CONNECTOR

20210135624 ยท 2021-05-06

    Inventors

    Cpc classification

    International classification

    Abstract

    Provided a connector including a first female connector and a first male connector. The first female connector includes a first male sleeve, and a probe is disposed on the first male sleeve. The first male connector includes a first female sleeve, in which an elastic structure is disposed in the first female sleeve. The probe passes through a hole on the first male sleeve and is electrically connected to a second female sleeve in a second male connector. The elastic structure is electrically connected to a second male sleeve in a second female connector.

    Claims

    1. A connector, comprising: a first female connector, comprising: a first male sleeve with a probe disposed in the first male sleeve; and a first male connector, comprising: a first female sleeve with an elastic structure disposed in the first female sleeve, wherein the probe passes through a hole on the first male sleeve and is electrically connected to a second female sleeve in a second male connector, and the elastic structure is electrically connected to a second male sleeve in a second female connector.

    2. The connector of claim 1, wherein the probe is electrically connected to a voltage positive electrode of an electrical measurement device, and the elastic structure is electrically connected to a voltage negative electrode of the electrical measurement device.

    3. The connector of claim 2, wherein the first male sleeve is electrically connected to a current positive electrode of the electrical measurement device, and the first female sleeve is electrically connected to a current negative electrode of the electrical measurement device.

    4. The connector of claim 1, wherein the second female sleeve is electrically connected to a positive electrode of a test object, and the second male sleeve is electrically connected to a negative electrode of the test object.

    Description

    BRIEF DESCRIPTION OF THE DRAWINGS

    [0011] The present disclosure can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein:

    [0012] FIG. 1 is a conventional electrical measurement equipment of a solar power module;

    [0013] FIG. 2 shows the I-V curve of the solar power module measured when the MC4 connector is aged;

    [0014] FIG. 3 is an equivalent circuit diagram of the electrical measurement equipment shown in FIG. 1;

    [0015] FIG. 4 is a diagram of a connector according to an embodiment of the present disclosure;

    [0016] FIG. 5 is an equivalent circuit diagram using the connector shown in FIG. 4; and

    [0017] FIG. 6 is an I-V curve measured using the connector according to an embodiment of the present disclosure.

    DETAILED DESCRIPTION

    [0018] Technical terms of the present disclosure are based on general definition in the technical field of the present disclosure. If the present disclosure describes or explains one or some terms, definition of the terms is based on the description or explanation of the present disclosure. Each of the disclosed embodiments has one or more technical features. In possible implementation, a person skilled in the art would selectively implement all or some technical features of any embodiment of the present disclosure or selectively combine all or some technical features of the embodiments of the present disclosure.

    [0019] In each of the following embodiments, the same reference number represents the same or similar element or component.

    [0020] Referring to FIG. 4, an embodiment of the present disclosure is disclosed. This embodiment provides a connector including a first female connector MCfemale and a first male connector MCmale. The first female connector MCfemale includes: a first male sleeve Smale. The first male connector MCmale includes: a first female sleeve Sfemale.

    [0021] A probe P is provided in the first male sleeve Smale, and an elastic structure SP is provided in the first female sleeve Sfemale. The probe P penetrates a hole on the first male sleeve Smale and is electrically connected to a second female sleeve Sfemale in a second male connector MCmale. The elastic structure SP is electrically connected to the second male sleeve Smale in the second female connector MCfemale.

    [0022] According to the embodiment disclosed by the present disclosure, the embodiment provides a connector, in which the probe P is electrically connected to a voltage positive electrode V+ of the 4-wire I-V measurement equipment, and the elastic structure SP is electrically connected to a voltage negative electrode V of the 4-wire I-V measurement equipment.

    [0023] According to the embodiment disclosed by the present disclosure, the embodiment provides a connector, in which the first male sleeve Smale is electrically connected to a current positive electrode I+ of the 4-wire I-V measurement equipment, and the first female sleeve Sfemale is electrically connected to a current negative electrode I of the 4-wire I-V measurement equipment.

    [0024] According to the embodiment disclosed by the present disclosure, the embodiment provides a connector, in which the second female sleeve Sfemale in the second male connector MCmale is electrically connected to a positive electrode of a test object (i.e., the solar power module), and the second male sleeve Smale in the second female connector MC female is electrically connected to a negative electrode of the test object.

    [0025] FIG. 5 is an equivalent circuit diagram using the connector shown in FIG. 4. With the connector provided by the present disclosure, the measured resistance of the solar power generation module is R. FIG. 6 is an I-V curve measured using the connector disclosed in the embodiment of the present disclosure. When the connector is aged, the connector disclosed in the present disclosure will cause the I-V curve to generate a measurement window in the section where the voltage is very low; that is, when the voltage is very low, the short-circuit current will not be measured. However, the overall I-V curve does not change, so the correct I-V curve can still be measured.

    [0026] While the present disclosure has been described by way of examples and in terms of the embodiments, it should be understood that the present disclosure is not limited to the disclosed embodiments. On the contrary, it is intended to cover various modifications and similar arrangements (as would be apparent to those skilled in the art). Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements.