APPARATUS FOR MEASURING A STRUCTURE AND ASSOCIATED METHOD
20210072023 ยท 2021-03-11
Assignee
Inventors
Cpc classification
G01N29/221
PHYSICS
G01N2291/0258
PHYSICS
E02D17/04
FIXED CONSTRUCTIONS
H04N7/18
ELECTRICITY
G01S15/86
PHYSICS
G01B21/20
PHYSICS
G01C15/00
PHYSICS
International classification
Abstract
A measuring apparatus for measuring a structure comprises at least one measurement sensor configured to measure the structure, a bearing platform configured to carry the at least one measurement sensor and a control. The control is configured to specify at least one quality reference value for at least one characteristic of measurement quality, and further configured to adjust one or more parameters of the measuring apparatus which influence the at least one characteristic of measurement quality. An actual quality value is determined and approaches the at least one quality reference value as the one or more parameters are adjusted.
Claims
1. A method for measuring a structure to assess for damage and monitor construction, the method comprising: providing a measuring apparatus configured to move along the structure, the measuring apparatus comprising, at least one measurement sensor, and a bearing platform configured to carry the at least one measurement sensor; measuring the structure using the at least one measurement sensor; determining one or more parameters of the measuring apparatus; specifying at least one quality reference value for at least one quality characteristic, wherein the at least one quality reference value indicates a desired level of quality for the measuring of the structure; and adjusting the one or more parameters during the measuring to achieve the at least one specified quality reference value, wherein the one or more parameters influence the at least one quality characteristic.
2. The method according to claim 1, wherein the at least one quality characteristic comprises at least one of accuracy, precision, resolution, reliability, completeness, reproducibility of structural data of the structure acquired by measurement, and time required for completion of the measurement.
3. The method according to claim 1, wherein the at least one measurement sensor is configured to automatically regulate the one or more parameters relative to the structure and is positioned relative to the structure.
4. The method according to claim 1, wherein the one or more parameters influencing the at least one quality characteristic comprises at least one of position of the at least one measurement sensor with respect to the structure, spacing between the at least one measurement sensor and the structure, height position of the at least one measurement sensor relative to the structure, orientation of the at least one measurement sensor with respect to the structure, drift of the bearing platform, orientation of the bearing platform, operational speed of the bearing platform, acceleration of the bearing platform, scan rate of the at least one measurement sensor, and measurement frequency of the at least one measurement sensor.
5. The method according to claim 4, wherein the at least one measurement sensor is configured to be adjusted relative to the bearing platform.
6. The method according to claim 5, wherein the at least one measurement sensor is configured to rotate relative to the bearing platform around at least one axis of rotation.
7. The method according to claim 6, wherein the at least one measurement sensor is configured to be adjusted in height and in a lateral direction in a translatory manner relative to the structure and relative to the bearing platform, and wherein the bearing platform further comprises a drive configured to move the bearing platform toward and away from the structure.
8. The method according to claim 7, wherein the at least one measurement sensor emits one of electromagnetic radiation and soundwaves, and wherein the at least one measuring sensor is orientated with respect to the structure such that the one of radiation and soundwaves emitted by the sensor strike a surface of the structure at a 90 angle.
9. The method according to claim 8, wherein during the measurement of the structure, a position of the measuring apparatus is determined and assigned to structural data recorded during measurement.
10. The method according to claim 1, wherein the structure is measured multiple times and a structural change is determined by comparing the multiple measurements.
11. The method according to claim 1, wherein the at least one quality reference value is used for planning a route.
12. The method according to claim 11, wherein the planned route includes specifications for one or more control variables, wherein the one or more control variables comprise at least one of trajectory of the bearing platform, operational speed of the bearing platform, acceleration of the bearing platform, orientation of the at least one measurement sensor with respect to the structure, a control variable related to a material and a control variable which accounts for a surface of the structure.
13. The method according to claim 11, wherein the rout planning comprises subdividing an area of movement for the bearing platform which surrounds the structure into sectors of various measurement quality, wherein the planned route is placed through the sectors which achieve at least the specified quality reference value.
14. A method for measuring a structure using a measuring apparatus moving along the structure to be measured, the method comprising: measuring the structure using at least one measurement sensor of the measuring apparatus; providing at least one quality reference value for at least one characteristic of measurement quality; determining one or more parameters of the measuring apparatus, wherein the one or more parameters influence the at least one characteristic of measurement quality; determining an actual quality value based on the one or more parameters; and regulating the one or more parameters so the determined actual quality value approaches the at least one quality reference value.
15. A measuring apparatus for measuring a structure, the measuring apparatus comprising: at least one measurement sensor configured to measure the structure; a bearing platform configured to carry the at least one measurement sensor; and a control configured to specify at least one quality reference value for at least one characteristic of measurement quality and to adjust one or more parameters of the measuring apparatus which influence the at least one characteristic of measurement quality, wherein an actual quality value is determined and approaches the at least one quality reference value as the one or more parameters are adjusted.
16. The measuring apparatus according to claim 15, wherein the bearing platform is moved by one of a land vehicle, a watercraft, and an aircraft.
17. The measuring apparatus according to claim 15, wherein the at least one measurement sensor comprises at least one of a laser scanner, a camera, an echo sounder, a multi-beam sensor, and a side-scan sonar.
18. The measuring apparatus according to claim 15, further comprising at least one locating unit configured to determine a position of the measuring apparatus.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0033] One embodiment of the invention is explained below using figures below where:
[0034]
[0035]
[0036]
[0037]
[0038] If not otherwise specified, the same reference numbers indicate the same objects below.
DETAILED DESCRIPTION OF THE INVENTION
[0039]
[0040]
[0041] The specified trajectory 30 was defined as part of planning the route. This trajectory was defined based on a preferred level of quality to achieve for the measurement. This level of quality is influenced by multiple quality characteristics, with a quality reference value having been specified for at least one of the quality characteristics. The distance of one or more of the measurement sensors 14, 16, 18 with respect to the bulkhead 28 is included particularly for this in planning the route and thus the trajectory as a parameter influencing measurement quality. Here a distance of the measuring apparatus and thus of the respective sensors from the bulkhead 28 is regulated during the run of the measuring apparatus 10 along the bulkhead such that the quality reference value is achieved. The measuring apparatus 10 is maintained at a predefined distance with respect to the bulkhead 28 along the specified trajectory 30. Ultimately, compliance with the planned route is regulated in this way. Thus the actual trajectory 32 which is in fact followed by the measuring apparatus 10 can be kept as close as possible to the specified trajectory 30.
[0042] Particularly reliable and reproducible measurement is accomplished by maintaining this trajectory and thus the specified parameters. In particular, quality assured recording of the structure can be ensured this way. For this, and influence function which describes the influence of the parameter on quality is defined for each of the parameters.
[0043] Additional parameters can be incorporated in route planning. In particular, these parameters can also be regulated in the inventive manner such that the quality reference value is achieved. Along with the distance of the sensors and thus of the measuring apparatus from the bulkhead as already described, this can also be the orientation of the sensors with respect to the bulkhead. For instance, the speed or acceleration of the bearing platform and orientation of the bearing platform can also comprise such parameters. Specified values are defined initially for the parameters to be regulated based on empirical values or estimated values. Referring to
[0044] For example, as already mentioned, the distance of the measuring apparatus with respect to the bulkhead and the orientation of the measurement sensors with respect to the bulkhead can be incorporated as parameters influencing quality. In defining the trajectory, the attempt is made to achieve the highest possible total quality, for example to achieve a specified quality or a highest possible quality. Since the objective of this is to achieve a particular quality overall via all parameters, it can be expedient, at least in sections, to specify a reference value for one of the parameters which is rather suboptimal insofar as this allows an optimal reference value to be specified for another parameter. For example, by varying the distance of the measuring apparatus with respect to the structure along the trajectory as shown in
[0045] In accordance with the invention, these parameters can be regulated during the measurement run such that the specified quality reference value is achieved. For example, a resolution of 2 cm on the bulkhead 28 can be specified as a quality reference value. Then the quality characteristic is therefore the resolution of the structural data. This resolution can be achieved up to a maximum spacing of 5 m, for example, between measurement sensor 18 and bulkhead 28, but at a greater distance that can no longer be ensured in some circumstances. If, for example, the bearing platform 12 were to drift farther than 5 m from the bulkhead 28 due to wind and current, the bearing platform 12 can be brought closer to the bulkhead 28 again by changing the azimuthal direction angle, doing so in fact until the resolution of 2 cm or better is once again achieved. Thus the distance between bulkhead 28 and measurement sensor 18 can be regulated such that the quality reference value is achieved.
[0046] A structure to be investigated can also be scanned in multiple runs. As seen in