SAMPLING ASSEMBLY AND TESTING INSTRUMENT

Abstract

A sampling assembly is described. The sampling assembly comprises an input, a light source unit, at least one deflector unit, and a light receiver. The input is configured to receive an electrical input signal. The light source unit is configured to generate and output a light beam in the direction of the deflector unit. The light source unit is configured to adapt an intensity of the light beam based on an amplitude of the input signal. The deflector unit is configured to obtain a deflection command signal. The deflector unit further is configured to deflect the light beam into at least one spatial direction based on the deflection command signal. The light receiver comprises at least two photosensitive pixels. The light receiver is configured to receive the light beam via at least one of the at least two photosensitive pixels, and the light receiver is configured to convert received light into an electrical output signal. Further, a testing instrument is described.

Claims

1. A sampling assembly, comprising an input, a light source unit, at least one deflector unit and a light receiver, said input being configured to receive an electrical input signal; said light source unit being configured to generate and output a light beam in the direction of said deflector unit, said light source unit being configured to adapt an intensity of said light beam based on an amplitude of said input signal; said deflector unit being configured to obtain a deflection command signal, said deflector unit further being configured to deflect said light beam into at least one spatial direction based on said deflection command signal; and said light receiver comprising at least two photosensitive pixels, said light receiver being configured to receive said light beam via at least one of said at least two photosensitive pixels, and said light receiver being configured to convert received light into an electrical output signal.

2. The sampling assembly according to claim 1, wherein said light source unit comprises a laser.

3. The sampling assembly according to claim 1, wherein said deflector unit is configured to deflect said light beam into two different spatial directions based on said deflection command signal.

4. The sampling assembly according to claim 1, wherein said deflector unit is configured to deflect said light beam according to a predefined pattern based on said deflection command signal.

5. The sampling assembly according to claim 1, wherein said deflector unit comprises at least one of an electro-optical element and an acousto-optic element.

6. The sampling assembly according to claim 1, further comprising an acquisition unit being connected to said light receiver, said acquisition unit being configured to determine a set of acquisition samples based on said electrical output signal.

7. The sampling assembly according to claim 6, wherein said acquisition unit is configured to determine said set of acquisition samples based on said deflection command signal.

8. The sampling assembly according to claim 1, further comprising an analog to digital converter being connected to said input, wherein said analog to digital converter is configured to determine a set of ADC samples based on said input signal.

9. The sampling assembly according to claim 6, further comprising an analog to digital converter being connected to said input, wherein said analog to digital converter is configured to determine a set of ADC samples based on said input signal, wherein said sampling assembly is configured to synchronize said set of acquisition samples and said set of ADC samples.

10. The sampling assembly according to claim 6, further comprising an analog to digital converter being connected to said input, wherein said analog to digital converter is configured to determine a set of ADC samples based on said input signal, wherein said sampling assembly is configured to calibrate said light receiver and/or said acquisition unit based on said set of ADC samples.

11. The sampling assembly according to claim 1, wherein said light receiver comprises at least one of a CCD sensor and a CMOS sensor.

12. The sampling assembly according to claim 1, further comprising a signal generator connected to said deflector unit, said signal generator being configured to generate said deflection command signal.

13. A testing instrument, comprising a sampling assembly, said sampling assembly comprising an input, a light source unit, at least one deflector unit and a light receiver, said input being configured to receive an electrical input signal; said light source unit being configured to generate and output a light beam in the direction of said deflector unit, said light source unit being configured to adapt an intensity of said light beam based on an amplitude of said input signal; said deflector unit being configured to obtain a deflection command signal, said deflector unit further being configured to deflect said light beam into at least one spatial direction based on said deflection command signal; and said light receiver comprising at least two photosensitive pixels, said light receiver being configured to receive said light beam via at least one of said at least two photosensitive pixels, and said light receiver being configured to convert received light into an electrical output signal.

14. The testing instrument according to claim 13, wherein said sampling assembly further comprises an acquisition unit connected to said light receiver, said acquisition unit being configured to determine a set of acquisition samples based on said electrical output signal.

15. The testing instrument according to claim 13, wherein said sampling assembly further comprises an analog to digital converter connected to said input, wherein said analog to digital converter is configured to determine a set of ADC samples based on said input signal.

16. The testing instrument according to claim 14, wherein said sampling assembly further comprises an analog to digital converter connected to said input, wherein said analog to digital converter is configured to determine a set of ADC samples based on said input signal, and wherein said sampling assembly is configured to synchronize said set of acquisition samples and said set of ADC samples.

17. The testing instrument according to claim 14, wherein said sampling assembly further comprises an analog to digital converter connected to said input, wherein said analog to digital converter is configured to determine a set of ADC samples based on said input signal, and wherein said sampling assembly is configured to calibrate said light receiver and/or said acquisition unit based on said set of ADC samples.

18. The testing instrument according to claim 13, wherein at least one of said testing instrument and said sampling assembly further comprises a signal generator being connected to said deflector unit, said signal generator being configured to generate said deflection command signal.

19. A sampling assembly, comprising an input, a particle source unit, at least one deflector unit and a particle receiver, said input being configured to receive an electrical input signal; said particle source unit being configured to generate and output a particle beam in the direction of said deflector unit, said particle source unit being configured to adapt an intensity of said particle beam based on an amplitude of said input signal; said deflector unit being configured to obtain a deflection command signal, said deflector unit further being configured to deflect said particle beam into at least one spatial direction based on said deflection command signal; and said particle receiver comprising at least two particle-sensitive pixels, said particle receiver being configured to receive said particle beam via at least one of said at least two particle-sensitive pixels, and said particle receiver being configured to convert received particles into an electrical output signal.

Description

DESCRIPTION OF THE DRAWINGS

[0053] The foregoing aspects and many of the attendant advantages of the claimed subject matter will become more readily appreciated as the same become better understood by reference to the following detailed description, when taken in conjunction with the accompanying drawings, wherein:

[0054] FIG. 1 schematically shows a representative testing instrument according to an embodiment of the present disclosure;

[0055] FIG. 2 shows a block diagram of a representative signal analysis method using the testing instrument of FIG. 1;

[0056] FIG. 3 shows a front view of a light receiver of the testing instrument of FIG. 1; and

[0057] FIG. 4 schematically shows two sets of samples of an input signal.

DETAILED DESCRIPTION

[0058] The detailed description set forth below in connection with the appended drawings, where like numerals reference like elements, is intended as a description of various embodiments of the disclosed subject matter and is not intended to represent the only embodiments. Each embodiment described in this disclosure is provided merely as an example or illustration and should not be construed as preferred or advantageous over other embodiments. The illustrative examples provided herein are not intended to be exhaustive or to limit the claimed subject matter to the precise forms disclosed.

[0059] FIG. 1 schematically shows a testing instrument 10. Generally speaking, the testing instrument 10 may be a measurement instrument that is used to measure and analyze electromagnetic signals of any type.

[0060] In some embodiments, the testing instrument 10 is a digital measurement device that is configured to digitize and analyze analog input signals, as will be described in more detail below. For example, the testing instrument 10 may be established as a (digital) oscilloscope, as a vector network analyzer or as any other kind of measurement device.

[0061] The testing instrument 10 comprises a sampling assembly 12 with an input 14, a light source, such as light source unit 16, a deflector, such as deflector unit 18, a light receiver 20, an acquisition circuit or unit 22, an analog to digital converter (ADC) 24, and a signal generator 25.

[0062] It is noted that in the context of this disclosure, the term “light” is to be understood to comprise not only visible light, but also light in the infrared range and/or in the ultraviolet range.

[0063] The light source unit 16 and the analog to digital converter 24 are each connected to the input 14 in a signal-transmitting manner. In an embodiment, the light source unit 16, the deflector unit 18 and the light receiver 20 are all arranged along a common optical axis A. The light receiver 20 and the analog to digital converter 24 are both connected to the acquisition unit 22 in a signal-transmitting manner.

[0064] The light source unit 16 comprises a laser 26 and a light modulator 28, which both are arranged along the optical axis A. The laser 26 and the light modulator 28 may be established separately from each other. Alternatively, the light source unit 16 may be formed in a unitary manner. In other words, the laser 26 has an integrated light modulator, for example an integrated light modulator with respect to the amplitude.

[0065] The deflector unit 18 comprises a first deflector element 30 and a second deflector element 32, wherein the deflector elements 30, 32 are both arranged along the optical axis A.

[0066] The light receiver 20 is established as a two-dimensional screen, for example as a CCD sensor and/or as a CMOS sensor, having several pixels 34, for example light-sensitive pixels.

[0067] The testing instrument 10 or rather the sampling assembly 12 is configured to perform a sampling method of sampling an electrical input signal. This sampling method is described in more detail below with reference to FIGS. 1 and 2.

[0068] An electrical input signal is received via the input 14 and is forwarded to both the analog to digital converter 24 and to the light source unit 16, more precisely to the light modulator 28 (step S1).

[0069] The electrical input signal is an analog signal that is to be digitized by the sampling assembly 12.

[0070] Generally speaking, the light source unit 16 generates a light beam based on the electrical input signal and emits the light beam along the optical axis A in the direction of the deflector unit 18 (step S2).

[0071] Therein, the light source unit 16 adapts an intensity of the light beam based on a momentary amplitude of the electrical input signal. Thus, a light beam with a higher momentary intensity is generated if the momentary amplitude of the electrical input signal is high, and a light beam with a lower momentary intensity is generated if the momentary amplitude of the electrical input signal is low.

[0072] In the specific embodiment depicted in FIG. 1, the laser 26 generates a laser beam that is subsequently dampened by the light modulator 28 based on the momentary amplitude of the electrical input signal. In other words, the laser 26 always generates a light beam having a constant intensity, which however is dampened/attenuated by the light modulator 28 prior to leaving the light source unit 16.

[0073] However, it is also possible that the laser 26 itself may generate the laser beam with varying intensity based on a momentary amplitude of the electrical input signal received. In this case, the light modulator 28 is not needed.

[0074] In any case, the light source unit 16 has an input for receiving the electrical input signal that is used to adapt the light beam (intensity). This input may be assigned to the laser 26 or the light modulator 28.

[0075] In addition, the signal generator 25 generates a deflection command signal and forwards the deflection command signal to the deflection unit 18 (step S3).

[0076] Based on the deflection command signal, the deflector unit 18 deflects the light beam into at least one spatial direction, for example into two spatial directions (step S4).

[0077] Thus, the deflected light beam encloses an angle with the optical axis A, and with at least one of the spatial direction that are perpendicular to the optical axis A.

[0078] More precisely, the deflector unit 18 deflects the light beam according to a predefined pattern, which predefined pattern is determined by the deflection command signal.

[0079] Thus, the deflector unit 18 deflects the light beam such that the light beam hits the individual pixels 34 of the light receiver 20 in a predetermined order, wherein the order is determined by the deflection command signal.

[0080] Generally speaking, the deflection of the light beam is based on deflection within the first deflector element 30 and/or within the second deflector element 32. The first deflector elements 30 may deflect the light beam in one of the two spatial directions, while the second deflector element 32 may deflect the light beam in the other one of the two spatial directions. In some embodiments, these spatial directions are perpendicular with respect to each other. The first direction may relate to a deflection in horizontal direction, whereas the second direction may relate to a deflection in vertical direction.

[0081] The refractive index of the first deflector element 30 and of the second deflector element 32 can individually be controlled by the deflection command signal, such that the deflection angles of the light beam after passing through the deflector elements 30, 32 with respect to the optical axis A are controllable. Put differently, the deflections in the first spatial direction and/or the second spatial direction are controllable.

[0082] For example, the first deflector element 30 and/or the second deflector element 32 may each comprise an electro-optic element and/or a acousto-optic element. The refractive index of such components can be controlled by applying an electric field or a sound wave to the component, respectively.

[0083] The functionality of the deflector elements 30, 32 may be based on the Pockels effect and/or the Kerr effect.

[0084] Thus, the deflection command signal may be an electrical signal that is applied to the deflector elements 30, 32. Alternatively or additionally, the deflection command signal may be converted into an acoustic signal, and the acoustic signal may be applied to the deflector elements 30, 32.

[0085] Thus, due to the steps S3 and S4 described above, the light beam is deflected such that it hits pixels 34 in a predefined order, wherein the predefined order is known or can at least be reconstructed from the deflection command signal generated by the signal generator 25.

[0086] In some embodiments, the light beam is deflected such that it hits the pixels 34 in a periodic pattern, i.e. in a repeating pattern.

[0087] The deflection command signal may be generated such that the pattern or rather the order of pixels hit by the light beam can easily be identified. For example, the light beam may be deflected such that it hits the pixels 34 in a spiral pattern, in a zig-zag-pattern, etc.

[0088] Alternatively or additionally, the light beam may be deflected such that it hits at least a predefined portion of the pixels 34 within one repetition of the pattern. The light beam may hit at least 25% of the pixels, at least 50% of the pixels and/or at least 75% of the pixels 34. In some embodiments, the light beam may hit all of the pixels 34 during one repetition of the pattern.

[0089] FIG. 3 illustrates one example for such a pattern, namely the spiral pattern already mentioned above. As is also shown in FIG. 3, the light beam may be generated and/or deflected such that time markers are generated. For example, the laser 26 may be operated in a pulsed operation mode, such that there are gaps within the pattern of the light beam hitting the pixels 34.

[0090] The individual pixels 34 each convert the impinging light of the light beam into an electrical output signal (step S5). Therein, the amplitude of the electrical output signals that are output by the individual pixels are proportional to the respective intensity of the light beam falling onto that particular pixel 34.

[0091] The electrical output signals generated by the pixels 34 are forwarded to the acquisition unit 22. The acquisition unit 22 determines a set of acquisition samples based on the electrical output signals of the pixels 34 (step S6).

[0092] Therein, the individual acquisition samples contain information about the amplitude of the original input signal, as the amplitude of the electrical output signal corresponding to that particular acquisition sample is proportional to the light beam intensity, which in turn is proportional to the amplitude of the electrical input signal.

[0093] Moreover, the acquisition samples also contain time information about the time relation between the individual acquisition samples, as the correct order of the individual acquisition samples is the same as the order in which the corresponding pixels 34 are hit by the light beam.

[0094] The time information may also be derived from the deflection command signal, which may be forwarded to the acquisition unit 22.

[0095] Thus, the set of acquisition samples comprises information about the development of the amplitude of the electrical input signal over time. In other words, the set of acquisition samples corresponds to a sampled version of the original electrical input signal.

[0096] In order to calibrate and/or improve the accuracy of the method described above, the following additional steps may be performed.

[0097] The electrical input signal is digitized via the analog to digital converter 24 (step S7). Thereby, a set of ADC samples is generated.

[0098] For input signal frequencies exceeding the sampling rate of the analog to digital converter 24, the electrical input signal may be “under-sampled”, i.e. the number of sampling points per time interval is not enough in order to unambiguously reconstruct the electrical input signal. However, at the individual sampling points, the amplitude and time information contained in the set of ADC samples is correct.

[0099] The acquisition unit 22 may synchronize the set of ADC samples and the set of acquisition samples (step S8). In other words, the sets of samples are aligned with one another, such that a temporal accordance between the two sets is obtained.

[0100] The result of step S8 is illustrated in FIG. 4, which shows the original electrical input signal x.sub.in(t), the set of ADC samples {s.sub.ADC,i} and the set of acquisition samples {s.sub.acq,i}, each plotted against time t.

[0101] Based on the ADC samples, the light receiver 20 and/or the acquisition unit 22 may be calibrated (step S9).

[0102] As already mentioned above, the amplitude information contained in the ADC samples is correct, even if the number of samples may be not enough to accurately reconstruct the electrical input signal.

[0103] Thus, as soon as the two sets are correctly aligned, the amplitude information of the set of ADC samples is used to calibrate the light receiver 20 and/or the acquisition unit 22 to correctly interpret the signals from the light receiver 20.

[0104] Thus, the test instrument 10 described above comprises the “conventional” analog to digital converter 24, an optical analog to digital converter module, which comprises the light source unit 16, the deflector unit 18 and the light receiver 20, as well as the acquisition unit 22.

[0105] This optical analog to digital converter module may achieve much higher sampling rates compared to the analog to digital converter 24. In order to enhance the accuracy of the optical analog to digital converter, it is calibrated by using the analog to digital converter 24.

[0106] It is noted that it is possible to replace the light source unit 16 with a corresponding particle source unit. Thus, compared to the embodiment of the sampling assembly described above, a particle beam is generated instead of a light beam.

[0107] In some embodiments, the particle source unit is established as an electron source unit that is configured to generate an electron beam, wherein the intensity of the electron beam is adapted based on the momentary amplitude of the electrical input signal.

[0108] Of course, with the light source unit 16 being replaced by a particle source unit, the deflector unit is adapted as well. For example, the deflector unit 18 may be adapted to deflect the particle beam via suitable electric and/or magnetic fields.

[0109] Moreover, the light receiver 20 described above is replaced with a corresponding particle receiver. The particle receiver comprises pixels that are each configured to generate an electrical output signal when hit by the particle beam, analogously to the embodiment described above.

[0110] Certain embodiments disclosed herein utilize circuitry (e.g., one or more circuits) in order to implement protocols, methodologies or technologies disclosed herein, operably couple two or more components, generate information, process information, analyze information, generate signals, acquire signals, encode/decode signals, convert signals, transmit and/or receive signals, control other devices, etc. Circuitry of any type can be used.

[0111] In an embodiment, circuitry includes, among other things, one or more computing devices such as a processor (e.g., a microprocessor), a central processing unit (CPU), a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), a system on a chip (SoC), or the like, or any combinations thereof, and can include discrete digital or analog circuit elements or electronics, or combinations thereof. In an embodiment, circuitry includes hardware circuit implementations (e.g., implementations in analog circuitry, implementations in digital circuitry, and the like, and combinations thereof).

[0112] In an embodiment, circuitry includes combinations of circuits and computer program products having software or firmware instructions stored on one or more computer readable memories that work together to cause a device to perform one or more protocols, methodologies or technologies described herein. In an embodiment, circuitry includes circuits, such as, for example, microprocessors or portions of microprocessor, that require software, firmware, and the like for operation. In an embodiment, circuitry includes an implementation comprising one or more processors or portions thereof and accompanying software, firmware, hardware, and the like.

[0113] The present application may reference quantities and numbers. Unless specifically stated, such quantities and numbers are not to be considered restrictive, but exemplary of the possible quantities or numbers associated with the present application. Also in this regard, the present application may use the term “plurality” to reference a quantity or number. In this regard, the term “plurality” is meant to be any number that is more than one, for example, two, three, four, five, etc. The terms “about,” “approximately,” “near,” etc., mean plus or minus 5% of the stated value. For the purposes of the present disclosure, the phrase “at least one of A and B” is equivalent to “A and/or B” or vice versa, namely “A” alone, “B” alone or “A and B.”. Similarly, the phrase “at least one of A, B, and C,” for example, means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B, and C), including all further possible permutations when greater than three elements are listed.

[0114] The principles, representative embodiments, and modes of operation of the present disclosure have been described in the foregoing description. However, aspects of the present disclosure which are intended to be protected are not to be construed as limited to the particular embodiments disclosed. Further, the embodiments described herein are to be regarded as illustrative rather than restrictive. It will be appreciated that variations and changes may be made by others, and equivalents employed, without departing from the spirit of the present disclosure. Accordingly, it is expressly intended that all such variations, changes, and equivalents fall within the spirit and scope of the present disclosure, as claimed.