Combined wafer production method with a receiving layer having holes
10960574 ยท 2021-03-30
Assignee
Inventors
Cpc classification
H01L31/18
ELECTRICITY
B28D5/0011
PERFORMING OPERATIONS; TRANSPORTING
Y10T225/304
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01L21/2007
ELECTRICITY
International classification
B28D5/00
PERFORMING OPERATIONS; TRANSPORTING
H01L21/20
ELECTRICITY
H01L31/18
ELECTRICITY
Abstract
A method for producing solid layers includes: providing a solid for separating at least one solid layer; fixing an accommodating layer for holding the solid layer on the solid, wherein the accommodating layer has a multiplicity of holes for conducting a liquid, wherein the accommodating layer is fixed on the solid by means of a connecting layer; and thermal loading of the accommodating layer for mechanical generation of stresses in the solid. A crack in the solid propagates along a detachment plane due to the stresses. The solid layer is separated from the solid by means of the crack. The accommodating layer includes at least one polymer material, and the polymer material undergoes a glass transition at a temperature lower than 0 C.
Claims
1. A method for producing solid layers, comprising: providing a solid for separating at least one solid layer; fixing an accommodating layer for holding the solid layer on the solid, wherein the accommodating layer has a multiplicity of holes for conducting a liquid, wherein the accommodating layer is fixed on the solid by means of a connecting layer; thermal loading of the accommodating layer for mechanical generation of stresses in the solid, wherein a crack in the solid propagates along a detachment plane due to the stresses, wherein the solid layer is separated from the solid by means of the crack, wherein the accommodating layer comprises at least one polymer material, wherein the polymer material undergoes a glass transition at a temperature lower than 0 C.; and after the thermal loading, guiding a fluid through the holes in the accommodating layer and onto the connecting layer, wherein the fluid weakens, decomposes or dissolves the connecting layer such that the fixing of the accommodating layer on the solid is weakened or terminated, wherein the accommodating layer comprises a first material portion and a second material portion different than the first material portion, wherein the first material portion has the holes, wherein the holes are lined by the second material portion.
2. The method according to claim 1, further comprising the holes having a diameter of less than 1 mm, less than 0.5 mm or less than 0.1 mm.
3. The method according to claim 1, further comprising the accommodating layer having more than 10 of the holes, more than 100 of the holes or more than 1000 of the holes.
4. The method according to claim 1, further comprising at least one further hole being formed in a radius of less than 50 mm, less than 25 mm or less than 5 mm.
5. The method according to claim 1, further comprising creating defects in an inner structure of the solid to predefine the detachment plane with at least one radiation source.
6. The method according to claim 5, further comprising creating the defects with a laser before or after the application of the accommodating layer on the solid.
7. The method according to claim 6, further comprising setting up the laser in such a manner that beams emitted for creating the detachment plane penetrate into the solid to a defined depth of more than 100 m, more than 200 m, more than 400 m or more than 700 m.
8. The method according to claim 6, further comprising creating the defects with the laser being a femtosecond laser.
9. The method according to claim 8, further comprising choosing an energy of the femtosecond laser in such a manner that a damage propagation in the solid is smaller than 3-times the Rayleigh length, smaller than the Rayleigh length or smaller than a third of the Rayleigh length.
10. The method according to claim 8, further comprising choosing a wavelength of the laser such that the absorption of the solid is lower than 10 cm-1, lower than 1 cm-1 or smaller than 0.1 cm-1.
11. The method according to claim 8, further comprising the defects being in each case created as a consequence of multiple-photon excitation effected by the femtosecond laser.
12. The method according to claim 5, further comprising setting up the radiation source in such a manner that beams emitted by the radiation source for creating the detachment plane penetrate into the solid to a defined depth of less than 200 m, less than 100 m, less than 50 m or less than 20 m.
13. The method according to claim 5, further comprising the radiation source having a pulse duration of less than 10 ps, less than 1 ps or less than 500 fs.
14. A wafer produced by the method of claim 1.
15. The method according to claim 1, wherein the at least one polymer material is polydimethylsiloxane.
16. The method according to claim 1, wherein the second material portion coats the first material portion on an upper side parallel to the connecting layer.
17. The method according to claim 1, wherein the first material portion comprises the at least one polymer material, and wherein the second material portion comprises metal.
Description
(1) In the figures:
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(12) A workpiece 2 or a substrate is shown in
(13) In
(14) A state after crack formation and subsequent crack guidance is shown in
(15) Examples for the creation, shown in
(16) The present invention therefore relates to a method for producing solid layers. The method according to the invention can in this case additionally or alternatively comprise one, a plurality or all of the steps listed below, particularly providing a workpiece 2 for separating at least one solid layer 4, generating preferably defined local stresses or local stresses by means of at least one radiation source, particularly an fs laser, in the inner structure of the solid for predefining a crack guidance layer, along which the solid layer is separated from the solid, and thermal loading of a polymer layer 10 arranged on the workpiece 2, for, in particular mechanical, generation of detachment stresses in the workpiece 2, wherein a crack in the workpiece 2 propagates along the crack guidance layer 8 due to the detachment stresses, which crack separates the solid layer 4 from the workpiece 2. The local stresses here preferably cause the crack propagation to take place in the desired crack guidance layer 8.
(17) In
(18) A focussed laser beam 6 is shown in
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(24) Furthermore, it is preferably additionally or alternatively conceivable that the method for producing solid layers comprises one, a plurality or all of the following mentioned steps: Providing a solid 2 for separating at least one solid layer 4, arranging an accommodating layer 10 for holding the solid layer 4 on the solid 2, wherein the accommodating layer consists at least of a polymer and a further material, wherein the accommodating layer preferably mostly consists of the polymer in terms of volume and/or in terms of mass, wherein the further material has a greater conductivity than the polymer, thermal loading of the accommodating layer 10 for the, in particular mechanical, generation of stresses in the solid 2, wherein a crack in the solid 2 propagates along a detachment plane 8 due to the stresses, wherein the solid layer 4 is separated from the solid 2 by means of the crack.
(25) Furthermore, the film according to the invention for generating stress in a solid preferably comprises at least one polymer material, particularly PDMS, and a further material, wherein the film mostly consists of the polymer material in terms of volume, wherein the material has a greater thermal conductivity than the polymer material, wherein the polymer material preferably undergoes a glass transition at a temperature lower than 0 C., particularly at a temperature lower than 50 C.
REFERENCE LIST
(26) 2 Workpiece 3 Substrate 4 Solid layer 5 Sacrificial layer 6 Radiation 8 Crack guidance layer 10 Accommodating layer/film 11 Connecting layer 12 Holding layer 14 First planar area segment 16 Second planar area segment 18 Radiation source/defect-creating device 20 Stabilizing device 36 Hole 38 Loading with cold 39 First material portion 40 Second material portion X First direction Y Second direction 2 Third direction