RADIO FREQUENCY CABLE HEAD AND RADIO FREQUENCY PERFORMANCE TESTING DEVICE

Abstract

The present application discloses a radio frequency (RF) cable head and an RF performance testing device. The RF cable head includes a cable head housing, a first connector and a second connector. Both of the first connector and the second connector are disposed inside the cable head housing. The first connector is provided with a spring connected with the second connector, and the cable head housing is provided with a probe hole. The RF performance testing device includes the RF cable head.

Claims

1. An RF cable head, comprising a cable head housing, and a first connector and a second connector, wherein both of the first connector and the second connector are disposed inside the cable head housing, the first connector is connected with the second connector; and the cable head housing is provided with a probe hole through which a probe is inserted to disconnect the first connector from the second connector.

2. The RF cable head of claim 1, wherein the first connector is provided with a spring connected with the second connector.

3. The RF cable head of claim 2, wherein the probe hole faces the spring directly.

4. The RF cable head of claim 1, wherein an end of the first connector away from the second connector is provided with a pin or a jack, which is configured to be matched and connected with a jack or a pin of a board connector.

5. The RF cable head of claim 1, wherein an end of the second connector away from the first connector is provided with a pin or a jack, which is configured to be matched and connected with a jack or a pin of a subsequent circuit.

6. The RF cable head of claim 2, wherein the spring is connected to the second connector through a protrusion.

7. The RF cable head of claim 6, wherein the protrusion is disposed on the second connector or the spring.

8. The RF cable head of claim 1, wherein the cable head housing is an insulating housing.

9. An RF performance testing device, comprising the RF cable head of claim 1.

10. The RF performance testing device of claim 9, further comprising a probe which is inserted through the probe hole to disconnect the first connector from the second connector during a test process.

11. The RF performance testing device of claim 9, wherein the first connector is provided with a spring connected with the second connector.

12. The RF performance testing device of claim 11, wherein the probe hole faces the spring directly.

13. The RF performance testing device of claim 9, wherein an end of the first connector away from the second connector is provided with a pin or a jack, which is configured to be matched and connected with a jack or a pin of a board connector.

14. The RF performance testing device of claim 9, wherein an end of the second connector away from the first connector is provided with a pin or a jack, which is configured to be matched and connected with a jack or a pin of a subsequent circuit.

15. The RF performance testing device of claim 11, wherein the spring is connected to the second connector through a protrusion.

16. The RF performance testing device of claim 15, wherein the protrusion is disposed on the second connector or the spring.

17. The RF performance testing device of claim 9, wherein the cable head housing is an insulating housing.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The accompanying drawings are intended to provide further understanding of the technical solutions of the present application, and are incorporated in and constitute a part of the specification. The drawings, together with the embodiments of the present application, are intended to explain the technical solutions of the present application, but the technical solutions of the present application are not limited thereto. In the drawings,

[0023] FIG. 1 is a structural diagram illustrating Embodiment One of the present application; and

[0024] FIG. 2 is a schematic diagram illustrating application of Embodiment One of the present application.

DETAILED DESCRIPTION

[0025] The embodiments of the present application are described in detail below with reference to the accompanying drawings. It should be noted that the embodiments and the technical features thereof in the present application may be arbitrarily combined with one another if no conflict is incurred.

EMBODIMENT ONE

[0026] As shown in FIG. 1, Embodiment One provides an RF cable head mainly including a cable head housing 1, a first connector 2 and a second connector 3. Both the first connector 2 and the second connector 3 are disposed inside the cable head housing 1. The first connector 2 is connected with the second connector 3.

[0027] In practical application, the cable head housing 1 is provided with a probe hole 11 through which a probe is inserted to disconnect the first connector 2 from the second connector 3. The cable head housing 1 is preferably an insulating housing. When an RF performance test needs to be performed, the probe may be inserted into the cable head housing 1 through the probe hole 11, so that the probe may press the first connector 2 to disconnect the first connector 2 from the second connector 3, and the probe may be connected with the first connector 2 so as to perform the corresponding RF performance test.

[0028] In the embodiment, the first connector 2 is provided with a spring 21 connected with the second connector 3. The spring 21 is arranged in such a way that an elastic force of the spring 21 itself can ensure stable connection between the first connector 2 and the second connector 3, and the spring 21 can be bent under an external force applied by the probe to disconnect the first connector 2 from the second connector 3.

[0029] As shown in FIG. 2, when there is a need to carry out an RF performance test, a probe 4 may be inserted through the probe hole 11, and press the spring 21 of the first connector 2 to control the first connector 2 to be disconnected from the second connector 3. In this way, the probe 4 is connected with the first connector 2 through the spring 21, so that the corresponding RF performance test operation may be performed. Since the second connector 3 is disconnected from the first connector 2, an influence of a subsequent circuit 32 of the second connector 3 on the test result may be effectively avoided.

[0030] By adopting the above RF cable head, the corresponding test operation may be performed with no need to open the cable head housing 1 in the test process, which simplifies the test operation. In addition, the test operation does not need an RF test socket, which may effectively reduce corresponding connecting devices, thereby decreasing the occupied area of the motherboard and lowering overall cost effectively.

[0031] In the embodiment, an end of the first connector 2 away from the second connector 3 is matched and connected with a board connector 22.

[0032] In practical application, the board connector 22 is a motherboard connector, and the subsequent circuit 32 is a motherboard circuit. The first connector 2 is connected with the motherboard connector, and the second connector 3 is connected with the motherboard circuit. When there is a need to perform an RF performance test, the probe 4 is inserted through the probe hole 11 and press the spring 21 of the first connector 2 downwards to break a connection to the motherboard circuit connected with the second connector 3. In this way, the probe 4, the first connector 2 and the motherboard connector are in a connected state, so that the corresponding RF performance test operation may be performed.

[0033] It should be noted that the board connector 22 may be an antenna daughter board connector, or other similar connector, in which case a specific RF performance test operation is similar to the RF performance test operation in the case that the board connector 22 is a motherboard connector.

[0034] In the embodiment, the first connector 2 is connected with the board connector 22 by plugging.

[0035] In practical application, the end of the first connector 2 away from the second connector 3 is provided with a pin or a jack, and the board connector 22 is correspondingly provided with a jack or a pin, so that the first connector 2 may be easily connected with the board connector 22 by plugging.

[0036] In the embodiment, the spring 21 and the second connector 3 are connected with each other through a protrusion 31 which may be provided on the second connector 3 or the spring 21.

[0037] In the embodiment, the second connector 3 and the subsequent circuit 32 are connected with each other by plugging.

[0038] In practical application, an end of the second connector 3 may be made into a structure similar to that of the end of the first connector 2. That is, the end of the second connector 3 is provided with a pin or a jack, and the subsequent circuit 32 is correspondingly provided with a jack or a pin, so that the second connector 3 may be easily connected with the subsequent circuit 32 by plugging.

[0039] In the embodiment, the probe hole 11 may be a circular hole, or a rectangular hole, or a hole in another shape, as long as the probe may be easily inserted through the probe hole 11.

EMBODIMENT TWO

[0040] Embodiment Two of the present application provides an RF performance testing device, which includes the RF cable head disclosed in Embodiment One, and further includes the probe which is inserted through the probe hole to disconnect the first connector from the second connector during a test process.

[0041] In practical application, the probe may be inserted through the probe hole and press the spring of the first connector, so that the spring is pressed to be bent and deformed to be disconnected from the second connector. In this way, the probe and the spring are in a connected state, so that a corresponding RF performance test operation may be performed, and the subsequent circuit and the probe are in a disconnected state, so that the influence of the subsequent circuit on the test result can be avoided.

[0042] In the description of the present application, the terms dispose, couple, connect and fix and the like should be interpreted in a broad sense, for example, connect may indicate a fixed connection, a detachable connection, or an integral connection, and also may indicate a direct connection, or an indirect connection through an intermediate medium. The specific meanings of the above terms in the present application can be understood by those skilled in the art according to specific conditions.

[0043] In the Description of the present application, the description of the terms an embodiment, some embodiments, specific embodiment and the like indicates that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In the Description, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Furthermore, the described specific features, structures, materials or characteristics may be combined in any suitable manner in any one or more embodiments or examples.

[0044] It should be understood by those skilled in the art that the above-mentioned implementation disclosed by the embodiments of the present application is the implementation employed merely for facilitating the understanding of the embodiments of the present application, and is not intended to limit the embodiments of the present application. Without departing from the spirit and scope of the embodiments of the present application, those skilled in the technical field of the embodiments of the present application may make various modifications and changes to the forms and details of the implementation, but the protection scope of the embodiments of the present application should be considered to be the protection scope defined by the appended Claims.

REFERENCE NUMERALS IN THE DRAWINGS

[0045] 1cable head housing, 11probe hole, 2first connector, 21spring, 22board connector, 3second connector, 31protrusion, 32subsequent circuit, 4probe