OXIDE SINTERED BODY AND SPUTTERING TARGET

Abstract

An oxide sintered body has metal elements of In, Ga, Zn, and Sn and contains Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4, and InGaZnO.sub.4. The contents of In, Ga, Zn, and Sn in the oxide sintered body satisfy the relations [Ga]37 atomic %, [Sn]15 atomic %, and [Ga]/([In]+[Zn])0.7, where [In], [Ga], [Zn], and [Sn] represent ratios (atomic %) of In, Ga, Zn, and Sn with respect to all metal elements contained in the oxide sintered body, respectively.

Claims

1. An oxide sintered body having metal elements of In, Ga, Zn, and Sn and containing Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4, and InGaZnO.sub.4, wherein contents of In, Ga, Zn, and Sn satisfy expressions (1) to (3):
[Ga]37 atomic %(1),
[Sn]15 atomic %(2), and
[Ga]/([In]+[Zn])0.7(3), where [In], [Ga], [Zn], and [Sn] represent atomic ratios of In, Ga, Zn, and Sn, with respect to all metal elements contained in the oxide sintered body, respectively.

2. The oxide sintered body according to claim 1, wherein when the oxide sintered body is subjected to X-ray diffraction, the Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4, and InGaZnO.sub.4 satisfy expression (4):
[Ga.sub.2In.sub.6Sn.sub.2O.sub.16]+[ZnGa.sub.2O.sub.4]+[InGaZnO.sub.4]0.9(4), where [Ga.sub.2In.sub.6Sn.sub.2O.sub.16]I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases)), [ZnGa.sub.2O.sub.4]=I(ZnGa.sub.2O.sub.4)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases)), and [InGaZnO.sub.4]=I(InGaZnO.sub.4)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases)); where, I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16), I(ZnGa.sub.2O.sub.4), and I(InGaZnO.sub.4) are respectively diffraction peak intensities of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase identified by X-ray diffraction, and I(other crystal phases) is a diffraction peak intensity of a crystal phase identified by X-ray diffraction other than Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4, and InGaZnO.sub.4.

3. The oxide sintered body according to claim 1, wherein an average grain size of the oxide sintered body is 10 m or less.

4. The oxide sintered body according to claim 3, wherein the average grain size is 7 m or less.

5. The oxide sintered body according to claim 1, wherein the atomic ratio of Sn satisfies
2 atomic %[Sn].

6. A sputtering target obtained by using the oxide sintered body according to claim 1, which has a resistivity of 1 .Math.cm or less.

Description

BRIEF DESCRIPTION OF DRAWINGS

[0020] FIG. 1 is a graph (X-ray diffraction chart) illustrating the X-ray diffraction results of the oxide sintered body of the present invention in Example 2.

[0021] FIG. 2A is a diagram illustrating EPMA test results (element mapping) of the oxide sintered body of the present invention in Example 2.

[0022] FIG. 2B is a diagram illustrating EPMA test results (element mapping) of the oxide sintered body of the present invention in Example 2.

DESCRIPTION OF EMBODIMENTS

[0023] The present inventors have made intensive studies on an oxide sintered body so as to provide an oxide sintered body for sputtering targets, which enables stable deposition over a long period of time by the suppression of abnormal electrical discharge during sputtering and cracking of a sputtering target material and moreover, is suitable for depositing an oxide semiconductor film capable of enhancing photo-induced stress stability.

[0024] As a result, it has been found that in an oxide sintered body having metal elements composed of In, Ga, Zn and Sn, when each of the contents of respective metal elements contained in the oxide sintered body is appropriately controlled, an oxide sintered body composed of predetermined crystal phases can be obtained and cracking of the oxide sintered body can be suppressed while ensuring excellent photo-induced stress stability.

[0025] Specifically, it has been found out that (a) when a large amount (37 atomic % or more) of Ga is added, excellent photo-induced stress stability can be ensured; and (b) when, relative to the total amount of In and Zn, not less than a predetermined amount (0.7 or more) of Ga is added and not more than a predetermined amount (15 atomic % or less) of Sn is added, Sn can be preferentially dissolved in Ga.sub.2In.sub.6Sn.sub.2O.sub.16 out of Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4 contained in the oxide sintered body to suppress the grain growth of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 and a structure resistant to bonding cracking is obtained. The present invention has been accomplished based on this finding.

[0026] First, the oxide sintered body according to the present invention is described in detail.

[0027] The oxide sintered body of the present invention has metal elements composed of In, Ga, Zn and Sn and containing Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4, wherein when the ratios (atomic %) of the contents of In, Ga, Zn and Sn to all metal elements excluding oxygen contained in the oxide sintered body are taken as [In], [Ga], [Zn] and [Sn], respectively, the following expressions (1) to (3) are satisfied:

[Ga]37 atomic %(1)

[Sn]15 atomic %(2)

[Ga]/([In]+[Zn])0.7(3)

[0028] Here, in order to form an oxide sintered body having excellent photo-induced stress stability and capable of suppressing cracking of the oxide sintered body in the bonding process, each of the contents of respective metal elements contained in the oxide sintered body needs to be appropriately controlled.

[0029] Specifically, when the ratios (atomic %) of the contents of In, Ga, Zn and Sn to all metal elements excluding oxygen contained in the oxide sintered body are taken as [In], [Ga], [Zn] and [Sn], respectively, the ratios are controlled to satisfy the following expressions (1) to (3):

[Ga]37 atomic %(1)

[Sn]15 atomic %(2)

[Ga]/([In]+[Zn])0.7(3)

[0030] Expression (1) defines the Ga ratio ([Ga]=Ga/(In+Ga+Zn+Sn)) in all metal elements. Ga not only decreases oxygen defects to stabilize an amorphous structure of the oxide semiconductor thin film but also has a function of enhancing the reliability in stress stability, particularly, against light+negative bias stress.

[0031] If [Ga] is too low, the effect of enhancing the reliability in light+negative bias stress of the oxide semiconductor thin film after deposition by sputtering is hardly obtained. Accordingly, [Ga] is 37 atomic % or more, preferably 40 atomic % or more, more preferably 42 atomic % or more, still more preferably 45 atomic % or more.

[0032] In addition, if [Ga] is too high, the mobility decreases. Accordingly, [Ga] is preferably 65 atomic % or less, more preferably 60 atomic % or less.

[0033] Expression (2) defines the Sn ratio ([Sn]=Sn/(In+Ga+Zn+Sn)) in all metal elements. In general, Sn has a function of enhancing the chemical resistance of the oxide semiconductor thin film, such as wet etching property.

[0034] If [Sn] is too high, growth of the grain of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 cannot be suppressed and in addition, formation of Sn-containing crystal phases other than Ga.sub.2In.sub.6Sn.sub.2O.sub.16 tends to be induced. As a result, cracks develop starting from the crystal phase generated and can give rise to a cause of cracking at the time of bonding. Accordingly, [Sn] is 15 atomic % or less, preferably 12 atomic % or less, more preferably 10 atomic % or less.

[0035] In addition, if [Sn] is too low, the effect of suppressing grain growth in the Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase by virtue of preferential dissolution of Sn in Ga.sub.2In.sub.6Sn.sub.2O.sub.16 is hardly obtained. Accordingly, [Sn] is 1 atomic % or more, preferably 2 atomic % or more, more preferably 3 atomic % or more, still more preferably 5 atomic % or more.

[0036] Expression (3) defines the Ga ratio in all metal elements to the total of the In ratio in all metal elements and the Zn ratio in all metal elements.

[0037] If [Ga]/([In]+[Zn]) is too low, growth of the grain of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 cannot be suppressed, and formation of Sn-containing crystal phases other than Ga.sub.2In.sub.6Sn.sub.2O.sub.16 tends to be induced. As a result, cracks develop starting from the crystal phase generated and can give rise to a cause of cracking at the time of bonding. Accordingly, [Ga]/([In]+[Zn]) is 0.7 or more, preferably 0.8 or more.

[0038] In addition, even if [Ga]/([In]+[Zn]) is too high, an adverse effect is not particularly caused, but in view of resistivity of the oxide sintered body, the ratio is 0.99 or less.

[0039] Next, Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4 detected when the oxide sintered body according to the present invention is subjected to X-ray diffraction are described.

[0040] Each of Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4 is an oxide formed by bonding of at least a part of In, Ga and Zn, and O constituting the oxide sintered body of the present invention. Sn contained in the oxide sintered body is preferentially dissolved in Ga.sub.2In.sub.6Sn.sub.2O.sub.16 and almost no Sn is contained in ZnGa.sub.2O.sub.4 and InGaZnO.sub.4.

[0041] As described above, Sn is preferentially dissolved in Ga.sub.2In.sub.6Sn.sub.2O.sub.16 out of Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4 contained in the oxide sintered body, and grain growth of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 is thereby suppressed. As a result, a structure resistant to bonding cracking is obtained. In addition, by virtue of preferential dissolution of Sn, other crystal phases giving rise to a cause of abnormal electrical discharge, such as SnO, are not generated, making stable deposition possible, and moreover, cracking at the time of bonding can be prevented from occurring due to development of cracks starting from crystal phases other than Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4, which are locally precipitated.

[0042] Furthermore, in order to more enhance the effect of preventing cracking at the time of bonding, it is preferable to refine the average grain size of grains of the oxide sintered body. Specifically, the average grain size of grains observed with a scanning electron microscope (SEM) in a fracture surface (an arbitrary position on a section surface when the oxide sintered body is cut at an arbitrary position in the thickness direction) of the oxide sintered body is controlled to preferably 10 m or less, and cracking of the oxide sintered body can thereby be more prevented.

[0043] The average grain size of grains of the oxide sintered body is more preferably 8 m or less, still more preferably 7 m or less, yet still more preferably 6 m or less. On the other hand, the lower limit value of the average grain size is not particularly limited, but in view of the balance between refining of the average grain size and production cost, the lower limit of the average grain size is preferably about 0.05 m.

[0044] Furthermore, in the present invention, it is preferable to appropriately control the grain size distribution as well as the average grain size of grains of the oxide sintered body. Specifically, coarse grains having a grain size exceeding 15 m give rise to cracking of the oxide sintered body at the time of bonding and therefore, the proportion thereof is preferably as small as possible. Accordingly, the area ratio of coarse grains having a grain size exceeding 15 m in the entire grains is preferably 10% or less, more preferably 8% or less, still more preferably 6% or less, yet still more preferably 4% or less.

[0045] The relative density of the oxide sintered body of the present invention is preferably 90% or more. By increasing the relative density of the oxide sintered body, the effect of preventing cracking at the time of bonding can be more enhanced. The relative density of the oxide sintered body of the present invention is more preferably 95% or more, still more preferably 98% or more. The upper limit value is not particularly limited and may be, for example, 100%, but in view of production cost, the upper limit is preferably 99%.

[0046] In order to further enhance the effect of preventing cracking at the time of bonding, the peak intensities of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase identified by X-ray diffraction preferably satisfy the following expression (4):

[Ga.sub.2In.sub.6Sn.sub.2O.sub.16]+[ZnGa.sub.2O.sub.4]+[InGaZnO.sub.4]0.9(4)

wherein [Ga.sub.2In.sub.6Sn.sub.2O.sub.16]I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases)), [ZnGa.sub.2O.sub.4]=I(ZnGa.sub.2O.sub.4)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases)), and [InGaZnO.sub.4]=I(InGaZnO.sub.4)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases)).

[0047] In the expression, I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16), I(ZnGa.sub.2O.sub.4) and I(InGaZnO.sub.4) are respectively diffraction peak intensities of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase identified by X-ray diffraction. I(other crystal phases) is a diffraction peak intensity of a crystal phase identified by X-ray diffraction other than Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4. I means that it is the measured value of X-ray diffraction intensity.

[0048] With respect to diffraction peaks obtained by subjecting the oxide sintered body to X-ray diffraction, the compound phases of Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4 have crystal structures described in ICSD (Inorganic Crystal Structure Database) cards 01-089-7011, 00-038-1240 and 01-070-3625, respectively (corresponding to Ga.sub.2In.sub.6Sn.sub.2O.sub.16, ZnGa.sub.2O.sub.4 and InGaZnO.sub.4, respectively) (see Table 2).

[0049] In the present invention, when the oxide sintered body is subjected to X-ray diffraction, it is preferred that the total of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase is contained in a predetermined ratio. When the diffraction peak intensity ratios of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase are decreased, this means that the proportion of these compounds in the entire oxide sintered body decreases and consequently, the proportion of precipitated crystal phases other than these compounds increases.

[0050] In this case, cracks develop starting from crystal phases other than Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase, which are locally precipitated, and may give rise to a cause of cracking at the time of bonding. For this reason, [Ga.sub.2In.sub.6Sn.sub.2O.sub.16]+[ZnGa.sub.2O.sub.4]+[InGaZnO.sub.4] is preferably 0.9 or more, more preferably 0.95 or more, still more preferably 0.99 or more.

[0051] A suitable production method for the oxide sintered body of the present invention is described below.

[0052] The oxide sintered body of the present invention is obtained by mixing and sintering indium oxide; gallium oxide; zinc oxide; and tin oxide, and the sputtering target can be produced by processing the oxide sintered body. Specifically, the sputtering target can be obtained by subjecting oxide powders to (a) mixing/pulverization.fwdarw.(b) drying/granulation.fwdarw.(c) preforming.fwdarw.(d) degreasing.fwdarw.(e) atmospheric sintering, and subjecting the obtained oxide sintered body to (f) processing.fwdarw.(g) bonding.

[0053] Of these steps, in the present invention, as described in detail below, it may be sufficient if the selection conditions of indium oxide, gallium oxide, zinc oxide and tin oxide as raw material powders and the conditions of atmospheric sintering ((e)) are appropriately controlled. Other steps are not particularly limited, and usually employed steps may be appropriately selected. In the following, each step is described, but the present invention is by no means limited thereto.

[0054] First, an indium oxide powder; a gallium oxide powder; a zinc oxide powder; and a tin oxide powder are blended in a predetermined ratio, followed by mixing and pulverization. Each of the raw material powders used preferably has a purity of about 99.99% or more because an impurity element, if present in a trace amount, may impair semiconducting properties of the oxide semiconductor thin film. The blending ratio of respective raw material powders is preferably controlled such that the ratios of contents of indium, gallium, zinc and tin to all metal elements excluding oxygen contained in the oxide sintered body fall within the ranges above.

[0055] The (a) mixing/pulverization is preferably performed using a ball mill by charging the raw material powders thereinto together with water. As the ball or bead used in this step, a ball or bead formed of, for example, materials such as nylon, alumina and zirconia is preferably used. On this occasion, a dispersant for the purpose of homogeneous mixing, and a binder for ensuring ease of the subsequent forming step, may be mixed.

[0056] Next, a mixed powder obtained in the step above is preferably subjected to the (b) drying/granulation by means of, for example, a spray drier.

[0057] After drying/granulation, the (c) preforming is performed. In performing the forming, the powder after drying/granulation fills a die having a predetermined dimension and is preformed by die pressing. The preforming is performed for the purpose of enhancing the handling property at the time of setting in a sintering furnace and therefore, is sufficient if a compact is formed by applying a pressure of approximately from 0.5 to 1.0 tonf/cm.sup.2.

[0058] Thereafter, forming (main forming) is performed by CIP (Cold Isostatic Pressing). For increasing the relative density of the oxide sintered body, the pressure during forming is preferably controlled to about 1 tonf/cm.sup.2 or more.

[0059] In the case where a dispersant or a binder is added to the mixed powder, it is preferable to perform the (d) degreasing by heating the compact so as to remove the dispersant or binder. The heating conditions are not particularly limited as long as the purpose of degreasing can be achieved, but, for example, the compact may be kept in the air generally at about 500 C. for about 5 hours.

[0060] After degreasing, the compact is set in a die providing a desired shape and sintered by (e) atmospheric sintering.

[0061] In the present invention, sintering is performed at a sintering temperature: from 1,300 to 1,600 C., for a holding time at this temperature: from 1 to 50 hours. In addition, it is preferable to once hold the compact at 1,100 to 1,300 C. for 1 to 10 hours. By selecting these temperature ranges and holding times, compound phases satisfying expressions (1) to (3) can be obtained.

[0062] If the sintering temperature is low, the compact cannot be sufficiently densified, and the material strength decreases. On the other hand, if the sintering temperature is too high, the grain is coarsened, making it impossible to control the average grain size of grains to a predetermined range, and the material strength decreases. Accordingly, a sintering temperature is 1,300 C. or more, preferably 1,350 C. or more, more preferably 1,400 C. or more, and 1,600 C. or less, preferably 1,550 C. or less.

[0063] In the present invention, the average temperature rise rate up to the sintering temperature above after forming is preferably 100 C./hr or less. If the average temperature rise rate exceeds 100 C./hr, abnormal growth of grain is likely to occur, and the relative density cannot be sufficiently increased.

[0064] In the sintering step, the sintering atmosphere is preferably set to an oxygen gas atmosphere (for example, air atmosphere) or an oxygen gas pressurized atmosphere. The pressure of the atmosphere gas is preferably set to an atmospheric pressure so as to suppress evaporation of zinc oxide having a high vapor pressure.

[0065] After an oxide sintered body is obtained as above, (f) processing.fwdarw.(g) bonding are performed in a conventional manner, as a result, the sputtering target of the present invention is obtained. The processing method for the oxide sintered body is not particularly limited, and the oxide sintered body may be processed into a shape according to various uses by a known method.

[0066] The sputtering target can be obtained by bonding the processed oxide sintered body to a backing plate by use of a bonding material. The type of the material of the backing plate is not particularly limited, but pure copper or copper alloy having excellent thermal conductivity is preferred. The type of the bonding material is also not particularly limited, and various known bonding materials having electrical conductivity can be used. Examples thereof include an In-based solder material and an Sn-based solder material.

[0067] The bonding method is also not particularly limited and may be, for example, a method in which the oxide sintered body and the backing plate are melted by heating at a temperature causing melting of the bonding material, for example, at approximately from 140 to 220 C., the molten bonding material is applied to the bonding surface of the backing plate, respective bonding surfaces are stuck together, and both are pressure-bonded and then cooled.

[0068] In the sputtering target obtained using the oxide sintered body of the present invention, cracking due to a stress, etc. developed by shock, heat history, etc. during the bonding operation does not occur. The resistivity is also very good and is preferably 1 .Math.cm or less, more preferably 10.sup.1 .Math.cm or less, still more preferably 10.sup.2 .Math.cm or less.

[0069] When the sputtering target of the present invention is used, deposition in which the abnormal electrical discharge during sputtering and the cracking of the sputtering target material are more suppressed can be achieved, and physical vapor deposition (sputtering method) using the sputtering target can be efficiently performed in the production line of a display device. In addition, the oxide semiconductor thin film obtained also exhibits good TFT properties.

EXAMPLES

[0070] The present invention is more specifically described below by referring to Examples and Comparative Examples, but the present invention is not limited to the following Examples and can also be implemented by making changes within the range conformable to the gist, and all of these changes are encompassed by the technical scope of the present invention.

(Preparation of Sputtering Target)

[0071] An indium oxide powder (In.sub.2O.sub.3) having a purity of 99.99%, a zinc oxide powder (ZnO) having a purity of 99.99%, a gallium oxide powder (Ga.sub.2O.sub.3) having a purity of 99.99% and a tin oxide powder (SnO.sub.2) having a purity of 99.99% were blended at a ratio shown in Table 1, and water and a dispersant (ammonium polycarboxylate) were added thereto, followed by mixing in a zirconia ball mill for 24 hours. Then, the mixed powder obtained in the step above was dried and granulated.

[0072] The thus-obtained powder was preformed by die pressing (forming pressure: 1.0 tonf/cm.sup.2, size of compact: 110t 13 mm, t is the thickness) and then subjected to main forming at a forming pressure of 3.0 tonf/cm.sup.2 by CIP (cold isostatic pressing).

[0073] The compact obtained in this way was allowed to rise in temperature to 500 C. at normal pressure in an air atmosphere and held at that temperature for 5 hours to effect degreasing. The compact after degreasing was set in a sintering furnace and sintered.

[0074] The resulting sintered body was machined to a finished dimension of 100t5 mm and bonded to a Cu-made backing plate to prepare a sputtering target.

(Average Grain Size)

[0075] With respect to each of Examples and Comparative Examples, the Average Grain Size (m) in Table 1 was measured as follows.

[0076] First, the oxide sintered body was broken down, and its fracture surface (an arbitrary position on a section surface when the oxide sintered body was cut at an arbitrary position in the thickness direction) was mirror-polished to prepare a sample. Next, a photograph of the structure thereof was taken at a magnification of 400 times by using a scanning electron microscope (SEM); a straight line having a length of 100 m was drawn in an arbitrary direction; the number (N) of grains included within the straight line was determined; and the value calculated from [100/N] was taken as grain size on straight line. Similarly, 20 straight lines were drawn at such intervals as keeping coarse grains from overlapping with each other (at intervals of at least 20 m or more), and the grain sizes on individual straight lines were calculated. Then, the value calculated from [the sum of grain sizes on individual straight lines/20] was taken as average grain size of oxide sintered body.

(Cracking at the Time of Bonding)

[0077] With respect to each of Examples and Comparative Examples, the presence or absence of Cracking at the Time of Bonding in Table 1 was measured as follows.

[0078] First, the sintered body was processed into a shape of 4 inches in diameter and 5 mm in thickness and bonded to a backing plate to obtain a sputtering target. At this time, the sintered body and backing plate were allowed to rise in temperature on a hot plate up to 180 C. over 20 minutes, and the bonding operation was performed using a wetting material (In metal). After the bonding operation, whether or not cracking occurred on the oxide sintered body surface was confirmed with an eye. When a crack exceeding 1 mm was observed on the oxide sintered body surface, cracking was judged to be present. The bonding operation was performed 10 times, and when cracking occurred even only once, the sample was evaluated as failed and indicated by present in Table 1. On the other hand, when cracking did not occur even once out of 10 times, the sample was evaluated as passed and indicated by none in Table 1.

(Peak Intensity Ratios of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 Phase, ZnGa.sub.2O.sub.4 Phase and InGaZnO.sub.4 Phase)

[0079] With respect to each of Examples and Comparative Examples, the Peak Intensity Ratios of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 Phase, ZnGa.sub.2O.sub.4 Phase and InGaZnO.sub.4 Phase in Table 1 were measured as follows.

[0080] First, the sputtering target obtained by sputtering was removed from the backing plate, and a test piece of 10 mm square was cut out therefrom and subjected to the following X-ray diffraction to determine the X-ray diffraction pattern of each oxide sintered body. Analyzer: X-ray Diffractometer RINT-TTR-III manufactured by Rigaku Corporation Analysis Conditions:

[0081] Target: Cu

[0082] Monochromatization: Use of monochromator (K)

[0083] Target output: 40 kV-200 mA

[0084] (Continuous Measurement) /2 Scanning

[0085] Slits: Divergence: 1/2, Scattering: 1/2, Receiving: 0.15 mm

[0086] Monochromator receiving slit: 0.6 mm

[0087] Scanning speed: 2/min

[0088] Sampling interval: 0.02

[0089] Measurement angle (2): 5 to 90

[0090] As an example, FIG. 1 shows a graph (X-ray diffraction chart) illustrating X-ray diffraction results for the oxide sintered body of Example 2. From the thus-obtained X-ray diffraction chart of each oxide sintered body, respective compound phases (crystal phases) were identified based on the above-described ICSD cards and measured for the diffraction peak intensity (height of diffraction peak) shown in Table 2. As for the peak, among the compound phases, a peak having a high diffraction peak intensity and having as little overlapping with the peaks of other compound phases as possible was selected. In addition, even when a crystal phase other than the crystal phases shown in Table 2 was present, one peak having as little overlapping as possible was selected per crystal phase, and the diffraction peak intensity (height of diffraction peak) was measured.

[0091] The measured values of the peak height at a designated peak in individual compound phases are denoted respectively by I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16), I(ZnGa.sub.2O.sub.4), I(InGaZnO.sub.4) and I(other crystal phases) (I means that it is the measured value of X-ray diffraction intensity (diffraction peak intensity)). The total of the peak intensity ratio of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, the peak intensity ratio of ZnGa.sub.2O.sub.4 phase and the peak intensity ratio of InGaZnO.sub.4 phase, i.e., [Ga.sub.2In.sub.6Sn.sub.2O.sub.16]+[ZnGa.sub.2O.sub.4]+[InGaZnO.sub.4], was determined according to the following expressions.

[0092] [Ga.sub.2In.sub.6Sn.sub.2O.sub.16]I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases))

[0093] [ZnGa.sub.2O.sub.4]=I(ZnGa.sub.2O.sub.4)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases))

[0094] [InGaZnO.sub.4]=I(InGaZnO.sub.4)/(I(Ga.sub.2In.sub.6Sn.sub.2O.sub.16)+I(ZnGa.sub.2O.sub.4)+I(InGaZnO.sub.4)+I(other crystal phases))

[0095] Peaks of compound phases other than those described above were hardly observed.

[0096] In this Example, when the thus-obtained [Ga.sub.2In.sub.6Sn.sub.2O.sub.16]+[ZnGa.sub.2O.sub.4]+[InGaZnO.sub.4] was 0.9 or more, the sample was evaluated as passed.

(Confirmation that Sn is Segregated)

[0097] With respect to each of Examples, in order to confirm that Sn was segregated (Sn was preferentially dissolved in Ga.sub.2In.sub.6Sn.sub.2O.sub.16), the oxide sintered bodies of Examples 1 to 3 were subjected to element mapping of the Sn distribution by means of EPMA. The measurement conditions of EPMA are as follows:

Analyzer: JXA-8900RL manufactured by JEOL Ltd.

Analysis Conditions:

[0098] Accelerating voltage: 15.0 kV

[0099] Irradiation current: 1.99810.sup.8

[0100] Beam diameter: minimum (0 m)

[0101] Measurement time: 100.00 ms

[0102] Number of measurement points: 250250

[0103] Measurement interval: X 0.40 m, Y 0.40 m

[0104] Measurement area: 400 m400 m

[0105] Number of measurement visual fields: 1 visual field

[0106] As an example, FIG. 2A and FIG. 2B illustrate the results of element mapping for the oxide sintered body of Example 2. First, a color scale is depicted in right side of FIG. 2A and FIG. 2B, and CP in the top-left photograph of FIG. 2A means a reflected electron image. FIG. 2A illustrates the results of CP, O (oxygen), Ga, and Sn, and FIG. 2B illustrates the results of Zn and In. Furthermore, in FIG. 2A, assuming Level of Sn at a point exhibiting a maximum Sn concentration is 500 and Level of Sn at a point not containing Sn is 20, the Sn concentration at each point is expressed by a relative value to the maximum concentration, i.e., Level: 500. And, the abundance ratio of each Level is denoted by the area ratio (Area %).

[0107] Referring to the results of Sn in FIG. 2A, it is seen that each Sn concentration is present in the crystal phase over the entirety from Level: 20 to Level: 500. More specifically, it is understood that Sn is segregated in the crystal phase.

[0108] Furthermore, comparing the results of Sn in FIG. 2A with the results of Zn in FIG. 2B, Zn is hardly present in the region where Sn is present at a high concentration, and on the other hand, Sn is hardly present in the region where Zn is present at a high concentration. More specifically, as illustrated in the X-ray diffraction results above, it is understood that Sn is segregated in Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase not containing Zn as an element, and it is understood that Sn is hardly contained in ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase each containing Zn as an element (that is, Sn is hardly solid-dissolved).

[0109] It could be confirmed that similarly to the results of Example 2, Sn is segregated also in Examples other than Example 2. These could verify that the oxide sintered body according to the present invention constitutes crystal phases of Ga.sub.2In.sub.6Sn.sub.2O.sub.16 phase, ZnGa.sub.2O.sub.4 phase and InGaZnO.sub.4 phase as revealed by the X-ray diffraction results above and Sn is segregated as revealed by the EPMA results above.

TABLE-US-00001 TABLE 1 Peak Intensity Composition of Oxide Sintered Body Ratios of (atomic %) Average Cracking Ga.sub.2In.sub.6Sn.sub.2O.sub.16, [Ga]/ Grain at the Time ZnGa.sub.2O.sub.4 and [In] [Ga] [Zn] [Sn] ([In] + [Zn]) Size (m) of Bonding InGaZnO.sub.4 Example 1 20.8 46.8 28.9 3.5 0.94 7 none 1.00 Example 2 21.8 43.2 27.1 7.9 0.88 5 none 1.00 Example 3 20.9 38.7 33.5 6.9 0.71 8 none 0.96 Comparative 25.6 35.3 28.8 10.3 0.64 13 present 0.72 Example 1 Comparative 24.3 33.1 29.6 13.0 0.61 11 present 0.59 Example 2 Comparative 21.1 38.2 23.4 17.3 0.86 34 present 0.68 Example 3

TABLE-US-00002 TABLE 2 Reference ICSD Index of Peak Crystal Phase Card No. Measured (h k l) Ga.sub.2In.sub.6Sn.sub.2O.sub.16 01-089-7011 (3 1 2) ZnGa.sub.2O.sub.4 00-038-1240 (3 1 1) InGaZnO.sub.4 01-070-3625 (1 0 1)

[0110] While the invention has been described in detail and with reference to specific embodiments thereof, it will be apparent to one skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention. This application is based on Japanese Patent Application (Patent Application No. 2017-098732) filed on May 18, 2017 and Patent Application (Patent Application No. 2018-002051) filed on Jan. 10, 2018, the entirety of which is incorporated herein by way of reference.