METHOD AND DEVICE FOR DETECTING A FOCAL POSITION OF A LASER BEAM

Abstract

A method and a device for detecting a focal position of a laser beam, particularly a machining laser beam in a laser machining head, includes an optical element which is arranged in the laser beam converging toward the focal point and which is designed to outcouple a reflection from the laser beam path, and a sensor arrangement which is designed to detect beam characteristics of said laser beam in the region of the focal point in the laser extension direction, and which measures the outcoupled reflection of the laser beam at at least two locations that are offset to one another in the extension direction, in order to determine the current focal position.

Claims

1. A device for detecting a focal position of a laser beam, in particular a machining laser beam in a laser machining head, comprising: an optical element arranged in said laser beam converging towards a focus for decoupling at least one back reflection from the laser beam path; and a sensor arrangement for detecting beam properties of said laser beam in the region of said focus along the direction of propagation, said sensor arrangement measuring the decoupled reflection of said laser beam at at least two locations offset from each other along the direction of propagation for determining the current focal position.

2. The device according to claim 1, wherein said sensor arrangement includes at least one spatially resolving detector.

3. The device according to claim 2, wherein said spatially resolving detector is arranged to be displaceable along a beam propagation direction of the back reflection.

4. The device according to claim 2, wherein the back reflection decoupled from the laser beam path can be directed onto said spatially resolving detector by means of a deflection element arranged to be displaceable along the beam propagation direction of the back reflection.

5. The device according to claim 2, wherein said spatially resolving detector is arranged to be inclined with respect to the beam propagation direction of the back reflection.

6. The device according to claim 5, wherein said spatially resolving detector is movable into a plurality of positions inclined with respect to the beam propagation direction of the back reflection.

7. The device according to claim 1, wherein said sensor arrangement includes a non-spatially-resolving sensor or detector, in particular a power detector, preferably a photodiode, the position of which is changeable in the direction of propagation of the back reflection relative thereto in order to measure the intensity of the back reflection near the beam axis thereof at different locations.

8. The device according to claim 1, wherein the decoupled back reflections are split by means of a deflection unit into a plurality of partial reflections, the optical paths of which from the last surface of a focusing optics to a sensor or detector of said sensor arrangement are different from one another.

9. The device according to claim 8, wherein said deflection element consists of one or more planar plates such that, by means of a plurality of surfaces, a plurality of back reflections can be directed to said sensor or detector of said sensor arrangement, each of the back reflections being associated with a location on the beam axis.

10. The device according to claim 8, wherein said sensor or detector of said sensor arrangement is a spatially resolving sensor.

11. The device according to claim 10, wherein said spatially resolving sensor is a CCD, in particular a camera sensor or a line sensor, the orientation of which corresponds to the beam propagation direction of the split back reflections.

12. The device according to claim 1, wherein the decoupled back reflection is split into at least two partial back reflections by at least one beam splitter and directed to at least two sensors or detectors of said sensor arrangement.

13. The device according to claim 1, wherein said sensor arrangement comprises a scattering medium arranged along an optical axis of the back reflection, wherein, for observation of the beam caustics, scattered light emanating from the back reflection is imageable onto a detector using an imaging optics.

14. A method for detecting a focal position of a laser beam, in particular a machining laser beam in a laser machining head, comprising the following steps: decoupling at least one back reflection from the laser beam path by means of an optical element arranged in said laser beam converging towards a focus, detecting beam properties of said laser beam in the region of said focus along the direction of propagation thereof by means of a sensor arrangement, and measuring the decoupled back reflection of said laser beam for determining the current focal position at at least two locations offset from one another along the direction of propagation.

15. The method according to claim 14, wherein the intensity of the back reflection near the beam axis thereof is measured as the beam property of said laser beam at different locations by means of a non-spatially-resolving sensor or detector of said sensor arrangement, the position of which in the direction of propagation of the back reflection is changeable relative thereto.

16. The method according to claim 14, wherein the beam diameter of the back reflection is detected as the beam property of the laser beam.

17. The method according to claim 16, wherein a spatially resolving detector is moved into a plurality of positions inclined with respect to the beam propagation direction of the back reflection in order to detect the beam diameter of the back reflection at a plurality of locations offset from one another along the direction of propagation.

18. The method according to claim 14, wherein the decoupled back reflections are split by means of a deflection unit into a plurality of partial reflections, the optical paths of which from the last surface of a focusing optics to a sensor or detector of said sensor arrangement are different from one another such that each of the plurality of back reflections is associated with a location on the beam axis.

19. The method according to claim 14, wherein the back reflection is guided through a scattering medium of said sensor arrangement, and in that, as the beam property of said laser beam, scattered light emanating from the back reflection is imaged onto a detector by means of an imaging optics for observing the beam caustic.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The invention is explained in more detail below with reference to the drawing.

[0032] FIG. 1 shows a schematic simplified diagram of a laser machining head with a device according to the invention for detecting a focal position of a machining laser beam in a laser machining head during laser material machining,

[0033] FIG. 2 shows a simplified diagram of the beam guiding optics of a laser machining head with a schematic illustration of a sensor arrangement for focal position control or measurement,

[0034] FIG. 3 shows a schematic diagram of the beam guiding optics according to FIG. 2 with a sensor arrangement for focal position control according to an embodiment of the invention,

[0035] FIG. 4 shows a profile of laser beam caustics in the region of the laser focus,

[0036] FIGS. 5 to 7 each show a schematic diagram of the beam guiding optics according to FIG. 2 with a sensor arrangement for focal position control according to various embodiments of the invention,

[0037] FIG. 8 shows a schematic diagram of the beam guiding optics according to FIG. 2 with a sensor arrangement according to a further embodiment of the invention, the spatially resolving sensor of which is arranged at a defined angle a with respect to the beam propagation direction,

[0038] FIGS. 9a and 9b each show a schematic cross section through a laser beam caustic for illustrating the oblique arrangement of the spatially resolving sensor according to FIG. 8,

[0039] FIG. 9c shows a schematic diagram of the sensor plane of the spatially resolving sensor according to FIG. 8,

[0040] FIG. 10 shows a schematic cross section through a laser beam caustic similar to FIG. 9a for illustrating the measurement of a beam caustic at a defined tilt angle for detecting several beam diameters along the beam propagation direction, and

[0041] FIGS. 11 to 13 each show a schematic diagram of the beam guiding optics according to FIG. 2 with a sensor arrangement for focal position control according to further embodiments of the invention.

DETAILED DESCRIPTION OF THE INVENTION

[0042] In the different figures of the drawing, corresponding elements are designated with the same reference symbols.

[0043] FIG. 1 schematically shows a laser machining head 10, through which a machining laser beam 12 is guided. The machining laser light is provided to the laser machining head 10 via an optical fiber 14, for example. The machining laser beam 12 emerging from the optical fiber 14 is collimated by a first optics 16 and focused by a focusing optics 18 into a laser focus 20 on a workpiece 22. Usually, a protective glass 26 intended to protect the inside of the laser machining head 10 and in particular the focusing optics 18 from soiling, which can be caused, for example, by splashes or smoke, is arranged between the focusing optic 18 and a beam nozzle 24 through which the convergent machining laser beam 12 is focused onto the workpiece 22.

[0044] The first optics 16 and the focusing optics 18 are shown as individual lenses, but may also be lens groups, as is known. In particular, the first optics 16 may be formed by movable lenses of a zoom system, the lenses collimating the machining laser beam 12.

[0045] In order to decouple one or more back reflections 30 from the machining laser beam path for focal position measurement or control, the protective glass 26 is inclined relative to the optical axis 28 of the beam guiding optics in such a way that the angle between the optical axis 28 and the refractive and reflecting surfaces 32, 34 of the protective glass 26 is different from 90. As shown schematically in FIG. 1, the back reflections 30 are directed onto a sensor arrangement 36. The sensor arrangement 36 may include a spatially resolving sensor or a non-spatially-resolving sensor, as will be explained in more detail below with reference to various embodiments of the invention.

[0046] As is shown schematically in FIG. 2, at least one back reflection from an optical element of the beam guiding optics, e.g. the back reflection 30, is decoupled from the working laser beam path by the last transparent optical surface before the laser machining process. For example, the last protective glass 26 is arranged obliquely with respect to the optical axis for this purpose. However, another optical element (not shown here) arranged in the convergent working laser beam path may also be used for decoupling the back reflection 30. Advantageously, a protective glass 26 with an increased thickness is used to separate the two back reflections 30 indicated in FIG. 1 from both sides of the protective glass 26. The decoupled back reflection 30 is preferably measured from the last transparent optical surface by means of the sensor arrangement 36. Therefore, the beam measurement takes place separately from the machining laser beam path.

[0047] In order to determine the position of the laser focus 20 in real time, the beam properties of the machining laser beam 12 are evaluated along the beam propagation direction using the sensor arrangement 36, the back reflection 30 corresponding to the entire laser beam.

[0048] A first possibility is to determine the beam caustic. This has the advantage that all possible changes in the machining laser beam due to a thermal lens can be monitored. A second possibility is to determine the maximum laser intensity along the beam propagation direction. Here, the monitoring of other beam properties is omitted, while the focal position can still be captured in real time.

[0049] In order to adjust a focal position and to correct the focal position, at least one of the imaging optical elements of the beam guide optics, that is, in the example shown, the first optics 16 and/or the focusing optics 18, are arranged so as to be movable in the direction of their optical axis 28, so that they can be moved by a suitable actuator (not shown) in order to perform focal position correction. In order to carry out focal position correction on the basis of a detected focal position shift, an output signal of the sensor arrangement 36 is provided to an evaluation circuit (not shown) which determines the current focal position or location from the output signal of the sensor arrangement 36 and outputs an actuating signal for the actuator such that at least one optical element, for example the first optics 16, is displaced accordingly.

[0050] The back reflection 30 decoupled from the machining laser beam 12 is directed into a measuring region 38 of a sensor or detector 40 of the sensor arrangement 36, in which the laser power no longer has a measurable thermal influence. Here, a deflection mirror 42 may be provided here, as shown in FIG. 2, for example. In order to determine the focal position in real time, the sensor or detector 40 measures properties of the machining laser beam along its beam propagation direction 44. In particular, beam properties are measured in at least two different planes A, B perpendicular to the beam propagation direction 44.

[0051] As shown in FIG. 3, the two back reflections 30.1, 30.2, for example, are used by the last optical element of the beam guiding optics before the laser process, that is by the protective glass 26, for focal position measurement, in order to measure the machining laser beam at several positions along the beam propagation direction 44, and deflected with another transparent optical element, a deflection element 60, onto a spatially resolving sensor or detector 40. Any sensor may be used as the spatially resolving sensor or detector 40 by means of which a diameter of the laser beam incident on the sensor, that is the laser back reflection for beam measurement, can be determined. Expediently, however, a camera is used as the spatially resolving sensor or detector 40, the sensor surface of which is formed, for example, by a CCD sensor.

[0052] A plane-parallel plate may be provided as the deflection element 60. However, it is also possible to use a wedge plate as a deflection element 60, protective glass 26 or as a further deflection element in order to further separate from the points or regions of incidence of the individual partial back reflections on the spatially resolving sensor 40, that is on the sensor surface thereof. It is also possible to apply reflective coating to the rear surface of the deflection element 60 in order to avoid light losses for the corresponding back reflections. It is also conceivable to provide the front surface of the deflection element 60 with a coating, so that the intensity of the two incident rear reflections 30.1 and 30.2 is evenly distributed among the respective partial back reflections.

[0053] Due to the multiple back reflections produced in this way, the machining laser beam, in particular the beam diameter thereof in the region of the focus, can be measured at a plurality of points since the optical path of the light from the last surface of the focusing optics 18 to the sensor surface of the spatially resolving sensor or detector 40 is different for each of the back reflections, sometimes shorter and sometimes longer than the nominal focal length determining the focal position.

[0054] As shown in FIG. 3, the four back reflections generated from the two back reflections 30 by the protective glass 26 due to the multiple reflections at the deflection element 60, meet at the positions 1, k-2, k-1 and k. The beam diameters determined by the spatially resolving sensor 40 at these regions of its sensor surface are shown schematically in FIG. 4. It can be seen, therefore, that beam diameters that are located in front of the focus 20 are detected in regions 1 and k-2, while beam diameters in the regions k-1 and k are detected in locations that are behind focus 20. By measuring a plurality of beam diameters along the beam propagation direction in the region of the nominal focus 20, it is possible to approximately determine the beam caustic 62 in order to then determine the real focal position of the machining laser beam 12 from the beam caustic 62.

[0055] As shown in FIG. 5, the back reflection 30 to be measured is split into (at least) two beams by means of (at least) one beam splitter 46 and, for measuring the beam properties at (at least) two positions along the beam propagation direction 44, directed to (at least) two associated spatially resolving sensors or detectors 40.1 and 40.2 of the sensor arrangement 36. The detectors 40.1 and 40.2 are positioned perpendicular to the beam propagation direction 44. The detectors 40.1 and 40.2 can measure (at least) two beam diameters along the beam propagation direction in order to determine the beam caustic and therefrom the focal position for focal position correction.

[0056] As indicated in FIG. 6 by a double arrow 48, the spatially resolving sensor or detector 40 is arranged perpendicular to the beam propagation direction 44 and is displaceable therealong. The detector 40 can thus measure the beam diameter of the back reflection 30 along the beam propagation direction 44 at a variety of positions in the region of the focus 20 of the back reflection 30. The focus 20 of the back reflection 30 corresponds to the focus 20 of the machining laser beam 12. By measuring the back reflection 30 in the region of its focus 20, the beam caustic of the machining laser beam 12 can thus be detected and evaluated for determining and correcting the focal position.

[0057] According to FIG. 7, in another embodiment of the invention, it is not the spatially resolving sensor or detector 14, but the deflection mirror 42 that can be moved, as indicated by the double arrow 48. In comparison to the embodiment according to FIG. 6, a larger detector area is required here, but there is a smaller displacement path for the deflection mirror 42 since a displacement of the deflection mirror 42 essentially results in double the relative displacement of the sensor or detector 14 along the back reflection 30 in the beam propagation direction 44. This allows for a more compact design.

[0058] FIG. 8 shows another embodiment of the invention, wherein the spatially resolving sensor or detector 40 is arranged at a defined angle a with respect to the beam propagation direction.

[0059] FIG. 9a shows a cross section through the back reflection 30 corresponding to the machining laser beam 12 shown as beam caustic 62 perpendicular to a sensor or camera plane 41, while FIG. 9b shows a cross section through the beam caustic 62 extending in the direction of propagation 44 of the machining laser beam 12 in parallel to the longitudinal extension of the sensor or camera plane 41 along with a plan view of the sensor or camera plane 41 of the tilted spatially resolving sensor or detector 40. FIG. 9c shows the elliptical image of the measured beam on the sensor or camera plane 41.

[0060] The measurement of the elliptical image of the beam, i.e. the beam caustic 62, at a defined tilt angle allows for the calculation of the beam diameter at up to three positions along the beam propagation direction 44. For this purpose, the segment AB in the elliptical image of the measured beam and the segments OC and OD along the long axis of the ellipse are evaluated taking into account the angle between the spatially resolving sensor or detector 40 and the beam axis 12. While the segment AB in the elliptical image of the measured beam corresponds directly to the beam diameter in the center O of the sensor or detector plane 41, beam segments may be calculated from the segments OC and OD which are at locations axially offset from the center O along the beam axis. The distance of the position of the diameter in the direction z of the beam axis 12 results from the following equation: z.sub.1=OD*sin , while the diameter d is calculated as follows: d=2*r.sub.1, where r.sub.1=OD*cos .

[0061] Another possibility is to turn or tilt the spatially resolving sensor or detector 40 by respectively defined angles .sub.j. Depending on the angle .sub.j, the spatially resolving sensor measures the segments s.sub.j1 and s.sub.j2 corresponding to the distances OD and OC. Based thereon, the corresponding beam radius and thus the beam diameter is determined as a function of the z position. With j different angles, this results in at least (2*j+1) different planes of the beam caustic along the beam propagation direction in which the beam diameter d can be measured for the approximate determination of the beam caustic 62.

[0062] The arrangement of the sensor or detector plane 41 at three different angles is shown schematically in FIG. 10. This results in 7 different beam diameters d at seven different locations z.sub.j1, z.sub.j2 along the beam axis 12 in the z direction. The diameters d.sub.j1, d.sub.j2 and the locations z.sub.j1, z.sub.j2 can be calculated as follows.

d.sub.j1=2*r.sub.j1 with r.sub.j1=s.sub.j1*cos .sub.j

z.sub.j1=s.sub.j1*sin .sub.j

[0063] As shown in FIG. 11, a non-spatially-resolving sensor or detector 40, in particular a power detector such as a photodiode, is arranged displaceably in the direction of propagation 44 of the back reflection 30 in order to measure the intensity of the back reflection 30 near the beam axis thereof. The free aperture of this sensor may not be larger than the beam diameter d in focus 20. With this arrangement, the measured intensity or power on the sensor reaches a maximum in the focus 20. By displacing the sensor or detector 40 along the optical axis, the intensity or power distribution shown in the diagram in FIG. 11 can be measured along the direction of propagation 44. Therefrom, the focal position can then be determined according to the maximum of the distribution.

[0064] As shown in FIG. 12, a line sensor 40, to which a plurality of back reflections 30.n emanating from a deflection element 64 are provided, is used as the sensor or detector for measuring the power in the back reflection 30. The deflection element 64 consists, for example, of several stacked planar plates, so that a plurality of back reflections 30.n can be provided simultaneously using a plurality of surfaces, each of which can be associated with a location on the beam axis. The linear power distribution on the line sensor 40 correlates with the power density distribution along the optical axis 28, the maximum of which corresponds to the focal position, and can therefore be used for determining and correcting the focal position.

[0065] FIG. 13 shows another embodiment of the invention, wherein the back reflection 30 is guided by a scattering medium 50 arranged along its optical axis 28 in such a way that the focus 20 thereof is located in the region of the scattering medium 50 and the beam caustic in the region of the focus 20 can be observed for focal position determination and correction. The beam caustic is observed using an imaging optics 52, which images scattered light emanating from the back reflection 30 onto a detector 54.

[0066] The detector 54 may be a spatially resolving sensor such as a CCD recording the beam caustic, from which the focal position can be determined. However, it is also conceivable to use a line sensor for measuring the scattered light power for determining the focal position, the line sensor detects the profile of the scattered light intensity or power along the beam propagation direction. The maximum of the profile of the scattered light intensity or power then indicates the focal position.

[0067] For example, the imaging optics 52 may be an elliptical cavity, a parabolic reflector, or the like.

[0068] Advantageously, a solid transparent material with homogeneously distributed scattering elements, such as small particles, is used as a scattering medium 50. Due to the improvement in the production of particles in the submicrometer range, it is now possible to manufacture and use solid materials with very high transmission, which can scatter the light very homogeneously and efficiently for lighting purposes. This has the advantage that measurement artifacts caused by dust particles are not critical. Alternatives to this design of the scattering medium are movable elements such as a scattering wall along the optical axis or a rotating fan.