Platform and methods for dynamic thin film measurements using hyperspectral imaging
11580631 · 2023-02-14
Assignee
Inventors
Cpc classification
International classification
Abstract
Dynamic thin film interferometry is a technique used to non-invasively characterize the thickness of thin liquid films that are evolving in both space and time. Recovering the underlying thickness from the captured interferograms, unconditionally and automatically is still an open problem. A compact setup is provided employing a snapshot hyperspectral camera and the related algorithms for the automated determination of thickness profiles of dynamic thin liquid films. The technique is shown to recover film thickness profiles to within 100 nm of accuracy as compared to those profiles reconstructed through the manual color matching process. Characteristics and advantages of hyperspectral interferometry are discussed including the increased robustness against imaging noise as well as the ability to perform thickness reconstruction without considering the absolute light intensity information.
Claims
1. A method for dynamic thin film measurements using hyperspectral imaging, comprising: (a) processing two-dimensional hyperspectral data of interference patterns of a dynamic thin film by: (i) constructing a three-dimensional hyperspectral cube from the two-dimensional hyperspectral data; (ii) subtracting a background spectrum from spectra in the three-dimensional hyperspectral cube; and (ii) denoising the background subtracted three-dimensional hyperspectral cube to obtain a preprocessed three-dimensional hyperspectral cube; (b) matching the processed three-dimensional hyperspectral cube to a reference spectral map to obtain an initial thickness profile of the thin film by: (j) generating the reference spectral map that defines a mapping between a physical thickness of the dynamic thin film and a corresponding spectral signature as expected to be observed by the hyperspectral imager; and (jj) applying geometric analysis and neighbor matching between each spectrum in the preprocessed three-dimensional hyperspectral cube and the reference generated spectral map to arrive at the initial thickness of the dynamic thin film; and (c) performing spatial optimization in an iterative process on the initial thin film thickness profile to obtain a final thin film thickness profile.
2. The method as set forth in claim 1, wherein the step of denoising is applying a hybrid mean filter.
3. The method as set forth in claim 1, wherein the corresponding spectral signature is corresponding spectral signature as expected to be observed by the hyperspectral imager according to thin interference theory.
4. The method as set forth in claim 1, wherein the dynamic thin film is a film whose thickness varies both in space and time.
5. The method as set forth in claim 1, wherein the dynamic thin film is a film whose thickness is not larger than 4 to 5 microns.
6. A method for dynamic thin film measurements using hyperspectral aging, comprising: (a) acquiring two-dimensional hyperspectral data of interference patterns of a dynamic thin film using a hyperspectral imager; and (b) recovering thickness profiles of the dynamic thin film from the acquired two-dimensional hyperspectral data by: (i) preprocessing acquired two-dimensional hyperspectral data by: (j) constructing a three-dimensional hyperspectral cube from the acquired two-dimensional hyperspectral data; (jj) subtracting an acquired background spectrum from spectra in the three-dimensional hyperspectral cube; and (jjj) denoising the background subtracted three-dimensional hyperspectral cube to obtain a preprocessed three-dimensional hyperspectral cube; (ii) matching the preprocessed three-dimensional hyperspectral cube to a reference spectral map to obtain an initial thickness profile of the thin film by: (p) generating the reference spectral map that defines a mapping between a physical thickness of the dynamic thin film and a corresponding spectral signature as expected to be observed by the hyperspectral imager; and (pp) applying geometric analysis and neighbor matching between each spectrum in the preprocessed three-dimensional hyperspectral cube and the reference generated spectral map to arrive at the initial thickness of the dynamic thin film; and (iii) performing spatial optimization in an iterative process on the initial thin film thickness profile to obtain a final thin film thickness profile.
7. The method as set forth in claim 6, wherein the step of denoising is applying a hybrid mean filter.
8. The method as set forth in claim 6, wherein the corresponding spectral signature is corresponding spectral signature as expected to be observed by the hyperspectral imager according to thin interference theory.
9. The method as set forth in claim 6, wherein the dynamic thin film is a film whose thickness varies both in space and time.
10. The method as set forth in claim 6, wherein the dynamic thin film is a film whose thickness is not larger than 4 to 5 microns.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
(7) In this invention, an arrangement is provided utilizing hyperspectral imaging for the unconditional and automated reconstruction of thickness profiles from thin liquid film interferograms. Approaches utilizing hyperspectral imaging (using the pushbroom like techniques) have previously been reported for characterizing static thin films. However, these approaches are not suited for dynamic films, primarily due to the nature of image acquisition, and to the best of inventors' knowledge have never been modified for use with dynamic films. Here, the inventors describe a compact setup employing a snapshot hyperspectral imager and the related algorithms for automated determination of thickness profiles of thin films.
(8) Theory
(9) The theory of thin film interference was formalized in the early 19th century by Fresnel, and has since been discussed by many researchers in the context of measuring the thickness of thin films such as for bubbles, tear films, and for surface profiling. Here a brief formulation is described relevant for a hyperspectral camera.
(10) Consider a beam of light having intensity I.sub.0(λ) incident on a thin liquid film of thickness d and refractive index n.sub.2. The film is bounded on top and bottom by media having refractive indices n.sub.1 and n.sub.3 respectively. Assuming normal incidence and nondispersive films, the reflected light intensity I(d, λ) emanating from the thin film can be written as,
(11)
(12) Here λ is the wavelength of light, ϕ is the phase difference and is the indicator function that captures the phase shift of π radians that occurs when light passes in to a medium with a higher refractive index. R.sub.1 and R.sub.2 are the power (intensity) reflectivity coefficients obtained from the Fresnel equations evaluated for normal incidence, and are given by,
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(14) Finally, the intensity perceived by the ith channel of a pixel H in a hyperspectral camera as a function of the film thickness can be computed as,
(15)
(16) Here Ir (λ) is the spectral response of filters in the system, λ.sub.0 and λ.sub.f are the smallest and largest wavelengths within the global band pass filter transmission window, and Si(λ) is the spectral sensitivity of the i.sup.th channel of a pixel. See
(17) During an experiment (
(18) Experimental Setup
(19) The single bubble coalescence experiments used to validate the utility of hyperspectral imaging for thin film thickness measurements were performed using a modified Dynamic Fluid-Film Interferometer (DFI). The construction and the utility of the DFI has been previously discussed.
(20) For the current study and for the purposes of this invention, the DFI was modified to have a 16-channel snapshot HyperSpectral Imaging (HSI) camera (Model: MQ022HG-IM-SM4X4-VIS, Manufacturer: Ximea GmbH, Germany) having a maximum acquisition frame rate of 170 frames per second as its top camera (
(21) To benchmark the thin film measurement capability of the hyperspectral camera, single bubble experiments were also performed using RGB cameras (IDS UI 3060CP), commonly used for thin film interferometery.
(22) Image Processing
(23) To recover the film thickness from the hyperspectral image, the following steps were executed utilizing Matlab. Initially, the raw images from the snapshot HSI camera were sliced and spliced appropriately to reconstruct the hyperspectral cubes. Subsequently, background subtraction was performed on the cubes, followed by cropping, intensity correction and normalization. Background subtraction is accomplished by imaging the measurement region in the absence of the thin film and subtracting this background spectrum from the measured spectrum. Intensity correction when necessary (for flat field corrections) is accomplished by imaging a surface of known reflectivity, and using the result to compute the correction mask for each spectral band. Intensity normalization is accomplished by normalizing the hyperspectral interferogram by the largest intensity in the interferogram. Subsequently, a k-Nearest neighbor search utilizing the cosine distance metric is performed between each pixel in the resulting HSI cube and the theoretical spectral map (
(24) Finally, a spatial optimization algorithm is utilized to correct for the any incorrectly assigned points. The algorithm basically enforces the C.° spatial continuity in film thickness by replacing any incorrectly assigned thickness with an appropriate thickness from the k possible thickness values at that point. In practice, this is accomplished by identifying regions with unphysical gradients and utilizing the gradient descent technique to iteratively correct the thickness in these regions. All steps involved in the thickness reconstruction pipeline is summarized as a block diagram in
(25) Thickness Reconstruction Performance
(26) The performance of the new camera system is established by reconstructing the dynamic film thickness of a bubble in a silicone oil mixture. The results before and after optimization are compared to the manually reconstructed thickness profiles in
(27) The mean film thickness (∫∫T(x,y)dxdy/∫∫dxdy) a very common metric used to report the thickness of thin films, is very similar across the three cases with values of 358.9 nm, 344.4 nm and 347.9 nm for the manual, unoptimized and optimized thickness profiles respectively.
(28) The absolute pixel-wise height difference between the manually reconstructed and the automatically reconstructed thickness profiles pre and post optimization are shown in
(29) Finally, a convenient advantage of the automated reconstruction is the ease of analyzing time sequential data to obtain the temporal evolution of the film thicknesses.
(30) Robustness Against Noise
(31) Theoretically, the three channels in RGB interferograms are sufficient to disambiguate the underlying film thicknesses. However, in practice, the inherent noise in the acquired image data breaks this theoretical uniqueness between the RGB intensities and the film thickness; thus, requiring optimization (even for static films) and/or calibration for thickness recovery. Unlike the RGB interferograms, hyperspectral interferograms are relatively more robust to noise.
(32) To illustrate the robustness of hyperspectral interferograms against noise, perform numerical experiments were performed using a ramp thickness profile having a minimum thickness of 1 nm and a maximum thickness of 2,000 nm. This thickness profile is mapped to corresponding color interferograms using the color maps of the tested cameras. Subsequently, Gaussian noise is added to the images. Inset in (|T.sub.i.sup.g−T.sub.i|<50)) as a function of the number of channels in the camera.
(33) From
(34) The increased robustness of HSI interferograms against noise is related to the higher dimensionality of the color co-ordinates that correspond to a given film thickness. As a result of the higher dimensionality, the pair wise Euclidean distances of HSI color co-ordinates are larger than the corresponding pair wise distances of color co-ordinates obtained from an RGB camera. This observation is quantified in
(35) Absolute Light Intensity Independent Thickness Reconstruction
(36) Another advantage of using hyperspectral imaging is that the absolute intensity of light at any point in the interferogram may be neglected during thickness reconstruction. This can be shown to be true using two different arguments. Firstly, standard transformations (such as RGB to HSV) can isolate the intensity information into a single channel. Neglecting the intensity channel, still gives us (for the tested HSI camera) information from 15 channels to unambiguously (see
(37) A direct consequence of this result is that the reconstruction techniques described in this invention are robust against the natural spatial variation of incident light intensity (vignetting) over the interferogram. Hence in addition to obviating the need for accurately obtaining the absolute light intensities, the corrections for vignetting may also be conveniently avoided. Note that flat field corrections may still be required if there are spatial variations in pixel sensitivities in a camera.
(38) Characteristics of Hyperspectral Thin Film Interferometry
(39) Hyperspectral imaging when applied to thin film interferometry has some interesting characteristics. Firstly, the number of spectral classes is higher than in traditional hyperspectral imaging used for remote sensing or medical imaging. The number of spectral classes in thin film interferometry goes as (T.sub.max/T.sub.resolution), which is equal to 4,000 when trying to resolve film thickness of up to T.sub.max=4,000 nm with a resolution of T.sub.resolution=1 nm. Consequently, spectral matching routines used for thin film interferometry should have a high degree of specificity, and may also need optimization algorithms (as used in this invention) to completely reconstruct the thickness profile.
(40) Secondly, the spectra vary gradually in space. Unlike traditional hyperspectral imaging where there are no spatial restrictions on the expected spectra, the spatial continuity of thin films constrains the spectrum to vary gradually in space. This is a direct consequence of the spectral map in
(41) Thirdly, as thin liquid films are dynamic, the spectral signatures change rapidly both in space and time. As a consequence, snapshot hyperspectral imaging (as opposed to techniques such as the pushbroom) is better suited for thin film interferometry.
(42) Comparison to Spectroscopic Ellipsometry
(43) Ellipsometers utilize the change in the polarization state of light as it is reflected obliquely from a thin film to measure the film thickness. Ellipsometers are known for their sub-Angstrom precision, particularly when dealing with nanometric and sub-nanometric films. Spectroscopic ellipsometers are a class of ellipsometers that employ a range of wavelengths to perform the measurement, resulting in an improved measurement range spanning a few Angstroms to tens of microns. In addition, with the help of adequate models, they are also used to determine many optical and geometrical characteristics of thin films.
(44) The herein reported hyperspectral thin film interferometry technique currently has a measurement accuracy of about a 100 nm and can measure film that are between 100 nm and 4,000 nm. Despite having an inferior range and accuracy, hyperspectral interferometry complements spectroscopic ellipsometry by addressing the following two important limitations. Firstly, ellipsometers have a poor spatial resolution, often restricted to measuring the thickness at a single point. This makes ellipsometers unsuitable for characterizing dynamic liquid films that are evolving in both space and time. Secondly, measurements using ellipsometers require an oblique angle of incidence. This makes the imaging of thin films on curved geometries very challenging. The capability of the current hyperspectral technique to characterize dynamic liquid films over curved geometries makes this technique attractive to many technical fields including that of colloid and interface science where thin liquid films involving bubbles, drops and the tear film are routinely studied.
SUMMARY
(45) A compact setup is discussed herein employing snapshot hyperspectral imaging and the related algorithms for the automated determination of thickness profiles of dynamic thin liquid films. It has been shown that one would be able to reconstruct dynamic thin film profiles to within 100 nm of those reconstructed manually. As manually reconstructed profiles themselves are only accurate up to 50 nm, the automatic reconstructed profiles are a faithful representation of the ground truth. It has further been demonstrated herein through numerical experiments that hyperspectral interferometry has two key advantages, namely, the increased robustness against imaging noise and the ability to neglect the absolute light intensity information during thickness reconstruction.
(46) Variations and/or enhancements of the embodiments provided herein may be focused on improving both the hardware and software aspects. Improvements in the spatial resolution, the sensor quantum efficiency, and the filter properties like transmissivity and FWHM of the hyperspectral imager could enhance the reconstruction performance. The results also suggest that improving the filters (especially the Q-factor) will have a significant impact on the robustness of the system. Finally, improvements in image pre-processing (like background subtraction) and in spectral matching algorithms (such as enhancing the specificity and robustness) will also aid in perfecting the embodiments of this invention.