Testing device
D0920819 ยท 2021-06-01
Assignee
Inventors
- Sigeru MATSUMOTO (Tokyo, JP)
- Hiroshi MIYASHITA (Tokyo, JP)
- Kazuyoshi TASHIRO (Kanagawa, JP)
- Kazuhiro MURAUCHI (Tokyo, JP)
Cpc classification
International classification
Abstract
Claims
The ornamental design for a testing device, as shown and described.
Description
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(8) The evenly spaced broken lines depict unclaimed parts of the testing device and form no part of the claimed design.