Methodology for measuring dielectric and magnetic material properties
20210088568 ยท 2021-03-25
Assignee
Inventors
Cpc classification
H01P11/003
ELECTRICITY
G01R27/28
PHYSICS
International classification
G01R27/28
PHYSICS
G01R27/26
PHYSICS
Abstract
A methodology for measuring the dielectric and magnetic properties of materials is provided. The method comprises a multi-section transmission line (TL) and multi-section fluidic channels. Two of the TL sections are incorporated with channel sections. The length-ratio of the two line-channel sections (LCS) is L:L. A network analyzer coupled to the TL can be configured to measure scattering parameters when the LCS have no material-under-measurement (MUM), one LCS has MUM, both LCSs have MUM. Then, the S-parameters are transformed to ABCD matrices. When L:L is 2:1, the propagation constant of the LCSs can be calculated with analytical formulas over the measured frequency range. When L:L is not 2:1, the propagation constant can be obtained with numerical root-searching algorithms. The properties of MUM can be extracted by use of models which relate the propagation constants with the given geometry and substrate of LCSs as well as the unknown MUM properties.
Claims
1. A method for measuring dielectric and magnetic material properties, the method comprising forming a transmission line comprising a plurality of sections, the sections are cascaded sequentially; forming a fluidic channel comprising a plurality of sections, the sections are cascaded sequentially; forming two line-channel sections, each section comprising a transmission line section and a fluidic channel section, the length ratio of the two transmission line sections is 2:1; measuring a plurality of scattering parameters of the transmission line at the desired frequencies by use of a network analyzer when the two line-channel sections are empty, one line-channel is filled with material, and the two line-channel sections are filled with materials; extracting propagation constants of the line-channel sections from measured scattering parameters by use of analytical formulas; extracting material properties from the extracted propagation constants by use of models that relate the propagation constants to line-channel geometry, dimension, substrate material property and the dielectric and magnetic material properties.
2. The method of claim 1 wherein one or more fluidic channel sections comprise a microfluidic channel or a nanofluidic channel.
3. The method of claim 1 wherein the two line-channel sections are connected with external tubing.
4. The method of claim 1 wherein the two line-channel sections are connected with separate material injectors.
5. The method of claim 1 wherein the transmission line is a coplanar waveguide or a microstrip line.
6. The method of claim 1 wherein the transmission line comprises coating films.
7. The method of claim 1 wherein the channels of the line-channel sections are formed in transmission line substrate or surface.
8. The method of claim 1 wherein a transmitter and a receiver are configured to measure the scattering parameters.
9. A method of claim 1 wherein the length ratio of the two transmission line sections is not 2:1 and the propagation constant of the line-channel sections can be obtained with numerical root-searching algorithms.
Description
(3) BRIEF DESCRIPTION OF THE DRAWINGS
[0006] A full and enabling disclosure of the present invention, including the best mode thereof, directed to one of ordinary skill in the art, is set forth in the specification, which makes reference to the appended figures, in which:
[0007]
[0008]
[0009]
[0010]
[0011]
[0012]
[0013]
[0014]
[0015]
[0016]
[0017]
[0018]
[0019] Repeat use of reference characters throughout the present specification and appended drawings is intended to represent same or analogous features or elements of the invention.
(4) DETAILED DESCRIPTION OF THE INVENTION
[0020] Reference now will be made in detail to embodiments of the invention, one or more examples of which are illustrated in the drawings. Each example is provided by way of explanation of the invention, not limitation of the invention. In fact, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the scope or spirit of the invention. For instance, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Thus, it is intended that the present invention covers such modifications and variations as come within the scope of the appended claims and their equivalents.
[0021] Generally, the present application relates to automatic and self-calibration of devices for quantitative material measurement. The device described herein simultaneously addresses the need for calibration standards or reference material and the uncertainty of multiple connections. In actual embodiment, the transmission line does not need to be straight. Any type of transmission lines, including waveguides, can be used. The materials to be measured can be solid, such as thin films, gas, such as volatile organic chemicals (VOC, which can be absorbed with polymers for stronger signals), and liquids, including liquids with suspended particle.
[0022] In operation, a vector network analyzer (VNA) can be configured to measure the four scattering parameters or S-parameters (S.sub.11, S.sub.12, S.sub.21, S.sub.22), under three different states: there is no material-under-measurement (MUM, e.g. liquid), there is MUM on one transmission line section, and there is MUM on both transmission line sections. Then, the S-parameters are transformed to ABCD matrices. After processing the ABCD matrices, the propagation constant of the MUM line section can be calculated with analytical formulas when the length ratio of the two line-channel sections is 2:1 (or 1:2). When the ratio is not 2:1, numerical root-searching algorithms can be used to obtain the propagation constant of the MUM line section. The use of two line-channel sections, instead of one, can facilitate the searching process. Finally, the permittivity or permeability of MUM can be extracted by use of geometry and material specific models.
[0023] Referring to the drawings,
[0024] Full S-parameters for the three states can be recorded in a single-connection measurement while the vector network analyzer performs measurement operations continuously.
[0025] Referring to the drawings,
[0026]
[0027] Referring now to
[0028] Referring now to
[0029] The two TL sections have the same cross section geometry, thus identical propagation constant, .sup.I=.sup.II==+j, and characteristic impedance Z.sup.I=Z.sup.II=Z when air or MUM filled both sections and when MUM is at the same temperature as the system in
M.sub.LeftM.sub.i.sup.IM.sub.CenterM.sub.i.sup.IIM.sub.Right=M.sub.i(2)
[0030] where subscript i denotes one of the three states of sections 202, 206.
[0031] At (700), the measurement procedure for an exemplary embodiment in the present disclosure is demonstrated. The measured scattering parameters of the device in three states are described as the following:
[0032] 1) At (702), both section 202 and section 206 are full of air.
M.sub.LeftM.sub.air.sup.IM.sub.CenterM.sub.air.sup.IIM.sub.Right=M.sub.1(3)
[0033] 2) At (704), section 202 is filled with MUM while section 206 with air.
M.sub.LeftM.sub.liquid.sup.IM.sub.CenterM.sub.air.sup.IIM.sub.Right=M.sub.2(4)
[0034] 3) At (710), both sections 202, 206 are full of MUM.
M.sub.LeftM.sub.liquid.sup.IM.sub.CenterM.sub.liquid.sup.IIM.sub.Right=M.sub.3(5)
[0035] Multiply matrix M.sub.1 (M.sub.2) by the inverse matrix of M.sub.2 (M.sub.3), we obtain:
M.sub.LeftM.sub.air.sup.I(M.sub.liquid).sup.1(M.sub.Left).sup.1=M.sub.1M.sub.2.sup.1(6)
(M.sub.LeftM.sub.liquid.sup.IM.sub.Center)M.sub.air.sup.II(M.sub.liquid.sup.II).sup.1(M.sub.LeftM.sub.liquid.sup.IM.sub.Center).sup.1=M.sub.2M.sub.3.sup.1(7)
[0036] Notice that M.sub.1M.sub.2.sup.1(M.sub.2M.sub.3.sup.1) and M.sub.air.sup.I(M.sub.liquid.sup.I).sup.1(M.sub.air.sup.II(M.sub.liquid.sup.II).sup.1) are similar matrices. According to trace matrix theory, we can obtain:
[0037] For generality, we define the length ratio of section 202 and section 206 is always larger or equal to 1, i.e.
After collecting the S-parameters of the first two states, we need to determine if the length ratio is equal to 2 at (706). For the case
at (708), root-searching algorithm techniques can be used to solve eq. (8) or (9) for .sub.liquid. For the case
at (710), the S-parameters of the third state allows the removal of term
in eqs. (8) and (9) by using the sums of arguments rule of hyperbolic function:
[0038] Since
can be calculated with eq. (13) below when device dimensions and air permittivity are known, eq. (10) can be considered as a quadratic equation of
Then, the transmission-line propagation constants can be obtained from the measured S-parameters in three states with the following formulas at (712):
[0039] where .sup.1 and .sup.2 are two eigenvalue solutions from
They describe and incident and a reflected wave with .sup.1=.sup.2. Furthermore, the physically meaningful propagation constant needs to be identified from .sub.liquid.sup.1,2 and .sub.liquid,2.sup.1,2. Some educated, but often obvious, rules can be exploited from the obtained and || and ||. For a reasonable solution, its .sub.liquid is expected to be larger than .sub.air and have the same sign as .sub.liquid for each frequency.
[0040] With the obtained values, MUM permittivity can be obtained by use of geometry and material specific models at (714). Many of which are available in literature, such as the following one:
[0041] where c is the speed of light in vacuum, .sub.eff is the effective permittivity, .sub.1 is the relative permittivity of MUM, and q and C.sub.0 are constants that can be derived from conformal mapping (CM) or single layer reduction techniques. Conductor loss (.sub.c) can also be considered for better accuracy.
[0042] The equations to calculate from measured S-parameters are applicable to any type of transmission lines even though different transmission lines have different models to extract MUM permittivity from .
[0043] Referring to
[0044] Referring to
[0045] to describe spectrum accuracy, where N is the number of measured frequency points over the spectrum.
[0046] Referring to
[0047] Referring now to
[0048] Experimental Measurement
[0049] A coplanar waveguide (CPW) with two microfluidic channels in
[0050] In embodiment I, where the two channels are not connected together, de-ionized (DI) water, methanol, ethanol and 2-propanol (IPA) from Sigma-Aldrich (US), are measured separately. For each of the sample liquids, the S-parameters of the three states are obtained. Each measurement is repeated three times. The measured data are then processed by use of eqs. (11) and (12) to obtain .sub.liquid. The complex permittivity of the MUM is obtained from eq. (5).
[0051] In embodiment II, where the two microfluidic channels are connected together with a silicone tubing to form a single channel, DI water and IPA are measured in succession. The 100 mm long tubing has a 0.51 mm inner diameter and provides 60s delay time. The obtained S parameters, such as S.sub.21 magnitude, are plotted in
[0052] In addition to measuring material properties, the present methodology has significant applicability in the development of portable, quantitative and fast RF/microwave probes that are easy to operate.
[0053] Such probes can be used to characterize various materials in-situ and on-line for real-time monitoring.
[0054] While the present subject matter has been described in detail with respect to specific embodiments thereof, it will be appreciated that those skilled in the art, upon attaining an understanding of the foregoing may readily produce alterations to, variations of, and equivalents to such embodiments. Accordingly, the scope of the present disclosure is by way of example rather than by way of limitation, and the subject disclosure does not preclude inclusion of such modifications, variations and/or additions to the present subject matter as would be readily apparent to one of ordinary skill in the art.