First and second dielectric waveguides disposed in respective multi-layer substrates which are connected by a connection structure having choke structures therein
10971792 ยท 2021-04-06
Assignee
Inventors
- Hideharu YOSHIOKA (Tokyo, JP)
- Yasuo MORIMOTO (Tokyo, JP)
- NAOFUMI YONEDA (TOKYO, JP)
- Akimichi HIROTA (Tokyo, JP)
- Tomokazu Hamada (Tokyo, JP)
- Tsuyoshi Hatate (Tokyo, JP)
Cpc classification
H01P3/16
ELECTRICITY
H05K2201/09609
ELECTRICITY
H05K1/0251
ELECTRICITY
H05K1/115
ELECTRICITY
International classification
H01P3/16
ELECTRICITY
Abstract
Provided is a structure configured to electrically connect multi-layer dielectric waveguides, each including a dielectric waveguide formed of conductor patterns and vias in a laminating direction of the multi-layer dielectric substrate, in which the vias for forming part of a waveguide wall of each of the dielectric waveguides are arranged in a staggered pattern in the multi-layer dielectric substrate side having choke structures formed so as to electrically connect the waveguides to each other.
Claims
1. A connection structure for dielectric waveguides, comprising: a first multi-layer dielectric substrate, which includes a first dielectric waveguide having a first opening portion, and is configured to propagate a high-frequency signal therethrough; and a second multi-layer dielectric substrate, which includes a second dielectric waveguide having a second opening portion, is arranged to be opposed to the first multi-layer dielectric substrate so that the first opening portion and the second opening portion are opposed to each other through a first space therebetween, and is configured to propagate the high-frequency signal therethrough, wherein the first multi-layer dielectric substrate includes: a first surface-layer conductor, which is provided so as to cover a surface of the first multi-layer dielectric substrate, the surface being opposed to the second multi-layer dielectric substrate, has the first opening portion formed therethrough, and has first cutouts formed at two positions spaced by /4 away from edges of the first opening portion so as to be opposed to each other through the first opening portion therebetween; a first inner-layer conductor, which is provided in the first multi-layer dielectric substrate so as to be opposed to the first surface-layer conductor, and has a first conductor removed portion formed at a position opposed to the first opening portion; and a plurality of first conductor columns, which are provided to extend from the first surface-layer conductor through the first inner-layer conductor in a laminating direction of the first multi-layer dielectric substrate so as to surround all sides of a perimeter of the first opening portion, and are arranged so as to form a waveguide wall of the first dielectric waveguide, wherein the first multi-layer dielectric substrate has choke structures at two positions opposed to each other through the first opening portion therebetween, wherein the choke structures include first choke passages, each having a length of /4, and second choke passages, each having a length of e/4, wherein each of the first choke passages is formed as a space from each of the edges of the first opening portion to a corresponding one of the first cutouts in the first space, wherein each of the second choke passages is formed as a space surrounded by a plurality of third conductor columns provided along an edge of each of the first cutouts, which is on a side opposite to a side on which the first dielectric waveguide is located, so as to connect the first surface-layer conductor and the first inner-layer conductor and the first conductor columns in a second space between the first surface-layer conductor and the first inner-layer conductor, wherein a part of the first conductor columns is arranged at a position spaced by e/4 away from each of the first cutouts toward the first opening portion, in which is a free-space wavelength of a signal wave, and e is an effective wavelength in the dielectric substrates.
2. The connection structure for dielectric waveguides according to claim 1, wherein each of the first opening portion and the second opening portion is formed in a rectangular shape so that a short-side length of each of the first opening portion and the second opening portion in a short-axis direction is formed to be one-half or smaller of a long-side length of each of the first opening portion and the second opening portion in a long-axis direction.
3. The connection structure for dielectric waveguides according to claim 1, wherein each of the first opening portion and the second opening portion is formed in an oval shape so that a short-axis length of each of the first opening portion and the second opening portion in a short-axis direction is formed to be one-half or smaller of a long-axis length of each of the first opening portion and the second opening portion in a long-axis direction.
4. The connection structure for dielectric waveguides according to claim 1, wherein each of the first cutouts is formed in a U-shape with rounded corners through removal of part of the first surface-layer conductor with a given width so as to be spaced by /4 away from each of the edges of the first opening portion at a position opposed to a center of the first opening portion in the long-axis direction and so as to be spaced by /8 or less away from each of the edges of the first opening portion at positions opposed to edges of the first opening portion in the long-axis direction.
5. The connection structure for dielectric waveguides according to claim 1, wherein the first opening portion has an opening area larger than each of an opening area of the second opening portion and an opening area of the first conductor removed portion.
6. The connection structure for dielectric waveguides according to claim 1, wherein the second multi-layer dielectric substrate includes: a second surface-layer conductor provided so as to cover a surface of the second multi-layer dielectric substrate, which is opposed to the first multi-layer dielectric substrate; and a second inner-layer conductor, which is provided in the second multi-layer dielectric substrate so as to be opposed to the second surface-layer conductor, and has a second conductor removed portion formed at a position opposed to the second opening portion, and wherein the second opening portion has an opening area smaller than each of an opening area of the second conductor removed portion and an opening area of the first conductor removed portion.
7. The connection structure for dielectric waveguides according to claim 1, wherein the first multi-layer dielectric substrate further includes a first short-circuit conductor arranged so as to be opposed to a surface opposite to a surface on which the first surface-layer conductor is provided with respect to the first inner-layer conductor, and wherein a plurality of fourth conductor columns are provided to pass from the first inner-layer conductor to the first short-circuit conductor so as to surround the first conductor removed portion.
8. The connection structure for dielectric waveguides according to claim 1, wherein a dielectric is provided in a region of the first space other than regions in which the first opening portion and the first choke passages are formed.
Description
BRIEF DESCRIPTION OF DRAWINGS
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DETAIL DESCRIPTION OF PREFERRED EMBODIMENTS
(36) Referring to the accompanying drawings, a connection structure for dielectric waveguides according to an exemplary embodiment of the present invention is described below.
FIRST EMBODIMENT
(37)
(38) In the first embodiment, a structure configured to connect dielectric waveguides, each including surface-layer conductors, inner-layer conductors, and conductor vias mainly in a laminating direction of multi-layer dielectric substrates is specifically described. The labeled components of the first embodiment as illustrated in
(39) In
(40) An inner-layer conductor 1111, an inner-layer conductor 1112, conductor vias 2101, conductor vias 2102a, and conductor vias 2102b are arranged between the surface-layer conductor 1101 and the surface-layer conductor 1102.
(41) Part of the surface-layer conductor 1101 is removed to form an opening 3101. Part of the inner-layer conductor 1111 is removed to form a conductor removed portion 3111. Part of the inner-layer conductor 1112 is removed to form a conductor removed portion 3112.
(42) A plurality of the conductor vias 2101 are arranged so as to surround the opening 3101 and pass through the multi-layer dielectric substrate 100, the inner-layer conductor 1111, and the inner-layer conductor 1112, which are located between the surface-layer conductor 1101 and the surface-layer conductor 1102.
(43) In the laminating direction of the multi-layer dielectric substrate 100, there is formed a dielectric waveguide 9101 including the surface-layer conductor 1101, the surface-layer conductor 1102, the inner-layer conductor 1111, the inner-layer conductor 1112, the conductor vias 2101, the opening 3101, the conductor removed portion 3111, and the conductor removed portion 3112.
(44) Meanwhile, a surface-layer conductor 1201 is arranged as a surface of the multi-layer dielectric substrate 200 on a side on which the multi-layer dielectric substrate 100 is arranged. A surface-layer conductor 1202 is arranged as a surface of the multi-layer dielectric substrate 200 on aside opposite to the side on which the multi-layer dielectric substrate 100 is arranged.
(45) An inner-layer conductor 1211, an inner-layer conductor 1212, and conductor vias 2201 are arranged between the surface-layer conductor 1201 and the surface-layer conductor 1202.
(46) Part of the surface-layer conductor 1201 is removed to form an opening 3201. Part of the inner-layer conductor 1211 is removed to form a conductor removed portion 3211. Part of the inner-layer conductor 1212 is removed to form a conductor removed portion 3212.
(47) A plurality of the conductor vias 2201 are arranged so as to surround the opening 3201 and pass through the multi-layer dielectric substrate 200, the inner-layer conductor 1211, and the inner-layer conductor 1212, which are located between the surface-layer conductor 1201 and the surface-layer conductor 1202.
(48) In the laminating direction of the multi-layer dielectric substrate 200, there is formed a dielectric waveguide 9201 including the surface-layer conductor 1201, the surface-layer conductor 1202, the inner-layer conductor 1211, the inner-layer conductor 1212, the conductor vias 2201, the opening 3201, the conductor removed portion 3211, and the conductor removed portion 3212.
(49) A dielectric waveguide 9101 and a dielectric waveguide 9201 are arranged so that the opening 3101 of the dielectric waveguide 9101 and the opening 3201 of the dielectric waveguide 9201 are opposed to each other, and are electromagnetically connected to each other.
(50) Portions of the surface-layer conductor 1101, which are located at positions spaced by /4 away from long-side edges of the opening 3101, are removed to form a cutout 4101a and a cutout 4101b. The cutout 4101a and the cutout 4101b are opposed to each other through the opening 3101 therebetween.
(51) A plurality of the conductor vias 2102a are arranged along one of edges of the cutout 4101a, which is on the side opposite to the side on which the dielectric waveguide 9101 is located, to reach the vicinity of the conductor vias 2101 so as to connect the surface-layer conductor 1101 and the inner-layer conductor 1111.
(52) A plurality of the conductor vias 2102b are arranged along one of edges of the cutout 4101b, which is on the side opposite to the side on which the dielectric waveguide 9101 is located, to reach the vicinity of the conductor vias 2101 so as to connect the surface-layer conductor 1101 and the inner-layer conductor 1111.
(53) A choke passage 5101a is a space from one edge of the opening 3101 to the cutout 4101a within a space formed between the surface-layer conductor 1101 and the surface-layer conductor 1201.
(54) A choke passage 5101b is a space from another edge of the opening 3101 to the cutout 4101b within a space formed between the surface-layer conductor 1101 and the surface-layer conductor 1201.
(55) A choke passage 5102a is a space surrounded by the conductor vias 2102a and the conductor vias 2101 within a space formed between the surface-layer conductor 1101 and the inner-layer conductor 1111.
(56) A choke passage 5102b is a space surrounded by the conductor vias 2102b and the conductor vias 2101 within a space formed between the surface-layer conductor 1101 and the inner-layer conductor 1111.
(57) A part of the conductor vias 2101 is arranged at a position spaced by e/4 away from the cutout 4101a toward the opening 3101. Meanwhile, a part of the conductor vias 2101 is arranged at a position spaced by e/4 away from the cutout 4101b toward the opening 3101. As a result, the conductor vias 2101 are arranged in a staggered pattern.
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(59) Meanwhile,
(60) In the results of simulations shown in
(61) In
(62) For example, in
(63) Meanwhile, in
(64) Specifically, a reflection amount is the same in the example of the related-art connection structure for dielectric waveguides and the connection structure for dielectric waveguides according to the first embodiment. For a passage amount, however, unnecessary emission of the high-frequency signal propagating from the conductor removed portion 3111 to the conductor removed portion 3211 is suppressed owing to the improvement of the connection structure for dielectric waveguides.
(65) As is apparent from the results described above, the connection structure for dielectric waveguides in the first embodiment has such a configuration that a part of the conductor vias 2101 is arranged at the position spaced by e/4 away from the cutout 4101a toward the opening 3101 and a part of the conductor vias 2101 is arranged at the position spaced by e/4 away from the cutout 4101b toward the opening 3101 to arrange the conductor vias 2101 in the staggered pattern.
(66) With the configuration described above, a length of the choke passage 5102a from the electrically short-circuited conductor via 2101 to the cutout 4101a becomes equal to e/4. As a result, the cutout 4101a is electrically open.
(67) Further, in the connection structure for dielectric waveguides in the first embodiment, a length of the choke passage 5101a from the cutout 4101a, which is electrically open, to the edge of the opening 3101 can be set to /4. Thus, the edge of the opening 3101 is electrically short-circuited.
(68) Similarly, a length of the choke passage 5102b from the electrically short-circuited conductor via 2101 to the cutout 4101b can be set to e/4. Thus, the cutout 4101b is electrically open.
(69) Further, a length of the choke passage 5101b from the cutout 4101b, which is electrically open, to the edge of the opening 3101 can be set to /4. Thus, the edge of the opening 3101 is electrically short-circuited.
(70) As a result, according to the first embodiment, leakage of the high-frequency signal from a space between the opening 3101 and the opening 3210 can be suppressed to provide the connection structure for dielectric waveguides, which has good reflection characteristic and passage characteristic.
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(72) Meanwhile,
(73) As is apparent from comparison between
(74) Specifically, in the connection structure for dielectric waveguides according to the first embodiment, as illustrated in
(75) The arrangement of the conductor vias 2101 in the present invention is not limited to the staggered arrangement illustrated in
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(77) In
(78) In the example of
(79) Meanwhile, in the example of
(80) In the first embodiment described above as shown in
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(82) As illustrated in
(83) In the connection structure for dielectric waveguides, which has choke structures illustrated in
(84) Further, in the first embodiment described above as shown in
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(87) As illustrated in
(88) Further, in the first embodiment as shown in
(89) In the connection structure for dielectric waveguides, which has choke structures illustrated in
SECOND EMBODIMENT
(90) In the first embodiment described above as shown in
(91)
(92) In
(93) In
(94) A plurality of the conductor vias 2112 are arranged so as to surround the conductor removed portion 3111 and pass through the multi-layer dielectric substrate 100 from the the inner-layer conductor 1111 to the inner-layer conductor 1112.
(95) A part of the conductor vias 2111 is arranged at a position spaced by e/4 away from the cutout 4101a toward the opening 3101. Meanwhile, a part of the conductor vias 2111 is arranged at a position spaced by e/4 away from the cutout 4101b toward the opening 3101. As a result, the conductor vias 2111 are arranged in a staggered pattern.
(96) The opening dimension of the opening 3101 in the second embodiment is larger than the opening dimension of the opening 3201. The opening dimension of each of the conductor removed portion 3111, the conductor removed portion 3211, and the conductor removed portion 3212 is smaller than that of the opening 3101 and larger than that of the opening 3201.
(97) The inner-layer conductor 1112 in the second embodiment does not have a conductor removed portion, and serves as a short-circuited surface of the dielectric waveguide 9101.
(98) According to the second embodiment, the opening dimension of the opening 3101 is set larger than that of the opening 3201. The opening dimension of each of the conductor removed portion 3111, the conductor removed portion 3211, and the conductor removed portion 3212 is set smaller than that of the opening 3101 and larger than that of the opening 3201. With the configuration described above, characteristic deterioration, which may be caused due to a misalignment between the multi-layer dielectric substrate 100 and the multi-layer dielectric substrate 200, can be allowed.
(99) Further, according to the second embodiment, the opening dimension is locally changed for the opening 3201 in the dielectric waveguide 9201 so as to be different from the opening dimension of the opening 3101 in the dielectric waveguide 9101. With the adoption of the configuration described above, influences of the connection between the lines having different impedances at a connecting portion between the dielectric waveguides, which are generated along with change in opening dimension, can be minimized. At the same time, the same effects as those of the first embodiment described above are attained.
(100) Third Embodiment
(101) In the first embodiment and the second embodiment described above, there has been described the connection structure for dielectric waveguides, in which air is present in a space between the surface-layer conductor 1101 of the multi-layer dielectric substrate 100 and the surface-layer conductor 1201 of the multi-layer dielectric substrate 200. Meanwhile, in the third embodiment, there is described a connection structure for dielectric substrates, in which a dielectric is arranged in the space.
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(103) In
(104) In
(105) According to the third embodiment, with the adoption of the sheet-shaped dielectric 6001 arranged as described above, the surface-layer conductor 1101 of the multi-layer dielectric substrate 100 can be protected.
(106) With the use of air in the regions in which the opening 3101, the choke passage 5101a, and the choke passage 5101b are formed, a fluctuation in electrical length in the choke passage 5101a and the choke passage 5101b, which may be caused by a misalignment between the multi-layer dielectric substrate 100 and the multi-layer dielectric substrate 200, can be minimized in comparison to a case in which the above-mentioned regions are formed as dielectrics. As a result, the characteristic deterioration in the choke structures can be minimized. At the same time, the same effects as those attained in the first embodiment described above are attained.
(107) In the embodiments described above, the term staggered pattern is used to collectively, represent the arrangement of the conductor vias 2101 or the conductor vias 2111, which is illustrated in
(108) When each of the opening 3101 (corresponding to the first opening portion) and the opening 3201 (corresponding to a second opening portion) is formed in the rectangular shape, it is desired that a short-side length be formed as a length equal to or smaller than one-half of a long-side length. When each of the opening 3101 and the second opening 3201 is formed in the oval shape, it is desired that a short-axis length be formed as a length equal to or smaller than one-half of a long-axis length. With the adoption of the desirable structure described above, a high-order transmission mode can be generated in a frequency band higher than an operating band. Thus, a basic transmission mode alone is used as a transmission mode in the operating band. Thus, a good passage characteristic can be achieved.
(109) A free combination of the embodiments, a modification of a suitable component in each of the embodiments, or omission of a suitable component in each of the embodiments is possible in the present invention within the scope of the invention.
REFERENCE SIGNS LIST
(110) 100, 200 multi-layer dielectric substrate; 1101, 1102, 1201, 1202 surface-layer conductor; 1111, 1112, 1211, 1212 inner-layer conductor; 2101, 2102a, 2102b, 2201, 2202a, 2202b, 2111, 2112 conductor via; 3101, 3201 opening; 3111, 3112, 3211, 3212 conductor removed portion; 4101a, 4101b cutout; 5101a, 5101b, 5102a, 5102b choke passage; 9101, 9201 dielectric waveguide; 6001 sheet-shaped dielectric