Test Apparatus and Method for Synthetically Testing at Least One Switch Device for a High-Voltage Battery of a Vehicle

Abstract

A test apparatus for testing at least one switch device for a high-voltage battery of a vehicle, includes a voltage source for generating an electrical test voltage between a positive high-voltage path and a negative high-voltage path of the at least one switch device. The test apparatus has a first connecting device and a first current source for feeding a first electrical test current into the positive high-voltage path, wherein the first connecting device, the first current source and the positive high-voltage path together form a first circuit when testing the at least one switch device. The test apparatus has a second connecting device and a second current source for feeding a second electrical test current into the negative high-voltage path, wherein the second connecting device, the second current source and the negative high-voltage path together form a second circuit when testing the at least one switch device.

Claims

1.-11. (canceled)

12. A test apparatus for testing at least one switch device for a high-voltage battery of a vehicle, comprising: a voltage source for generating an electrical test voltage between a positive high-voltage path and a negative high-voltage path of the at least one switch device; a first connecting device and a first current source for feeding a first electrical test current into the positive high-voltage path, wherein the first connecting device, the first current source and the positive high-voltage path together form a first circuit when testing the at least one switch device, and a second connecting device and a second current source for feeding a second electrical test current into the negative high-voltage path, wherein the second connecting device, the second current source and the negative high-voltage path together form a second circuit when testing the at least one switch device.

13. The test apparatus according to claim 11, further comprising: a third connecting device, wherein the voltage source, the third connecting device and an insulating device of the switch device between the positive high-voltage path and the negative high-voltage path form a third circuit.

14. The test apparatus according to claim 12, further comprising: at least one isolating device for galvanically isolating the voltage source, the first current source and/or the second current source from an electrical supply network.

15. The test apparatus according to claim 12, further comprising: a control device for independently activating the voltage source, the first current source and/or the second current source.

16. The test apparatus according to claim 12, wherein the electrical test voltage generated by the voltage source is greater than 100 volts, and a current intensity of the test current provided by the first current source and/or the second current source is greater than 100 amperes,

17. The test apparatus according to claim 12, wherein the electrical test voltage generated by the voltage source is greater than 250 volts, and a current intensity of the test current provided by the first current source and/or the second current source is greater than 200 amperes.

18. The test apparatus according to claim 12, wherein the first circuit and/or the second circuit has at least two branches for respective inputs and/or outputs of the switch device.

19. The test apparatus according to claim 12, wherein when testing at least two switch devices electrically connected in series, the respective positive high-voltage paths are part of the first circuit and the respective negative high-voltage paths are part of the second circuit.

20. The test apparatus according to claim 12, wherein the voltage source, the first current source and/or the second current source are arranged in a common housing.

21. The test apparatus according to claim 12, wherein the voltage source, the first current source and/or the second current source are respectively arranged in separate housings.

22. An arrangement, comprising: a test apparatus according to claim 12; and at least one switch device.

23. A method for testing at least one switch device for a high-voltage battery of a vehicle, in which an electrical test voltage between a positive high-voltage path and a negative high-voltage path of the at least one switch device is generated by way of a voltage source, the method comprising: feeding a first electrical test current into the positive high-voltage path by way of a first current source, wherein a first connecting device, the first current source and the positive high-voltage path together form a first circuit when testing the at least one switch device; and feeding a second electrical test current into the negative high-voltage path by way of a second current source, wherein a second connecting device, the second current source and the negative high-voltage path together form a second circuit when testing the at least one switch device.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0024] FIG. 1 is a schematic representation of a high-voltage battery for a vehicle, which comprises a switch device.

[0025] FIG. 2 is an arrangement with the switch device and also a test apparatus for testing the switch device according to the prior art.

[0026] FIG. 3 is an arrangement of a test apparatus according to a first embodiment.

[0027] FIG. 4 is an arrangement with a test apparatus according to a further embodiment, wherein the switch device has a number of outputs.

[0028] FIG. 5 is an arrangement according to a further embodiment, in which the switch devices are electrically connected in series.

[0029] In the figures, elements that are the same or functionally the same are provided with the same designations.

DETAILED DESCRIPTION OF THE DRAWINGS

[0030] FIG. 1 shows in a schematic representation a high-voltage battery 1 for a vehicle. The high-voltage battery 1 may be used in particular as a traction battery and supply a drive motor of the vehicle with electrical energy. The high-voltage battery 1 comprises a plurality of battery cells 2, which are electrically connected in series. In addition, the high-voltage battery 1 comprises a switch device 3, which is electrically connected to the battery cells 2. The switch device 3 has a positive high-voltage path HV+, which connects a first input 4a and a first output 5a. Moreover, the switch device 3 has a negative high-voltage path HV, which connects a second input 4b to a second output 5b. The respective high-voltage paths HV+ and HV have in each case a switching element 6, which may be formed as a relay, switch, pyrotechnic isolating switch or the like. Furthermore, a fuse S is provided in the positive high-voltage path HV+. The high-voltage paths HV+ and HV are each intrinsically formed with low impedance (when the switching elements 6 are closed). For example, the respective high-voltage paths HV+ and HV have in each case a resistance of between 0.5 and 10 milliohms. The high-voltage paths HV+ and HV are isolated with high impedance in the switch device 3 by an insulating device 7. This insulating device 7 has an insulating resistance, which may typically be several megaohms to several gigaohms. Connected parallel to the insulating resistance may also be a very high measuring resistance, which serves for measuring the electrical voltage. The first output 5a of the switch device 3 is connected to a positive terminal 8a of the high-voltage battery 1 and the second output 5b is connected to a negative terminal 8b of the high-voltage battery 1.

[0031] FIG. 2 shows an arrangement 9, which has the switch device 3 and also a test apparatus 10 according to the prior art, wherein the test apparatus 10 serves for testing the switch device 3. If the switch device 3 is to be tested alone, but under the full electrical voltage and with the full electrical current, an electrical high-power source 11 that can simultaneously generate a high electrical current I and a high electrical test voltage U is used instead of the battery cells 2. This high-voltage source 11 is connected to the inputs 4a, 4b of the switch device 3. Connected to the outputs 5a, 5b is an electronic load 12 or high-power load, which can then also take up the high electrical power output. In this setup or this arrangement 9 according to the prior art, the high-power source 11 and the load 12 are designed for a high electrical power output. This gives rise to the disadvantage that high costs are produced.

[0032] FIG. 3 shows an arrangement 9 with a switch device 3 and a test apparatus 10 according to a first embodiment. Also with this test apparatus 10, a high-current and high-voltage test of the switch device 3 can be carried out, but without a high power source 11 and a load 12. The test apparatus 10 comprises a first current source 13, by means of which a first test current I.sub.1 can be fed into the positive high-voltage path HV+ of the switch device 3. Furthermore, the test apparatus 9 comprises a first connecting device 14, by means of which the first current source 13 and the positive high-voltage path HV+ can be electrically connected to one another. In the testing of the switch device 3 or in the connecting as intended of the test apparatus 10 to the switch device 3, the first current source 13, the first connecting device 14 and the positive high-voltage path HV+ form a first circuit 15. In addition, the test apparatus 9 comprises a second current source 16, by means of which a second test current I.sub.2 can be fed into the negative high-voltage path HV of the switch device 3. Furthermore, the test apparatus 9 comprises a second connecting device 17 for electrically connecting the second current source 16 to the negative high-voltage path HV. The second current source 16, the second connecting device 17 and also the negative high-voltage path HV together form a second circuit 18. Furthermore, the test apparatus 9 comprises a voltage source 19, which is connected by way of a third connecting device 20 to the positive high-voltage path HV+ and the negative high-voltage path HV. With the voltage source 19, the test voltage U can be applied to the isolating device 7 or between the positive high-voltage path HV+ and the negative high-voltage path HV. In this case, the voltage source 19, the third connecting device 20 and the isolating device 7 form a third circuit 21. The respective connecting devices 14, 17 and 20 may for example be provided by corresponding connecting lines, cables and/or plug-in connectors.

[0033] In the present case, the current sources 13, 16 and also the voltage source 19 are isolated from one another, so that only low electrical power outputs have to be implemented. In this case, the previously described three separate circuits are produced, to be specific the first circuit 15, the second circuit 18 and the third circuit 21. With the first current source 13 and the second current source 16, high electrical test currents I.sub.1 and I.sub.2 are generated, but in each case only low electrical voltages, because they each only have to separately handle a small electrical resistance of the positive high-voltage path HV+ and of the negative high-voltage path HV. The voltage source 19 provides the high electrical test voltage U, but only generates a very low electrical current, which flows over the high insulating resistance of the insulating device 7. Consequently, none of the current sources 13, 16 nor the voltage source 19 has to have a high power output, because none of the sources 13, 16, 19 has to generate high electrical voltages and a high electrical current simultaneously.

[0034] In addition, the test apparatus 9 comprises a control device 22, which is connected to the first current source 13, the second current source 16 and also the voltage source 19. By means of the control device 22, for example, control signals can be transmitted to the sources 13, 16 and 19. The sources 13, 16, 19 may be controlled by the control device 22, by the transmission of the control signals, in such a way that the test voltage U of the voltage source 19 and the respective current intensities of the test currents I.sub.1 and I.sub.2 of the current sources 13, 16 can be set. In this way, the behavior of an actual load can be replicated, that is to say the relationship of the electrical test currents I.sub.1, I.sub.2 and electrical test voltage U corresponds to reality. Furthermore, it is provided that the test apparatus 9 has at least one isolating device (not represented here) for galvanically isolating the sources 13, 16, 19 from an electrical supply network. This isolation may be incorporated in the respective source 13, 16, 19 or be provided with the aid of an isolating transformer.

[0035] The test apparatus 9 results in much lower costs, because the respective sources 13, 16, 19 do not have to provide a high electrical power output. However, the sources 13, 16, 19 allow the switch device 3 to be operated in a realistic way with the switching elements 6 closed. This can be used particularly for long-lasting endurance tests. If, for example, a system is tested with a test voltage of 500 volts and a test current of 400 amperes, the electrical power output in a setup or an arrangement 9 according to the prior art is 500 volts400 amperes=200 kilowatts. In the proposed test setup, assuming an electrical resistance in the positive high-voltage path HV+ and the negative high-voltage path HV of in each case 2 milliohms and an insulating resistance of the insulating device 7 of 1 megaohm, the power output of the three sources 13, 16, 19 is in total: 2400 amperes400 amperes2 milliohms+500 volts500 volts/1 megaohm=0.64025 kilowatt. Consequently, an electrical power output that is over 300 times smaller than in the case of a setup according to the prior art is required.

[0036] FIG. 4 shows an arrangement 9 according to a further embodiment. In this case, the switch device 3 has two first outputs 5a and 5a. Furthermore, the switch device 3 has two second outputs 5b and 5b. In the first circuit 15, the respective outputs 5a and 5a are assigned respective branches 23 and 24. In the first branch 23, which is assigned to the output 5a, a first resistance R1 is provided. In a second branch 24, which is assigned to the second output 5a, a second resistance R2 is provided. In the second circuit 18, two branches 23, 24 are likewise provided for the respective outputs 5b and 5b. Here, too, the first resistance R1 is arranged in a first branch 23, which is connected to the output 5b, and the second resistance R2 is arranged in the second branch 24, which is connected to the output 5b. The resistances R1, R2 allow the respective test current I.sub.1, I.sub.2 to be divided among the respective outputs 5a, 5a, 5b, 5b. If the switch device 3 has a number of inputs, corresponding branches may be provided for them.

[0037] In many tests it is necessary that a number of switch devices 3 are tested. For this purpose, a number of switch devices 3 may be electrically connected in series. This is represented by way of example in FIG. 5, which shows an arrangement 9 in which two switch devices 3 are electrically connected in series. Here, the respective positive high-voltage paths HV+ of the respective switch devices 3 are assigned to the first circuit. Furthermore, the respective negative high-voltage paths HV of the switch devices 3 are assigned to the second circuit 18. The test voltage U provided by the voltage source 19 is present at the respective insulating devices 7 or insulating resistances.

LIST OF REFERENCE SIGNS

[0038] 1 High-voltage battery [0039] 2 Battery cell [0040] 3 Switch device [0041] 4a Input [0042] 4b Input [0043] 5a Output [0044] 5a Output [0045] 5b Output [0046] 5b Output [0047] 6 Switching element [0048] 7 Insulating device [0049] 8a Terminal [0050] 8b Terminal [0051] 9 Arrangement [0052] 10 Test apparatus [0053] 11 High power source [0054] 12 Load [0055] 13 First current source [0056] 14 First connecting device [0057] 15 First circuit [0058] 16 Second current source [0059] 17 Second connecting device [0060] 18 Second circuit [0061] 19 Voltage source [0062] 20 Third connecting device [0063] 21 Third circuit [0064] 22 Control device [0065] 23 Path [0066] 24 Path [0067] HV+ Positive high-voltage path [0068] HV Negative high-voltage path [0069] I Electrical current [0070] I1 First test current [0071] I2 Second test current [0072] R1 Resistance [0073] R2 Resistance [0074] S Fuse [0075] U Test voltage