FORCE SENSOR

Abstract

A force sensor includes a frame and an oscillation structure which has arms and can oscillate freely in the frame. The arms are fixed to suspension frame regions and run transverse to one another at least in sections. At least one conductor extends along at least two arms. An AC voltage can be applied to the at least one conductor to excite at least one oscillation mode of the oscillation structure with a resonant frequency using Lorentz force. The force sensor is designed such that the suspension regions are at least partially spatially displaced relative to one another when a force is applied to the frame, that the magnitude of the spatial displacement of the suspension regions depends on the magnitude of the force, and that the spatial displacement of the suspension regions causes detuning of the resonant frequency, the magnitude of which depends on the spatial displacement magnitude.

Claims

1. A force sensor (1) comprising a frame (2) as well as an oscillation structure (4), which has multiple arms (3a-d) and can oscillate freely in the frame (2), wherein the arms (3a-d) are fixed in place on suspension regions (6a-d) of the frame (2) and run transverse to one another, at least in certain sections, wherein at least one conducting means (5a-d) is provided, which extends along at least two arms (3a-b; 3b-c; 3c-d; 3d-a), so as to allow a flow of current (i) in the form of moving charge carriers at least between two suspension regions (6a-b; 6b-c; 6c-d; 6d-a), wherein the at least one conducting means (5a-d) can have an alternating voltage applied to it, so as to excite at least one oscillation mode of the oscillation structure (4) with a resonance frequency, particularly in an unstressed state of the force sensor (1), making use of the Lorentz force (FL), when the oscillation structure (4) is situated in a magnetic field (B), wherein the force sensor (1) is designed in such a manner that the suspension regions (6a-d) are displaced spatially relative to one another, at least in part, when the frame (2) has a force (7) applied to it, that the magnitude of the spatial displacement (8) of the suspension regions (6a-d) depends on the magnitude of the force (7), that the spatial displacement (8) of the suspension regions (6a-d) brings about detuning of the resonance frequency, and that the magnitude of the detuning depends on the magnitude of the spatial displacement (8) of the suspension regions (6a-d).

2. The force sensor (1) according to claim 1, wherein the suspension regions (6a-d) are disposed in the region of corners (10a-d) of the frame (2).

3. The force sensor (1) according to claim 1, wherein four corners (10a-d) of the frame (2) are provided, which are disposed in a plane of the frame (2) and preferably form a rectangle, particularly preferably a square in the plane.

4. The force sensor (1) according to claim 1, wherein the frame (2) has at least one meander-shaped section (11a-d), which is preferably disposed between at least two suspension regions (6a-b; 6b-c; 6c-d; 6d-a).

5. The force sensor (1) according to claim 1, wherein the number of arms (3a-d) is a whole-number multiple of four, preferably precisely four.

6. The force sensor (1) according to claim 1, wherein the oscillation structure (4) has a coupling element (9) by means of which the arms (3a-d) are mechanically coupled with one another, wherein each arm (3a-d) is preferably fixed in place on the coupling element (9) with one end.

7. The force sensor (1) according to claim 6, wherein the coupling element (9) forms an edge around a surface that preferably lies in a plane of the frame (2).

8. The force sensor (1) according to claim 7, wherein the coupling element (9) is polygonal, preferably four-cornered, preferably rectangular, particularly preferably square.

9. The force sensor (1) according to claim 8, wherein each arm (3a-d) is fixed in place on the coupling element (9) in the region of a corner point of the element.

10. The force sensor (1) according to claim 1, wherein the arms (3a-d) are fixed in place on the respective suspension region (6a-d), in each instance, by means of a temperature-compensation structure (12a-d) that is meander-shaped at least in certain sections.

11. The force sensor (1) according to claim 1, wherein the frame (2) and the oscillation structure (4) are produced in one piece from silicon, preferably mono-crystalline silicon.

12. A system (14) comprising a the force sensor (1) according to claim 1 as well as read-out means for determination of the resonance frequency, wherein the read-out means preferably comprise at least one optical sensor (15) and/or at least one capacitive sensor.

13. The system (14) according to claim 12, wherein a control unit (16) is provided, using which an alternating voltage can be applied to the at least one conducting means (5a-d), so as to excite the oscillation structure (4) to cause it to oscillate, and wherein the control unit (16) is connected with the read-out means (15) for determination of the resonance frequency, wherein preferably at least two conducting means (5a-d) are provided and the control unit (16) is designed for applying counter-phase alternating voltages to the at least two conducting means (5a-d).

14. The system (14) according to claim 13, wherein the control unit (16) is designed for applying at least one pulse of alternating voltages to the at least one conducting means (5a-d), so as to excite the oscillation structure (4) to cause the oscillation structure to oscillate, wherein the at least one pulse has a bandwidth of frequencies, which bandwidth comprises the resonance frequency of at least one oscillation mode of the oscillation structure (4), preferably in an unstressed state of the force sensor (1).

15. The system (14) according to claim 14, wherein the control unit is designed for application of multiple pulses of alternating voltages to the at least one conducting means (5a-d), one after the other, wherein the different pulses comprise resonance frequencies of different oscillation modes of the oscillation structure (4), preferably in the unstressed state of the force sensor (1).

16. The system (14) according to claim 12, wherein the system comprises means (17) for generation of the magnetic field (B), preferably at least one permanent magnet and/or at least one Helmholtz coil.

17. The system (14) according to claim 13, wherein the control unit (16) is designed for excitation of oscillations of the oscillation structure (4) in a plane of the frame (2).

18. A prosthesis comprising the force sensor (1) according to claim 1 and/or a system (14) comprising the force sensor (1) according to claim 1 as well as read-out means for determination of the resonance frequency, wherein the read-out means preferably comprise at least one optical sensor (15) and/or at least one capacitive sensor.

Description

BRIEF DESCRIPTION OF THE FIGURES

[0052] The invention will now be explained in greater detail using an exemplary embodiment. The drawings are intended as examples and are intended to present the idea of the invention, but by no means to restrict it or actually to represent it conclusively.

[0053] In this regard, the drawing shows:

[0054] FIG. 1 a force sensor according to the invention in a top view,

[0055] FIG. 2 a magnified view of Detail A from FIG. 1,

[0056] FIG. 3 a schematic block diagram of a system according to the invention, having the force sensor of FIG. 1.

WAYS TO IMPLEMENT THE INVENTION

[0057] FIG. 1 shows a force sensor 1 according to the invention in a top view, which sensor is suitable for measurement of very small forces of less than or equal to 1 μN, preferably of less than or equal to 1 nN. The force sensor 1 has a frame 2 having four corners 10a, 10b, 10c, 10d, which lie in a plane of the frame 2, wherein in FIG. 1, the plane of the frame 2 coincides with the plane of the drawing. In the exemplary embodiment shown, the corners 10a-d mark corner points of a square having a side length of typically 2 mm. It should be emphasized, however, that fundamentally, other shapes, in particular a rectangular shape of the frame 2 would also be possible.

[0058] The force sensor 1 furthermore has an oscillation structure 4, which can oscillate freely in the frame 2. For this purpose, in the exemplary embodiment shown, the oscillation structure 4 has four arms 3a, 3b, 3c, and 3d, with which the oscillation structure 4 is attached to the frame 2, wherein each of the arms 3a-d is fixed in place, with an end, in a related suspension region 6a, 6b, 6c, 6d of the frame 2. The suspension regions 6a-d are disposed in the region of one of the corners 10a-d of the frame 2, in each instance.

[0059] The arms 3a-d furthermore each have an end that is fixed in place on a coupling element 9 of the oscillation structure 4. The coupling element 9 in turn is disposed centered within the frame 2 in the exemplary embodiment shown, and configured to be essentially rectangular, wherein each of the arms 3a-d joins the coupling element 9 in the region of one of its corner points.

[0060] In the exemplary embodiment shown, each of the arms 3a-d extends between the related suspension region 6a-d and the related corner point of the coupling element 9 with an essentially straight-line section. In this way, an arrangement of the arms 3a-d occurs that is similar to an X shape, so that each of the arms 3a-d runs transverse to two of the other arms 3a-d, at least in certain sections (the said straight-line sections of the arms 3a and 3c run parallel to one another and transverse to the corresponding straight-line sections of the arms 3b and 3d and vice versa).

[0061] In the exemplary embodiment shown, guiding means in the form of conductor tracks 5a, 5b, 5c, 5d, preferably composed of platinum, are disposed on the arms 3a-d. Each of the conductor tracks 5a-d extends along two of the arms 3a-d, in each instance, so as to make possible a flow of current in the form of moving charge carriers, in particular electrons, between the suspension regions 6a-d of the respective two arms 3a-d. In concrete terms, in the exemplary embodiment shown, the conductor track 5a extends along the arms 3a and 3b between the suspension regions 6a and 6b, the conductor track 5b extends along the arms 3b and 3c between the suspension regions 6b and 6c, the conductor track 5c extends along the arms 3c and 3d between the suspension regions 6c and 6d, and the conductor track 5d extends along the arms 3d and 3a between the suspension regions 6d and 6a.

[0062] In order to be able to apply alternating voltage to the conductor tracks 5a-d in simple manner, circular contact points 13a, 13a′, 13b, 13b′, 13c, 13c′, 13d, 13d′ are provided in the suspension regions 6a-d. These points are structured to be so large that contact with an alternating voltage source or with conductors of such a source (not shown) for applying alternating voltage to at least one of the conductor tracks 5a-d is conveniently possible. In concrete terms, the conductor track 5a runs between the contact points 13a′ and 13b, the conductor track 5b runs between the contact points 13b′ and 13c, the conductor track 5c runs between the contact points 13c′ and 13d, and the conductor track 5d runs between the contact points 13d′ and 13a.

[0063] For a better illustration of the conductor tracks 5a-d, FIG. 2 shows a magnified view of Detail A from FIG. 1, in which the conductor tracks 5a and 5d can be clearly seen. Furthermore, in FIG. 2 an alternating current i that flows through the conductor track 5a is symbolized with an arrow. If, in this case, the force sensor 1 is disposed in a magnetic field having a flux density B, which is assumed to be uniform with a vector that points from left to right in FIG. 1 and FIG. 2, in the exemplary embodiment shown, in the entire region of the force sensor 1, this results in a Lorentz force F.sub.L that is shown schematically in FIG. 2, stands normal to the plane of the drawing and points into it. If the alternating current changes its sign or its direction, then the Lorentz force F.sub.L also points in the opposite direction (in other words out of the plane of the drawing). The Lorentz force acts on the charge carriers in the conductor track 5a and thereby on the conductor track 5a itself or on the arms 3a, 3b, and excites the arms 3a and 3b and thereby the entire oscillation structure 4 to oscillate in the frame 2, by means of the constant change in sign. Particularly efficient excitation takes place if the alternating current i has a resonance frequency, in other words the frequency of a resonant oscillation mode of the oscillation structure 4.

[0064] It should be noted that not all the conductor tracks 5a-d necessarily have to be used simultaneously for excitation of oscillations of the oscillation structure 4 or to have alternating voltage applied to them simultaneously. In FIG. 2, the conductor track 5d, for example, could intentionally not have alternating voltage applied to it, so that no alternating current i flows through the conductor track 5d (but rather, in FIG. 2, only through the conductor track 5a). Then the conductor track 5d can be used for temperature measurement, for example, in that the electrical resistance of the conductor track 5d is measured, wherein in the case of this measurement, the contact points 13d′ and 13a can be used for contacting.

[0065] The resonance frequency of the oscillation structure 4 is particularly dependent on the relative position of the suspensions regions 6a-d to one another. A change brings about tensioning of the oscillation structure 4, in particular of the arms 3a-d, and this results in a corresponding change in the resonance frequency. In order to be able to utilize this effect optimally for force measurement, the force sensor 1 is designed in such a manner that the suspension regions 6a-d shift spatially relative to one another, at least in part, when a force 7 is applied to the frame 2, that the magnitude of the spatial displacement 8 of the suspension regions 6a-d depends on the magnitude of the force 7, that the spatial displacement 8 of the suspension regions 6a-d brings about detuning of the resonance frequency, and that the magnitude of the detuning depends on the magnitude of the spatial displacement 8 of the suspension regions 6a-d.

[0066] Calculation of the magnitude of the force 7 can be performed in that the resonance frequency of the oscillation structure 4 in an unstressed state of the force sensor 1, in other words without any force effect, is known or determined, and then the resonance frequency in the stressed state, in other words when the force 7 acts on the force sensor 1 or the frame 2, is known or determined. Likewise, it is possible, proceeding from a stressed state and knowledge or determination of the resonance frequency in this stressed state, to determine the corresponding force change (from the stressed state to the further stressed state) in the case of a further stressed state with a different force 7.

[0067] Forces 7 that have at least one component within the plane of the frame 2 can be measured particularly well. In FIG. 1, the force 7 shown in the drawing lies completely within the plane of the frame 2. In this regard, pressure from above is exerted downward against the frame 2, in the region of the suspension regions 6b, 6c, and pressure from below is exerted upward in the region of the suspension regions 6d, 6a. In this example, the suspension regions 6b, 6c, on the one hand, and the suspension regions 6d, 6a, on the other hand, are displaced toward one another by the displacement 8. The relative position of the suspension regions 6d and 6a to one another does not change during this process, and neither does the relative position of the suspension regions 6b and 6c to one another.

[0068] In order for the displacement 8 to be sufficiently great even in the case of very small forces 7, the frame 2 has meander-shaped sections 11a, 11b, 11c, 11d, which are disposed between two of the suspension regions 6a-d, in each instance, and promotes elastic deformability of the frame 2 in a direction parallel to the connection line between these two of the suspension regions 6a-d. In the exemplary embodiment shown, the meander-shaped sections 11a and 11c are deformed by the force 7, and this leads to the displacement 8.

[0069] In order to prevent thermally related arching or tensioning based on temperature changes, by means of expansion or contraction of the arms 3a-d, which would bring with them a change in the resonance frequency of the oscillation structure 4, temperature-compensation structures 12a, 12b, 12c, 12d are provided in the exemplary embodiment shown. Each of the arms 3a-d is attached to the frame by means of one of the temperature-compensation structures 12a-d. The temperature-compensation structures 12a-d are structured in meander shape. A temperature change results in expansion or contraction of the temperature-compensation structures 12a-d, which precisely compensates the thermal expansion or contraction of the related arm 3a-d, so that no detuning takes place.

[0070] In this regard, the conductor tracks 5a-d run along the temperature-compensation structures 12a-d, in other words also in meander shape, at least in certain sections.

[0071] In the exemplary embodiment shown, frame 2 and oscillation structure 4 of the force sensor 1 are produced by means of known silicon-on-insulator technology. In the case of this production method, the frame 2, together with the oscillation structure 4, can be produced in one piece in a production frame, wherein after completion, the frame 2 or the force sensor 1 is broken out of the production frame at planned breaking points provided for this purpose.

[0072] In order to determine the (resonance) oscillations of the oscillation structure 4, in particular the frequencies of the (resonance) oscillations, known read-out means can be used, in particular optical sensors 15 and/or capacitive sensors (not shown). Capacitive sensors are particularly suitable for measurement of oscillation modes, the oscillation plane or amplitude of which stands normal to the plane of the frame 2, wherein the capacitive sensors can then be disposed above and/or below the plane. Oscillation modes, the oscillation plane or amplitude of which lies in the plane of the frame 2, in particular, can be measured using optical sensors 15. For example, an optical measurement can take place in transmission geometry (transverse, in particular normal to the plane of the frame 2; the at least one optical sensor 15 is then disposed above and/or below the plane of the frame 2), and thereby the periodic change in the placement or geometry of the oscillation structure 4 in the plane of the frame 2 can be detected.

[0073] FIG. 3 shows a schematic representation of a system 14 according to the invention, which comprises the force sensor 1 as well as at least one optical sensor 15. The dotted line between the at least one optical sensor 15 and the force sensor 1 indicates, in FIG. 3, that the oscillations, in particular the frequency of the oscillation structure 4 of the force sensor, are detected by means of the at least one optical sensor 15. In this regard, the optical sensor 15 is connected with a control unit 16 of the system 14, so as to be able to determine the or at least one resonance frequency of the oscillation structure 4. Furthermore, the control unit 16 is connected with the force sensor 1 or with at least one of the conductor tracks 5a-d (in particular by way of the corresponding contact points 13a-d′), so as to apply alternating voltage to at least one of the conductor tracks 5a-d and to be able to excite the oscillation structure 4 to cause it to oscillate.

[0074] In practice, this can also be implemented in such a manner that the control unit 16 controls a separate alternating voltage source, which in turn is connected with the force sensor 1 or with at least one of the conductor tracks 5a-d. In this case, an indirect connection of the control unit 16 with the force sensor 1 is involved, or the at least one of the conductor tracks 5a-d has alternating voltage applied to it indirectly by means of the control unit 16.

[0075] The control unit 16 can therefore use alternating voltages having different frequencies for application—particularly one after the other—and can determine at least one resonance frequency on the basis of detection of the resulting oscillation of the oscillation structure 4, in each instance, wherein the selection of the next frequency can be made dependent on the current detection result.

[0076] Preferably, two of the conductor tracks 5a-d have counter-phase alternating voltage applied to them by means of the control unit 16 for excitation of an oscillation mode of the oscillation structure 4, wherein these two conductor tracks preferably lie opposite one another, for example the conductor tracks 5a and 5c.

[0077] In order to be able to determine at least one resonance frequency particularly rapidly, the control unit 16 can be designed for application of at least one pulse of alternating voltages to the at least one of the conductor tracks 5a-d, so as to excite the oscillation structure 4 to cause it to oscillate, wherein the at least one pulse has a bandwidth of frequencies, which bandwidth comprises the resonance frequency of at least one oscillation mode of the oscillation structure 4, preferably in an unstressed state of the force sensor 1. The sequential application of alternating voltages of different frequencies as described above is clearly more time-consuming, in comparison. In particular, proceeding from knowledge of at least one resonance frequency in the unstressed state (i.e. without any force effect on the force sensor 1), a suitable or sufficiently great frequency band can be selected, so as to determine the resonance frequency that was detuned due to the force effect.

[0078] In order to excite different resonance frequencies in targeted manner, for example so as to conveniently make use of direction dependencies of the corresponding oscillation modes for a direction-resolved force measurement, in terms of measurement technology, the control unit 16 can be designed for application to the at least one of the conductor tracks 5a-d of multiple pulses of alternating voltages, one after the other, wherein the different pulses comprise resonance frequencies of different oscillation modes of the oscillation structure 4, preferably in the unstressed state of the force sensor 1. In other words, a first pulse comprises at least one first resonant oscillation mode of the oscillation structure 4, preferably in the unstressed state; a further pulse comprises at least one further resonant oscillation mode of the oscillation structure 4, preferably in the unstressed state, wherein the first oscillation mode and the further oscillation mode are different.

[0079] In order to make a well-defined magnetic field available, the system 14 comprises means 17 for generation of the magnetic field. These can include, in particular, at least one permanent magnet and/or at least one Helmholtz coil. The broken line in FIG. 3 indicates that it is conceivable that the means 17 are controlled by the control unit 16, so as to adjust a desired magnetic field. For example, a Helmholtz coil can be controlled by the control unit 16.

[0080] Desired oscillation modes of the oscillation structure 4 can be set very precisely by means of ensuring a well-defined magnetic field, and this in turn allows particularly precise force measurements. In particular, in this manner excitation of what are called in-plane oscillations can be guaranteed, in other words oscillation modes having an oscillation plane or amplitude that lies in the plane of the frame. It has been shown that such in-plane oscillations allow particular precise detection of torsions of the frame 2.

REFERENCE SYMBOL LIST

[0081] 1 force sensor [0082] 2 frame [0083] 3a, 3b, 3c, 3d arm [0084] 4 oscillation structure [0085] 5a, 5b, 5c, 5d conductor track [0086] 6a, 6b, 6c, 6d suspension region [0087] 7 force [0088] 8 spatial displacement of the suspension regions [0089] 9 coupling element [0090] 10a, 10b, 10c, 10d corner of the frame [0091] 11a, 11b, 11c, lid meander-shaped section of the frame [0092] 12a, 12b, 12c, 12d temperature-compensation structure [0093] 13a, 13a′, 13b, 13b′, 13c, 13c′, 13d, 13d′ contact point [0094] 14 system [0095] 15 optical sensor [0096] 16 control unit [0097] 17 means for generating a magnetic field [0098] B magnetic flux density [0099] F.sub.L Lorentz force [0100] i alternating current