EMITTER, ELECTRON GUN IN WHICH SAME IS USED, ELECTRONIC DEVICE IN WHICH SAME IS USED, AND METHOD FOR MANUFACTURING SAME

Abstract

The purpose of the present invention is to provide an emitter that is made of hafnium carbide (Hf) and that releases electrons in a stable and highly efficient manner, a method for manufacturing the emitter, and an electron gun and electronic device in which the emitter is used.

In this nanowire-equipped emitter, the nanowires are made of hafnium carbide (HfC) single crystal, the longitudinal direction of the nanowires match the <100> crystal direction of the hafnium carbide single crystal, and the end part of the nanowires through which electrons are to be released comprise the (200) face and the {310} face of the hafnium carbide single crystal, with the (200) face being the center and the {311} face surrounding the (200) face.

Claims

1: An emitter comprising a nanowire, wherein the nanowire is made of hafnium carbide (HfC) single crystal, a longitudinal direction of the nanowire corresponds to a <100> crystal direction of the hafnium carbide single crystal, an end of the nanowire through which electrons are to be emitted has a (200) plane and a {311} plane(s) of the hafnium carbide single crystal, the (200) plane is centered, and the {311} plane(s) surrounds the (200) plane.

2: The emitter according to claim 1, wherein a length in a lateral direction of the nanowire is 1 nm or more and 100 nm or less, and a length in a longitudinal direction of the nanowire is 500 nm or more and 30 m or less.

3: The emitter according to claim 1, wherein the end through which the electrons are to be emitted has a tapered shape.

4: The emitter according to claim 1, wherein the end through which the electrons are to be emitted are terminated with hafnium (Hf) of the hafnium carbide single crystal.

5: The emitter according to claim 4, wherein the hafnium is combined with oxygen and/or nitrogen.

6: The emitter according to claim 5, wherein the end through which the electrons are to be emitted is coated with an oxide, nitride or oxynitride of the hafnium.

7: The emitter according to claim 6, wherein a thickness of the oxide, nitride or oxynitride of the hafnium is 1 nm or more and 5 nm or less.

8: An electron gun comprising at least an emitter, wherein the emitter is the emitter according to claim 1.

9: The electron gun according to claim 8, wherein the emitter further comprises a needle and a filament, and the nanowire is attached to the filament via the needle made of an element selected from the group consisting of tungsten (W), tantalum (Ta), platinum (Pt), rhenium (Re) and carbon (C).

10: The electron gun according to claim 8, wherein the electron gun is a cold cathode field emission electron gun or a Schottky electron gun.

11: An electronic device comprising an electron gun, wherein the electron gun is the electron gun according to claim 8, the electronic device is selected from the group consisting of scanning electron microscope, transmission electron microscope, scanning transmission electron microscope, Auger electron spectrometer, electron energy loss spectrometer, and energy dispersive electron spectrometer.

12: A method for manufacturing the emitter according to claim 1, comprising: a heating step of heating a nanowire made of hafnium carbide single crystal in vacuo, wherein a longitudinal direction of the nanowire corresponds to a <100> crystal direction of the hafnium carbide single crystal, and the end of the nanowire is heated under a vacuum of 110.sup.10 Pa or more and 110.sup.6 Pa or less in a temperature range of 300 C. or more and 1000 C. or less for 5 seconds or more and 30 minutes or less.

13: The method according to claim 12, wherein in the heating step, the end of the nanowire is heated in a temperature range of more than 600 C. and 1000 C. or less for 1 minute or more and 5 minutes or less.

14: The method according to claim 13, wherein in the heating step, the end of the nanowire is heated in a temperature range of 650 C. or more and 750 C. or less for 1 minute or more and 5 minutes or less.

15: The method according to claim 12, wherein in the heating step, the nanowire is attached to a filament, and the filament is energized and heated.

16: The method according to claim 12, further comprising, subsequent to the heating step, the step of introducing oxygen and/or nitrogen.

17: The method according to claim 16, wherein in the step of introducing the oxygen and/or nitrogen, oxygen and/or nitrogen is introduced until a pressure becomes greater than 110.sup.6 Pa and 110.sup.4 Pa or less.

18: The method according to claim 16, wherein in the step of introducing the oxygen and/or nitrogen, the end of the nanowire is heated in a temperature range of 650 C. or more and 850 C. or less for 3 minutes or more and 10 minutes or less.

Description

BRIEF DESCRIPTION OF DRAWINGS

[0029] FIG. 1 is a schematic view of the emitter according to Embodiment 1.

[0030] FIG. 2 is a flowchart showing a method for manufacturing the emitter according to Embodiment 1.

[0031] FIG. 3 is a schematic view showing a state in which a method for manufacturing the emitter according to Embodiment 1 is performed.

[0032] FIG. 4 is a schematic view showing an electron gun according to Embodiment 2.

[0033] FIG. 5 is a view showing a low magnification TEM image of a nanowire before undergoing surface modification.

[0034] FIG. 6 is an SEM image showing each end of nanowires according to Examples 1 and 2/Comparative Example 3.

[0035] FIG. 7 is a diagram showing the time dependence of a field emission current of the emitter using a nanowire according to Example 1.

[0036] FIG. 8 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 2.

[0037] FIG. 9 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Comparative Example 3.

[0038] FIG. 10 is a view showing each field emission pattern of nanowires according to Examples 1 and 2/Comparative Example 3.

[0039] FIG. 11 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 1 before or after undergoing heating.

[0040] FIG. 12 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 2 before or after undergoing heating.

DESCRIPTION OF EMBODIMENTS

[0041] Hereinafter, embodiments of the present invention are described with reference to the drawings. It should be noted that identical components are denoted by identical or substantially identical reference numerals, and descriptions thereof are omitted.

Embodiment 1

[0042] Embodiment 1 describes an emitter according to the present invention and a method for manufacturing the same.

[0043] FIG. 1 is a schematic view of the emitter according to Embodiment 1.

[0044] The emitter according to the present invention includes a nanowire 100 made of hafnium carbide (hereinafter, referred to as HfC) single crystal 110. Furthermore, the longitudinal direction of the nanowire 100 corresponds to the <100> crystal direction of the HfC single crystal. As shown in FIG. 1(B), the end 120 of the nanowire 100 through which electrons are to be emitted has the (200) plane and the {311} plane(s) of the HfC single crystal 100, the (200) plane is centered, and the {311} plane(s) surrounds the (200) plane.

[0045] In the present invention, since the nanowire 100 is made of HfC single crystal 110, the end 120 through which electrons are to be emitted is controlled at an atomic level. Accordingly, electrons can be stably emitted. Furthermore, since the end 120 through which electrons are to be emitted is surface-modified to have the above-mentioned plane orientation, electrons can be stably emitted with high efficiency.

[0046] A plane surrounding the (200) plane may have the {201} plane or the like in addition to the {311} plane(s). Also in this case, it is desirable that the plane is surface-modified so that the area of the {311} plane(s) is larger than that of the {201} plane.

[0047] Preferably, the length in the lateral direction (that is, the diameter) of the nanowire 100 is in a range of 1 nm or more and 100 nm or less, and the length in the longitudinal direction is in a range of 500 nm or more and 30 m or less. With such a size, an electric field concentration can be effectively generated at the end 120 through which electrons are to be emitted, so that more electrons can be emitted through the end.

[0048] More preferably, the length in the lateral direction of the nanowire 100 is in a range of 10 nm or more and 60 nm or less, and the length in the longitudinal direction is in a range of 5 m or more and 30 m or less. For example, in case of manufacturing the nanowire 100 using a chemical vapor deposition method (CVD) mentioned below, the nanowire 100 can be easily provided having the above-mentioned range and made of high-quality HfC single crystal with no cracks, kinks or the like.

[0049] Preferably, the end 120 through which electrons are to be emitted has a tapered shape. Accordingly, the {311} plane(s) can be configured to surround the (200) plane which is centered, as mentioned above. Such a processing and treatment can be performed using a heat treatment mentioned below.

[0050] In the emitter equipped with the nanowire made of hafnium carbide (HfC) single crystal according to the present invention, the end 120 of the emitter is surface-modified so as to have the above-mentioned plane orientation, as mentioned above, so that more tapered shape can be obtained than the case of a conventional nanowire emitter made of hafnium carbide single crystal (specifically, a nanowire emitter made of hafnium carbide single crystal before being coated with hafnium oxide in Patent Literature 1). Therefore, electrons are more efficiently emitted.

[0051] Preferably, the end 120 through which electrons are to be emitted is terminated with Hf (hafnium) of the HfC single crystal. This reduces the work function, so that electrons can be more efficiently emitted. The termination with Hf can be simply confirmed by calculating the work function.

[0052] More preferably, in case where the end 120 through which electrons are to be emitted is terminated with Hf, the Hf may be combined with oxygen and/or nitrogen. This reduces dangling bond and stabilizes the Hf so that electrons can be emitted with high efficiency. More preferably, the combination of Hf with oxygen and/or nitrogen allows the end 120 through which electrons are to be emitted to be coated with hafnium oxide, nitride or oxynitride. When the end 120 has oxide, nitride or oxynitride, the material itself is stabilized, so that electrons can be emitted with high efficiency. In this case, the thickness of hafnium oxide, nitride or oxynitride is preferably in a range of 1 nm or more and 5 nm or less. When the thickness is less than 1 nm, Hf might not be sufficiently stabilized. When the thickness exceeds 5 nm, emission of electrons through the HfC single crystal 110 might be suppressed. The formation of hafnium oxide, nitride or oxynitride is estimated from experimental condition or by field emission measurement.

[0053] In FIG. 1, the nanowire 100 is shown as the emitter itself, but is not limited thereto. For example, the emitter may be the nanowire 100 itself, the nanowire 100 may be attached to and integrated with a needle, or may be further attached to a filament.

[0054] Next, a description is made of a method for manufacturing the emitter according to Embodiment 1.

[0055] FIG. 2 is a flowchart showing a method for manufacturing the emitter according to Embodiment 1.

[0056] FIG. 3 is a schematic view showing a state in which a method for manufacturing the emitter according to Embodiment 1 is performed.

[0057] Step 210: The nanowire 100 made of the hafnium carbide (Hf) single crystal 110 is heated in vacuo. The longitudinal direction of the nanowire 100 corresponds to the <100> crystal direction of the HfC single crystal 110. Here, the end of the nanowire 100 is heated in a heating condition under a vacuum of 110.sup.10 Pa or more and 110.sup.6 Pa or less in a temperature range of 300 C. or more and 1000 C. or less for 5 seconds or more and 30 minutes or less. When being heated in the above-mentioned condition, in addition to cleaning a nanowire by ordinary heat flashing, the surface can be modified so that the end of the nanowire has the (200) plane and the {311} plane(s), the (200) plane is centered, and the {311} plane(s) surrounds the (200) plane. Here, the ordinary heat flashing performed for cleaning a nanowire is an optional treatment, as mentioned above, and even without this treatment, the surface modification can be performed so that the above end has the above-mentioned plane orientation.

[0058] When the degree of vacuum exceeds 110.sup.6 Pa, the surface modification of the end of the HfC single crystal 110 may not sufficiently proceed. The lower limit of the degree of vacuum is not particularly limited, but the degree of vacuum is appropriately 110.sup.10 Pa in view of the limit of apparatus. When the heating temperature is lower than 300 C., the surface modification of the end of the nanowire 100 may not sufficiently proceed. On the other hand, when the heating temperature exceeds 1000 C., it becomes difficult to control the surface processing at an atomic level. When the heating time is less than 5 seconds, the surface modification may not sufficiently proceed. On the other hand, when the heating time exceeds 30 minutes, there is no change in the degree of surface modification, and thus such a condition is inefficient.

[0059] In a step S210, heating is preferably performed in a temperature range of more than 600 C. and 1000 C. or less for 1 minute or more and 5 minutes or less. As a result, the end 120 of the nanowire 100 through which electrons are to be emitted has a tapered shape, and the HfC single crystal 110 is terminated with Hf More preferably, heating is performed in a temperature range of 650 C. or more and 750 C. or less for 1 minute or more and 5 minutes or less. As a result, the HfC single crystal 110 can be reliably terminated with Hf. The present inventors have experimentally confirmed the following: when the heating temperature is lower than 650 C., the end 120 may not be terminated with Hf, so that the work function may not be sufficiently reduced. Accordingly, from the viewpoint of more stably terminating the end 120 with Hf, the temperature is more preferably 650 C. or more.

[0060] Preferably, following the step S210, a step of introducing oxygen and/or nitrogen may be performed. As a result, when the end 120 through which electrons are to be emitted is terminated with Hf, the end 120 can be made of Hf oxide, nitride or oxynitride. More preferably, oxygen and/or nitrogen are introduced until the degree of vacuum is greater than 110.sup.6 Pa and 110.sup.4 Pa or less. As a result, hafnium oxide, nitride or oxynitride having a thickness in a range of 1 nm or more and 5 nm or less can be obtained. More preferably, it is desirable to introduce oxygen and/or nitrogen until the degree of vacuum becomes 110.sup.5 Pa or more and 110.sup.4 Pa or less.

[0061] In the step of introducing oxygen and/or nitrogen, the end of the nanowire may be preferably heated in a temperature range of 650 C. or more and 850 C. or less for 3 minutes or more and 10 minutes or less. This promotes the growth of hafnium oxide, nitride or oxynitride.

[0062] For example, the method according to the present invention can be performed using a device shown in FIG. 3. As shown in FIG. 3, the nanowire 100 may be attached to a filament 320, and the filament 320 is energized and heated. Specifically, the nanowire 100 is attached to the filament 320 via a needle 330 made of an element selected from the group consisting of tungsten (W), tantalum (Ta), platinum (Pt), rhenium (Re) and carbon (C). The nanowire 100 may be attached to a needle 330 through a conductive adhesive sheet such as a carbon pad. By energizing the filament 320 via a power supply 340, the filament is heated and the surface of the nanowire 100 can be modified. It should be noted that the device shown in FIG. 3 can be mounted on a vacuum chamber or the like to maintain a desired degree of vacuum. The heating temperature caused by the filament 320 can be measured by, for example, radiation thermometer or thermal imaging camera.

Embodiment 2

[0063] Embodiment 2 describes an electron gun equipped with the emitter according to the present invention.

[0064] FIG. 4 is a schematic view showing the electron gun according to Embodiment 2.

[0065] The electron gun 400 according to the present invention includes at least the emitter 410 having the nanowire 100 described in Embodiment 1. In FIG. 4, the emitter 410 further includes, in addition to the nanowire 100, the filament 320 and the needle 330.

[0066] The nanowire 100 is attached to the filament 320 via the needle 330 made of an element selected from the group consisting of tungsten (W), tantalum (Ta), platinum (Pt), rhenium (Re) and carbon (C). This is preferable because the handling of the nanowire 100 is simplified. In FIG. 4, the filament 320 has a hairpin-type shape (U-shape), but is not limited thereto. The filament 320 may have any shape such as a V-shape.

[0067] In the electron gun 400, an extraction power supply 450 is connected between an electrode 440 and an extraction electrode 460, in which the extraction power supply 450 applies a voltage between the emitter 410 and the extraction electrode 460. Furthermore, in the electron gun 400, an acceleration power supply 470 is connected between the electrode 440 and an acceleration electrode 480, in which the acceleration power supply 470 applies a voltage between the emitter 410 and the acceleration electrode 480.

[0068] Furthermore, the electrode 440 may be further connected to a flash power supply when the electron gun 400 is a cold cathode field emission electron gun, or may be connected to a heating power supply when the electron gun 400 is a Schottky electron gun.

[0069] The electron gun 400 may be placed under a vacuum of 10.sup.8 Pa to 10.sup.7 Pa (10.sup.8 Pa or more and 10.sup.7 Pa or less). In this case, the end of the emitter 410 through which electrons are to be emitted can be kept clean.

[0070] The operations when the electron gun 400 according to the present invention is a cold cathode field emission electron gun are briefly described below.

[0071] The extraction power supply 450 applies a voltage between the emitter 410 and the extraction electrode 460. As a result, an electric field concentration is generated at the end of the nanowire 100 of the emitter 410 through which electrons are to be emitted, and thus electrons are extracted. Furthermore, the acceleration power supply 470 applies a voltage between the emitter 410 and the acceleration electrode 480. As a result, electrons extracted at the end of the nanowire 100 of the emitter 410 through which electrons are to be emitted are accelerated and emitted toward a sample. The surface of the nanowire 100 may be cleaned by, if needed, performing flashing using a flash power supply connected to the electrode 440. These operations are performed under the above-mentioned vacuum.

[0072] The operations when the electron gun 400 according to the present invention is a Schottky electron gun are briefly described below.

[0073] A heating power supply connected to the electrode 440 heats the emitter 410, and the extraction power supply 450 applies a voltage between the emitter 410 and the extraction electrode 460. As a result, a Schottky emission is generated at the end of the nanowire 100 of the emitter 410 through which electrons are to be emitted, and thus electrons are extracted. Furthermore, the acceleration power supply 470 applies a voltage between the emitter 410 and the acceleration electrode 480. As a result, electrons extracted at the end of the nanowire 100 of the emitter 410 through which electrons are to be emitted are accelerated and emitted toward a sample. These operations are performed under the above-mentioned vacuum. Since thermoelectrons can be emitted from the nanowire 100 of the emitter 410 by the heating power supply, the electron gun 400 may further include a suppressor (not shown in the drawings) for shielding thermoelectrons.

[0074] Since the electron gun 400 according to the present invention includes the emitter 410 equipped with the nanowire 100 described in detail in Embodiment 1, electrons can be easily and stably emitted for a long time. Such an electron gun 400 is employed in any electronic device having an electron focusing ability. For example, such an electronic device is selected from the group consisting of scanning electron microscope, transmission electron microscope, scanning transmission electron microscope, Auger electron spectrometer, electron energy loss spectrometer and energy dispersive electron spectrometer.

[0075] Next, the present invention is described in detail with reference to specific examples, but it should be noted that the present invention is not limited to these examples.

EXAMPLES

Example 1

[0076] In Example 1, an emitter was manufactured by modifying the surface of a nanowire made of HfC single crystal in a heating temperature range of 650 C. to 750 C. (650 C. or more and 750 C. or less).

[0077] Prior to surface modification, nanowires composed of HfC single crystal were manufactured by CVD method. Nanowires made of HfC single crystal were prepared on a graphite substrate in the same procedure and condition as in Reference Example 1 of Patent Literature 1. One of the nanowires was taken out and observed by scanning electron microscope (SEM, JSM-6500F, manufactured by JEOL) and transmission electron microscope (TEM, JEOL-2100F, manufactured by JEOL) equipped with an energy dispersive X-ray analyzer (EDS). The results are shown in FIG. 5.

[0078] FIG. 5 is a view showing a low magnification TEM image of a nanowire before undergoing surface modification.

[0079] As a result of EDS measurement, only Hf and C were detected, having an atomic ratio is 1:1. From this, it has been confirmed that the synthesized nanowire is hafnium carbide (HfC). According to FIG. 5, it has been found that the nanowire is made of one type of crystal and has a length in the lateral direction of 60 nm and a length in the longitudinal direction of 3 m. In addition, from the observation results by means of a high-resolution transmission electron microscope image (HRTEM image), it has been confirmed that the longitudinal direction of the nanowire corresponds to the <100> crystal direction of the HfC single crystal. Furthermore, although not being shown in the drawings, according to the selected area electron diffraction pattern (SAED), the nanowire was of single crystal.

[0080] Next, the nanowire was surface-modified to manufacture an emitter, using the device shown in FIG. 3. The procedure for manufacturing the emitter was as follows. A wire made of tantalum was etched and processed into a Ta needle (330 in FIG. 3) having one end tapered. Next, the Ta needle was connected to a hairpin shaped tungsten filament (320 in FIG. 3) by welding. The nanowire (100 in FIG. 3) was fixed to the tapered Ta needle using a carbon pad. The degree of vacuum in a vacuum chamber was 110.sup.7 Pa.

[0081] Next, the nanowire was heated in vacuo (the step S210 in FIG. 2). In detail, a current of 2.3 A was applied to the tungsten filament via a power supply (340 in FIG. 3), and its state was maintained for 3 minutes. When the temperature of the tungsten filament was measured by radiation thermometer, the temperature was 650 C. to 750 C. (650 C. or more and 750 C. or less).

[0082] The nanowire thus obtained was observed by SEM. The results are shown in FIG. 6. Next, the time dependence of the field emission current of the emitter at room temperature and an extraction voltage of 720 V was measured using a field ion microscope (FIM). The results are shown in FIG. 7. Next, the field emission pattern was observed by inverting the polarity of the extraction voltage of the emitter to generate field emission. The results are shown in FIG. 10.

[0083] Furthermore, the above-mentioned time dependence of the field emission current was measured while performing heating. At this time, the heating was at 1.6 A (in a range of 300 C. or more and 500 C. or less). The results are shown in FIG. 11.

Example 2

[0084] In Example 2, an emitter was manufactured by surface-modifying a nanowire made of HfC single crystal that was manufactured by CVD method in the same manner as in Example 1 in a heating temperature range of 500 C. to 600 C. (500 C. or more and 600 C. or less). The condition for heating the nanowire was the same as that in Example 1, except that a current of 2.1 A (500 C. to 600 C. (500 C. or more and 600 C. or less) according to a radiation thermometer) was applied and its state was maintained for 1 minute.

[0085] The nanowire thus obtained was observed by SEM. The results are shown in FIG. 6. In the same manner as in Example 1, the time dependence of the field emission current of the emitter at room temperature and an extraction voltage of 990 V was measured using an FIM. The results are shown in FIG. 8. The field emission pattern was observed in the same manner as in Example 1. The results are shown in FIG. 10.

[0086] In addition, in the same manner as in Example 1, the above-mentioned time dependence of the field emission current was measured while performing heating. At this time, the heating was at 1.5 A (in a range of 300 C. or more and 500 C. or less). The results are shown in FIG. 12.

Comparative Example 31

[0087] In Comparative Example 3, a nanowire made of HfC single crystal manufactured by CVD method in the same manner as in Example 1 was used for an emitter without surface modification by heating. In the same manner as in Example 1, the time dependence of the field emission current of the emitter at room temperature and an extraction voltage of 1330 V was measured using an FIM. The results are shown in FIG. 9. The field emission pattern was observed in the same manner as in Example 1. The results are shown in FIG. 10.

[0088] The above experimental conditions are summanzed in Table 1 for simplicity.

TABLE-US-00001 TABLE 1 List of experimental condition for emitter according to Examples 1 and 2/Comparative Example 3 Example/ Heat-treatment condition Comparative Degree of Temperature Current Time Example Size of HfC vacuum (Pa) ( C.) value (A) minute Example 1 3 m in length, 1 10.sup.7 650~750 2.3 3 60 nm Example 2 3 m in length, 1 10.sup.7 500~600 2.1 1 60 nm Comparative 3 m in length, Example 3 60 nm

[0089] FIG. 6 is an SEM image showing the ends of the nanowires according to Examples 1 and 2/Comparative Example 3. The sizes areas described in Size of HfC in Table 1.

[0090] FIGS. 6(A) to 6(C) are SEM images showing the ends of the nanowires according to Example 1, Example 2, and Comparative Example 3, respectively. The nanowire according to Comparative Example 3 shown in FIG. 6(C) is the same as that in FIG. 5 because it has not been heat-treated.

[0091] According to FIG. 6(A), it has been found that the end of the nanowire according to Example 1 has a tapered shape and the surface has been modified. Although the end of the nanowire according to Example 2 shown in FIG. 6(B) is not as tapered as the end of the nanowire according to Example 1 shown in FIG. 6(A), it indicates to have a slightly tapered shape, so that its surface has been modified. This indicates that heating the nanowire in vacuo is advantageous for surface modification.

[0092] FIG. 7 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 1.

[0093] FIG. 8 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 2.

[0094] FIG. 9 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Comparative Example 3.

[0095] As shown in FIG. 9, the field emission current property of the nanowire according to Comparative Example 3 was not stable. On the other hand, according to FIG. 7, the nanowire according to Example 1 exhibited relatively stable field emission current property over about 10 minutes, and the current value was as high as about 0.15 A. According to FIG. 8, the nanowire according to Example 2 exhibited more stable field emission current property than that of the nanowire according to Example 1, but the current value was smaller.

[0096] These results indicate that the nanowires of which surfaces have been modified by heating in vacuo have improved field emission properties. Furthermore, since the current value in the nanowire according to Example 1 is larger than that according to Example 2, it has been found that the end of the nanowire according to Example 1 has reduced work function and promoted release of electrons due to termination with Hf.

[0097] FIG. 10 is a view showing the field emission patterns of nanowires according to Examples 1 and 2/Comparative Example 3.

[0098] FIGS. 10(A) to 10(C) show the field emission patterns of the nanowire according to Example 1, the nanowire according to Example 2, and the nanowire according to Comparative Example 3, respectively. In FIG. 10, areas shown bright in the gray scale are the field emission area.

[0099] According to FIG. 10, it has been found that the field emission areas in the nanowires according to Examples 1 and 2 are wider and more concentrated at the center than the field emission areas in the nanowire according to Comparative Example 3. These results also indicate that the nanowires of which surfaces have been modified by heating in vacuo have improved field emission properties. Furthermore, comparing FIG. 10(A) with FIG. 10(B), it has been found that the field emission area in the nanowire according to Example 1 is more concentrated at the center than that according to Example 2. Furthermore, when the plane index of the HfC single crystal in the field emission pattern was specified, it has been indicated that the {311} plane(s) surrounds the (200) plane with the (200) plane centered, as shown in FIG. 10(A).

[0100] From these, it has been found that only when a nanowire made of HfC single crystal of which longitudinal direction matches the <100> crystal direction is heated in a temperature range of 650 C. or more and 750 C. or less for 1 minute or more and 5 minutes or less in vacuo, the end emitting electrons can be surface-modified so that the {311} plane(s) surrounds the (200) plane with the (200) centered, and thus electrons can be efficiently and stably released.

[0101] In addition, comparing the field emission patterns of the nanowire emitters according to Examples 1 and 2 in FIG. 10 (i.e., FIGS. 10(A) and 10(B)) to the field emission pattern of a conventional emitter made of hafnium carbide single crystal (specifically, a nanowire emitter made of hafnium carbide single crystal before being coated with hafnium oxide in Patent Literature 1) (see FIGS. 12(A) and 12(B) in Patent Literature 1), the field emission patterns showing that the area shown brightly in the gray scale (i.e., the field emission area) is more concentrated at the center (tip) of the emitter end are apparently seen in FIG. 10 (i.e., the nanowire emitter according to the present invention). Therefore, it has been also confirmed that, according to the emitter of the present invention (specifically, the emitter equipped with a nanowire made of hafnium carbide (HfC) single crystal, in which the longitudinal direction of the nanowire corresponds to the <100> crystal direction of the hafnium carbide single crystal, and the end of the nanowire through which electrons are to be emitted has the (200) plane and the {311} plane(s), and the {311} plane(s) surrounds the (200) plane with the (200) centered), electrons can be emitted more efficiently and more stably, compared to conventional nanowire emitters made of hafnium carbide single crystal.

[0102] FIG. 11 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 1 before or after undergoing heating.

[0103] FIG. 12 is a diagram showing the time dependence of the field emission current of the emitter using a nanowire according to Example 2 before or after undergoing heating.

[0104] According to FIG. 11 and FIG. 12, in both cases, the field emission current properties are further stabilized by heating, and in the nanowire according to Example 1, the current value is further improved. From this, it has been found that the properties of the nanowire according to the present invention are further improved by auxiliary heating current, and it is particularly advantageous for a Schottky electron gun among electron guns.

Example 41

[0105] In Example 4, in the same manner as in Example 1, a nanowire made of surface-modified HfC single crystal was further treated with oxygen to manufacture an emitter. The conditions of the oxygen treatment are as follows: after performing the surface modification under the same condition as in Example 1, oxygen was introduced, the degree of vacuum after the oxygen introduction was maintained at 510.sup.5 Pa, a current of 2.5 A (800 C. according to a radiation thermometer) was applied, and its state was maintained for 5 minutes.

[0106] From the condition of oxygen introduction, an oxide of Hf (HfOx: 0<x2) was formed at the end of the HfC single crystal, and the thickness of the oxide was estimated to be 3 nm.

[0107] In the same manner as in Example 1, the nanowire thus obtained was observed by SEM. The time dependence of the field emission current of the emitter at room temperature and an extraction voltage of 720 V was measured using an FIM, and the field emission pattern was observed. Although not shown, it has been observed that, in addition to the same stability as that of Example 1, the field emission current properties of the nanowire according to Example 4 have improved current value. From this, it has been found that bonding the terminal Hf with oxygen, nitrogen or the like allows the nanowire according to the present invention to more efficiently and stably emit electrons because the end through which electrons are to be emitted is stabilized with the oxide, nitride or the like of Hf.

INDUSTRIAL APPLICABILITY

[0108] Because using the emitter according to the present invention allows electrons to be efficiently and stably emitted, it can be applied for any device having an electron focusing ability such as scanning electron microscope, transmission electron microscope, scanning transmission electron microscope, Auger electron spectrometer, electron energy loss spectrometer, and energy dispersive electron spectrometer.

REFERENCE SIGNS LIST

[0109] 100 Nanowire [0110] 110 Hafnium carbide (Hf) single crystal [0111] 120 End through which electrons are to be emitted [0112] 320 Filament [0113] 330 Needle [0114] 340 Power supply [0115] 400 Electron gun [0116] 410 Emitter [0117] 440 Electrode [0118] 450 Extraction power supply [0119] 460 Extraction electrode [0120] 470 Acceleration power supply [0121] 480 Acceleration electrode