Blending temperature-dependent currents to generate bias current with temperature dependent profile
11112315 · 2021-09-07
Assignee
Inventors
- Mohamed ABOUZIED (La Jolla, CA, US)
- Ibrahim Ramez Chamas (Carlsbad, CA, US)
- Bhushan Shanti Asuri (San Diego, CA)
Cpc classification
G05F3/245
PHYSICS
International classification
Abstract
An apparatus for generating a temperature-dependent current. The apparatus includes an input current scaling circuit configured to generate a first current that varies with temperature in accordance with a first programmable slope, and a second current that varies with temperature in accordance with a second programmable slope; and a current temperature blending circuit configured to generate a third current based on the first current over a first temperature range and the second current over a second temperature range, wherein the first temperature range is different than the second temperature range.
Claims
1. An apparatus, comprising: an input current scaling circuit configured to: generate a first current that varies with temperature in accordance with a first programmable slope; and generate a second current that varies with temperature in accordance with a second programmable slope; and a current temperature blending circuit configured to generate a third current based on the first current over a first temperature range and the second current over a second temperature range, wherein the first temperature range is different than the second temperature range.
2. The apparatus of claim 1, wherein the first programmable slope is a positive slope, and the second programmable slope is substantially zero.
3. The apparatus of claim 1, wherein the first programmable slope is a first positive slope, and the second programmable slope is a second positive slope, wherein the first positive slope is different than the second positive slope.
4. The apparatus of claim 1, wherein the first programmable slope is a negative slope, and the second programmable slope is substantially zero.
5. The apparatus of claim 1, wherein the first programmable slope is a first negative slope, and the second programmable slope is a second negative slope, wherein the first negative slope is different than the second negative slope.
6. The apparatus of claim 1, wherein the first programmable slope is a positive slope, and the second programmable slope is a negative slope.
7. The apparatus of claim 1, wherein the first current is based on a combination of a first scaling factor applied to a bandgap current and a second scaling factor applied to a proportional to absolute temperature (PTAT) current.
8. The apparatus of claim 7, wherein the first programmable slope is based on a ratio of the second scaling factor over the first scaling factor.
9. The apparatus of claim 7, wherein the second current is based on a combination of a third scaling factor applied to the bandgap current and a fourth scaling factor applied to the PTAT current.
10. The apparatus of claim 9, wherein the second programmable slope is based on a ratio of the fourth scaling factor over the third scaling factor.
11. The apparatus of claim 1, the input current scaling circuit comprises: a first current mirror configured to receive a bandgap current; a second current mirror coupled to the first current mirror, wherein the second current mirror is configured to generate a fourth current based on a first scaling factor applied to the bandgap current; a third current mirror coupled to the first current mirror, wherein the third current mirror is configured to generate a fifth current based on a second scaling factor applied to the bandgap current; a fourth current mirror configured to receive a proportional to absolute temperature (PTAT) current; a fifth current mirror coupled to the fourth current mirror, wherein the fifth current mirror is configured to generate a sixth current based on a third scaling factor applied to the PTAT current; and a sixth current mirror coupled to the fourth current mirror, wherein the sixth current mirror is configured to generate a seventh current based on a fourth scaling factor applied to the PTAT current, wherein the first current is based on the fourth and sixth currents, and the second current is based on the fifth and seventh currents.
12. The apparatus of claim 1, further comprising a first negative-slope current generating circuit coupled to the input current scaling circuit, wherein the first negative-slope current generating circuit is configured to cause the first programmable slope of the first current to be negative.
13. The apparatus of claim 12, wherein: the input current scaling circuit comprises: a first current mirror configured to receive a bandgap current; and a second current mirror configured to receive a proportional to absolute temperature (PTAT) current; and the first negative-slope current generating circuit comprises: a third current mirror coupled to the first current mirror, wherein the third current mirror is configured to generate a fourth current based on a first scaling factor applied to the bandgap current; a fourth current mirror coupled to the second current mirror, wherein the fourth transistor is configured to generate a fifth current based on a second scaling factor applied to the PTAT current, wherein the third and fourth current mirrors are coupled together to generate a sixth current based on a difference between the fourth current and the fifth current, and wherein the first current is based on the fifth current.
14. The apparatus of claim 12, further comprising a second negative-slope current generating circuit coupled to the input current scaling circuit, wherein the second negative-slope current generating circuit is configured to cause the second programmable slope of the second current to be negative.
15. The apparatus of claim 1, wherein the current temperature blending circuit is configured to generate the third current based on the first current in response to the first current being greater than the second current in the first temperature range, and generate the third current based on the second current in response to the second current being greater than the first current in the second temperature range.
16. The apparatus of claim 1, wherein the current temperature blending circuit is configured to generate the third current based on the first current in response to the first current being less than the second current in the first temperature range, and generate the third current based on the second current in response to the second current being less than the first current in the second temperature range.
17. The apparatus of claim 1, wherein the current temperature blending circuit comprises: first and second transistors are configured to substantially generate the first and second currents in response to the first current being greater than the second current, respectively; third and fourth transistors configured to substantially generate the first and second currents in response to the first current being less than the second current, respectively; a first current mirror coupled to the first and third transistors, wherein the first current mirror is configured to generate the third current based on the first current in response to the first current being greater than the second current, and based on the second current in response to the second current being greater than the first current; and a second current mirror coupled to the second and fourth transistors, wherein the second current mirror is configured to generate a fourth current based on the first current in response to the first current being less than the second current, and based on the second current in response to the second current being less than the first current.
18. The apparatus of claim 1, wherein the current temperature blending circuit is configured to: generate the third current based on the first current in response to the first current being greater than the second current in the first temperature range, and generate the third current based on the second current in response to the second current being greater than the first current in the second temperature range; and generate a fourth current based on the second current in response to the second current being less than the first current in the first temperature range, and generate the fourth current based on the first current in response to the first current being less than the second current in the second temperature range.
19. The apparatus of claim 18, further comprising an output current scaling circuit configured to: generate a first output current based on a first scaling factor applied to the third current; and generate a second output current based on a second scaling factor applied to the fourth current.
20. The apparatus of claim 18, further comprising an output current scaling and routing circuit configured to: generate a first output current based on a first scaling factor applied to the third current; generate a second output current based on a second scaling factor applied to the fourth current; selectively route the first output current to a first or a second output node; and selectively route the second output current to the second or the first output node.
21. A method, comprising: generating a first current that varies with temperature in accordance with a first programmable slope; generating a second current that varies with temperature in accordance with a second programmable slope; and generating a third current based on the first current over a first temperature range and the second current over a second temperature range, wherein the first temperature range is different than the second temperature range.
22. The method of claim 21, wherein the first programmable slope is a first positive slope, and the second slope is a second positive slope or is substantially zero, wherein the first positive slope is different than the second positive slope.
23. The method of claim 21, wherein the first programmable slope is a first negative slope, and the second programmable slope is a second negative slope or is substantially zero, wherein the first negative slope is different than the second negative slope.
24. The method of claim 21, wherein the first slope is a negative slope, and the second slope is a positive slope.
25. The method of claim 21, wherein generating the third current comprises generating the third current based on the first current in response to the first current being greater than the second current in the first temperature range, and generating the third current based on the second current in response to the second current being greater than the first current in the second temperature range.
26. The method of claim 21, wherein generating the third current comprises generating the third current based on the first current in response to the first current being less than the second current in the first temperature range, and generating the third current based on the second current in response to the second current being less than the first current in the second temperature range.
27. An apparatus, comprising: means for generating a first current that varies with temperature in accordance with a first programmable slope; means for generating a second current that varies with temperature in accordance with a second programmable slope; and means for generating a third current based on the first current over a first temperature range and the second current over a second temperature range, wherein the first temperature range is different than the second temperature range.
28. The apparatus of claim 27, wherein the first programmable slope is a first negative slope, and the second programmable slope is a second negative slope or is substantially zero, wherein the first negative slope is different than the second negative slope.
29. The apparatus of claim 27, wherein the means for generating the third current comprises means for generating the third current based on the first current in response to the first current being greater than the second current in the first temperature range, and means for generating the third current based on the second current in response to the second current being greater than the first current in the second temperature range.
30. The apparatus of claim 27, wherein the means for generating the third current comprises means for generating the third current based on the first current in response to the first current being less than the second current in the first temperature range, and means for generating the third current based on the second current in response to the second current being less than the first current in the second temperature range.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
DETAILED DESCRIPTION
(12) The detailed description set forth below, in connection with the appended drawings, is intended as a description of various configurations and is not intended to represent the only configurations in which the concepts described herein may be practiced. The detailed description includes specific details for the purpose of providing a thorough understanding of the various concepts. However, it will be apparent to those skilled in the art that these concepts may be practiced without these specific details. In some instances, well-known structures and components are shown in block diagram form in order to avoid obscuring such concepts.
(13)
(14) The amplifier circuit 100 further includes a PA bias current circuit 110 configured to generate a bias current I.sub.CB or I.sub.B(T) for the PA 120. The bias current I.sub.CB is a substantially constant current with temperature over an operating temperature range of the PA 120. The bias current I.sub.B(T) varies with temperature over the operating temperature range of the PA 120.
(15) The constant bias current I.sub.CB for the PA 120 may not achieve target operating characteristics for the PA 120 over the operating temperature range. For example, with reference to the graph also shown in
(16) The temperature-dependent bias current I.sub.B(T) may be configured to reduce variations in the various operating characteristics of the PA 120 or other type of amplifier (e.g., LNA). For example, as shown in the graph, the temperature-dependent bias current I.sub.B(T) may be configured to significantly reduce the variation in the output power P.sub.O (and/or other operating characteristics) of the PA 120 over the operating temperature range. For example, the bias current I.sub.B(T) may be configured to increase with temperature to cause the output power P.sub.O of the PA 120 to increase so as to compensate for the reduction in the output power P.sub.O with temperature if an otherwise constant bias current is used.
(17) In summary, a temperature-dependent bias current generator is disclosed herein. The bias current generator receives two (or more) input currents with different temperature-dependent profiles over an operating temperature range of an amplifier, where the two temperature-dependent profiles intercept at a particular temperature within the operating temperature range. The bias current generator includes an analog processing circuit configured to generate at least one output current with a temperature-dependent profile based on a blending or combination of the temperature-dependent profiles of the input currents. In one case, the output current has a temperature-dependent profile based on a maximum of the temperature-dependent profiles of the input currents over a temperature range. In another case, the output current has a temperature-dependent profile based on a minimum of the temperature-dependent profiles of the input currents over a temperature range.
(18)
(19) The current temperature blending circuit 210 may be configured to generate at least one output current with a temperature-dependent profile being a combination or blending of the temperature-dependent profiles of the input currents I.sub.1(T) and I.sub.2(T). For example, the current temperature blending circuit 210 may generate an output current I.sub.MAX(T) with a temperature-dependent profile being a maximum of the temperature-dependent profiles of the input currents I.sub.1(T) and I.sub.2(T) over the temperature range T.sub.A to T.sub.C.
(20) For example, if the current I.sub.1(T) is greater than the current I.sub.2(T) over a temperature sub-range T.sub.A to T.sub.B, where T.sub.B is the temperature at which the input currents I.sub.1(T) and I.sub.2(T) are equal or intercept, the current temperature blending circuit 210 generates the I.sub.MAX(T) current based on the current I.sub.1(T) over the temperature sub-range T.sub.A to T.sub.B. In this example, the current I.sub.2(T) may be greater than the current I.sub.1(T) over the remaining temperature sub-range T.sub.B to T.sub.C. In such case, the current temperature blending circuit 210 generates the I.sub.MAX(T) current based on the current I.sub.2(T) over the temperature sub-range T.sub.B to T.sub.C.
(21) The converse operation of the current temperature blending circuit 210 may also be performed for the case where the current I.sub.2(T) is greater than the current I.sub.1(T) over the temperature sub-range T.sub.A to T.sub.B, and the current I.sub.1(T) is greater than the current I.sub.2(T) over the temperature sub-range T.sub.B to T.sub.C. In such case, the current temperature blending circuit 210 generates the I.sub.MAX(T) current based on the current I.sub.2(T) over the temperature sub-range T.sub.A to T.sub.B, and based on the current I.sub.1(T) over the temperature sub-range T.sub.B to T.sub.C.
(22) Alternatively, or in addition to, the current temperature blending circuit 210 may generate an output current I.sub.MIN(T) with a temperature-dependent profile being a minimum of the temperature-dependent profiles of the input currents I.sub.1(T) and I.sub.2(T) over the temperature range T.sub.A to T.sub.C. For example, if the current I.sub.1(T) is less than the current I.sub.2(T) over the temperature sub-range T.sub.A to T.sub.B, the current temperature blending circuit 210 generates the I.sub.MIN(T) current based on the current I.sub.1(T) over the temperature sub-range T.sub.A to T.sub.B. In this example, the current I.sub.2(T) may be less than the current I.sub.1(T) over the remaining temperature sub-range T.sub.B to T.sub.C. In such case, the current temperature blending circuit 210 generates the I.sub.MIN(T) current based on the current I.sub.2(T) over the temperature sub-range T.sub.B to T.sub.C.
(23) The converse operation of the current temperature blending circuit 210 may also be performed for the case where the current I.sub.2(T) is less than the current I.sub.1(T) over the temperature sub-range T.sub.A to T.sub.B, and the current I.sub.1(T) is less than the current I.sub.2(T) over temperature sub-range T.sub.B to T.sub.C. In such case, the current temperature blending circuit 210 generates the I.sub.MIN(T) current based on the current I.sub.2(T) over the temperature sub-range T.sub.A to T.sub.B, and based on the current I.sub.1(T) over the temperature sub-range T.sub.B to T.sub.C. Various examples of input currents and resulting output currents are described below.
(24)
(25)
(26)
(27)
(28)
(29)
(30)
(31)
(32)
(33)
(34)
(35)
(36)
(37) The input current scaling circuit 710 is configured to receive a bandgap current I.sub.bg and a PTAT current I.sub.ptat by way of switching devices 702 and 704, respectively. The switching devices 702 and 704 may be responsive to an enable signal (en). For example, the switching devices 702 and 704 may be closed in response to the enable signal (en) being asserted (e.g., en=1), or may be open in response to the enable signal (en) being deasserted (e.g., en=0). In this regard, the enable signal (en) effectively enables and disables the bias current generator 700.
(38) When the enable signal (en) is asserted (and the CTAT current generating circuit 720 is disabled, as discussed further herein), the input current scaling circuit 710 is configured to generate input currents I.sub.1(T) and I.sub.2(T) by combining and scaling the bandgap current I.sub.bg and the PTAT current I.sub.ptat. For example, as discussed in more detail later herein with respect to an example implementation, the input current scaling circuit 710 may be configured to generate the input currents I.sub.1(T) and I.sub.2(T) in accordance with the following relationships:
I.sub.1(T)=a.sub.0/I.sub.bg+a.sub.1*I.sub.ptat Eq. 1
I.sub.2(T)=a.sub.2*I.sub.bg+a.sub.3*I.sub.ptat Eq. 2
where a.sub.0, a.sub.1, a.sub.2, and a.sub.3 may be programmable scaling factors.
(39) For example, if the current I.sub.1(T) is configured to be substantially constant with temperature as in the examples illustrated in
(40) Considering the examples illustrated in
(41) The negative-slope (CTAT) current generating circuit 720 may be configured to cause the input current scaling circuit 710 to generate the currents I.sub.1(T) and I.sub.2(T) with temperature variations having negative slopes in response to CTAT enable signals en_ctat1 and en_ctat2 being asserted (e.g., en_ctat1=en_ctat2=1). If the CTAT enable signals en_ctat1 and en_ctat2 are deasserted, the CTAT current generating circuit 720 is disabled, and the input current scaling circuit 710 generates the currents I.sub.1(T) and I.sub.2(T) in accordance with Eqs. 1 and 2, respectively. As further indicated, the input current scaling circuit 710 may be configured to program or set the scaling factors a.sub.1 and a.sub.3 to zero (0) in response to the CTAT enable signals en_ctat1 and en_ctat2 being asserted. Accordingly, when the CTAT enable signals en_ctat1 and en_ctat2 are asserted, the currents I.sub.1(T) and I.sub.2(T) may be generated in accordance with the following relationship:
I.sub.1(T)=a.sub.0*I.sub.bg(a.sub.6*I.sub.bg−a.sub.7*I.sub.ptat) Eq. 3
I.sub.2(T)=a.sub.2*I.sub.bg+(a.sub.4*I.sub.bg−a.sub.5*I.sub.ptat) Eq. 4
where a.sub.4, a.sub.5, a.sub.6, and a.sub.7 may also be programmable scaling factors. As discussed further herein with respect to another implementation, it shall be understood that the ability to configure one of the currents, such as the current I.sub.1(T), to have a negative slope is optional.
(42) Considering the examples of
(43) Considering the examples of
(44) The current temperature blending circuit 730 is configured to combine or blend the input currents I.sub.1(T) and I.sub.2(T) to generate an I.sub.MAX(T) current and/or an I.sub.MIN(T) current, similarly as discussed with reference to current temperature blending circuit 210. That is, the current temperature blending circuit 730 is configured to generate the I.sub.MAX(T) current based on the maximum of the currents I.sub.1(T) and I.sub.2(T) over a temperature range. Similarly, the current temperature blending circuit 730 is configured to generate the I.sub.MIN(T) current based on the minimum of the currents I.sub.1(T) and I.sub.2(T) over the temperature range.
(45) The output current scaling circuit 740 is configured to apply scaling factors a.sub.8 and a.sub.9 to the I.sub.MAX(T) and I.sub.MIN(T) currents to generate output currents I.sub.OUT1(T) and I.sub.OUT2(T), respectively. Accordingly, the following relationships for the output currents I.sub.OUT1(T) and T.sub.OUT2(T) may apply:
I.sub.OUT1(T)=a.sub.8*I.sub.MAX(T) Eq. 5
I.sub.OUT2(T)=a.sub.9*I.sub.MIN(T) Eq. 6
As discussed further herein with reference to an example implementation, the output current scaling circuit 740 may be configured to selectively route the output currents I.sub.OUT1(T) and I.sub.OUT2(T) between two different output nodes.
(46)
(47)
(48)
(49)
(50)
(51)
(52)
(53)
(54)
(55) It shall be understood that another option pertaining to the CTAT current generating circuit 720 being enabled for the I.sub.1(T) current and disabled for the I.sub.2(T) current (e.g., en_ctat1=1 and en_ctat2=0) may be available. According to this option, the currents I.sub.1(T) and I.sub.2(T) are given by Eqs. 3 and 2, respectively.
(56)
(57) Similarly, it shall be understood that the other option of the CTAT current generating circuit 720 being enabled for the I.sub.1(T) current and disabled for the I.sub.2(T) current (e.g., en_ctat1=1 and en_ctat2=0) may be available. According to this option, the currents I.sub.1(T) and I.sub.2(T) are given by Eqs. 3 and 2, respectively.
(58)
(59) The input current scaling circuit 910 includes n-channel metal oxide semiconductor (NMOS) FETs M1-M6. These transistors M1-M6 (and others described herein) are configured as current mirrors, and may be implemented in other current-mirror configurations, including those that have source resistors and/or select transistors. The bandgap current source I.sub.bg is coupled in series with a first enable switching device and the current mirror M1 between an upper voltage rail Vdd and a lower voltage rail (e.g., ground). As discussed with reference to bias current generator 700, the first enable switching device is responsive to an enable signal (en) to effectively enable and disable the bias current generator 900 (e.g., en=1, first switching device closed; en=0, first switching device open). The current mirror M1 includes a gate coupled to gates of the current mirrors M2 and M3. The current mirrors M2 and M3 include sources coupled to the lower voltage rail (e.g., ground).
(60) The PTAT current source I.sub.ptat is coupled in series with a second enable switching device and the current mirror M4 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). Similarly, the second enable switching device is responsive to the enable signal (en) to effectively enable and disable the bias current generator 900 (e.g., en=1, second switching device closed; en=0, second switching device open). The current mirror M4 includes a gate coupled to gates of the current mirrors M5 and M6. The current mirrors M5 and M6 include sources coupled to the lower voltage rail (e.g., ground).
(61) The I.sub.2(T) CTAT current generating circuit 920 includes NMOS FETs M7-M8 and p-channel metal oxide semiconductor (PMOS) FETs M9-M10. These transistors M7-M10 are also configured as current mirrors. The current mirror M9 is coupled in series with the current mirror M8 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The current mirror M10 is coupled in series with a second CTAT enable switching device and the current mirror M7 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The second CTAT enable switching device is responsive to a second CTAT enable signal (en_ctat2) to selectively enable the current I.sub.2(T) to have a negative slope (e.g., en_ctat2=1, I.sub.2(T) has a negative slope; en_ctat2=0, I.sub.2(T) does not have a negative slope). The current mirrors M9-M10 include gates coupled together, and to a drain of the current mirror M9. The current mirror M7 includes a gate coupled to the gates of current mirrors M1, M2, and M3 of the input current scaling circuit 910. The current mirror M8 includes a gate coupled to the gates of current mirrors M4, M5, and M6 of the input current scaling circuit 910.
(62) The I.sub.1(T) CTAT current generating circuit 930, which may be optional, includes NMOS FETs M11-M12 and PMOS FETs M13-M14. These transistors M11-M14 are also configured as current mirrors. The current mirror M14 is coupled in series with the current mirror M12 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The current mirror M13 is coupled in series with a first CTAT enable switching device and the current mirror M1l between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The first CTAT enable switching device is responsive to a first CTAT enable signal (en_ctat1) to selectively enable the current I.sub.1(T) to have a negative slope (e.g., en_ctat1=1, I.sub.1(T) has a negative slope; en_ctat1=0, I.sub.1(T) does not have a negative slope). The current mirrors M13-M14 include gates coupled together, and to a drain of the current mirror M14. The current mirror M11 includes a gate coupled to the gates of current mirrors M1, M2, and M3 of the input current scaling circuit 910. The current mirror M12 includes a gate coupled to the gates of current mirrors M4, M5, and M6 of the input current scaling circuit 910.
(63) The current temperature blending circuit 940 includes PMOS FETs M15-M20. The transistors M19 and M20 are configured as current mirrors. The current mirror M19 is coupled between the upper voltage rail Vdd and sources of PMOS FETs M16 and M17. The current mirror M19 includes a gate coupled to its drain. The current mirror M20 is coupled between the upper voltage rail Vdd and sources of PMOS FETs M15 and M18. The current mirror M20 includes a gate coupled to its drain. The PMOS FET M15 includes a gate coupled to its drain, a gate of the PMOS FET M16, a drain of PMOS FET M17, drains of current mirrors M2 and M6 of the input current scaling circuit 910, and optionally to a drain of current mirror M11 of the I.sub.1(T) CTAT current generating circuit 930. The PMOS FET M18 includes a gate coupled to its drain, a gate of the PMOS FET M17, a drain of PMOS FET M16, drains of current mirrors M5 and M3 of the input current scaling circuit 910, and to a drain of current mirror M7 of the I.sub.2(T) CTAT current generating circuit 920.
(64) The output current scaling and routing circuit 950 includes PMOS FETs M21 and M22. These transistors M21-M22 are configured as current mirrors. The current mirror M21 is coupled between the upper voltage rail Vdd and respective first terminals of a first set of complementary switches sw.sub.1 and
(65) The effective size or channel width W to channel L ratio (W/L) of the current mirrors M2, M3, M5, M6, M7, M8, M11, M12, M21, and M22 may be configured to effectuate the scaling factors a.sub.0-a.sub.9 as previously discussed with reference to bias current generator 700, respectively. This is typically effectuated by each of these current mirrors being a set of select transistors coupled in series with a set of W/L weighted transistors, respectively. The set of W/L weighted transistors may be equally weighted, binary weighted, or weighted in other manners. The corresponding scaling factor depends on the selected W/L weighted transistors via the set of select transistors, and the W/L weights of the selected W/L transistors, respectively. It shall be understood that the first and second CTAT enable switching devices may be incorporated into the sets of select transistors associated with current mirrors M11 and M7, respectively.
(66) The operation of the bias current generator 900 is as follows: As discussed, the enable (en) signal being asserted causes the first and second switching devices to close; thereby coupling the bandgap current source I.sub.bg and the PTAT current source I.sub.ptat to the current mirrors M1 and M4, respectively. In the first part of the operational discussion, it is assumed that the I.sub.1(T) and I.sub.2(T) CTAT current generating circuits 930 and 920 are disabled by the first and second CTAT enable switching devices being open. Because of the current mirror configuration of the NMOS FETs M1-M3, the current through current mirror M2 is a.sub.0*I.sub.bg and the current through current mirror M3 is a.sub.2*I.sub.bg. Similarly, because of the current mirror configuration of the NMOS FETs M4-M6, the current through current mirror M5 is a.sub.3*I.sub.ptat and the current through current mirror M6 is a.sub.1*I.sub.ptat.
(67) As the drains of current mirrors M2 and M6 are coupled together, the current I.sub.1(T) flowing to those nodes is the summation of the current a.sub.0*I.sub.bg through current mirror M2 and the current a.sub.1*I.sub.ptat through current mirror M6 (e.g., I.sub.1(T)=a.sub.0*I.sub.bg+a.sub.1*I.sub.ptat (Eq. 1)). Similarly, as the drains of current mirrors M3 and M5 are coupled together, the current I.sub.2(T) flowing to those nodes is the summation of the current a.sub.2*I.sub.bg through current mirror M3 and the current a.sub.3*I.sub.ptat through current mirror M5 (e.g., I.sub.2(T)=a.sub.2*I.sub.bg+a.sub.3*I.sub.ptat (Eq. 2)).
(68) If the current I.sub.1(T) is greater than the current I.sub.2(T), the voltage at the gates of PMOS FETs M15 and M16 is less than the voltage at the gates of PMOS FETs M17 and M18. Thus, the PMOS FETs M15 and M16 are turned on more than the PMOS FETs M17 and M18. As the majority of the current I.sub.1(T) flows through PMOS FET M15 because it is turned on more than PMOS FET M17, the current I.sub.MAX(T) through current mirror M20 is based more on the current I.sub.1(T) than I.sub.2(T). Similarly, as the majority of the current I.sub.2(T) flows through PMOS FET M16 because it is turned on more than PMOS FET M18, the current I.sub.MIN(T) through current mirror M19 is based more on the current I.sub.2(T) than I.sub.1(T). Thus, the current temperature blending circuit 940 effectively outputs the larger current I.sub.1(T) as I.sub.MAX(T) and the smaller current I.sub.2(T) as I.sub.MIN(T).
(69) Conversely, if the current I.sub.2(T) is greater than the current I.sub.1(T), the voltage at the gates of PMOS FETs M17 and M18 is less than the voltage at the gates of PMOS FETs M15 and M16. Thus, the PMOS FETs M17 and M18 are turned on more than the PMOS FETs M15 and M16. As the majority of the current I.sub.2(T) flows through PMOS FET M18 because it is turned on more than PMOS FET M16, the current I.sub.MAX(T) through current mirror M20 is based more on the current I.sub.2(T) than I.sub.1(T). Similarly, as the majority of the current I.sub.1(T) flows through PMOS FET M17 because it is turned on more than PMOS FET M15, the current I.sub.MIN(T) through current mirror M19 is based more on the current I.sub.1(T) than I.sub.2(T). Thus, the current temperature blending circuit 940 effectively outputs the larger current I.sub.2(T) as I.sub.MAX(T) and the smaller current I.sub.1(T) as I.sub.MIN(T).
(70) Because of the current mirror configurations of PMOS FETs M20 and M21, a first output current I.sub.OUT1(T) through current mirror M21 is a.sub.8*I.sub.MAX(T). Similarly, because of the current mirror configurations of PMOS FETs M19 and M22, a second output current I.sub.OUT2(T) through current mirror M22 is a.sub.9*I.sub.MAX(T). The first and second output currents I.sub.OUT1(T) and I.sub.OUT2(T) may be selectively routed to output nodes OUT.sub.1 and OUT.sub.2. For example, if switching devices sw.sub.1,
(71) With regard to the I.sub.2(T) CTAT current generating circuit 920, it is enabled when the CTAT enable signal en_ctat2 is asserted (e.g., en_ctat2=1) to close the corresponding en_ctat2 switching device; thereby coupling the current mirror M10 to the current mirror M7. Further, when the I.sub.2(T) CTAT current generating circuit 920 is enabled, the scaling factor a.sub.3 is equal to zero (0) so that substantially no current flows through current mirror M5. The I.sub.2(T) CTAT current generating circuit 920 operates as a current subtractor to generate a CTAT component of the second current I.sub.2(T) being equal to a difference of the current a.sub.4*I.sub.bg through current mirror M7 and the current a.sub.5*I.sub.ptat through current mirror M8. Accordingly, the current I.sub.2(T) is the sum of the current through the current mirror M3 a.sub.2*I.sub.bg and the CTAT current a.sub.4*I.sub.bg− a.sub.5*I.sub.ptat (e.g., I.sub.2(T)=a.sub.2*I.sub.bg+(a.sub.4*I.sub.bg−a.sub.5*I.sub.ptat) (Eq. 4)). The remaining circuits 910, 940, and 950 operate the same as discussed above.
(72) Similarly, with regard to the optional I.sub.1(T) CTAT current generating circuit 930, it is enabled when the CTAT enable signal en_ctat1 is asserted (e.g., en_ctat1=1) to close the corresponding en_ctat1 switching device; thereby coupling the current mirror M13 to the current mirror M11. Further, when the I.sub.1(T) CTAT current generating circuit 930, the scaling factor a.sub.1 is equal to zero (0) so that substantially no current flows through current mirror M6. The I.sub.1(T) CTAT current generating circuit 930 operates as a current subtractor to generate a CTAT component of the first current I.sub.1(T) being equal to a difference of the current a.sub.6*I.sub.bg through current mirror M1l and the current a.sub.7*I.sub.ptat through current mirror M12. Accordingly, the current I.sub.1(T) is the sum of the current through the current mirror M2 a.sub.0*I.sub.bg and the CTAT current a.sub.6*I.sub.bg−a.sub.7*I.sub.ptat (e.g., I.sub.1(T)=a.sub.0*I.sub.bg+(a.sub.6*I.sub.bg−a.sub.7*I.sub.ptat) (Eq. 3)). The remaining circuits 910, 940, and 950 operate the same as discussed above.
(73) It shall be understood that both I.sub.1(T) and I.sub.2(T) CTAT current generating circuits 920 and 930 may be enabled at the same time. Further, for current density balancing purpose, the sum of the scaling factors a.sub.0 and a.sub.1 may be kept substantially constant. For example, if the application requires a relatively high scaling factor a.sub.0 or a.sub.1, then the reverse scaling factor a.sub.1 or a.sub.0 should be set such as a.sub.0+a.sub.1 is maintained at a substantially constant value.
(74)
(75) The bias current generator 1000 includes an input current scaling circuit 1010, an I.sub.2(T) CTAT current generating circuit 1020, an optional I.sub.1(T) current generating circuit 1030, a current temperature blending circuit 1040, and an output current scaling and routing circuit 1050. The bias current generator 1000 may also include a bandgap current source I.sub.bg and a PTAT current source I.sub.ptat.
(76) The input current scaling circuit 1010 includes PMOS FETs M1-M6. Similarly, the PMOS FETs M1-M6 are configured as current mirrors. The current mirror M1 is coupled in series with the bandgap current source I.sub.bg and a first enable switching device between an upper voltage rail Vdd and a lower voltage rail (e.g., ground). As previously, the first enable switching device is responsive to an enable signal (en) to effectively enable and disable the bias current generator 1000 (e.g., en=1, first switching device closed; en=0, first switching device open). The current mirror M1 includes a gate coupled to gates of the current mirrors M2 and M3. The current mirrors M2 and M3 include sources coupled to the upper voltage rail Vdd.
(77) The current mirror M4 is coupled in series with the PTAT current source I.sub.ptat and a second enable switching device between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). Similarly, the second enable switching device is responsive to the enable signal (en) to effectively enable and disable the bias current generator 1000 (e.g., en=1, switching device closed; en=0, switching device open). The current mirror M4 includes a gate coupled to gates of the current mirrors M5 and M6. The current mirrors M5 and M6 include sources coupled to the upper voltage rail Vdd.
(78) The I.sub.2(T) CTAT current generating circuit 1020 includes PMOS FETs M7-M8 and NMOS FETs M9-M10. These transistors M7-M10 are also configured as current mirrors. The current mirror M8 is coupled in series with the current mirror M9 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The current mirror M7 is coupled in series with a second CTAT enable switching device and the current mirror M10 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The second CTAT enable switching device is responsive to a second CTAT enable signal (en_ctat2) to selectively enable the current I.sub.2(T) to have a negative slope (e.g., en_ctat2=1, I.sub.2(T) has a negative slope; en_ctat2=0, I.sub.2(T) does not have a negative slope). The current mirrors M9-M10 include gates coupled together, and to a drain of the current mirror M9. The current mirror M7 has a gate coupled to the gates of current mirrors M1, M2, and M3 of the input current scaling circuit 1010. The current mirror M8 includes a gate coupled to the gates of current mirrors M4, M5, and M6 of the input current scaling circuit 1010.
(79) The I.sub.1(T) CTAT current generating circuit 1030, which may be optional, includes PMOS FETs M11-M12 and NMOS FETs M13-M14. These transistors M7-M10 are also configured as current mirrors. The current mirror M12 is coupled in series with the current mirror M13 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The current mirror M11 is coupled in series with a first CTAT enable switching device and the current mirror M14 between the upper voltage rail Vdd and the lower voltage rail (e.g., ground). The first CTAT enable switching device is responsive to a first CTAT enable signal (en_ctat1) to selectively enable the current I.sub.1(T) to have a negative slope (e.g., en_ctat1=1, I.sub.1(T) has a negative slope; en_ctat1=0, I.sub.1(T) does not have a negative slope). The current mirrors M13-M14 include gates coupled together, and to a drain of the current mirror M13. The current mirror M11 includes a gate coupled to the gates of current mirrors M1, M2, and M3 of the input current scaling circuit 1010. The current mirror M12 includes a gate coupled to the gates of current mirrors M4, M5, and M6 of the input current scaling circuit 1010.
(80) The current temperature blending circuit 1040 includes NMOS FETs M15-M20. The transistors M19-M20 are configured as current mirrors. The current mirror M19 is coupled between sources of NMOS FETs M16 and M17 and the lower voltage rail (e.g., ground). The current mirror M19 includes a gate coupled to the its drain. The current mirror M20 is coupled between sources of NMOS FETs M15 and M18 and the lower voltage rail Vdd (e.g., ground). The current mirror M20 includes a gate coupled to its drain. The NMOS FET M15 includes a gate coupled to its drain, a gate of the NMOS FET M16, a drain of NMOS FET M17, drains of current mirrors M2 and M6 of the input current scaling circuit 1010, and optionally to a drain of current mirror M11 of the I.sub.1(T) CTAT current generating circuit 1030. The NMOS FET M18 includes a gate coupled to its drain, a gate of the NMOS FET M17, a drain of NMOS FET M16, drains of current mirrors M5 and M3 of the input current scaling circuit 1010, and to a drain of current mirror M7 of the I.sub.2(T) CTAT current generating circuit 1020.
(81) The output current scaling and routing circuit 1050 includes a first set of complementary switches sw.sub.1 and
(82)
(83) The method 1100 further includes generating a second current that varies with temperature in accordance with a second programmable slope (block 1120). Examples of means for generating a second current that varies with temperature in accordance with a second programmable slope include any of the input current scaling circuits described herein.
(84) The method 1100 further includes generating a third current based on the first current over a first temperature range and the second current over a second temperature range, wherein the first temperature range is different than the second temperature range (block 1130). Examples of means for generating a third current based on the first current over a first temperature range and the second current over a second temperature range, wherein the first temperature range is different than the second temperature range include any of the current temperature blending circuits described herein.
(85) The previous description of the disclosure is provided to enable any person skilled in the art to make or use the disclosure. Various modifications to the disclosure will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other variations without departing from the spirit or scope of the disclosure. Thus, the disclosure is not intended to be limited to the examples described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.