SYSTEM AND METHOD FOR MINIMIZING THE EFFECTS OF SENSOR ORIENTATION IN SMART OPTICAL MONITORING SYSTEMS

Abstract

A smart additive manufacturing system uses a spectrometer to collect emission spectra along an optical axis from a laser-generated plasma plume, and wherein the laser beam and the optical axis of the emission spectra are co-axial, at least in the vicinity of the melt pool, thereby minimizing the fluctuation of spectral signals caused by ambient pressure/gas variations. The laser beam passes through a beam splitter prior to reaching the work piece, and the emission spectra from the work piece are redirected by the beam splitter to the spectrometer, and wherein the laser beam and the optical axis of the emission spectra are co-axial between the work piece and the beam splitter. The beam splitter may be a dichroic mirror or other type of beam splitter, including holographic beam splitters, and spectral filtering may be carried out with separate optical elements, as long as the overall goal of on-axis excitation and collection is achieved.

Claims

1. An additive manufacturing system, comprising: a laser outputting a beam of light onto work piece so as to form a melt pool with a laser-generated plasma plume; a spectrometer operative to collect emission spectra along an optical axis from the laser-generated plasma plume; and wherein the laser beam and the optical axis of the emission spectra are co-axial at least in the vicinity of the melt pool.

2. The additive manufacturing system of claim 1, wherein: the laser passes through a beam splitter prior to reaching the work piece; the emission spectra from the work piece are redirected by the beam splitter to the spectrometer; and the laser beam and the optical axis of the emission spectra are co-axial between the work piece and the beam splitter.

3. The system of claim 1, wherein the beam splitter is a dichroic mirror.

4. The system of claim 1, wherein the beam splitter is selected to function as a short-pass or as a long-pass filter.

5. The system of claim 1, wherein the choice of a short-pass or a long-pass filter is based on the type of material comprising the work piece.

6. The system of claim 1, wherein the choice of a short-pass or a long-pass filter is based on a wavelength range of the emission spectra.

7. The system of claim 1, further including an optical element between the beam splitter and the melt pool to focus the laser beam onto the work piece.

8. The system of claim 1, wherein the additive manufacturing system is a laser or arc welding system.

9. The system of claim 1, wherein the additive manufacturing system is a powder-bed fusion (PBF) system.

10. In a smart optical monitoring system wherein a spectrometer is used to collect emission spectra from a laser-generated plasma plume, the improvement comprising: a beam splitter disposed in the path of the laser operative to re-direct the emission spectra to the spectrometer, such that the path of the transmitted laser wavelength and the path of the reflected wavelengths to the sensor are co-axial.

11. The improvement of claim 10, further including a focusing objective between the beam splitter and a sample melt pool.

12. The improvement of claim 10, wherein the beam splitter is a dichroic mirror.

13. The improvement of claim 10, wherein the beam splitter is selected to function as a short-pass or as a long-pass filter.

14. The improvement of claim 10, wherein the choice of a short-pass or a long-pass filter is based on the type of material being monitored.

15. The improvement of claim 10, wherein the choice of a short-pass or a long-pass filter is based on the atomic data of elements to be detected.

16. The improvement of claim 10, wherein the smart optical monitoring system forms part of an additive manufacturing system.

17. The improvement of claim 10, wherein the smart optical monitoring system forms part of a laser/arc welding system.

18. The improvement of claim 10, wherein the smart optical monitoring system forms part of a powder-bed fusion (PBF) system.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0009] FIG. 1(a) is a drawing of a typical AM-Direct Energy Deposition (DED) system;

[0010] FIG. 1(b) depicts a comparison of a laser generated plasma plume at varying pressures;

[0011] FIG. 2 provides an example of effect on sensor orientation to sensor signal intensity by SOMS in the case of circular cylinder build-up;

[0012] FIG. 3(a) is a schematic of a coaxial set-up of an optics train with SOMS;

[0013] FIG. 3 (b) shows the selection of a dichroic mirror with a SOMS sensor;

[0014] FIG. 4 is an example of a SOMS set-up with a commercially available laser head; and

[0015] FIG. 5 illustrates a co-axial optic train SOMS set-up for a 3DP powder bed fusion system.

DETAILED DESCRIPTION OF THE INVENTION

[0016] To increase the accuracy of additive manufacturing (AM) in general, and direct-metal deposition (DMD); directed-energy deposition (DED); and powder-bed deposition systems in particular, a spectroscopic sensor may be used to achieve a Smart Optical Monitoring System (SOMS). This equipment, shown in FIG. 1(a), addresses many of the challenges faced by manufacturing industries, including stringent customer demands, intensified competition to reduce lead time, cycle time and manual labor, and rigorous requirements to eliminate liability of defective products.

[0017] SOMS uses optical emission spectroscopy to improve manufacturing quality to achieve no-defect product throughput in metal manufacturing processes, especially laser/arc welding and additive manufacturing (AM) processes. SOMS has the ability to perform in-situ characterization of defects such as porosity, composition, and phase transformation for fabrication processes using emitted light without any physical contact.

[0018] Atomic-level information unraveling, and mechanical and chemical condition of the product are also provided by SOMS. Spectroscopic sensors exhibit remarkable immunity to both electromagnetic interference and background acoustic noises associated with the fabrication processes.

[0019] In SOMS, an optical collimator collects the plasma plume emission from the processing zone and sends the signal to a spectrometer for signal processing. The spectrometer has a tunable optical attenuator to adjust the signal intensity to avoid saturation. The plasma spectra obtained from the spectrometer are analyzed in a signal processing unit, where mechanisms on how different defects, composition and phase transformation affect the plasma characterization are analyzed. A refined signal processing algorithm is used to detect and categorize different defects, analyze composition and phase transformation and predict the cause of these changes.

[0020] Some AM systems require processing under specific ambient environments (inert gas or near vacuum). It is noted that the laser-generated plasma plume size varies depending on the type of ambient gas and pressure, as shown in FIG. 1(b). In near-vacuum conditions, the laser generated plasma plume may exhibit a near-spherical shape, varying under types of ambient gas (e.g., He, N, Ar, etc.) and pressure.

[0021] In minimizing the fluctuation of spectral signals caused by ambient pressure/gas variation, machine-trained SOMS data needs to be properly captured and executed. Indeed, it has been discovered that the plasma spectrum intensity measured by the spectrometer may vary due to sensor orientation and/or angle. However, it has also been found that the consistency of the spectral signals can be maintained through proper sensor orientation. In broad and general terms, to minimize the influence of motion variation and sensor orientation to sensor signal intensity during SOMS, this invention uses a co-axial arrangement of the sensor with respect to the laser plasma plume.

[0022] A co-axial set-up of the SOMS sensor with respect to optical train inside the laser head is shown in FIG. 3(a). A laser used for deposition and/or plume analysis, passes through a beam splitter and is focused onto a localized region of a work piece. The reflected wavelengths are redirected by the same beam splitter onto the spectroscopic sensor shown at the right in the diagram. It is noted that other types of beam splitters may be used, including holographic, and the filtering may be done with separate optical elements, as long as the overall goal of on-axis excitation and collection is maintained.

[0023] In the embodiment shown, the spectroscopic signals are acquired by way of a dichroic mirror to the SOMS sensor. The selection of dichroic mirror (short-pass or long-pass) is dependent on the types of material (metals or polymers) to be processed and atomic data (strong lines or persistent lines) of major elements to be detected as shown in FIG. 3(b). In particular, a short-pass filter may be implemented to pass wavelengths less than 500 nm, while reflecting wavelengths greater than 500 nm, whereas a long-pass arrangement may be used to pass wavelengths greater than 650 nm, while reflecting wavelengths less than 650 nm. Those of skill in the art will appreciate that other filters may be used to pass and/or reflect wavelengths of interest.

[0024] As an example of SOMS sensor set-up with a commercially available laser head, co-axial sensing through optics train can be done, as shown in FIG. 4. As one specific application example, FIG. 5 depicts an optical train integration of a SOMS sensor with powder-bed fusion (PBF) AM system.