SYSTEM AND METHOD FOR PASSIVELY MONITORING A SAMPLE
20210172883 · 2021-06-10
Inventors
Cpc classification
G01H9/00
PHYSICS
G01B9/02094
PHYSICS
International classification
Abstract
A system for passively monitoring a sample is disclosed. The system comprises an optical arrangement, a filtering unit and a detector unit. The optical arrangement is configured for collecting light arriving from a sample, directing the collected light to the filtering unit for filtering based on at least one of spatial and spectral composition and directing the collected light onto the detector unit. The optical arrangement and the detector unit are arranged to provide imaging of collected light from the sample on the detector unit with selected focusing/defocusing level to generate image data pieces comprising speckle patterns formed in the collected light.
Claims
1. A system comprising: optical arrangement, filtering unit and a detector unit; the optical arrangement is configure for collecting light arriving from a sample, directing the collected light to the filtering unit for filtering based on at least one of spatial and spectral composition and directing the collected light onto the detector unit, the optical arrangement and the detector unit are arranged to provide imaging of collected light from the sample on the detector unit with selected focusing/defocusing level.
2. The system of claim 1, configured for generating detector output data comprising of one or more image data pieces, said image data pieces comprising speckle patterns formed in light collected from the sample.
3. The system of claim 1, wherein said filtering unit comprises at least one of spatial filtering unit and spectral filtering unit.
4. The system of claim 1, wherein said filtering unit comprises a coherence shaping unit configured for enhancing at least one of spatial and temporal coherence properties of the collected light, thereby increasing contrast of speckle pattern formed in the collected light.
5. The system of claim 1, wherein said filtering unit comprises spatial filtering unit and spectral filtering unit; the spatial filtering unit is configured for enhancing coherence of light components collected from a common spatial position on the sample, said spectral filtering unit is configured for filtering light components for directing light components of a selected wavelength range onto a one or more defined regions on the detector unit.
6. The system of claim 1, wherein said spectral filtering unit comprises one or more dichroic filters configured for transmitting or reflecting a selected wavelength range.
7. The system of claim 1, wherein said optical arrangement is positioned to provide defocused imaging of the object, thereby generating defocused image of collected light on the detector unit.
8. The system of claim 7, wherein said defocused image form one or more speckle patterns of the detector unit, said detector unit being configured for collecting image data pieces indicative of said one or more speckle patterns at a selected sampling rate to provide image data sequence comprising at least one sequence of speckle patterns.
9. The system of claim 1, further comprising a control unit connected to at least said detector array and configured for receiving detector output data comprising one or more sequences of image data pieces and for processing said one or more sequences and determining data indicative of one or more parameters of the sample.
10. The system of claim 9, wherein said control unit comprises at least one processor unit, said control unit is adapted for receiving image data pieces from the detector array and for operating the processor unit for processing said image data pieces for determining variations in speckle patterns in accordance with sampling rate of the detector array.
11. The system of claim 10, wherein said processing comprises determining variation in spatial correlation between speckle pattern in different image data pieces, and determining a time-correlation function, said time-correlation function is indicative of variations in at least one of location and orientation of surface of the sample.
12. The system of claim 1, wherein said spatial filtering is provided by a spatial filtering unit configures as an interferometric unit configured for generating output light being a result of interference of at least two copies of collected light arriving from the object.
13. The system of claim 12, wherein said interferometric unit comprises a beam splitting element configured to receive collected light and split the collected light to form said at least two copies, said interferometric unit further comprises at least first and second arms allowing light components of said at least two copies to propagate therethrough along selected optical paths, and to combine light components from said first and second arms to provide output light.
14. The system of claim 1, wherein said collected light arriving from the sample comprises thermal radiation emitted for the sample or ambient light reflected from the sample.
15. The system of claim 1, wherein spatial filtering unit providing said spatial filtering comprises a selected aperture or pinhole and utilizing one or more scattering medium associated with the sample and located downstream of the aperture with respect to direction of propagation of collected radiation.
16. The system of claim 15, wherein said spatial filtering unit is formed by an aperture unit mounted on an endoscope, said one or more scattering medium being associated with additional tissue located exterior from the aperture unit.
17. A method for monitoring an object, the method comprising collecting electromagnetic radiation originating from the object by thermal radiation or reflection of ambient light, passing the collected radiation through at least one of spectral and spatial filter for enhancing coherence of the collected radiation, and collecting image data pieces at a selected sampling rate, the image data pieces comprise speckle patterns formed in the collected radiation.
18. The method of claim 17, further comprising processing the collected image data pieces for determining variations in the speckle pattern along time, and determining one or more parameters of the object.
19. The method of claim 18, wherein said processing comprises determining correlations between image data piece to determine spatial variations of the speckle patterns between time of acquisition of said image data pieces and determining at least one time-correlation function indicative of one or more parameters of said object.
20. The method of claim 17, wherein said passing the collected light through at least one of spectral and spatial filter comprises passing the collected light through at least one spectral filter having bandpass width not exceeding 0.5 nm, and passing the collected light through a spatial filter for enhancing spatial coherence of the collected light.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0032] In order to better understand the subject matter that is disclosed herein and to exemplify how it may be carried out in practice, embodiments will now be described, by way of non-limiting example only, with reference to the accompanying drawings, in which:
[0033]
[0034]
[0035]
[0036]
[0037]
[0038]
[0039]
DETAILED DESCRIPTION OF EMBODIMENTS
[0040] Reference is made to
[0041] The filtering unit 120 includes at least one of spatial filter 122 and spectral filter 124 or corresponding spatial and/or spectral filtering units, configured for filtering collected light for improving one or more conditions of coherence of the collected light. Preferably, according to some embodiments, the filtering unit 120 includes both spatial filtering unit 122 and spectral filtering unit 124. The spectral filtering unit 124 may typically be a spectral filter, a chromatic filter or any other filter configured for transmitting light with narrow bandwidth around a selected wavelength range. As described in more detail below, the spectral filter may transmit light in a selected visible wavelength, selected wavelength in infra-red range or any other wavelength selected in accordance with parameters of the object 50 to be monitoring and sensitivity of the detector array 130. The spatial filtering unit 122 is configured for improving spatial coherence of collected light. For example, the spatial filtering unit 122 may be formed of a pinhole transmitting light arriving from a selected, relatively small, location of the object 50. It should however be noted that, a pinhole also operates as a low pass filter and may limit collection of spatial information of the object 50. To overcome such limitation, in some configuration the spatial filtering unit 122 may include a self-interferometric optical arrangement configured for interfering collected light with itself to enhance spatial coherence. In some configurations, the spatial filtering unit 122 may be formed by a phase mask having phase affecting patterns selected to provide desired coherence function of light passing through the mask as described in more detail below. Specifically, the spatial filtering unit 122 is configured for enhancing spatial coherence of collected light while maintaining certain spatial information in the collected light, to thereby enable monitoring of parameter of the object 50.
[0042] The optical lens arrangement 110, when used, may generally be located upstream of the filtering unit 120, at an intermediate location between elements of the filtering unit 120, or between the filtering unit 120 and the detector array 130 in accordance with specific configuration of the system as described in more detail further below. The optical lens arrangement 110 is typically configured to provide imaging of a selected inspection region on the object 50 to be collected by the detector array 130. In some configurations, the optical lens arrangement 110 is configured and positioned to provide imaging of the selected region of the object 50 with selected focusing or defocusing level. More specifically, the optical lens arrangement 110 may be configured with field of view collecting light arriving from the selected inspection region of the object 50, while imaging an intermediate plane located between the object 50 and the optical lens arrangement onto the detector array 130.
[0043] The control unit 140 is connected to at least the detector array 130 and configured for operating the detector array for collecting at least one sequence image data pieces with selected sampling rate and selected exposure time for each image frame. The image data pieces may each be assigned with time stamp indicative of time of collection. Additionally or alternatively, the image data pieces may be collected at selected time difference between them. The control unit 140 is further configured for receiving collected image data pieces and for processing the image data pieces for determining data on one or more parameters of the object 50. To this end the control unit 140 generally includes a processing unit, e.g. including at least one processor, which is not specifically shown in
[0044] Generally, the control unit 140 may operate for storing received image data pieces in a respective memory unit (e.g. random-access memory RAM unit) enabling processing of image data pieces taken with different time stamps. The processing unit utilizes received image data pieces and data pieces stored in the memory unit for determining one or more correlation measures between speckle pattern in the image data piece. For example, the processing unit may determine correlation measure between pairs of consecutively collected image data pieces (e.g. first and second images, second and third images, etc.). Additionally or alternatively, the processing unit may determine correlations between speckle patterns in collected images with respect to a selected image (e.g. second and first images, third and first images, etc.) Generally, speckles are regions of high and low radiation intensity formed by self-interference of light/radiation components. This self-interference typically creates regions of destructive and constructive interference, resulting in regions of high and low intensity that is visible in coherent (or relatively coherent radiation). The self-interference patterns generally occur also in non-coherent radiation but are almost unseen sue to short coherence time and integration of any detection technique that averages the pattern. As indicated above, the present invention utilizes at least one of spatial and spectral filtering (and preferably both spatial and spectral filtering) of collected light, to improve coherence of the collected light enabling to identify speckle patterns on image data pieces.
[0045] In some exemplary tests, the inventors of the present invention use a pinhole located upstream of a diffuser element as spatial filter, enabling to transmit light arriving from a small region of the inspected object.
[0046] Reference is made to
[0047] It should be noted that the variations in speckle patterns exemplified in
[0048] Further, as indicated above, the use of pinhole may affect the level of data that can be collected using the present technique. This is since pinhole provides spatial filtering in the form of low pass filter with respect to spatial frequencies, thereby causing loss of information. Generally, the use of pinhole 122a as spatial filter may be advantageous when combined with diffuser layer located between the pinhole and detector 130. For example, a pinhole mask may be used, surgically inserted (e.g. using an endoscope or via laparotomy) into a body and positioned in front of one or more organs to be inspected. The organ, generally emitting infra red illumination by thermal emission, can thus be monitored by detecting variation in speckle patterns of thermal radiation as appearing on the skin, where the skin itself, and/or blood or other tissue located downstream of the pinhole with respect to general direction of propagation of collected radiation act as diffuser 122b.
[0049] Alternatively, and preferably, the present invention may utilize spatial filter 122 configured as phase mask or selected self-interferometric unit for enhancing spatial coherence of the collected light. Reference is made to
Where Λ(x) is triangle function
rect(x) is rectangle function rect(x)=1 for |x|<Δx/2, and zero otherwise. The phase mask may be formed of a central flat phase region, surrounded by rings of varying phase pattern, e.g., between first and second phase variations such as 0 and pi, 0 and pi/2 etc. Similarly,
Where sinc(x)=sin(x)/x. This mask may also be formed of central flat phase region surrounded by rings of variation phases, typically varying between first and second phase affecting levels.
[0050] The phase pattern of the phase mask may for examples be determined in accordance with Z. Zalevsky et al “Energetic efficient synthesis of mutual intensity distribution,” J. Opt. A: Pure Appl. Opt. 2, 83-87 (2000). describing a formulation of phase mask pattern determined for generating desired mutual coherence functions based on given coherence condition of input light and incorporated herein by reference. It should be noted that the phase mask is generally designed with respect to wavelength selected by spectral filter 124.
[0051] Additional configurations of the spatial filter 122 may utilize coherence coding by interferometric unit configured for interfering at least two copies of the collected light with selected axial or temporal coding, providing enhanced spatial coherence in the output light. Reference is made to
[0052] As shown in
[0053] In the example of
[0054] Generally, in some configurations, at least one of the encoding reflecting surface (e.g. mirror 18) and decoding reflecting surface (e.g. mirror 28), when used, may be movable along optical axis thereof for determined length of the respective interferometer arm. Selection of axial location of mirror 28 with respect to mirror 18 enables determining axial depth of inspection region used for monitoring, while requiring no active illumination of any contact with the object 50.
[0055] Thus, spatial filter 122 according to the example of
[0056] An additional configuration of the spatial filter 122 is illustrated in
[0057] It should be noted that additional configurations of the interfering optical arrangement 122 may be used. For example, interfering configuration as described in “Depth sensing using coherence mapping,” Opt. Commun. 283, 3122-3128 (2010) indicated above may be used. Such configuration may utilize collection of light reflected from the object 50 combined with reference light field. Further, additional various configurations providing enhanced spatial coherence of light may act as spatial filter.
[0058] Thus, the present invention provides a technique and corresponding system enabling monitoring parameters of an object, e.g. living organ, individual biomedical parameters etc., using thermal radiation and/or reflection of ambient illumination collected from the object. As indicated, the technique includes collecting radiation arriving from a selected region of the object, while applying at least one of spatial and spectral filtering to the collected radiation for enhancing coherence of the collected radiation. This enables detection of speckle patterns in the collected light. The technique further includes generating at least one sequence of image data pieces, each including at least one speckle pattern and processing the speckle patterns for determining a variation function indicating changes in the speckle patterns over time. It should be noted that the present technique utilizes passive components for collection of radiation from the object and utilizes generally incoherent (e.g. thermal) radiation for speckle-based sensing by tracking the dynamics of the speckles. The technique is suitable for use with any selected wavelength, in accordance with selection of proper optics and detector array.