CERAMIC BASED STRAIN DETECTOR
20210293645 · 2021-09-23
Assignee
Inventors
- Anastacio FAVELA CARRASCO (San Nicolas de los Garza, MX)
- Carlos Ramon BAEZ ALVAREZ (Apodaca, MX)
- Alfredo Alberto DE LA LLATA AYALA (General Escobedo, MX)
Cpc classification
G01M5/0083
PHYSICS
G01L1/18
PHYSICS
G01L1/20
PHYSICS
International classification
Abstract
A ceramic based strain detector includes a ceramic body including a conductive member deposited thereon, and a pair of conductive end caps affixed to respective ends of the ceramic body. The strain detector is supported by a circuit board and fractures when the circuit board undergoes excessive strain. A strain monitor is configured to detect when the strain detector fractures by sensing a resistance between the pair of conductive end caps.
Claims
1. An apparatus comprising: (a) a circuit board; (b) a strain detector including a fracturable body including a conductive member deposited thereon; (c) said strain detector including a pair of conductive end caps affixed to respective ends of said fracturable body; (d) said strain detector supported by said circuit board and configured such that said fracturable body fractures when said circuit board undergoes excessive strain; (e) a strain monitor configured to detect when said strain detector fractures by sensing a resistance between said pair of conductive end caps.
2. The apparatus of claim 1 wherein said circuit board is a printed circuit board.
3. The apparatus of claim 1 wherein said fracturable body is rectangular.
4. The apparatus of claim 1 wherein said fracturable body is less than 300 micrometers thick.
5. The apparatus of claim 1 wherein said fracturable body has a length less than 2 mm.
6. The apparatus of claim 1 wherein said fracturable body has a width less than 1 mm.
7. The apparatus of claim 1 wherein said conductive material covers an entire upper surface of said fracturable body.
8. The apparatus of claim 1 wherein said conductive material covers at least a majority of an upper surface of said fracturable body.
9. The apparatus of claim 1 wherein said conductive material also fractures together with said fracturable body.
10. The apparatus of claim 1 wherein said conductive material is less than 10 micrometers thick.
11. The apparatus of claim 1 wherein said strain monitor senses a change in resistance of said resistance between said pair of conductive end caps.
12. The apparatus of claim 1 wherein said change in resistance is greater than 2 times to indicate said fracture.
13. The apparatus of claim 1 wherein said strain monitor senses at least 10 ohms to indicate said fracture.
Description
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
[0009]
[0010]
[0011]
[0012]
[0013]
[0014]
DETAILED DESCRIPTION OF PREFERRED EMBODIMENT
[0015] As previously described, printed circuit board assemblies (PCBAs) are becoming more complex and susceptible to mechanical strain induced failures. Mechanical strain can cause failures during assembly, shipping, handling, and field operation. Such failures due to mechanical strain may occur in solder joints, traces, or in the circuit board itself, inclusive of pad cratering. Determining the existence of such failures, including when such failures occur, is desirable to take measures to prevent such future failures, and to repair or discard damaged printed circuit board assemblies.
[0016] Referring to
[0017] One or more strain detectors 130 may be supported by the upper surface of the circuit board 100. Preferably one or more strain detectors 130A is included within the first high stress region 120A. Preferably one or more strain detectors 130B is included within the second high stress region 120B. Preferably one or more strain detectors 130C is included within the third high stress region 120C. Preferably one or more strain detectors 130D is included within the fourth high stress region 120D. Often, the regions proximate the corners of a package 110 are more susceptible to damage due to straining or flexing. One or more strain detectors 130 may be located at any other suitable location on the printed circuit board 110, and preferably located in those regions that are more susceptible to damage due to straining or flexing circuit board 110.
[0018] Referring to
[0019] Referring to
[0020] The strain detector 300 is supported by the upper surface of the printed circuit board 100 and secured thereto, such as by soldering. The particular ceramic material 210 together with its dimensions are selected such that it fractures at a specific strain imposed thereon that is consistent with the mechanical strain range of the particular printed circuit board that it is supported thereon. In other words, the ceramic body material and dimensions are selected such that it will fracture within a mechanical strain range depending on the range of strain to be detected for a particular printed circuit board. The excessive strain may be the result, for example, of assembly, of shipping, of handling, and/or of field operation. Alternatively, the ceramic body may be constructed from other materials that fracture under stress. Referring to
[0021] During the assembly of the package 110 on the printed circuit board 100, with the strain detectors 300 already supported thereon, the conductivity of each of the strain detectors 300 may be tested to ensure that the printed circuit board 100 has not undergone excessive strain. After shipping (to or from a customer) and/or handling and/or field operations the printed circuit board 100 with the package 110 and the strain detectors 300 supported thereon, the conductivity of each of the strain detectors 300 may be tested to ensure that the printed circuit board 100 has not undergone excessive strain. Periodically while using the printed circuit board 100 with the package 110 and the strain detectors 300 supported thereon, the conductivity of each of the strain detectors 300 may be tested to ensure that the printed circuit board 100 has not undergone excessive strain. A sufficient difference in the results of the testing will indicate when such an excessive strain occurred.
[0022] Referring to
[0023] By way of example, the strain sensor may be approximately 1 mm (or less) by 2 mm (or less) in size with a ceramic thickness of approximately 50-300 micrometers and with a conductive material thickness of a few micrometers (e.g., less than 10 micrometers). For example, the strain sensor may have approximately 0-5 ohms of resistance prior to fracture. For example, the strain sensor may have approximately 10 ohms of resistance (or more) after fracture. Preferably, the change in resistance is greater than 2×, and/or greater than 20 ohms. Further, the alarm circuit 600 may store the pre-fracture resistance(s) so that if a substantial change from the pre-fracture resistance occurs, it may be readily determined. If desired, the testing may occur shortly before shipment of the product to a customer, then may be testing may occur after shipment to the customer, to determine if an overstress occurred during transportation and/or during the life at the customer.
[0024] While this specification contains many specific implementation details, these should not be construed as limitations on the scope of any invention or of what may be claimed, but rather as descriptions of features that may be specific to particular implementations of particular inventions. Certain features that are described in this specification in the context of separate implementations can also be implemented in combination in a single implementation. Conversely, various features that are described in the context of a single implementation can also be implemented in multiple implementations separately or in any suitable subcombination. Moreover, although features may be described above as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can in some cases be excised from the combination, and the claimed combination may be directed to a subcombination or variation of a sub combination.
[0025] Similarly, while operations are depicted in the drawings in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. In certain circumstances, multitasking and parallel processing may be advantageous. Moreover, the separation of various system components in the implementations described above should not be understood as requiring such separation in all implementations, and it should be understood that the described program components and systems can generally be integrated together in a single product or packaged into multiple products.
[0026] The terms and expressions which have been employed in the foregoing specification are used therein as terms of description and not of limitation, and there is no intention, in the use of such terms and expressions, of excluding equivalents of the features shown and described or portions thereof, it being recognized that the scope of the invention is defined and limited only by the claims which follow.