Current sensor and a method of manufacturing a current sensor
10859605 ยท 2020-12-08
Assignee
Inventors
Cpc classification
G01R3/00
PHYSICS
International classification
Abstract
The present disclosure provides an improved Rogowski-type current sensor. The current measurement coil, and the compensation coil are provided on the same board. The measurement coil and the compensation coil are arranged such that they at least partially overlap by virtue of each repeatedly changing side of the board. This arrangement makes the current sensor far better at rejecting interference than certain other PCB Rogowski type coil arrangements.
Claims
1. A rate of change of current sensor formed on a substrate, the substrate having a first side and a second side and including an aperture or path for at least one current carrying conductor formed within the substrate, the sensor comprising: the substrate; a plurality of measurement conductors arranged on the first and second sides of the substrate and spaced around the aperture such that each measurement conductor has a major portion that extends away from the aperture or the path for the at least one current carrying conductor from a first end to a second end, wherein the first end is nearer the aperture than the second end, and wherein the major portions of the measurement conductors on the first and second sides are aligned with one another and connected by vias through the substrate so as to form a measurement coil formed into a loop; wherein the measurement conductors include a first set of connection portions at the first end and a second set of connection portions at the second end, each connection portion disposed at an angle to the major portion and leading towards a via to make contact with an immediately adjacent measurement conductor on the opposite side of the substrate, and wherein the sensor further comprises a compensation conductor following a meandering path adjacent one single set of connection portions of either the first set of connections portions or the second set of connection portions.
2. A sensor as claimed in claim 1, in which the connection portions of the first set of connection portions and the second set of connection portions on the first side of the substrate are disposed at a positive angle with respect to the direction of advancement of the measurement coil, and the one set of connection portions connection portions cross portions of the compensation conductor formed on the second side of the substrate, the portions of the compensation conductor on the second side being disposed at a negative angle with respect to the direction of advancement of the measurement coil.
3. A sensor as claimed in claim 1 in which the connection path between adjacent measurement conductors traverses between the first and second sides of the substrate at a position which is between the pair of measurement conductors.
4. A sensor as claimed in claim 1, in which the compensation conductor comprises an alternating pattern of first conductors on the first side of the substrate and second conductors on the second side of the substrate.
5. A sensor as claimed in claim 1, in which the respective major portions of measurement conductors on the first side align with respective major portions of measurement conductors on the second side.
6. A sensor as claimed in claim 5, in which respective major portions of measurement conductors on the first side overlap with respective major portions of measurement conductors on the second side.
7. A sensor as claimed in claim 1 in which the first ends of adjacent measurement conductors are formed at a plurality of distances from the aperture or the at least one current carrying conductor.
8. A sensor as claimed in claim 1, wherein the sensor comprises a first plurality of vias arranged on a first geometric shape, a second plurality of vias arranged on a second geometric shape, a third plurality of vias arranged on third geometric shape, where the first to third shapes are the same and concentric but of different sizes, and where vias of the first and second groups are closer to the aperture and the first vias are connected to measurement conductors of a first length and the second vias are connected to measurement conductors of a second length.
9. A sensor as claimed in claim 8, where the compensation conductor comprises segments of conductor formed in alternating sequence on the first and second sides of the board, and connected by a first set of compensation conductor vias and a second set of compensation conductor vias; and in which the first set of compensation conductor vias are arranged on a fourth geometric shape and the second set of compensation conductor vias are arranged on a fifth geometric shape, where the fourth geometric shape is smaller than the fifth geometric shape.
10. A sensor as claimed in claim 9, in which the fifth geometric shape is the same size as the third geometric shape.
11. A sensor as claimed in claim 8, in which the geometric shapes are circular.
12. A sensor as claimed in claim 8, where the second set of connection portions meander about a further geometric shape which has the same shape as the third geometric shape.
13. A sensor as claimed in claim 12, in which the compensation conductor meanders about the further geometric path.
14. A sensor as claimed in claim 8, in which the geometric shape is rectangular.
15. A sensor as claimed in claim l, where the substrate is a double sided printed circuit board.
16. A sensor as claimed, in claim l, wherein the substrate is coupled to a printed circuit board comprising other components.
17. A sensor as claimed in claim l in which the current carrying conductor makes a plurality of loops around the sensor.
18. A sensor as claimed in claim 1 in which a first and a second current carrying conductor pass through a shared, rate-change current sensor, and define current flow paths being in opposition to each other.
19. A sensor as claimed in claim 1 comprising: at least two measurement coils, each measuring the current through a respective current carrying conductor; and a circuit for combining the outputs of the measurement coils.
20. A sensor as clamed in claim 1, in which the sensor is formed on a multiple layer board having a first conductive layer and a second conductive layer, where measurement conductors are formed in the first and second conductive layers, and the compensation conductors are formed in the first and second conductive layers.
21. A sensor as clamed in claim 19, in which the sensor is formed on the multiple layer board further including a third conductive layer and a fourth conductive layer, where measurement conductors are formed in the first and fourth conductive layers, and the compensation conductors are formed in the second and third conductive layers, or in the first and fourth conductive layers.
22. The sensor as claimed in claim l, included in or in combination with a power meter.
23. A sensor as claimed in claim l, wherein the compensation conductor comprises an alternating pattern of first conductors on the first side of the substrate and second conductors on the second side of the substrate.
24. A sensor as claimed in claim l, wherein the substrate is formed of two half boards pivotably attached so as to be movable between an open position and a closed position.
25. A sensor as claimed in claim 24, wherein the two halfboards are held in a closed position by a removable fixing placed through apertures through the substrate which line up when the half boards are in the closed position.
26. A sensor as claimed in claim 24, wherein the removable fixing forces the two half boards into contact with each other.
27. A sensor as claimed in claim 26, wherein the removable fixing is conductive.
28. The sensor of claim 1, wherein the sensor is in combination with an amplifier including a gain compensation arrangement for adjusting the gain of the amplifier as a function of temperature to mitigate an effect of thermal expansion of the sensor.
29. The sensor of claim 28, in which the amplifier is provided in a Virtual earth configuration and wherein an input resistor of the amplifier is provided in series with the sensor; the temperature coefficient of resistance of the input resistor being less than the temperature coefficient of resistance of the sensor.
30. The sensor of claim 29, in which the input resistor has a resistance value of between 300 and 1000 ohms.
31. A sensor formed on a substrate, the substrate having a first side and a second side and including an aperture or path for at least one current carrying conductor formed within the substrate, the sensor comprising: the substrate; a plurality of measurement conductors arranged on the first and second sides of the substrate and spaced around the aperture such that each measurement conductor has a major portion that extends away from the aperture or the path for the at least one current carrying conductor from a first end to a second end, wherein the first end is nearer the aperture than the second end, and wherein the major portions of the measurement conductors on the first and second sides are aligned with one another and connected by vias through the substrate so as to form a measurement coil formed into a loop; wherein the measurement conductors include a connection portion disposed at an angle to the major portion and leading towards a via to make contact with an immediately adjacent measurement conductor on the opposite side of the substrate; wherein the sensor further comprises a compensation conductor following a meandering path adjacent the connection portions; and wherein the sensor comprises a first plurality of vias arranged on a first geometric shape, a second plurality of vias arranged on a second geometric shape, a third plurality of vias arranged on third geometric shape, where the first, second, and third shapes are the same and concentric but of different sizes, and where vias of the first and second plurality of vias are closer to the aperture than the third plurality of wins and the first vias are connected to measurement conductors and the second vias are connected to measurement conductors.
32. The sensor of claim 31, the compensation conductor is configured to compensate an output of the sensor for one or more parasitic fields perpendicular to the major surface of the substrate of the measurement conductors formed at the connection portion.
33. A method of measuring total power consumed by a supply having at least three wires using a sensor comprising: a substrate having a first side and a second side and including an aperture or path for at least one current carrying conductor formed within the substrate; a plurality of measurement conductors arranged on the first and second sides of the substrate and spaced around the aperture such that each measurement conductor has a major portion that extends away hunt the aperture or the path for the at least one current carrying conductor from a first end to a second end, wherein the first end is nearer the aperture than the second end, and wherein the major portions of the measurement conductors on the first and second sides are aligned with one another and connected by vias through the substrate so as to form a measurement coil into a loop; wherein the measurement conductors include a first set of connection portions at the first end and a second set of connection portions at the second end, each connection portion disposed at an angle to the major portion and leading towards a via to make contact with an immediately adjacent measurement conductor on the opposite side of the substrate, and wherein the sensor further comprises a compensation conductor following a meandering path adjacent one particular set of connection portions of either the first set of connections portions or the second set of connection portions; the method comprising : measuring current and voltage front a first current carrying element extending through the aperture from an underside of the substrate to a topside of the substrate; measuring current and voltage from a second current carrying element, carrying current that is 180 degrees out of phase from the first current carrying element, extending through the aperture from the underside of the substrate to the to the topside of the substrate; approximating a voltage on a neutral element based on the measured voltages from the first current carrying element and the second current carrying element; and calculating total power by using the measured current and voltage measurements from both the first and second current carrying elements along with the approximated voltage from the neutral element.
34. The method of claim 33, wherein the first current carrying element is arranged to make several passes through the sensor.
35. The method of claim 33, wherein the second current carrying element is arranged to make several passes through the sensor.
36. The method of claim 33, wherein the first, and second current carrying elements include insulated wires.
37. A method of measuring total power consumed by a supply having at least three wires using a sensor on each current carrying element, the sensor comprising: a substrate having a first side and a second side and including an aperture or path for at least one current carrying conductor formed within the substrate; a plurality of measurement conductors arranged on the first and second sides of the substrate and spaced around the aperture such that each measurement conductor has a major portion that extends away hunt the aperture or the path for the at least one current carrying conductor from a first end to a second end wherein the first end is nearer the aperture than the second end, and wherein the major portions of the measurement conductors on the first and, second sides are aligned with one another and connected by vias through the substrate so as to form a measurement coil into a loop; wherein the measurement conductors include a first set of connection portions at the first end and a second set of connection portions at the second end, each connection portion disposed at an angle to the major portion and leading towards a via to make contact with an immediately adjacent measurement conductor on the opposite side of the substrate, and wherein the sensor further comprises a compensation conductor following a meandering path adjacent one particular set of connection portions of either the first set of connections portions or the second set of connection portions; the method comprising measuring current and voltage front a first current carrying element extending through the aperture of a first sensor from an underside of the substrate to a topside of the substrate; measuring current and voltage from a second current carrying element extending through the aperture of a second sensor placed on the substrate from underside of the substrate to the to the topside of the substrate; approximating a voltage on a neutral element based, on the measured voltage from the first current carrying element and the second current carrying element; and calculating total power by using the measured current and voltage measurements from both the first and second current carrying elements along with the approximated voltage from the neutral element.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) The present disclosure will now be described, by way of non-limiting example, with reference to the accompanying drawings, in which:
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DETAILED DESCRIPTION OF EMBODIMENTS OF THE DISCLOSURE
(48) In an embodiment of the disclosure, a current sensor is provided using a single double sided circuit board (a board having tracks on only its opposing sides). The use of a single printed circuit board with only two conducive layers reduces cost and simplifies manufacture as the sensor can be on the same board that carries the processing electronics required to process the output of the sensor. Advantageously a toroidal current measurement coil is provided on the board. A compensation conductor is provided on the same board. The board includes an opening through which a current carrying conductor may pass. The compensation conductor is provided in association with the current measurement coil such that the average distance of the compensation conductor from the aperture is similar to the average distance of the coil advancement path formed between adjacent turns of the measurement coil. The compensation conductor may be formed in a number of different patterns, but typically is provided so that it is substantially formed within or adjacent the outer edge the coil. Preferably the shape of the compensation conductor is substantially the same as the shape of the advancement path of the measurement conductor. The arrangement provides a significant improvement in terms of interference rejection over the prior art PCB Rogowski coil arrangements in which the compensation wire is either omitted or provided outside the area defined by the coil.
(49) Preferably the board is a two-sided board, and the measurement coil is formed on the upper and lower sides of the board. An upper set of measurement coil tracks is formed on the upper side, and a lower set of measurement coil tracks is formed on the lower side of the board. The measurement coil tracks are delimited by first and second end portions. The first end portion is provided proximal the aperture and the second end portion is provided distal the aperture. The upper and lower measurement coil tracks may be connected using vias formed in the board. In one embodiment, one end of the measurement coil is connected to the compensation conductor and the compensation conductor retraces the path of the measurement coil. Advantageously the upper measurement coil tracks are aligned with the lower measurement coil tracks, forming planes that are perpendicular to the surface of the board and which extend away in a radial fashion from the aperture. This is achieved by using connecting regions that extend in a different direction, which can be regarded as kinks at, for example, the second ends, i.e. the outer ends, of each measurement coil track in order to make an electrical connection with the vias. The kinks are formed within an edge space defined by the vias, and as such the lengths of the measurement coil tracks are not significantly compromised. The symmetry that results makes the coil substantially insensitive to currents when compared with the sub-optimal PCB coil arrangements shown in the prior art.
(50) In view of the above, the present disclosure provides a PCB-based current sensing coil with good interference rejection and which accurately detects currents in the conductor passing through the aperture.
(51) A Rogowski coil can take many forms, and it is worthwhile considering these such that terms used herein are not interpreted in an overly restrictive manner. Rogowski coils can be formed as flexible devices, for example in the form of a flexible tube that carries a helically wound measurement coil, and where the flexible tube is, in use, wrapped around a conductor carrying a current that is to be measured. The Rogowski coil need not have a predetermined shape. Nor need it be closed into a loop. In fact to a first order approximation the shape of the measurement coil is unimportant. Similarly to a first order approximation the shape of the turns of the measurement coil are unimportant but the area enclosed by each turn should be the same.
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(53) The progression of the measurement conductor used to form the measurement coil effectively forms a one turn coil in the plane of the measurement coil which is sensitive to magnetic fields from current carrying conductors other than the target conductor. The orientation of these other conductors may not be known and there may be several of them in close proximity. To address this parasitic coil formed by the advancement of the measurement conductor Rogowski coils are usually made with a compensation conductor. The compensation conductor is formed as a one turn compensation coil whose response is opposed to that the parasitic coil inadvertently formed by the measurement coil.
(54) A Rogowski coil including a compensation conductor shaped to form a compensation coil is schematically illustrated in
(55) The Rogowski coil can also be provided in segments. Such an arrangement can be referred to as a segmented Rogowski coil.
(56) For sensitivity, the Rogowski coil benefits by enclosing a large volume A, as designated by item 3 in
(57) In accordance with the teachings of this disclosure printed circuit boards can be used to form segmented Rogowski coils. Segmented Rogowski like coils may be provided on a plurality of circuit boards. Multiple boards can be secured together with suitable conductive contacts making connections between the boards. Such an approach may facilitate installation of a Rogowski type current sensor around an existing current carrying target conductor. The boards may be formed in an enclosure or a mechanical arrangement allowing them to clamp on to and substantially encircle the conductor with a minimal air gap between the boards after closure/attachment. A plurality of boards may be provided on two or more planes to facilitate this.
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(59) A hole 104 is formed at the center of the board 101. The hole 104 is to allow a target conductor 1 to pass through the Rogowski coil 100. The diameter of the Rogowski coil may be around 35 mm, and the diameter of the hole 104 may be around 9 mm. However, depending on the application, the diameter of the Rogowski coil 101 may be in the range of 5 mm to 600 mm, and the diameter of the hole 104 may be in the range of 1 mm to 500 mm. The board 101 also has a thickness which may, for example, be 1.6 mm as this is a common thickness for circuit boards. The thickness of the board may be increased or decreased as appropriate. These dimensions are given for information only and should not be regarded as being limiting.
(60) The measurement coil 100 is formed, in part, by a number of measurement coil tracks which in this embodiment are provided as radial elements. As there are a large number of radial elements, they have not been individually identified in
(61) As can be seen in
(62) As can be seen in
(63) It should also be noted that the major portions of the radial elements are straight, and are ideally exactly aligned with the radii of the circle formed by the board 101. The radial elements may be within +/5 or better still within +/2 degrees of being exactly radial. Preferably, the radial elements may be within +/1 degree of being exactly radial, or better still within 0.5 degree or less. Further details of the geometry of the coils will be described below.
(64) The measurement coil 100 is provided with external connections. As such, coil connections 109a and 109b are formed by breaking the repeating circular pattern of connections to allow a signal to be extracted from the measurement coil. One of these connections 109a and 109b can be connected to the compensation conductor.
(65) It can also be seen that a plurality of conductors 120 which substantially copy the shape of an outermost end of the elements 105 are interposed between pairs of neighboring radial elements 105S and 105L. These conductors 120 extend between vias 122 and vias 124. The vias 122 are formed in the spaces between the vias 106, and in this example are at the midpoint between each neighboring pair of vias 106. The vias 124 are, in this example, formed at a smaller radius and in this example are offset by half of the pitch of the measurement coil 100. The conductors 120 can be regarded as being first conductors of the compensation conductor and serve to form the compensation coil 6.
(66) In the above-described embodiment, the measurement coil 100 is circular. A symmetric coil is better at rejecting interference. As an alternative to a circular design, the coil may be triangular, square, rectangular, polygonal or elliptical. As with the circular design, it is important that the coil be substantially symmetrical, whatever its shape.
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(68) The benefit of this feature, as will be seen below, is that the radial elements 105 on the top surface of the coil board 101 can be exactly aligned with corresponding radial elements on the bottom side of the coil board 101.
(69) The kinks allow the windings of the coil to be advanced around the circle at or substantially adjacent the vias 106. Advancement is not required at the inner vias 107 and 108.
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(71) As such, the structure formed by the upper radial elements 105 and the lower radial elements 135, as well as the vias 106, 107 and 108, is a measurement coil that progresses in a circumferential direction around the board 101 from coil connection 109a to coil connection 109b. This structure may be regarded as a modified-Rogowski coil. The progression occurs at the outer edge only in this embodiment. However without loss of generality the non-radial connective portion could be provided at the inner end of the coil or at an arbitrary distance along the radial conductors.
(72) Similarly conductors 140 which are mirror images of the conductors 120, cooperate with the vias 122 and 124, and with the conductors 120 to form the compensation conductor. The conductors that form the outermost part of the radial conductors 105 and 135 form a path that is interwoven or wound/twisted with the path of the compensation coil. The conductors 140 can be regarded as being second conductors of the compensation conductor.
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(74) As can be seen, sections 404 and 407 create a plane which is formed exactly on a radius of the circle formed on board 101 and which is orthogonal to the plane formed by a surface of the board 101. The benefit of this arrangement is that the winding planes that form the measurement coil are now properly aligned with the magnetic field from the target conductor rather than being slightly inclined with respect to it. It is believed that this causes sensitivity to currents flowing in a conductor passing through hole 104 to be increased when compared with similar coil arrangements in which the planes formed by the radial elements are not orthogonal to the surface of the board or not precisely formed on the radii of the circle formed by board 101. This is because the magnetic field generated by the current passing through the measurement coil is perpendicular to the plane of the windings. This also improves the sensor's rejection of external magnetic fields. The nodes 405 and 413 are at different distances from the center of the aperture, as shown by vias 107 and 108 in
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(76) The compensation conductor is formed as a single turn coil by alternating tracks 120 and 140 formed on the upper and lower sides of the circuit board in the arrangement shown in
(77) It can be seen by visual inspection of
(78) For completeness,
(79) Other connection patterns are possible.
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(84) In each of the above cases the coils can be connected together in series before connecting to the electronics, or if desired each coil can connect to a respective input circuit and the coil outputs can be combined later.
(85) The advantage of the arrangement shown in
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(87) The boards 410, 430 and 440 can repeat the Rogowski type coil described herein before and suitably placed connection points or other pass though connections are provided to contact these boards with the mother board 101. Multiple numbers of boards beyond four can be connected to form more sensitive sensors if so desired.
(88) The sensitivity of a Rogowski coil like sensor can be increased by increasing the volume or the turns density of the sensing coil (as effectively achieved by stacking two or more coils as described above). Additionally or alternatively the sensitivity can be increased by increasing the magnetic flux generated by the target conductor 1. This can be achieved by making the target conductor 1 make several passes through the aperture. The target conductor can loop round outside of the periphery of the measurement coil so as to return from a second side of the circuit board to a first side of the circuit board such that it can pass through the aperture 104 again. This can be repeated a plurality of times.
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(90) The provision of the multiple paths 1a to 1d as described in the context of a single insulating wire with respect to
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(92) The multi-pass approach to increasing sensitivity can be combined with the multi-coil boards described herein before to achieve further increases in sensitivity.
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(94) The multi-pass approach may also be implemented in multi-layer boards comprising four or more layers. In such an arrangement the outermost layers of the board can be used to form the current flow paths to carry the current to be measured while the innermost layers can be used to form the measurement and compensation coils.
(95) A current sensor formed in accordance with any of the preceding embodiments may be connected to additional electronics to provide amplification and filtering functions. The following examples show various ways in which a sensor may be connected to additional integrated circuits or passive components.
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(107) It is thus possible to provide a relatively inexpensive PCB based Rogowski coil like sensor with good rejection of interfering magnetic fields.
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(110) As noted hereinbefore, the measurement coil advancement by way of the kinks 111 and the compensation conductor need not be placed at the radially outermost edge of the board. This is often a convenient position when the diameter of the target conductor is small. However, it can also be seen that bringing the advancement radially inwards reduces the size of the parasitic coil and consequently there is some advantage to be gained by moving the advancement away from the outer edge of the Rogowski-type coil and moving it towards the inner edge. The advancement can in fact be placed at any distance along the measurement coil conductors.
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(112) In a high precision design of a Rogowski coil, it is sensible to take account of changes in the coil response resulting from changes in temperature. For a PCB based coil, the response of a Rogowski type coil changes with temperature. The variation in response depends on the coil design and the materials used to form the coil and the circuit board.
(113) Printed circuit boards can be made from several materials. A common material is a glass-epoxy material known as FR4. Such a materials can have anisotropic properties, for example some sources suggest that the coefficient of thermal expansion in the X-direction is 1410.sup.6, in the Y-direction is 1210.sup.6 and in the Z direction is 7010.sup.6 (unverified Wikipedia page https://en.wikipedia.org/wiki/FR-4). The coefficient of thermal expansion of copper is 1710.sup.6 and the thermal coefficient of resistivity of copper is 3.710.sup.3.
(114) The thermal expansion coefficient of copper and FR4 in the plane of the circuit board are very similar and the copper will dominate at 1710.sup.6. However in the Z plane the expansion of the circuit board material dominates. This data allows the effective expansion coefficient for the Rogowski coil current sensor to be calculated, based on knowledge of the coil dimensions and the thickness of the circuit board. Assume a circular measurement coil.
(115) Area A.sub.0 at nominal working temperature T.sub.0, the coil cross section is A.sub.0=X.sub.0Z.sub.0, where X.sub.0 represents the effective width of the coil (between the innermost and outermost edges of the coil) and Z.sub.0 represents the thickness of the coil (mainly defined by the thickness of the circuit board, but the thickness of the copper track on the circuit board also needs to be taken into account).
(116) After a rise of 1 degree the area A.sub.1=X.sub.0(1+1710.sup.6)Z.sub.0(1+7010.sup.6).
(117) However it can be seen than given the dimensions of the coil, an effective coefficient of thermal expansion can be calculated, and it will be in the range of 17 to 70 ppm depending on the aspect ratio of the coil.
(118) For the sake of simplicity we shall assume that the calculation for an example Rogowski style sensor on a PCB has yielded an effective expansion coefficient of 50 ppm.
(119) This increase in area gives an increase in output voltage having an equivalent temperature coefficient of 50 ppm in this example. To counter this, the gain applied to the output needs to decrease by 50 ppm/K.
(120) The copper track forming the coil has a resistance R.sub.coil. This can be used in combination with another resistor to change the gain of an amplifier such that the gain reduces with increasing temperature so as to wholly or partially compensate for the increase in measurement coil output voltage due to thermal expansion of the measurement coil.
(121) The temperature coefficient of resistance of copper is around +3700 ppm. The inventor realized that compensation for expansion could be achieved as long as the resistors associated with the amplifier has a lower temperature coefficient of resistance. On chip resistors fabricated by Analog Devices can achieve temperature coefficients of +750 ppm but compensation can be achieved with higher or lower values of temperature coefficient of resistance.
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Gain=R.sub.F/R.sub.IN
Here R.sub.IN=R1+R.sub.coil
So gain=R/(R1+R.sub.coil)
(123) A 1 degree rise in temperature, assuming a resistor temperature coefficient of 750 ppm, gives a gain G1 of
G1=R.sub.F(1+75010.sup.6)/(R(1+75010.sup.6)+R.sub.coil(1+370010.sup.6)).
(124) The goal is that G1-G is equal to 50 ppm to compensate the coils expansion of +50 ppm, so:
(R.sub.F(1+75010.sup.6)/(R1(1+75010.sup.6)+R.sub.coil(1+370010.sup.6)))(R.sub.F/(R1+R.sub.coil))=0.00005
(125) To simplify make R.sub.F=R1 as the absolute gain does not matter for the purpose of this calculation, so
(R1(1+75010.sup.6)/(R1(1+75010.sup.6)+R.sub.coil(1+370010.sup.6)))(R1/(R1+R.sub.coil))=0.00005
Re-arranging
R1/(R1+R.sub.coil)=(0.00005(R1(1+75010.sup.6)+R.sub.coil(1+370010.sup.6))+(R1(1+75010.sup.6))/(R1(1+75010.sup.6)+R.sub.coil(1+370010.sup.6)))
R1/(R1+R.sub.coil)=(0.99995(R1(1+75010.sup.6)+R.sub.coil(1+370010.sup.6))/(R1(1+75010.sup.6)+R.sub.coil(1+370010.sup.6))
(126) If we assume now R1=K*R.sub.coil
K/(K+1)=(0.99995K(1+75010.sup.6)+(1+370010.sup.6))/(K(1+75010.sup.6)+(1+370010.sup.6))
(127) Solving for K gives R160*R.sub.coil
(128) The coil resistance is generally low, giving R1 in the range of several hundred to several kilo-ohms. The amplifier 2510 can be differential and may have an output common mode voltage applied if desired to offset the output voltage to facilitate use of single ended supplies. The amplifier may include features such as auto zeroing to reduce the effects of input referred offsets and chopping may also be used for noise shaping. The amplifier may also have an attenuator formed by resistors of differing values and temperature coefficients at the output of the amplifier and preceding other components such as an analog to digital converter to return the signal to a common mode closer to ground. Such an arrangement will be considered with respect to
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(130) The input resistance comprises at least two resistors, one of which is the resistance R.sub.C of the Rogowski coil sensor. The or each other resistor may be an on chip resistor, or at least a resistor with a lower temperature coefficient of resistance than that of the Rogowski coil. The at least one other resistor has a resistance R.sub.IN. In the example shown in
(131) If we consider the temperature coefficient of amplifier gain, then as on chip feedback resistance has the same temperature coefficient as the on chip resistors in the signal path from the coil, then we need merely consider the input side components when calculating a temperature coefficient of the gain. If we define the following values: Coil resistance=R.sub.C PCB metal temperature Coefficient=B.sub.TC Amplifier independence=R.sub.IN Amplifier resistor temperature coefficient=R.sub.ATC
(132) Then the temperature coefficient of the gain of the amplifier can be expressed as:
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(134) Turning our attention to the output side of the amplifier, the output nodes of the amplifier can be connected to output resistors 2540a and 2540b. The resistors 2540a and 2540b act as the major contribution in defining an amplifier output impedance R.sub.OUT.
(135) The output resistors can form a potential divider with resistors 2542a and 2542b each connected to ground or alternatively a single resistor can be connected between resistors 2542a and 2542b. These resistors act to define a differential output impedance of the potential divider R.sub.DIV.
(136) The differential outputs OutP and OutN from the potential dividers are connected to first and second inputs of the differential analog to digital converter 2522. The converter 2522 has an input impedance R.sub.ADC and a temperature coefficient of input impedance R.sub.ADCTC.
(137) If we define the following values: Output impedance=R.sub.OUT Differential output impedance=R.sub.DIV Amplifier resistor temperature Coefficient=R.sub.ATC Differential input impendence of ADC=R.sub.ADC ADC input impedance Temp Coefficient=R.sub.ADCTC
(138) Then the attenuation temperature coefficient of the attenuator can be expressed as:
(139)
(140) The overall temperature coefficient of the signal processing stage of
Signal processing stage(T.sub.C)=Gain(T.sub.C)+Attenuator(T.sub.C).
(141) By way of non-limiting example the resistors 2540a and 2540b may have values of several K Ohm, e.g. 3 kOhm, and resistors 2542a and 2542b may have values of a similar order of magnitude as resistors 2540a and 2540b, for example 1 kOhm. The feedback resistors 2550a and 2550b may typically be in a range of 12 k to 72 kOhm. A measurement of the coil resistance and the input resistance of the amplifier, can allow for a suitable value of the load resistor. Additionally a further resistor 2550 may be provided to change the effective impendence of the analog to digital converter 2522. The value of this resistor 2550 can be selected as a function of the values of the other resistors (using the principles underlying the above calculations) to provide further trimming of the circuit as a function of temperature so as to compensate for the expansion of the Rogowski style coil. The resistor 2550 may be a discrete low temperature coefficient component. Where such a component is provided its value is likely to be in the range of 10's of kilo-ohms, although this statement is given by way of guidance only and should not be construed as limiting.
(142)
(143)
(144)
(145) The current sensor described herein can be used in a multitude of supply configurations. In some installations a split single phase is used such that the maximum voltage difference of either of the conductors with respect to ground in reduced. In effect a single phase is provided by way of a center tapped transformer. The current flow paths to a dwelling wired in a single phase 3 wire configuration can be regarded as having first and second Live wires L1 and L2 and a neutral. Typically for such a configuration the neutral conductor is not taken into an electricity consumption meter.
(146)
(147) The first conductor is, in this arrangement, formed as a first metallic element 3010 that extends from connector (not shown) that allows the meter to be connected to the mains supply. The first element 3010 passes beneath the board 101 and extends towards the aperture 104 to terminate at a through board connection 3012. The through board connection 3012 forms a current flow path to a second metallic element 3014 which is formed on or passes above the upper surface of the coil board and which extends towards a further connection (not show) to connect with the domestic wiring. Thus the elements 3012 and 3014 form a first path L1 that flows from the underside of the board 101 to the top side of the board. A second current flow path L2 carries a current from the other phase in the opposite direction (it should be noted that the currents may not always be equal). The second current flow path is formed by a third metallic element 3020 which extends from a connector (not shown) beneath or on the lower surface of the coil board 101 towards the aperture 104 where is makes contact with a through board connector 3022. The connector is also in contact with a fourth metallic element 3024 which extends from the aperture 104 over of on an upper surface of the board towards a further connector (not shown).
(148) It can be seen that the magnetic fields from the current flow through the through board connectors 3012 and 3022 are additive. In such an arrangement we only need one current measurement and one voltage measurement to calculate the power consumed.
(149) The conductors L1 and L2 could be arranged to make multiple passes through the Rogowski coil, for example using the approaches described with respect to
(150) From inspection we can see that the instantaneous power P.sub.1 delivered from Line L1 is
P.sub.1=(V.sub.1V.sub.n)*I.sub.1
and the instantaneous power P.sub.2 on Line L2 is
P.sub.2=(V.sub.2V.sub.n)*I.sub.2
(151) Where V.sub.1 is the instantaneous voltage of L1 I.sub.1 is the instantaneous current flowing in L1 V.sub.2 is the instantaneous voltage of L2 I.sub.2 is the instantaneous current flowing in L2, and V.sub.n is the neutral voltage.
(152) The total power consumed is P.sub.total=P.sub.1+P.sub.2
(153) There is no access to the neutral as it typically does not enter the meter so an approximation is used based solely on measuring the potential difference between V.sub.1 and V.sub.2.
V.sub.meas=(V.sub.1V.sub.2)/2=(V1Vn)=(V2Vn)
(154) To compensate Current on in L2 (which can be regarded as Phase 2) being 180 Degrees out of phase with the estimated voltage, the current I.sub.1 on L1 (which can be regarded as being phase 1) is combined with the inverse of the current I.sub.2 on Phase 2.
I.sub.meas=(I.sub.L1I.sub.L2)=I.sub.L1+(I.sub.L2)
(155) The voltage and current measurements are multiplied to obtain total the total power
(156)
(157) Thus the total power can be calculated by independently measuring the combined current of L1 and L2 (as performed by the single Rogowski coil) and the voltage between them, and then assigning half of the voltage difference to each of the currents. The phase shift can be taken care of, for example, by working with the magnitude of the currents.
(158) The PCB style of Rogowski type current sensor makes matching between sensors formed on the same circuit board relatively easy as it can be achieved by repeating the exact etch pattern for the sensors. As a consequence separate Rogowski type sensors may be provided to measure the currents in L1 and L2. This approach can be used to avoid problems that may result from physically having to route the two phases through the same Rogowski type coil.
(159)
(160) The Rogowski coils do not need to be formed in a circular configuration. Moving away from a circular configuration to a more rectangular one allow the coils to be more densely packed, especially in places where the space is confined.
(161)
(162) If the circuit carried by the coil board is sufficiently complex that it requires the use of a board with more than two layers then the coils described herein before can be adapted.
(163) In a four layer board having conductive layers layer 1, layer 2, layer 3 and layer 4, then the measurement conductors 105S, 105L and connecting regions 111 of
(164) Conductors in layer 1 are represented by solid line 3210. Conductors in layer 2 are represented by chain dot line 3220. Conductors in layer 3 are represented by double chain-double dot line 3230 and conductors in layer 4 are represented by broken line 3240.
(165) In these arrangements the shape, in plan view, of the compensation coil exactly matches the shape of the measurement coil advancement. Consequently and interfering fields should induce the same response in the measurement coil and the compensation coil. Furthermore the effective position of the coils perpendicular to the surface of the board is such that they are effectively coincident.
(166) The current measurement apparatus may be provided in association with a voltage measurement apparatus to provide a power (watt-hour) meter.
(167) The coils described herein can be used in conjunction with tamper checking and calibration systems, for example such as described in WO2013/038176, Current measurement the content of which is incorporated by reference.
(168) It is thus possible to provide a robust, accurate and relatively inexpensive rate of change of current detector based around a measurement coil formed on a double sided circuit board. A double sided board can be formed by securing two single sided boards together and such an arrangement is within the teachings of this disclosure.
(169) The sensors have been discloser herein in the context of power metering. However they can also be used circuit breakers and fault detection, (particularly in the transmission and distribution market), were they can be used to sense the overcurrent. Examples of these are MCCB (moulded case circuit breakers) and ACCB (air core circuit breakers), and FCI (Fault Circuit Indicators). The ability to work with high currents and at high frequency are key reasons why Rogowski type sensors are applicable to these applications. Similarly such Rogowski coil type sensors can be used for in building as fault detectors e.g. an Arc Fault Circuit Interrupters (AFCI).
(170) Such Rogowski style sensors can also be used in internet of things (IOT) current/energy monitoring. For example for energy usage optimisation or for equipment health detection. In the former example such sensors enable low-cost and easy attachment at multiple measurement points, in the latter case such sensors are useful for electrical signature analysis, which may be indicative either of the equipment performing normally/abnormally, or matching a characteristic that is indicative of a known failure mechanism (eg a spur in the frequency response of the current taken by an induction motor, if in the right place is indicative of a Rotor fault)
(171) Although the claims are presented in single dependency format suitable for use at the USTPO it is to be understood that any claim may depend on any preceding claim except where that is clearly not feasible.