Method and apparatus for analysing a component
11125679 · 2021-09-21
Assignee
Inventors
Cpc classification
F05D2260/80
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
F05D2300/606
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
Y02T50/60
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
F05D2300/607
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
F05D2300/17
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
F01D21/003
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
G01N21/9515
PHYSICS
International classification
F01D21/00
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
Abstract
A method of analysing a component formed from a metal alloy to identify a possible defect, wherein the metal alloy comprises a first crystal grain region and the possible defect comprises a second crystal grain region aligned to a different axis to the first crystal grain region, the method comprising the steps of: obtaining a first image of the component illuminated using a first polarisation state of light, the first image comprising first polarisation data; obtaining a second image of the component illuminated using a second polarisation state of light different to the first polarisation state, the second image comprising second polarisation data; determining a difference in polarisation data for plural pixels of the first image between each pixel of the first image and a corresponding pixel of the second image; and identifying pixels corresponding to the second crystal grain region based on the difference in polarisation data.
Claims
1. A method of analysing a component formed from a metal alloy to identify a possible defect, wherein the metal alloy comprises a first crystal grain region and the possible defect comprises a second crystal grain region aligned to a different axis to the first crystal grain region, the method comprising the steps of: obtaining a first image of the component using a multi-pixel sensor and illuminated using a first polarisation state of light, the first image comprising first polarisation data across a plurality of pixels within the multi-pixel sensor; obtaining a second image of the component using a multi-pixel sensor and illuminated using a second polarisation state of light different to the first polarisation state, the second image comprising second polarisation data across a plurality of pixels within the multi-pixel sensor; determining a difference between the first and second polarisation data for the plurality of pixels of the first image and a corresponding plurality of pixels of the second image; and identifying pixels corresponding to the second crystal grain region based on the difference in first polarisation data from the plurality of pixels of the first image and second polarisation data of the corresponding plurality of pixels of the second image.
2. The method of claim 1, wherein a pixel is categorised as corresponding to the first crystal grain region if the difference between first polarisation data from the plurality of pixels of the first image and second polarisation data of the corresponding plurality of pixels of the second image falls within a first range, or corresponding to the second crystal grain region if the difference between first polarisation data from the plurality of pixels of the first image and second polarisation data of the corresponding plurality of pixels of the second image falls within a second range, where the first range is different to the second range.
3. The method of claim 1, wherein a pixel is categorised as corresponding to the second crystal grain region if the difference in first and second polarisation data exceeds a threshold value.
4. The method of claim 1, further comprising determining the angle of orientation of the second crystal grain region relative to the angle of orientation of the first crystal grain region based on the difference in first and second polarisation data.
5. The method of claim 1, further comprising determining the location of the boundary between the second crystal grain region and the first crystal grain region based on the difference in first and second polarisation data.
6. The method of claim 1, further comprising determining the area of the second crystal grain region based on the difference in first and second polarisation data.
7. The method of claim 1, wherein the component is illuminated using the first polarisation state of light at the same perspective and orientation relative to the illumination using the second polarisation stage of light.
8. The method of claim 1, wherein the second image is obtained at the same perspective and orientation relative to the component as the first image.
9. The method of claim 1, wherein at least one of the first and second polarisation states is a circular polarisation state.
10. The method of claim 1, wherein each of the first image and the second image further comprise intensity data; and the method further comprises the step of determining a difference in intensity for plural pixels of the first image between each pixel of the first image and a corresponding pixel of the second image; wherein the identification of pixels corresponding to the second crystal grain region is additionally based on the difference in intensity.
11. The method of claim 1, further comprising obtaining a plurality of further images of the component, wherein each of the further plurality of images is obtained using a different polarisation state to each of the other of the further plurality of images; and storing the polarisation data of each of the images of the component in a matrix of image data; wherein the identification of pixels corresponding to the second crystal grain region is performed by analysis of the matrix of image data.
12. The method of claim 1, wherein at least one of the first and second polarisation states of light is a linear polarisation state.
13. The method of claim 12, wherein both of the first and second polarisation states of light are linear polarisation states and incident upon the component in a plane of incidence, the first linear polarisation state being at a different polarisation angle with respect to the plane of incidence to the second linear polarisation state.
14. An apparatus for analysing a component formed from a metal alloy, the apparatus comprising: a light source configured to produce polarised light; a detector comprising a sensor with multiple pixels, each pixel configured to detect the polarisation state of light incident on the pixel; and an analyser; wherein the apparatus is configured to perform the method of claim 1.
15. A method of analysing a component formed from a metal alloy to identify a possible defect, wherein the metal alloy comprises a first crystal grain region and the possible defect comprises a second crystal grain region aligned to a different axis to the first crystal grain region; and the method comprises the steps of: obtaining an image of the component illuminated using a first polarisation state of light, the first image comprising polarisation data; determining a difference in polarisation data for plural pixels of the first image between each pixel of the first image and at least one other pixel of the first image; and identifying pixels corresponding to the second crystal grain region based on the difference in polarisation data.
16. The method of claim 15, wherein each pixel is categorised as corresponding to the first crystal grain region by identifying a first region of the differences in polarisation data in a first range or corresponding to the second crystal grain region by identifying a second region of the differences in polarisation data in a second range, where the first range is different to the second range.
17. The method of claim 15, wherein each pixel is categorised as corresponding to the second crystal grain region if the difference in polarisation data exceeds a threshold value.
18. The method of claim 15, further comprising determining the angle of orientation of the second crystal grain region relative to the angle of orientation of the first crystal grain region based on the difference in polarisation data.
19. The method of claim 15, further comprising determining the location of the boundary between the second crystal grain region and the first crystal grain region based on the difference in polarisation data.
20. The method of claim 15, further comprising determining the area of the second crystal grain region based on the difference in polarisation data.
Description
DESCRIPTION OF THE DRAWINGS
(1) Embodiments will now be described by way of example only, with reference to the Figures, in which:
(2)
(3)
(4)
(5)
(6)
(7)
DETAILED DESCRIPTION
(8) Aspects and embodiments of the present disclosure will now be discussed with reference to the accompanying figures. Further aspects and embodiments will be apparent to those skilled in the art.
(9)
(10) In use, the core airflow A is accelerated and compressed by the low pressure compressor 14 and directed into the high pressure compressor 15 where further compression takes place. The compressed air exhausted from the high pressure compressor 15 is directed into the combustion equipment 16 where it is mixed with fuel and the mixture is combusted. The resultant hot combustion products then expand through, and thereby drive, the high pressure and low pressure turbines 17, 19 before being exhausted through the core exhaust nozzle 20 to provide some propulsive thrust. The high pressure turbine 17 drives the high pressure compressor 15 by a suitable interconnecting shaft 27. The fan 23 generally provides the majority of the propulsive thrust. The epicyclic gearbox 30 is a reduction gearbox.
(11) An exemplary arrangement for a geared fan gas turbine engine 10 is shown in
(12) that the terms “low pressure turbine” and “low pressure compressor” as used herein may be taken to mean the lowest pressure turbine stages and lowest pressure compressor stages (i.e. not including the fan 23) respectively and/or the turbine and compressor stages that are connected together by the interconnecting shaft 26 with the lowest rotational speed in the engine (i.e. not including the gearbox output shaft that drives the fan 23). In some literature, the “low pressure turbine” and “low pressure compressor” referred to herein may alternatively be known as the “intermediate pressure turbine” and “intermediate pressure compressor”. Where such alternative nomenclature is used, the fan 23 may be referred to as a first, or lowest pressure, compression stage.
(13) The epicyclic gearbox 30 is shown by way of example in greater detail in
(14) The epicyclic gearbox 30 illustrated by way of example in
(15) It will be appreciated that the arrangement shown in
(16) Accordingly, the present disclosure extends to a gas turbine engine having any arrangement of gearbox styles (for example star or planetary), support structures, input and output shaft arrangement, and bearing locations.
(17) Optionally, the gearbox may drive additional and/or alternative components (e.g. the intermediate pressure compressor and/or a booster compressor).
(18) Other gas turbine engines to which the present disclosure may be applied may have alternative configurations. For example, such engines may have an alternative number of compressors and/or turbines and/or an alternative number of interconnecting shafts. By way of further example, the gas turbine engine shown in
(19) The geometry of the gas turbine engine 10, and components thereof, is defined by a conventional axis system, comprising an axial direction (which is aligned with the rotational axis 9), a radial direction (in the bottom-to-top direction in
(20)
(21) The component 40 may be formed from a metal alloy, for example nickel, and the manufacturing process for the component 40 may be intended to result in a single crystal alloy. The component 40 may comprise a first crystal grain region 41. The first crystal grain may be the intended crystal grain from which the component 40 is to be formed. The first crystal grain region 41 has a particular crystal grain axis 410.
(22) If the manufacturing process for the component 40 has been performed successfully, the first crystal grain region 41 may be the only crystal grain present in the component 40. Alternatively, a second crystal grain region 42 may also be present in the component 40. The second crystal grain region 42 has a crystal grain axis 420 that is different to the crystal grain axis 410 of the first crystal grain region 41.
(23) The presence of the second crystal grain region 42 may be considered a defect. The presence of the defect may be due to an error in the manufacturing process of the component 40. Alternatively, the presence of defects may be unavoidable but it may be desirable to reduce the presence of defects in the component 40.
(24) It is possible to obtain information about the presence of such defects through optical analysis of the surface of the component. For example, when a component 40 formed of a nickel material is cast and goes through a blast and etch process, gamma prime precipitate blocks form the optical surface of the component. The presence of a second crystal grain 42 at the surface of the component 40 may cause a change in behaviour of light illuminating the component 40. For example, the difference in the angle of the crystal grain axis 420 of the second crystal grain region 42 to the crystal grain axis 410 of the first crystal grain region 41 (known as the sheer angle) may cause a shift in the angular position of maximum reflectance from the surface of the component 40.
(25) The gamma prime precipitate blocks which form the surface of the component 40 may have a similar size distribution to the wavelength of light used to illuminate the surface. In this case, the surface of the component 40 may exhibit diffraction grating like properties. The presence of a second crystal grain region 42 at a different crystal grain axis 420 results in an in-plain rotation of the diffraction grating like surface, which causes a polarisation shift in light reflected from the surface. Therefore, the presence of a second crystal grain region 42 may cause a change in the polarisation angle of light illuminating the surface of the component 40 when compared to light illuminating the first crystal grain region 41.
(26) It is therefore possible to obtain information about the presence of a second crystal grain region 42 within a component 40 by imaging the component 40 using different polarisations states of light. It is also possible to obtain information about the presence of a second crystal grain region 42 by imaging the component 40 using a single polarisation state of light by comparing the polarisation state of different regions of an obtained image of the component 40.
(27) An example of the steps of such a method is shown in
(28) In a second step 52, a second image of the component 40 may be obtained. When obtaining the second image, the component 40 is illuminated using light of a second polarisation state which is different to the first polarisation state. The second image also includes polarisation data such as the polarisation angle recorded for each pixel.
(29) The method described above may be performed with various different polarisation states. For example, both the first polarisation state used to obtain the first image and the second polarisation state used to obtain the second image may be linear polarisation states. In this case, the polarisation angle of the first state may be different to the second state. Alternatively, one of the states may be a circular polarisation state. Different polarisation states may be used depending on the nature of the defect and the component being analysed.
(30) In a third step 53, a difference in polarisation is be calculated. If only the first image of the component 40 has been obtained, the difference in polarisation may be determined between different regions of the first image. For example, each pixel of the first image may be compared to at least one other pixel of the first image. In the case where the second image has been obtained, the first image of the component 40 and the second image of the component 40 are compared. A plurality of pixels in the first image may be compared to corresponding pixels of the second image. Corresponding pixels may be pixels from each image that represent the same point on the surface of the component 40.
(31) A difference in the measured polarisation between corresponding pixels may be calculated. For example, the change in the recorded polarisation angle between the corresponding pixels may be calculated.
(32) In a fourth step 54, pixels corresponding to the second crystal grain region 42 may be determined based on the calculated difference in polarisation. Using this method, regions of the second crystal grain region 42, which may be a defect in the component 40 as discussed above, can be identified. Identification of various properties of such defect regions may allow selection of components with minimal or no defects. Identification of the properties may allow improvement of the manufacturing method of the component 40 by comparing the properties defects between different components manufactured using different methods.
(33) The different regions in the component 40 may be identified in different ways. For example, particular regions of the component 40 may be characterised as being part of the first region 41 if the calculated polarisation difference falls into a first range. Particular regions of the component 40 may be characterised as being part of the second region 42 if the calculated polarisation difference falls into a second range. Alternatively, a region of the image may be categorised as being part of the second region 42 if the calculated in polarisation exceeds a threshold value.
(34) The calculated difference in polarisation may be used to determine further information about the second crystal grain region 42. For example, the calculated difference in polarisation may be used to calculate the angle of orientation of the second crystal grain axis 420 relative to the angle of orientation of the first crystal grain axis 410. The boundary between the two regions may also be determined. The area of the second crystal grain region 42, either as an absolute value or relative to the area of the first crystal grain region 41 may also be obtained.
(35) Each of the first image and the second image may be obtained with at least one of the illumination source and the light receiver arranged at the same orientation relative to the component 40. In this case, identifying corresponding pixels in the first and the second images may be simpler as corresponding pixels will be at the same location in each image.
(36) Additional information may be used to assist with the identification of the second crystal grain region 42. For example, when the polarisation information of the first image and the second image is obtained, intensity data may also be obtained for each pixel. A difference in intensity between different pixels within the first image or corresponding pixels of the first image and the second image may be calculated. The calculated difference in intensity may be used in addition to the calculated difference in polarisation when determining the properties of the second crystal grain region 42 as discussed above.
(37) The method discussed above is not limited to the obtaining of only two images. Any number of images may be obtained, where each of the further plurality of images is obtained using a different polarisation state of light to each of the other plurality of images. For example, a plurality of images may be obtained, where linearly polarised light is used to illuminate the object 40 and the polarisation angle of the light is stepped through in each subsequent image. When a plurality of images has been obtained, the polarisation values of each of the pixels of the plurality of images may be stored as a matrix of image data. Identification of pixels corresponding to the second crystal grain region 42 may be performed by analysis of the matrix of image data. Data mining and deep learning techniques such as the analysis of the matrix of image data using trained neural networks may be used.
(38)
(39) The light reaches the component 40, is reflected in the plane of incidence and is received by a detector 62. The detector 62 may comprise a sensor with multiple pixels, where in each pixel is configured to detect the polarisation state of light incident on the pixel. Image data obtained by the detector 62 may be passed to an analyser 63. The analyser 63 may compare the image data of multiple images obtained by the detector 62 to calculate the differences in polarisation as discussed above.
(40) It will be understood that the invention is not limited to the embodiments above-described and various modifications and improvements can be made without departing from the concepts described herein. Except where mutually exclusive, any of the features may be employed separately or in combination with any other features and the disclosure extends to and includes all combinations and sub-combinations of one or more features described herein.