the strain gauge (4) on the bottom of the single-degree-of-freedom oscillator (3); the relative displacement u.sub.s(t) of the single-degree-of-freedom oscillator (3) at a certain moment is obtained through calculation; and the speed {dot over (u)}.sub.s(t) of the single-degree-of-freedom oscillator (3) relative to the pile head and the relative acceleration ü.sub.s(t) are obtained through differential; 3) the displacement u.sub.z(t) of the single-degree-of-freedom oscillator (3) at a certain moment is measured through the information collector (9) by means of the laser source (8) arranged on the single-degree-of-freedom oscillator (3) and the photosensitive band (7) arranged on the raft (5); speed {dot over (u)}.sub.z(t) and acceleration ü.sub.z(t) are obtained through differential; and displacement u.sub.q(t), speed {dot over (u)}.sub.q(t) and acceleration ü.sub.q(t) of the pile head are obtained:
u.sub.q(t)=u.sub.z(t)−u.sub.s(t),{dot over (u)}.sub.q(t)={dot over (u)}.sub.z(t)−{dot over (u)}.sub.s(t),ü.sub.q(t)=ü.sub.z(t)−ü.sub.s(t)  (1) 4) for the short pile a, the following dynamic equation is used:
MΣü.sub.q(t,h)+Σc(h){dot over (u)}.sub.q(t,h)+Σk(h)u.sub.q(t,h)=F−mü.sub.s(t)  (2) to obtain: $\begin{array}{cc}\underset{n=1}{\overset{k}{.Math.}}\left[\left(i\omega c_n+k_n\right)\left(h_n+h_{n-1}\right)\right]=2\frac{h_0}{{\stackrel{\_}{u}}_q}F+\frac{{\stackrel{\_}{u}}_s}{{\stackrel{\_}{u}}_q}{\omega }^{2}m{h}_0+M{\omega }^2\left(\frac{h_0^2+h_k^2}{h_0+h_k}\right)& \left(5\right)\end{array}$ wherein i is an imaginary unit, and i.sup.2=−1; ω is frequency; h.sub.0 is a distance from the top of the pile to the ground surface; h.sub.k is a distance from a bottom surface of an upper soil layer of a soil layer of specified depth to the ground surface; c.sub.n is the damp of the nth soil layer; k.sub.n is the rigidity of the nth soil layer; h.sub.n is a distance from the bottom surface of the nth soil layer to the ground surface; h.sub.n−1 is a distance from the bottom surface of the (n−1)th soil layer to the ground surface; 5) for the long pile b, the following dynamic equation is used:
M′Σü.sub.q′(t,h)+Σc(h){dot over (u)}.sub.q′(t,h)+Σk(h)u.sub.q′(t,h)=F−mü.sub.s′(t)  (6) to obtain: $\begin{array}{cc}\underset{n=1}{\overset{k+1}{.Math.}}\left[\left(i\omega c+k_n\right)\left(h_n+h_{n-1}\right)\right]=2\frac{h_0}{{\stackrel{\_}{u}}_q}F+\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}{\omega }^2{\mathrm{mh}}_0+M^{\prime }{\omega }^2\left(\frac{h_0^2+h_{k+1}^2}{h_0+h_{k+1}}\right)& \left(9\right)\\ \left(i\omega c_{k+1}+k_{k+1}\right)\left(h_k+h_{k+1}\right)=2\frac{h_0}{{\stackrel{\_}{u}}_q^{\prime }}F+\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}{\omega }^2{\mathrm{mh}}_0+M^{\prime }{\omega }^2\left(\frac{h_0^2+h_{k+1}^2}{h_0+h_{k+1}}\right)-\underset{n=1}{\overset{k}{.Math.}}\left[\left(i\omega c_n+k_n\right)\left(h_n+h_{n-1}\right)\right]& \left(10\right)\end{array}$ wherein c.sub.k+1 is the damp of the soil layer of the specified depth; k.sub.k+1 is the rigidity of the soil layer of the specified depth; h.sub.k+1 is the specified foundation depth; $\begin{array}{cc}\mathrm{wherein}{M}^{\prime }=\frac{h_0+h_{k+1}}{h_0+h_k}M& \left(11\right)\end{array}$ formula (5) and formula (11) are substituted into formula (10) which is compiled as: $\begin{array}{cc}\left(i\omega c_{k+1}+k_{k+1}\right)\left(h_k+h_{k+1}\right)=2{\mathrm{Fh}}_0\left(\frac{{\stackrel{\_}{u}}_q-{\stackrel{\_}{u}}_q^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }{\stackrel{\_}{u}}_q}\right)+M{\omega }^2\left(\frac{h_{k+1}^2-h_k^2}{h_0+h_k}\right){\omega }^{2}m{h}_0\left(\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}-\frac{{\stackrel{\_}{u}}_s}{{\stackrel{\_}{u}}_q}\right)& \left(12\right)\end{array}$ to further obtain: $\begin{array}{cc}i\omega c_{k+1}+k_{k+1}=\frac{2{\mathrm{Fh}}_0}{\left(h_k+h_{k+1}\right)}\left(\frac{{\stackrel{\_}{u}}_q-{\stackrel{\_}{u}}_q^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }{\stackrel{\_}{u}}_q}\right)+M{\omega }^2\left(\frac{h_{k+1}-h_k}{h_0+h_k}\right)+\frac{{\omega }^{2}m{h}_0}{\left(h_k+h_{k+1}\right)}\left(\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}-\frac{{\stackrel{\_}{u}}_s}{{\stackrel{\_}{u}}_q}\right)& \left(13\right)\end{array}$ 6) a dynamic impedance S.sub.g(ω) at a different foundation depth is obtained:
S.sub.g(ω)=iωc.sub.k+1(ω)=k.sub.k+1(ω)  (14).

Description

DESCRIPTION OF DRAWINGS

(1) FIG. 1 is a schematic diagram of assembly of a device of the present invention.

(2) FIG. 2 is a cross-sectional view of a device of the present invention.

(3) FIG. 3 is a vertical top view of site application of a device of the present invention.

(4) In the figures: 1 bracket; 2 bidirectional electromagnetic exciter; 3 single-degree-of-freedom oscillator; 4 strain gauge; 5 raft; 6 rigid pile; 7 photosensitive band; 8 laser source; and 9 information collector.

DETAILED DESCRIPTION

(5) Specific embodiments of the present invention are described below in detail in combination with the technical solution and drawings.

(6) Two rigid piles 6 are driven into the foundation by different depths. Pile heads reserved on the ground have a length of h.sub.0. The raft 5 is arranged to ensure that the intersection of the piles and the foundation surface will not have relative displacement. As shown in FIG. 1, the bidirectional electromagnetic exciter 2 is arranged between the two piles to ensure that impact loads on the two rigid piles are the same. The bidirectional electromagnetic exciter 2 instantly ejects an oscillator to impact a pile head through electromagnetic change. After the oscillator comes into full contact with the pile head, the oscillator rapidly separates from the pile head and rebounds. The instantaneous acting force F=m′ü′ of the exciter on the pile head is obtained according to the acceleration ü′ exerted to an excitation block by the bidirectional electromagnetic exciter 2 and the mass m′ of the excitation block. The single-degree-of-freedom oscillators 3 are arranged on pile heads, and the natural vibration frequencies of the single-degree-of-freedom oscillators 3 are regulated by regulating the heights and the mass of the single-degree-of-freedom oscillators 3. The strain gauges 4 are vertically arranged on the bottoms of the single-degree-of-freedom oscillators 3 to sensitively measure the vertical strain ε of supporting rods of the single-degree-of-freedom oscillators 3. One laser source 8 is arranged respectively on each of the single-degree-of-freedom oscillators 3; the displacement u.sub.z(t) of the single-degree-of-freedom oscillators at each moment can be measured through the photosensitive band 7 arranged at one side parallel to the axes of the two rigid piles and the information collector 9; and speed {dot over (u)}.sub.z and acceleration ü.sub.z can be differentiated. The following physical quantities can be obtained through measurement: the instantaneous acting force F of the exciter on the pile head, the mass M of a short pile, the mass M′ of a long pile, a distance h.sub.n from the bottom of a soil layer to the ground surface, the mass in of the single-degree-of-freedom oscillator, damp c and rigidity k.

(7) A test flow is as follows:

(8) 1) The bidirectional electromagnetic exciter ejects the oscillator, and the oscillator comes into full contact with the pile head and rebounds to calculate the exciting force F. Because action time is extremely short, the acting force F of the excitation block on the pile can be considered as a rectangular impulse force.

(9) 2) The strain gauge is arranged on the bottom of the single-degree-of-freedom oscillator so as to measure the strain ε on the bottom of a cantilever bar; the relative displacement u.sub.s(t) of the single-degree-of-freedom oscillator is calculated; and the speed {dot over (u)}.sub.s(t) and the relative acceleration ü.sub.s(t) of the single-degree-of-freedom oscillator relative to the pile head are obtained through differential.

(10) 3) The displacement u.sub.z(t) of the single-degree-of-freedom oscillator 3 at a certain moment is measured through the information collector 9 by means of the laser source 8 arranged on the single-degree-of-freedom oscillator 3 and the photosensitive band 7 arranged on the raft 5; speed {dot over (u)}.sub.z(t) and acceleration ü.sub.z(t) are obtained through differential; and displacement, speed and acceleration of the pile head are obtained, as shown by formula (1).

(11) 4) For the short pile a, the dynamic equation shown by formula (2) is used to obtain:

(12) 0$\begin{array}{cc}\frac{1}{2}M{\stackrel{\mathrm{.Math.}}{u}}_q\left(t\right)\left[\frac{h_0}{h_0+h_k}+\frac{h_k}{h_0+h_k}\frac{h_k}{h_0}\right]+\frac{\stackrel{.}{u_q}\left(t\right)}{h_0}\underset{n=1}{\overset{k}{.Math.}}\frac{1}{2}{c}_n\left(h_n+h_{n-1}\right)\frac{u_q\left(t\right)}{h_0}\underset{n=1}{\overset{k}{.Math.}}\frac{1}{2}{k}_n\left(h_n+h_{n-1}\right)=F-m{\stackrel{\mathrm{.Math.}}{u}}_s\left(t\right)& \left(3\right)\end{array}$

(13) Fourier transform is conducted on formula (3) to obtain:

(14) $\begin{array}{cc}-\frac{1}{2}{\omega }^2\left[\frac{h_0}{h_0+h_k}M{\stackrel{\_}{u}}_q+\frac{h_k}{h_0+h_k}M{\stackrel{\_}{u}}_q\frac{h_k}{h_0}\right]+\frac{{\stackrel{\_}{u}}_q}{h_0}\underset{n=1}{\overset{k}{.Math.}}\frac{1}{2}\left[\left(i\omega c_n+k_n\right)\left(h_n+h_{n-1}\right)\right]=F+\frac{1}{2}{\omega }^{2}m{\stackrel{\_}{u}}_s& \left(4\right)\end{array}$
compiled as:

(15) $\begin{array}{cc}\underset{n=1}{\overset{k}{.Math.}}\left[\left(i\omega c_n+k_n\right)\left(h_n+h_{n-1}\right)\right]=2\frac{h_0}{{\stackrel{\_}{u}}_q}F+\frac{{\stackrel{\_}{u}}_s}{{\stackrel{\_}{u}}_q}{\omega }^{2}m{h}_0+M{\omega }^2\left(\frac{h_0^2+h_k^2}{h_0+h_k}\right)& \left(5\right)\end{array}$

(16) 5) For the long pile b, the dynamic equation shown by formula (6) is used to obtain:

(17) $\begin{array}{cc}\frac{1}{2}M{}^{\prime }\stackrel{\mathrm{.Math.}}{u}_q{\hspace{0.17em}}^{\prime }\left(t\right)\left[\frac{h_0}{h_0+h_{k+1}}+\frac{h_{k+1}}{h_0+h_{k+1}}\frac{h_k}{h_0}\right]+\frac{{\stackrel{.}{u}}_q{\hspace{0.17em}}^{\prime }\left(t\right)}{h_0}\underset{n=1}{\overset{k}{.Math.}}\frac{1}{2}{c}_n\left(h_n+h_{n-1}\right)+\frac{u_q{\hspace{0.17em}}^{\prime }\left(t\right)}{h_0}\underset{n=1}{\overset{k}{.Math.}}\frac{1}{2}{k}_n\left(h_n+h_{n-1}\right)=F-m{\stackrel{\mathrm{.Math.}}{u}}_s{\hspace{0.17em}}^{\prime }\left(t\right)& \left(7\right)\end{array}$

(18) Fourier transform is conducted on formula (7):

(19) $\begin{array}{cc}-\frac{1}{2}{\omega }^2\left[\frac{h_0}{h_0+h_{k+1}}M{}_{}{}^{\prime }\stackrel{\_}{u}_q^{\prime }+\frac{h_{k+1}}{h_0+h_{k+1}}M{}_{}{}^{\prime }\stackrel{\_}{u}_q^{\prime }\frac{h_{k+1}}{h_0}\right]+\frac{{{\stackrel{\_}{u}}_q}^{\prime }}{h_0}\underset{n=1}{\overset{k+1}{.Math.}}\frac{1}{2}\left[\left(i\omega c_n+k_n\right)\left(h_n+h_{n-1}\right)\right]=F+\frac{1}{2}{\omega }^{2}m{{\stackrel{\_}{u}}_s}^{\prime }& \left(8\right)\end{array}$
compiled as:

(20) $\begin{array}{cc}\underset{n=1}{\overset{k+1}{.Math.}}\left[\left(i\omega c+k_n\right)\left(h_n+h_{n-1}\right)\right]=2\frac{h_0}{{\stackrel{\_}{u}}_q}F+\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}{\omega }^2{\mathrm{mh}}_0+M^{\prime }{\omega }^2\left(\frac{h_0^2+h_{k+1}^2}{h_0+h_{k+1}}\right)& \left(9\right)\\ \left(i\omega c_{k+1}+k_{k+1}\right)\left(h_k+h_{k+1}\right)=2\frac{h_0}{{\stackrel{\_}{u}}_q^{\prime }}F+\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}{\omega }^2{\mathrm{mh}}_0+M^{\prime }{\omega }^2\left(\frac{h_0^2+h_{k+1}^2}{h_0+h_{k+1}}\right)-\underset{n=1}{\overset{k}{.Math.}}\left[\left(i\omega c_n+k_n\right)\left(h_n+h_{n-1}\right)\right]& \left(10\right)\\ \mathrm{wherein}{M}^{\prime }=\frac{h_0+h_{k+1}}{h_0+h_k}M& \left(11\right)\end{array}$
formula (5) and formula (11) are substituted into formula (10) which is compiled as:

(21) $\begin{array}{cc}\left(i\omega c_{k+1}+k_{k+1}\right)\left(h_k+h_{k+1}\right)=2{\mathrm{Fh}}_0\left(\frac{{\stackrel{\_}{u}}_q-{\stackrel{\_}{u}}_q^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }{\stackrel{\_}{u}}_q}\right)+M{\omega }^2\left(\frac{h_{k+1}^2-h_k^2}{h_0+h_k}\right){\omega }^{2}m{h}_0\left(\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}-\frac{{\stackrel{\_}{u}}_s}{{\stackrel{\_}{u}}_q}\right)& \left(12\right)\end{array}$
to further obtain:

(22) $\begin{array}{cc}i\omega c_{k+1}+k_{k+1}=\frac{2{\mathrm{Fh}}_0}{\left(h_k+h_{k+1}\right)}\left(\frac{{\stackrel{\_}{u}}_q-{\stackrel{\_}{u}}_q^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }{\stackrel{\_}{u}}_q}\right)+M{\omega }^2\left(\frac{h_{k+1}-h_k}{h_0+h_k}\right)+\frac{{\omega }^{2}m{h}_0}{\left(h_k+h_{k+1}\right)}\left(\frac{{\stackrel{\_}{u}}_s^{\prime }}{{\stackrel{\_}{u}}_q^{\prime }}-\frac{{\stackrel{\_}{u}}_s}{{\stackrel{\_}{u}}_q}\right)& \left(13\right)\end{array}$

(23) 6) A dynamic impedance S.sub.g(ω) at a specified foundation depth is obtained:
S.sub.g(ω)=iωc.sub.k+1(ω)=k.sub.k+1(ω)  (14)
The present invention has the operating principle that:

(24) (1) The horizontal dynamic impedance at the specified foundation depth is calculated according to the differential response of pulse excitation. It is not practical to calculate the dynamic impedance at the specified foundation depth based only on the response of one pile. The two rigid piles embedded into different foundation depths bear different lateral force of the soil layer, so that motion characteristics in the process of collision impact with the outside are different. Dynamic impedance at the specified foundation depth is deduced from the formula according to the differential response.

(25) (2) The bidirectional electromagnetic exciter 2 is used to apply equal pulse loads to the rigid piles 6 (penetrating piles). The base shear force can be calculated by the product of the mass of the upper design structure and the design seismic acceleration so as to calculate the shear force at the top of a single pile. In the test, an acceleration can be applied to the excitation block by using the bidirectional electromagnetic exciter 2, so that the exciting force of the excitation block on the single pile is approximately equal to the calculated actual shear force at the top of the single pile. Thus, the equivalent relationship between the test device and the actual structure is established so that the measured dynamic impedance of the foundation has practical significance.

(26) (3) The single degree of freedom system with the designated frequency is arranged on the pile in order to reflect the frequency of the actual upper structure. The natural vibration frequency of the upper structure is adjusted, so as to reflect the dynamic influence of the dynamic impedance of the foundations of different depths on the structures with different natural frequency features. Specifically, the frequency of the single degree of freedom system is regulated by regulating the heights and the mass of the single-degree-of-freedom oscillators 3. The speed and the acceleration can be obtained by the differential of the measured maximum amplitude of the single degree of freedom system. The dynamic stiffness of the foundation at the frequency is calculated according to the formula. Thus, the result can be directly applied to the actual upper structure.

(27) The above embodiments only express the implementation of the present invention, and shall not be interpreted as a limitation to the scope of the patent for invention. It should be noted that, for those skilled in the art, several variations and improvements can also be made without departing from the concept of the present invention, all of which belong to the protection scope of the present invention.