Radiometric measuring apparatus

Abstract

A radiometric measuring apparatus detects a measured variable in the form of a fill level, a point level, a density and/or a mass flow, and includes a scintillator embodied to generate light pulses upon excitation by ionizing radiation, an optoelectronic sensor embodied to convert the light pulses into a sensor signal, a first signal processing unit embodied to process the sensor signal into a first measured variable signal, an adjustable second signal processing unit embodied in a measurement setting to process the sensor signal into a second measured variable signal, wherein the second measured variable signal corresponds to the first measured variable signal in the case of a correctly processing first signal processing unit and a correctly processing second signal processing unit, and embodied in at least one operation setting to process the sensor signal into at least one operating variable signal, wherein the at least one operating variable signal does not correspond to the measured variable signals, a setting unit embodied to set the second signal processing unit into the measurement setting in measured variable time intervals and into the at least one operation setting in operating variable time intervals that alternate with the measured variable time intervals, and an assessment unit embodied to compare the first measured variable signal and the second measured variable signal with one another and to assess the first signal processing unit and/or the second signal processing unit to be processing correctly or incorrectly, depending on a result of the comparison.

Claims

1. A radiometric measuring apparatus for detecting a measured variable in the form of a fill level, a point level, a density and/or a mass flow, the radiometric measuring apparatus comprising: a scintillator device, wherein the scintillator device is embodied to generate light pulses upon excitation by ionizing radiation; an optoelectronic sensor device, wherein the optoelectronic sensor device is embodied to convert the light pulses into a sensor signal; a first signal processing unit, wherein the first signal processing unit is embodied to process the sensor signal into a first measured variable signal; an adjustable second signal processing unit, wherein the second signal processing unit is embodied in a measurement setting to process the sensor signal into a second measured variable signal, wherein the second measured variable signal corresponds to the first measured variable signal in the case of a correctly processing first signal processing unit and a correctly processing second signal processing unit, and embodied in at least one operation setting to process the sensor signal into at least one operating variable signal, wherein the at least one operating variable signal does not correspond to the measured variable signals; a setting unit, wherein the setting unit is embodied to set the second signal processing unit into the measurement setting in measured variable time intervals and into the at least one operation setting in operating variable time intervals that alternate with the measured variable time intervals; and an assessment unit, wherein the assessment unit is embodied to compare the first measured variable signal and the second measured variable signal with one another and to assess the first signal processing unit and/or the second signal processing unit to be processing correctly or incorrectly, depending on a result of the comparison.

2. The radiometric measuring apparatus according to claim 1, wherein the setting unit is embodied to repeatedly set the second signal processing unit into the measurement setting and into the at least one operation setting.

3. The radiometric measuring apparatus according to claim 1, wherein the first signal processing unit is embodied to process the sensor signal from a time window into the first measured variable signal, the second signal processing unit is embodied to process the same sensor signal from the same time window into the second measured variable signal when in the measurement setting, the setting unit is embodied to intermittently set the second signal processing unit into the measurement setting in such a way that the second signal processing unit processes the same sensor signal from the same time window into the second measured variable signal, and the assessment unit is embodied to compare the first measured variable signal and the second measured variable signal, which were both processed from the same sensor signal from the same time window, with one another.

4. The radiometric measuring apparatus according to claim 1, wherein the first signal processing unit is embodied to process the sensor signal into the first measured variable signal only.

5. The radiometric measuring apparatus according to claim 1, wherein the first signal processing unit and/or the second signal processing unit each have a comparator and/or a monostable trigger circuit.

6. The radiometric measuring apparatus according to claim 5, wherein a threshold of the comparator of the second signal processing unit is adjustable to a measurement threshold for the measurement setting and to at least one operation threshold that differs from the measurement threshold for the at least one operation setting.

7. The radiometric measuring apparatus according to claim 1, wherein the first measured variable signal and the second measured variable signal each contain a measurement information item, and/or the at least one operating variable signal contains a closed-loop control information item, a noise edge position information item, a high temperature measurement information item and/or a cosmic ray information item.

8. The radiometric measuring apparatus according to claim 7, wherein the assessment unit is embodied to monitor the noise edge position information item in respect of whether a noise edge position threshold is reached and/or exceeded, and should the noise edge position threshold be reached and/or exceeded, the setting unit is embodied to lengthen a ratio of a time duration of the operating variable time intervals for processing the operating variable signal containing the high temperature measurement information item to a time duration of the measured variable time intervals in relation to the undershot case.

9. The radiometric measuring apparatus according to claim 1, wherein one or more of: the measured variable time intervals have a different time duration than the operating variable time intervals, the measured variable time intervals have a time duration from 10 ms to 300 s, and the operating variable time intervals have a time duration from 50 ms to 900 s.

10. The radiometric measuring apparatus according to claim 1, wherein the optoelectronic sensor device comprises at least one photodiode.

11. The radiometric measuring apparatus according to claim 1, further comprising: an interface, wherein the interface is embodied to couple the radiometric measuring apparatus to a receiver for data transfer purposes, and wherein the radiometric measuring apparatus is embodied to be supplied with electrical power via its interface only.

12. The radiometric measuring apparatus according to claim 1, further comprising: a malfunction output and/or transfer unit, wherein the malfunction output and/or transfer unit is embodied to output and/or transfer a malfunction signal if the first signal processing unit and/or the second signal processing unit are assessed to be processing incorrectly.

13. The radiometric measuring apparatus according to claim 1, wherein the first measured variable signal and the second measured variable signal contain a measured variable value of the measured variable, and/or the radiometric measuring apparatus is embodied to determine a measured variable value of the measured variable on the basis of the first measured variable signal and/or the second measured variable signal.

14. The radiometric measuring apparatus according to claim 13, further comprising: at least one counter and/or at least one analog-to-digital converter for determining the measured variable value on the basis of the first measured variable signal and/or the second measured variable signal.

15. The radiometric measuring apparatus according to claim 1, further comprising: a common housing, wherein the scintillator device, the optoelectronic sensor device, the first signal processing unit, the second signal processing unit, the setting unit and the assessment unit are disposed in the common housing.

16. The radiometric measuring apparatus according to claim 10, wherein the optoelectronic sensor device comprises at least one avalanche photodiode.

17. The radiometric measuring apparatus according to claim 10, wherein the optoelectronic sensor device comprises at least one array of photodiodes.

18. The radiometric measuring apparatus according to claim 10, wherein the optoelectronic sensor device comprises at least one silicon photomultiplier.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 shows a radiometric measuring apparatus according to an embodiment of the invention.

(2) FIG. 2 shows a first signal processing unit of the radiometric measuring apparatus of FIG. 1.

(3) FIG. 3 shows an adjustable second signal processing unit of the radiometric measuring apparatus of FIG. 1.

(4) FIG. 4 shows a spectrum of a frequency of measurement pulses against an intensity of the measurement pulses.

(5) FIG. 5 shows a temporal sequence of time intervals, more particularly in the case where a noise edge position threshold is undershot by a noise edge position information item.

(6) FIG. 6 shows a further temporal sequence of time intervals, more particularly in the case where the noise edge position threshold is reached and/or exceeded by the noise edge position information item.

DETAILED DESCRIPTION OF THE DRAWINGS

(7) FIG. 1 shows a radiometric measuring apparatus 1 for detecting a measured variable MG in the form of a fill level, a point level, a density and/or a mass flow. The radiometric measuring apparatus 1 comprises a scintillator device 2, an optoelectronic sensor device 3, a first signal processing unit 4a, an adjustable second signal processing unit 4b, a setting unit 5 and an assessment unit 6. The scintillator device 2 is embodied to generate light pulses LI upon excitation by ionizing radiation IS. The optoelectronic sensor device 3 is embodied to convert the light pulses LI into a sensor signal SES, more particularly an electrical sensor signal. The first signal processing unit 4a is embodied to process the sensor signal SES into a first measured variable signal MGSa, more particularly a first electrical measured variable signal. The second signal processing unit 4b is embodied in a measurement setting ME to process the sensor signal SES into a second measured variable signal MGSb, more particularly a second electrical measured variable signal. The second measured variable signal MGSb corresponds to, more particularly equals, the first measured variable signal MGSa in the case of a correctly processing first signal processing unit 4a and a correctly processing second signal processing unit 4b. Moreover, the second signal processing unit 4b is embodied in at least one operation setting BE1, BE2, BE3, BE4 to process the sensor signal SES into at least one operating variable signal BGS1, BGS2, BGS3, BGS4. The at least one operating variable signal BGS1, BGS2, BGS3, BGS4 does not correspond to the measured variable signals MGSa, MGSb. The setting unit 5 is embodied to set the second signal processing unit 4b into the measurement setting ME in measured variable time intervals MZI and into the at least one operation setting BE1, BE2, BE3, BE4 in operating variable time intervals BZI1, BZI2, BZI3, BZI4 that alternate with the measured variable time intervals MZI, as shown in FIGS. 5 and 6. The assessment unit 6 is embodied to compare the first measured variable signal MGSa and the second measured variable signal MGSb with one another and to assess the first signal processing unit 4a and/or the second signal processing unit 4b to be processing correctly or incorrectly, depending on a result of the comparison.

(8) In the shown exemplary embodiment, the radiometric measuring apparatus 1 comprises a microcontroller C. The microcontroller C comprises the setting unit 5 and the assessment unit 6.

(9) Moreover, the optoelectronic sensor device 3 is optically coupled to the scintillator device 2, as indicated by a dashed line in FIG. 1. Moreover, the first signal processing unit 4a is electrically coupled to the optoelectronic sensor device 3, as indicated by a solid line in FIG. 1. Further, the second signal processing unit 4b is electrically coupled to the optoelectronic sensor device 3, as indicated by a solid line in FIG. 1. Moreover, the setting unit 5 is electrically coupled to the second signal processing unit 4b, as indicated by a solid line in FIG. 1. Moreover, the assessment unit 6 is electrically coupled to the first signal processing unit 4a and the second signal processing unit 4b, as indicated by a solid line in FIG. 1.

(10) In detail, the setting unit 5 is embodied to repeatedly set, more particularly periodically set, the second signal processing unit 4b into the measurement setting ME and into the at least one operation setting BE1, BE2, BE3, BE4.

(11) Moreover, the first signal processing unit 4a is embodied to process the sensor signal SES from a time window ZF′, ZF″ into the first measured variable signal MGSa, as shown in FIG. 5 for a time interval I and a time interval VIII and as shown in FIG. 6 for a time interval I and a time interval IX. The second signal processing unit 4b is embodied to process the same sensor signal SES from the same time window ZF′, ZF″ into the second measured variable signal MGSb in the measurement setting ME. The setting unit 5 is embodied to set the second signal processing unit 4b intermittently into the measurement setting ME in such a way that the second signal processing unit 4b processes the same sensor signal SES from the same time window ZF′, ZF″ into the second measured variable signal MGSb. The assessment unit 6 is embodied to compare the first measured variable signal MGSa and the second measured variable signal MGSb with one another, said measured variable signals having been processed from the same sensor signal SES from the same time window ZF′, ZF″.

(12) In FIG. 1, the assessment unit 6 compares the first measured variable signal MGSa and the second measured variable signal MGSb, which were processed from the same sensor signal SES from the same time window ZF′, ZF″, with one another and assesses the first signal processing unit 4a and/or the second signal processing unit 4b to be processing correctly or incorrectly, depending on a result of the comparison.

(13) In detail, the first signal processing unit 4a is embodied to process the sensor signal SES into the first measured variable signal MGSa only, as shown in FIGS. 5 and 6.

(14) Further, the first signal processing unit 4a and the second signal processing unit 4b each have a comparator 7a, 7b and a monostable trigger circuit 8a, 8b, as shown in FIGS. 2 and 3.

(15) In particular, the first measured variable signal MGSa and the second measured variable signal MGSb and the at least one operating variable signal BGS1, BGS2, BGS3, BGS4 have measurement pulses, more particularly each have measurement pulses.

(16) In detail, a threshold SW of the comparator 7b of the second signal processing unit 4b is adjustable to a measurement threshold MSW for the measurement setting ME and to at least one operation threshold BSW1, BSW2, BSW3, BSW4 that differs from the measurement threshold MSW for the at least one operation setting BE1, BE2, BE3, BE4, as shown in FIG. 3.

(17) Additionally, a threshold SW of the comparator 7a of the first signal processing unit 4a is fixed and in particular corresponds to, more particularly equals, the measurement threshold MSW, as shown in FIG. 2.

(18) Moreover, the first measured variable signal MGSa and the second measured variable signal MGSb each include a measurement information item MI, as shown in FIGS. 5 and 6.

(19) Additionally, the at least one operating variable signal BGS1, BGS2, BGS3, BGS4 in the shown exemplary embodiment includes a closed-loop control information item RI, a noise edge position information item RKPI, a high temperature measurement information item HTMI and a cosmic ray information item HSI.

(20) In detail, a high temperature operation threshold BSW3 for the high temperature measurement information item HTMI is elevated in relation to the measurement threshold MSW for the measurement information item MI, as shown in FIG. 4 in the spectrum of a frequency of measurement pulses against an intensity of the measurement pulses. Additionally, a closed-loop control operation threshold BSW1 for the closed-loop control information item RI is elevated, more particularly elevated again, in relation to the measurement threshold MSW for the measurement information item MI. Further additionally, a cosmic ray operation threshold BSW4 for the cosmic ray information item HSI is elevated, more particularly elevated again, in relation to the measurement threshold MSW for the measurement information item MI. Further additionally, a noise edge position operation threshold BSW2 for the noise edge position information item RKPI is lowered in relation to the measurement threshold MSW for the measurement information item MI.

(21) In alternative exemplary embodiments, the at least one operating variable signal may include the closed-loop control information item, the noise edge position information item, the high temperature measurement information item and/or the cosmic ray information item.

(22) Expressed differently: the second signal processing unit 4b in the shown exemplary embodiment is embodied to process the sensor signal SES into four operating variable signals BGS1, BGS2, BGS3, BGS4 in four operation settings BE1, BE2, BE3, BE4. The setting unit 5 is embodied to set the second signal processing unit 4b into the four operation settings BE1, BE2, BE3, BE4 in operating variable time intervals BZI1, BZI2, BZI3, BZI4. In detail, the threshold SW of the comparator 7b of the second signal processing unit 4b is adjustable to the four operation thresholds BSW1, BSW2, BSW3, BSW4 for the four operation settings BE1, BE2, BE3, BE4.

(23) In alternative exemplary embodiments, the second signal processing unit can be embodied to process the sensor signal into only a single operating variable signal or into two, three or at least five operating variable signals in only a single operation setting or in two, three or at least five operation settings. The setting unit can be embodied to set the second signal processing unit into the one operation setting or into the two, three or at least five operation settings in operating variable time intervals. In detail, the threshold of the comparator of the second signal processing unit can be adjustable to only a single operation threshold or to two, three or at least five operation thresholds for the one operation setting or for the two, three or at least five operation settings.

(24) In a time interval I shown in FIG. 5, in particular in a measured variable time interval MZI, the setting unit 5 sets the second signal processing unit 4b into the measurement setting ME, more particularly adjusts the threshold SW of the comparator 7b of the second signal processing unit 4b to the measurement threshold MSW. Consequently, in the time interval I, the second signal processing unit 4b processes the sensor signal SES into the second measured variable signal MGSb including the measurement information item MI.

(25) In a subsequent time interval II, in particular in a closed-loop control operating variable time interval BZI1, the setting unit 5 sets the second signal processing unit 4b into the closed-loop control operation setting BE1, more particularly adjusts the threshold SW to the closed-loop control operation threshold BSW1. Consequently, in the time interval II, the second signal processing unit 4b processes the sensor signal SES into the closed-loop control operating variable signal BGS1 including the closed-loop control information item RI.

(26) In a subsequent time interval III, in particular in a high temperature operating variable time interval BZI3, the setting unit 5 sets the second signal processing unit 4b into the high temperature operation setting BE3, more particularly adjusts the threshold SW to the high temperature operation threshold BSW3. Consequently, in the time interval III, the second signal processing unit 4b processes the sensor signal SES into the high temperature operating variable signal BGS3 including the high temperature measurement information item HTMI.

(27) In a subsequent time interval IV, in particular in a noise edge position operating variable time interval BZI2, the setting unit 5 sets the second signal processing unit 4b into the noise edge position operation setting BE2, more particularly adjusts the threshold SW to the noise edge position operation threshold BSW2. Consequently, in the time interval IV, the second signal processing unit 4b processes the sensor signal SES into the noise edge position operating variable signal BGS3 including the noise edge position information item RKPI.

(28) In a subsequent time interval V, in particular in a closed-loop control operating variable time interval BZI1, the setting unit 5 sets the second signal processing unit 4b into the closed-loop control operation setting BE1, more particularly again. Consequently, in the time interval V, the second signal processing unit 4b processes the sensor signal SES into the closed-loop control operating variable signal BGS1 including the closed-loop control information item RI, more particularly again.

(29) In a subsequent time interval VI, in particular in a high temperature operating variable time interval BZI3, the setting unit 5 sets the second signal processing unit 4b into the high temperature operation setting BE3, more particularly again. Consequently, in the time interval VI, the second signal processing unit 4b processes the sensor signal SES into the high temperature operating variable signal BGS3 including the high temperature measurement information item HTMI, more particularly again.

(30) In a subsequent time interval VII, in particular in a cosmic ray operating variable time interval BZI4, the setting unit 5 sets the second signal processing unit 4b into the cosmic ray operation setting BE4, more particularly adjusts the threshold SW to the cosmic ray operation threshold BSW4. Consequently, in the time interval VII, the second signal processing unit 4b processes the sensor signal SES into the cosmic ray operating variable signal BGS4 including the cosmic ray information item HSI.

(31) In a subsequent time interval VIII, in particular in a measured variable time interval MZI, the setting unit 5 sets the second signal processing unit 4b into the measurement setting ME, more particularly again. Consequently, in the time interval VIII, the second signal processing unit 4b processes the sensor signal SES into the second measured variable signal MGSb including the measurement information item MI, more particularly again.

(32) The first signal processing unit 4a processes the sensor signal SES into the first measured variable signal MGSa in the time intervals I to VIII.

(33) Moreover, the assessment unit 6 is embodied to monitor the noise edge position information item RKPI in respect of whether a noise edge position threshold RKPSW is reached and/or exceeded. Should the noise edge position threshold RKPSW be reached and/or exceeded, the setting unit 5 is embodied to lengthen, more particularly double, a ratio of a time duration ZDB of the operating variable time intervals BZI3 for processing the operating variable signal BGS3 containing the high temperature measurement information item HTMI to a time duration ZDM of the measured variable time intervals MZI in relation to the undershot case, as shown in FIGS. 5 and 6.

(34) In detail, FIG. 5 shows the case where this is undershot and FIG. 6 shows the case where this is reached and/or exceeded.

(35) In a time interval I shown in FIG. 6, in particular in a measured variable time interval MZI, the setting unit 5 sets the second signal processing unit 4b into the measurement setting ME. Consequently, in the time interval I, the second signal processing unit 4b processes the sensor signal SES into the second measured variable signal MGSb including the measurement information item MI.

(36) In a subsequent time interval II, in particular in a high temperature operating variable time interval BZI3, more particularly a high temperature operating variable time interval that has been lengthened in time, the setting unit 5 sets the second signal processing unit 4b into the high temperature operation setting BE3. Consequently, in the time interval II, the second signal processing unit 4b processes the sensor signal SES into the high temperature operating variable signal BGS3 including the high temperature measurement information item HTMI.

(37) In a subsequent time interval III, in particular in a noise edge position operating variable time interval BZI2, the setting unit 5 sets the second signal processing unit 4b into the noise edge position operation setting BE2. Consequently, in the time interval III, the second signal processing unit 4b processes the sensor signal SES into the noise edge position operating variable signal BGS3 including the noise edge position information item RKPI.

(38) In a subsequent time interval IV, in particular in a high temperature operating variable time interval BZI3, more particularly a high temperature operating variable time interval that has been lengthened in time, the setting unit 5 sets the second signal processing unit 4b into the high temperature operation setting BE3, more particularly again. Consequently, in the time interval IV, the second signal processing unit 4b processes the sensor signal SES into the high temperature operating variable signal BGS3 including the high temperature measurement information item HTMI, more particularly again.

(39) In a subsequent time interval V, in particular in a closed-loop control operating variable time interval BZI1, the setting unit 5 sets the second signal processing unit 4b into the closed-loop control operation setting BE1. Consequently, in the time interval V, the second signal processing unit 4b processes the sensor signal SES into the closed-loop control operating variable signal BGS1 including the closed-loop control information item RI.

(40) In a subsequent time interval VI, in particular in a high temperature operating variable time interval BZI3, more particularly a high temperature operating variable time interval that has been lengthened in time, the setting unit 5 sets the second signal processing unit 4b into the high temperature operation setting BE3, more particularly again. Consequently, in the time interval VI, the second signal processing unit 4b processes the sensor signal SES into the high temperature operating variable signal BGS3 including the high temperature measurement information item HTMI, more particularly again.

(41) In a subsequent time interval VII, in particular in a cosmic ray operating variable time interval BZI4, the setting unit 5 sets the second signal processing unit 4b into the cosmic ray operation setting BE4. Consequently, in the time interval VII, the second signal processing unit 4b processes the sensor signal SES into the cosmic ray operating variable signal BGS4 including the cosmic ray information item HSI.

(42) In a subsequent time interval VIII, in particular in a high temperature operating variable time interval BZI3, more particularly a high temperature operating variable time interval that has been lengthened in time, the setting unit 5 sets the second signal processing unit 4b into the high temperature operation setting BE3, more particularly again. Consequently, in the time interval VIII, the second signal processing unit 4b processes the sensor signal SES into the high temperature operating variable signal BGS3 including the high temperature measurement information item HTMI, more particularly again.

(43) In a subsequent time interval IX, in particular in a measured variable time interval MZI, the setting unit 5 sets the second signal processing unit 4b into the measurement setting ME, more particularly again. Consequently, in the time interval IX, the second signal processing unit 4b processes the sensor signal SES into the second measured variable signal MGSb including the measurement information item MI, more particularly again.

(44) The first signal processing unit 4a processes the sensor signal SES into the first measured variable signal MGSa in the time intervals I to IX.

(45) Moreover, the measured variable time intervals MZI have a different time duration ZDM, more particularly a shorter time duration, than the operating variable time intervals BZI1, BZI2, BZI3, BZI4.

(46) In detail, the measured variable time intervals MZI have a time duration ZDM from 10 ms to 300 s.

(47) Further, the operating variable time intervals BZI1, BZI2, BZI3, BZI4 have a time duration ZDB from 50 ms to 900 s.

(48) Moreover, the optoelectronic sensor device 3 in the shown exemplary embodiment comprises at least one silicon photomultiplier 15, as shown in FIG. 1. In alternative exemplary embodiments, the optoelectronic sensor device may comprise at least one photodiode.

(49) Moreover, in the shown exemplary embodiment, the radiometric measuring apparatus 1 is embodied to determine, particularly in the undershot case, a measured variable value MGW of the measured variable MG on the basis of the first measured variable signal MGSa and/or the second measured variable signal MGSb, more particularly on the basis of the measurement information item MI. In alternative exemplary embodiments, the first measured variable signal and the second measured variable signal may contain a measured variable value of the measured variable.

(50) Additionally, the radiometric measuring apparatus 1 in the shown exemplary embodiment is embodied to determine, particularly in the reached and/or overshot case, a measured variable value MGW of the measured variable MG on the basis of the operating variable signal BGS3 including the high temperature measurement information item HTMI.

(51) In detail, the radiometric measuring apparatus 1 comprises at least one counter 12 and at least one analog-to-digital converter 13 for determining the measured variable value MGW on the basis of the first measured variable signal MGSa and/or the second measured variable signal MGSb, more particularly on the basis of the measurement information item MI, in particular in the undershot case.

(52) Additionally, the at least one counter 12 and the at least one analog-to-digital converter 13 are embodied in the shown exemplary embodiment to determine the measured variable value MGW on the basis of the operating variable signal BGS3 including the high temperature measurement information item HTMI, particularly in the reached and/or overshot case.

(53) In the shown exemplary embodiment, the microcontroller μC comprises the at least one counter 12 and the at least one analog-to-digital converter 13.

(54) In the undershot case shown in FIG. 5, the radiometric measuring apparatus 1 determines the measured variable value MGW on the basis of the first measured variable signal MGSa and/or the second measured variable signal MGSb, more particularly on the basis of the measurement information item MI, in particular by means of the at least one counter 12 and the at least one analog-to-digital converter 13. In the reached and/or exceeded case shown in FIG. 6, the radiometric measuring apparatus 1 determines the measured variable value MGW on the basis of the operating variable signal BGS3 including the high temperature measurement information item HTMI, in particular by means of the at least one counter 12 and the at least one analog-to-digital converter 13.

(55) Moreover, the radiometric measuring apparatus 1 comprises an interface 9, as shown in FIG. 1. The interface 9 is embodied to couple the radiometric measuring apparatus 1 to a receiver 10 for data transfer purposes, in particular for transferring the measured variable value MGW of the measured variable MG. The radiometric measuring apparatus 1 is embodied to be supplied with electrical power by way of its interface 9 only, in particular by way of the receiver 10.

(56) In the shown exemplary embodiment, the interface 9 is electrically coupled to the microcontroller μC, as indicated by a solid line in FIG. 1.

(57) In FIG. 1, the radiometric measuring apparatus 1 is electrically coupled to the receiver 10 via the interface 9, as indicated by a solid line in FIG. 1. Further, the radiometric measuring apparatus 1 transfers the measured variable value MGW to the receiver 10 in particular, in particular by means of the interface 9. Moreover, the radiometric measuring apparatus 1 is supplied with electrical power via its interface 9 only.

(58) Moreover, the radiometric measuring apparatus 1 comprises a malfunction output and/or transfer unit 11, as shown in FIG. 1. The malfunction output and/or transfer unit 11 is embodied to output and/or transfer a malfunction signal FFS, in particular by means of the interface 9, in particular to the receiver 10, if the first signal processing unit 4a and/or the second signal processing unit 4b is/are assessed to be processing incorrectly.

(59) Additionally, the malfunction output and/or transfer unit 11 is embodied in the shown exemplary embodiment to output and/or transfer a noise or high temperature signal, in particular by means of the interface 9, in particular to the receiver 10, if the noise edge position threshold RKPSW is reached and/or exceeded by the noise edge position information item RKPI.

(60) In the shown exemplary embodiment, the microcontroller μC comprises the malfunction output and/or transfer unit 11.

(61) Moreover, the radiometric measuring apparatus 1 comprises a common housing 14, in particular in the form of an explosion prevention housing, as shown in FIG. 1. The scintillator device 2, the optoelectronic sensor device 3, the first signal processing unit 4a, the second signal processing unit 4b, the setting unit 5 and the assessment unit 6 or the microcontroller μC are disposed in the common housing 14.

(62) Additionally, the interface 9, the malfunction output and/or transfer unit 11, the at least one counter 12 and the at least one analog-to-digital converter 13 are disposed in the common housing 14 in the shown exemplary embodiment.

(63) As the exemplary embodiments shown and explained above elucidate, the invention provides an advantageous radiometric measuring apparatus for detecting a measured variable in the form of a fill level, a point level, a density and/or a mass flow, said radiometric measuring apparatus having improved properties, more particularly having a relatively large functional scope and being functionally safe, particularly in the case of only two signal processing units, and having a relatively low power consumption.

(64) The foregoing disclosure has been set forth merely to illustrate the invention and is not intended to be limiting. Since modifications of the disclosed embodiments incorporating the spirit and substance of the invention may occur to persons skilled in the art, the invention should be construed to include everything within the scope of the appended claims and equivalents thereof.